CN114614926A - Simulation test method and device of communication system and electronic equipment - Google Patents
Simulation test method and device of communication system and electronic equipment Download PDFInfo
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- H04B17/30—Monitoring; Testing of propagation channels
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Abstract
The invention provides a simulation test method and device of a communication system and electronic equipment. The simulation test method comprises the following steps: receiving a signal to be detected of a sending end; pre-attenuating the power of a signal to be detected to a preset interval to obtain a pre-attenuated signal; the preset interval is the corresponding interval when the signal-to-noise ratio test accuracy of the channel simulator is smaller than the preset value; inputting the pre-attenuation signal into a preset channel simulator, and performing simulated fading to obtain a simulated test signal; the channel simulator is used for simulating a wireless fading environment when the communication rate is a set rate and the normalized signal-to-noise ratio is a lowest setting interval corresponding to the set rate; and sending the simulation test signal to the receiving end so that the receiving end can test the simulation test signal to complete the simulation test of the communication system. The invention can reduce the signal-to-noise ratio threshold under the low communication rate scene when the simulation test is carried out in the communication system, and realizes the simulation test of the transmission signal with lower communication rate and lower signal-to-noise ratio.
Description
Technical Field
The present invention relates to the field of communications technologies, and in particular, to a method and an apparatus for testing a communication system.
Background
In the field of wireless communication equipment testing, a channel simulator is used for simulating and simulating a wireless fading environment in a communication process. For example, the channel simulator may simulate a transmission signal with a set rate and a set signal-to-noise ratio, simulate and simulate a fading condition of the transmission signal in a wireless fading environment under a set channel fading type. The channel fading conditions of transmission signals with different rates and different signal-to-noise ratios in the same wireless channel environment are different. The test instrument can realize the simulation detection of the transmission signal in the wireless fading environment by detecting parameters such as the power, the bit error rate, the message success rate and the like of the transmission signal after the simulation fading.
In an actual communication system, when the communication rate of a transmission signal is low, the signal-to-noise ratio and the power of the transmission signal are generally low. Simulation with a channel simulator is required to simulate a scenario with a low communication rate and a low signal-to-noise ratio. However, when the communication rate is low, the signal-to-noise ratio that can be simulated by the current channel simulator is generally high, and the simulated signal-to-noise ratio cannot be reduced, and the actual requirement for a low signal-to-noise ratio cannot be met, so that the channel simulator cannot simulate the communication environment when both the communication rate and the signal-to-noise ratio are low.
For example, at present, when the communication rate is 0.1kbps, the snr can only be reduced to 20dB, and the simulation cannot be performed on the communication environment with a lower snr, for example, the channel simulator cannot simulate the communication environment with the communication rate of 0.1kbps and the snr of 5dB, which results in that the simulation test cannot be performed on the transmission signal with a lower communication rate and a lower snr.
Disclosure of Invention
The embodiment of the invention provides a simulation test method and device for a communication system and electronic equipment, which can reduce the signal-to-noise ratio threshold in a low communication rate scene during simulation test in the communication system and realize the simulation test of transmission signals with lower communication rate and lower signal-to-noise ratio.
In a first aspect, an embodiment of the present invention provides a simulation test method for a communication system, which is applied to a simulation test system, where the simulation test system includes a sending end, a receiving end, and a simulation test apparatus, and the simulation test method includes: receiving a signal to be detected of a sending end; pre-attenuating the power of a signal to be detected to a preset interval to obtain a pre-attenuated signal; the preset interval is the corresponding interval when the signal-to-noise ratio test accuracy of the channel simulator is smaller than the preset value; inputting the pre-attenuation signal into a preset channel simulator, and performing simulated fading to obtain a simulated test signal; the channel simulator is used for simulating a wireless fading environment when the communication rate is a set rate and the normalized signal-to-noise ratio is a lowest setting interval corresponding to the set rate; and sending the simulation test signal to the receiving end so that the receiving end can test the simulation test signal to complete the simulation test of the communication system.
The embodiment of the invention provides a simulation test method of a communication system, which comprises the steps of pre-attenuating the power of a signal to be tested, and then inputting the pre-attenuated signal into a preset channel simulator, wherein the channel simulator is used for simulating a wireless fading environment when the communication rate is a set rate and the normalized signal-to-noise ratio is a lowest set interval corresponding to the set rate. Because the normalized signal-to-noise ratio represents the ratio of the average signal power to the noise power spectral density, when the wireless fading environment simulated by the channel simulator is not changed, the noise power spectral density is not changed, the power of the signal to be tested is pre-attenuated, the average signal power can be reduced, and the actual normalized signal-to-noise ratio of the signal to be tested is reduced, namely, when the channel simulator simulates the wireless fading environment, the actual normalized signal-to-noise ratio of the signal to be tested in the simulation test is reduced through pre-attenuation, the signal-to-noise ratio threshold under the low-communication rate scene is reduced when the simulation test in the communication system is carried out, and the simulation test of the transmission signal with lower communication rate and lower signal-to-noise ratio is realized.
In addition, the power of the signal to be tested is within the preset interval, wherein the preset interval is the interval corresponding to the situation that the signal-to-noise ratio test accuracy of the channel simulator is smaller than the preset value, so that the signal-to-noise ratio test accuracy of the channel simulator in the simulation test is ensured, and the test accuracy of the simulation test is ensured.
In a possible implementation manner, pre-attenuating the power of the signal to be detected to a preset interval to obtain a pre-attenuated signal includes: determining a fixed attenuation value, wherein the fixed attenuation value is used for attenuating the power of a signal to be detected to a preset interval; determining a variable attenuation value, wherein the variable attenuation value is used for attenuating the power of a signal to be detected in a preset interval; and attenuating the power of the signal to be detected to a preset interval by the sum of the fixed attenuation value and the variable attenuation value to obtain a pre-attenuation signal.
In one possible implementation, determining a fixed attenuation value includes: determining the power of a signal to be detected; and determining a fixed attenuation value based on the power of the signal to be measured and the endpoint value of the preset interval.
In one possible implementation, determining a variable attenuation value includes: determining a value to be measured of the normalized signal-to-noise ratio and a setting value of the normalized signal-to-noise ratio; setting the value as any value in the lowest setting interval; determining the difference value between the set value and the value to be measured as a variable attenuation value; or, determining a value to be measured of the normalized signal-to-noise ratio and an actual value of the normalized signal-to-noise ratio; the actual normalized signal-to-noise ratio is actually the simulated test signal; and determining the difference value between the actual value and the value to be measured as a variable attenuation value.
In one possible implementation, determining a value to be measured for the normalized signal-to-noise ratio includes: determining any value in a to-be-tested interval of the normalized signal-to-noise ratio in the simulation test as an initial to-be-tested value; determining a set of values to be measured of the normalized signal-to-noise ratio based on the signal-to-noise ratio test accuracy, the adjustment accuracy of the variable attenuation value, and the initial value to be measured, wherein the signal-to-noise ratio test accuracy is smaller than the adjustment accuracy of the variable attenuation value; and determining any value in the value set to be measured as a value to be measured of the normalized signal-to-noise ratio.
In a possible implementation manner, before inputting the pre-attenuation signal to a preset channel simulator to perform simulated fading to obtain a simulated test signal, the simulated test method further includes: determining the minimum value of the lowest setting interval; determining the minimum value as a setting value of the normalized signal-to-noise ratio; and setting a channel simulator by taking the setting value and the setting rate as parameters.
In a possible implementation manner, before inputting the pre-attenuation signal to a preset channel simulator to perform simulated fading to obtain a simulated test signal, the simulated test method further includes: adjusting the setting value of the normalized signal-to-noise ratio in the lowest setting interval based on the signal-to-noise ratio test accuracy; and setting the channel simulator by taking the adjusted setting value and the set rate as parameters.
In a possible implementation manner, before sending the analog test signal to the receiving end, the analog test method further includes: determining a received signal power range of a receiving end; if the power of the analog test signal is greater than the maximum value of the received signal power range, the analog test signal is attenuated based on the received signal power range.
In a second aspect, an embodiment of the present invention provides a simulation test apparatus for a communication system, which is applied to a simulation test system, where the simulation test system includes a sending end, a receiving end, and the simulation test apparatus includes: a communication module and a processing module;
the communication module is used for receiving a signal to be detected of a sending end;
the processing module is used for pre-attenuating the power of the signal to be detected to a preset interval to obtain a pre-attenuated signal; the preset interval is the corresponding interval when the signal-to-noise ratio test accuracy of the channel simulator is smaller than the preset value; inputting the pre-attenuation signal into a preset channel simulator, and performing simulated fading to obtain a simulated test signal; the channel simulator is used for simulating a wireless fading environment when the communication rate is a set rate and the normalized signal-to-noise ratio is a lowest setting interval corresponding to the set rate;
the communication module is further used for sending the simulation test signal to the receiving end so that the receiving end can test the simulation test signal conveniently to complete the simulation test of the communication system.
In a possible implementation manner, the processing module is specifically configured to determine a fixed attenuation value, where the fixed attenuation value is used to attenuate the power of the signal to be detected to a preset interval; determining a variable attenuation value, wherein the variable attenuation value is used for attenuating the power of a signal to be detected in a preset interval; and attenuating the power of the signal to be detected to a preset interval by the sum of the fixed attenuation value and the variable attenuation value to obtain a pre-attenuation signal.
In a possible implementation manner, the processing module is specifically configured to determine the power of the signal to be measured; and determining a fixed attenuation value based on the power of the signal to be measured and the endpoint value of the preset interval.
In a possible implementation manner, the processing module is specifically configured to determine a value to be measured of the normalized signal-to-noise ratio and a setting value of the normalized signal-to-noise ratio; setting the value as any value in the lowest setting interval; determining the difference value between the set value and the value to be measured as a variable attenuation value; or, determining a value to be measured of the normalized signal-to-noise ratio and an actual value of the normalized signal-to-noise ratio; the actual normalized signal-to-noise ratio is actually the simulated test signal; and determining the difference value between the actual value and the value to be measured as a variable attenuation value.
In a possible implementation manner, the processing module is specifically configured to determine any value in a to-be-measured interval of a normalized signal-to-noise ratio in the simulation test as an initial to-be-measured value; determining a set of values to be measured of the normalized signal-to-noise ratio based on the signal-to-noise ratio test accuracy, the adjustment accuracy of the variable attenuation value, and the initial value to be measured, wherein the signal-to-noise ratio test accuracy is smaller than the adjustment accuracy of the variable attenuation value; and determining any value in the set of values to be measured as a value to be measured of the normalized signal-to-noise ratio.
In a possible implementation manner, the processing module is further configured to determine a minimum value of the lowest setting interval; determining the minimum value as a setting value of the normalized signal-to-noise ratio; and setting the channel simulator by taking the setting value and the setting rate as parameters.
In a possible implementation manner, the processing module is further configured to adjust a setting value of the normalized signal-to-noise ratio within a lowest setting interval based on the signal-to-noise ratio test accuracy; and setting the channel simulator by taking the adjusted setting value and the set rate as parameters.
In a possible implementation manner, the processing module is further configured to determine a received signal power range of the receiving end; if the power of the analog test signal is greater than the maximum value of the received signal power range, the analog test signal is attenuated based on the received signal power range.
In a third aspect, an embodiment of the present invention provides a simulation test apparatus for a communication system, where the simulation test apparatus is applied to a simulation test system, the simulation test system includes a sending end, a receiving end, and the simulation test apparatus includes: a variable attenuator and a channel simulator;
the variable attenuator is used for receiving a signal to be detected of a transmitting end; pre-attenuating the power of a signal to be detected to a preset interval to obtain a pre-attenuated signal; the preset interval is the corresponding interval when the signal-to-noise ratio test accuracy of the channel simulator is smaller than the preset value; the pre-attenuated signal is input to a preset channel simulator,
the channel simulator is used for receiving the pre-attenuation signal and carrying out simulated fading to obtain a simulated test signal; the channel simulator is used for simulating a wireless fading environment when the communication rate is a set rate and the normalized signal-to-noise ratio is a lowest setting interval corresponding to the set rate; and the device is also used for sending the simulation test signal to the receiving end so as to facilitate the receiving end to test the simulation test signal and finish the simulation test of the communication system.
In a fourth aspect, an embodiment of the present invention provides an electronic device, where the electronic device includes a memory and a processor, where the memory stores a computer program, and the processor is configured to call and execute the computer program stored in the memory to perform the steps of the method according to the first aspect or any possible implementation manner of the first aspect.
In a fifth aspect, the present invention provides a computer-readable storage medium, which stores a computer program, and when the computer program is executed by a processor, the computer program implements the steps of the method according to the first aspect or any one of the possible implementation manners of the first aspect.
The technical effects brought by any one of the implementation manners of the second aspect to the fifth aspect may refer to the technical effects brought by the first aspect or the corresponding implementation manner of the first aspect, and are not described herein again.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the embodiments or the prior art descriptions will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without inventive exercise.
Fig. 1 is an application scenario diagram of a simulation test method of a communication system according to an embodiment of the present invention;
fig. 2 is a schematic flowchart of a simulation testing method of a communication system according to an embodiment of the present invention;
fig. 3 is a schematic flow chart of a simulation testing method of another communication system according to an embodiment of the present invention;
FIG. 4 is a schematic structural diagram of a simulation testing apparatus according to an embodiment of the present invention;
fig. 5 is a schematic structural diagram of an electronic device according to an embodiment of the present invention.
Detailed Description
In the following description, for purposes of explanation and not limitation, specific details are set forth, such as particular system structures, techniques, etc. in order to provide a thorough understanding of the embodiments of the invention. It will be apparent, however, to one skilled in the art that the present invention may be practiced in other embodiments that depart from these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present invention with unnecessary detail.
In order to make the objects, technical solutions and advantages of the present invention more apparent, the following description is made by way of specific embodiments with reference to the accompanying drawings.
Fig. 1 is an application scenario diagram of a simulation test method of a communication system according to an embodiment of the present invention. As shown in fig. 1, an embodiment of the present invention provides a schematic diagram of a simulation test system of a communication system. The simulation test system comprises a sending end 101, a receiving end 102 and a simulation test device 103. The sending end 101 sends a signal to be tested to the analog testing device 102, the analog testing device 102 simulates a fading type which may be received by the signal to be tested, a wireless fading environment of the signal to be tested is simulated, the analog testing device 102 simulates and simulates the signal to be tested based on the wireless fading environment to obtain an analog testing signal, and the analog testing signal is sent to the receiving end 103. The receiving end 103 detects parameters such as power, bit error rate, message success rate and the like of the analog test signal. Therefore, the simulation test of the signal to be tested in the wireless fading environment is realized.
As shown in fig. 1, the analog testing apparatus 102 may include a variable attenuator 1021 and a channel simulator 1022.
The variable attenuator 1021 performs variable attenuation on the power of the signal to be measured. The attenuation value of the variable attenuator 1021 is adjusted and changed in real time, and accurate control of power attenuation is achieved. Illustratively, the control precision of the variable attenuator is 1dB, and the adjustment range of the attenuation value is 0-110 dB.
The channel simulator 1022 is used for simulating a wireless fading environment to which the signal under test may be subjected. The channel simulator 1022 has processing functions of loading test parameters, detecting signal power, generating channel fading, superimposing noise interference, analyzing and displaying states, and the like. The channel simulator 1022 may perform test parameter loading and signal power detection based on the signal to be tested, and then generate channel fading and noise interference for the signal to be tested, so as to realize simulation and emulation of a wireless fading environment, and obtain an analog test signal.
In some embodiments, the analog testing apparatus 102 may further include an input fixed attenuator 1023, where the input fixed attenuator 1023 is used to perform fixed attenuation on the power of the signal to be tested, so as to attenuate the power of the signal to be tested to a preset range. For example, when the power of the signal to be measured is large, a large fixed attenuation value may be set. A smaller fixed attenuation value may be set when the power of the signal to be measured is smaller.
On one hand, when the power of the signal to be tested is too high, spatial radiation is easily formed to cause spatial coupling, which affects the signal detection of the receiving end 103, and further affects the accuracy of the test. On the other hand, the power of the signal to be tested is too small to meet the power requirement of the channel simulator 1022 for the signal to be tested, which affects the testing accuracy of the channel simulator 1022.
Illustratively, the power of the signal to be measured is [ -5dBm, +5dBm ], the attenuation parameter input into the fixed attenuator is 10dB, and the power of the signal to be measured after attenuation is [ -15dBm, -5dBm ].
In some embodiments, the analog testing apparatus 102 may further include an output fixed attenuator 1024, and the output fixed attenuator 1024 is used to attenuate the analog testing signal output by the channel simulator, so that the receiving end can receive the analog testing signal.
It should be noted that the signal simulator 1022 has a high accuracy, which can reach 0.1dB, when the power of its input signal is [ -20dBm, 0dBm ]. The effective range of output power of the channel simulator 1022 is [ -60dBm, -40dBm ]. And this range may not meet the requirements of the receiving end. For example, when the power range of the input signal of the receiving end 103 is required to be [ -80dBm, -60dBm ], the analog test signal needs to be attenuated by the output fixed attenuator 1024 and then transmitted to the receiving end 103. The receiving end 103 detects normally.
It should be noted that the simulation test method for a communication system provided by the embodiment of the present invention can simulate data transmission processes of various communication systems. For example, a wireless communication system based on a 5G communication technology, a wireless communication system based on a scattering communication technology, a wireless communication system based on a short-wave communication technology, and a wireless communication system in which a plurality of communication technologies are integrated. The simulation test method of the communication system provided by the embodiment of the invention can also simulate various communication scenes. For example, communication scenarios between communication base stations and terminals, communication scenarios between military communication vehicles and military communication vehicles, and transmission scenarios between civilian stations and audience terminals. Those skilled in the art can find that, with the evolution of network architecture and the emergence of new service scenarios, the technical solution provided by the embodiment of the present invention is also applicable to similar technical problems.
Based on the simulation test apparatus shown in fig. 1, as shown in fig. 2, an embodiment of the present invention provides a simulation test method for a communication system, which is applied to a simulation test system, where the simulation test system includes a sending end, a receiving end, and a simulation test apparatus. The simulation test method is executed by a simulation test device. The simulation test method includes steps S201 to S204.
S201, the simulation test device receives a signal to be tested of a sending end.
Correspondingly, the sending end sends a signal to be tested to the simulation test device.
In some embodiments, the signal under test has a uniform communication rate and transmission frequency. For example, the sending end may set parameters such as a working mode of the sending end, a communication rate of the signal to be detected, and a transmission frequency.
As a possible implementation manner, the analog testing apparatus may periodically receive a signal to be tested sent by the sending end, so as to complete testing of different wireless fading environments.
S202, simulating the power of the signal to be tested to a preset interval by the test device to obtain a pre-attenuation signal.
The preset interval is the corresponding interval when the signal-to-noise ratio test accuracy of the channel simulator is smaller than the preset value.
For example, the preset interval may be [ -20dB, -0dBm ]. The channel simulator has high accuracy up to 0.1dB when the power of the input signal is [ -20dBm, 0dBm ]. The preset interval may also set other ranges according to the accuracy that the channel simulator can achieve, and is not limited herein.
Alternatively, the analog testing device may obtain the pre-attenuation signal through steps A1-A3.
A1, the simulation test device determines a fixed attenuation value.
The fixed attenuation value is used for attenuating the power of the signal to be detected to a preset interval.
As a possible implementation, the analog testing device may determine the power of the signal to be tested; and determining a fixed attenuation value based on the power of the signal to be measured and the endpoint value of the preset interval.
Illustratively, assuming that the preset interval is [ -20dB, -0dBm ], the power of the signal to be measured is +5dBm, and the fixed attenuation value is 5dBm or 25 dBm.
A2, determining a variable attenuation value by a simulation test device.
The variable attenuation value is used for attenuating the power of the signal to be measured in a preset interval.
It should be noted that, after the analog testing device attenuates the power of the signal to be tested to the prediction interval based on the fixed attenuation value, the analog testing device implements attenuation of the signal to be tested in different degrees in the preset interval by changing the variable attenuation value, so as to complete the test of the wireless fading environment.
Alternatively, the analog testing device may determine the variable attenuation value based on the value to be measured of the normalized signal-to-noise ratio.
As a possible implementation manner, the analog testing device may determine a value to be measured of the normalized signal-to-noise ratio and a setting value of the normalized signal-to-noise ratio; setting the value as any value in the lowest setting interval; and determining the difference value between the set value and the value to be measured as a variable attenuation value.
As another possible implementation, the simulation test apparatus may determine a value to be measured of the normalized signal-to-noise ratio and an actual value of the normalized signal-to-noise ratio; the actual normalized signal-to-noise ratio is actually the simulated test signal; and determining the difference value between the actual value and the value to be measured as a variable attenuation value.
It should be noted that the normalized snr represents the ratio of the average signal power to the noise power spectral density. When the wireless fading environment simulated by the channel simulator is not changed, the noise power spectral density is not changed, the power of the signal to be tested is pre-attenuated, and the average signal power can be reduced, so that the actual normalized signal-to-noise ratio of the signal to be tested is reduced.
Alternatively, the analog testing device may determine the value to be measured for the normalized signal-to-noise ratio based on steps B1-B3.
And B1, the simulation test device determines any value in the test interval of the normalized signal-to-noise ratio in the simulation test as an initial test value.
In some embodiments, the interval to be tested of the normalized snr is a set of normalized snrs that the analog testing device needs to perform a test.
For example, the simulation test apparatus may determine the actual normalized signal-to-noise ratio when the variable attenuation value is zero and the normalized signal-to-noise ratio is the lowest setting value corresponding to the set rate as the initial value to be measured. In this way, the analog testing device can determine the to-be-measured value set of the normalized signal-to-noise ratio by changing the variable attenuation value.
As another example, the analog testing device may further determine an endpoint value or a midpoint value of the interval to be tested as the initial value to be tested.
B2, the simulation testing device determines the value set to be tested of the normalized signal-to-noise ratio based on the testing accuracy of the signal-to-noise ratio, the adjusting accuracy of the variable attenuation value and the initial value to be tested.
Wherein the signal-to-noise ratio test accuracy is less than the adjustment accuracy of the variable attenuation value.
Illustratively, the signal-to-noise ratio test accuracy may be 0.1dB and the adjustment accuracy of the variable attenuation value may be 1 dB.
It will be appreciated that the channel simulator may change the setting of the normalized signal-to-noise ratio by changing the setting parameters. Illustratively, the channel simulator may change the setting of the normalized signal-to-noise ratio at a granularity of 0.1dB when the signal-to-noise ratio test accuracy is 0.1 dB. Accordingly, the simulation test apparatus can change the variable attenuation value with the adjustment accuracy of the variable attenuation value as a granularity.
Therefore, the simulation test device can obtain the to-be-tested value set of the normalized signal-to-noise ratio with the signal-to-noise ratio test accuracy with smaller granularity as the granularity.
B3, the analog testing device determines any value in the set of values to be tested as the value to be tested of the normalized signal-to-noise ratio.
It can be understood that, the analog testing device pre-attenuates the power of the signal to be tested to a preset interval, which can ensure that the signal-to-noise ratio testing accuracy of the channel simulator is low. On the basis, the set of values to be tested of the normalized signal-to-noise ratio is constructed according to the signal-to-noise ratio testing accuracy, so that the granularity among the values to be tested can be reduced, the testing accuracy of the simulation test is improved, and the testing result of the simulation test is more accurate.
A3, the analog testing device attenuates the power of the signal to be tested to a preset interval by the sum of the fixed attenuation value and the variable attenuation value to obtain a pre-attenuation signal.
S203, the simulation test device inputs the pre-attenuation signal to a preset channel simulator to carry out simulated fading, and a simulated test signal is obtained.
The channel simulator is used for simulating a wireless fading environment when the communication rate is a set rate and the normalized signal-to-noise ratio is a lowest setting interval corresponding to the set rate.
Optionally, the simulation testing apparatus may preset the channel simulator based on the following two implementation manners.
The implementation method is as follows: the simulation test device determines the minimum value of the minimum setting interval; determining the minimum value as a setting value of the normalized signal-to-noise ratio; and setting the channel simulator by taking the setting value and the setting rate as parameters.
Therefore, the simulation test device can simulate the wireless fading environment based on the fact that the normalized signal-to-noise ratio is the minimum value, and change the actual normalized signal-to-noise ratio of the signal to be tested by changing the magnitude of the variable attenuation value, so as to complete the wireless fading environment simulation and the simulation test under different actual normalized signal-to-noise ratios.
The implementation mode two is as follows: the simulation testing device adjusts the setting value of the normalized signal-to-noise ratio in the lowest setting interval based on the signal-to-noise ratio testing accuracy; and setting the channel simulator by taking the adjusted setting value and the set rate as parameters.
Therefore, the actual normalized signal-to-noise ratio of the signal to be detected can be changed by changing the setting value of the normalized signal-to-noise ratio. Because the testing accuracy of the signal-to-noise ratio is smaller than the adjusting accuracy of the variable attenuation value, the actual normalized signal-to-noise ratio can be more accurate, and the accuracy of the simulation test is improved.
S204, the simulation test device sends a simulation test signal to the receiving end so that the receiving end can test the simulation test signal conveniently to complete the simulation test of the communication system.
Optionally, the analog testing device may further determine a received signal power range of the receiving end; if the power of the analog test signal is greater than the maximum value of the received signal power range, the analog test signal is attenuated based on the received signal power range.
The embodiment of the invention provides a simulation test method of a communication system, which comprises the steps of pre-attenuating the power of a signal to be tested, and then inputting the pre-attenuated signal into a preset channel simulator, wherein the channel simulator is used for simulating a wireless fading environment when the communication rate is a set rate and the normalized signal-to-noise ratio is a lowest set interval corresponding to the set rate. Because the normalized signal-to-noise ratio represents the ratio of the average signal power to the noise power spectral density, when the wireless fading environment simulated by the channel simulator is not changed, the noise power spectral density is not changed, the power of the signal to be tested is pre-attenuated, the average signal power can be reduced, and the actual normalized signal-to-noise ratio of the signal to be tested is reduced, namely, when the channel simulator simulates the wireless fading environment, the actual normalized signal-to-noise ratio of the signal to be tested in the simulation test is reduced through pre-attenuation, the signal-to-noise ratio threshold under the low-communication rate scene is reduced when the simulation test in the communication system is carried out, and the simulation test of the transmission signal with lower communication rate and lower signal-to-noise ratio is realized.
In addition, the power of the signal to be tested is within the preset interval, wherein the preset interval is the interval corresponding to the situation that the signal-to-noise ratio test accuracy of the channel simulator is smaller than the preset value, so that the signal-to-noise ratio test accuracy of the channel simulator in the simulation test is ensured, and the test accuracy of the simulation test is ensured.
It should be noted that, a scatter communication scenario between a military communication vehicle and a military communication vehicle is taken as an example. Suppose that military communication vehicles need to transmit at a low communication rate, but currently, the signal receiving condition of the signals with low communication rate after wireless decay is lacked. For the scene, the technical scheme provided by the embodiment of the invention can be used for simulating the lower-speed communication process possibly existing between the military communication vehicles and determining the signal transmission result between the military communication vehicles, so that the simulation test under the scene is realized.
As shown in fig. 3, an embodiment of the present invention provides a simulation test method for a communication system, where the simulation test method includes steps S300 to S314.
And S300, starting.
And S301, setting parameters of a sending end.
In some embodiments, the sending end may set parameters such as an operating mode, a communication rate of a signal to be measured, and a transmission frequency. And after the setting is finished, the sending end sends the signal to be detected based on the setting parameters.
And S302, setting parameters of a channel simulator.
Optionally, the simulation testing apparatus may set the channel simulator based on parameters such as a communication rate, a normalized signal-to-noise ratio, a fading type, and noise interference.
As a possible implementation, the simulation test apparatus may set parameters of the channel simulator based on the initial normalized signal-to-noise ratio. For example, the initial normalized signal-to-noise ratio may be the lowest value corresponding to the set rate.
As another possible implementation, the simulation test apparatus may set parameters of the channel simulator based on the normalized signal-to-noise ratio that changes during the test. Illustratively, assuming a test accuracy of 0.1dB for the normalized signal-to-noise ratio, the normalized signal-to-noise ratio during the test may be 20.2dB, or 20.3 dB. This is not a limitation of the present application.
S303, the analog testing device receives the signal to be tested, and correspondingly, the sending end sends the signal to be tested.
S304, the simulation test device fixedly attenuates the signal to be tested.
The determination method of the fixed attenuation value may refer to S202.
S305, simulating the variable attenuation of the signal to be tested by the test device to obtain a pre-attenuation signal.
The determination method of the variable attenuation value may refer to S202.
As a possible implementation, the simulation test apparatus may set the initial variable attenuation value to zero.
As another possible implementation, the analog testing device may determine the variable attenuation value based on the initial to-be-tested value of the normalized signal-to-noise ratio.
As another possible implementation manner, the analog testing device may determine the variable attenuation value based on the to-be-tested value of the normalized signal-to-noise ratio after being changed in the testing process.
And S306, inputting the pre-attenuation signal to a channel simulator by the simulation test device, and carrying out simulated fading to obtain a simulated test signal.
And S307, the simulation test device sends a simulation test signal to a receiving end.
S308, the receiving end tests the simulation test signal.
S309, the simulation test device changes the variable attenuation value based on the value to be measured of the normalized signal-to-noise ratio.
S202 may be referred to as a method for determining the to-be-measured value of the normalized signal-to-noise ratio.
S310, the simulation test device judges whether the variable attenuation value is changed completely. If yes, go to S311; if not, S305 is executed.
As a possible implementation, the simulation test apparatus may change the variable attenuation value based on the adjustment accuracy of the variable attenuation value. For example, the simulation test apparatus may gradually increase the variable attenuation value from zero to a step value with the adjustment accuracy of the variable attenuation value, and indicate that the change of the variable attenuation value is completed when the variable attenuation value is maximum.
S311, the simulation test device changes the setting value of the normalized signal-to-noise ratio of the channel simulator based on the value to be measured of the normalized signal-to-noise ratio.
S312, the simulation testing device judges whether the set value of the normalized signal-to-noise ratio of the channel simulator is changed. If yes, go to S313; if not, go to step S302.
As a possible implementation, the simulation test apparatus may change the setting value of the normalized signal-to-noise ratio based on the adjustment accuracy of the variable attenuation value and the signal-to-noise ratio test accuracy.
For example, assuming that the adjustment accuracy of the variable attenuation value is 1dB and the signal-to-noise ratio test accuracy is 0.1dB, the analog testing device may change the setting value of the normalized signal-to-noise ratio within the range of the adjustment accuracy of the variable attenuation value. For example, assuming a minimum setting of 20dB for the normalized signal-to-noise ratio, the analog testing device may determine multiple settings for the normalized signal-to-noise ratio between 19dB and 20dB with an accuracy of 0.1 dB. Such as: 19.1dB, 19.2dB, 19.3dB, … … dB, 19.8dB, 19.9dB and 20 dB.
Therefore, the simulation test device can change the setting values of the variable attenuation value and the normalized signal-to-noise ratio based on the adjustment accuracy of the variable attenuation value and the signal-to-noise ratio test accuracy to obtain the to-be-tested value of the normalized signal-to-noise ratio with the signal-to-noise ratio test accuracy as the granularity, reduce the granularity of the to-be-tested value of the normalized signal-to-noise ratio and improve the test accuracy of the simulation test.
And S313, completing the test.
Based on the embodiment shown in fig. 3, the invention can reduce the actual normalized signal-to-noise ratio of the signal to be tested in the simulation test by pre-attenuation while the channel simulator simulates the wireless fading environment, reduce the signal-to-noise ratio threshold in the low communication rate scene during the simulation test in the communication system, and realize the simulation test of the transmission signal with lower communication rate and lower signal-to-noise ratio. And the signal-to-noise ratio testing accuracy is smaller than the adjusting accuracy of the variable attenuation value, so that the actual normalized signal-to-noise ratio is more accurate, the accuracy of the simulation test is improved, and the testing accuracy of the simulation test is ensured.
It should be understood that, the sequence numbers of the steps in the foregoing embodiments do not imply an execution sequence, and the execution sequence of each process should be determined by its function and inherent logic, and should not constitute any limitation to the implementation process of the embodiments of the present invention.
The following are embodiments of the apparatus of the invention, reference being made to the corresponding method embodiments described above for details which are not described in detail therein.
Fig. 4 is a schematic structural diagram of a simulation testing apparatus of a communication system according to an embodiment of the present invention, and for convenience of description, only the parts related to the embodiment of the present invention are shown, which are detailed as follows:
as shown in fig. 4, the simulation test apparatus 400 includes: a communication module 401 and a processing module 402. Applied to a simulation test system, the simulation test system comprises a sending end, a receiving end and the simulation test device 400,
a communication module 401, configured to receive a signal to be detected at a sending end;
the processing module 402 is configured to pre-attenuate the power of the signal to be detected to a preset interval, so as to obtain a pre-attenuated signal; the preset interval is the corresponding interval when the signal-to-noise ratio test accuracy of the channel simulator is smaller than the preset value; inputting the pre-attenuation signal into a preset channel simulator, and performing simulated fading to obtain a simulated test signal; the channel simulator is used for simulating a wireless fading environment when the communication rate is a set rate and the normalized signal-to-noise ratio is a lowest setting interval corresponding to the set rate;
the communication module 401 is further configured to send an analog test signal to the receiving end, so that the receiving end tests the analog test signal to complete the analog test of the communication system.
In a possible implementation manner, the processing module 401 is specifically configured to determine a fixed attenuation value, where the fixed attenuation value is used to attenuate the power of the signal to be detected to a preset interval; determining a variable attenuation value, wherein the variable attenuation value is used for attenuating the power of a signal to be detected in a preset interval; and attenuating the power of the signal to be detected to a preset interval by the sum of the fixed attenuation value and the variable attenuation value to obtain a pre-attenuation signal.
In a possible implementation manner, the processing module 401 is specifically configured to determine the power of a signal to be measured; and determining a fixed attenuation value based on the power of the signal to be measured and the endpoint value of the preset interval.
In a possible implementation manner, the processing module 401 is specifically configured to determine a value to be measured of the normalized signal-to-noise ratio and a setting value of the normalized signal-to-noise ratio; setting the value as any value in the lowest setting interval; determining the difference value between the set value and the value to be measured as a variable attenuation value; or, determining a value to be measured of the normalized signal-to-noise ratio and an actual value of the normalized signal-to-noise ratio; the actual normalized signal-to-noise ratio is actually the simulated test signal; and determining the difference value between the actual value and the value to be measured as a variable attenuation value.
In a possible implementation manner, the processing module 401 is specifically configured to determine any value in a to-be-measured interval of a normalized signal-to-noise ratio in a simulation test as an initial to-be-measured value; determining a set of values to be measured of the normalized signal-to-noise ratio based on the signal-to-noise ratio test accuracy, the adjustment accuracy of the variable attenuation value, and the initial value to be measured, wherein the signal-to-noise ratio test accuracy is smaller than the adjustment accuracy of the variable attenuation value; and determining any value in the value set to be measured as a value to be measured of the normalized signal-to-noise ratio.
In a possible implementation manner, the processing module 401 is further configured to determine a minimum value of the lowest setting interval; determining the minimum value as a setting value of the normalized signal-to-noise ratio; and setting the channel simulator by taking the setting value and the setting rate as parameters.
In a possible implementation manner, the processing module 401 is further configured to adjust a setting value of the normalized signal-to-noise ratio within a lowest setting interval based on the signal-to-noise ratio test accuracy; and setting the channel simulator by taking the adjusted setting value and the set rate as parameters.
In a possible implementation manner, the processing module 401 is further configured to determine a received signal power range of the receiving end; if the power of the analog test signal is greater than the maximum value of the received signal power range, the analog test signal is attenuated based on the received signal power range.
Fig. 5 is a schematic diagram of an electronic device provided in an embodiment of the present invention. As shown in fig. 5, the electronic apparatus 500 of this embodiment includes: a processor 501, a memory 502 and a computer program 503 stored in said memory 502 and executable on said processor 501. The processor 501, when executing the computer program 503, implements the steps in the above method embodiments, such as the steps 201 to 204 shown in fig. 2. Alternatively, the processor 501, when executing the computer program 503, implements the functions of each module/unit in the above-described device embodiments, such as the functions of the communication module 401 and the processing module 402 shown in fig. 4.
Illustratively, the computer program 503 may be partitioned into one or more modules/units that are stored in the memory 502 and executed by the processor 501 to implement the present invention. The one or more modules/units may be a series of computer program instruction segments capable of performing specific functions, which are used to describe the execution process of the computer program 503 in the electronic device 500. For example, the computer program 503 may be divided into a communication module 401 and a processing module 402 shown in fig. 4.
The electronic device 500 may include, but is not limited to, a processor 501, a memory 502. Those skilled in the art will appreciate that fig. 5 is merely an example of an electronic device 500 and does not constitute a limitation of electronic device 500 and may include more or fewer components than shown, or some components may be combined, or different components, e.g., the electronic device may also include input-output devices, network access devices, buses, etc.
The Processor 501 may be a Central Processing Unit (CPU), other general purpose Processor, a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), a Field Programmable Gate Array (FPGA) or other Programmable logic device, discrete Gate or transistor logic device, discrete hardware component, or the like. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like.
The storage 502 may be an internal storage unit of the electronic device 500, such as a hard disk or a memory of the electronic device 500. The memory 502 may also be an external storage device of the electronic device 500, such as a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital (SD) Card, a Flash memory Card (Flash Card), and the like, provided on the electronic device 500. Further, the memory 502 may also include both internal storage units and external storage devices of the electronic device 500. The memory 502 is used for storing the computer programs and other programs and data required by the terminal. The memory 502 may also be used to temporarily store data that has been output or is to be output.
It will be apparent to those skilled in the art that, for convenience and brevity of description, only the above-mentioned division of the functional units and modules is illustrated, and in practical applications, the above-mentioned function distribution may be performed by different functional units and modules according to needs, that is, the internal structure of the apparatus is divided into different functional units or modules to perform all or part of the above-mentioned functions. Each functional unit and module in the embodiments may be integrated in one processing unit, or each unit may exist alone physically, or two or more units are integrated in one unit, and the integrated unit may be implemented in a form of hardware, or in a form of software functional unit. In addition, specific names of the functional units and modules are only used for distinguishing one functional unit from another, and are not used for limiting the protection scope of the present application. The specific working processes of the units and modules in the system may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again.
In the above embodiments, the descriptions of the respective embodiments have respective emphasis, and reference may be made to the related descriptions of other embodiments for parts that are not described or illustrated in a certain embodiment.
Those of ordinary skill in the art will appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware or combinations of computer software and electronic hardware. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the implementation. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present invention.
In the embodiments provided in the present invention, it should be understood that the disclosed apparatus/terminal and method may be implemented in other ways. For example, the above-described apparatus/terminal embodiments are merely illustrative, and for example, the division of the modules or units is only one logical division, and there may be other divisions when actually implemented, for example, a plurality of units or components may be combined or may be integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices or units, and may be in an electrical, mechanical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit may be implemented in the form of hardware, or may also be implemented in the form of a software functional unit.
The integrated modules/units, if implemented in the form of software functional units and sold or used as separate products, may be stored in a computer readable storage medium. Based on such understanding, all or part of the flow of the method according to the above embodiment may be implemented by a computer program, which may be stored in a computer readable storage medium and used for implementing the steps of the above method embodiment when executed by a processor. Wherein the computer program comprises computer program code, which may be in the form of source code, object code, an executable file or some intermediate form, etc. The computer-readable medium may include: any entity or device capable of carrying the computer program code, recording medium, usb disk, removable hard disk, magnetic disk, optical disk, computer Memory, Read-Only Memory (ROM), Random Access Memory (RAM), electrical carrier wave signals, telecommunications signals, software distribution medium, and the like. It should be noted that the computer readable medium may contain other components which may be suitably increased or decreased as required by legislation and patent practice in jurisdictions, for example, in some jurisdictions, computer readable media which may not include electrical carrier signals and telecommunications signals in accordance with legislation and patent practice.
The above-mentioned embodiments are only used for illustrating the technical solutions of the present invention, and not for limiting the same; although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not substantially depart from the spirit and scope of the embodiments of the present invention, and are intended to be included within the scope of the present invention.
Claims (10)
1. A simulation test method of a communication system is characterized in that the simulation test method is applied to a simulation test system, the simulation test system comprises a sending end, a receiving end and a simulation test device, and the simulation test method comprises the following steps:
receiving a signal to be detected of the sending end;
pre-attenuating the power of the signal to be detected to a preset interval to obtain a pre-attenuated signal; the preset interval is a corresponding interval when the signal-to-noise ratio test accuracy of the channel simulator is smaller than a preset value;
inputting the pre-attenuation signal into a preset channel simulator, and performing simulated fading to obtain a simulated test signal; the channel simulator is used for simulating a wireless fading environment when the communication rate is a set rate and the normalized signal-to-noise ratio is a lowest setting interval corresponding to the set rate;
and sending the simulation test signal to the receiving end so that the receiving end can test the simulation test signal to finish the simulation test of the communication system.
2. The simulation test method of claim 1, wherein the pre-attenuating the power of the signal to be tested to a preset interval to obtain a pre-attenuated signal comprises:
determining a fixed attenuation value, wherein the fixed attenuation value is used for attenuating the power of the signal to be detected to the preset interval;
determining a variable attenuation value, wherein the variable attenuation value is used for attenuating the power of the signal to be detected in the preset interval;
and attenuating the power of the signal to be detected to a preset interval by using the sum of the fixed attenuation value and the variable attenuation value to obtain a pre-attenuation signal.
3. The simulation test method of claim 2, wherein the determining a fixed attenuation value comprises:
determining the power of the signal to be detected;
and determining a fixed attenuation value based on the power of the signal to be measured and the endpoint value of the preset interval.
4. The simulation test method of claim 2, wherein the determining a variable attenuation value comprises:
determining a value to be measured of the normalized signal-to-noise ratio and a setting value of the normalized signal-to-noise ratio; the setting value is any value in the lowest setting interval; determining the difference value between the setting value and the value to be measured as a variable attenuation value; or,
determining a value to be measured for the normalized signal-to-noise ratio and an actual value for the normalized signal-to-noise ratio; the actual is the actual normalized signal-to-noise ratio of the simulated test signal; and determining the difference value of the actual value and the measured value as a variable attenuation value.
5. The simulation testing method of claim 4, wherein said determining a value to be tested for said normalized signal-to-noise ratio comprises:
determining any value in the interval to be tested of the normalized signal-to-noise ratio in the simulation test as an initial value to be tested;
determining a set of to-be-measured values of the normalized signal-to-noise ratio based on the signal-to-noise ratio test accuracy, the adjustment accuracy of the variable attenuation value, and the initial value to be measured, the signal-to-noise ratio test accuracy being less than the adjustment accuracy of the variable attenuation value;
and determining any value in the set of values to be measured as the value to be measured of the normalized signal-to-noise ratio.
6. The analog testing method according to any one of claims 1 to 5, wherein before inputting the pre-attenuated signal to a preset channel simulator for analog fading to obtain an analog testing signal, the analog testing method further comprises:
determining the minimum value of the lowest setting interval;
determining the minimum value as a setting value of the normalized signal-to-noise ratio;
and setting the channel simulator by taking the setting value and the setting rate as parameters.
7. The analog testing method of claim 6, wherein before inputting the pre-attenuated signal to a preset channel simulator for analog fading to obtain an analog testing signal, the analog testing method further comprises:
adjusting the setting value of the normalized signal-to-noise ratio in the lowest setting interval based on the signal-to-noise ratio testing accuracy;
and setting the channel simulator by taking the adjusted setting value and the setting rate as parameters.
8. The analog testing method according to any one of claims 1 to 5, wherein before the sending the analog testing signal to the receiving end, the analog testing method further comprises:
determining a received signal power range of the receiving end;
attenuating the analog test signal based on the received signal power range if the power of the analog test signal is greater than the maximum value of the received signal power range.
9. A simulation test device of a communication system is characterized in that the simulation test device is applied to a simulation test system, the simulation test system comprises a sending end, a receiving end and the simulation test device, and the simulation test device comprises: a communication module and a processing module;
the communication module is used for receiving a signal to be detected of the sending end;
the processing module is used for pre-attenuating the power of the signal to be detected to a preset interval to obtain a pre-attenuated signal; the preset interval is a corresponding interval when the signal-to-noise ratio test accuracy of the channel simulator is smaller than a preset value; inputting the pre-attenuation signal to a preset channel simulator for simulating fading to obtain a simulated test signal; the channel simulator is used for simulating a wireless fading environment when the communication rate is a set rate and the normalized signal-to-noise ratio is a lowest setting interval corresponding to the set rate;
the communication module is further configured to send the analog test signal to the receiving end, so that the receiving end can test the analog test signal to complete the analog test of the communication system.
10. An electronic device, characterized in that the electronic device comprises a memory storing a computer program and a processor for invoking and running the computer program stored in the memory to execute the method according to any one of claims 1 to 8.
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