CN114018960B - A defect analysis device based on X-ray flaw detection images - Google Patents

Abstract

The invention relates to the technical field of nondestructive testing, in particular to a defect analysis device based on an X-ray flaw detection image. The detection platform comprises a focusing mirror and a transmission light receiver which are arranged in the detection platform, the detection platform is horizontally fixed on a rotating shaft of a first rotating motor, the first rotating motor is vertically fixed on a lifting platform below the first rotating motor, and the lifting platform is fixed on a lifting mechanism. An X-ray gun is fixed above the detection platform, and the X-ray gun is obliquely towards the upper surface of the detection platform. First rotating electrical machines, elevating system, X ray rifle all are connected with the switch board. The reflected light receiver is arranged above the detection table and is positioned on the opposite side of the X-ray gun. The transmission light receiver and the reflection light receiver are both connected with an imaging and analyzing system. The analysis device can perform transmission and reflection light imaging on the same measurement position, effectively improves the resolution ratio of the defect image, can automatically finish the classification of the defect type, and effectively improves the detection efficiency.

Description

A defect analysis device based on X-ray flaw detection images

technical field

The invention relates to the technical field of non-destructive testing, in particular to a defect analysis device based on X-ray flaw detection images.

Background technique

The following contents in the background art only refer to the information related to the present invention understood by the inventor, and are intended to increase the understanding of the present invention by explaining some basic technical knowledge related to the present invention, and the information does not necessarily constitute a knowledge known to those of ordinary skill in the art.

X-ray flaw detection is a non-destructive testing method that uses the characteristics of X-rays that can penetrate and decay in materials to find defects. X-ray flaw detection has the advantages of high sensitivity and is suitable for the detection of internal defects of various materials, and has been widely used in the quality inspection of various instruments and devices. Although X-rays travel in a straight line at the speed of light and are not affected by electric and magnetic fields, they are attenuated in the process of penetrating the material. If they encounter defects such as cracks, holes, and slag inclusions, they will show dark shadow areas on the negative. . Based on this, the essence of X-ray flaw detection is that according to the different degrees of attenuation of the ray energy by the inspected workpiece and its internal defect medium, the intensity difference after the ray passes through the workpiece is caused, so that the latent image generated by the projection of the defect is obtained on the photosensitive material, which passes through the darkroom. After further processing, a defect image is obtained, and then the nature of the internal defect of the workpiece and the film grade are evaluated against the standard.

Based on the above principles and technical guidance, current X-ray flaw detection devices generally only adopt and collect transmitted X-ray information for imaging. However, this method has the problem that the imaging resolution is not ideal, which leads to a large error in the subsequent defect classification process, which affects the accuracy of the part quality assessment.

SUMMARY OF THE INVENTION

In view of the above problems, the present invention provides a defect analysis device based on X-ray flaw detection images, the analysis device can perform both transmitted light imaging and reflected light imaging on the same measurement position, effectively improving the resolution of the defect image, and The analysis device can automatically complete the classification of defect types, thereby effectively improving the detection efficiency. In order to achieve the above objects, the present invention adopts the following technical solutions.

A defect analysis device based on X-ray flaw detection images, comprising: an inspection table, a focusing mirror, a transmitted light receiver, a first rotating motor, a lifting platform, a lifting mechanism, an X-ray gun, a control cabinet, a reflected light receiver, and an imaging and imaging device. analysis system. Wherein: the detection stage has an inner cavity, the focusing mirror and the transmitted light receiver are fixed in the inner cavity, and the transmitted light receiver is located directly under the focusing mirror. The detection table is horizontally fixed on the motor shaft of the first rotary motor, and the first rotary motor is vertically fixed on a lifting platform below it, and the lifting platform is fixed on the lifting mechanism. The X-ray gun is fixed above the inspection table, and the X-ray gun is inclined toward the upper surface of the inspection table. The first rotating motor, the lifting mechanism and the X-ray gun are all connected with the control cabinet. The reflected light receiver is arranged above the detection table and on the opposite side of the X-ray gun, so as to receive the reflected light. Both the transmitted light receiver and the reflected light receiver are connected with the imaging and analysis system, so as to convert the received light into a visual image and analyze the defect type.

In a further technical solution, the imaging and analysis system includes an imaging module, an image collection module, an analysis module and a storage module. Wherein: the imaging module is used to image the light signals collected by the transmitted light receiver and the reflected light receiver, and the image collection module is used to collect the images from the imaging module and transmit them to the analysis module for analysis Defect identification and classification. The storage module is connected with the analysis module, and the storage module is used for storing the analysis result given by the analysis module.

In a further technical solution, the imaging and analysis system further includes a display, the display is used to display a visualized analysis image, such as a detection image of the workpiece to be tested, defect types, etc., for inspection personnel to observe.

In a further technical solution, the analysis module has a convolutional neural network model for classifying defects in images, which can identify and classify the X-ray information input to the image collection module, and associate the corresponding defect types and levels with the corresponding defect types and levels. After matching, it is transmitted to the storage module for storage, and transmitted to the display for display.

In a further technical solution, the lifting mechanism includes any one of an air cylinder, a hydraulic cylinder, a lead screw mechanism, etc., so as to drive the lifting platform up and down, and the detection table and X-ray can be realized through the lifting and lowering of the lifting platform. The distance between the guns changes, thereby changing the irradiation position of the X-ray on the workpiece under test on the inspection table.

In a further technical solution, the lead screw mechanism includes a second rotating motor, a fixed plate, a support rod, a screw hole plate, a screw rod and a guide rod. Wherein: the second rotating electrical machine is arranged vertically, the fixing plate is horizontally fixed on the upper end surface of the motor shaft of the second rotating electrical machine, the support rod is vertically fixed on the fixing plate, and the screw hole plate is horizontally fixed At the top end of the support rod, the screw rod is screwed into the screw hole of the screw hole plate, and the screw rod is coaxially arranged with the motor shaft of the second rotating electrical machine. There are two guide rods, which are respectively vertically fixed on both sides of the second rotating electrical machine, and the upper ends of the guide rods pass through the lifting platform and are slidably connected.

In a further technical solution, a collimator is also included, which is connected to the light exit port of the X-ray gun, and the collimator is inclined toward the upper surface of the detection table. The collimator can enhance the X-rays emitted by the X-ray gun, can correct and concentrate the X-rays, generate high-density X-ray beams, and improve the imaging resolution.

In a further technical solution, a wireless transmission module connected to the transmitted light receiver is provided in the inner cavity of the detection stage, so as to wirelessly transmit the transmitted light signal received by the transmitted light receiver to the imaging and analysis system.

In a further technical solution, the reflected light receiver is connected to a wireless transmission module, and the wireless transmission module is used for wirelessly transmitting the reflected light signal received by the reflected light receiver to the imaging and analysis system.

In a further technical solution, it also includes a protective shell, and the detection table, the focusing mirror, the transmitted light receiver, the first rotating motor, the lifting platform, the lifting mechanism, the X-ray gun, and the reflected light receiver are all located in the protective shell In order to reduce the leakage of X-rays and reduce the impact on the staff.

Based on the above technical solutions, the defect analysis device of the present invention can at least produce the following beneficial effects:

(1) A defect analysis device based on X-ray flaw detection images exemplified in the present invention simultaneously adopts a transmitted light receiver and a reflected light receiver to receive the transmitted light and reflected light passing through the workpiece to be tested, so that the two kinds of light can be used. Separate imaging, and further comprehensively reflect the internal situation of the workpiece through the two imaging methods, so that the imaging resolution is higher, the detection results are more accurate, and it is convenient to determine the defects in the workpiece more accurately. Imaging the transmitted X-ray information leads to problems such as unsatisfactory imaging resolution and large error in detection results.

(2) An X-ray flaw detection image-based defect analysis device exemplified in the present invention adopts an imaging and analysis system including an imaging module, an image collection module, an analysis module, and a storage module, wherein the analysis module has a system for analyzing the image. The convolutional neural network model for defect classification, which can use a high-accuracy neural network model to automatically match the received image with the defect image data, and classify it accordingly, automatically complete the classification of defect types, and effectively improve detection. efficiency.

(3) A defect analysis device based on X-ray flaw detection images exemplified in the present invention builds a focusing mirror and a transmitted light receiver in the inner cavity of the inspection table, and then uses the first rotating motor and the lifting platform to realize the detection table. The advantages of rotating and lifting are: in order to ensure the accurate measurement of the X-ray gun, the X-ray gun is fixed above the inspection table, which will lead to the problem of how to realize the comprehensive inspection of the workpiece on the inspection table. For this reason, the present invention ensures that the positional relationship between the workpiece to be tested and the focusing mirror will not move due to the movement of the detection table after the focusing mirror and the transmitted light receiver are built in, thereby ensuring smooth and accurate detection. At the same time, the first rotating motor is used to ensure that the detection table carries the workpiece to be tested to rotate, so as to realize the detection within the same radius on the workpiece, but this still cannot complete the comprehensive detection of the entire workpiece to be tested. Change the distance between the workpiece to be tested and the X-ray gun, thereby changing the landing point of the X-ray on the upper surface of the workpiece to be tested. As the distance decreases, the landing point of the X-ray is closer to the edge of the workpiece to be tested. The closer it is to the center of the workpiece to be tested, so that when the detection within the same radius is completed, the height of the lifting platform is adjusted to perform detection within another radius. The above detection can be automatically completed through the setting of the control cabinet, which is a good solution. It solves the problem of comprehensive inspection of the workpiece to be tested on the inspection table.

Description of drawings

The accompanying drawings forming a part of the present invention are used to provide further understanding of the present invention, and the exemplary embodiments of the present invention and their descriptions are used to explain the present invention, and do not constitute an improper limitation of the present invention.

FIG. 1 is a schematic structural diagram of a defect analysis device based on an X-ray inspection image according to an embodiment of the present invention.

FIG. 2 is a schematic structural diagram of an imaging and analysis system in an embodiment of the present invention.

FIG. 3 is a schematic structural diagram of a detection table and its accessories in an embodiment of the present invention.

FIG. 4 is a schematic structural diagram of a lifting mechanism in an embodiment of the present invention.

The marks in the figure represent: 1-detection stage, 2-focusing mirror, 3-transmitted light receiver, 4-first rotating motor, 5-lifting platform, 6-lifting mechanism, 6.1-second rotating motor, 6.2-fixed plate , 6.3-support rod, 6.4-screw hole plate, 6.5-screw, 6.6-guide rod, 7-X-ray gun, 8-control cabinet, 9-reflected light receiver, 10-imaging and analysis system, 10.1-imaging module , 10.2-image collection module, 10.3-analysis module, 10.4-storage module, 10.5-display, 11-support ring, 12-groove, 13-collimator.

Detailed ways

It should be noted that the following detailed description is exemplary and intended to provide further explanation of the invention. Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs.

In the description of the present invention, the terms "horizontal", "longitudinal", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", " The orientation or positional relationship indicated by "top", "bottom", "inside", "outside", etc. is based on the orientation or positional relationship shown in the accompanying drawings, and does not limit the structure, but is only for the convenience of describing the present invention, rather than Indicating or implying that the referred device or element needs to have a specific orientation, be constructed and operate in a specific orientation, and therefore should not be construed as limiting the invention.

In addition, the terms "installed", "connected", "connected", "fixed" and the like in the present invention should be construed broadly. For example, it may be a fixed connection, a detachable connection, or an integral body; it may be a mechanical connection, a direct connection, or an indirect connection through an intermediate medium, or an internal connection between two components, or an internal connection between two components. For the interaction relationship, those of ordinary skill in the art can understand the specific meanings of the above terms in the present invention according to specific situations. The technical solution of the present invention will now be further described with reference to the accompanying drawings and embodiments of the description.

Referring to FIG. 1 and FIG. 2 , an X-ray flaw detection image-based defect analysis device is exemplified in the figures, which is an assembly including a plurality of components and belongs to the category of industrial inspection equipment. The main structure of the analysis device is a vertical design to ensure that the workpiece to be tested can be placed in the defect analysis device for inspection. Specifically, the defect analysis device includes: a detection table 1, a focusing mirror 2, a transmitted light receiver 3, a first rotating motor 4, a lifting platform 5, a lifting mechanism 6, an X-ray gun 7, a control cabinet 8, a reflected light receiver device 9 and imaging and analysis system 10, wherein:

The detection table 1, the focusing mirror 2, the transmitted light receiver 3, the first rotating motor 4, the lifting platform 5, the lifting mechanism 6, the X-ray gun 7, and the reflected light receiver 9 are all located in a protective shell. The lead box is used to reduce the leakage of X-rays and cause harm to the staff.

The detection table 1 has a box-type or box-type structure, that is, it has an inner cavity, and the focusing mirror 2 and the transmitted light receiver 3 are both fixed in the inner cavity of the detection table 1, wherein the transmitted light receiver 3 is located directly under the focusing mirror 2, and the focusing mirror 2 is bonded to the support ring 11, and the inner edge of the support ring 11 is concave, so as to fit with the lower surface edge of the focusing mirror 2 , so that the focusing mirror 2 is more stably installed and fixed on the support ring 11 . The built-in focusing mirror 2 and the transmitted light receiver 3 ensure that the positional relationship between the workpiece to be tested and the focusing mirror 2 will not be changed due to the movement of the detection table 1, thus ensuring the accuracy of detection. In another preferred embodiment, referring to FIG. 3 , the upper surface of the inspection table 1 also has a groove 12 to constrain the workpiece to be tested on the inspection table 1 during the rotation process, helping to prevent the workpiece to be tested Accidentally fell off.

In addition, based on the above description, it should be understood that the defect analysis device of this embodiment is more suitable for the detection of disc-shaped, annular workpieces, etc., which require a larger detection surface, while the The defect analysis device can realize comprehensive inspection of such workpieces through the rotation and elevation of the inspection table 1 .

Continuing, the first rotating electrical machine 4 is vertically fixed on the lifting platform 5 below it, that is, the motor shaft of the first rotating electrical machine 4 is vertically upward, and the detection table 1 is horizontally fixed on the first rotating electrical machine 4. On the upper end surface of the motor shaft of the rotary electric machine 4 . The lifting platform 5 is fixed on the lifting mechanism 6, and the lifting mechanism 6 is an air cylinder, or can also be a hydraulic cylinder or other mechanism with a lifting function, so as to drive the lifting platform 5 to lift and lower, thereby solving the existing problems. Some such inspection devices cannot complete the problem of comprehensive inspection of the entire tested workpiece. The first rotating motor 4 is used to ensure that the inspection table 1 carries the workpiece to be tested to rotate, so that the X-ray gun 7 scans the workpiece surface within the radius of the A range, but this still cannot complete the detection of the entire workpiece to be tested.

For this reason, in this embodiment, the distance between the workpiece to be tested and the X-ray gun 7 is changed through the lifting platform 5, thereby changing the landing point of the X-ray on the upper surface of the workpiece to be tested. As the distance decreases, The closer the drop point is to the edge of the workpiece to be tested, and vice versa, the closer the drop point is to the center of the workpiece to be tested, so when the detection within the same radius range is completed, the height of the lifting platform 5 is adjusted for another radius range (such as B, so For the detection within the above-mentioned B≠A), the above-mentioned detection and the switching of the radius range can be automatically completed by setting the parameters of the control cabinet 8, which well solves the problem of comprehensively detecting the workpiece to be tested on the detection table 1.

Further, continuing to refer to FIG. 1 , the X-ray gun 7 is fixed above the detection table 1, and the X-ray gun 7 is inclined toward the upper surface of the detection table 1, and the specific inclination angle of the X-ray gun 7 is not There is no special limitation, and it can be set according to actual needs. This is because the inclination angle of the X-ray gun 7 mainly determines the irradiation point of the X-ray on the upper surface of the detection table 1. When the inclination angle is larger, the irradiation The drop point is closer to the center of the upper surface of the inspection table 1 , and vice versa, the closer to the edge of the upper surface of the inspection table 1 . However, since the height of the detection table 1 in this embodiment is adjustable, the irradiation landing point of the X-ray on the upper surface of the detection table 1 can also be changed. Therefore, the X-ray gun 7 can pass the detection when the inclination angle of the X-ray gun 7 is not suitable. The height of the table 1 is adjusted.

The first rotating electrical machine 4 , the lifting mechanism 6 and the X-ray gun 7 are all connected to the control cabinet 8 . The reflected light receiver 9 is arranged above the detection table 1 and on the opposite side of the X-ray gun 7 so as to receive the reflected light. In a preferred embodiment, the receiving surface of the reflected light receiver 9 is an arc surface, so as to receive the reflected X-rays more comprehensively and improve the detection accuracy. The defect analysis device of this embodiment adopts both the transmitted light receiver 3 and the reflected light receiver 9 to receive the transmitted light and the reflected light passing through the workpiece to be tested, respectively, so that the two kinds of light can be used for imaging respectively, and further through the combination of the two imaging methods Reflect the internal situation of the workpiece, so that the imaging resolution is higher and the detection result is more accurate.

Both the transmitted light receiver 3 and the reflected light receiver 9 are connected to the imaging and analysis system 10 so as to convert the received light into a visual image and analyze the defect types. Specifically, referring to FIG. 2 , the imaging and analysis system 10 includes: an imaging module 10.1, an image collection module 10.2, an analysis module 10.3 and a storage module 10.4. The imaging module 10.1 is used to image the light signals collected by the transmitted light receiver 3 and the reflected light receiver 9, and the image collection module 10.2 is used to collect the image from the imaging module 10.1 and transmit it to the analysis module 10.3 Defect identification and classification are performed, and the analysis module 10.3 has a convolutional neural network model for defect classification of images. The storage module 10.4 is used for storing the analysis result of the analysis module 10.3.

Further, the imaging and analysis system 10 further includes a display 10.5, which is used to display the information retrieved from the storage module 10.4, such as the detection image of the workpiece to be tested, the defect type, and the like. The imaging and analysis system of this embodiment can automatically match the received image with the corresponding defect type and level by using a high-accuracy neural network model, automatically complete the classification of the defect type, and then transmit it to the storage module for storage , and transmitted to the display for display, and classified accordingly, which effectively improves the detection efficiency.

In another preferred embodiment, there is a wireless transmission module connected to the transmitted light receiver 3 in the inner cavity of the detection table 1, so as to wirelessly transmit the transmitted light signal received by the transmitted light receiver 3 to imaging and analysis system 10. Similarly, the reflected light receiver 9 is connected to a wireless transmission module, which is used to wirelessly transmit the reflected light signal received by the reflected light receiver 9 to the imaging and analysis system 10, thereby removing unnecessary wires The structure of the defect analysis device based on the X-ray inspection image is more streamlined.

As mentioned above, the lifting mechanism 6 can also be a hydraulic cylinder or other mechanism with a lifting function, so as to drive the lifting platform 5 to lift and lower, thereby solving the problem that some existing detection devices of this type cannot complete the detection of the entire workpiece to be tested. Fully detect the problem. Referring to FIG. 4 , it illustrates a lifting mechanism 6 of another structure. Specifically, the screw mechanism 6 includes: a second rotating motor 6.1, a fixing plate 6.2, a support rod 6.3, a screw hole plate 6.4, a screw 6.5 and a guide Rod 6.6, where:

The second rotating electrical machine 6.1 is arranged vertically, that is, the motor shaft of the second rotating electrical machine 6.1 is arranged vertically upward. The fixing plate 6.2 is horizontally fixed on the upper end surface of the motor shaft of the second rotating electrical machine 6.1, and the supporting rods 6.3 are two, which are respectively vertically fixed on both sides of the fixing plate 6.2, and the screw hole plate 6.4 Horizontally fixed on the top of the support rod 6.3, the screw 6.5 is threaded in the screw hole at the center of the screw hole plate 6.4, and the screw 6.5 is located between the two support rods 6.3, the screw 6.5 and the first The motor shafts of the two rotating motors 6.1 are coaxially arranged to prevent eccentric movement during rotation, which is not conducive to detection.

There are two guide rods 6.6, which are respectively vertically fixed on both sides of the second rotating electrical machine 6.1. The upper ends of the guide rods 6.6 pass through the lifting platform 5 and are slidably connected. The screw hole plate 6.4 is driven by the second rotating motor 6.1 to rotate relative to the screw rod 6.5, while the screw rod 6.5 and the lifting platform 5 cannot rotate under the constraint of the guide rod 6.6, and can only slide up/down along the guide rod 6.6, thereby realizing The lifting and lowering of the lifting platform 5.

1, in another preferred embodiment, the above-mentioned defect analysis device further includes a collimator 13, which is connected to the light exit port of the X-ray gun 7, and the collimator 13 is oblique toward the upper surface of the detection table 1 . The collimator 13 can enhance the X-rays emitted by the X-ray gun 7, can correct and concentrate the X-rays, generate high-density X-ray beams, and improve the imaging resolution.

Finally, it should be noted that any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included within the protection scope of the present invention. Although the specific embodiments of the present invention have been described above in conjunction with the accompanying drawings, they do not limit the scope of protection of the present invention. Those skilled in the art should understand that on the basis of the technical solutions of the present invention, those skilled in the art do not need to pay creative efforts. Various modifications or deformations that can be made are still within the protection scope of the present invention.

Claims (6)

1. A defect analysis device based on X-ray flaw detection image, is characterized in that, comprises: detection table, focusing mirror, transmitted light receiver, first rotating motor, lifting platform, lifting mechanism, X-ray gun, control cabinet, reflection A light receiver and an imaging and analysis system, wherein: the detection stage has an inner cavity, the inner cavity is provided with a focusing mirror and a transmitted light receiver, and the transmitted light receiver is located directly under the focusing mirror; the The detection table is horizontally fixed on the rotating shaft of the first rotary motor, the first rotary motor is vertically fixed on the lifting platform below it, and the lifting platform is fixed on the lifting mechanism; the X-ray gun is fixed on the detection table. above, and the X-ray gun is obliquely facing the upper surface of the detection table; the first rotating motor, the lifting mechanism, and the X-ray gun are all connected to the control cabinet; the reflected light receiver is arranged above the detection table, and is located in the X-ray The opposite side of the ray gun; both the transmitted light receiver and the reflected light receiver are connected to the imaging and analysis system; Also includes a collimator, which is connected at the light exit port of the X-ray gun, and the collimator is inclined toward the upper surface of the detection platform; It also includes a protective shell, wherein the detection table, the focusing mirror, the transmitted light receiver, the first rotating motor, the lifting platform, the lifting mechanism, the X-ray gun, and the reflected light receiver are all located in the protective shell; The receiving surface of the reflected light receiver is an arc surface; The lifting mechanism is a lead screw mechanism, which includes: a second rotating motor, a fixing plate, a support rod, a screw hole plate, a screw rod and a guide rod; wherein: the second rotating motor is arranged vertically, and the fixing plate is horizontally fixed At the upper end of the motor shaft of the second rotating electrical machine, the support rod is vertically fixed on the fixing plate, the screw hole plate is horizontally fixed on the top end of the support rod, and the screw rod is threadedly connected in the screw hole of the screw hole plate, And the screw rod is coaxially arranged with the motor shaft of the second rotating electrical machine; the guide rods are two, which are respectively vertically fixed on both sides of the second rotating electrical machine, and the upper end of the guide rod passes through the lifting platform and the two guide rods pass through the lifting platform. swipe to connect. 2. A defect analysis device based on X-ray flaw detection images according to claim 1, wherein the imaging and analysis system comprises an imaging module, an image collection module, an analysis module and a storage module, wherein the The imaging module is used to image the light signals collected by the transmitted light receiver and the reflected light receiver, the image collection module is used to collect the images from the imaging module and transmit them to the analysis module for defect identification and classification, and the storage module Connect with the analysis module. 3 . A defect analysis device based on X-ray inspection images according to claim 2 , wherein the analysis module has a convolutional neural network model for classifying defects in images. 4 . 4 . The defect analysis device based on X-ray inspection images according to claim 2 , wherein the imaging and analysis system further comprises a display for displaying the information retrieved from the storage module. 5 . 5 . The defect analysis device based on X-ray flaw detection images according to claim 1 , wherein the inner cavity of the inspection platform has a device connected to the transmitted light receiver and capable of being connected to the imaging and imaging device. 6 . The wireless transmission module of the analysis system for information transmission. 6. A defect analysis device based on X-ray flaw detection images according to claim 5, wherein the reflected light receiver is connected to a wireless transmission module, and the wireless transmission module is used to The reflected light signal is wirelessly transmitted to the imaging and analysis system.

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