CN114371496B - A method for measuring tritium content in solid materials - Google Patents
A method for measuring tritium content in solid materials Download PDFInfo
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- CN114371496B CN114371496B CN202111534622.9A CN202111534622A CN114371496B CN 114371496 B CN114371496 B CN 114371496B CN 202111534622 A CN202111534622 A CN 202111534622A CN 114371496 B CN114371496 B CN 114371496B
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- YZCKVEUIGOORGS-NJFSPNSNSA-N Tritium Chemical compound [3H] YZCKVEUIGOORGS-NJFSPNSNSA-N 0.000 title claims abstract description 60
- 229910052722 tritium Inorganic materials 0.000 title claims abstract description 60
- 238000000034 method Methods 0.000 title claims abstract description 29
- 239000011343 solid material Substances 0.000 title claims abstract description 17
- 238000001228 spectrum Methods 0.000 claims abstract description 65
- 230000005684 electric field Effects 0.000 claims abstract description 33
- 230000005250 beta ray Effects 0.000 claims description 8
- 239000000463 material Substances 0.000 claims description 5
- 230000009471 action Effects 0.000 claims description 3
- 230000000903 blocking effect Effects 0.000 claims description 3
- 239000004065 semiconductor Substances 0.000 claims description 3
- 238000005259 measurement Methods 0.000 abstract description 13
- 238000004364 calculation method Methods 0.000 abstract description 5
- 230000008569 process Effects 0.000 abstract description 5
- 230000002708 enhancing effect Effects 0.000 abstract description 2
- 238000004458 analytical method Methods 0.000 description 10
- 238000005516 engineering process Methods 0.000 description 4
- YZCKVEUIGOORGS-OUBTZVSYSA-N Deuterium Chemical compound [2H] YZCKVEUIGOORGS-OUBTZVSYSA-N 0.000 description 3
- 229910052805 deuterium Inorganic materials 0.000 description 3
- 230000005284 excitation Effects 0.000 description 3
- 238000012544 monitoring process Methods 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 238000000691 measurement method Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000002083 X-ray spectrum Methods 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 238000004422 calculation algorithm Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000000446 fuel Substances 0.000 description 1
- 230000004927 fusion Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 230000005658 nuclear physics Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/185—Measuring radiation intensity with ionisation chamber arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
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- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Measurement Of Radiation (AREA)
Abstract
本发明提供了一种固体材料中氚含量的测量方法，包括，S1：将被测对象置于平行电极板之间，改变电极板两端的电压参数，获取多组能谱数据；S2：计算在不同电场强度下，β射线诱发的X射线能谱数据；S3：建立多能谱组合反演模型，构建总射线能谱与不同深度的射线能谱在电场下的函数关系，基于不同电场强度下的反演模型，求解氚在不同深度的分布情况。本发明的优点在于：通过加高压的手段对测量谱进行增强，避免在测量过程中产生较大的误差，为后续的数据反演提供了保障，提高了反演计算的准确率。
The present invention provides a method for measuring tritium content in solid materials, including: S1: placing the object to be measured between parallel electrode plates, changing the voltage parameters at both ends of the electrode plates, and obtaining multiple sets of energy spectrum data; S2: calculating the X-ray energy spectrum data induced by beta rays under different electric field strengths; S3: establishing a multi-energy spectrum combination inversion model, constructing a functional relationship between the total ray energy spectrum and the ray energy spectrum at different depths under the electric field, and solving the distribution of tritium at different depths based on the inversion model under different electric field strengths. The advantages of the present invention are: enhancing the measurement spectrum by means of adding high voltage, avoiding large errors in the measurement process, providing a guarantee for subsequent data inversion, and improving the accuracy of inversion calculation.
Description
Technical Field
The invention relates to the technical field of nuclear physics, in particular to a method for measuring tritium content in a solid material.
Background
Tritium is not only a national important strategic material, but also an important fuel for fusion stacks, and is widely applied to various fields such as military, aerospace, industry, technical development, scientific research and the like. The analysis and measurement technology of tritium is researched and developed, and the accurate analysis and measurement of the tritium is the most basic requirement of the tritium process for reliability and stability. With the rapid development of science and technology, the quantity of tritium involved in various projects reaches the kilogram level, and new challenges are provided for tritium analysis and measurement technology.
The analysis and measurement method of tritium in solid is focused on by a beta-induced X-ray spectrum (BIXS) analysis method at present, is one of the most effective means for carrying out nondestructive measurement and analysis on tritium materials, and is widely adopted by developed countries such as Japan and Germany. At present, great progress and breakthrough have been made in BIXS tritium measurement technology in China, and related technical achievements have been promoted and applied. However, the adopted BIXS analysis method utilizes a mode of comparing and conforming a group of experimental spectrums with a simulation spectrum to estimate the content and depth distribution of tritium, and is influenced by various factors such as the content and depth of tritium, experimental conditions, a simulation algorithm, conforming accuracy and the like, so that the analysis accuracy is difficult to ensure to a great extent.
The invention patent application with publication number of CN 106844996A discloses an accident tritium source item inversion method based on plant tritium monitoring data, which utilizes the advantages of easy collection and monitoring of plant tritium and solves the technical obstacle of on-line monitoring of gaseous tritium (HTO/HT) existing in the inversion tritium accident source item by adopting an atmospheric dispersion model in the traditional method.
The invention patent application with publication number of CN109164115A discloses a BIXS method analysis device for tritium in a sample, which utilizes the interaction characteristic of beta rays and substances, has simple structure, small volume, low price, high detection speed and high sensitivity, and supports experiments under two different conditions of vacuum and argon filling.
However, the above methods cannot effectively and accurately measure the content and the distribution depth of tritium in a solid material, and the patent application of the invention with the publication number of CN110045411A discloses a method for measuring the depth distribution of deuterium and tritium in a solid material, and the method is complicated in measurement method and is not suitable for measuring the distribution of tritium alone because an analysis model for simultaneously analyzing the deuterium and the tritium is required for measuring the distribution of the deuterium and the tritium.
Disclosure of Invention
The technical problem to be solved by the invention is to provide a method capable of accurately measuring the distribution condition of tritium in a solid material.
The invention solves the technical problems by the following technical proposal that the method for measuring the tritium content in the solid material comprises the following steps,
S1, placing a measured object between parallel electrode plates, changing voltage parameters at two ends of the electrode plates, and obtaining multiple groups of energy spectrum data;
S2, calculating X-ray energy spectrum data induced by beta rays under different electric field intensities;
and S3, establishing a multi-energy spectrum combination inversion model, constructing a functional relation of the total ray energy spectrum and the ray energy spectrums with different depths under an electric field, and solving the distribution condition of tritium at different depths based on the inversion model under different electric field intensities.
According to the invention, a measured object is placed between parallel electrode plates, multi-energy spectrum data are obtained through an excitation electric field, beta-ray induced X-ray energy spectrum data are extracted, a relation formula of tritium content and energy spectrum of each layer is built by layering the measured object, and the tritium content of each layer is settled based on numerical values under various different electric fields, so that the distribution condition of the tritium content in the measured object is obtained, a measurement spectrum is enhanced by a high-voltage means, larger errors in the measurement process are avoided, guarantee is provided for subsequent data inversion, and the accuracy of inversion calculation is improved.
Preferably, the parallel electrode plates are made of beta-ray blocking layer materials.
Preferably, the multi-energy spectrum data includes beta-ray and X-ray energy spectrums of two sides of the measured object acquired by the ionization chamber detector and the semiconductor detector.
Preferably, the Monte Carlo model is used to calculate energy spectrum data under different electric field intensities, and the energy spectrum data of the X-ray induced by the beta rays is obtained.
Preferably, the method for establishing the multi-energy spectrum inversion model is that,
Dividing the measured object into n layers, measuring the energy spectrum data by using m different electric fields, and expressing the total X-ray energy spectrum S (E j) as follows,
Wherein f i(Ej) represents an X-ray energy spectrum when only the ith layer contains tritium element under the action of an electric field in the jth, and a i represents the tritium content of the ith layer;
s (E j) is obtained by measurement under different electric field intensities, an inversion equation set is constructed,
And solving the equation set to calculate the tritium content a i in each layer.
The method for measuring the tritium content in the solid material has the advantages that a measured object is placed between parallel electrode plates, multi-energy spectrum data are obtained through an excitation electric field, beta-ray induced X-ray energy spectrum data are extracted, a relation formula of the tritium content of each layer and the energy spectrum is built by layering the measured object, settlement is carried out on the tritium content of each layer based on numerical values under various different electric fields, distribution conditions of the tritium content in the measured object are obtained, a high-voltage measure is used for enhancing the measured spectrum, larger errors are avoided in the measuring process, guarantee is provided for subsequent data inversion, and inversion calculation accuracy is improved.
Drawings
FIG. 1 is a flow chart of a method for measuring tritium content in a solid material provided by an embodiment of the invention;
FIG. 2 is a schematic diagram of a method for measuring tritium content in a solid material according to an embodiment of the present invention.
Detailed Description
For the purposes of making the objects, technical solutions and advantages of the present invention more apparent, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings, and it is apparent that the described embodiments are some embodiments of the present invention, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
With reference to fig. 1 and 2, this example provides a method for measuring tritium content in a solid material, comprising,
S1, placing a measured object between parallel electrode plates, changing voltage parameters at two ends of the electrode plates, and obtaining multiple groups of energy spectrum data;
S2, calculating X-ray energy spectrum data induced by beta rays under different electric field intensities;
and S3, establishing a multi-energy spectrum combination inversion model, constructing a functional relation of the total ray energy spectrum and the ray energy spectrums with different depths under an electric field, and solving the distribution condition of tritium at different depths based on the inversion model under different electric field intensities.
According to the embodiment, the measured object is placed between the parallel electrode plates, multi-energy spectrum data are obtained through the excitation electric field, beta-ray induced X-ray energy spectrum data are extracted, the measured object is subjected to layered construction of a relation formula of tritium content and energy spectrum of each layer, and the tritium content of each layer is settled based on numerical values under various different electric fields, so that the distribution condition of the tritium content in the measured object is obtained, the measurement spectrum is enhanced by a high-voltage means, larger errors in the measurement process are avoided, guarantee is provided for subsequent data inversion, and the inversion calculation accuracy is improved.
Specifically, the method for measuring the tritium content in the solid material provided by the embodiment comprises the following steps of,
S1, placing a measured object between parallel electrode plates, changing voltage parameters at two ends of the electrode plates, and obtaining multiple groups of energy spectrum data;
The parallel electrode plate is made of beta-ray blocking layer materials, aluminum is used in the embodiment, and the ionization detector and the semiconductor detector are used for measuring beta-rays and X-rays on two sides of a tested object respectively while voltage parameters on two ends of the electrode plate are changed in the test, so that multi-energy spectrum data are obtained and used as experimental spectrums.
S2, calculating X-ray energy spectrum data induced by beta rays under different electric field intensities;
in this embodiment, a monte carlo model is used to calculate energy spectrum data under different electric field intensities, and the energy spectrum data of the X-ray induced by the beta rays is obtained as a simulated spectrum.
And S3, establishing a multi-energy spectrum combination inversion model, constructing a functional relation of the total ray energy spectrum and the ray energy spectrums with different depths under an electric field, and solving the distribution condition of tritium at different depths based on the inversion model under different electric field intensities.
The method for establishing the multi-energy spectrum inversion model comprises the following steps of,
Dividing the measured object into n layers, measuring the energy spectrum data by using m different electric fields, and expressing the total X-ray energy spectrum S (E j) as follows,
Wherein, f i(Ej) represents the X-ray energy spectrum when only the ith layer contains tritium element under the action of the electric field in the j, and a i represents the tritium content of the ith layer, which is obtained through the calculation result of S2;
s (E j) is obtained by measurement under different electric field intensities, an inversion equation set is constructed,
And solving the equation set to calculate the tritium content a i in each layer.
The foregoing embodiments are merely for illustrating the technical solution of the present invention, but not for limiting the same, and although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those skilled in the art that modifications may be made to the technical solution described in the foregoing embodiments or equivalents may be substituted for parts of the technical features thereof, and that such modifications or substitutions do not depart from the spirit and scope of the technical solution of the embodiments of the present invention in essence.
Claims (4)
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Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106844996A (en) * | 2017-02-10 | 2017-06-13 | 中国科学院合肥物质科学研究院 | A kind of accident tritium Source Term Inversion method based on plant tritium Monitoring Data |
| CN107657119A (en) * | 2017-09-29 | 2018-02-02 | 环太平洋高科技开发有限公司 | Improve the measuring method of gamma spectra data quality |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB9502050D0 (en) * | 1995-02-02 | 1995-03-22 | Euratom | Apparatus and method for tritium measurement by gas scintillation |
| JP3781893B2 (en) * | 1998-04-14 | 2006-05-31 | 国昭 渡辺 | Method and apparatus for measuring tritium |
| CN110045411B (en) * | 2019-04-09 | 2022-11-25 | 中国科学院合肥物质科学研究院 | A method for measuring the depth distribution of deuterium and tritium in solid matter |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN106844996A (en) * | 2017-02-10 | 2017-06-13 | 中国科学院合肥物质科学研究院 | A kind of accident tritium Source Term Inversion method based on plant tritium Monitoring Data |
| CN107657119A (en) * | 2017-09-29 | 2018-02-02 | 环太平洋高科技开发有限公司 | Improve the measuring method of gamma spectra data quality |
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