CN114634353A - 一种低介低损耗近零温漂低温共烧陶瓷材料及其制备方法 - Google Patents
一种低介低损耗近零温漂低温共烧陶瓷材料及其制备方法 Download PDFInfo
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- 229910010293 ceramic material Inorganic materials 0.000 title claims abstract description 51
- 238000002360 preparation method Methods 0.000 title abstract description 33
- 239000000919 ceramic Substances 0.000 claims abstract description 79
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 claims abstract description 39
- 229910052593 corundum Inorganic materials 0.000 claims abstract description 35
- 229910001845 yogo sapphire Inorganic materials 0.000 claims abstract description 35
- 238000012360 testing method Methods 0.000 claims abstract description 16
- 229910001404 rare earth metal oxide Inorganic materials 0.000 claims abstract description 15
- 239000011521 glass Substances 0.000 claims description 47
- 239000000758 substrate Substances 0.000 claims description 34
- 239000000843 powder Substances 0.000 claims description 24
- 239000000463 material Substances 0.000 claims description 20
- 238000005245 sintering Methods 0.000 claims description 20
- 239000002002 slurry Substances 0.000 claims description 15
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 11
- -1 phosphate ester Chemical class 0.000 claims description 9
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 claims description 8
- 239000002994 raw material Substances 0.000 claims description 8
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 claims description 6
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 6
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 claims description 6
- QGZKDVFQNNGYKY-UHFFFAOYSA-O Ammonium Chemical compound [NH4+] QGZKDVFQNNGYKY-UHFFFAOYSA-O 0.000 claims description 4
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 claims description 4
- 238000005452 bending Methods 0.000 claims description 4
- 239000011230 binding agent Substances 0.000 claims description 4
- 239000003795 chemical substances by application Substances 0.000 claims description 4
- 239000002270 dispersing agent Substances 0.000 claims description 4
- ZKATWMILCYLAPD-UHFFFAOYSA-N niobium pentoxide Inorganic materials O=[Nb](=O)O[Nb](=O)=O ZKATWMILCYLAPD-UHFFFAOYSA-N 0.000 claims description 4
- 239000004014 plasticizer Substances 0.000 claims description 4
- 229920000058 polyacrylate Polymers 0.000 claims description 4
- 229920002503 polyoxyethylene-polyoxypropylene Polymers 0.000 claims description 4
- 229910002637 Pr6O11 Inorganic materials 0.000 claims description 3
- 239000002518 antifoaming agent Substances 0.000 claims description 3
- CETPSERCERDGAM-UHFFFAOYSA-N ceric oxide Chemical compound O=[Ce]=O CETPSERCERDGAM-UHFFFAOYSA-N 0.000 claims description 3
- 229910000422 cerium(IV) oxide Inorganic materials 0.000 claims description 3
- MRELNEQAGSRDBK-UHFFFAOYSA-N lanthanum oxide Inorganic materials [O-2].[O-2].[O-2].[La+3].[La+3] MRELNEQAGSRDBK-UHFFFAOYSA-N 0.000 claims description 3
- KTUFCUMIWABKDW-UHFFFAOYSA-N oxo(oxolanthaniooxy)lanthanum Chemical compound O=[La]O[La]=O KTUFCUMIWABKDW-UHFFFAOYSA-N 0.000 claims description 3
- 239000001856 Ethyl cellulose Substances 0.000 claims description 2
- ZZSNKZQZMQGXPY-UHFFFAOYSA-N Ethyl cellulose Chemical compound CCOCC1OC(OC)C(OCC)C(OCC)C1OC1C(O)C(O)C(OC)C(CO)O1 ZZSNKZQZMQGXPY-UHFFFAOYSA-N 0.000 claims description 2
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- 229910019142 PO4 Inorganic materials 0.000 claims description 2
- 229920002319 Poly(methyl acrylate) Polymers 0.000 claims description 2
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- XSTXAVWGXDQKEL-UHFFFAOYSA-N Trichloroethylene Chemical group ClC=C(Cl)Cl XSTXAVWGXDQKEL-UHFFFAOYSA-N 0.000 claims description 2
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 claims description 2
- 150000001412 amines Chemical class 0.000 claims description 2
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- 229920001249 ethyl cellulose Polymers 0.000 claims description 2
- 235000019325 ethyl cellulose Nutrition 0.000 claims description 2
- 239000000194 fatty acid Substances 0.000 claims description 2
- 229930195729 fatty acid Natural products 0.000 claims description 2
- 235000021323 fish oil Nutrition 0.000 claims description 2
- RBNPOMFGQQGHHO-UHFFFAOYSA-N glyceric acid Chemical compound OCC(O)C(O)=O RBNPOMFGQQGHHO-UHFFFAOYSA-N 0.000 claims description 2
- WGCNASOHLSPBMP-UHFFFAOYSA-N hydroxyacetaldehyde Natural products OCC=O WGCNASOHLSPBMP-UHFFFAOYSA-N 0.000 claims description 2
- 239000010452 phosphate Substances 0.000 claims description 2
- XNGIFLGASWRNHJ-UHFFFAOYSA-L phthalate(2-) Chemical compound [O-]C(=O)C1=CC=CC=C1C([O-])=O XNGIFLGASWRNHJ-UHFFFAOYSA-L 0.000 claims description 2
- 229920002037 poly(vinyl butyral) polymer Polymers 0.000 claims description 2
- 229920001223 polyethylene glycol Polymers 0.000 claims description 2
- 229920001451 polypropylene glycol Polymers 0.000 claims description 2
- 229920002451 polyvinyl alcohol Polymers 0.000 claims description 2
- 150000003839 salts Chemical class 0.000 claims description 2
- 229920002545 silicone oil Polymers 0.000 claims description 2
- UBOXGVDOUJQMTN-UHFFFAOYSA-N trichloroethylene Natural products ClCC(Cl)Cl UBOXGVDOUJQMTN-UHFFFAOYSA-N 0.000 claims description 2
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- 238000004891 communication Methods 0.000 abstract description 5
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- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 28
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- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 5
- 238000005266 casting Methods 0.000 description 4
- 229910052681 coesite Inorganic materials 0.000 description 4
- 230000000052 comparative effect Effects 0.000 description 4
- 229910052906 cristobalite Inorganic materials 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 4
- 239000000203 mixture Substances 0.000 description 4
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- 229910052682 stishovite Inorganic materials 0.000 description 4
- 229910052905 tridymite Inorganic materials 0.000 description 4
- 238000011161 development Methods 0.000 description 3
- 229910052760 oxygen Inorganic materials 0.000 description 3
- 239000001301 oxygen Substances 0.000 description 3
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- 239000000126 substance Substances 0.000 description 3
- 238000010998 test method Methods 0.000 description 3
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 239000002131 composite material Substances 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 238000002425 crystallisation Methods 0.000 description 2
- 230000008025 crystallization Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000005357 flat glass Substances 0.000 description 2
- 239000000156 glass melt Substances 0.000 description 2
- 150000002500 ions Chemical group 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000010287 polarization Effects 0.000 description 2
- 238000010345 tape casting Methods 0.000 description 2
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 229910052784 alkaline earth metal Inorganic materials 0.000 description 1
- 150000001342 alkaline earth metals Chemical class 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- WMWLMWRWZQELOS-UHFFFAOYSA-N bismuth(III) oxide Inorganic materials O=[Bi]O[Bi]=O WMWLMWRWZQELOS-UHFFFAOYSA-N 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 238000010344 co-firing Methods 0.000 description 1
- 238000013329 compounding Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000007123 defense Effects 0.000 description 1
- 238000000280 densification Methods 0.000 description 1
- 239000003989 dielectric material Substances 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 230000002708 enhancing effect Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000009472 formulation Methods 0.000 description 1
- 239000002241 glass-ceramic Substances 0.000 description 1
- 229910052909 inorganic silicate Inorganic materials 0.000 description 1
- 239000005355 lead glass Substances 0.000 description 1
- 239000007791 liquid phase Substances 0.000 description 1
- 239000006060 molten glass Substances 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 229910052573 porcelain Inorganic materials 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- 229910052761 rare earth metal Inorganic materials 0.000 description 1
- 150000002910 rare earth metals Chemical class 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000005368 silicate glass Substances 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 239000006104 solid solution Substances 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 229910001428 transition metal ion Inorganic materials 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
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Abstract
本发明涉及电子陶瓷材料及其制造技术领域,具体涉及一种具有低介低损耗近零温漂性能的低温共烧陶瓷材料,并进一步公开其制备方法。本发明所述低介低损耗近零温漂的低温共烧陶瓷材料由ZnO‑SiO2‑Al2O3玻璃、Al2O3、稀土氧化物制备而成,使用SPDR测试方法,在室温以及测试频率20GHz下,介电常数为7±0.5,介电损耗<2×10‑3;在‑40℃~110℃温度范围内以及测试频率20GHz下,温漂为±3ppm/℃以内;此外,低温共烧陶瓷材料的抗弯强度>150MPa,可应用于5G通讯毫米波天线模组。
Description
技术领域
本发明涉及电子陶瓷材料及其制造技术领域,具体涉及一种具有低介低损耗近零温漂性能的低温共烧陶瓷材料,并进一步公开其制备方法。
背景技术
近年来,在半导体技术飞速发展的带动下,电子元器件不断向小型化、集成化和高频化方向发展。选择适当的能与银等导电材料在不超过900℃的温度下低温共烧的陶瓷,从而制作多层元件或把无源器件埋入多层电路基板中,成为上述趋势的必然要求,作为无源集成元件主要介质材料的低温共烧陶瓷也因此成为一种重要的发展趋势。
低温共烧陶瓷LTCC(Low Temperature Co-fired Ceramic)材料主要是将适量烧结助剂引入介质陶瓷系统后,利用液相烧结机制促进材料的致密化,所述烧结助剂通常为低熔点氧化物或低熔点玻璃,例如,在CaO-B2O3体系中加入B2O3、Bi2O3等可使烧结温度下降至950℃。低温共烧陶瓷技术具有阻抗可控、传输损耗低、组装密度高、功能模块丰富等优点,是微波/毫米波电路组件实现小型化、多功能化、高可靠性化、低成本化不可或缺的关键技术。
研究表明,高频低介低损耗LTCC基板材料的开发是LTCC技术能否在微波/毫米波领域成功应用的关键。目前,国内外广泛应用的LTCC基板材料主要分为两大类:玻璃/陶瓷体系和微晶玻璃体系。玻璃/陶瓷体系的理化性能主要由添加的陶瓷相决定,具有性能稳定、工艺适应性好等优点;但其组成含有近50%的玻璃相,导致基板的高频介电损耗大,限制了其高频应用,如硼硅酸铅玻璃/氧化铝体系的应用频率一般在8GHz以下。微晶玻璃体系的理化性能由析出的晶体种类与数量控制,这类基板材料烧结后残余玻璃相极少,故具有优良的高频性能,如CaO-B2O3-SiO2微晶玻璃的应用频率可达100GHz;但微晶玻璃体系的析晶行为对烧结工艺极其敏感,导致产品工艺控制难度大,产品性能稳定性差。
国防科技大学的陈兴宇等人以无铅低软化点的La2O3-B2O3-Al2O3(LBA)微晶玻璃和Al2O3制备了新型微晶玻璃/陶瓷复合材料,并在900℃烧结的60%-LBA玻璃+40%-Al2O3复合材料,其在8.1GHz下介电常数为7.91,介电损耗为2.12×10-3。又如中国专利CN109608050A中方案,其以60%MO-BAS(碱土金属氧化物-BaO-Al2O3-SiO2)微晶玻璃与40%Al2O3复合制得的微晶玻璃/陶瓷系LTCC基板材料,在875℃烧结3.5h后,所得材料在9-11GHz下介电常数为5.82,介电损耗为7.52×10-3,抗弯强度为102.7MPa。虽然该材料的烧结温度达到使用要求,但是介电损耗仍然较大,不适用于毫米波天线模组等5G通讯领域。
发明内容
为此,本发明所要解决的技术问题在于提供一种低介低损耗近零温漂的低温共烧陶瓷材料,以满足5G通讯中毫米波天线模组的性能要求;
本发明所要解决的第二个技术问题在于提供所述低介低损耗近零温漂的低温共烧陶瓷材料的制备方法。
为解决上述技术问题,本发明所述的一种低介低损耗近零温漂低温共烧陶瓷材料,以所述材料的总量计,包括如下质量含量的组分:
ZnO-SiO2-Al2O3玻璃 45-65wt%;
Al2O3 35-50wt%;
稀土氧化物 0-15wt%。
具体的,所述ZnO-SiO2-Al2O3玻璃包括如下质量含量的原料成分:
其中,x为1或2,y为1、2、3或5;
所述R元素选自Zr元素、Ba元素、Sb元素、Cu元素或Ti元素中的至少一种。
具体的,所述稀土氧化物包括CeO2、Pr6O11、La2O3、Nb2O5中的至少一种。
具体的,所述低温共烧陶瓷材料中,控制所述Al2O3组分的含量与所述玻璃中Al2O3的含量之和占所述低温共烧陶瓷材料总量的43-63wt%。
具体的,所述低温共烧陶瓷材料中,控制所述玻璃粉中的ZnO、SiO2、RxOy分别占所述低温共烧陶瓷材料总量的26.55-39.55%、8.55-13.65%、0.045-0.65%。
具体的,本发明所述低温共烧陶瓷材料使用SPDR测试方法,在室温以及测试频率20GHz下,介电常数为7±0.5,介电损耗<2×10-3,温漂(谐振频率温度系数)为±3以内,强度>150MPa。
具体的,本发明所述低温共烧陶瓷材料的制备方法,包括按照选定的含量比例取所述ZnO-SiO2-Al2O3玻璃、氧化铝和选定稀土氧化物混合的步骤,进一步经球磨、烘干及过筛处理,得到配方粉。
本发明还公开了一种低介低损耗近零温漂低温共烧陶瓷浆料,包括所述低温共烧陶瓷材料以及有机载体,其中,所述低温共烧陶瓷材料占所述浆料的质量含量为37-48wt%。
具体的,本发明所述低介低损耗近零温漂低温共烧陶瓷浆料的制备方法,则包括将所述低温共烧陶瓷材料与所述有机载体进行充分混合的步骤。
具体的,所述有机载体包括粘结剂、增塑剂及溶解剂,进一步包括分散剂、消泡剂。
具体的,所述粘结剂包括PVA、PVB、聚丙烯酸甲脂、乙基纤维素、丙烯酸乳剂、聚丙烯酸胺盐中一种;
所述增塑剂包括聚乙二醇、邻苯二甲酸脂、乙二醇中一种;
所述溶解剂包括水、乙醇、甲乙酮、三氯乙烯、甲苯、二甲苯中的一种;
所述分散剂包括聚丙烯酸铵、磷酸脂、乙氧基化合物、鲜鱼油中的一种;
所述消泡剂包括乳化硅油、高碳醇脂肪酸酯复合物、聚氧乙烯聚氧丙烯季戊四醇醚、聚氧乙烯聚氧丙醇胺醚、聚氧丙烯甘油醚、聚氧丙烯中的一种。
本发明还公开了一种低介低损耗近零温漂低温共烧陶瓷生瓷带,由所述低温共烧陶瓷浆料制备形成。
具体的,本发明所述低介低损耗近零温漂低温共烧陶瓷生瓷带的制备方法,则包括将所述的低温共烧陶瓷材料基于流延法制备所需生瓷带的步骤。
本发明公开了一种低介低损耗近零温漂低温共烧陶瓷基板,由所述低温共烧陶瓷材料制成。
本发明还公开了一种低介低损耗近零温漂低温共烧陶瓷基板,由所述低温共烧陶瓷生瓷带经烧结制得。
具体的,本发明还公开了一种制备所述低介低损耗近零温漂低温共烧陶瓷基板的方法,包括如下步骤:
(1)按照选定的含量比例取所述ZnO-SiO2-Al2O3玻璃、氧化铝和选定稀土氧化物混合,经球磨、烘干及过筛处理,得到配方粉,备用;
(2)将所得配方粉制成生瓷带,经烧结处理,即得所需低介低损耗近零温漂低温共烧陶瓷基板。
具体的,所述步骤(1)中,所述球磨步骤中,控制所述原料、水和氧化锆球的质量比为1:1.2-1.5:2.4-3;
控制氧化锆球直径为1.5mm,控制球磨转速为300-350r/min,球磨时间为2-5h。
控制烘干步骤的温度为80-180℃,烘干时间为3-12h。
控制过筛步骤的筛网为80目。
具体的,所述步骤(2)中,所述烧结步骤包括:控制所述生瓷带在含氧气氛下,自室温升至230-270℃,再自230-270℃升温至330-370℃,最后自330-370℃升温至840-890℃。
具体的,控制各梯度温度阶段的升温速率彼此独立的为1-5℃/min。
优选的,控制所述烧结步骤保温烧结的时间为2-4h。
所述步骤(2)中,所述制备生瓷带的步骤包括流延法,具体包括将所述配方粉制成所需低温共烧陶瓷浆料的步骤。
具体的,本发明所述低介低损耗近零温漂低温共烧陶瓷材料、浆料、生瓷带和基板的制备方法中,还包括制备选定成分及含量的所述ZnO-SiO2-Al2O3玻璃的步骤,即按照选定的成分和含量,取各原料成分混合,经高温熔制成玻璃熔浆,并经冷却对辊成片状玻璃,再经陶瓷对辊成粗玻璃,然后经过干式粉碎和气流粉碎将粗玻璃制成所需ZnO-SiO2-Al2O3玻璃。
本发明还公开了所述低介低损耗近零温漂低温共烧陶瓷材料用于制备LTCC器件的用途。
本发明所述低介低损耗近零温漂的低温共烧陶瓷材料包括ZnO-SiO2-Al2O3玻璃、Al2O3、稀土氧化物。本发明所使用的ZnO-SiO2-Al2O3玻璃,其中ZnO中的Zn2+属于过渡金属离子结构,外层有18个电子,电子云容易变形,可以通过极化增加其共价成分,与玻璃网络形成体离子争夺氧离子的能力更强,并容易引起[SiO4]四面体聚会合结构的解聚,从而降低玻璃熔体的粘度,增强玻璃熔化效果;而SiO2和Al2O3属于玻璃网络的形成体和中间体,结合能高,在外电场作用下不易产生极化,因此玻璃能表现出较低的介电常数和介电损耗,同时还可以抑制玻璃的析晶;RxOy的加入主要起到提高玻璃的热稳定性、化学稳定性和机械强度的作用。另外,本方面所述陶瓷材料所加入的稀土氧化物可以与氧化铝形成固溶体,由于离子半径的不同,导致得到不同的容差因子,引起不同程度的氧八面体畸变,从而达到降低温漂的作用。
本发明所述低介低损耗近零温漂的低温共烧陶瓷材料,使用SPDR测试方法,在室温以及测试频率介电常数为7±0.5,介电损耗<2×10-3,在-40℃~110℃温度范围内以及测试频率20GHz下,温漂(谐振频率温度系数)为±3以内;此外,所述低温共烧陶瓷材料的强度>150MPa。所述低温共烧陶瓷材料可应用于5G通讯毫米波天线模组。
具体实施方式
制备例1-5
分别按照下表1中记载的质量百分比进行选定成分的配料,将选定原材料共混,经高温熔制成玻璃熔浆,并经冷却对辊成片状玻璃,再经陶瓷对辊成粗玻璃,然后经过干式粉碎和气流粉碎将粗玻璃制成所需组分的ZnO-SiO2-Al2O3玻璃。
表1所述ZnO-SiO2-Al2O3玻璃成分配料表(wt%)
实施例1
本实施例所述低介低损耗近零温漂低温共烧陶瓷基板的制备方法,包括如下步骤:
(1)按照下表2中所述的成分及质量百分比含量进行配料,取制备例1中得到的ZnO-SiO2-Al2O3玻璃、Al2O3以及选定稀土氧化物混合,并按照制备原料物料:水:氧化锆球质量比为1:1.4:2.8的比例加入水和氧化锆球,控制氧化锆球直径为1.5mm,控制球磨转速为300r/min,进行球磨5h,随后经180℃烘干3h至完全烘干后,使用80目筛网过筛,得到配方粉,备用;
(2)将所得配方粉,经轧膜/流延将过筛后的配方粉制成膜片/生瓷带,随后所述生瓷带在空气气氛下,控制升温速率为3℃/min,自室温升至250℃,再控制升温速率为1℃/min,自250℃升温至350℃,最后控制升温速率为4℃/min,自350℃升温至840℃,并进行保温烧结4h,经烧结处理后将所述生瓷带制成基板,即得所需低温共烧陶瓷基板。
实施例2
本实施例所述低介低损耗近零温漂低温共烧陶瓷基板的制备方法,包括如下步骤:
(1)按照下表2中所述的成分及质量百分比含量进行配料,取制备例2中得到的ZnO-SiO2-Al2O3玻璃、Al2O3以及选定稀土氧化物混合,并按照制备原料物料:水:氧化锆球质量比为1:1.5:3的比例加入水和氧化锆球,控制氧化锆球直径为1.5mm,控制球磨转速为320r/min,进行球磨4h,随后经150℃烘干6h至完全烘干后,使用80目筛网过筛,得到配方粉,备用;
(2)将所得配方粉,经轧膜/流延将过筛后的配方粉制成膜片/生瓷带,随后所述生瓷带在空气气氛下,控制升温速率为3℃/min,自室温升至250℃,再控制升温速率为1℃/min,自250℃升温至350℃,最后控制升温速率为4℃/min,自350℃升温至850℃,并进行保温烧结3h,经烧结处理后将所述生瓷带制成基板,即得所需低温共烧陶瓷基板。
实施例3
本实施例所述低介低损耗近零温漂低温共烧陶瓷基板的制备方法,包括如下步骤:
(1)按照下表2中所述的成分及质量百分比含量进行配料,取制备例3中得到的ZnO-SiO2-Al2O3玻璃、Al2O3以及选定稀土氧化物混合,并按照制备原料物料:水:氧化锆球质量比为1:1.2:2.4的比例加入水和氧化锆球,控制氧化锆球直径为1.5mm,控制球磨转速为340r/min,进行球磨4h,随后经120℃烘干10h至完全烘干后,使用80目筛网过筛,得到配方粉,备用;
(2)将所得配方粉,经轧膜/流延将过筛后的配方粉制成膜片/生瓷带,随后所述生瓷带在空气气氛下,控制升温速率为3℃/min,自室温升至250℃,再控制升温速率为1℃/min,自250℃升温至350℃,最后控制升温速率为4℃/min,自350℃升温至870℃,并进行保温烧结3h,经烧结处理后将所述生瓷带制成基板,即得所需低温共烧陶瓷基板。
实施例4
本实施例所述低介低损耗近零温漂低温共烧陶瓷基板的制备方法,包括如下步骤:
(1)按照下表2中所述的成分及质量百分比含量进行配料,取制备例4中得到的ZnO-SiO2-Al2O3玻璃、Al2O3以及选定稀土氧化物混合,并按照制备原料物料:水:氧化锆球质量比为1:1.3:2.6的比例加入水和氧化锆球,控制氧化锆球直径为1.5mm,控制球磨转速为350r/min,进行球磨2.5h,随后经80℃烘干12h至完全烘干后,使用80目筛网过筛,得到配方粉,备用;
(2)将所得配方粉,经轧膜/流延将过筛后的配方粉制成膜片/生瓷带,随后所述生瓷带在空气气氛下,控制升温速率为3℃/min,自室温升至250℃,再控制升温速率为1℃/min,自250℃升温至350℃,最后控制升温速率为4℃/min,自350℃升温至890℃,并进行保温烧结2.5h,经烧结处理后将所述生瓷带制成基板,即得所需低温共烧陶瓷基板。
实施例5
本实施例所述低介低损耗近零温漂低温共烧陶瓷基板的制备方法同实施例3,其区别仅在于,配方粉中稀土氧化物的添加量不同,具体如表2所示。
实施例6
本实施例所述低介低损耗近零温漂低温共烧陶瓷基板的制备方法同实施例3,其区别仅在于,配方粉中稀土氧化物的添加量不同,具体如表2所示。
实施例7
本实施例所述低介低损耗近零温漂低温共烧陶瓷基板的制备方法同实施例3,其区别仅在于,配方粉中稀土氧化物的添加量不同,具体如表2所示。
实施例8
本实施例所述低介低损耗近零温漂低温共烧陶瓷基板的制备方法同实施例3,其区别仅在于,采用制备例1中制得所述ZnO-SiO2-Al2O3玻璃。
实施例9
本实施例所述低介低损耗近零温漂低温共烧陶瓷基板的制备方法同实施例3,其区别仅在于,采用制备例2中制得所述ZnO-SiO2-Al2O3玻璃。
实施例10
本实施例所述低介低损耗近零温漂低温共烧陶瓷基板的制备方法同实施例3,其区别仅在于,采用制备例4中制得所述ZnO-SiO2-Al2O3玻璃。
实施例11
本实施例所述低介低损耗近零温漂低温共烧陶瓷基板的制备方法同实施例3,其区别仅在于,采用制备例5中制得所述ZnO-SiO2-Al2O3玻璃。
表2各实施例所述配方粉的组分及质量比(wt%)
实施例 | 玻璃粉 | Al<sub>2</sub>O<sub>3</sub> | La<sub>2</sub>O<sub>3</sub> | CeO<sub>2</sub> | Pr<sub>6</sub>O<sub>11</sub> | Nb<sub>2</sub>O<sub>5</sub> |
1 | 60 | 40 | - | - | - | - |
2 | 50 | 40 | 10 | - | - | - |
3 | 55 | 35 | 5 | - | 5 | - |
4 | 52.5 | 35 | 5 | 5 | - | 2.5 |
5 | 55 | 35 | 10 | - | - | - |
6 | 55 | 35 | - | 10 | - | - |
7 | 55 | 35 | - | 5 | - | 5 |
8 | 55 | 35 | 5 | - | - | - |
9 | 55 | 35 | 5 | - | - | - |
10 | 55 | 35 | 5 | - | - | - |
11 | 45 | 50 | 5 | - | - | - |
对比例1
本对比例所述低温共烧陶瓷基板的制备同实施例3,其区别仅在于,所述玻璃为含硼硅酸盐玻璃粉,其成分为B2O3(67.5wt%)、SiO2(15.1wt%)、Al2O3(14.3wt%)、ZnO(2.7%)、CaO(0.4wt%)。
实验例
分别对上述实施例1-11及对比例1中制备的低温共烧陶瓷基板的性能进行测试,测试结果见下表3所示。
在室温以及测试频率20GHz下,使用SPDR测试方法,以测试所述低温共烧陶瓷材料的介电常数和介电损耗;在室温-40℃~110℃温度范围内以及测试频率20GHz下测试低温共烧陶瓷材料的温漂;同时还测试了低温共烧陶瓷材料的抗弯强度。
表3各实施例中烧结样品的性能
编号 | 介电常数 | 损耗角正切 | 温漂(ppm/℃) | 抗弯强度(MPa) |
实施例1 | 6.6 | 1.6×10<sup>-3</sup> | 2.8 | 213 |
实施例2 | 7.4 | 8.3×10<sup>-4</sup> | 1.2 | 179 |
实施例3 | 6.9 | 1.3×10<sup>-3</sup> | 0.9 | 194 |
实施例4 | 7.2 | 1.1×10<sup>-3</sup> | 0.7 | 188 |
实施例5 | 7.0 | 1.5×10<sup>-3</sup> | 1.3 | 190 |
实施例6 | 7.1 | 1.6×10<sup>-3</sup> | 2.5 | 185 |
实施例7 | 7.1 | 1.5×10<sup>-3</sup> | 2.3 | 180 |
实施例8 | 6.6 | 1.1×10<sup>-3</sup> | 1.0 | 195 |
实施例9 | 6.8 | 1.2×10<sup>-3</sup> | 1.1 | 192 |
实施例10 | 7.2 | 1.7×10<sup>-3</sup> | 0.9 | 186 |
实施例11 | 7.5 | 1.2×10<sup>-3</sup> | 2.7 | 152 |
对比例1 | 8.1 | 5.2×10<sup>-3</sup> | 12 | 160 |
可见,本发明所述低介低损耗近零温漂的低温共烧陶瓷材料,在室温以及测试频率20GHz下,介电常数为7±0.5,介电损耗<2×10-3;在室温-40℃~110℃温度范围内以及测试频率20GHz下温漂为±3ppm/℃以内;此外,低温共烧陶瓷材料的抗弯强度>150MPa,可应用于5G通讯中毫米波天线模组。
显然,上述实施例仅仅是为清楚地说明所作的举例,而并非对实施方式的限定。对于所属领域的普通技术人员来说,在上述说明的基础上还可以做出其它不同形式的变化或变动。这里无需也无法对所有的实施方式予以穷举。而由此所引伸出的显而易见的变化或变动仍处于本发明创造的保护范围之中。
Claims (17)
1.一种低介低损耗近零温漂低温共烧陶瓷材料,其特征在于,以所述材料的总量计,包括如下质量含量的组分:
ZnO-SiO2-Al2O3玻璃 45-65wt%;
Al2O3 35-50wt%;
稀土氧化物 0-15wt%。
3.根据权利要求2所述的低介低损耗近零温漂低温共烧陶瓷材料,其特征在于,所述稀土氧化物包括CeO2、Pr6O11、La2O3、Nb2O5中的至少一种。
4.根据权利要求1-3任一项所述的低介低损耗近零温漂低温共烧陶瓷材料,其特征在于,所述低温共烧陶瓷材料中,控制所述Al2O3组分的含量与所述玻璃中Al2O3的含量之和占所述低温共烧陶瓷材料总量的43-63wt%。
5.根据权利要求1-4任一项所述的低介低损耗近零温漂低温共烧陶瓷材料,其特征在于,所述低温共烧陶瓷材料中,控制所述玻璃粉中ZnO、SiO2、RxOy分别占所述低温共烧陶瓷材料总量的26.55-39.55%、8.55-13.65%、0.045-0.65%。
6.根据权利要求1-5任一项所述的低介低损耗近零温漂低温共烧陶瓷材料,其特征在于,所述低温共烧陶瓷材料在室温以及测试频率20GHz下,介电常数为7±0.5。
7.根据权利要求1-5任一项所述的低介低损耗近零温漂低温共烧陶瓷材料,其特征在于,所述低温共烧陶瓷材料在室温以及测试频率20GHz下,介电损耗<2×10-3。
8.根据权利要求1-5任一项所述的低介低损耗近零温漂低温共烧陶瓷材料,其特征在于,所述低温共烧陶瓷材料在-40℃~110℃温度范围内以及测试频率20GHz下,温漂为±3ppm/℃以内。
9.根据权利要求1-5任一项所述的低介低损耗近零温漂低温共烧陶瓷材料,其特征在于,所述低温共烧陶瓷材料的抗弯强度>150MPa。
10.一种低介低损耗近零温漂低温共烧陶瓷浆料,其特征在于,包括如权利要求1-9任一项所述低温共烧陶瓷材料以及有机载体,其中,所述低温共烧陶瓷材料占所述浆料的质量含量为37-48wt%。
11.根据权利要求10所述低介低损耗近零温漂低温共烧陶瓷浆料,其特征在于,所述有机载体包括粘结剂、增塑剂及溶解剂。
12.根据权利要求11所述低介低损耗近零温漂低温共烧陶瓷浆料,其特征在于,所述有机载体还包括分散剂和消泡剂。
13.根据权利要求11所述低介低损耗近零温漂低温共烧陶瓷浆料,其特征在于:
所述粘结剂包括PVA、PVB、聚丙烯酸甲脂、乙基纤维素、丙烯酸乳剂、聚丙烯酸胺盐中一种;
所述增塑剂包括聚乙二醇、邻苯二甲酸脂、乙二醇中一种;
所述溶解剂包括水、乙醇、甲乙酮、三氯乙烯、甲苯、二甲苯中的一种。
14.根据权利要求12所述低介低损耗近零温漂低温共烧陶瓷浆料,其特征在于:
所述分散剂包括聚丙烯酸铵、磷酸脂、乙氧基化合物、鲜鱼油中的一种;
所述消泡剂包括乳化硅油、高碳醇脂肪酸酯复合物、聚氧乙烯聚氧丙烯季戊四醇醚、聚氧乙烯聚氧丙醇胺醚、聚氧丙烯甘油醚、聚氧丙烯中的一种。
15.一种低介低损耗近零温漂低温共烧陶瓷生瓷带,其特征在于,由权利要求10-14任一项所述低温共烧陶瓷浆料制备形成。
16.一种低介低损耗近零温漂低温共烧陶瓷基板,其特征在于,由权利要求1-9任一项所述低温共烧陶瓷材料制成。
17.一种低介低损耗近零温漂低温共烧陶瓷基板,其特征在于,由权利要求15所述低温共烧陶瓷生瓷带经烧结制得。
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