CN114645321B - Co 9 S 8 Method for preparing single crystal transition metal sulfide film - Google Patents
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Abstract
本发明属于脉冲激光沉积技术以及过渡金属硫化物薄膜制备领域,具体提供一种Co9S8单晶过渡金属硫化物薄膜的制备方法,用以获得高质量外延硫化物薄膜。本发明利用脉冲激光沉积法,通过CoS靶材制备与沉积参数精准设计,首次制备得到Co9S8单晶外延薄膜,相较于Co9S8粉体或块体,Co9S8单晶外延薄膜能够有着更好的物理性质,相较于现有过渡金属硫化物薄膜,Co9S8单晶外延薄膜具有结晶质量高、厚度较薄、电输运性能好的优点;综上,本发明基于脉冲激光沉积法首次制备得到Co9S8单晶外延薄膜,具有质量高、厚度薄、电输运性能好的优点,为其在能源领域的应用提供了良好的基础,并且,制备工艺简单、制备成本低。
The invention belongs to the field of pulsed laser deposition technology and preparation of transition metal sulfide films, and specifically provides a method for preparing Co 9 S 8 single crystal transition metal sulfide films, so as to obtain high-quality epitaxial sulfide films. The present invention utilizes the pulsed laser deposition method to prepare Co 9 S 8 single crystal epitaxial film for the first time through the preparation of CoS target and precise design of deposition parameters. Compared with Co 9 S 8 powder or bulk, Co 9 S 8 single crystal The epitaxial film can have better physical properties. Compared with the existing transition metal sulfide film, the Co 9 S 8 single crystal epitaxial film has the advantages of high crystal quality, thinner thickness, and good electrical transport performance; in summary, this paper The invention is based on the pulsed laser deposition method to prepare the Co 9 S 8 single crystal epitaxial film for the first time, which has the advantages of high quality, thin thickness and good electrical transport performance, which provides a good foundation for its application in the energy field, and the preparation process Simple and low preparation cost.
Description
技术领域technical field
本发明属于脉冲激光沉积技术以及过渡金属硫化物薄膜制备领域,具体提供一种Co9S8单晶过渡金属硫化物薄膜的制备方法。The invention belongs to the field of pulse laser deposition technology and the preparation of transition metal sulfide thin films, and specifically provides a preparation method of Co 9 S 8 single crystal transition metal sulfide thin films.
背景技术Background technique
过渡金属硫化物薄膜对于光电器件、光伏电池、热电器件、传感器等领域有着非常重要的作用,目前制备得过渡金属硫化物薄膜多是粗糙且存在高密度缺陷的、并且膜厚常为几十个微米,受限的性能以及高密度缺陷使得人们更多的把研究的方向转移到了高质量的单晶以及极薄的外延薄膜上。然而,由于存在着晶格参数的不匹配以及热膨胀等因素,通过一步法直接在氧化物衬底上沉积硫化物外延薄膜是非常困难的;与此同时,传统的自上而下技术也无法实现纳米级别的精度控制;因此,想要获得在较大衬底上获得高质量外延硫化物薄膜仍然是一个相当大的挑战。Transition metal sulfide thin films play a very important role in the fields of optoelectronic devices, photovoltaic cells, thermoelectric devices, sensors, etc. At present, most transition metal sulfide thin films prepared are rough and have high-density defects, and the film thickness is often dozens of Micron, limited performance and high density of defects make people more research direction to high-quality single crystal and extremely thin epitaxial film. However, due to the mismatch of lattice parameters and thermal expansion, it is very difficult to directly deposit sulfide epitaxial films on oxide substrates by one-step method; at the same time, traditional top-down techniques cannot achieve Nanoscale precision control; therefore, obtaining high-quality epitaxial sulfide films on larger substrates remains a considerable challenge.
发明内容Contents of the invention
本发明的目的在于提供一种Co9S8单晶过渡金属硫化物薄膜的制备方法,首次制备得到Co9S8单晶外延薄膜,并且具有优良的电学性能以及较好的稳定性,为研究Co9S8的一系列优良性能提供样本。The purpose of the present invention is to provide a method for preparing a Co 9 S 8 single crystal transition metal sulfide thin film. The Co 9 S 8 single crystal epitaxial thin film is prepared for the first time, and has excellent electrical properties and good stability. A series of excellent properties of Co 9 S 8 provide samples.
为实现上述目的,本发明采用的技术方案为:To achieve the above object, the technical solution adopted in the present invention is:
一种Co9S8单晶过渡金属硫化物薄膜的制备方法,包括如下步骤:A method for preparing a Co 9 S 8 single crystal transition metal sulfide film, comprising the steps of:
步骤1.以CoS粉末为反应材料进行研磨、压片、高温煅烧,得到CoS靶材;Step 1. Grinding, tableting, and high-temperature calcination with CoS powder as the reaction material to obtain the CoS target;
步骤2.采用丙酮、酒精、去离子水依次对YSZ基片进行超声清洗,并氮气吹干备用;
步骤3.将CoS靶材与YSZ基片置于脉冲激光沉积系统的溅射室中,设置靶材与基底的间距为55mm,设置脉冲激光沉积系统的背底真空度为4.5×10-4Pa、生长温度为500℃-600℃,设置脉冲激光的重复频率为9Hz、脉冲激光能量密度为1.6J/cm2、沉积脉冲数为18000pulses~30000pulses,通过脉冲激光沉积系统于YSZ基片上沉积生长得到Co9S8单晶过渡金属硫化物薄膜。
进一步的,所述步骤1中,CoS粉末的用量为1g-2g。Further, in the step 1, the CoS powder is used in an amount of 1g-2g.
进一步的,所述步骤1中,研磨在真空手套箱中进行,研磨时间为25min-30min。Further, in the step 1, the grinding is carried out in a vacuum glove box, and the grinding time is 25min-30min.
进一步的,所述步骤1中,压片采用压片机进行,设置压力为15Mpa-20Mpa、压片时间为8min-10min,压片完成后将其和陶瓷垫片一同转移到石英管中,然后使用真空封管机进行抽真空封管。Further, in the step 1, tablet pressing is carried out with a tablet pressing machine, the setting pressure is 15Mpa-20Mpa, and the tablet pressing time is 8min-10min. After the tablet pressing is completed, it is transferred to the quartz tube together with the ceramic gasket, and then Vacuum seal the tubes using a vacuum tube sealer.
进一步的,所述步骤1中,高温煅烧采用管式炉进行,首先在管式炉中放入刚玉管,再将装有靶材的石英管放入刚玉管内,用以防止硫化物易挥发导致石英管炸裂,高温煅烧的参数为:以5℃/min的加热速率从室温加热至750℃、保温10h-12h。Further, in the step 1, the high-temperature calcination is carried out using a tube furnace. First, a corundum tube is placed in the tube furnace, and then a quartz tube equipped with a target is placed in the corundum tube to prevent the volatilization of sulfide from causing The quartz tube burst, and the parameters for high-temperature calcination are: heating from room temperature to 750°C at a heating rate of 5°C/min, and holding for 10h-12h.
进一步的,所述步骤3中,CoS靶材采用砂纸进行表面打磨后用导电碳胶粘至靶托上,YSZ基片用导电银浆粘至基片台上。Further, in the
进一步的,所述Co9S8单晶过渡金属硫化物薄膜的厚度为60nm-100nm。Further, the thickness of the Co 9 S 8 single crystal transition metal sulfide film is 60nm-100nm.
本发明的有益效果在于:The beneficial effects of the present invention are:
本发明提供一种Co9S8单晶过渡金属硫化物薄膜的制备方法,利用脉冲激光沉积法,通过CoS靶材制备与沉积参数精准设计,首次制备得到Co9S8单晶外延薄膜,相较于Co9S8粉体或块体,Co9S8单晶外延薄膜能够有着更好的物理性质,相较于现有过渡金属硫化物薄膜,Co9S8单晶外延薄膜具有结晶质量高、厚度较薄、电输运性能好的优点;综上,本发明基于脉冲激光沉积法首次制备得到Co9S8单晶外延薄膜,具有质量高、厚度薄、电输运性能好的优点,为其在能源领域的应用提供了良好的基础,并且,制备工艺简单、制备成本低。The present invention provides a method for preparing a Co 9 S 8 single crystal transition metal sulfide thin film. The pulsed laser deposition method is used to prepare a Co 9 S 8 single crystal epitaxial thin film for the first time through the preparation of a CoS target and the precise design of deposition parameters. Compared with Co 9 S 8 powder or bulk, Co 9 S 8 single crystal epitaxial film can have better physical properties. Compared with existing transition metal sulfide films, Co 9 S 8 single crystal epitaxial film has crystalline quality High, thin thickness, and good electrical transport properties; in summary, the present invention is the first to prepare Co 9 S 8 single crystal epitaxial film based on pulsed laser deposition, which has the advantages of high quality, thin thickness, and good electrical transport properties , providing a good foundation for its application in the energy field, and the preparation process is simple and the preparation cost is low.
附图说明Description of drawings
图1为本发明实施例1、2、3制备的Co9S8单晶薄膜的校准YSZ(002)取向测得的XRD图。Fig. 1 is the XRD pattern measured for the calibrated YSZ (002) orientation of Co 9 S 8 single crystal thin films prepared in Examples 1, 2, and 3 of the present invention.
图2为本发明实施例1制备的Co9S8单晶薄膜的校准YSZ(002)取向测得的RSM图。Fig. 2 is an RSM diagram measured for the calibrated YSZ (002) orientation of the Co 9 S 8 single crystal thin film prepared in Example 1 of the present invention.
图3为本发明实施例1制备的Co9S8单晶薄膜的校准YSZ(202)测得的Phi-Scan图。Fig. 3 is a Phi-Scan diagram measured by the calibration YSZ (202) of the Co 9 S 8 single crystal thin film prepared in Example 1 of the present invention.
图4为本发明实施例1、2、3制备的Co9S8单晶薄膜的变温电阻图。Fig. 4 is a temperature-varying resistance diagram of Co 9 S 8 single crystal thin films prepared in Examples 1, 2, and 3 of the present invention.
具体实施方式Detailed ways
下面结合附图和实施例对本发明做进一步详细说明。The present invention will be described in further detail below in conjunction with the accompanying drawings and embodiments.
实施例1Example 1
本实施例提供一种Co9S8单晶过渡金属硫化物薄膜的制备方法,具体包括如下步骤:This embodiment provides a method for preparing a Co 9 S 8 single crystal transition metal sulfide film, which specifically includes the following steps:
步骤1.称取CoS粉末2g,并使用玛瑙研钵在真空手套箱中研磨30min;研磨好后使用压片机进行压片,压片压力为20Mpa、时间为10min;压片完成后将压好的靶材和陶瓷垫片一同放入石英管中,并用真空封管机进行真空封管,封管真空度控制在4.5×10-4pa;封管完成后将石英管放入管式炉中进行靶材烧结,烧结温度为750℃、保温时间为12h、升温速率为5℃/min,烧结完成后即可得到CoS的靶材;Step 1. Weigh 2g of CoS powder, and grind it in a vacuum glove box for 30 minutes with an agate mortar; after grinding, use a tablet machine to compress the tablet, the tablet pressure is 20Mpa, and the time is 10min; The target material and the ceramic spacer were put into the quartz tube together, and the tube was vacuum sealed with a vacuum tube sealing machine, and the vacuum degree of the tube sealing was controlled at 4.5×10 -4 Pa; after the tube sealing was completed, the quartz tube was put into the tube furnace Carry out target sintering, the sintering temperature is 750°C, the holding time is 12h, and the heating rate is 5°C/min. After the sintering is completed, the CoS target can be obtained;
步骤2.将YSZ基片依次用丙酮、酒精、去离子水进行超声波清洗,清洗时间各为5min;清洗完毕后使用氮气枪将其吹干;
步骤3.将烧结好的靶材首先使用细砂纸将其打磨光滑,再使用导电碳胶将靶材粘到靶材托上;将YSZ基片使用导电银浆将基片粘到基片台上,并用加热台将银浆快速烤干;将靶材和基片一同放入脉冲激光沉积系统中,靶材和基底之间的间距控制在55mm;在脉冲激光沉积系统中于YSZ基片上沉积生长Co9S8单晶过渡金属硫化物薄膜,沉积生长参数为:真空度控制在4.5×10-4pa、温度为600℃、激光频率为9Hz、能量密度为1.6J/cm2、激光脉冲数为18000pulses,即可得到厚度为60nm的Co9S8单晶过渡金属硫化物薄膜。
实施例2Example 2
本实施例提供一种Co9S8单晶过渡金属硫化物薄膜的制备方法,其与实施例1的唯一区别在于:步骤3中,激光脉冲数由18000pulses变为30000pulses,得到厚度由60nm变为100nm的Co9S8单晶过渡金属硫化物薄膜。This embodiment provides a method for preparing a Co 9 S 8 single crystal transition metal sulfide film. The only difference between it and Embodiment 1 is that in
实施例3Example 3
本实施例提供一种Co9S8单晶过渡金属硫化物薄膜的制备方法,其与实施例1的唯一区别在于:所述步骤3中,生长温度由600℃变为700℃,其他生长条件保持不变的Co9S8单晶过渡金属硫化物薄膜。This example provides a method for preparing a Co 9 S 8 single crystal transition metal sulfide film. The only difference between it and Example 1 is that in
如图1所示为上述实施例1、2、3制备的Co9S8薄膜的校准(002)取向测得的XRD图,由图可见,薄膜出现的峰均是和基片的取向一致的峰,说明了我们的薄膜是外延生长的。As shown in Figure 1, the XRD pattern measured for the calibration (002) orientation of the Co 9 S 8 thin film prepared in the above-mentioned
如图2所示为实施例1制备的Co9S8薄膜的校准YSZ(002)取向测得的RSM图,从RSM图可以看出,薄膜与基片的外延关系良好。Figure 2 shows the RSM diagram measured for the calibrated YSZ(002) orientation of the Co 9 S 8 film prepared in Example 1. It can be seen from the RSM diagram that the epitaxial relationship between the film and the substrate is good.
如图3所示为实施例1制备的Co9S8薄膜的校准YSZ(202)取向测得的Phi-Scan图,由图可见,薄膜在0-360度范围内出现了4个峰,表明了薄膜具有四重对称性,体现出了薄膜与基片的良好外延关系。As shown in Figure 3, it is the Phi-Scan figure that the calibration YSZ (202) orientation of the Co 9 S 8 film prepared in Example 1 measures, as can be seen from the figure, there are 4 peaks in the film in the range of 0-360 degrees, indicating that The film has four-fold symmetry, which reflects the good epitaxial relationship between the film and the substrate.
如图4所示为实施例1、2、3制备的Co9S8薄膜的变温电阻数据图,根据数据得知,Co9S8的电阻很小,此次测试的样品电阻均在10欧姆以下,从电阻变温电阻随温度变化趋势得知,Co9S8薄膜电阻呈现的是随着温度电阻增加即金属特性,并且较高的温度和更厚的膜有着更加优异的电学性能。As shown in Figure 4, it is the variable temperature resistance data diagram of the Co 9 S 8 film prepared in Examples 1, 2, and 3. According to the data, the resistance of Co 9 S 8 is very small, and the sample resistance of this test is all at 10 ohms In the following, it is known from the variation trend of resistance temperature resistance with temperature that Co 9 S 8 thin film resistors exhibit metallic characteristics as the temperature resistance increases, and higher temperatures and thicker films have more excellent electrical properties.
以上所述,仅为本发明的具体实施方式,本说明书中所公开的任一特征,除非特别叙述,均可被其他等效或具有类似目的的替代特征加以替换;所公开的所有特征、或所有方法或过程中的步骤,除了互相排斥的特征和/或步骤以外,均可以任何方式组合。The above is only a specific embodiment of the present invention. Any feature disclosed in this specification, unless specifically stated, can be replaced by other equivalent or alternative features with similar purposes; all the disclosed features, or All method or process steps may be combined in any way, except for mutually exclusive features and/or steps.
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