Disclosure of Invention
Therefore, the invention provides a manufacturing process of a conductive circuit based on a die cutting process, which can well solve the problems of difficult waste discharge and poor precision.
In order to achieve the above purpose, the technical scheme provided by the invention is as follows:
a manufacturing process of a conductive circuit comprises the following steps:
A1, providing a substrate, and planning a wiring area and a waste discharge area on the surface of the substrate;
a2, covering an isolation layer on the surface of the waste discharge area of the substrate;
A3, pressing the conductive layer on the surface of the substrate;
a4, cutting out the conductive layer into a circuit positioned on the surface of the wiring area and waste positioned on the surface of the waste discharge area through die cutting;
and A5, removing waste materials to obtain the conductive line positioned in the wiring area.
Further, in step A2, the surface of the wiring area of the substrate is an exposed surface, and in step A3, the conductive layer is directly pressed onto the surface of the wiring area of the substrate and the surface of the isolation layer located in the waste discharging area.
Further, in step A2, a coupling agent layer is covered on the wiring area of the substrate, and in step A3, the conductive layer is pressed on the surface of the coupling agent layer in the wiring area and the surface of the isolation layer in the waste disposal area.
Further, the isolation layer is an OSP layer, specifically, the OSP is Organic Solderability Preservatives, which is an organic solder mask, also called copper-protecting agent.
Further, the OSP layer is made of benzotriazole.
In the step A2, the OSP material is dissolved in an organic solvent to obtain a mixed solution, the mixed solution is covered on the surface of the waste discharge area in a printing or spraying mode, and the organic solvent is volatilized and dried to obtain the isolation layer.
Further, the conductive layer in the step A3 is a conductive film layer of copper foil, aluminum foil or other conductive film materials, and a reinforcing layer is added at the bottom of the conductive film layer.
Further, in step A5, the waste is removed by suction under negative pressure.
Further, step A5 is followed by step A6 of covering the conductive trace in the wiring area with a protective layer.
The technical scheme provided by the invention has the following beneficial effects:
The isolating layer is covered on the surface of the waste discharge area, so that the binding force of the conducting layer in the waste discharge area is smaller than that in the wiring area, the conducting layer is disconnected after die cutting, waste materials can be uniformly discharged in a negative pressure sucking and removing mode due to the difference of the binding force, the waste discharge is easy and high in efficiency, a circuit positioned on the surface of the wiring area cannot be influenced, and the precision is well ensured.
Detailed Description
For further illustration of the various embodiments, the invention is provided with the accompanying drawings. The accompanying drawings, which are incorporated in and constitute a part of this disclosure, illustrate embodiments and together with the description, serve to explain the principles of the embodiments. With reference to these matters, one of ordinary skill in the art will understand other possible embodiments and advantages of the present invention. The components in the figures are not drawn to scale and like reference numerals are generally used to designate like components.
The invention will now be further described with reference to the drawings and detailed description.
Example 1
Referring to fig. 1, the present embodiment provides a process for manufacturing a conductive line, including the following steps:
a1, as shown in FIG. 2, providing a substrate 10, and planning a wiring area 101 and a waste discharge area 102 on the surface of the substrate 10; in the figure, the ring positions are set as wiring areas 101, and the remaining positions are waste discharge areas 102.
A2, covering an isolation layer 20 on the surface of the waste discharge area 102 of the substrate 10, as shown in FIG. 3;
Specifically, in this embodiment, the surface of the wiring area 101 of the substrate 10 is exposed, so as to form an exposed surface;
A3, as shown in FIG. 4, a conductive layer 30 (specifically, a copper foil layer in the present embodiment) is laminated on the surface of the substrate 10;
Specifically, the conductive layer 30 is directly pressed onto the surface of the wiring area 101 of the substrate 10 and the surface of the isolation layer 20 located in the waste discharging area 102.
A4, as shown in fig. 5, cutting out the conductive layer 30 by die cutting to form a line 31 on the surface of the wiring area 101 and a scrap 32 on the surface of the scrap discharging area 102; specifically, the die cutting can be selected from laser cutting, cutting die cutting and the like in the prior art.
Thus, the surface of the waste discharging area 102 is covered with the isolation layer 20, so that the bonding force of the conductive layer 30 in the waste discharging area 102 is smaller than that in the wiring area 101.
A5, as shown in FIG. 6, the waste 32 is discharged to obtain a conductive line in the wiring area 101, and the line 31 is the conductive line.
Due to the difference of binding force, the waste 32 is discharged more easily, the circuit 31 on the surface of the wiring area 101 is not affected, and the precision is well ensured. Specifically, in step A5, the waste 32 is uniformly removed by negative pressure suction, so that the efficiency is higher. Of course, other means of discharging waste are possible.
Specifically, in the present embodiment, the substrate 10 is a structure that can form adhesion with the conductive layer 30 during the lamination process, such as a PET substrate. Of course, if the substrate 10 is difficult to directly form an adhesive structure with the conductive layer 30, such as a ceramic substrate, a layer of adhesive may be added on the surface of the substrate 10 or the bottom of the conductive layer 30 to facilitate press-bonding.
Further, in step A3, if a conductive film layer is used as the conductive layer, for example, a copper foil, an aluminum foil or other conductive film material with a thickness of 18 μm, the strength is obviously insufficient, and the conductive film layer is basically broken by pulling by hand; therefore, in this case, a reinforcing layer, such as a PET layer having a thickness of 10 μm, may be added to the bottom of the conductive film layer, i.e., aluminum foil (or copper foil) and PET are processed by a composite process to increase strength.
Specifically, the isolation layer 20 is an OSP layer, specifically, in step A2, the OSP material is dissolved in an organic solvent to obtain a mixed solution, and then the mixed solution is covered on the surface of the waste discharge area by printing or spraying, and the organic solvent is volatilized and dried to obtain the isolation layer. The OSP layer can be formed to have a nano-scale thickness, generally 0.2-0.5 microns, and the solvent is solid after volatilization, so that the formed circuit is clearer.
Meanwhile, after the conductive circuit is formed, the residual OSP layer can be volatilized or sublimated and removed through the subsequent normal baking or reflow soldering heating process, and no additional removing step is needed; after removal, no isolation is performed, and a resin layer can be added on the circuit 31 for secondary lamination or glue can be applied for protection and reinforcement. More preferably, the OSP layer is made of benzotriazole, can sublimate at 98-100 ℃, is easier to remove, and has lower removal temperature, especially lower than the long-term use temperature of the common material PET (polyethylene terephthalate) of the RFID tag, and the long-term use temperature is lower than 120 ℃. Of course, in other embodiments, other layers such as alkyl imidazoles or phenyl imidazoles may be used for the OSP layer. Besides the OSP layer, other silicon oil layers such as silicon oil layers made of materials can be adopted, and isolation can be realized; but has poor effect, i.e. after step A5, an additional step of removing the isolation layer is required to remove it.
Further, step A5 is followed by step A6 of covering the conductive trace in the wiring area with a protective layer. In this way, the line 31 can be effectively protected. Of course, this is not limiting in other embodiments.
Example two
The manufacturing process of the conductive circuit provided in the present embodiment is substantially the same as that provided in the first embodiment, and is different in that: in step A2 of the present embodiment, a coupling agent layer is further covered on the wiring area of the substrate, and in step A3, the conductive layer is pressed onto the surface of the coupling agent layer in the wiring area and the surface of the isolation layer in the waste disposal area. In the embodiment, the coupling agent layer is additionally arranged in the wiring area, and the coupling agent can further promote the combination of the conductive layer and the surface of the wiring area, so that the combination is firmer.
While the invention has been particularly shown and described with reference to a preferred embodiment, it will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the appended claims.