CN114710615B - Efficient single-pixel imaging method and system - Google Patents

Abstract

The invention provides a high-efficiency single-pixel imaging method and a system, comprising the following steps: generating a series of modulation patterns which satisfy Zernike polynomial distribution and have different orders, and loading the modulation patterns on a spatial light modulator; the spatial light modulator modulates the intensity of the laser emitted by the light source by utilizing the series of modulation patterns with different orders and meeting the Zernike polynomial distribution, projects the modulated laser onto a target object and collects a return light intensity signal reflected from the target object; and reconstructing the target object image based on the return light intensity signal and the series of modulation patterns with different orders and satisfying the Zernike polynomial distribution. Based on the high-efficiency single-pixel imaging method provided by the invention, the imaging efficiency and the imaging quality can be improved under the condition of low sampling ratio.

Description

Efficient single-pixel imaging method and system

technical field

The invention relates to the technical field of optical detection and imaging, in particular to a high-efficiency single-pixel imaging method and system using a Zernike moment light field.

Background technique

Single-pixel imaging refers to a technology that uses a single photosensitive device to image a target object. Unlike the traditional array detector imaging technology that only responds to the visible light band, a single-pixel detector can achieve imaging in the ultraviolet, infrared and even terahertz bands. The pixel detector records the return light of the object in the way of barrel detection, with high sensitivity, and can be used in the field of low-light detection and imaging such as long-distance target detection. At present, single-pixel detection technology usually uses spatial light modulation to perform single-pixel imaging, that is, the intensity of the illumination light field is spatially modulated to generate structured light fields with different intensity distributions, and then single-pixel detectors are used to detect different structured light fields to illuminate the target. The return light intensity generated by the object, combined with the intensity distribution of the structured light field and the return light intensity recorded by the single-pixel detector, can reconstruct the image of the object. The earliest single-pixel imaging technology usually uses a random light field as a modulated light field. Since the two-dimensional spatial intensity distribution of the illumination light field is random, the information collected between different light fields is redundant, so the number of measurements required is far. The number of pixels in the reconstructed pattern is redundant, the data acquisition time is long, and the imaging efficiency is low.

SUMMARY OF THE INVENTION

In view of the defects existing in the prior art, the present invention proposes an efficient single-pixel imaging method and system. The invention proposes to adopt the single-pixel imaging technology based on the Zernike orthogonal moment light field, utilizes the sparsity of the image in the Zernike orthogonal moment transform domain, uses a small amount of Zernike orthogonal light field to illuminate the target object, and reconstructs the image. High-quality object images can effectively improve the imaging efficiency of single-pixel imaging technology, and the imaging quality is high.

For realizing the above-mentioned technical purpose, the technical scheme proposed by the present invention is:

In one aspect, the present invention provides an efficient single-pixel imaging method, comprising:

Generate a series of modulation patterns of different orders satisfying the Zernike polynomial distribution and load them on the spatial light modulator;

The spatial light modulator uses the modulation pattern to modulate the intensity of the laser light emitted by the light source, projects the modulated laser light onto the target object, and collects the return light intensity signal reflected from the target object;

Based on the return light intensity signal and the modulation pattern, the target object image is reconstructed.

In a preferred embodiment, the modulation pattern is generated using the following steps:

Generate a series of first patterns of different orders that satisfy the Zernike polynomial distribution;

The first pattern is split into two modulation patterns and then loaded on the spatial light modulator in turn, wherein a modulation pattern is split from the first pattern to retain the positive elements in the first pattern, and the remaining elements are taken as zero; In another modulation pattern split from the first pattern, the positions of the non-negative elements in the first pattern are all taken as zero, and the positions of the remaining negative elements are taken as the absolute values of the negative elements.

In a preferred embodiment, the first pattern expression is as follows:

、

分别是泽尼克多项式的径向和角向分量；where r and θ are the radial and angular coordinates in the polar coordinate system, respectively, m and n are the angular and radial orders of the Zernike polynomial, respectively,

,

are the radial and angular components of the Zernike polynomial, respectively;

简化为具有一个阶数变量i的形式，如下：the first pattern

Simplified to the form with one order variable i , as follows:

where i and m and n satisfy Noll polynomials;

拆分成两幅调制图案

和

，将调制图案

和

依次加载在空间光调制器上，其中调制图案

保留

中的正数元素，其余元素均取零；调制图案

将

中的非负数元素所在位置均取零，其余负数元素所在位置取该负数元素的绝对值，

。Will

Split into two modulation patterns

and

, will modulate the pattern

and

sequentially loaded on the spatial light modulator, where the modulation pattern

reserve

The positive elements in , and the rest of the elements are zero; modulation pattern

Will

The positions of the non-negative elements in are all zero, and the positions of the remaining negative elements are the absolute values of the negative elements.

.

In a preferred embodiment, based on the return light intensity signal and the modulation pattern, the image of the target object is reconstructed, and the method is as follows:

分布的激光投射到目标物体上产生的回光强度为

，满足

分布的激光投射到目标物体上产生的回光强度为

，基于回光强度

和

通过下式计算得到泽尼克多项式中第i阶泽尼克基的系数a _i ；Satisfy

The intensity of the returned light generated by the distributed laser projected onto the target object is

,Satisfy

The intensity of the returned light generated by the distributed laser projected onto the target object is

, based on the return light intensity

and

The coefficient a _i of the i -th order Zernike base in the Zernike polynomial is calculated by the following formula;

。

.

：Further, the following formula is used to obtain the reconstructed image of the target object

:

where N is the number of times the reconstructed image is sampled.

In another aspect, the present invention provides a high-efficiency single-pixel imaging system, comprising:

The modulation pattern generation module is used to generate a series of modulation patterns of different orders satisfying the Zernike polynomial distribution and load them on the spatial light modulator;

a light source for generating laser light and projecting the generated laser light onto the spatial light modulator;

The spatial light modulator uses the modulation pattern to modulate the intensity of the laser light emitted by the light source, and projects the modulated laser light onto the target object;

Single-pixel photodetector, used to collect the return light intensity signal reflected from the target object;

The imaging module reconstructs the image of the target object based on the returned light intensity signal and the modulation pattern.

As a preferred embodiment, both the modulation pattern generation module and the imaging module are implemented by a computer.

As a preferred embodiment, the spatial light modulator may be a digital micromirror array (DMD) or a spatial light phase modulator.

As a preferred embodiment, the light source includes a laser and a collimated beam expander system.

Compared with the prior art, the advantages of the present invention are:

(1) The present invention uses a two-dimensional Zernike polynomial as a modulation pattern, modulates a Zernike light field to illuminate the target object, and can directly reconstruct the target object pattern according to the return light intensity of the object and the generated Zernike modulation pattern, There is no need to measure and calculate the spectral information of the target, the implementation method is simple, the reconstruction algorithm takes less time, and rapid imaging can be achieved;

(2) Since most of the information of the target image is concentrated in the low-order Zernike basis of finite order, the Zernike light field used in the present invention can be effectively reconstructed in the case of a small number of samples High-quality object images with high imaging efficiency;

和

来替代

，实验上更具可操作性，并且差分的方法可有效消除背景光噪声，有效提高成像信噪比；(3) In the present invention, two projection patterns are used in a differential manner

and

to replace

, the experiment is more operational, and the differential method can effectively eliminate the background light noise and effectively improve the imaging signal-to-noise ratio;

(4) Since the Zernike polynomial is defined in the polar coordinate system of the circular domain, and its angular component satisfies the sine or cosine distribution, for the target object with circular symmetry, the single-pixel imaging technology using the Zernike light field has a relatively high performance. Good reconstructed image quality.

In conclusion, the single-pixel imaging technology provided by the present invention can improve imaging efficiency and imaging quality under the condition of low sampling ratio.

Description of drawings

In order to explain the embodiments of the present invention or the technical solutions in the prior art more clearly, the following briefly introduces the accompanying drawings that need to be used in the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are only These are some embodiments of the present invention, and for those of ordinary skill in the art, other drawings can also be obtained according to the structures shown in these drawings without creative efforts.

1 is a flowchart of an embodiment of the present invention;

2 is a structural diagram of an embodiment of the present invention;

3 is a first-order Zernike light field intensity gray distribution map generated by calculation in an embodiment of the present invention, wherein (a) is a first-order Zernike light field intensity gray distribution map generated by calculation; (b) is the gray distribution map of the second-order Zernike light field intensity generated by calculation; (c) is the gray distribution map of the third-order Zernike light field intensity generated by calculation; (d) is the fourth-order Zernike light field intensity distribution map generated by calculation Field intensity gray distribution map; (e) is the fifth-order Zernike light field intensity gray distribution map generated by calculation; (f) is the sixth-order Zernike light field intensity gray distribution map generated by calculation; (g) is the seventh-order Zernike light field intensity gray distribution map generated by calculation; (h) is the eighth-order Zernike light field intensity gray distribution map generated by calculation; (i) is the ninth-order Zernike light field intensity distribution map generated by calculation Field intensity grayscale distribution map;

4 is an original image of a target object in an embodiment of the present invention;

5 is an image of an object reconstructed using a 500-order Zernike light field according to an embodiment of the present invention;

FIG. 6 is an image of an object reconstructed using a 1000-order Zernike light field according to an embodiment of the present invention.

Detailed ways

In order to make the purposes, technical solutions and advantages of the embodiments of the present invention more clearly understood, the following will clearly illustrate the spirit of the disclosed contents of the present invention with the accompanying drawings and detailed description. Afterwards, changes and modifications can be made by the technology taught by the content of the present invention, without departing from the spirit and scope of the content of the present invention. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention, but are not intended to limit the present invention.

In one embodiment, referring to FIG. 1 , an efficient single-pixel imaging method is provided, including:

(S1) A series of modulation patterns of different orders satisfying the Zernike polynomial distribution are generated and loaded onto the spatial light modulator;

(S2) The spatial light modulator uses the modulation pattern to modulate the intensity of the laser light emitted by the light source, projects the modulated laser light on the target object, and collects the return light intensity signal reflected from the target object;

(S3) Reconstructing the target object image based on the return light intensity signal and the modulation pattern.

In one embodiment, the step (S1) includes:

(S1.1) Generate a series of first patterns of different orders that satisfy the Zernike polynomial distribution;

(S1.2) Split the first pattern into two modulation patterns and load them on the spatial light modulator in turn, wherein one modulation pattern is split from the first pattern to retain the positive elements in the first pattern, and the remaining elements All take zero; for another modulation pattern split from the first pattern, the positions of non-negative elements in the first pattern are all taken as zero, and the positions of other negative elements take the absolute value of the negative element.

In one embodiment, in step (S1.1), the expression of the first pattern is as follows:

、

分别是泽尼克多项式的径向和角向分量;where r and θ are the radial and angular coordinates in the polar coordinate system, respectively, m and n are the angular and radial orders of the Zernike polynomial, respectively,

,

are the radial and angular components of the Zernike polynomial, respectively;

。

.

简化为具有一个阶数变量i的形式，如下：Further, in order to make the operation more convenient, in step (S1.1), the first pattern is

Simplified to the form with one order variable i , as follows:

where i and m and n satisfy Noll polynomials;

的数值矩阵中既有正值，也存在负值，负值部分无法加载到空间光调制器上。步骤（S1.2）中采用差分的方式分两幅调制图案实现泽尼克多项式

的产生。将

拆分成两幅调制图案

和

，将调制图案

和

依次加载在空间光调制器上，其中调制图案

保留

中的正数元素，其余元素均取零；调制图案

将

中的非负数元素所在位置均取零，其余负数元素所在位置取该负数元素的绝对值，

。Because of the Zernike polynomial

There are both positive and negative values in the numerical matrix of , and the negative value part cannot be loaded on the spatial light modulator. In step (S1.2), the Zernike polynomial is realized by using the differential method to divide the two-amplitude modulation pattern

production. Will

Split into two modulation patterns

and

, will modulate the pattern

and

sequentially loaded on the spatial light modulator, where the modulation pattern

reserve

The positive elements in , and the rest of the elements are zero; modulation pattern

Will

The positions of the non-negative elements in are all zero, and the positions of the remaining negative elements are the absolute values of the negative elements.

.

拆分成两幅调制图案

和

后依次加载到空间光调制器上，空间光调制器利用调制图案对光源发出的激光进行强度调制，将调制后产生满足

分布的激光和满足

分布的激光依次投射到目标物体上，并采集从目标物体反射回的回光强度

和

。满足

分布的激光投射到目标物体上产生的回光强度为

，满足

分布的激光投射到目标物体上产生的回光强度为

，分别满足下列公式：The present invention will satisfy the modulation pattern of the two-dimensional Zernike polynomial distribution

Split into two modulation patterns

and

Then, they are loaded on the spatial light modulator in turn, and the spatial light modulator uses the modulation pattern to modulate the intensity of the laser light emitted by the light source, so that the modulated output satisfies the

distributed laser and meet

The distributed lasers are projected onto the target object in turn, and the intensity of the returned light reflected from the target object is collected

and

. Satisfy

The intensity of the returned light generated by the distributed laser projected onto the target object is

,Satisfy

The intensity of the returned light generated by the distributed laser projected onto the target object is

, respectively satisfy the following formulas:

为目标物体在极坐标系下的反射率函数。in

is the reflectance function of the target object in the polar coordinate system.

In (S3) of an embodiment, the image of the target object is reconstructed based on the return light intensity signal and the modulation pattern, and the method is as follows:

分布的激光投射到目标物体上产生的回光强度为

，满足

分布的激光投射到目标物体上产生的回光强度为

，基于回光强度

和

计算得到泽尼克多项式中第i阶泽尼克基的系数a _i ；Satisfy

The intensity of the returned light generated by the distributed laser projected onto the target object is

,Satisfy

The intensity of the returned light generated by the distributed laser projected onto the target object is

, based on the return light intensity

and

Calculate the coefficient a _i of the i -th order Zernike base in the Zernike polynomial;

：Use the following formula to obtain the reconstructed image of the target object

:

where N is the order of the Zernike polynomial used, that is, the number of times the reconstructed image is sampled.

The principle of the present invention is as follows:

其表达式可知，不同阶数的泽尼克多项式在极坐标系下是正交的，其径向分量

和角向分量

满足下列正交关系：Depend on

Its expression shows that the Zernike polynomials of different orders are orthogonal in the polar coordinate system, and their radial components

and angular components

The following orthogonal relations are satisfied:

满足下列的正交关系：Therefore, the two-dimensional Zernike polynomial

Satisfy the following orthogonal relationship:

可拆分为不同阶数的泽尼克多项式来表示：According to the theory of Zernike polynomial, the reflectivity function of the target object in the polar coordinate system

It can be divided into Zernike polynomials of different orders to represent:

According to the orthogonality between Zernike polynomials of different orders, the corresponding coefficients can be expressed as:

Among them, I _i is the detected return light intensity.

。

.

Therefore, the reconstructed target object image satisfies the following formula:

Compared with the existing random light field, Hadamard-based light field and Fourier-based light field, the present invention can obtain a higher-quality reconstructed image with fewer sampling times, and at the same time, it has the characteristics of circular symmetry. The method can better reconstruct and identify the pattern information of circular symmetry in the object, which can greatly reduce the sampling times and improve the imaging efficiency.

Referring to FIG. 2, an embodiment provides a high-efficiency single-pixel imaging system, including:

The modulation pattern generation module is used to generate a series of modulation patterns of different orders satisfying the Zernike polynomial distribution and load them on the spatial light modulator;

Structured light generating device 2, the structured light generating device 2 includes a light source and a spatial light modulator, wherein the light source is used to generate laser light, and the generated laser light is projected onto the spatial light modulator; the spatial light modulator uses a modulation pattern to emit light to the light source The intensity of the laser is modulated, and the modulated laser is projected onto the target object 3;

The single-pixel photodetector 4 is used to collect the return light intensity signal reflected from the target object 3;

The imaging module reconstructs the image of the target object based on the returned light intensity signal and the modulation pattern.

Wherein, the modulation pattern generation module and the imaging module are realized by the computer 1, and also includes a data acquisition card (the model is not limited, such as using NI USB-6361), the computer is used to generate a series of different orders satisfying the Zernike polynomial distribution. The modulation pattern is loaded on the spatial light modulator, and the data acquisition card is used to collect and record the return light intensity signal from the target object received by the single-pixel photodetector 4 and transmit it to the computer for image reconstruction.

The working wavelength of the light source described in the present invention is not limited, it can be in the visible light band (such as 532 nm), it can also be in the near-infrared wavelength band (such as 1064 nm) or other wavelength bands, and the spatial light modulator used can be a digital micromirror array. (DMD), or spatial light modulators such as liquid crystal spatial light phase modulators (SLM), the single-pixel detectors used can be photomultiplier tubes, PIN photodiodes, avalanche photodiodes, nanowire superconducting single-photon detectors, etc. and other photodetectors.

In an embodiment of the present invention, the structured light generating device 2 may be composed of a light source, a beam expander, a spatial light modulator, and a projection lens. In this embodiment, the light source adopts a continuous laser with an operating wavelength of 532 nm, and the spatial light modulator adopts a digital microcomputer. Mirror array device (TI DLP Discovery V-7001), the magnification of the beam expander is about 10 times; the target object 3 is a commonly used natural image-photographer; the single-pixel detector 4 uses a photomultiplier tube (Thorlabs PMT-PMM02) .

In an embodiment of the present invention, the workflow of the high-efficiency single-pixel imaging system is as follows:

(1) The computer generates a series of modulation patterns of different orders satisfying the Zernike polynomial distribution and sequentially loads them onto the digital micromirror array;

(2) The continuous laser generated by the light source is expanded and projected onto the digital micromirror array for intensity modulation;

(3) The structured light field generated after modulation is irradiated onto the target object 3 through the projection lens, and the generated return light intensity signal is collected by the single-pixel detector 4, and converted into an electrical signal and sent to the data acquisition card, which collects and records The return light intensity signal from the target object received by the single-pixel photodetector 4 is transmitted to the computer;

(4) The computer reconstructs the image of the target object based on the modulation pattern and the return light intensity signal.

In one embodiment, the modulation pattern generation module includes:

The first module is used to generate a series of first patterns of different orders satisfying the Zernike polynomial distribution;

The second module is used to split the first pattern into two modulation patterns and then load them on the spatial light modulator in turn, wherein one modulation pattern is split from the first pattern to retain the positive elements in the first pattern, and the rest All elements take zero; another modulation pattern split from the first pattern takes zero for the positions of the non-negative elements in the first pattern, and takes the absolute value of the negative elements for the positions of the remaining negative elements.

In the first module, the expression of the generated first pattern is as follows:

、

分别是泽尼克多项式的径向和角向分量；where r and θ are the radial and angular coordinates in the polar coordinate system, respectively, m and n are the radial and angular orders of the Zernike polynomial, respectively,

,

are the radial and angular components of the Zernike polynomial, respectively;

简化为具有一个阶数变量i的形式，如下：the first pattern

Simplified to the form with one order variable i , as follows:

where i and m and n satisfy Noll polynomials;

拆分成两幅调制图案

和

，将调制图案

和

依次加载在空间光调制器上，其中调制图案

保留

中的正数元素，其余元素均取零；调制图案

将

中的非负数元素所在位置均取零，其余负数元素所在位置取该负数元素的绝对值，

。The second module will

Split into two modulation patterns

and

, will modulate the pattern

and

sequentially loaded on the spatial light modulator, where the modulation pattern

reserve

The positive elements in , and the rest of the elements are zero; modulation pattern

Will

The positions of the non-negative elements in are all zero, and the positions of the remaining negative elements are the absolute values of the negative elements.

.

In one embodiment, the imaging module includes:

分布的激光投射到目标物体上产生的回光强度

和满足

分布的激光投射到目标物体上产生的回光强度

计算得到泽尼克多项式中第i阶泽尼克基的系数a _i ；The third module, using the satisfaction

The intensity of the return light generated by the distributed laser projection onto the target object

and satisfied

The intensity of the return light generated by the distributed laser projection onto the target object

Calculate the coefficient a _i of the i -th order Zernike base in the Zernike polynomial;

，其中The fourth module is used to reconstruct the image of the target object

,in

N is the number of times the reconstructed image is sampled.

The methods for implementing the functions of the above modules can be implemented by the same methods as those in the foregoing embodiments, and details are not described herein again.

。首先，生成大小为N*N的单位坐标矩阵，本实施例中N=128，单位坐标矩阵的数值范围为（-1,1）。由于泽尼克多项式

定义在极坐标系中的单位圆上，因此在本实施例中，将极坐标系中二维泽尼克多项式

的值转化为相应笛卡尔坐标系下的值，并投影到大小为N*N的单位矩阵的内切圆上，矩阵中的其余元素值取零，由此可采用大小N*N的矩阵表示一幅泽尼克多项式分布的投影图案。由于原定义式中泽尼克多项式

的阶数由m和n两个参数决定，为计算和实验方便，可采用一个参数i来表示泽尼克多项式的阶数

，其中m, n和i的对应关系满足Noll多项式，本实施例中,前9阶泽尼克多项式中m, n和i的对应关系以及相应的泽尼克多项式

的表达式如下表所示：In one embodiment, the computer generates a series of discrete two-dimensional Zernike polynomials of different orders

. First, a unit coordinate matrix with a size of N*N is generated. In this embodiment, N=128, and the numerical range of the unit coordinate matrix is (-1, 1). Because of the Zernike polynomial

is defined on the unit circle in the polar coordinate system, so in this embodiment, the two-dimensional Zernike polynomial in the polar coordinate system is

The value of is converted to the value in the corresponding Cartesian coordinate system, and projected onto the inscribed circle of the unit matrix of size N*N, and the remaining element values in the matrix are zero, so it can be represented by a matrix of size N*N A projected pattern of a Zernike polynomial distribution. Since the Zernike polynomial in the original definition

The order of is determined by two parameters, m and n. For the convenience of calculation and experiment, a parameter i can be used to represent the order of the Zernike polynomial

, where the correspondence between m, n and i satisfies the Noll polynomial. In this embodiment, the correspondence between m, n and i in the first 9-order Zernike polynomial and the corresponding Zernike polynomial

The expression is shown in the following table:

FIG. 3 is a grayscale map showing the first 9-order Zernike light field intensity distribution calculated and generated in this embodiment, wherein (a) is the first-order Zernike light field intensity grayscale distribution map generated by calculation; (b) is the gray distribution map of the second-order Zernike light field intensity generated by calculation; (c) is the gray distribution map of the third-order Zernike light field intensity generated by calculation; (d) is the fourth-order Zernike light field intensity distribution map generated by calculation Field intensity gray distribution map; (e) is the fifth-order Zernike light field intensity gray distribution map generated by calculation; (f) is the sixth-order Zernike light field intensity gray distribution map generated by calculation; (g) is the seventh-order Zernike light field intensity gray distribution map generated by calculation; (h) is the eighth-order Zernike light field intensity gray distribution map generated by calculation; (i) is the ninth-order Zernike light field intensity distribution map generated by calculation Field intensity grayscale distribution map. FIG. 4 is the original image of the target object in this embodiment, FIG. 5 is an image of the object reconstructed by using a 500-order Zernike light field in this embodiment (that is, the sampling times N=500), and FIG. 6 is an embodiment of the present invention The image of the object reconstructed by the 1000-order Zernike light field (that is, the sampling times N=1000). It can be seen from Fig. 5 and Fig. 6 that the method proposed in the present invention can reconstruct a clear target object image with less sampling times under the condition of under-sampling. With the increase of sampling times, the reconstructed object image is clearer. The target object size used in the embodiment of the present invention is a pixel matrix of 128*128. When the sampling number is 1000, the sampling ratio is about 6.1%. It can be seen that the single-pixel imaging method proposed by the present invention utilizes the information of the target object to be included in the Features in low-order Zernike polynomials to achieve clear imaging of target objects with lower sampling ratios.

The technical features of the above embodiments can be combined arbitrarily. In order to make the description simple, all possible combinations of the technical features in the above embodiments are not described. However, as long as there is no contradiction in the combination of these technical features It is considered to be the range described in this specification.

The above-mentioned embodiments only represent several embodiments of the present application, and the descriptions thereof are specific and detailed, but should not be construed as a limitation on the scope of the invention patent. It should be pointed out that for those skilled in the art, without departing from the concept of the present application, several modifications and improvements can be made, which all belong to the protection scope of the present application. Therefore, the scope of protection of the patent of the present application shall be subject to the appended claims.

Claims (4)

1. an efficient single-pixel imaging method, is characterized in that, comprises: Generate a series of first patterns of different orders that satisfy the Zernike polynomial distribution; The first pattern is split into two modulation patterns and then loaded on the spatial light modulator in turn, wherein a modulation pattern is split from the first pattern to retain the positive elements in the first pattern, and the remaining elements are taken as zero; In another modulation pattern split from the first pattern, the positions of the non-negative elements in the first pattern are all taken as zero, and the positions of the remaining negative elements are taken as the absolute values of the negative elements; The spatial light modulator uses the modulation pattern to modulate the intensity of the laser light emitted by the light source, projects the modulated laser light onto the target object, and collects the return light intensity signal reflected from the target object; reconstructing the image of the target object based on the return light intensity signal and the modulation pattern; The first pattern expression is as follows:

where r and θ are the radial and angular coordinates in the polar coordinate system, respectively, m and n are the angular and radial orders of the Zernike polynomial, respectively,

,

are the radial and angular components of the Zernike polynomial, respectively; the first pattern

Simplified to the form with one order variable i , as follows:

where i and m and n satisfy Noll polynomials; Will

Split into two modulation patterns

and

, will modulate the pattern

and

sequentially loaded on the spatial light modulator, where the modulation pattern

reserve

The positive elements in , and the rest of the elements are zero; modulation pattern

Will

The positions of the non-negative elements in are all zero, and the positions of the remaining negative elements are the absolute values of the negative elements.

; Based on the return light intensity signal and the modulation pattern, the image of the target object is reconstructed, and the method is as follows: Satisfy

The intensity of the returned light generated by the distributed laser projected onto the target object is

,Satisfy

The intensity of the returned light generated by the distributed laser projected onto the target object is

, based on the return light intensity

and

Calculate the coefficients of the i -th order Zernike base in the Zernike polynomial

; Use the following formula to obtain the reconstructed image of the target object

:

where N is the number of times the reconstructed image is sampled. 2. The high-efficiency single-pixel imaging method according to claim 1, wherein the coefficient

It is calculated by the following formula:

. 3. A high-efficiency single-pixel imaging system, comprising: A modulation pattern generation module, the modulation pattern generation module includes a first module and a second module: the first module is used to generate a series of first patterns of different orders satisfying the Zernike polynomial distribution; the second module is used to The first pattern is split into two modulation patterns and then loaded on the spatial light modulator in turn, wherein a modulation pattern is split from the first pattern to retain the positive elements in the first pattern, and the remaining elements are taken as zero; In another modulation pattern split from a pattern, the positions of the non-negative elements in the first pattern are all taken as zero, and the positions of the remaining negative elements are taken as the absolute values of the negative elements; a light source for generating laser light and projecting the generated laser light onto the spatial light modulator; The spatial light modulator uses the modulation pattern to modulate the intensity of the laser light emitted by the light source, and projects the modulated laser light onto the target object; Single-pixel photodetector, used to collect the return light intensity signal reflected from the target object; an imaging module, for reconstructing the image of the target object based on the return light intensity signal and the modulation pattern; In the first module, the first pattern expression is as follows:

where r and θ are the radial and angular coordinates in the polar coordinate system, respectively, m and n are the angular and radial orders of the Zernike polynomial, respectively,

,

are the radial and angular components of the Zernike polynomial, respectively; the first pattern

Simplified to the form with one order variable i , as follows:

where i and m and n satisfy Noll polynomials; Will

Split into two modulation patterns

and

, will modulate the pattern

and

sequentially loaded on the spatial light modulator, where the modulation pattern

reserve

The positive elements in , and the rest of the elements are zero; modulation pattern

Will

The positions of the non-negative elements in are all zero, and the positions of the remaining negative elements are the absolute values of the negative elements.

; The imaging module includes: The third module, using the satisfaction

The intensity of the return light generated by the distributed laser projection onto the target object

and satisfied

The intensity of the return light generated by the distributed laser projection onto the target object

Calculate the coefficients of the i -th order Zernike base in the Zernike polynomial

; The fourth module is used to reconstruct the image of the target object

,in

N is the number of times the reconstructed image is sampled. 4. The high-efficiency single-pixel imaging system according to claim 3, wherein the modulation pattern generation module and the imaging module are implemented by a computer.

Images