CN114356677B - NVMe SSD hot plug test method, device, equipment and storage medium - Google Patents
NVMe SSD hot plug test method, device, equipment and storage medium Download PDFInfo
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Abstract
The invention relates to the technical field of data storage, and provides a NVMe SSD hot plug test method, a device, equipment and a storage medium, wherein the method comprises the following steps: acquiring equipment information of the NVMe SSD to be tested, wherein the NVMe SSD to be tested is connected to a test host through a storage system component hot plug equipment; sending a control instruction to the hot-plug equipment of the storage system component, wherein the control instruction carries preset test parameters and equipment information so that the hot-plug equipment of the storage system component configures on-off delay information of a target signal pin according to the test parameters, and the target signal pin is a signal pin for establishing a connection relation between the NVMe SSD to be tested and the test host; and controlling the hot plug equipment of the storage system component to carry out on-off control on the target signal pin according to the on-off delay information so as to simulate the hot plug scene of the NVMe SSD to be tested. The invention can achieve the purpose of accurately and quickly testing the NVMe SSD hot plug function.
Description
Technical Field
The invention relates to the technical field of storage equipment fault testing, in particular to a NVMe SSD hot plug testing method, device, equipment and storage medium.
Background
In recent years, with rapid development of industries such as cloud computing, big data, internet of things and the like, the demand for data storage is increasing. Because the nvmessd (non-volatile memory host controller interface specification solid state disk) has the characteristics of large capacity, high read-write speed, low io delay and the like, the market scale of the nvmessd is greatly improved no matter in a consumer-grade market or an enterprise-grade market, the nvmessd is already applied in a large scale in different application scenes, the use requirement on the nvmessd is more and more diversified, and the requirement on the reliability of the nvmessd is more and more high. When the server is in use and the nvmessd storage space is insufficient or fails, new nvmessd equipment needs to be added, decreased or replaced, and the nvmessd can be updated or expanded under the condition that the server is started up by the hot plug function of the nvmessd without influencing the normal operation of the system. Therefore, an nvmessd hot plug test method with higher test efficiency is needed.
The prior art proposes several nvmessd hot plug tests:
one mode is realized by depending on an ipmitool tool through BMC (baseboard management controller) out-of-band management, the mode is large in limitation, and the mode can be realized only by supporting a BMC out-of-band management hot plug function by the test server and the test nvmessd at the same time, but most of the conventional mainstream servers do not support the BMC hot plug function. Moreover, the hot plug in this way cannot achieve the accurate control of the plugging time and speed, and also cannot achieve the non-notification hot plug test.
The other mode is realized by setting the POWER state corresponding to the PCIe card slot, which can be understood as unloading and loading nvmessd, the mode cannot fully simulate the test scene of the actual hot plug of the nvmessd, and only can support notification type hot plug and non-notification type hot plug.
Disclosure of Invention
In view of the above problems, the present invention is proposed to provide a NVMe SSD hot plug test method, apparatus, device and storage medium that overcome the above problems or at least partially solve the above problems.
In one aspect of the invention, a NVMe SSD hot plug test method is provided, the method comprising:
acquiring equipment information of an NVMe SSD to be tested, wherein the NVMe SSD to be tested is connected to a test host through a storage system component hot plug equipment;
sending a control instruction to storage system component hot plug equipment, wherein the control instruction carries preset test parameters and equipment information, so that the storage system component hot plug equipment configures on-off delay information of a target signal pin according to the test parameters, and the target signal pin is a signal pin for establishing a connection relation between an NVMe SSD to be tested corresponding to the equipment information and a test host;
and controlling the hot plug equipment of the storage system component to carry out on-off control on the target signal pin according to the on-off delay information so as to simulate the hot plug scene of the NVMe SSD to be tested by changing the on-off state of the target signal pin.
Further, the method further comprises:
writing a preset amount of data into the NVMe SSD to be tested in advance.
Further, the controlling the hot plug device of the storage system component to perform on-off control on the target signal pin according to the on-off delay information includes:
and performing data writing operation on the NVMe SSD to be detected, and controlling the hot-plug equipment of the storage system component to perform on-off control on the target signal pin according to the on-off delay information in the data writing process or after the data writing operation is completed.
Further, the target signal pin includes: a power signal pin and a data signal pin;
the controlling the hot plug equipment of the storage system component to carry out on-off control on the target signal pin according to the on-off delay information comprises the following steps:
controlling the hot-plug equipment of the storage system component to sequentially disconnect a power signal pin and a data signal pin according to the on-off delay information so as to simulate the scene of pulling out the NVMe SSD to be tested;
after a preset waiting time, controlling the hot plug equipment of the storage system component to sequentially connect the power signal pin and the data signal pin according to the on-off delay information so as to simulate a scene of NVMe SSD insertion to be tested.
Further, after controlling the hot-plug device of the storage system component to sequentially disconnect the power signal pin and the data signal pin according to the on-off delay information, the method further comprises:
and detecting the equipment information of the NVMe SSD to be detected, and judging whether the NVMe SSD to be detected is subjected to pulling-out operation or not.
Further, after controlling the hot-plug device of the storage system component to sequentially connect the power signal pin and the data signal pin according to the on-off delay information, the method further comprises:
detecting equipment information of the NVMe SSD to be detected, and judging whether the NVMe SSD to be detected has an abnormal insertion condition;
and if the NVMe SSD to be tested has an abnormal insertion condition, acquiring and recording abnormal insertion information.
Further, the method further comprises:
and if the NVMe SSD to be tested is normally inserted, repeatedly executing the operation of controlling the hot plug equipment of the storage system component to carry out on-off control on the target signal pin according to the on-off delay information until the preset test times are reached.
In another aspect of the present invention, a NVMe SSD hot plug test apparatus is further provided, the apparatus includes:
the device comprises an acquisition module, a test host and a storage system component, wherein the acquisition module is used for acquiring the device information of the NVMe SSD to be tested, and the NVMe SSD to be tested is connected to the test host through a hot plug device of the storage system component;
the configuration module is used for sending a configuration instruction to the hot-plug equipment of the storage system component, wherein the configuration instruction carries preset test parameters and the equipment information so as to enable the hot-plug equipment of the storage system component to configure on-off delay information of a target signal pin according to the test parameters, and the target signal pin is a signal pin for establishing a connection relation between the NVMe SSD to be tested and the test host corresponding to the equipment information;
and the control module is used for controlling the hot plug equipment of the storage system component to carry out on-off control on the target signal pin according to the on-off delay information so as to simulate the hot plug scene of the NVMe SSD to be tested by changing the on-off state of the target signal pin.
In a third aspect of the present invention, an NVMe SSD hot plug test device is further provided, which includes a memory, a processor, and a computer program stored on the memory and executable on the processor, where the processor implements the steps of the NVMe SSD hot plug test method when executing the computer program.
In a fourth aspect of the present invention, there is also provided a computer readable storage medium, on which a computer program is stored, which when executed by a processor, implements the steps of the NVMe SSD hot plug test method as above.
The NVMe SSD hot plug test method, the NVMe SSD hot plug test device, the NVMe SSD hot plug test equipment and the NVMe SSD hot plug test storage medium provided by the embodiment of the invention can realize the accurate hot plug speed and time control of the NVMe SSD to be tested, realize the coverage of various hot plug test scenes, have strong expandability and good transplantation flexibility, and achieve the purpose of accurately and quickly testing the NVMe SSD hot plug function.
The foregoing description is only an overview of the technical solutions of the present invention, and the embodiments of the present invention are described below in order to make the technical means of the present invention more clearly understood and to make the above and other objects, features, and advantages of the present invention more clearly understandable.
Drawings
Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The drawings are only for purposes of illustrating the preferred embodiments and are not to be construed as limiting the invention. Also, like reference numerals are used to refer to like parts throughout the drawings. In the drawings:
fig. 1 is a flowchart of an NVMe SSD hot plug test method according to an embodiment of the present invention;
fig. 2 is a schematic connection diagram of a hot plug test system applicable to the NVMe SSD hot plug test method according to the embodiment of the present invention;
fig. 3 is a structural block diagram of an NVMe SSD hot plug test device according to an embodiment of the present invention.
Detailed Description
Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.
As used herein, the singular forms "a", "an", "the" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms "comprises" and/or "comprising," when used in this specification, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
It will be understood by those skilled in the art that, unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. It will be further understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the prior art and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein.
Fig. 1 schematically shows a flowchart of an NVMe SSD hot plug test method according to an embodiment of the present invention. Referring to fig. 1, the NVMe SSD hot plug test method of the embodiment of the present invention specifically includes the following steps:
and S11, acquiring device information of the NVMe SSD to be tested, wherein the NVMe SSD to be tested is connected to the test host through the hot plug device of the storage system component.
In this embodiment, the hot-plug device of the storage system component may be implemented by a share device. As shown in fig. 2, specifically, the share device establishes a connection relationship between the NVMe SSD to be tested and the Host Server of the test Host through the power signal pin, the data signal pin, and the bypass signal pin, so as to simulate a plug-in connection between the NVMe SSD to be tested and the test Host. The Quarch device comprises a connection Module Connector Module and a Control Module, the Control Module of the Quarch device is powered by a 12V DC power supply and is connected to a test Host Server through a USB interface, one end of the connection Module Connector Module is connected with the Control Module, and the other end of the connection Module Connector Module is connected with the NVMe SSD to be tested.
The test host is provided with a Linux system, an upper Control software program Control software developed by using a general programming language is run in the test host, and the NVMe SSD to be tested and the hot plug equipment of the storage system component can be synchronously controlled to cooperate with each other through the upper Control software program Control software to realize the hot plug test of the NVMe SSD.
The device information of the NVMe SSD to be tested comprises a device name displayed in the test host system, a bus ID (namely a bus ID) connected with the PCIe and a slot num (namely a PCIe card slot number corresponding to the NVMe SSD to be tested).
S12, sending a control instruction to the hot-plug equipment of the storage system component, wherein the control instruction carries preset test parameters and the equipment information, so that the hot-plug equipment of the storage system component configures on-off delay information of a target signal pin according to the test parameters, and the target signal pin is a signal pin for establishing a connection relation between the NVMe SSD to be tested and the test host corresponding to the equipment information.
In this embodiment, the test host sends out a Control instruction according to a test parameter value preset by software through an upper Control software program Control software to set on-off delay time of 3 groups of signal pins in the Quarch device, which can be accurate to millisecond level.
And S13, controlling the hot plug equipment of the storage system component to carry out on-off control on the target signal pin according to the on-off delay information, so as to simulate the hot plug scene of the NVMe SSD to be tested by changing the on-off state of the target signal pin.
As shown in fig. 2, the NVMe SSDPCIE interface includes a power signal pin, a data signal pin, and a bypass signal pin, and the on-off sequence of the different pins may cause different effects when performing hot plug. The Quarch equipment comprises a connection Module Connector Module and a Control Module, and Software instructions are issued through an upper Control Software program Control Software to Control the connection Module Connector Module and the Control Module to be matched and operated, so that accurate on-off Control can be performed on each signal pin of the Quarch, and therefore the simulation hot plug operation of the NVMe SSD to be tested is achieved. The upper layer Control Software program Control Software can respectively realize notification type and non-notification type hot plug tests by issuing different Control instructions, and simultaneously can support the NVMe SSD to be tested to carry out hot plug tests in the IO data read-write process and after the IO data read-write.
The NVMe SSD hot plug test method provided by the embodiment of the invention can realize the accurate hot plug speed and time control of the NVMe SSD to be tested, realize the coverage of various hot plug test scenes, has strong expandability and good transplantation flexibility, and achieves the purpose of accurately and quickly testing the NVMe SSD hot plug function.
In this embodiment of the present invention, before controlling the hot-plug device of the storage system component to perform on-off control on the target signal pin according to the on-off delay information, the method further includes: writing a preset amount of data into the NVMe SSD to be tested in advance. Wherein the written data is known data.
Specifically, after the test host computer tests the device information of the NVMe SSD through the upper Control software program Control software, the Quarch device is initialized, the running state of the Quarch device is checked and basic state information is reported, and then a certain amount of data writing is carried out on the NVMe SSD in advance by using a storage device data reading and writing tool FIO. Among other things, FIO is a tool that can spawn many threads or processes and perform certain types of I/O operations specified by a user. In this embodiment, a certain amount of known data is written into the NVMe SSD to be tested in advance, so that after the NVMe SSD to be tested is simulated to be hot-plugged, whether the NVMe SSD to be tested has data abnormality is determined according to the condition of data being written in advance.
In the embodiment of the present invention, a specific implementation manner for controlling the hot-plug device of the storage system component to perform on-off control on the target signal pin according to the on-off delay information is as follows: and performing data writing operation on the NVMe SSD to be detected, and controlling the hot-plug equipment of the storage system component to perform on-off control on the target signal pin according to the on-off delay information in the data writing process or after the data writing operation is completed. In the embodiment, the thermal plugging of the NVMe SSD to be tested is simulated in the process of writing the known data into the NVMe SSD to be tested, so that after the thermal plugging of the NVMe SSD to be tested is simulated, whether the data abnormality occurs in the NVMe SSD to be tested is judged according to the situation of writing the data,
specifically, the target signal pins comprise power signal pins and data signal pins, and coverage of various hot plug test scenes can be realized by controlling different on-off delay information of the power signal pins and the data signal pins.
In a specific example, the controlling the hot plug device of the storage system component to perform on-off control on the target signal pin according to the on-off delay information further includes the following steps: controlling the hot-plug equipment of the storage system component to sequentially disconnect a power signal pin and a data signal pin according to the on-off delay information so as to simulate the scene of pulling out the NVMe SSD to be tested; after a preset waiting time, controlling the hot plug equipment of the storage system component to sequentially connect the power signal pin and the data signal pin according to the on-off delay information so as to simulate a scene of NVMe SSD insertion to be tested. After the hot plug device of the storage system component is controlled to sequentially disconnect the power signal pin and the data signal pin according to the on-off delay information, the device information of the NVMe SSD to be detected is detected, and whether the NVMe SSD to be detected is subjected to pulling-out operation is judged.
Specifically, the test host starts double threads through an upper Control software program Control software, and thread 1 uses FIO to perform continuous data read-write operation on the NVMe SSD to be tested; and the thread 2 controls the Quarch equipment to sequentially disconnect the power supply signal pin and the data signal pin of the NVMe SSD to be tested according to the on-off delay information, simulates the pulling-out scene of the disk to be tested, and checks the equipment information of the nvmessd to be tested to ensure that the disk to be tested is really pulled out. After the preset waiting time, the test host controls the Quarch device to sequentially reconnect the power supply signal pin and the data signal pin of the NVMe SSD to be tested according to on-off delay information through the upper Control software program Control software, and simulates the scene of inserting the disk to be tested
Further, after controlling the hot plug device of the storage system component to sequentially connect the power signal pin and the data signal pin according to the on-off delay information, detecting device information of the NVMe SSD to be detected, and judging whether the NVMe SSD to be detected is abnormally inserted; if the NVMe SSD to be tested has an abnormal insertion condition, acquiring and recording abnormal insertion information; and if the NVMe SSD to be tested is normally inserted, repeatedly executing the operation of controlling the hot plug equipment of the storage system component to carry out on-off control on the target signal pin according to the on-off delay information until the preset test times are reached.
Specifically, the test host checks the device information of the to-be-tested NVMe SSD through the upper Control software program Control software to determine whether the to-be-tested NVMe SSD is abnormal after being inserted, and if the to-be-tested NVMe SSD is abnormal, the upper Control software program Control software automatically collects relevant insertion abnormal information records and then exits; and if all the NVMe SSD to be tested is normal, the upper Control software program Control software can repeatedly execute the operation of controlling the hot plug equipment of the storage system component to carry out on-off Control on the target signal pin according to the on-off delay information according to the test times of the preset hot plug until the preset test times are reached.
In this embodiment, the test host automatically collects, records and stores the information of the test nvmessd and the test system before exiting through the upper Control software program Control software, which is convenient for data analysis after the test is completed.
A complex power supply Control device does not need to be designed, automatic testing can be well realized through an upper Control software program Control software running on a testing host, labor is saved, and testing efficiency can be effectively improved. The expansibility is good, and the parallel test of multiple disks can be deployed at the same time. Through setting up each pin break-make interval time to the quarch equipment, can simulate the hot plug operation of different speeds, it is high to the control accuracy of NVMe SSD interface that awaits measuring, can realize thousands of hot plug tests fast to can simulate multiple hot plug test scene, thereby improve the test coverage of hot plug function.
For simplicity of explanation, the method embodiments are described as a series of acts or combinations, but those skilled in the art will appreciate that the embodiments are not limited by the order of acts described, as some steps may occur in other orders or concurrently with other steps in accordance with the embodiments of the invention. Further, those skilled in the art will appreciate that the embodiments described in the specification are presently preferred and that no particular act is required to implement the invention.
Fig. 3 schematically shows a structural schematic diagram of an NVMe SSD hot plug test device according to an embodiment of the invention. Referring to fig. 3, the NVMe SSD hot plug test device of the embodiment of the present invention specifically includes an obtaining module 201, a configuration module 202, and a control module 203, where:
the acquiring module 201 is configured to acquire device information of an NVMe SSD to be tested, where the NVMe SSD to be tested is connected to a test host through a storage system component hot plug device;
the configuration module 202 is configured to send a configuration instruction to a storage system component hot-plug device, where the configuration instruction carries preset test parameters and device information, so that the storage system component hot-plug device configures on-off delay information of a target signal pin according to the test parameters, where the target signal pin is a signal pin for establishing a connection relationship between an NVMe SSD to be tested and a test host corresponding to the device information;
and the control module 203 is used for controlling the hot plug equipment of the storage system component to perform on-off control on the target signal pin according to the on-off delay information so as to simulate a hot plug scene of the NVMe SSD to be tested by changing the on-off state of the target signal pin.
In this embodiment of the present invention, the control module 203 is further configured to write a preset amount of data in the NVMe SSD to be tested in advance.
In the embodiment of the present invention, the control module 203 is configured to perform data writing operation on the NVMe SSD to be tested, and control the hot-plug device of the storage system component to perform on-off control on the target signal pin according to the on-off delay information during data writing process or after the data writing operation is completed.
In an embodiment of the present invention, the target signal pin includes: a power signal pin and a data signal pin.
Further, the control module 203 comprises a first control unit and a second control unit, wherein:
the first control unit is used for controlling the hot plug equipment of the storage system component to sequentially disconnect the power signal pin and the data signal pin according to the on-off delay information so as to simulate the scene of pulling out the NVMe SSD to be tested;
and the second control unit is used for controlling the hot-plug equipment of the storage system component to sequentially connect the power signal pin and the data signal pin according to the on-off delay information after the preset waiting time so as to simulate the scene of inserting the NVMe SSD to be tested.
In this embodiment, the control module 203 further includes a first determining unit, where the first determining unit is configured to detect device information of the to-be-tested NVMe SSD after controlling the hot-plug device of the storage system component to sequentially disconnect the power signal pin and the data signal pin according to the on-off delay information, and determine whether the to-be-tested NVMe SSD is subjected to a pulling-out operation.
In this embodiment, the control module 203 further includes a second determining unit and an obtaining unit, where:
the second determination unit is used for detecting the device information of the NVMe SSD to be detected after controlling the hot plug device of the storage system component to be sequentially connected with the power signal pin and the data signal pin according to the on-off delay information, and determining whether the NVMe SSD to be detected is abnormally inserted;
and the obtaining unit is used for obtaining and recording insertion abnormity information when the judgment result of the second judging unit is that the NVMe SSD to be tested has an insertion abnormity.
Further, the control module 203 is further configured to, when the determination result of the second determination unit is that the NVMe SSD to be tested is normally inserted, repeatedly perform an operation of controlling the hot plug device of the storage system component to perform on-off control on the target signal pin according to the on-off delay information until the preset test times are reached.
For the device embodiment, since it is basically similar to the method embodiment, the description is simple, and for the relevant points, refer to the partial description of the method embodiment.
In addition, the embodiment of the invention also provides NVMe SSD hot plug test equipment, which comprises a memory, a processor and a computer program which is stored in the memory and can run on the processor, wherein the processor executes the computer program to realize the steps of the NVMe SSD hot plug test method. Such as steps S11-S13 shown in FIG. 1.
In addition, an embodiment of the present invention further provides a computer-readable storage medium, on which a computer program is stored, where the computer program, when executed by a processor, implements the steps of the NVMe SSD hot plug test method described above.
In this embodiment, if the NVMe SSD hot plug test method is implemented in the form of a software functional unit and sold or used as an independent product, it may be stored in a computer readable storage medium. Based on such understanding, all or part of the flow of the method according to the embodiments of the present invention may also be implemented by a computer program, which may be stored in a computer-readable storage medium, and when the computer program is executed by a processor, the steps of the method embodiments described above may be implemented. Wherein the computer program comprises computer program code, which may be in the form of source code, object code, an executable file or some intermediate form, etc. The computer-readable medium may include: any entity or device capable of carrying the computer program code, recording medium, U.S. disk, removable hard disk, magnetic diskette, optical disk, computer Memory, Read-Only Memory (ROM), Random Access Memory (RAM), electrical carrier wave signal, telecommunications signal, and software distribution medium, etc. It should be noted that the computer readable medium may contain content that is subject to appropriate increase or decrease as required by legislation and patent practice in jurisdictions, for example, in some jurisdictions, computer readable media does not include electrical carrier signals and telecommunications signals as is required by legislation and patent practice.
The NVMe SSD hot plug test method, the NVMe SSD hot plug test device, the NVMe SSD hot plug test equipment and the NVMe SSD hot plug test storage medium provided by the embodiment of the invention can realize the accurate hot plug speed and time control of the NVMe SSD to be tested, realize the coverage of various hot plug test scenes, have strong expandability and good transplantation flexibility, and achieve the purpose of accurately and quickly testing the NVMe SSD hot plug function.
Furthermore, those skilled in the art will appreciate that while some embodiments herein include some features included in other embodiments, rather than other features, combinations of features of different embodiments are meant to be within the scope of the invention and form different embodiments. For example, any of the claimed embodiments may be used in any combination.
Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (10)
1. A NVMe SSD hot plug test method is characterized by comprising the following steps:
acquiring equipment information of the NVMe SSD to be tested, wherein the NVMe SSD to be tested is connected to a test host through hot plug equipment of a storage system component;
sending a control instruction to storage system component hot plug equipment, wherein the control instruction carries preset test parameters and equipment information, so that the storage system component hot plug equipment configures on-off delay information of a target signal pin according to the test parameters, the target signal pin is a signal pin for establishing a connection relation between an NVMe SSD to be tested and a test host corresponding to the equipment information, and the target signal pin comprises a power supply signal pin and a data signal pin;
controlling the hot plug equipment of the storage system component to carry out on-off control on the target signal pin according to the on-off delay information, so as to simulate the hot plug scene of the NVMe SSD to be tested by changing the on-off state of the target signal pin, and after the NVMe SSD to be tested is simulated to carry out hot plug, judging whether the NVMe SSD to be tested has data abnormality according to the condition of writing data;
the test host computer starts a double thread through the upper control software program, and the thread 1 is used for performing continuous data read-write operation on the NVMe SSD to be tested by using a storage device data read-write tool; and the thread 2 is used for controlling the hot plug equipment of the storage system component to carry out on-off control on the target signal pin according to the on-off delay information.
2. The method of claim 1, further comprising:
writing a preset amount of data into the NVMe SSD to be tested in advance.
3. The method according to claim 1, wherein the controlling the hot plug device of the storage system component to perform on-off control on the target signal pin according to the on-off delay information comprises:
and performing data writing operation on the NVMe SSD to be detected, and controlling the hot-plug equipment of the storage system component to perform on-off control on the target signal pin according to the on-off delay information in the data writing process or after the data writing operation is completed.
4. The method according to claim 1, wherein the controlling the hot plug device of the storage system component to perform on-off control on the target signal pin according to the on-off delay information comprises:
controlling the hot-plug equipment of the storage system component to sequentially disconnect a power signal pin and a data signal pin according to the on-off delay information so as to simulate the scene of pulling out the NVMe SSD to be tested;
after a preset waiting time, controlling the hot plug equipment of the storage system component to sequentially connect the power signal pin and the data signal pin according to the on-off delay information so as to simulate a scene of NVMe SSD insertion to be tested.
5. The method of claim 4, wherein after controlling the hot-plug device of the storage system component to sequentially turn off the power signal pin and the data signal pin according to the on-off delay information, the method further comprises:
and detecting the equipment information of the NVMe SSD to be detected, and judging whether the NVMe SSD to be detected is subjected to pulling-out operation or not.
6. The method of claim 4, wherein after controlling the hot-plug device of the storage system component to sequentially connect the power signal pin and the data signal pin according to the on-off delay information, the method further comprises:
detecting equipment information of the NVMe SSD to be detected, and judging whether the NVMe SSD to be detected has an abnormal insertion condition;
and if the NVMe SSD to be tested has an abnormal insertion condition, acquiring and recording abnormal insertion information.
7. The method of claim 6, further comprising:
and if the NVMe SSD to be tested is normally inserted, repeatedly executing the operation of controlling the hot plug equipment of the storage system component to carry out on-off control on the target signal pin according to the on-off delay information until the preset test times are reached.
8. A NVMe SSD hot plug testing device, the device comprising:
the device comprises an acquisition module, a test host and a storage system component, wherein the acquisition module is used for acquiring the device information of the NVMe SSD to be tested, and the NVMe SSD to be tested is connected to the test host through a hot plug device of the storage system component;
the configuration module is used for sending a configuration instruction to the storage system component hot plug equipment, wherein the configuration instruction carries preset test parameters and equipment information so that the storage system component hot plug equipment configures on-off delay information of a target signal pin according to the test parameters, the target signal pin is a signal pin for establishing a connection relation between an NVMe SSD to be tested and a test host corresponding to the equipment information, and the target signal pin comprises a power supply signal pin and a data signal pin;
the control module is used for controlling the hot plug equipment of the storage system component to carry out on-off control on the target signal pin according to the on-off delay information, so as to simulate the hot plug scene of the NVMe SSD to be tested by changing the on-off state of the target signal pin, and after the NVMe SSD to be tested is simulated to carry out hot plug, whether the NVMe SSD to be tested has abnormal data is judged according to the situation of writing data; the test host computer starts a double thread through the upper control software program, and the thread 1 is used for performing continuous data read-write operation on the NVMe SSD to be tested by using a storage device data read-write tool; and the thread 2 is used for controlling the hot plug equipment of the storage system component to carry out on-off control on the target signal pin according to the on-off delay information.
9. An NVMe SSD hot plug test device, comprising a memory, a processor and a computer program stored on the memory and executable on the processor, the processor implementing the steps of the method as claimed in any of claims 1-7 when executing the computer program.
10. A computer-readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out the steps of the method according to any one of claims 1 to 7.
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Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10678739B1 (en) * | 2019-05-02 | 2020-06-09 | Wistron Corporation | Electronic system, host device and control method |
| CN111966545A (en) * | 2020-07-30 | 2020-11-20 | 苏州浪潮智能科技有限公司 | PCIe splitter hot plug test method, device, equipment and storage medium |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7339367B2 (en) * | 2006-04-28 | 2008-03-04 | Agilent Technologies, Inc. | Interface for detection and control of multiple test probes |
| US20070271404A1 (en) * | 2006-05-16 | 2007-11-22 | Sun Microsystems, Inc. | Realtime multithreaded hot-plug control |
| CN109032864A (en) * | 2018-07-20 | 2018-12-18 | 郑州云海信息技术有限公司 | A kind of method and system of NVMe SSD hot plug test |
| CN109117335A (en) * | 2018-08-15 | 2019-01-01 | 浪潮电子信息产业股份有限公司 | A kind of hard disk simulation hot plug test method, device, terminal and storage medium |
| CN109189621A (en) * | 2018-08-20 | 2019-01-11 | 郑州云海信息技术有限公司 | A kind of test method and system of NVMe SSD hot plug |
| CN112015609A (en) * | 2020-08-28 | 2020-12-01 | 北京浪潮数据技术有限公司 | Hot plug test method, device and equipment |
| CN113656224A (en) * | 2021-07-22 | 2021-11-16 | 浪潮商用机器有限公司 | NVMe SSD hot plug test method, system, device and readable storage medium |
| CN114064541B (en) * | 2022-01-18 | 2022-04-22 | 苏州浪潮智能科技有限公司 | Method, device, equipment and storage medium for simulating plugging and unplugging of hard disk |
-
2022
- 2022-03-16 CN CN202210255032.0A patent/CN114356677B/en active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10678739B1 (en) * | 2019-05-02 | 2020-06-09 | Wistron Corporation | Electronic system, host device and control method |
| CN111966545A (en) * | 2020-07-30 | 2020-11-20 | 苏州浪潮智能科技有限公司 | PCIe splitter hot plug test method, device, equipment and storage medium |
Non-Patent Citations (1)
| Title |
|---|
| 大型复杂系统内存热插拔技术的实现;高云岭等;《电子技术与软件工程》(第19期) * |
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