CN114487909A - Short circuit detection method and system for test interface unit - Google Patents

Abstract

The present disclosure provides a short detection method for a test interface unit having a plurality of test pins, the method comprising: contacting a plurality of test pins of the test interface unit with a plurality of contacts of a package unit to be tested; determining whether a short circuit exists in a plurality of test pins of the test interface unit; and if the short circuit exists in the plurality of test pins of the test interface unit, determining the position of the short-circuited pin in the plurality of test pins of the test interface unit. The present disclosure also provides a short circuit detection system for testing an interface unit.

Description

Short circuit detection method and system for testing interface units

technical field

The present disclosure relates generally to the field of post-package testing, and more particularly, to short circuit detection methods and systems for testing interface units.

Background technique

After the packaging of the semiconductor device, it is necessary to use a test interface unit (TIU, test interface unit) to perform various electrical function tests on the packaging unit (for example, CPU, south bridge chip, north bridge chip, etc.) to measure whether the electrical function of the packaging unit is Meet the design requirements. Corresponding test interface units are selected for different package units, and the test interface unit has a plurality of test pins with a pitch of micrometers. As shown in FIG. 1( a ), when the package unit 110 is electrically functionally tested by the test interface unit 100 , the test pins 120 of the test interface unit 100 are in close contact with the contacts 130 of the package unit 110 to be tested. Then, various electrical function tests of the package unit to be tested 110 are completed by applying corresponding electrical signals to the test interface unit 100 .

When using the test interface unit to test the package unit, a force needs to be applied so that the test pins of the test interface unit are in close contact with the contacts of the package unit to be tested. However, with the frequent use of the test interface unit, the test pins of the test interface unit may be deformed. In this case, two (or more) test pins of the test interface unit may come into contact with each other when a force is applied to make the test pins of the test interface unit come into close contact with the contacts of the package unit to be tested. As shown in FIG. 1( b ), the two test pins 120 on the left side of the test interface unit 100 are in contact, thereby causing a short circuit of the test interface unit 100 , and then the test interface unit 100 cannot be used to complete the electrical function test of the package unit 110 to be tested. .

In order to eliminate the deformation of the test pins of the test interface unit, a technician is required to manually correct the test pins of the test interface unit. Since the test interface unit has thousands of test pins, manual calibration by a technician is time-consuming and tiresome for this long and repetitive labor. In addition, this manual correction is performed under the condition that the test pins of the test interface unit are not in contact with the contacts of the package unit to be tested. Therefore, even after manually correcting all the test pins of the test interface unit, it cannot be guaranteed that the test pins after the correction will not cause short-circuiting of the test pins when they come into contact with the contacts of the package unit.

Therefore, there is a need for a short-circuit detection method and system for testing an interface unit, which can perform various electrical function tests on the package unit to be tested by using the test interface unit. Accurately detect whether the test pins of the test interface unit are short-circuited when the contacts are in contact.

SUMMARY OF THE INVENTION

According to an embodiment of the present disclosure, there is provided a short circuit detection method for a test interface unit, the test interface unit having a plurality of test pins, the method comprising: connecting the plurality of test pins of the test interface unit contact with a plurality of contacts of the package unit to be tested; determine whether a short circuit exists in a plurality of test pins of the test interface unit; and if it is determined that a short circuit exists in a plurality of test pins of the test interface unit, determine the The location of the shorted pin among the multiple test pins of the test interface unit.

In some embodiments, the method further includes removing a shorted pin of the plurality of test pins of the test interface unit.

In some embodiments, determining the location of a shorted pin among the plurality of test pins of the test interface unit includes: connecting the test interface unit to a power source; and connecting the plurality of test pins of the test interface unit A test pin that has a visible change in it is identified as a shorted pin.

In some embodiments, the voltage of the power supply is 10V and the test interface unit is connected to the power supply for 2-5 seconds.

In some embodiments, it is determined whether a short circuit exists in a plurality of test pins of the test interface unit by connecting the test interface unit to the resistance measurement unit.

In some embodiments, the resistance measurement unit is a multimeter or an ohmmeter.

According to an embodiment of the present disclosure, a short circuit detection system for a test interface unit is provided, the test interface unit has a plurality of test pins, and the system includes: a test platform for carrying a package unit to be tested, the The packaging unit to be tested has a plurality of contacts; the test interface unit, a plurality of test pins of the test interface unit are in contact with a plurality of contacts of the packaging unit to be tested; a resistance measurement unit is used to connect to the a test interface unit to determine whether a short circuit exists in a plurality of test pins of the test interface unit; and a power supply for connecting to the test interface when a short circuit is determined to exist in a plurality of test pins of the test interface unit unit to determine the position of the short-circuited pin among the plurality of test pins of the test interface unit.

In some embodiments, the resistance measurement unit is a multimeter or an ohmmeter.

In some embodiments, determining the location of a shorted pin among the plurality of test pins of the test interface unit comprises: connecting the test interface unit to the power source; and connecting the plurality of tests of the test interface unit A test pin with a visible change in the pin is identified as a shorted pin.

In some embodiments, the voltage of the power supply is 10V and the test interface unit is connected to the power supply for 2-5 seconds.

Description of drawings

The accompanying drawings, which are incorporated herein and form a part of the specification, illustrate embodiments of the disclosure and together with the description further serve to explain the principles of the disclosure and to enable those skilled in the relevant art to make and use the disclosure.

Fig. 1 (a) shows the schematic diagram that the test pins of the test interface unit are in close contact with the contacts of the package unit to be tested and the test pins of the test interface unit are not short-circuited;

Fig. 1 (b) shows the schematic diagram that the test pin of the test interface unit is in close contact with the contact of the package unit to be tested and the test pin of the test interface unit is short-circuited;

2(a)-2(b) are schematic diagrams illustrating a short-circuit detection method for testing an interface unit according to an embodiment of the present disclosure;

3 shows a flowchart of a short-circuit detection method for testing an interface unit according to an embodiment of the present disclosure;

FIG. 4 is a schematic diagram illustrating that short-circuited test pins in the test interface unit will become visible after short-circuit detection is performed on the test interface unit using the short-circuit detection method for the test interface unit according to an embodiment of the present disclosure; and

FIG. 5 shows a structural block diagram of a short circuit detection system for testing an interface unit according to an embodiment of the present disclosure.

Embodiments will be described with reference to the accompanying drawings.

Detailed ways

The subject matter described herein will now be discussed with reference to example implementations. It should be understood that these embodiments are discussed only to enable those skilled in the art to better understand and implement the subject matter described herein, and not to limit the scope of protection, applicability, or examples set forth in the claims. Changes may be made in the function and arrangement of elements discussed without departing from the scope of the disclosure. Various examples may omit, substitute, or add various procedures or components as desired. For example, the methods described may be performed in an order different from that described, and various steps may be added, omitted, or combined. Additionally, features described with respect to some examples may also be combined in other examples.

It is noted that references in the specification to "one embodiment," "an embodiment," "some embodiments," etc. mean that the described embodiment may include a particular feature, structure, or characteristic, but not necessarily every embodiment. Include that particular feature, structure or characteristic. Moreover, such phrases are not necessarily referring to the same embodiment. Furthermore, when a particular feature, structure or characteristic is described in connection with one embodiment, it is within the purview of those skilled in the relevant art to implement such feature, structure or characteristic in connection with other embodiments, expressly or not expressly described.

Embodiments herein may be described with reference to the accompanying drawings. Unless explicitly stated, the dimensions of the drawings are intended to simplify the example rather than a description of relative dimensions. For example, the various lengths/widths/heights of elements in the figures may not be drawn to scale unless otherwise indicated.

Embodiments of a short circuit detection method and system for testing an interface unit according to the present disclosure will now be described with reference to the accompanying drawings.

2(a)-2(b) illustrate schematic diagrams of a short-circuit detection method for testing an interface unit according to an embodiment of the present disclosure, and FIG. 3 illustrates a short-circuit detection method for testing an interface unit according to an embodiment of the present disclosure 300 flow chart. A short circuit detection method for testing an interface unit according to an embodiment of the present disclosure will now be described with reference to FIGS. 2( a )- 2 ( b ) and FIG. 3 .

As shown in FIG. 3 , the short-circuit detection method 300 for a test interface unit according to an embodiment of the present disclosure starts at step S310 : contacting a plurality of test pins of the test interface unit with a plurality of contacts of the package unit to be tested . For example, the package unit to be tested may be any one of a CPU, a south bridge chip, a north bridge chip, a ball grid array (BGA), and the like.

As shown in FIG. 2( a ), the test interface unit 200 has multiple test pins 220 , the package unit 210 to be tested has multiple contacts 230 , and the multiple test pins 220 of the test interface unit 200 are connected to the package unit to be tested A plurality of contacts 230 of 210 are in contact. Only three test pins 220 and three contacts 230 are shown in FIG. 2( a ) as an example, and the two test pins 220 on the left side of the test interface unit 200 are in contact with the contact points 230 of the package unit 210 to be tested In the case of being in contact with each other, they also contact each other, thereby causing a short circuit of the test interface unit 200 . When the test interface unit 200 is short-circuited, various electrical function tests cannot be performed on the package unit 210 to be tested by using the test interface unit 200 .

Next, the method 300 proceeds to step S320: determining whether a short circuit exists in the plurality of test pins of the test interface unit. As shown in FIG. 2( a ), the resistance measurement unit 240 is used to determine whether there is a short circuit in the plurality of test pins 220 of the test interface unit 200 . If there is a short circuit among the plurality of test pins 220 of the test interface unit 200, the resistance measurement unit 240 measures that the resistance is zero. In one embodiment, the resistance measurement unit 240 may be any of a multimeter or an ohmmeter.

Next, as shown in FIG. 3, if it is determined in step S320 that there is a short circuit in the plurality of test pins 220 of the test interface unit 200, the method 300 proceeds to step S330: determining a plurality of test pins of the test interface unit the location of the shorted pins. As shown in FIG. 2( b ), the test interface unit 200 is connected to the power source 250 under the condition that the plurality of test pins 220 of the test interface unit 200 are in contact with the plurality of contacts 230 of the package unit 210 to be tested. If a plurality of test pins 220 of the test interface unit 200 (eg, the two test pins 220 on the left) are short-circuited, the current flowing through the short-circuited test pins 220 causes the short-circuited test pins 220 to heat up or even melt . In this case, the heating of the test pin 220 causes the test pin to undergo a visible change, such as turning white. 4 is a schematic diagram illustrating that short-circuited test pins in the test interface unit will become visible after short circuit detection is performed on the test interface unit using the short circuit detection method for the test interface unit according to an embodiment of the present disclosure. As shown in FIG. 4 , R represents the package unit 210 to be tested. After the test interface unit 200 is connected to the power source 250 , current flows through the shorted test pins 220 , causing the shorted test pins 220 to heat up or even melt, thereby producing visible changes at the shorted test pins 220 . For example, as shown in the enlarged view of the test interface unit 200 in the lower part of FIG. 4 , the test pins 220 of the test interface unit 200 are made of rhodium alloy, and the test pins 220 that are not short-circuited are gray and unchanged. The pins 220 become whitish (FIG. 4 shows three shorted pins 220, respectively included in circles 410, 420, 430), so that the location of the shorted test pins 220 can be observed with the naked eye.

In one embodiment, the voltage of the power supply 250 is 10V and the test interface unit 200 is connected to the power supply 250 for 2-5 seconds. For those skilled in the art, the voltage of the power supply 250 and the duration for which the test interface unit 200 is connected to the power supply 250 can be selected according to the material of the test pins 220 .

As shown in FIG. 3 , if it is determined in step S320 that there is no short circuit in the plurality of test pins of the test interface unit, the method 300 proceeds to step S340 : using the test interface unit to perform an electrical function test on the package unit to be tested. That is to say, the test interface unit can be used to perform various electrical function tests on the package unit to be tested only if there is no short circuit among the plurality of test pins of the test interface unit.

As shown in FIG. 3 , after determining the position of the shorted pin among the plurality of test pins of the test interface unit, the method 300 proceeds to step S350 : removing the plurality of test pins of the test interface unit shorted pins. The test interface unit usually has a plurality of test pins, and the plurality of test pins belong to a plurality of different channels. Removing a small number of short-circuited test pins in one channel will not affect the use of the test interface unit.

FIG. 5 shows a structural block diagram of a short circuit detection system 500 for testing an interface unit according to an embodiment of the present disclosure. As shown in FIG. 5 , a short circuit detection system 500 for testing an interface unit includes a test platform 510 , a package unit to be tested 520 , a test interface unit 530 , a resistance measurement unit 540 , and a power supply 550 .

The test platform 510 is used to carry the package unit 520 to be tested. As described above, the package unit 520 to be tested may be any one of a CPU, a south bridge chip, a north bridge chip, a ball grid array (BGA), etc., and the present disclosure is not limited thereto. The test interface unit 530 has a plurality of test pins. When using the test pins of the test interface unit 530 to perform various electrical function tests on the package unit 520 to be tested, the plurality of test pins of the test interface unit 530 and the package unit to be tested 520 The multiple contacts are in close contact.

Before various electrical function tests are performed on the package unit 520 under test using the test interface unit 530 , the resistance measurement unit 540 is connected to the test interface unit 530 to determine whether a short circuit exists in a plurality of test pins of the test interface unit 530 . If there is a short circuit in the plurality of test pins of the test interface unit 530, the resistance measured by the resistance measurement unit 540 is close to zero. As described above, the resistance measurement measurement unit 540 may be any one of a multimeter or an ohmmeter, but the present disclosure is not limited thereto.

After the resistance measurement unit 540 is used to detect a short-circuited test pin among the plurality of test pins of the test interface unit 530 , the power source 550 is connected to the test interface unit 530 to determine a short circuit among the plurality of test pins of the test interface unit 530 pin location. As described above, when the test interface unit 530 is connected to the power source 550, current flows through the shorted test pins 220, causing the shorted test pins to heat up or even melt, thereby producing visible changes at the shorted test pins , such as whitening. It will be apparent to those skilled in the art that a suitable power supply can be selected according to the material of the test pins.

According to the short-circuit detection method and system for testing the interface unit according to the embodiments of the present disclosure, before various electrical function tests are performed on the package unit to be tested by the test interface unit, the test pins of the test interface unit and the package unit to be tested can be tested. Accurately detect whether the test pins of the test interface unit are short-circuited when the contacts are in contact. Compared with the existing manual correction of the test pins of the test interface unit, it saves time and can accurately detect all short-circuit test leads in the case that the test pins of the test interface unit are in contact with the contacts of the package unit to be tested. foot.

It should be noted that not all steps and units in the above-mentioned processes and system structure diagrams are necessary, and some steps or units may be omitted according to actual needs. The execution order of each step is not fixed and can be determined as required. The device structure described in the above embodiments may be a physical structure or a logical structure, that is, some units may be implemented by the same physical entity, or some units may be implemented by multiple physical entities, or may be implemented by multiple physical entities. Some components in separate devices are implemented together.

The above description of the present disclosure is provided to enable any person of ordinary skill in the art to make or use the present disclosure. Various modifications to this disclosure will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other variations without departing from the scope of this disclosure. Thus, the present disclosure is not intended to be limited to the examples and designs described herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims (10)

1. A short detection method for a test interface unit having a plurality of test pins, the method comprising:

contacting a plurality of test pins of the test interface unit with a plurality of contacts of a package unit to be tested;

determining whether a short circuit exists in a plurality of test pins of the test interface unit; and

and if the short circuit exists in the plurality of test pins of the test interface unit, determining the position of the short-circuited pin in the plurality of test pins of the test interface unit.

2. The short detection method of claim 1, further comprising removing a shorted pin of the plurality of test pins of the test interface unit.

3. The short-circuit detection method of claim 1, wherein determining the location of the shorted pin of the plurality of test pins of the test interface unit comprises:

connecting the test interface unit to a power supply; and

and determining a test pin with visible change in the plurality of test pins of the test interface unit as a short-circuited pin.

4. The short circuit detection method of claim 3, wherein the voltage of the power supply is 10V and the test interface unit is connected to the power supply for 2-5 seconds.

5. The short detection method of claim 1, wherein determining whether there is a short in a plurality of test pins of a test interface unit is performed by connecting the test interface unit to a resistance measurement unit.

6. The short circuit detection method according to claim 5, wherein the resistance measurement unit is a multimeter or an ohmmeter.

7. A short detection system for a test interface unit having a plurality of test pins, the system comprising:

the test platform is used for bearing a to-be-tested packaging unit, and the to-be-tested packaging unit is provided with a plurality of contacts;

the test interface unit is characterized in that a plurality of test pins of the test interface unit are contacted with a plurality of contacts of the packaging unit to be tested;

the resistance measuring unit is connected to the test interface unit to determine whether a short circuit exists in a plurality of test pins of the test interface unit; and

the power supply is used for being connected to the test interface unit when the short circuit exists in the plurality of test pins of the test interface unit so as to determine the position of the short-circuited pin in the plurality of test pins of the test interface unit.

8. The short circuit detection system of claim 7, wherein the resistance measurement unit is a multimeter or ohmmeter.

9. The short detection system of claim 7, wherein determining the location of the shorted pin of the plurality of test pins of the test interface unit comprises:

connecting the test interface unit to the power supply; and

and determining a test pin with visible change in the plurality of test pins of the test interface unit as a short-circuited pin.

10. The short detection system of claim 9, wherein the voltage of the power supply is 10V and the test interface unit is connected to the power supply for 2-5 seconds.

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