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CN114114731B - Test control method, device, equipment and medium of display panel - Google Patents

Test control method, device, equipment and medium of display panel Download PDF

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Publication number
CN114114731B
CN114114731B CN202111439227.2A CN202111439227A CN114114731B CN 114114731 B CN114114731 B CN 114114731B CN 202111439227 A CN202111439227 A CN 202111439227A CN 114114731 B CN114114731 B CN 114114731B
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test
station
starting
idle
display panel
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CN114114731A (en
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徐超
黄光明
黄正阳
毛齐宁
张维
汤国平
李宗峰
王昊
冉钢
王志杰
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BOE Technology Group Co Ltd
Chongqing BOE Optoelectronics Technology Co Ltd
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BOE Technology Group Co Ltd
Chongqing BOE Optoelectronics Technology Co Ltd
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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
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    • G06Q10/063—Operations research, analysis or management
    • G06Q10/0631—Resource planning, allocation, distributing or scheduling for enterprises or organisations
    • G06Q10/06316—Sequencing of tasks or work
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
    • G06Q50/00—Information and communication technology [ICT] specially adapted for implementation of business processes of specific business sectors, e.g. utilities or tourism
    • G06Q50/04—Manufacturing
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/30—Computing systems specially adapted for manufacturing

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  • Manufacturing & Machinery (AREA)
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  • General Health & Medical Sciences (AREA)
  • Primary Health Care (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Liquid Crystal (AREA)

Abstract

The application relates to a test control method, a device, equipment and a medium of a display panel, wherein the test control method comprises the following steps: when the display panel to be tested is monitored, determining an idle test starting station in the test equipment; selecting a target test starting station from the idle test starting stations; transmitting the display panel to a target test starting station for test starting; selecting a target test station from idle test stations of the test equipment based on the test trigger signal; transmitting the display panel to a target test station for test processing; based on the test discharge signal, the display panel is transmitted to the discharge station for output according to the discharge priority of the target test station. According to the application, the logistics mode of the testing equipment is improved, so that the material channel of the testing equipment is converted into the fusion channel, the production beat of the testing equipment is accelerated on the premise of unchanged volume of the testing equipment, and the production capacity is improved.

Description

Test control method, device, equipment and medium of display panel
Technical Field
The embodiment of the application relates to the technical field of display, in particular to a test control method, a device, equipment and a medium of a display panel.
Background
In the field of liquid crystal display production, a liquid crystal display (Liquid Crystal Display, LCD) panel can be finally packaged and delivered through manual inspection and automatic picture test under an Aging (Aging) room, so that the stability and reliability of delivered products are ensured.
Specifically, before entering the aging chamber, the process actions of two stations, namely, the downloading of a matched Test file and the initial inspection of a picture, are required to be performed through Test equipment, and the Test equipment can flow into the aging chamber after successful detection; the test starting station is used for scanning a Panel unique code (Identity document, ID) through a bar code scanner BCR so as to match and download a test file for the Panel according to the ID, and meanwhile, a Panel station is made; the testing station is used for automatically testing basic pictures of the Panel (Panel) before entering the aging chamber for aging, so that the Panel enters the aging chamber for further high-low temperature testing when the display screen of the Panel is qualified. The existing test equipment mainly adopts a logistics mode of 'test starting station → Input (IN) station → discharge (OUT) station → test station → discharge (OUT) station', and has the advantages that a logistics path of the logistics mode plays a role of Buffer; when the back-end aging equipment is unstable intermittently, the logistics path accommodates more liquid crystal display panels after being fused. However, with the stability of the aging equipment, the beat of the testing equipment is too slow, which becomes a bottleneck for restricting production for a long time, and affects the production efficiency of the liquid crystal display panel.
Disclosure of Invention
In view of the above, in order to solve the above technical problems or some of the technical problems, embodiments of the present application provide a method, an apparatus, a device, and a medium for controlling testing of a display panel.
In a first aspect, an embodiment of the present application provides a test control method for a display panel, including: when the display panel to be tested is monitored, determining an idle test starting station in the test equipment; selecting a target test starting station from the idle test starting stations; transmitting the display panel to the target test starting station for test starting; selecting a target test station from idle test stations of the test equipment based on a test trigger signal, wherein the test trigger signal is a signal generated by the target test starting station after the test starting is completed; transmitting the display panel to the target test station for test processing; and transmitting the display panel to a discharge station for output according to the discharge priority of the target test station based on a test discharge signal, wherein the test discharge signal is a signal generated by the target test station after the test processing is completed.
In one possible embodiment, the determining an idle test start station in the test equipment includes:
acquiring state marking information of each test starting station in a material channel of the test equipment;
and determining the test starting station with the state mark information being idle mark information as the idle test starting station.
In one possible embodiment, the selecting a target test start station from the idle test start stations includes:
if the number of the idle test starting stations is one, determining the idle test starting stations as target test starting stations;
and if the number of the idle test starting stations is greater than one, selecting a target test starting station with the highest priority from the idle test starting stations based on the starting priority sequence corresponding to each test starting station.
In a possible implementation manner, the selecting, based on the test trigger signal, a target test station from idle test stations of the test apparatus includes:
when the in-place sensor signal of the target test starting station is detected, the in-place sensor signal is used as the test trigger signal;
Aiming at the test trigger signal, determining an idle test station in the test equipment according to the working state marking information of each test station in a material channel of the test equipment;
if the number of the idle test stations is one, determining the idle test stations as the target test stations;
and if the number of the idle test stations is greater than one, selecting a target test station with the highest priority from the idle test stations according to the test priority sequence corresponding to each test station.
In one possible implementation manner, determining an idle test station in the test equipment according to the working state marking information of each test station in the material channel of the test equipment includes:
acquiring working state marking information of each test station in the material channel;
and determining the test station with the working state marking information being the idle state marking information as the idle test station.
In one possible implementation manner, the transmitting the display panel to the discharge station for output according to the discharge priority of the target test station based on the test discharge signal includes:
when the in-place sensor signal of the target test station is detected, determining the in-place sensor signal of the target test station as the test discharge signal;
For the test discharge signal, determining whether the discharge priority of the target test station is higher than the discharge priority of a station to be discharged corresponding to the discharge station, wherein the station to be discharged is a test station for completing panel test processing;
and if the discharge priority of the target test station is higher than that of the station to be discharged, transmitting the display panel to the discharge station, and outputting the display panel through the discharge station.
In a second aspect, an embodiment of the present application provides a test control device for a display panel, including:
the idle test starting station determining module is used for determining an idle test starting station in the test equipment when the display panel to be tested is monitored;
the target test starting station selection module is used for selecting a target test starting station from the idle test starting stations;
the test starting transmission module is used for transmitting the display panel to the target test starting station for test starting;
the target test station selection module is used for selecting a target test station from idle test stations of the test equipment based on a test trigger signal, wherein the test trigger signal is a signal generated by the target test starting station after the test starting is completed;
The test processing transmission module is used for transmitting the display panel to the target test station for test processing;
the output module is used for transmitting the display panel to the discharge station for output according to the discharge priority of the target test station based on a test discharge signal, wherein the test discharge signal is generated by the target test station after the test processing is completed.
In a third aspect, an embodiment of the present application provides a test apparatus, including: a processor, and a memory for storing executable instructions of the processor; wherein the processor is configured to perform the test control method of the display panel according to any one of the first aspect.
In one possible implementation mode, the material channel of the test equipment comprises at least two test starting stations and at least four test stations, a transmission crawler is arranged between the test starting stations and the test stations, and a movable blocking mechanism is arranged in the material channel and used for controlling the position of the display panel on the transmission crawler.
In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the test control method for a display panel according to any one of the first aspects.
According to the test control method, the device, the equipment and the medium for the display panel, when the display panel to be tested is monitored, the idle test starting station in the test equipment is determined, then the target test starting station is selected from the idle test starting stations to transmit the display panel to be tested to the target test starting station for test starting, then the target test station is selected from the idle test stations of the test equipment based on the test triggering signal generated by the target test starting station after the test starting is finished, the display panel is transmitted to the target test station for test processing, and the display panel is transmitted to the discharge station for output based on the test discharge signal generated by the test processing, so that the logistics mode of the test equipment is improved, the material channel of the test equipment is converted into a fusion channel, a plurality of functions of fusing, test, buffer and the logistics channel are realized, and the production beat of the test equipment can be accelerated on the premise that the volume of the test equipment is unchanged, and the production capacity is improved.
Drawings
FIG. 1 is a schematic diagram of a conventional logistics model of a prior art test apparatus;
Fig. 2 is a flowchart of steps of a method for controlling testing of a display panel according to an embodiment of the present application;
FIG. 3 is a flowchart illustrating a method for controlling testing of a display panel according to an alternative embodiment of the present application;
FIG. 4 is a schematic diagram of a novel logistics model of a test apparatus in one example of the present application;
FIG. 5 is a schematic illustration of tray entry and exit in a test apparatus according to one example of the application;
FIG. 6 is a schematic illustration of a flow path of a test apparatus provided with a blocking mechanism in one example of the application;
FIG. 7 is a schematic illustration of a test apparatus in one example of the application having a flow path provided with a blocking mechanism and a sensor;
FIG. 8 is a schematic diagram of a test apparatus in one example of the application;
FIG. 9 is a Gantt chart of a test start performed by a test start station of a test apparatus in one example of the present application;
fig. 10 is a block diagram of a test control device for a display panel according to an embodiment of the present application.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the embodiments of the present application more apparent, the technical solutions of the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application, and it is apparent that the described embodiments are some embodiments of the present application, but not all embodiments of the present application. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to be within the scope of the application.
With the stability of the display panel burn-in equipment, the test equipment becomes an equipment bottleneck of the display panel burn-in process section. Specifically, taking a thin film transistor liquid crystal display (Thin film transistor liquid crystal display, TFT-LCD) as an example, in the aging test process of the TFT-LCD module process, after the production of the liquid crystal display panel is completed, the liquid crystal display panel is placed on a Pallet (Pallet), and the detection link of the automatic picture test in the aging chamber is completed by an automatic transmission mode; the tray is used as a base for operating the liquid crystal display panel, a picture generator (Pattern Generator, PG) box and a test line are arranged on the tray, picture test can be carried out, and the liquid crystal display panel can be conveyed through a conveying crawler CV so that the liquid crystal display panel on the tray can pass through an aging chamber in an automatic logistics mode. Specifically, before entering an aging room for testing, the liquid crystal display panel passes through a testing device, and the testing device finishes the test file downloading and site logging of the model product, namely a test starting link mainly through scanning codes of the ID of the liquid crystal display panel and the ID of a tray; meanwhile, the tray after the start of the Test flows into the Test station, so that a picture preliminary Test function, namely a Test link, is performed on the liquid crystal display panel on the tray through the Test station, and the purpose of the Test is to intercept abnormal trays such as loose manual wire insertion, damaged connecting wires and the like, and finally, the display panel on the intact tray flows into an Aging (Aging Room) chamber. The existing Test equipment adopts a logistics mode of 'Fuing station-IN station-OUT station-Test station-OUT station', as shown IN figure 1, the logistics mode has a production mode of 1 Fuing station and 2 Test stations, namely '1 drags 2'; in actual operation, the average Time generally consumed by the fuing station is 11 seconds (Second, s), the average Time generally consumed by the Test station is 29s, the logistics Time is added, and the general Takt Time (TT) of the Test equipment is about 16s and flows out of a liquid crystal display panel; the front section input Line (Line In) station adopts a manual mode, and the input TT can be lower than 14s; TT for the post reject sort station input Aging (Lift In Aging) is also around 14 s. Therefore, the Test equipment is too slow to beat and becomes a bottleneck for long-term production restriction, and a more efficient Test equipment needs to be generated. It should be noted that the Line In station is used as a manual job post, and the liquid crystal display panel can be placed on the tray returned by reflow, the signal Line is connected to the liquid crystal display panel, and meanwhile, the liquid crystal display panel label is attached to the tray, so that the display panel ID can be determined by scanning the label later.
One of the core ideas of the embodiment of the application is that a testing control method of a display panel is provided, and a material channel of a testing device is converted into a fusion channel, so that the material channel of the testing device has a plurality of functions of fusing, test, buffer and a logistics channel, a logistics mode of 'fusion channel-discharge station' is adopted, the production beat of the testing device is accelerated, and the production efficiency is improved.
For the purpose of facilitating an understanding of the embodiments of the present application, reference will now be made to the following description of specific embodiments, taken in conjunction with the accompanying drawings, which are not intended to limit the embodiments of the application.
Referring to fig. 2, a step flowchart of a test control method of a display panel according to an embodiment of the present application is shown. In a specific implementation, the method for testing and controlling the display panel provided by the embodiment of the application specifically includes the following steps:
step 210, determining an idle test starting station in the test equipment when the display panel to be tested is monitored.
In application implementation, the test device may be used for testing a display panel, for example, may be a device for lighting a liquid crystal display panel, where a material channel of the test device may include a test start station, a test station, and the like, and the stations of the material channel may be driven by a conveyor belt CV, which is not particularly limited in the embodiment of the present application.
In the production test process of the display panel, the display panel to be tested can be used as the display panel to be tested currently, so that when the display panel to be tested is monitored, the idle test starting station in the test equipment is determined according to the state of each test starting station in the material channel of the test equipment. The idle start test station may refer to a test start station in an idle state, for example, when a certain fuing station in the test apparatus is in an idle state, the fuing station may be determined as an idle test start station.
In actual processing, the embodiment of the application can preset corresponding state marking information for each test starting station in the material channel of the test equipment so as to mark the state of the test starting station through the state marking information. Optionally, the status flag information of the test start station may be divided into idle flag information and test flag information; the idle mark information can be used for marking that the test starting station is in an idle state, for example, after a certain fuing station is tested, the state mark information of the fuing station can be set as idle mark information so as to mark the fuing station as the idle test starting station; the test marking information can be used for marking that the test starting station is in a test working state, for example, in the test process of a certain fuing station, the state marking information of the fuing station can be set as test marking information so as to mark that the fuing station is in the test working state. Further, determining an idle test start station in the test equipment according to the embodiment of the application specifically may include: acquiring state marking information of each test starting station in a material channel of the test equipment; and determining the test starting station with the state mark information being idle mark information as the idle test starting station.
Step 220, selecting a target test starting station from the idle test starting stations.
In particular implementations, the test equipment may have one or more idle test initiation stations. After determining the idle test starting station in the test equipment, the embodiment of the application can select the idle test starting station with the highest priority from the idle test starting stations according to the priority sequence of the preset test starting stations as the target test starting station so as to test and start the current display panel to be tested through the target test starting station.
Further, the selecting a target test starting station from the idle test starting stations according to the embodiment of the present application may specifically include: if the number of the idle test starting stations is one, determining the idle test starting stations as target test starting stations; and if the number of the idle test starting stations is greater than one, selecting a target test starting station with the highest priority from the idle test starting stations based on the starting priority sequence corresponding to each test starting station. Specifically, after determining the idle test starting stations in the test equipment, the embodiment can count the number of the idle test starting stations so as to select a target test starting station from the idle test starting stations according to the number of the idle test starting stations. Specifically, when the number of idle test starting stations is one, that is, when the test equipment has one idle test starting station, the idle test starting station can be directly determined as a target test starting station; when the number of idle test starting stations is greater than one, that is, when the test equipment has two or more idle test starting stations, the test starting station with the highest priority level can be selected from the idle test starting stations according to the starting priority order corresponding to each test starting station, so as to be used as the target test starting station. The starting priority order may be preset for a priority order set for each test starting station in the test equipment, for example, in a case that two test starting stations are set in a material channel of the test equipment, the priority order of the two test starting stations may be set as a priority order for entering the test starting station: fuing 01→Fuing 02, where Fuing 01 may refer to the first of the two test start stations, fuing 02 may refer to the second of the two test start stations, and the first test start station Fuing 01 has a higher priority than the second test start station Fuing 02. For example, in the case where the first test start station fusion 01 and the second test start station fusion 02 are both in the idle state, the first test start station fusion 01 with a relatively high priority may be preferentially selected as the target test start station, so that the display panel to be detected is subsequently tested and started by using the first test start station fusion 01, that is, step 230 is executed.
And 230, transmitting the display panel to the target test starting station for test starting.
Specifically, after the target test starting station is determined, the display panel to be tested can be transmitted to the target test starting station through the conveying crawler, so that the display panel can be tested and started through the target test starting station, for example, a bar code scanner on the target test starting station scans the ID of the display panel to match and download test files for the panel according to the ID, and meanwhile, the display panel can be used as an upper panel station through the target test starting station to complete the test starting of the display panel.
Step 240, selecting a target test station from idle test stations of the test equipment based on the test trigger signal.
The test trigger signal is a signal generated by the target test starting station after the test starting is completed. Specifically, the target test starting station may generate a corresponding signal after the test starting of the display panel is completed, so as to serve as a test trigger signal in the embodiment of the present application. The embodiment of the application can determine whether the target test station completes the test starting of the display panel by monitoring the test trigger signal, so that the target test station can be determined to complete the test starting of the display panel when the test trigger signal is monitored, and any one idle test station can be selected from idle test stations of the test equipment for the test trigger signal to serve as the target test station, so that the display panel can be tested through the target test station later.
In actual processing, the material path of the test equipment may have one or more idle test stations. Therefore, in an alternative embodiment of the present application, after determining the idle test start station in the test apparatus, the idle test station with the highest priority may be selected from the idle test stations according to the preset priority order of the test stations, and be used as the target test station. Specifically, after determining the idle test stations in the test equipment, the embodiment can count the number of the idle test stations, so as to select the idle test station with the highest priority from the idle test start stations according to the preset priority sequence of the test stations according to the number of the idle test stations, and use the idle test station as the target test station. Further, the selecting a target test station from idle test stations of the test equipment according to the embodiment of the application specifically may include: when the number of idle test stations in the test equipment is one, namely when the test equipment has an idle test starting station, the idle test station can be determined as a target test station; and when the number of the idle test stations is greater than one, namely, when the test equipment has two or more idle test stations, the test station with the highest priority level can be selected from the idle test stations according to the corresponding test priority order of the test stations, so as to be used as a target test starting station. The test priority order may be preset for a priority order set for each test station in the test device, for example, in a case that four test stations are set in a material channel of the test device, the priority order of the four test stations may be set as a priority order for entering the test station: test 01- > test 02- > test 03- > test04, test01 may refer to a first one of the four test stations, test02 may refer to a second one of the four test stations, test03 may refer to a third one of the four test stations, test04 may refer to a fourth one of the four test stations, and the first test station test01 has a higher priority than the second test station test02, the second test station test02 has a higher priority than the third test station test03, and the third test station test03 has a higher priority than the fourth test station test 04. For example, in the case where the first test station test01, the second test station test02, the third test station test03, and the fourth test station test03 are in the idle state, the first test station test01 having a higher priority may be preferentially selected as the target test station; for another example, in the case where the first test station test01 is in the test state and the second test station test02, the third test station test03, and the fourth test station test03 are in the idle state, the second test station test02 with a higher priority may be selected from the test stations in the idle state as the target test station.
And step 250, transmitting the display panel to the target test station for test processing.
Specifically, after the target test station is determined, the display panel after the start of the test can be transmitted to the target test station through the conveyor belt, so that the display panel can be tested through the target test station, for example, the display panel can be automatically tested through the target test station to perform panel basic picture test, for example, lighting test of the display panel is performed, and a corresponding signal can be generated after the test is completed to serve as a test discharge signal corresponding to the display panel. The test eject signal may be used to indicate that the target test station has completed testing of the display panel, which may need to be transferred to an eject station of the test apparatus to output the tested display panel through the eject station.
And 260, based on the test discharge signal, transmitting the display panel to a discharge station for output according to the discharge priority of the target test station.
The test discharge signal is a signal generated by the target test station after the test processing is completed. Specifically, after the test discharge signal is generated by the target test station, the embodiment of the application can determine that the target test station completes the test of the display panel, and can acquire the discharge priority of the target test station according to the test discharge signal, so that the display panel which completes the test in the target test station is transmitted to the discharge station when the discharge station is idle according to the discharge priority of the target test station, and the display panel which completes the test can be output through the discharge station, so that the display panel which completes the test can enter an aging chamber for aging, and the stability and reliability of the display panel are improved.
In summary, the embodiment of the application determines the idle test starting station in the test equipment when the display panel to be tested is monitored, then selects the target test starting station from the idle test starting stations to transmit the display panel to be tested to the target test starting station for test starting, then selects the target test station from the idle test stations of the test equipment based on the test triggering signal generated by the target test starting station after the test starting is completed, so as to transmit the display panel to the target test station for test processing, and transmits the display panel to the discharge station for output based on the test discharge signal generated after the test processing is completed, thereby improving the logistics mode of the test equipment, converting the material channel of the test equipment into a fusion channel, having multiple functions of test starting, test, buffer storage and logistics channel, further accelerating the production beat of the test equipment and improving the production capacity on the premise of unchanged volume of the test equipment.
In the actual process, in order to realize the switching operation of the fusion channel, a Sensor (Sensor) may be provided at each station of the test apparatus to determine whether the display panel enters the station and/or whether the display panel needs to leave the station by acquiring a Sensor signal of the station. For example, an entry sensor and an in-place sensor may be configured for each station; the entering sensor can be used for detecting whether the tray of the display panel enters the station or not, so that whether the display panel on the tray enters the station or not can be determined by monitoring the signal of the entering sensor, and the signal of the entering sensor is the signal of the entering sensor; the in-place sensor can be used for detecting whether the tray of the display panel is transmitted to the outlet of the station, so that whether the display panel on the tray reaches the outlet of the station can be determined by monitoring the in-place sensor signal to determine that the display panel has completed corresponding processing at the station when the tray of the display panel is transmitted to the outlet of the station, and the in-place sensor signal can be discharged from the station. Of course, the station exit of the test apparatus may be provided with an entry sensor and an in-place sensor, and may be provided with other types of sensors, such as a deceleration sensor, etc., which is not limited in this example. Wherein, the deceleration sensor can be used for ensuring that the tray of the display panel does not collide with a blocking mechanism (Stopper) too hard when moving; the blocking mechanism may be used to control the position of the pallet on the conveyor track.
Furthermore, based on the above embodiment, the method according to the embodiment of the present application transmits the display panel to the discharge station for outputting according to the discharge priority of the target test station based on the test discharge signal, and specifically may include: when the in-place sensor signal of the target test station is detected, determining the in-place sensor signal of the target test station as the test discharge signal; for the test discharge signal, determining whether the discharge priority of the target test station is higher than the discharge priority of a station to be discharged corresponding to the discharge station, wherein the station to be discharged is a test station for completing panel test processing; and if the discharge priority of the target test station is higher than that of the station to be discharged, transmitting the display panel to the discharge station, and outputting the display panel through the discharge station.
Referring to fig. 3, a flowchart of steps of a test control method for a display panel according to an alternative embodiment of the present application is shown. Specifically, the method for testing and controlling the display panel provided by the alternative embodiment of the application specifically includes the following steps:
and 310, acquiring state marking information of each test starting station in a material channel of the test equipment when the display panel to be tested is monitored.
And 320, determining a test starting station with the state mark information being idle mark information as an idle test starting station.
In a specific implementation, the embodiment of the application can preset the corresponding state marking information for each test starting station in the material channel of the test equipment so as to mark the state of the test starting station through the state marking information, thereby determining whether each test starting station is an idle test starting station or not by acquiring the state marking information of each test starting station in the material channel of the test equipment in the production test process of the display panel. Specifically, when the display panel to be tested is monitored, the embodiment of the application can acquire the state marking information of each test starting station in the material channel of the test equipment; and can judge whether the state mark information of the test starting station is idle mark information for each test starting station, thus can confirm the test starting station as idle test starting station when the state mark information of the test starting station is idle mark information; and when the state mark information of the test starting station is not idle mark information, determining that the test starting station is in operation, if the state mark information of the test starting station is the test mark information, determining that the test starting station is in a test working state, and further determining that the test starting station does not belong to the idle test starting station.
Step 330, selecting a target test start station from the idle test start stations.
Specifically, after determining the idle test starting stations in the test equipment, the embodiment may select the target test starting station from one or more idle test starting stations according to the number of idle test starting stations. Specifically, when the number of idle test starting stations is one, that is, when the test equipment has one idle test starting station, the idle test starting station can be directly determined as a target test starting station; when the number of idle test starting stations is greater than one, that is, when the test equipment has two or more idle test starting stations, the test starting station with the highest priority level can be selected from the idle test starting stations according to the starting priority order corresponding to each test starting station, so as to be used as the target test starting station.
And step 340, transmitting the display panel to the target test starting station for test starting.
And 350, selecting a target test station from idle test stations of the test equipment based on the test trigger signal.
The test trigger signal is a signal generated by the target test starting station after the test starting is completed. Further, the selecting, based on the test trigger signal, the target test station from the idle test stations of the test equipment according to the embodiment of the present application may specifically include: when the in-place sensor signal of the target test starting station is detected, the in-place sensor signal is used as the test trigger signal; aiming at the test trigger signal, determining an idle test station in the test equipment according to the working state marking information of each test station in a material channel of the test equipment; if the number of the idle test stations is one, determining the idle test stations as the target test stations; and if the number of the idle test stations is greater than one, selecting a target test station with the highest priority from the idle test stations according to the test priority sequence corresponding to each test station.
Specifically, the embodiment of the application determines whether the target test starting station completes the test starting of the display panel by detecting the in-place sensor signal of the target test starting station so as to transmit the display panel to the target test station for testing after the target test starting station completes the test starting of the display panel. The target test station is an idle test station for testing the display panel. Further, according to the working state marking information of each test station in the material channel of the test equipment, the embodiment of the application determines the idle test station in the test equipment, which specifically includes: acquiring working state marking information of each test station in the material channel; and determining the test station with the working state marking information being the idle state marking information as the idle test station.
In actual processing, setting corresponding working state marking information for each test station in the material channel of the test equipment can be preset, so that the states of the test stations can be marked through the working state marking information, and whether each test station is an idle test station can be determined by acquiring the working state marking information of each test station in the material channel of the test equipment in the production test process of the display panel. Specifically, when the in-place sensor signal of the target test starting station is detected, the in-place sensor signal can be used for determining that the target test starting station completes the test starting of the display panel, and the in-place sensor signal can be used as a test trigger signal corresponding to the display panel, so that the working state marking information of each test station in a material channel of the test equipment can be obtained according to the test trigger signal; the working state marking information of each test station can be judged whether to be idle marking information or not, so that the test station can be determined to be an idle test station when the working state marking information of the test station is the idle state marking information; and when the working state marking information of the test station is not the idle state marking information, determining that the test station is in the test, if the working state marking information of the test station is the test state marking information, determining that the test station is in the test working state, and further determining that the test station does not belong to the idle test station.
After determining the idle test stations in the test equipment, a target test station can be selected from one or more idle test stations according to the number of the idle test stations. Specifically, when the number of idle test stations is one, that is, when the test equipment has one idle test station, the idle test station can be directly determined as a target test station; when the number of idle test stations is greater than one, that is, when the test equipment has two or more idle test stations, the test station with the highest priority level can be selected from the idle test stations according to the test priority order corresponding to each test station, so as to be used as the target test station.
And step 360, transmitting the display panel to the target test station for test processing.
And 370, determining the in-place sensor signal of the target test station as the test discharge signal when the in-place sensor signal of the target test station is detected.
Specifically, the embodiment of the application determines whether the target test station completes the test of the display panel by detecting the in-place sensor signal of the target test station, so that the target test station can be determined to complete the test of the display panel based on the in-place sensor signal of the target test station when the in-place sensor signal of the target test station is detected, and the in-place sensor signal of the target test station can be determined to be a test discharge signal corresponding to the display panel, so that the discharge priority of the target test station can be determined for the test discharge signal corresponding to the display panel later.
Step 380, determining, according to the test discharge signal, whether the discharge priority of the target test station is higher than the discharge priority of the station to be discharged corresponding to the discharge station.
The station to be excluded is a testing station for completing panel testing.
Step 390, if the discharge priority of the target test station is higher than the discharge priority of the station to be excluded, the display panel is transferred to the discharge station, and the display panel is output through the discharge station.
In the embodiment of the application, the test equipment can comprise one or more test stations, so that the corresponding discharge priority sequence can be preset for each test station in the test equipment, and the discharge priority of each test station can be determined according to the discharge priority sequence. Specifically, after the target test station completes the test of the display panel, the discharge priority of the target test station can be obtained, and other test stations completing the test of the display panel can be determined as stations to be discharged, so that the discharge priority of the target test station is compared with the stations to be discharged, and the discharge priority of the target test station is determined to be higher than the discharge priority of the stations to be discharged; when the discharge priority of the target test station is higher than the discharge priority of the station to be discharged, namely, when the discharge priority of the target test station is higher than the discharge priorities of other test stations for completing the testing of the display panel, the display panel which completes the testing in the target test station can be preferentially transmitted to the discharge station so as to preferentially output the display panel through the discharge station; when the discharge priority of the target test station is not higher than that of the station to be discharged, for example, when the discharge priority of the target test station is lower than that of other test stations for completing the test of the display panel, the display panel with higher discharge priority for completing the test in the station to be tested can be preferentially transmitted to the discharge station, so that the display panel for completing the test in each test station is output through the discharge station according to the discharge priority order, and the production beat of the test equipment is accelerated on the premise that the volume of the test equipment is unchanged, the test efficiency of the test equipment is improved, and the production capacity is further improved.
As an example of the present application, the first input station IN01 IN the conventional logistics mode shown IN fig. 1 may be defined as a first test start station fusion 01 of the test apparatus, and the original fusion station IN the conventional logistics mode may be defined as a second test start station fusion 02 of the test apparatus; the method comprises the steps of defining an original Test station Test02 as a first Test station Test01 of Test equipment, defining a second input station IN02 IN a traditional logistics mode as a second Test station Test02 of the Test equipment, defining the original Test station Test01 as a third Test station Test03 of the Test equipment, defining an OUT01 station IN the traditional logistics mode as a fourth Test station Test04 of the Test equipment, enabling a material channel of the Test equipment to be provided with two Test starting stations and four Test stations, and defining an OUT02 station IN the traditional logistics mode as a discharge station OUT of the Test equipment, so that the material channel of the Test equipment can be converted into a fusion channel through layout setting.
In particular, to keep the logistics smooth and efficient, specific requirements may be made on the entering and exiting sequence of each station in the test equipment, and the entering priority characteristics may include: the test start station entering priority and the test station entering priority may be: the priority order of entering the test stations from the fusion 01 to the fusion 02 can be as follows: the discharge priority characteristics of test 01- & gt test 02- & gt test 03- & gt test04 can comprise the priority of entering the discharge station out and the test entering discharge priority, and the priority sequence of entering the discharge station out can be as follows: test01→test02→test03→test04, the test entry discharge priority may be: entering-discharging, as shown in fig. 5, when the display panel on the tray Pallet2 completes the test start and the display panel on the tray Pallet 3 completes the test, the display panel on the tray Pallet2 may first enter the first test station test01 to perform the test, and then the display panel on the tray Pallet 3 is discharged from the fourth test station test04, at this time, the display panel on the tray Pallet1 is being tested and started in the first test start station fusion 01, and the display panel on the tray Pallet4 is being tested in the third test start station fusion 03.
In actual processing, in order to realize the switching operation of the fusion channel, the flow path of the test apparatus may be provided with 7 movable blocking mechanisms 610,3 and a fixed blocking mechanism 620, as shown in fig. 6, where the movable blocking mechanism 610 is a blocking mechanism with a raising/lowering function, and the fixed blocking mechanism 620 is mainly used for buffering; the most core design of the blocking mechanism is that the fourth test station test04 is provided with a movable blocking mechanism 610 when entering from top to bottom and is also provided with a movable blocking mechanism 610 when discharging from top to bottom; the discharge station out has a movable blocking mechanism 610 when entering from top to bottom, a movable blocking mechanism 610 when discharging from top to bottom, and a movable blocking mechanism 610 when discharging from left to right.
Meanwhile, the detection Sensor at the bottom of each station needs to be correspondingly arranged, for example, each station is marked with three groups of sensors, which are respectively: the Pallet enters Sensor, pallet to slow down the Sensor and the Pallet is in place; since the fourth test station test04 and the discharge station out need to implement the movement of the Pallet from top to bottom and from bottom to top, a deceleration Sensor needs to be disposed in each of the two movement directions, so as to ensure that the Pallet does not collide with the Stopper too much during the movement, as shown in fig. 7.
The stations can be driven by a conveyer belt CV, as shown in FIG. 8; the conveying belt CV in the X direction is called lifting (Lift) CV, and after the lifting platform is lifted wholly, one conveying channel in the X direction can be arranged; the CV in the Y direction is called Shift CV, and the transfer is effective only after the Lift platform descends; therefore, when working at a station, the Lift platform rises, so that the influence of shift CV can be avoided, and a free-running conveying channel can be formed; and during working at the station, the tray can be fixed at a correct position by positioning the rise of Pin, and at the moment, the electric brush can rise to access the power supply access part of the tray. Wherein the brushes may be power connection means for conducting power to the PG box.
For example, in the case where the display panel needs to be moved to the fuing station for about 3 to 4 seconds, to the first Test station Test01 or the third Test station Test03 for about 9 seconds, to the second Test station Test02 or to the fourth Test station Test04 for about 3 seconds, the fuing discharge completion time is about 3 to 4 seconds, the fuing discharge and fuing entry transit time is about 4 seconds, the Test discharge completion time is about 7 seconds, the brush power-on time is 1s, the fuing power-on Test process time is 11s, and the Test power-on Test process time is 29s, if according to the preset priority: in the sequence from the priming 01 to the priming 02, as shown in fig. 9, a first test starting station priming 01 is entered, the movement cost is 4s, the electricity cost is 1s, the electricity cost is 11s, and the discharge cost is 3s, and then the display panel on the tray takes 19s from entering the first test starting station priming 01 to being discharged from the first test starting station priming 01; similarly, the display panel on the 2 nd tray enters the second test starting station multiplexing 02 and takes 19s; the conversion is that 22s shows 2 trays which are used for completing the fusion, namely: the shorting TT is 11s out 1 pallet. Specifically, after the display panel to be tested, which is output by the Line In, is detected, whether the first test starting station multiplexing 01 is tested is judged according to the display panel to be tested; if the first test starting station fuing 01 is not tested, determining that the first test starting station fuing 01 is in a testing process based on the priority of the first test starting station fuing 01, and setting the state mark information of the second test starting station fuing 02 as 'discharge mark' information after the second test starting station fuing 02 is tested to determine whether the second test starting station fuing 02 is in an idle state or not, thereby determining that the second test starting station fuing 02 is in the idle state after the second test starting station fuing 02 is tested, further determining the second test starting station fuing 02 in the idle state as a target test starting station, completing the test starting of a display panel to be tested through the second test starting station fuing 02, setting the state mark information of the second test starting station fuing 02 as 'discharge mark' information after the second test starting station fuing 02 is tested to be started to the display panel, and accordingly generating a corresponding test trigger signal entering the test starting station based on the 'discharge mark' when the second test starting station fuing 02 is discharged to the display panel; if the first test starting station fuging 01 finishes the test, the first test starting station fuging 01 can be determined to be a target test starting station, so that the first test starting station fuging 01 is used for carrying out test starting on the display panel which is currently tested, after the first test starting station fuging 01 finishes the test starting on the display panel, the state mark information of the first test starting station fuging 01 can be set to be 'discharge mark' information to be used as idle mark information, and therefore when the first test starting station fuging 01 discharges the display panel, the first test starting station fuging 01 can be marked to be a vacant position through 'discharge mark' information, and a corresponding test signal is generated so that the first test starting station fuging 01 enters a test entering priority guiding judging flow based on the test trigger signal.
Specifically, after the test trigger signal is monitored, whether the first test station test01, the second test station test02, the third test station test03 and the fourth test station test04 are tested can be respectively judged based on the test trigger signal. If the first test station test01 is tested, the first test station test01 can be preferentially determined as a target test station according to the priority order of the test stations, so that the test processing of the display panel is finished through the first test station test01, and a corresponding test discharge signal can be generated through an in-place sensor of the first test station test01 after the test processing of the display panel is finished through the first test station test01, so that the display panel which is finished in the first test station test01 is preferentially transmitted to the discharge station to be output according to the discharge priority order of the test stations based on the test discharge signal. If the first test station test01 is not tested, but the second test station test02 is tested, the second test station test02 can be preferentially determined as a target test station according to the priority order of the test stations, so that the test processing of the display panel is finished through the second test station test02, and a corresponding test discharge signal can be generated through an in-place sensor of the second test station test02 after the test processing of the display panel is finished through the second test station test02, so that the test discharge priority guide judgment flow is entered based on the test trigger signal. If the first test station test01 and the second test station test02 are not tested, but the third test station test03 is tested, the third test station test03 can be preferentially determined as a target test station according to the priority order of the test stations, so that the test processing of the display panel is completed through the third test station test03, and after the test processing of the display panel is completed through the third test station test03, a corresponding test discharge signal can be generated through an in-place sensor of the third test station test03, so that the test discharge priority guide judgment flow is entered based on the test trigger signal. If the first test station test01, the second test station test02 and the third test station test03 are not tested, and the fourth test station test04 is tested, the fourth test station test04 can be determined as a target test station according to the priority order of the test stations, so that the test processing of the display panel is completed through the fourth test station test04, and after the test processing of the display panel is completed through the fourth test station test04, a corresponding test discharge signal can be generated through an in-place sensor of the fourth test station test04, so that the test discharge priority guide judgment flow is entered based on the test trigger signal.
Specifically, after the test discharge signal is monitored, whether a display panel for completing the test processing exists in each test station or not can be determined according to the discharge priority sequence of each test station based on the test discharge signal; if the first test station test01 has the display panel which completes the test processing, preferentially transmitting the display panel which completes the test processing in the first test station test01 to a discharge station so as to input the display panel which completes the test processing into an aging chamber for aging through the discharge station; if the first test station test01 does not have a display panel with the test processing completed, and the second test station test02 has a display panel with the test processing completed, the display panel with the test processing completed in the second test station test02 can be preferentially transmitted to the discharge station according to the priority order of the test stations, so that the display panel with the test processing completed is input into the aging chamber for aging through the discharge station; if the first test station test01 and the second test station test02 do not have the display panel subjected to the test processing, and the third test station test03 has the display panel subjected to the test processing, the display panel subjected to the test processing in the third test station test03 can be preferentially transmitted to the discharge station according to the priority order of the test stations, so that the display panel subjected to the test processing is input into the aging chamber through the discharge station for aging; if the first test station test01, the second test station test02 and the third test station test03 are not completed display panels, and the fourth test station test04 is provided with display panels which are completed with test processing, the display panels which are completed with test processing in the fourth test station test04 can be transmitted to the discharge station according to the priority order of the test stations, so that the display panels which are completed with test processing are input into the aging chamber through the discharge station for aging.
As can be seen, this example may be in order of priority for ingress and egress by test station: under the condition that the logic setting of entering Test and prior to discharging Test is met, periodical operation occurs after the first round of tray initialization entering, the period takes 53s, and each period can discharge display panels on 4 trays, namely TT of Test equipment is 13.3s, and display panels on 1 tray can be discharged, so that the production efficiency of the Test equipment can be effectively improved on the premise that the Test equipment is unchanged, for example, the production capacity of the Test equipment can be improved from a mode of '1 to 2' to a mode of '2 to 4', the mode of 'X Test starting stations to drag Y Test stations' is realized, the total consumption time of 'Fuing+test' is reduced, and the process bottleneck of the current display panel aging Test is relieved.
In summary, when the display panel to be tested is monitored, the idle Test starting station in the Test equipment is determined, so that the target Test starting station with the highest priority is selected from the idle Test starting stations according to the starting priority sequence corresponding to the Test starting stations, then the display panel to be tested is transmitted to the target Test starting station for Test starting, the target Test station with the highest priority is selected from the idle Test stations according to the priority sequence of the Test stations based on the Test triggering signal generated by the target Test starting station after the Test starting is completed, the display panel is transmitted to the target Test station for Test processing, and then the display panel is transmitted to the discharge station for output according to the discharge priority of the target Test station, so that the logistics mode of the Test equipment is improved, the material channel of the Test equipment is changed into a fusion channel, the total consumption time of Fuing+Test is reduced, the production time of the Test equipment is optimized from 16s to about 13.3s, and the Test equipment is not changed into the bottleneck of the aging process section.
In addition, the embodiment of the application flexibly utilizes the structural characteristics of the logistics channel, thereby not only greatly improving the production capacity of the equipment, but also not enlarging the occupied area of the equipment, but also realizing a upgrade scheme with exquisite structure and smoother running rhythm, so that the test equipment has the best compatibility with the original upstream and downstream equipment.
It should be noted that, for simplicity of description, the method embodiments are shown as a series of acts, but it should be understood by those skilled in the art that the embodiments are not limited by the order of acts, as some steps may occur in other orders or concurrently in accordance with the embodiments.
The embodiment of the application also provides a test control device of the display panel. As shown in fig. 10, the test control device 1000 of the display panel may include the following modules:
an idle test start station determining module 1010, configured to determine an idle test start station in the test apparatus when the display panel to be tested is monitored;
a target test start station selection module 1020 for selecting a target test start station from the idle test start stations;
a test start transmission module 1030, configured to transmit the display panel to the target test start station for test start;
The target test station selection module 1040 is configured to select a target test station from idle test stations of the test apparatus based on a test trigger signal, where the test trigger signal is a signal generated by the target test start station after the test start is completed;
the test processing transmission module 1050 is configured to transmit the display panel to the target test station for test processing;
and the output module 1060 is configured to transmit the display panel to a discharge station for output according to the discharge priority of the target test station based on a test discharge signal, where the test discharge signal is a signal generated by the target test station after the test process is completed.
Optionally, the idle test start station determination module 1010 may include the following sub-modules:
the state mark acquisition sub-module is used for acquiring state mark information of each test starting station in a material channel of the test equipment;
and the idle test starting station determining submodule is used for determining the test starting station with the state marking information being idle marking information as the idle test starting station.
Optionally, the target test start station selection module 1020 may include the following sub-modules:
The target test starting station determining submodule is used for determining the idle test starting station as a target test starting station when the number of the idle test starting stations is one;
and the target test starting station selecting sub-module is used for selecting the target test starting station with the highest priority from the idle test starting stations based on the starting priority sequence corresponding to each test starting station when the number of the idle test starting stations is more than one.
Optionally, the target test station selection module 1040 may include the following sub-modules:
the test trigger signal submodule is used for taking the in-place sensor signal as the test trigger signal when the in-place sensor signal of the target test starting station is detected;
the idle test station determining submodule is used for determining idle test stations in the test equipment according to the working state marking information of each test station in the material channel of the test equipment aiming at the test trigger signal;
the target test station determining submodule is used for determining the idle test station as the target test station when the number of the idle test stations is one;
And the target test station selecting submodule is used for selecting a target test station with the highest priority from the idle test stations according to the test priority sequence corresponding to each test station when the number of the idle test stations is more than one.
Optionally, the idle test station determining submodule includes the following units:
the working state mark acquisition unit is used for acquiring the working state mark information of each test station in the material channel;
and the idle test station determining unit is used for determining the test station with the working state marking information being the idle state marking information as the idle test station.
Optionally, the output module 1060 may include the following sub-modules:
the test discharge signal submodule is used for determining the in-place sensor signal of the target test station as the test discharge signal when the in-place sensor signal of the target test station is detected;
the discharge priority judging sub-module is used for determining whether the discharge priority of the target test station is higher than the discharge priority of a station to be discharged corresponding to the discharge station according to the test discharge signal, wherein the station to be discharged is a test station for completing panel test processing;
And the output sub-module is used for transmitting the display panel to the discharge station when the discharge priority of the target test station is higher than that of the station to be discharged, and outputting the display panel through the discharge station.
It should be noted that, the test control device for a display panel provided by the foregoing embodiment of the present application may execute the test control method for a display panel provided by any embodiment of the present application, and has the corresponding functions and beneficial effects of the execution method.
In a specific implementation, the test control device of the display panel can be applied to test equipment of the display panel, so that a material channel of the test equipment is converted into a fusion channel, and the test control device has a plurality of functions of fusing, test, buffer and logistics channels, and further can accelerate the production beat of the test equipment on the premise of unchanged volume of the test equipment, and improves the production capacity. Further, an embodiment of the present application further provides a test apparatus, including: a processor, and a memory for storing executable instructions of the processor; wherein the processor is configured to execute the test control method according to any one of the method embodiments described above.
Further, the material channel of the test equipment in the embodiment of the application comprises at least two test starting stations and at least four test stations, a transmission crawler is arranged between the test starting stations and the test stations, and a movable blocking mechanism is arranged in the material channel and used for controlling the position of the display panel on the transmission crawler.
The embodiment of the application also provides a computer readable storage medium, and the computer readable storage medium stores a computer program, and the computer program realizes the steps of the test control method according to any one of the method embodiments when being executed by a processor.
It should be noted that, in the embodiments of the apparatus, device, and storage medium, the description is relatively simple, and the relevant points refer to the part of the description of the method embodiments, since they are basically similar to the method embodiments.
In this specification, each embodiment is described in a progressive manner, and each embodiment is mainly described by differences from other embodiments, and identical and similar parts between the embodiments are all enough to be referred to each other.
Those of skill would further appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, computer software, or combinations of both, and that the various illustrative elements and steps are described above generally in terms of function in order to clearly illustrate the interchangeability of hardware and software. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the solution. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present application.
The foregoing description of the embodiments has been provided for the purpose of illustrating the general principles of the application, and is not meant to limit the scope of the application, but to limit the application to the particular embodiments, and any modifications, equivalents, improvements, etc. that fall within the spirit and principles of the application are intended to be included within the scope of the application.

Claims (9)

1. A test control method of a display panel, comprising:
when the display panel to be tested is monitored, determining an idle test starting station in the test equipment;
selecting a target test starting station from the idle test starting stations;
transmitting the display panel to the target test starting station for test starting;
selecting a target test station from idle test stations of the test equipment based on a test trigger signal, wherein the test trigger signal is a signal generated by the target test starting station after the test starting is completed;
transmitting the display panel to the target test station for test processing;
transmitting the display panel to a discharge station for output according to the discharge priority of the target test station based on a test discharge signal, wherein the test discharge signal is generated by the target test station after the test processing is completed;
Based on the test discharge signal, the display panel is transmitted to a discharge station for output according to the discharge priority of the target test station, and the method comprises the following steps:
when the in-place sensor signal of the target test station is detected, determining the in-place sensor signal of the target test station as the test discharge signal;
for the test discharge signal, determining whether the discharge priority of the target test station is higher than the discharge priority of a station to be discharged corresponding to the discharge station, wherein the station to be discharged is a test station for completing panel test processing;
and if the discharge priority of the target test station is higher than that of the station to be discharged, transmitting the display panel to the discharge station, and outputting the display panel through the discharge station.
2. The test control method of claim 1, wherein determining an idle test start station in the test equipment comprises:
acquiring state marking information of each test starting station in a material channel of the test equipment;
and determining the test starting station with the state mark information being idle mark information as the idle test starting station.
3. The test control method of claim 2, wherein selecting a target test start station from the idle test start stations comprises:
if the number of the idle test starting stations is one, determining the idle test starting stations as target test starting stations;
and if the number of the idle test starting stations is greater than one, selecting a target test starting station with the highest priority from the idle test starting stations based on the starting priority sequence corresponding to each test starting station.
4. The test control method of claim 1, wherein selecting a target test station from among idle test stations of the test equipment based on the test trigger signal comprises:
when the in-place sensor signal of the target test starting station is detected, the in-place sensor signal is used as the test trigger signal;
aiming at the test trigger signal, determining an idle test station in the test equipment according to the working state marking information of each test station in a material channel of the test equipment;
if the number of the idle test stations is one, determining the idle test stations as the target test stations;
And if the number of the idle test stations is greater than one, selecting a target test station with the highest priority from the idle test stations according to the test priority sequence corresponding to each test station.
5. The test control method of claim 4, wherein determining an idle test station in the test equipment according to the operation state marking information of each test station in the material channel of the test equipment comprises:
acquiring working state marking information of each test station in the material channel;
and determining the test station with the working state marking information being the idle state marking information as the idle test station.
6. A test control device for a display panel, comprising:
the idle test starting station determining module is used for determining an idle test starting station in the test equipment when the display panel to be tested is monitored;
the target test starting station selection module is used for selecting a target test starting station from the idle test starting stations;
the test starting transmission module is used for transmitting the display panel to the target test starting station for test starting;
The target test station selection module is used for selecting a target test station from idle test stations of the test equipment based on a test trigger signal, wherein the test trigger signal is a signal generated by the target test starting station after the test starting is completed;
the test processing transmission module is used for transmitting the display panel to the target test station for test processing;
the output module is used for transmitting the display panel to the discharge station for output according to the discharge priority of the target test station based on a test discharge signal, wherein the test discharge signal is a signal generated by the target test station after the test processing is completed;
the output module is specifically configured to determine, when detecting an in-place sensor signal of the target test station, the in-place sensor signal of the target test station as the test discharge signal; for the test discharge signal, determining whether the discharge priority of the target test station is higher than the discharge priority of a station to be discharged corresponding to the discharge station, wherein the station to be discharged is a test station for completing panel test processing; and if the discharge priority of the target test station is higher than that of the station to be discharged, transmitting the display panel to the discharge station, and outputting the display panel through the discharge station.
7. A test apparatus for a display panel, comprising: a processor, and a memory for storing executable instructions of the processor; wherein the processor is configured to perform the test control method of any one of claims 1 to 5.
8. The test apparatus of claim 7, wherein the material path of the test apparatus comprises at least two test start stations and at least four test stations, a conveyor track is disposed between the test start stations and the test stations, and a movable blocking mechanism is disposed in the material path for controlling the position of the display panel on the conveyor track.
9. A computer readable storage medium, characterized in that the computer readable storage medium stores a computer program which, when executed by a processor, implements the test control method according to any one of claims 1 to 5.
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