CN114322886B - Attitude probe with multiple sensors - Google Patents
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- CN114322886B CN114322886B CN202210022496.7A CN202210022496A CN114322886B CN 114322886 B CN114322886 B CN 114322886B CN 202210022496 A CN202210022496 A CN 202210022496A CN 114322886 B CN114322886 B CN 114322886B
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Abstract
The present disclosure describes a gesture probe with multisensor, gesture probe is used for carrying out spatial position and gesture measurement, including the reference layer that is provided with the position sensitive detector, be provided with the prism layer of hollow pyramid prism, and intermediate level between reference layer and the prism layer, the position sensitive detector sets up in the geometric center region of reference layer, the position sensitive detector includes the photosurface, the photosurface of position sensitive detector is perpendicular with the axis of hollow pyramid prism, and be configured to through the photosurface in order to detect the displacement distance of laser beam relative to the photosurface and output voltage signal, the prism layer is provided with the indication unit, the indication unit includes a plurality of white indication units and a plurality of black indication units, white indication unit and black indication unit configuration are not on the coplanar, the intermediate level includes the aperture plate that is provided with first through-hole, when gesture probe received the light beam, the light beam reaches the photosurface through first through-hole.
Description
Technical Field
The present disclosure relates to the industry of intelligent manufacturing equipment, and in particular to a gesture probe with multiple sensors.
Background
In the precision industry and the measurement field, when assembling a large-sized machine, people often need to test an assembled object by a precision instrument to improve the assembly precision, and meanwhile, after the machine is assembled, the machine needs to be calibrated, and in the assembly process, besides the three-dimensional coordinate measurement of the object or a certain target point on the object, the movement condition of the object or the target point needs to be measured, namely, the gesture of the object or the target point is measured, so that an instrument capable of measuring the three-dimensional coordinate of the object and the six-degree-of-freedom coordinate and gesture measurement of the object is needed. Thus, a laser tracker capable of performing high-precision measurement of a target object or point has emerged.
At present, a measuring system based on a laser tracker tracking target is widely applied to assembly or high-precision calibration of mechanical equipment, and because the laser tracker is provided with a plurality of rotating shafts, when the machine is measured or calibrated, the laser tracker rotates through the plurality of rotating shafts and is matched with the information of the space coordinates and the attitude angles of the target test target.
In the prior art, it is common to use a sensor with a position sensitive surface (e.g. a PSD or a CCD) alone, wherein a laser beam reflected on a target can be detected by a position sensitive detector and an output signal is generated, and the position and attitude of the target are obtained by processing the output signal. However, when the position of the attitude probe changes and even the laser beam reflected on the target is blocked, it is difficult to detect the change of the attitude probe by the position-sensitive probe alone, and the position and attitude of the target cannot be accurately measured by recording the change of the output signal of the position-sensitive probe.
Disclosure of Invention
The present disclosure has been made in view of the above-described conventional art, and an object thereof is to provide an attitude probe having a plurality of sensors capable of accurately performing spatial position and attitude measurements.
To this end, the present disclosure provides an attitude probe with multiple sensors for spatial position and attitude measurement, including a reference layer provided with a position-sensitive detector, a prism layer provided with a hollow pyramid prism, and an intermediate layer between the reference layer and the prism layer, the position-sensitive detector being disposed in a geometric center region of the reference layer, the position-sensitive detector including a photosurface, the photosurface of the position-sensitive probe being perpendicular to an axis of the hollow pyramid prism and configured to detect a moving distance of a light beam relative to the photosurface through the photosurface and output a voltage signal, the prism layer being provided with an indicating unit configured to indicate an attitude of the attitude probe, the indicating unit including a plurality of white indicating units and a plurality of black indicating units, the white indicating units and the black indicating units being configured not on the same plane, the intermediate layer including a small aperture plate provided with a first through hole through which the light beam reaches the photosurface when the attitude probe receives the light beam.
In the posture probe for performing spatial position and posture measurement according to the present disclosure, a position sensitive detector through which an incident angle and a position of an incident light beam are detected, and an indication unit through which a posture of the posture probe is indicated are provided. Thereby, the spatial position and posture of the posture probe can be automatically recognized and detected.
In addition, in the attitude probe for performing spatial position and attitude measurement according to the present disclosure, an inclination sensor configured to measure a change in position of the attitude probe in a gravitational direction is further provided at the prism layer. Thus, the change in the two-dimensional angle and the two-dimensional position of the attitude probe can be measured by the tilt sensor.
In addition, in the posture probe related to the present disclosure, the indication unit is configured to detect and locate it by a laser tracker imaging to obtain a posture of the posture probe. Thus, when the laser light entering the attitude probe is blocked, the position of the attitude probe can be indicated by the indicating unit.
In the attitude probe according to the present disclosure, the reference layer includes a mounting surface and a reference surface, and the position-sensitive detector is provided on the mounting surface so that the light-sensitive surface and the mounting surface are parallel to each other, and the mounting surface is parallel to the reference surface. Therefore, when the position sensitive detector receives the light rays which are vertically incident, the output voltage of the position sensitive detector is 0, and the angle position of the incident light beam can be accurately judged.
In addition, in the attitude probe according to the present disclosure, the hollow pyramid prism is formed by combining three plane mirrors in a two-to-two perpendicular manner, and the top of the hollow pyramid prism is located in the middle layer and the main body portion of the hollow pyramid prism is located in the prism layer. Therefore, when an incident light beam enters the hollow pyramid prism, the refraction of the incident light beam can be reduced by plane reflection of the incident light beam, and further the loss of light energy can be reduced.
In addition, in the attitude probe according to the present disclosure, a second through hole is provided at the top of the hollow pyramid prism so that a light beam passing through the hollow pyramid prism is incident on the position-sensitive detector through the second through hole and the first through hole, and the sizes of the second through hole and the first through hole are matched. Thus, light rays entering the hollow pyramid prism can enter the position-sensitive detector through the first through hole and then through the second through hole.
In the attitude probe for performing spatial position and attitude measurement according to the present disclosure, a conical three-dimensional space having the second through hole as a vertex is formed in the intermediate layer. Thereby, the light beam passing through the second through hole can be incident on the position sensitive detector.
In addition, in the attitude probe according to the present disclosure, the reference layer includes at least three supporting portions, and the parallelism of the light sensing surface and the reference surface is made smaller than a preset value by adjusting the heights of the supporting portions. Thus, the deviation of the parallelism to the measurement which improves the sensitivity of the position can be reduced, and the measurement accuracy can be further improved.
In addition, in the attitude probe according to the present disclosure, the tilt sensor is a two-dimensional gravity tilt sensor. Thereby, the position and angle of the attitude probe in the two-dimensional direction can be measured by the tilt sensor.
A second aspect of the present disclosure also provides a coordinate measurement system comprising a coordinate measurement device configured to transmit a light beam to the attitude probe and to receive a light beam reflected via the attitude probe, and the attitude probe as described in relation to the first aspect of the present disclosure. Thus, by receiving light rays emitted from the light source of the coordinate measuring device, the 6D pose of the pose probe can be measured.
Through the system and the method, the attitude probe fused in a multi-sensing mode can be provided for spatial position and attitude measurement, and measurement accuracy and operation convenience are improved.
Drawings
The present disclosure will now be explained in further detail by way of example only with reference to the accompanying drawings, in which:
fig. 1 is a perspective view showing a posture probe according to the present disclosure.
Fig. 2 is a cross-sectional view showing a symmetry plane of a posture probe according to the present disclosure.
Fig. 3 is a diagram showing a distribution diagram of an indicating unit of the attitude probe according to the present disclosure.
Fig. 4 is a schematic diagram showing a first embodiment of a posture probe according to the present disclosure.
Fig. 5 is an application scenario diagram showing a first embodiment of a gesture probe according to the present disclosure.
Fig. 6 is a flowchart showing pose measurement of the first embodiment of the pose probe according to the present disclosure.
Fig. 7 is a schematic diagram showing a second embodiment of a posture probe according to the present disclosure.
Fig. 8 is an application scenario diagram showing a second embodiment of a posture probe according to the present disclosure.
Fig. 9 is a flowchart showing pose measurement of a second embodiment of a pose probe according to the present disclosure.
Fig. 10 is a schematic diagram showing a third embodiment of a posture probe according to the present disclosure.
Detailed Description
Hereinafter, preferred embodiments of the present disclosure will be described in detail with reference to the accompanying drawings. In the following description, the same members are denoted by the same reference numerals, and overlapping description thereof is omitted. In addition, the drawings are schematic, and the ratio of the sizes of the components to each other, the shapes of the components, and the like may be different from actual ones.
It should be noted that the terms "comprises" and "comprising," and any variations thereof, in this disclosure, such as a process, method, system, article, or apparatus that comprises or has a list of steps or elements is not necessarily limited to those steps or elements expressly listed or inherent to such process, method, article, or apparatus, but may include or have other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
In addition, headings and the like referred to in the following description of the disclosure are not intended to limit the disclosure or scope thereof, but rather are merely indicative of reading. Such subtitles are not to be understood as being used for segmenting the content of the article, nor should the content under the subtitle be limited only to the scope of the subtitle.
The attitude probe according to the present disclosure will be described in detail with reference to the accompanying drawings. In addition, the application schematic diagram described by the examples of the present disclosure is for more clearly explaining the technical solution of the present disclosure, and does not constitute a limitation on the technical solution provided by the present disclosure.
A first aspect of the present disclosure relates to a gesture probe with multiple sensors for making spatial position and gesture measurements, which may be referred to simply as a "6D gesture probe" or a "gesture probe", a "coordinate measuring device" may also be referred to as a "laser tracker" or a "coordinate measuring instrument", and a Position Sensitive Detector (PSD) may also be referred to as a "position detector".
Fig. 1 is a perspective view showing a posture probe 1 according to the present disclosure.
In some examples, the structure of the gesture probe 1 is substantially symmetric left and right along the center.
Fig. 2 is a cross-sectional view showing a symmetry plane of the attitude probe 1 according to the present disclosure. In some examples, the gesture probe 1 may be circumferentially symmetric about a plane of symmetry.
As shown in fig. 2, in some examples, the gesture probe 1 may have a multi-layered structure. In the present embodiment, the attitude probe 1 may have a three-layer structure. In some examples, the three-layer structure of the gesture probe 1 may be a prism layer 10, a middle layer 20, and a reference layer 30. In some examples, the intermediate layer 20 is disposed between the prism layer 10 and the reference layer 30.
In some examples, a position sensitive detector 31 is provided at the reference layer 30. In this case, the position change of the incident light beam received by the position sensitive detector 31 can be perceived. In some examples, the position sensitive detector 31 may be a two-dimensional PSD. Thereby, the two-dimensional position of the incident light beam received by the attitude probe 1 can be measured. In some examples, the position sensitive detector 31 may also be disposed in a geometrically central region of the reference layer 30.
In some examples, the position sensitive detector 31 includes a photosurface (not shown). In this case, when the attitude probe 1 receives an incident light beam, the light beam can be incident on the photosurface on the position-sensitive detector 31. In some examples, the position sensitive detector 31 may sense the position of the received light spot incident on the photosurface, and thus output a different voltage or current signal. Thereby, the position change of the incident light beam can be detected by the photosensitive surface. In some examples, the photosurface may be perpendicular to the axis of the hollow cube-corner prism 11.
In some examples, a hollow corner cube 11 may also be provided in the prism layer 10. In this case, when the incident light beam enters the hollow pyramid prism 11, the refraction of the incident light beam can be reduced by plane reflection of the incident light beam and thus the loss of light energy can be reduced.
In some examples, a small aperture plate 21 may be provided in the intermediate layer 20. In some examples, the aperture plate 21 may be an aluminum plate. In some examples, the aperture plate 21 is provided with a first through hole (not shown). In this case, the incident light entering the attitude probe 1 can enter the intermediate layer 20 through the first through hole.
In some examples, aperture plate 21 opens into reference layer 30 having position sensitive detector 31.
In some examples, an indication unit 12 is also provided at the prism layer 10. In some examples, the indication unit 12 may indicate the pose of the pose probe 1 by its visual detection. In some examples, the number of indication units 12 may be multiple. In this case, when the laser beam entering the attitude probe is blocked, the target can be indicated and then the position of the target is determined based on the indication unit 12.
Fig. 3 is a diagram showing a distribution of the indication units of the attitude probe 1 according to the present disclosure.
As shown in fig. 3, in some examples, the indication units 12 may be asymmetrically distributed on the gesture probe 1. In this case, when the attitude probe 1 assumes an arbitrary angle, the other indication units 12 can be distinguished according to the distances of the phase differences among the respective indication units distributed on the attitude probe 1. This can improve the accuracy of the measurement position of the attitude probe 1.
As shown in fig. 3, in some examples, the indication unit 12 may include a white indication unit 120 and a black indication unit 121. In some examples, the number of the white indicating units 120 and the black indicating units 121 may be plural. In some examples, the distribution of the individual pointing units 12 over the gesture probe 1 may be as shown in fig. 3. However, examples of the present embodiment are not limited thereto, and in other examples, the indication unit 12 may also present other layouts on the gesture probe 1.
In some examples, the white indication unit 120 and the black indication unit 121 may not be on the same plane. In some examples, the white indication unit 120 may be located in a first plane and the black indication unit 121 may be located in a second plane. In some examples, the difference in height between the first plane and the second plane may be between 20 and 50 mm. Specifically, the height difference between the first plane and the second plane may be selected to be 20mm, 25 mm, 30 mm, 35 mm, 40 mm, 45 mm, or 50 mm. In this case, by comparing the measurement results of the indicating units in different planes, the measurement result with significantly larger error can be removed. Thereby, the method is used for the treatment of the heart disease. The gesture of the target can be accurately measured, so that an accurate measurement result can be obtained.
In some examples, the indication unit 12 may also be configured with a feature identification. In some examples, different colored indication units may be configured for different characteristic representations.
In some examples, a white indication unit 120 may be used to represent a primary feature. That is, the white indicating unit 120 may serve as a main feature indicating unit. In some examples, a black indication unit 121 may be used to represent the secondary feature. That is, the black indicating unit 121 may serve as a secondary characteristic indicating unit.
In some examples, the location of the indication unit representing the primary feature may be fixed. In some examples, the location of the indication unit representing the secondary feature may be varied. In some examples, the position of the white indication unit 120 may be fixed and the position of the black indication unit 121 may be variable. In this case, the white indicating unit 120 and the black indicating unit 121 are combined in different ways, and various layouts of the indicating units can be obtained. In addition, the required feature information can be extracted according to the layout of different feature indication units according to the corresponding situation.
However, examples of the present embodiment are not limited thereto, and in other examples, the main feature indication unit may be represented in black in the layout diagram, and the sub-feature indication unit may be represented in white in the layout diagram. In other examples, the primary feature visual and secondary indication elements may also be represented in other colors in the layout.
In some examples, the arrangement of the white indication unit 120 on the gesture probe 1 may substantially take on two straight lines. In some examples, two straight lines exhibit an intersecting state. In this case, when the pointing device of the attitude probe 1 is used for measurement, the white pointing device 120 can be distinguished from the pointing device 12 based on the signal that is transmitted from the pointing device and that forms a substantially continuous line.
In some examples, any three of the indication units including the white indication unit 120 and the black indication unit 121 are not collinear. Specifically, any one of the white indicating units 120 and any two of the black indicating units 121 are not on the same straight line, and any two of the white indicating units 120 and any one of the black indicating units 121 are not on the same straight line. In this case, when the attitude probe 1 is flipped, the line of sight of the detection of each of the indication units 12 is not blocked. At the same time, the differentiation of the individual display units 12 during the measurement can also be increased.
In some examples, the indication unit 12 may be a Light Emitting Diode (LED). Thereby, the position of the attitude probe 1 can be determined by the light emitting diode lighting.
In some examples, the infrared wavelength of the indication unit 12 is between 850 and 1550 nm.
In some examples, reference layer 30 has a mounting surface to which position sensitive detector 31 is disposed and a reference surface (not shown). In some examples, the photosurface and the mounting surface of the position sensitive detector 31 are parallel. In some examples, the mounting surface and the reference surface are parallel. In this case, the output voltage on the position sensitive detector 31 is 0 when the position sensitive detector 31 receives light of normal incidence. This makes it possible to determine the angle of incidence of the incident light beam from the output voltage value of the position-sensitive detector 31.
In some examples, the reference layer 30 may include at least three supports (not shown). In some examples, the parallelism of the light sensing surface and the reference surface is made smaller than a preset value by adjusting the height of the supporting portion. In some examples, the preset value may be no greater than 6 μm. Specifically, the preset value may be 6 μm, 5 μm, 4 μm or 3 μm.
In some examples, the hollow pyramid prism 11 may be formed of three planar mirrors vertically combined two by two. In this case, the direction of the outgoing light ray can be parallel to the direction of the incoming light ray after the incoming light beam is reflected in sequence by the three plane mirrors.
In some examples, the photosurface of the position sensitive detector 31 and the tangential plane of the hollow pyramid prism 11 are mounted in parallel. In some examples, the parallelism tolerance of the photosurface of the position sensitive detector 31 and the tangential surface of the hollow cube-corner 11 can be controlled by a managed installation. In some examples, parallelism tolerances are controlled to be between 5 and 10 μm by the managed mounting. In particular, the parallelism tolerance may be 5 μm, 6 μm, 7 μm, 8 μm, 9 μm or 10 μm.
In some examples, the vertex portion of the hollow corner cube 11 is located in the intermediate layer 20. In some examples, the body portion of the hollow cube-corner prism 11 is located in the prism layer 10. (see FIG. 2)
In some examples, the top of the hollow corner cube 11 may be provided with a second through hole (not shown).
In some examples, the light beam passing through the hollow corner cube 11 enters the position sensitive detector 31 through the second through hole and the first through hole. In some examples, the second via and the first via may be matched in size and location.
In some examples, the diameters of the second through hole and the first through hole may be no greater than 1 mm. In this case, the light beam passing through the second through hole does not generate a diffraction phenomenon of light, and the loss of light energy is small. Thereby, the accuracy of the measurement of the incident light beam by the position sensitive detector 31 can be improved.
In some examples, a conical volume having the second through hole as an apex may be formed within the intermediate layer 20. In this case, the incident light beam entering the intermediate layer 20 via the hollow pyramid prism 11 can be projected onto the position-sensitive detector 31 relatively smoothly. This can reduce the loss of the incident light beam.
In a second aspect of the present disclosure, a coordinate measurement system is also disclosed. In some examples, as shown in fig. 5, the coordinate measurement system may include a coordinate measurement device 2 and a gesture probe 1, wherein the gesture probe 1 is any of the gesture probes described above. In some examples, the coordinate measuring device 2 may emit a light beam to the gesture probe 1. In some examples, the coordinate measuring device 2 may also receive a light beam reflected via the gesture probe 1. In this case, by receiving the light emitted from the coordinate measuring device light source, the 6D pose of the pose probe 1 can be measured.
In some examples, the coordinate measuring device 2 further comprises a laser (not shown). In some examples, when the laser emits a laser beam, the laser beam passing through the tracking mirror enters the hollow cube-corner prism 11, and is mostly reflected back from the hollow cube-corner prism 11 in a direction parallel to the incident light, leaving a portion of the beam to enter the position sensitive detector 31 through the second aperture of the hollow cube-corner prism 11.
In some examples, a spatial pose measurement may be made for the pose probe 1 in combination with the pointing unit 12 and the position sensitive detector 31. In some examples, the coordinate measuring device 2 may include a pose camera 20. Thereby, the gesture probe 1 can be photographed by the gesture camera 20, and thus the motion trajectory of the gesture probe 1 can be obtained.
The present invention will be described in detail below using different embodiments of the attitude probe 1 according to the present disclosure, but the following examples and embodiments are provided only for the purpose of specifically explaining the present invention, and do not limit or restrict the scope of the invention disclosed in the present application.
In the first embodiment, the gesture probe 1 may include the indication unit 12 and the position sensitive detector 31, and thus, the indication unit 12 and the position sensitive detector 31 can be fused to perform measurement in cooperation with the coordinate measuring device 2 to obtain a measurement result.
Fig. 4 is a schematic diagram showing a first embodiment of the attitude probe 1 according to the present disclosure. Fig. 5 is a schematic view showing an application scenario of the first embodiment of the attitude probe 1 according to the present disclosure. Fig. 6 is a flowchart showing posture measurement of the first embodiment of the posture probe 1 according to the present disclosure.
In some examples, as shown in fig. 6, the flow of pose measurements of the first embodiment of the pose probe according to the present disclosure may include: establishing a coordinate system (step S100); defining origin coordinates of the position-sensitive detector 31 (step S200); defining a conversion relation between coordinate systems (step S300); measuring the coordinates of the beam hitting the position sensitive detector 31 (step S400); solving the attitude angle by combining the monocular vision method with the tilt sensor 13 (step S500); obtaining a posture conversion matrix (step S600); the position of the attitude probe 1 is calculated (step S700).
In some examples, in step S100, different coordinate systems may be established at the pose camera 20, the coordinate measuring device 2, and the pose probe 1, respectively. Specifically, a first coordinate system is established with the optical center of the attitude camera as an origin O, the planes being orthogonal to each other with respect to the horizontal plane as the X-axis and the Y-axis, and the vertical direction as the Z-axis, and a second coordinate system is established with the geometric center of the coordinate measuring device as the origin O, the planes being orthogonal to each other with respect to the horizontal plane as the X-axis and the Y-axis, and the gravitational direction as the Z-axis. In addition, a third coordinate system is established with the vertex of the hollow pyramid prism 11 as the origin O1, the plane in which the aperture plate 21 is located as a plane in which the X1 axis and the Y1 axis are perpendicular to each other, and the direction perpendicular to the plane in which the aperture plate 21 is located as the Z1 axis. The geometric center of the position sensitive detector 31 is taken as an origin O2, and a plane in which the position sensitive detector 31 is located is taken as a plane in which an X2 axis and a Y2 axis are perpendicular to each other to establish a two-dimensional coordinate system.
In some examples, the first coordinate system is the coordinate system of the pose camera 20 and the second coordinate system is the coordinate system of the coordinate measuring device 2. In some examples, the third coordinate system is the coordinate system of the gestural probe 1.
In some examples, in step S200, spatial coordinates of the origin of the position sensitive detector 31 in the third coordinate system are defined. Wherein the spatial coordinates of the origin are (0, h).
In some examples, in step S300, the light beam incident on the hollow pyramid prism 11 is set as one unit vector, and the light beam can have different spatial positions when the light beam is located in different coordinate systems through conversion of the coordinate systems. The light beam in the third coordinate system is converted to the first coordinate system, and a matrix relation of coordinate conversion of the third coordinate system and the first coordinate system can be obtained. Similarly, the light beam in the first coordinate system is converted to the second coordinate system, and a matrix relation of coordinate conversion between the first coordinate system and the second coordinate system can be obtained. The coordinate conversion between the first coordinate system and the second coordinate system can be obtained through calibration.
In some examples, in step S400, coordinates when the incident light beam hits the position sensitive detector are measured and recorded by the position sensitive detector 31, wherein the coordinates measured by the position sensitive detector 31 are coordinates in a two-dimensional coordinate system. The coordinates measured by the position sensitive detector 31 are then used to obtain the position coordinates of the beam vector in the third coordinate system.
In some examples, in step S500, the attitude angle of the attitude probe 1 is solved by monocular vision, the attitude angle including an azimuth angle, a pitch angle, and a roll angle. In some examples, the azimuth angle may represent a rotation angle of the gesture probe 1 about a first rotation axis (not shown) of the coordinate measurement device 2. In some examples, the pitch angle may represent the angle of rotation of the attitude probe 1 about an axis along the direction of gravity of the coordinate measuring device 2. In some examples, the roll angle may represent an angle of rotation of the gesture probe 1 about a third rotational axis (not shown) of the coordinate measurement device 2.
In some examples, in step S600, the posture conversion relationship between the second coordinate system and the third coordinate system is obtained by the posture angle operation. That is, a posture conversion matrix is obtained which is transformed from the second coordinate system to the third coordinate system.
In some examples, in step S700, the position of the attitude probe 1 can be obtained by matrix-conversion calculation by using the vertices of the known hollow pyramid prism 11 measured in the third coordinate system through the attitude conversion matrix between the third coordinate system and the second coordinate system.
Fig. 7 is a schematic diagram showing a second embodiment of the attitude probe 1 according to the present disclosure. Fig. 8 is a schematic view showing an application scenario of the second embodiment of the attitude probe 1 according to the present disclosure. Fig. 9 is a flowchart showing posture measurement of the second embodiment of the posture probe 1 according to the present disclosure.
In the second embodiment, the attitude probe 1 may include a position sensitive detector 31 and a tilt sensor 13 (see fig. 7). In some examples, the first and second sensors are configured to detect a signal. The gesture probe 1 may not include the indication unit 12. Thereby, the position sensitive detector 31 and the inclination sensor 13 can be fused together to perform measurement in cooperation with the coordinate measuring device 2.
In some examples, as shown in fig. 7, a tilt sensor 13 may be provided at the prism layer 10.
In some examples, the tilt sensor 13 may be a gravity tilt sensor. In some examples, the angle measurement range of the tilt sensor 13 may be a two-dimensional tilt sensor. In some examples, the tilt sensor 13 may be configured to measure angular changes of the attitude probe 1 in the vertical direction. In some examples, the prism layer 10 may also be provided with an indication unit 12. In some examples, the indication unit 12 may be used to detect the pose of the pose probe 1. In this case, if the inclination sensor 13 and the indication unit 12 are engaged with each other, a more accurate measurement result can be obtained.
As shown in fig. 8, in some examples, when the coordinate measuring device 2 has no imaging unit. When the coordinate measuring device 2 is used to photograph the target, the hollow pyramid prism 11 of the attitude probe 1, the position sensitive detector 31, and the tilt sensor 13 cooperate with each other to enable 6D measurement of the target. Specifically, the spatial position and attitude measurement can be performed by the coordinate measuring device 2 of the attitude-free camera 20 transmitting a light beam to the attitude probe 1 and receiving the light beam reflected by the attitude probe 1 for corresponding calculation. In this case, the common measurement can be performed by the attitude probe 1 in cooperation with the coordinate measuring devices 1 having different configurations. This can improve the engagement of the posture probe 1 and the convenience of operation.
In some examples, the gesture probe 1 may not have the indication unit 12. That is, the attitude probe 1 includes a hollow pyramid prism 11, a position sensitive detector 31, and a tilt sensor 13. In other words, the attitude probe 1 performs measurement and calculates its spatial coordinates and attitude by the position-sensitive detector 31 and the tilt sensor 13.
In some examples, as shown in fig. 8, the gesture probe 1 may not have the indication unit 12, and the coordinate measuring device 3 may not have the gesture camera 20. When the attitude probe 1 does not have the indicating unit 12, a light beam is emitted to the hollow pyramid prism 11 of the attitude probe 1 using the coordinate measuring apparatus 2, and the attitude probe 1 is measured.
Hereinafter, a flow of attitude measurement using the second embodiment of the attitude probe 1 according to the present disclosure will be described in detail with reference to fig. 9.
In some examples, as shown in fig. 9, the flow of the pose measurement of the second embodiment of the pose probe 1 according to the present disclosure may include: leveling the coordinate measuring device 2 (step S210); establishing a coordinate system (step S220); defining origin coordinates of the position-sensitive detector 31 (step S230); defining a conversion relation between coordinate systems (step S240); solving the attitude angle by a monocular vision method (step S250); obtaining a posture conversion matrix (step S260); the position of the attitude probe 1 is calculated (step S270).
In some examples, in step S210, the coordinate measuring device 2 may be leveled by a gravity level instrument.
In some examples, in step S210, different coordinate systems are established at the coordinate measuring device 2, and the gesture probe 1. Specifically, a second coordinate system is established with the center of the coordinate measuring device as the origin O, with the horizontal plane as the X-axis and the Y-axis being perpendicular to each other, and with the vertical direction as the Z-axis. In some examples, the second coordinate system is the coordinate system of the coordinate measuring device 2. The vertex of the hollow pyramid prism 11 is taken as an origin O1, a plane in which the small hole plate 21 is located is taken as a plane in which an X1 axis and a Y1 axis are mutually perpendicular, a third coordinate system is established by taking a direction perpendicular to the plane in which the small hole plate 21 is located as a Z1 axis, a geometric center of the position sensitive detector 31 is taken as an origin O2, and a two-dimensional coordinate system is established by taking the plane in which the position sensitive detector 31 is located as a plane in which the X2 axis and the Y2 axis are mutually perpendicular.
In some examples, in step S220, spatial coordinates of the origin of the position sensitive detector 31 in the third coordinate system are defined.
In some examples, in step S230, the light beam incident on the hollow pyramid prism 11 is set as one unit vector, and the light beam can have different spatial positions when the light beam is located in different coordinate systems through conversion of the coordinate systems. The light beam in the third coordinate system is converted into the second coordinate system, and a matrix relation of coordinate transformation of the third coordinate system and the second coordinate system can be obtained.
In some examples, in step S240, the attitude angle of the attitude probe 1 is solved by monocular vision, the attitude angle including an azimuth angle, a pitch angle, and a roll angle.
In some examples, in step S250, a pose transformation matrix transformed from the third coordinate system to the second coordinate system is obtained by a pose angle operation.
In some examples, in step S260, the pose of the pose probe 1 is obtained by a pose conversion matrix of the third coordinate system and the second coordinate system.
Fig. 10 is a schematic diagram showing a third embodiment of the attitude probe 1 according to the present disclosure.
In a third embodiment, the gesture probe 1 may comprise an indication unit 12, a position sensitive detector, and a tilt sensor 13. In this case, the indicating unit 12, the position-sensitive detector, and the inclination sensor 13 can be integrated together with the coordinate measuring machine 2 for measurement, and thus the measurement result can be obtained. The corresponding gesture measurement manners in the first embodiment and the second embodiment are described correspondingly, and the related contents of the first embodiment and the second embodiment are combined, so that the description about the contents of the third embodiment is omitted here.
In some examples, the gesture probe 1 may have a work switch (not shown).
In some examples, the gesture probe 1 may also be provided with an operating status indicator light (not shown). When the operation state indicator lamp is displayed in green, it indicates that the attitude probe 1 is in a normal operation state. When the operation state indicator lamp is displayed in another color, for example, red, it indicates that the attitude probe 1 is in an abnormally operated state.
In some examples, the gesture probe 1 may also be provided with a feedback indicator light (not shown).
In some examples, feedback indicator lights may be used to discern whether the working distance of the gesture probe is outside of a normal working range. In this case, when the working distance range measured by the attitude probe 1 is not within the normal area, the attitude probe 1 can be continuously adjusted by observing the feedback indicator lamp until the feedback indicator lamp is normally displayed.
In some examples, the gesture probe 1 may also be provided with a power indicator lamp (not shown).
In some examples, the charge indicator lights may be displayed in different colors to correspond to different charge usage conditions. In some examples, green may be used to indicate that the power of the gesture probe 1 is sufficient, orange may be used to indicate that the power of the gesture probe 1 needs to be replenished in time, and red may be used to indicate that the power of the gesture probe is severely insufficient and that it cannot operate normally. The example of the present embodiment is not limited thereto,
in some examples, the gesture probe 1 may be a handheld probe (not shown). In some examples, the gesture probe 1 may be in a battery powered mode. Therefore, when the electric quantity of the gesture probe 1 is insufficient, the battery can be replaced in time so that the gesture probe 1 can continue to work.
According to the multi-sensing-mode fusion attitude probe, the accuracy of measurement and the convenience of operation can be improved.
While the disclosure has been described in detail in connection with the drawings and examples, it is to be understood that the foregoing description is not intended to limit the disclosure in any way. Modifications and variations of the present disclosure may be made as desired by those skilled in the art without departing from the true spirit and scope of the disclosure, and such modifications and variations fall within the scope of the disclosure.
Claims (9)
1. A multi-sensor attitude probe for spatial position and attitude measurement, characterized in that,
the position sensitive detector comprises a light sensitive surface, the light sensitive surface is perpendicular to the axis of the hollow pyramid prism and is configured to detect the moving distance of a light beam relative to the light sensitive surface and output a voltage signal, the prism layer is provided with an indicating unit configured to indicate the posture of the posture probe, the indicating unit comprises a plurality of white indicating units which are fixed in position and serve as main characteristic indicating units and a plurality of black indicating units which are variable in position and serve as secondary characteristic indicating units, the white indicating units are located on a first plane, the black indicating units are located on a second plane different from the first plane, the difference of the heights of the first plane and the second plane is 20mm to 50mm, any three indicating units including the white indicating units and the black indicating units are arranged on the light sensitive surface and are configured to be different from each other in a straight line, and the three indicating units are arranged on the same inclined plane, and the inclined plane is further provided with the light beam sensor, and the three indicating units are arranged on the inclined plane and the same inclined plane, and the inclined plane is further provided with the through hole sensor.
2. The attitude probe according to claim 1, wherein,
the indication unit is configured to detect and position the indication unit through a laser tracker image so as to obtain the gesture of the gesture probe.
3. The attitude probe according to claim 1, wherein,
the reference layer is provided with a mounting surface and a reference surface, the position sensitive detector is arranged on the mounting surface in a mode that the light sensitive surface is parallel to the mounting surface, and the mounting surface is parallel to the reference surface.
4. The attitude probe according to claim 1, wherein,
the hollow pyramid prism is formed by combining three plane reflectors in a pairwise vertical mode, the top of the hollow pyramid prism is located on the middle layer, and the main body of the hollow pyramid prism is located on the prism layer.
5. The attitude probe according to claim 4, wherein,
the top of the hollow pyramid prism is provided with a second through hole so that light beams passing through the hollow pyramid prism can be injected into the position sensitive detector through the second through hole and the first through hole, and the sizes of the second through hole and the first through hole are matched.
6. The attitude probe according to claim 5, wherein,
a conical three-dimensional space with the second through hole as an apex is formed in the intermediate layer.
7. The attitude probe according to claim 3, wherein,
the reference layer comprises at least three supporting parts, and the heights of the supporting parts are adjusted to enable the parallelism between the light sensitive surface and the reference surface to be smaller than a preset value.
8. The attitude probe according to claim 1, wherein,
the inclination sensor is a two-dimensional gravity inclination sensor.
9. A coordinate measuring system, characterized in that,
a position probe comprising a coordinate measurement device and the position probe of claims 1 to 8, the coordinate measurement device being configured to transmit a light beam to the position probe and to receive a light beam reflected via the position probe.
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