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CN114010940A - Electrode wearing condition monitoring method and device for transcranial electrical stimulation - Google Patents

Electrode wearing condition monitoring method and device for transcranial electrical stimulation Download PDF

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CN114010940A
CN114010940A CN202111163752.6A CN202111163752A CN114010940A CN 114010940 A CN114010940 A CN 114010940A CN 202111163752 A CN202111163752 A CN 202111163752A CN 114010940 A CN114010940 A CN 114010940A
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resistance
electrode
value
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resistance threshold
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徐敏馨
易昊翔
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Hangzhou Enter Electronic Technology Co ltd
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    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61NELECTROTHERAPY; MAGNETOTHERAPY; RADIATION THERAPY; ULTRASOUND THERAPY
    • A61N1/00Electrotherapy; Circuits therefor
    • A61N1/18Applying electric currents by contact electrodes
    • A61N1/32Applying electric currents by contact electrodes alternating or intermittent currents
    • A61N1/36Applying electric currents by contact electrodes alternating or intermittent currents for stimulation
    • A61N1/36014External stimulators, e.g. with patch electrodes
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61NELECTROTHERAPY; MAGNETOTHERAPY; RADIATION THERAPY; ULTRASOUND THERAPY
    • A61N1/00Electrotherapy; Circuits therefor
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    • A61N1/04Electrodes
    • A61N1/0404Electrodes for external use
    • A61N1/0408Use-related aspects
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61NELECTROTHERAPY; MAGNETOTHERAPY; RADIATION THERAPY; ULTRASOUND THERAPY
    • A61N1/00Electrotherapy; Circuits therefor
    • A61N1/18Applying electric currents by contact electrodes
    • A61N1/32Applying electric currents by contact electrodes alternating or intermittent currents
    • A61N1/36Applying electric currents by contact electrodes alternating or intermittent currents for stimulation
    • A61N1/36014External stimulators, e.g. with patch electrodes
    • A61N1/3603Control systems

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Abstract

本申请提供了一种用于经颅电刺激的电极佩戴情况监测方法,所述方法包括:获取所述电极的电流值、电阻值及预设电阻阈值模型,所述预设电阻阈值模型包括多个刺激电流区间与电阻阈值之间的对应关系;确定所述电流值所在的目标刺激电流区间并根据所述预设电阻阈值模型,确定所述目标刺激电流区间所对应的目标电阻阈值;根据所述电阻值与所述目标电阻阈值,确定所述电极的佩戴结果。本申请可以将电极的刺激电流分成多个区间,并设置与多个刺激电流区间分别对应的电阻阈值,由此生成的预设电阻阈值模型更加符合实际的电阻变化曲线,从而能够实现一种高精度高准确度的用于经颅电刺激的电极佩戴情况监测方法。

Figure 202111163752

The present application provides a method for monitoring the wearing condition of electrodes for transcranial electrical stimulation. The method includes: acquiring a current value, a resistance value and a preset resistance threshold value model of the electrode, where the preset resistance threshold value model includes multiple Correspondence between each stimulation current interval and resistance threshold; determine the target stimulation current interval in which the current value is located, and determine the target resistance threshold corresponding to the target stimulation current interval according to the preset resistance threshold model; The resistance value and the target resistance threshold value are used to determine the wearing result of the electrode. In the present application, the stimulation current of the electrode can be divided into multiple sections, and the resistance thresholds corresponding to the multiple stimulation current sections can be set, and the preset resistance threshold model generated thereby is more in line with the actual resistance change curve, thereby realizing a high A high-accuracy monitoring method for electrode wearing for transcranial electrical stimulation.

Figure 202111163752

Description

Electrode wearing condition monitoring method and device for transcranial electrical stimulation
Technical Field
The invention relates to the field of medical equipment, in particular to an electrode wearing condition monitoring method and device for transcranial electrical stimulation.
Background
Transcranial electrical Stimulation (tES) is a neurostimulation technology, and can apply low-intensity current to a specific brain region through an electrode to achieve the purposes of regulating the activity of cerebral cortex nerves and changing the brain function. The transcranial electrical stimulation can assist conventional treatment means such as drug therapy and the like to treat diseases such as depression, Parkinson and the like.
In the related art, the transcranial electrical stimulation device needs to be worn and detected by a user before being used, and formal stimulation can be carried out on the user only after the detection is passed. Generally, a constant current is applied to a stimulation electrode of the transcranial electrical stimulation device in the wearing detection process, and whether the detection is passed or not is judged by comparing the resistance value of the stimulation electrode with a preset resistance threshold Ra of wearing. In the formal stimulation stage, a direct current is applied to a stimulation electrode of the transcranial electrical stimulation device, and the current in the stage is different from the wearing detection current, so that a resistance threshold Rb of another formal stimulation is preset. And judging whether the wearing condition is abnormal or not by comparing the real-time resistance value of the stimulating electrode with the Rb. However, in the actual stimulation phase, the stimulation current on the stimulation electrode has a change from 0 to the dc current. In the process, the resistance value between the stimulating electrodes changes along with the change of the stimulating current, so that the wearing condition is judged by adopting the same resistance threshold value under the condition that the stimulating current is different in magnitude, and the precision is low and inaccurate.
Therefore, there is a need in the related art for a high-precision electrode wear monitoring method for transcranial electrical stimulation.
Disclosure of Invention
Based on the above technical problem, the present application provides an electrode wearing condition monitoring method and device for transcranial electrical stimulation, which can provide a high-precision electrode wearing condition monitoring method for transcranial electrical stimulation.
The embodiment of the invention provides an electrode wearing condition monitoring method for transcranial electrical stimulation, which has the following specific technical scheme:
a method of electrode wear monitoring for transcranial electrical stimulation, the method comprising:
acquiring a current value, a resistance value and a preset resistance threshold value model of the electrode, wherein the preset resistance threshold value model comprises a corresponding relation between a plurality of stimulation current intervals and a resistance threshold value;
determining a target stimulation current interval in which the current value is positioned, and determining a target resistance threshold corresponding to the target stimulation current interval according to the preset resistance threshold model;
and determining the wearing result of the electrode according to the resistance value and the target resistance threshold value.
Compared with the prior art, the method has the beneficial effects that: compared with the prior art that the same resistance threshold value is adopted to determine the wearing result of the electrode under the condition that the stimulation currents are different in magnitude, the electrode wearing condition monitoring method for transcranial electrical stimulation provided by the embodiments of the application can divide the stimulation currents of the electrode into a plurality of intervals, and different resistance threshold values are set in different stimulation current intervals. The generated preset resistance threshold model is more in line with an actual resistance change curve, so that the electrode wearing condition monitoring method for transcranial electrical stimulation with high precision and high accuracy is realized.
Optionally, in an embodiment of the present application, the preset resistance threshold model is set to be determined as follows:
acquiring the output stimulation current range of the electrode;
selecting a plurality of mark current values from the output stimulation current range, and acquiring resistance values corresponding to the mark currents respectively;
and determining the preset resistance threshold model based on the plurality of flag current values and the resistance value.
Optionally, in an embodiment of the present application, the obtaining a plurality of resistance values corresponding to the plurality of flag currents includes:
acquiring a plurality of candidate resistance values of the electrode when the user comfort degree meets a preset condition under the marking current;
and selecting the maximum resistance value in the candidate resistance values as the resistance value corresponding to the mark current.
Optionally, in an embodiment of the present application, the obtaining a plurality of resistance values corresponding to the plurality of flag currents includes:
acquiring a reference curve of the electrode wearing condition of a user, wherein the reference curve comprises a corresponding relation between an output stimulation current value and a resistance value of the electrode;
and selecting a plurality of mark current values in the output stimulation current range and acquiring a plurality of resistance values corresponding to the plurality of mark currents based on the reference curve.
Optionally, in an embodiment of the present application, the determining the wearing result of the electrode according to the resistance value and the target resistance threshold includes:
and if the resistance value is larger than the target resistance threshold value, judging that the wearing result is abnormal.
Optionally, in an embodiment of the present application, the method further includes:
in the case that the electrode wearing result is determined to be abnormal, at least one regulation measure of the following measures is taken: regulating the output stimulation current, adjusting the wearing position and stopping outputting the stimulation current.
In a second aspect, the present application also proposes an electrode wear monitoring device for transcranial electrical stimulation, the device comprising:
the acquisition module is used for acquiring a current value, a resistance value and a preset resistance threshold model of the electrode, wherein the preset resistance threshold model comprises a corresponding relation between a plurality of stimulation current intervals and a resistance threshold;
a threshold determination module, configured to determine a target stimulation current interval in which the current value is located, and determine a target resistance threshold corresponding to the target stimulation current interval according to the preset resistance threshold model;
and the result determining module is used for determining the wearing result of the electrode according to the resistance value and the target resistance threshold value.
In a third aspect, the present application also proposes a processing device comprising a memory having stored therein computer program instructions and a processor arranged to execute the computer program instructions to perform the steps of the above-described electrode wear monitoring method for transcranial electrical stimulation.
In a fourth aspect, the present application also proposes a computer-readable storage medium having stored thereon a computer program which, when being executed by a processor, carries out the steps of the above-mentioned electrode wear monitoring method for transcranial electrical stimulation.
In a fifth aspect, the present application also proposes a chip comprising at least one processor for executing computer program instructions stored in a memory to perform the steps of the above-described electrode wear monitoring method for transcranial electrical stimulation.
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In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the embodiments or the prior art descriptions will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without inventive exercise.
FIG. 1 is a schematic diagram of an electrode wear monitoring system according to an embodiment of the present disclosure;
FIG. 2 is a schematic flow chart of a method for monitoring electrode wear for transcranial electrical stimulation according to an embodiment of the present application;
FIG. 3 is a diagram illustrating a model of a predetermined resistance threshold provided in an embodiment of the present application;
FIG. 4 is a diagram of a preset resistance threshold model provided in another embodiment of the present application;
FIG. 5 is a diagram illustrating a method for obtaining a plurality of resistance values corresponding to the plurality of flag currents according to an embodiment of the present disclosure;
FIG. 6 is a block diagram of an electrode wear monitoring device for transcranial electrical stimulation in accordance with an embodiment of the present application;
fig. 7 is a block diagram of a processing device according to an embodiment of the present disclosure.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application will be described and illustrated below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application. All other embodiments obtained by a person of ordinary skill in the art based on the embodiments provided in the present application without any inventive step are within the scope of protection of the present application. Moreover, it should be appreciated that in the development of any such actual implementation, as in any engineering or design project, numerous implementation-specific decisions must be made to achieve the developers' specific goals, such as compliance with system-related and business-related constraints, which may vary from one implementation to another.
Reference in the specification to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the specification. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. Those of ordinary skill in the art will explicitly and implicitly appreciate that the embodiments described herein may be combined with other embodiments without conflict.
Unless defined otherwise, technical or scientific terms referred to herein shall have the ordinary meaning as understood by those of ordinary skill in the art to which this application belongs. Reference to "a," "an," "the," and similar words throughout this application are not to be construed as limiting in number, and may refer to the singular or the plural. The present application is directed to the use of the terms "including," "comprising," "having," and any variations thereof, which are intended to cover non-exclusive inclusions; for example, a process, method, system, article, or apparatus that comprises a list of steps or modules (elements) is not limited to the listed steps or elements, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
Furthermore, in the following detailed description, numerous specific details are set forth in order to provide a better understanding of the present application. It will be understood by those skilled in the art that the present application may be practiced without some of these specific details. In some instances, devices, means, elements and circuits that are well known to those skilled in the art have not been described in detail so as not to obscure the present application.
The following describes an electrode wearing condition monitoring method for transcranial electrical stimulation according to various embodiments of the present application in a specific application scenario.
Fig. 1 provides a schematic diagram of an electrode wear monitoring system 100. As shown in FIG. 1, the electrode wear monitoring system 100 includes a transcranial electrical stimulation device 101, a processor 103, and an acquisition device 105. Processor 103 is coupled to transcranial electrical stimulation device 101 and acquisition device 105, respectively. The coupling may include a wired coupling or a wireless coupling, which is not limited herein. During the transcranial electrical stimulation of a user, the whole process needs to be monitored so as to avoid the situation that the skin of the user is painful due to poor wearing quality or excessively high resistance value. Therefore, the electrode wearing condition monitoring method for transcranial electrical stimulation provided by the embodiment of the application can be used for monitoring the condition that a user wears a stimulation electrode. As shown in FIG. 1, transcranial electrical stimulation apparatus 101 may include a power supply 1011 and stimulation electrodes 1033a, 1033 b. The processor 103 may be used to set the magnitude of the stimulation current output by the power supply 101. The processor 103 may be an electronic device with data processing capability and data transceiving capability, and may include, for example, a physical device such as a host, a computer, a tablet computer, a digital assistant (PDA), and the like, which is not limited herein.
In the stimulation process, the stimulation electrodes 1013a and 1013b are fixed on two sides of the head of the user, and the power supply unit 1011 can supply a stimulation current to the stimulation electrodes 1013a and 1013b, wherein the stimulation current has a variation process from 0 to a constant value. In the variation, the measuring terminal of the collecting device 105 is electrically connected to the stimulating electrodes 1013a and 1013b, respectively, to measure the current value between the stimulating electrodes 1013a and 1013b and the resistance value between the stimulating electrodes and the user, and send the measured current value and resistance value to the processor 103.
After receiving the current value and the resistance value, the processor 103 may process the current value and the resistance value by using the electrode wearing condition monitoring method for transcranial electrical stimulation provided in various embodiments of the present application, and obtain a wearing condition of the user wearing the transcranial electrical stimulation device. Of course, after the wearing condition is acquired, the wearing condition can be displayed on a display coupled with the processor, so that a doctor or a patient can know a specific detection result in time.
The electrode wearing condition monitoring method for transcranial electrical stimulation according to the application is described in detail below with reference to the accompanying drawings. Fig. 2 is a flowchart of a method for monitoring electrode wear for transcranial electrical stimulation according to an embodiment of the present application, which may include:
step 201: and acquiring a current value, a resistance value and a preset resistance threshold model of the electrode, wherein the preset resistance threshold model comprises a corresponding relation between a plurality of stimulation current intervals and a resistance threshold.
In the embodiment of the present application, the current value of the electrode may be a current value between the stimulation electrodes 1013a and 1013b, and the resistance value may be a resistance value between the stimulation electrodes 1013a and 1013b and the head of the user. The current value and the resistance value of the electrode are acquired by the acquisition device 105. Acquisition device 105 may include a multimeter, a dc resistance tester, or the like. The resistance value varies with the intensity, duration, etc. of the stimulation current output by the stimulation electrode during stimulation. The preset resistance threshold model may comprise a plurality of preset resistance threshold curves Ri(Ii). The resistance threshold curve may include a corresponding relationship between the stimulation current and the resistance threshold in different stimulation current intervals, that is, different resistance thresholds R may be preset in different stimulation current intensity I intervals.
Since the intensity of the stimulation current is constantly changing at different times during the stimulation process, it is inaccurate to determine the wearing condition of the electrode by using a fixed resistance threshold value in different stimulation current intervals. Based on this, in one embodiment of the present application, the preset resistance threshold model is set to be determined as follows:
step 301: acquiring the output stimulation current range of the electrode;
step 303: selecting a plurality of mark current values from the output stimulation current range, and acquiring resistance values corresponding to the mark currents respectively;
step 305: and determining the preset resistance threshold model based on the plurality of flag current values and the resistance value.
In the embodiment of the present application, the output stimulation current range of the stimulation electrode is obtained first, and in one example, the output stimulation current range may include 0-0.5mA, 0-1mA, and so on. After the output stimulation current range is determined, a plurality of marker current values I within the range can be selectedi. In an embodiment of the present application, the flag current value may be selected by a user according to an actual application requirement, for example, the flag current value may be selected to be 0.2mA, 0.4mA, 0.6mA, 0.8mA, or 1 mA. Of course, the flag current value may also be randomly sampled by the processor 103, and the application is not limited herein. Then, resistance values R corresponding to the plurality of mark currents are obtainediAnd finally based on the plurality of flag currents and the resistance value RiDetermines the resistance threshold model.
Obtaining a plurality of resistance values R corresponding to the plurality of mark currentsiThere are various ways, for example, transcranial electrical stimulation experiments may be performed on the same subject to be detected for a period of time, so as to generate the preset resistance threshold model. Based on this, in an embodiment of the present application, the selecting a plurality of flag current values in the output stimulation current range and obtaining a plurality of resistance values corresponding to the plurality of flag currents includes:
step 401: acquiring a plurality of candidate resistance values of the electrode when the user comfort degree meets a preset condition under the marking current;
step 403: and selecting the maximum resistance value in the candidate resistance values as the resistance value corresponding to the mark current.
In the embodiment of the present application, the processor 103 may set the stimulation current intensity of the stimulation electrodes 1013a and 1013b to slowly increase from 0 to IiAnd the comfort level of the user is set according to the actual application scene. In the process of the stimulation current rising, the resistance value between the stimulation electrodes 1013a, 1013b and the user is acquired in the case where the comfort level of the user satisfies the condition set in advance. For example, in one example, the user's comfort level may be set to six levels of 0-5. Specifically, a level of 0 represents extreme discomfort for the user, a level of 5 represents extreme comfort for the user, with closer levels to 0 indicating greater discomfort and closer levels to 5 indicating greater comfort. And in the case that the user comfort level is greater than 3, acquiring the resistance value of the stimulation electrode and taking the resistance value as a candidate resistance value. Finally, selecting the maximum resistance value from the candidate resistance values as the marking current IiThe corresponding resistance value.
Through the embodiment, the resistance threshold meeting the conditions can be obtained according to the comfort degree of the user in the wearing process, and the wearing requirements of the user are better met. In addition, a resistance threshold model matched with the user can be set according to the difference of the user individuals, and the diversity of the user requirements can be met.
In another embodiment of the present application, a standard corresponding relationship between the stimulation current and the resistance value of the electrode may be obtained for the determined object to be detected, so as to obtain a plurality of resistance values R corresponding to the plurality of marker currentsi. Specifically, the selecting a plurality of flag current values within the output stimulation current range and obtaining a plurality of resistance values corresponding to the plurality of flag currents includes:
step 501: acquiring a reference curve of the electrode wearing condition of a user, wherein the reference curve comprises a corresponding relation between an output stimulation current value and a resistance value of the electrode;
step 503: and selecting a plurality of mark current values in the output stimulation current range and acquiring a plurality of resistance values corresponding to the plurality of mark currents based on the reference curve.
In the embodiment of the present application, the reference curve may include a standard corresponding relationship between the stimulation current and the resistance value when the user wears the stimulation electrodes 1013a and 1013b of the transcranial electrical stimulation apparatus 101. The reference curve may be calculated based on theory. When the user wears the stimulation electrodes 1013a and 1013b, the resistance value changes with the change of the stimulation current, which is determined by the conductive property of the skin. Specifically, in an example, during the process of wearing the device, the reference curve r (i) of the resistance value varying with the output current is shown in fig. 3, and it can be seen that the resistance value gradually decreases with the increasing stimulation current. A, B, C three reference points are selected on the reference curve R (I), wherein reference point A comprises a reference current value IAAnd a reference resistance value RAThe reference point B comprises a reference current value IBAnd a reference resistance value RBThe reference point C comprises a reference current value ICAnd a reference resistance value RC. The preset resistance threshold model may be obtained based on all the reference resistance values and the reference current values.
Through the embodiment, the standard resistance values can be obtained by obtaining the reference curve of the electrode wearing condition of the user, so that the obtained preset resistance threshold model is higher in accuracy and better meets the actual user requirements.
Step 203: and determining a target stimulation current interval in which the current value is positioned, and determining a target resistance threshold corresponding to the target stimulation current interval according to the preset resistance threshold model.
In the embodiment of the present application, after the current value of the electrode is obtained through the above embodiments, it is necessary to determine the target stimulation current interval to which the current value belongs and the corresponding target resistance threshold. In one example, as shown in fig. 4, the preset resistance threshold model comprises four preset resistance threshold curves R1(I1),R2(I2),R3(I3),R4(I4). When the current value I of the stimulating electrode is between 0 and I1Within the interval, theThe preset resistance threshold value satisfies a function R1(I1) (ii) a When the current value I of the stimulating electrode is at I1-I2Within the interval, the preset resistance threshold value meets the function R2(I2) (ii) a When the current value I of the stimulating electrode is at I2-I3Within the interval, the preset resistance threshold value meets the function R3(I3) (ii) a When the current value I of the stimulating electrode is at I3-I4Within the interval, the preset resistance threshold value meets the function R4(I4). Determining the current value I of the electrodetargetIs located in the I2-I3After the interval, the I can be obtained2-I3Preset resistance threshold curve R in interval3(I3) To thereby determine the current value ItargetCorresponding target resistance threshold value is Rtarget
The resistance threshold curve Ri(Ii) The function may be a linearly changing function or may be a fixed value. For example, in another example, as shown in fig. 5, the preset resistance threshold model comprises four preset resistance threshold curves R1(I1),R2(I2),R3(I3),R4(I4). When the current value I of the stimulating electrode is at I0-I1Within the interval, the preset resistance threshold value is set to be a fixed value R1(ii) a When the current value I of the stimulating electrode is at I1-I2Within the interval, the preset resistance threshold value is set to be a fixed value R2(ii) a When the current value I of the stimulating electrode is at I2-I3Within the interval, the preset resistance threshold value is set to be a fixed value R3(ii) a When the current value I of the stimulating electrode is at I3-I4Within the interval, the preset resistance threshold value is set to be a fixed value R4. Determining a current value I of the electrodetargetIs located at I2-I3In the interval, the preset resistance threshold value is a fixed value R in the interval3To thereby determine the current value ItargetCorresponding target resistance threshold value is R3
Through the embodiment, different resistance threshold curves can be set at different stimulation stages, the wearing condition is judged by adopting different resistance threshold curves under the condition of different stimulation current sizes, and the precision is higher and the accuracy is high.
Step 205: and determining the wearing result of the electrode according to the resistance value and the target resistance threshold value.
In the embodiment of the present application, the wearing result of the electrode may be determined by comparing the resistance value obtained in each of the above embodiments with the target resistance threshold. The electrode wearing result may include wearing normality, wearing abnormality, or the like. The wearing abnormality may include the case of abnormal wearing positions such as electrode falling, uneven wearing contact and the like, and may also include the case of skin pain, burn and equipment overload of the user caused by excessively high resistance value.
Further, the determining the wearing result of the electrode according to the resistance value and the target resistance threshold value includes:
and if the resistance value is larger than the target resistance threshold value, judging that the wearing result is abnormal.
In this embodiment, the processor 103 may determine a magnitude relationship between the resistance value and the target resistance threshold, and if the resistance value is greater than the target resistance threshold, determine that the wearing condition is abnormal. The wearing result can be displayed through a display coupled with the processor 103, so that a user can conveniently know the real-time wearing condition.
It will be appreciated that after the current electrode wear results are obtained, feedback may also be provided to the user to enable the user to make corresponding adjustments. Based on this, in one embodiment of the present application, the method further comprises:
in the case that the electrode wearing result is determined to be abnormal, at least one regulation measure of the following measures is taken: regulating the output stimulation current, adjusting the wearing position and stopping outputting the stimulation current.
In the embodiment of the application, when the wearing result of the electrode is abnormal, measures should be taken for adjustment, so as to prevent the skin of the user from being burnt or cause the optic nerve of the user to be stimulated suddenly, so that the phenomenon of pseudoscopic vision of the user is caused, and the like. The adjusting measure may include adjusting the wearing position of the electrode, or may include adjusting the magnitude of the output stimulation current, or of course, may also directly stop outputting the stimulation current. The output stimulation current can be adjusted by the power supply unit 1011, or by pressing the sponge of the stimulation electrode or adding saline to the stimulation electrode, which is not limited herein.
Through the embodiment, the stimulation current of the electrode can be timely adjusted by determining the wearing result of the electrode, so that the wearing effect of the electrode is better.
It should be understood that, although the steps in the flowchart of fig. 2 are shown in order as indicated by the arrows, the steps are not necessarily performed in order as indicated by the arrows. The steps are not performed in the exact order shown and described, and may be performed in other orders, unless explicitly stated otherwise. Moreover, at least a portion of the steps in fig. 2 may include multiple steps or multiple stages, which are not necessarily performed at the same time, but may be performed at different times, which are not necessarily performed in sequence, but may be performed in turn or alternately with other steps or at least a portion of the other steps or stages.
In one embodiment, as shown in fig. 6, there is provided an electrode wear monitoring device 600 for transcranial electrical stimulation, the device comprising:
an obtaining module 601, configured to obtain a current value of the electrode, a resistance value, and a preset resistance threshold model, where the preset resistance threshold model includes a correspondence between multiple stimulation current intervals and a resistance threshold;
a threshold determining module 603, configured to determine a target stimulation current interval where the current value is located, and determine a target resistance threshold corresponding to the target stimulation current interval according to the preset resistance threshold model;
a result determining module 605, configured to determine a wearing result of the electrode according to the resistance value and the target resistance threshold.
In one embodiment of the present application, the preset resistance threshold model is set to be determined as follows:
acquiring the output stimulation current range of the electrode;
selecting a plurality of mark current values from the output stimulation current range, and acquiring resistance values corresponding to the mark currents respectively;
and determining the preset resistance threshold model based on the plurality of flag current values and the resistance value.
In an embodiment of the application, the obtaining a plurality of resistance values corresponding to the plurality of flag currents includes:
acquiring a plurality of candidate resistance values of the electrode when the user comfort degree meets a preset condition under the marking current;
and selecting the maximum resistance value in the candidate resistance values as the resistance value corresponding to the mark current.
In an embodiment of the application, the obtaining a plurality of resistance values corresponding to the plurality of flag currents includes:
acquiring a reference curve of the electrode wearing condition of a user, wherein the reference curve comprises a corresponding relation between an output stimulation current value and a resistance value of the electrode;
and selecting a plurality of mark current values in the output stimulation current range and acquiring a plurality of resistance values corresponding to the plurality of mark currents based on the reference curve.
In an embodiment of the application, the result determining module is specifically configured to: and if the resistance value is larger than the target resistance threshold value, judging that the wearing result is abnormal.
In one embodiment of the present application, the method further comprises: in the case that the electrode wearing result is determined to be abnormal, at least one regulation measure of the following measures is taken: regulating the output stimulation current, adjusting the wearing position and stopping outputting the stimulation current.
For specific limitations of the electrode wear monitoring device 600 for transcranial electrical stimulation, reference may be made to the above limitations of the electrode wear monitoring method for transcranial electrical stimulation, which are not described in detail herein. The various modules in the electrode wear monitoring device 600 for transcranial electrical stimulation described above may be implemented in whole or in part by software, hardware, and combinations thereof. The modules can be embedded in a hardware form or independent from a processor in the computer device, and can also be stored in a memory in the computer device in a software form, so that the processor can call and execute operations corresponding to the modules.
In another aspect, the present application further provides a processing device, which includes a memory and a processor, wherein the memory stores computer program instructions, and the processor is configured to execute the computer program instructions to execute the electrode wearing condition monitoring method for transcranial electrical stimulation according to the above embodiments.
The processing device 700 may be a physical device or a physical device cluster, or may be a virtualized cloud device, such as at least one cloud computing device in a cloud computing cluster. For ease of understanding, the present application illustrates the structure of the processing device 700 as a separate physical device from the processing device 700.
As shown in fig. 7, the processing apparatus 700 includes: a processor and a memory for storing processor computer program instructions; wherein the processor is configured to implement the apparatus described above when executing the computer program instructions. The processing device 700 includes a memory 701, a processor 703, a bus 705, and a communication interface 707. Memory 701, processor 703 and communication interface 707 communicate over a bus 705. The bus 705 may be a Peripheral Component Interconnect (PCI) bus, an Extended Industry Standard Architecture (EISA) bus, or the like. The bus may be divided into an address bus, a data bus, a control bus, etc. For ease of illustration, only one thick line is shown in FIG. 7, but this is not intended to represent only one bus or type of bus. The communication interface 707 is used for communication with the outside.
The processor 703 may be a Central Processing Unit (CPU). The memory 701 may include a volatile memory (volatile memory), such as a Random Access Memory (RAM). The memory 701 may also include a non-volatile memory (non-volatile memory), such as a read-only memory (ROM), a flash memory, an HDD or an SSD, and so on.
Those skilled in the art will appreciate that the architecture shown in fig. 7 is merely a block diagram of some of the structures associated with the disclosed aspects and is not intended to limit the computing devices to which the disclosed aspects apply, as particular computing devices may include more or less components than those shown, or may combine certain components, or have a different arrangement of components.
In another aspect, the present application further provides a chip comprising at least one processor, where the processor is configured to execute computer program instructions stored in a memory to execute the electrode wearing condition monitoring method for transcranial electrical stimulation according to the foregoing embodiments.
In another aspect, the present application further provides a computer-readable storage medium, on which computer program instructions are stored, and the computer program instructions, when executed by a processor, implement the electrode wearing condition monitoring method for transcranial electrical stimulation according to the above embodiments.
The computer readable storage medium may be a tangible device that can hold and store the instructions for use by the instruction execution device. The computer readable storage medium may be, for example, but is not limited to, an electronic memory device, a magnetic memory device, an optical memory device, an electromagnetic memory device, a semiconductor memory device, or any suitable combination of the foregoing. More specific examples (a non-exhaustive list) of the computer readable storage medium would include the following: a portable computer diskette, a hard disk, a Random Access Memory (RAM), a Read-Only Memory (ROM), an erasable Programmable Read-Only Memory (EPROM or flash Memory), a Static Random Access Memory (SRAM), a portable Compact Disc Read-Only Memory (CD-ROM), a Digital Versatile Disc (DVD), a Memory stick, a floppy disk, a mechanical coding device, a punch card or an in-groove protrusion structure, for example, having instructions stored thereon, and any suitable combination of the foregoing.
The computer program instructions described herein may be downloaded to the various computing/processing devices from a computer-readable storage medium, or to an external computer or external storage device via a network, such as the internet, a local area network, a wide area network, and/or a wireless network. The network may include copper transmission cables, fiber optic transmission, wireless transmission, routers, firewalls, switches, gateway computers and/or edge servers. The network adapter card or network interface in each computing/processing device receives computer program instructions from the network and forwards the computer program instructions for storage in a computer-readable storage medium in the respective computing/processing device.
The computer program instructions for carrying out operations of the present application may be assembler instructions, Instruction Set Architecture (ISA) instructions, machine-related instructions, microcode, firmware instructions, state setting data, or source or object code written in any combination of one or more programming languages, including an object oriented programming language such as smalltalk, C + + or the like and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The computer program instructions may execute entirely on the user's computer, partly on the user's computer, as a stand-alone software package, partly on the user's computer and partly on a remote computer or entirely on the remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer through any type of Network, including a Local Area Network (LAN) or a Wide Area Network (WAN), or the connection may be made to an external computer (for example, through the Internet using an Internet service provider). In some embodiments, the electronic circuitry can execute computer program instructions to implement aspects of the present application by utilizing state information of the computer program instructions to personalize custom electronic circuitry, such as Programmable Logic circuits, Field-Programmable Gate arrays (FPGAs), or Programmable Logic Arrays (PLAs).
Various aspects of the present application are described herein with reference to flowchart illustrations and/or block diagrams of methods, apparatus, and/or devices according to embodiments of the application. It will be understood that each block of the flowchart illustrations and/or block diagrams, and combinations of blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer program instructions.
These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions/acts specified in the flowchart and/or block diagram block or blocks. These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer, programmable data processing apparatus, and/or other devices to function in a particular manner, such that the computer-readable medium storing the instructions comprises an article of manufacture including instructions which implement the function/act specified in the flowchart and/or block diagram block or blocks.
The computer program instructions may also be loaded onto a computer, other programmable data processing apparatus, or other devices to cause a series of operational steps to be performed on the computer, other programmable apparatus or other devices to produce a computer implemented process such that the instructions which execute on the computer, other programmable apparatus or other devices implement the functions/acts specified in the flowchart and/or block diagram block or blocks.
The flowchart and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of apparatus, systems, methods according to various embodiments of the present application. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of instructions, which comprises one or more executable instructions for implementing the specified logical function(s). In some alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved.
It is also noted that each block of the block diagrams and/or flowchart illustration, and combinations of blocks in the block diagrams and/or flowchart illustration, can be implemented by hardware (e.g., a Circuit or an ASIC) for performing the corresponding function or action, or by combinations of hardware and software, such as firmware. The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the present invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.

Claims (10)

1. A method of electrode wear monitoring for transcranial electrical stimulation, the method comprising:
acquiring a current value, a resistance value and a preset resistance threshold value model of the electrode, wherein the preset resistance threshold value model comprises a corresponding relation between a plurality of stimulation current intervals and a resistance threshold value;
determining a target stimulation current interval in which the current value is positioned, and determining a target resistance threshold corresponding to the target stimulation current interval according to the preset resistance threshold model;
and determining the wearing result of the electrode according to the resistance value and the target resistance threshold value.
2. The method of claim 1, wherein the preset resistance threshold model is set to be determined as follows:
acquiring the output stimulation current range of the electrode;
selecting a plurality of mark current values from the output stimulation current range, and acquiring resistance values corresponding to the mark currents respectively;
and determining the preset resistance threshold model based on the plurality of flag current values and the resistance value.
3. The method of claim 2, wherein obtaining a plurality of resistance values corresponding to the plurality of flag currents comprises:
acquiring a plurality of candidate resistance values of the electrode when the user comfort degree meets a preset condition under the marking current;
and selecting the maximum resistance value in the candidate resistance values as the resistance value corresponding to the mark current.
4. The method of claim 2, wherein obtaining a plurality of resistance values corresponding to the plurality of flag currents comprises:
acquiring a reference curve of the electrode wearing condition of a user, wherein the reference curve comprises a corresponding relation between an output stimulation current value and a resistance value of the electrode;
and selecting a plurality of mark current values in the output stimulation current range and acquiring a plurality of resistance values corresponding to the plurality of mark currents based on the reference curve.
5. The method of claim 1, wherein determining the wearing result of the electrode based on the resistance value and the target resistance threshold comprises:
and if the resistance value is larger than the target resistance threshold value, judging that the wearing result is abnormal.
6. The method of claim 1, further comprising:
in the case that the electrode wearing result is determined to be abnormal, at least one regulation measure of the following measures is taken: regulating the output stimulation current, adjusting the wearing position and stopping outputting the stimulation current.
7. An electrode wear monitoring device for transcranial electrical stimulation, the device comprising:
the acquisition module is used for acquiring a current value, a resistance value and a preset resistance threshold model of the electrode, wherein the preset resistance threshold model comprises a corresponding relation between a plurality of stimulation current intervals and a resistance threshold;
a threshold determination module, configured to determine a target stimulation current interval in which the current value is located, and determine a target resistance threshold corresponding to the target stimulation current interval according to the preset resistance threshold model;
and the result determining module is used for determining the wearing result of the electrode according to the resistance value and the target resistance threshold value.
8. A processing device comprising a memory and a processor, wherein the memory has stored therein computer program instructions, the processor being arranged to execute the computer program instructions to perform the steps of the method of any of claims 1 to 6.
9. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the steps of the method of any one of claims 1 to 6.
10. A chip comprising at least one processor for executing computer program instructions stored in a memory for performing the steps of the method of any of the preceding claims 1 to 6.
CN202111163752.6A 2021-09-30 2021-09-30 Electrode wearing condition monitoring method and device for transcranial electrical stimulation Pending CN114010940A (en)

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