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CN113934194A - A test device and test method for DIO interface of industrial computer - Google Patents

A test device and test method for DIO interface of industrial computer Download PDF

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Publication number
CN113934194A
CN113934194A CN202111127945.6A CN202111127945A CN113934194A CN 113934194 A CN113934194 A CN 113934194A CN 202111127945 A CN202111127945 A CN 202111127945A CN 113934194 A CN113934194 A CN 113934194A
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test
npn
pnp
dio
interface
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毛成良
桂强
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Chaoen Intelligent Technology Suzhou Co ltd
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Chaoen Intelligent Technology Suzhou Co ltd
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    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • G05B23/0205Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0208Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system
    • G05B23/0213Modular or universal configuration of the monitoring system, e.g. monitoring system having modules that may be combined to build monitoring program; monitoring system that can be applied to legacy systems; adaptable monitoring system; using different communication protocols
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00Programme-control systems
    • G05B19/02Programme-control systems electric
    • G05B19/04Programme control other than numerical control, i.e. in sequence controllers or logic controllers
    • G05B19/042Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
    • G05B19/0423Input/output
    • G05B19/0425Safety, monitoring

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Debugging And Monitoring (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

The invention relates to a testing device and a testing method for a DIO interface of an industrial personal computer, wherein the testing device for the DIO interface of the industrial personal computer comprises the following components: the testing jig comprises an NPN testing circuit and a PNP testing circuit; the NPN test circuit comprises an NPN test port and an NPN status indicator lamp, and the NPN test port is used for being electrically connected with a DIO interface to be tested of the industrial personal computer; the PNP test circuit comprises a PNP test port and a PNP status indicator lamp, and the PNP test port is used for being electrically connected with a DIO interface to be tested of the industrial personal computer; the main control unit is electrically connected with the test fixture; the main control unit comprises an NPN regulation and control unit and a PNP regulation and control unit; the NPN regulation and control unit is electrically connected with the NPN test circuit; the PNP regulation unit is electrically connected with the PNP test circuit. Through the setting, the problems that the existing DIO interface is not intuitive to test and inconvenient to use can be solved.

Description

Testing device and testing method for DIO interface of industrial personal computer
Technical Field
The invention relates to the technical field of industrial personal computers, in particular to a testing device and a testing method for a DIO interface of an industrial personal computer.
Background
In the field of industrial personal computers, a DIO (digital input/output) port is widely used on the industrial personal computer; the user can develop the module corresponding to the software driver by himself according to the DIO port characteristics.
In the traditional test, input and output are short-circuited generally, and a command line is used for knocking codes to carry out transceiving test, and the test mode is not intuitive and is inconvenient to use.
Disclosure of Invention
In order to solve the technical problems, the invention aims to provide a testing device and a testing method for a DIO interface of an industrial personal computer.
In order to achieve one of the above objects, an embodiment of the present invention provides a testing apparatus for a DIO interface of an industrial personal computer, including:
the testing jig comprises an NPN testing circuit and a PNP testing circuit; the NPN test circuit comprises an NPN test port and an NPN status indicator lamp, the NPN test port is used for being electrically connected with a DIO interface to be tested of the industrial personal computer, and the NPN status indicator lamp is turned on when the input of the NPN test port is low level; the PNP test circuit comprises a PNP test port and a PNP status indicator lamp, the PNP test port is used for being electrically connected with a DIO interface to be tested of the industrial personal computer, and the PNP status indicator lamp is turned on when the input of the PNP test port is high level;
the main control unit is electrically connected with the test fixture; the main control unit comprises an NPN regulation and control unit and a PNP regulation and control unit; the NPN regulation and control unit is electrically connected with the NPN test circuit; the PNP regulation and control unit is electrically connected with the PNP test circuit.
As a further improvement of an embodiment of the present invention, the main control unit further includes a software debugging window interface, where the software debugging window interface includes an NPN test button and a PNP test button; the NPN test button is in signal connection with the NPN regulation and control unit; the PNP test button is in signal connection with the PNP regulation and control unit.
As a further improvement of an embodiment of the present invention, the software debugging window interface further includes a first DIO voltage writing unit and a second DIO voltage writing unit;
the first DIO voltage writing unit is positioned at the NPN test button and used for writing voltage data into the NPN test port;
the second DIO voltage writing unit is located at the position of the PNP test button and used for writing voltage data into the PNP test port.
As a further improvement of an embodiment of the present invention, the first DIO voltage writing unit includes a first data writing frame, a first data writing button; the first data writing frame is used for setting a low level numerical value by a user, and the first data writing button is used for confirming by the user;
the second DIO voltage writing unit comprises a second data writing frame and a second data writing button; the second data writing box is used for setting a high level value by a user, and the second data writing button is used for confirming by the user.
As a further improvement of an embodiment of the present invention, the NPN test circuit includes 8 sets of the NPN test port and the NPN status indicator lamp;
the PNP test circuit comprises 8 groups of PNP test ports and PNP status indicator lamps.
As a further improvement of an embodiment of the present invention, the NPN test circuit further includes 8 first voltage dividing resistors, which are electrically connected to the 8 NPN status indicator lamps, respectively;
the PNP test circuit further comprises 8 second voltage-dividing resistors which are electrically connected with the 8 PNP state indicating lamps respectively.
As a further improvement of an embodiment of the present invention, the NPN status indicator lamp and the PNP status indicator lamp are both LED indicator lamps.
As a further improvement of an embodiment of the present invention, the test fixture further includes a 12V power interface, a power indicator, for connecting a power supply and displaying a power-on state.
As a further improvement of an embodiment of the present invention, the test fixture is a handheld test fixture.
An embodiment of the present invention further provides a method for testing a DIO interface of an industrial personal computer, based on the device for testing a DIO interface of an industrial personal computer, the method including:
step A: electrically connecting the test fixture with a DIO interface to be tested of the industrial personal computer, and connecting a power supply;
and B: opening the software debugging window interface, and selecting an NPN test mode or a PNP test mode;
when an NPN test mode is selected, writing a low level value in the first data writing frame, clicking a first data writing button for confirmation, and observing whether the NPN status indicator lamp is lightened;
when the PNP test mode is selected, writing a high level value in the second data writing frame, clicking a second data writing button for confirmation, and observing whether the PNP state indicator lamp is lightened.
Compared with the prior art, the invention has the beneficial effects that:
arranging a test fixture and a main control unit in a test device of a DIO interface of an industrial personal computer; in the test fixture, the NPN test mode and the PNP test mode are integrated on one test fixture according to the two working modes of the DIO interface, so that the operation is convenient; in the main control unit, an NPN regulation and control unit and a PNP regulation and control unit are used for selecting a test mode;
when the NPN test mode is selected, the NPN test port is electrically connected with a DIO interface to be tested, and the NPN status indicator lamp is used for indicating a detection result;
when the PNP test mode is selected, the PNP test port is used for being electrically connected with a DIO interface to be tested, and the PNP state indicator lamp is used for indicating a detection result;
therefore, the main control unit selects the test mode, and the test fixture carries out specific test and result display, so that the DIO interface of the industrial personal computer can be visually and quickly detected, and the detection working efficiency is improved; meanwhile, the detection mode is simple and effective, the test result is visual, and the method is suitable for batch production.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings used in the embodiments or the description of the prior art will be briefly described below. It is obvious that the drawings in the following description are only some embodiments of the invention, and that for a person skilled in the art, other drawings can be derived from them without inventive effort.
FIG. 1 is a schematic structural distribution diagram of a test fixture according to an embodiment of the present invention;
FIG. 2 is a schematic plan view of a software debugging window interface in an embodiment of the invention;
FIG. 3 is a schematic circuit diagram of an NPN test circuit according to an embodiment of the present invention;
fig. 4 is a schematic circuit diagram of a PNP test circuit according to an embodiment of the present invention.
Wherein the reference numbers referred to in the figures are as follows:
the NPN test terminal 110, the NPN status indicator lamp 111, the PNP test terminal 120, the PNP status indicator lamp 121, the second voltage-dividing resistor 122, the 12V power interface 130, the power indicator lamp 131, the NPN test button 210, the first data write-in button 211, the PNP test button 220 and the LED lamp command line 25.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the technical solutions of the present invention will be described in detail and completely with reference to the following detailed description of the invention and the accompanying drawings. It is to be understood that the described embodiments are merely exemplary of the invention, and not restrictive of the full scope of the invention. All other embodiments, which can be obtained by a person skilled in the art without any inventive step based on the embodiments of the present invention, are within the scope of the present invention.
The embodiments described below with reference to the accompanying drawings are illustrative only for the purpose of explaining the present invention, and are not to be construed as limiting the present invention.
As shown in fig. 1 to fig. 2, an embodiment of the present invention provides a testing apparatus for a DIO interface of an industrial personal computer, including:
the testing jig comprises an NPN testing circuit and a PNP testing circuit; the NPN test circuit comprises an NPN test port 110 and an NPN status indicator lamp 111, wherein the NPN test port 110 is used for being electrically connected with a DIO interface to be tested of the industrial personal computer, and the NPN status indicator lamp 111 is turned on when the input of the NPN test port 110 is at a low level; the PNP test circuit comprises a PNP test port 120 and a PNP status indicator lamp 121, the PNP test port 120 is used for being electrically connected with a DIO interface to be tested of the industrial personal computer, and when the input of the PNP test port 120 is in a high level, the PNP status indicator lamp 121 is turned on;
the main control unit is electrically connected with the test fixture; the main control unit comprises an NPN regulation and control unit and a PNP regulation and control unit; the NPN regulation and control unit is electrically connected with the NPN test circuit; the PNP regulation unit is electrically connected with the PNP test circuit.
Specifically, a test fixture and a main control unit are arranged in a test device of a DIO interface of an industrial personal computer; in the test fixture, the NPN test mode and the PNP test mode are integrated on one test fixture according to the two working modes of the DIO interface, so that the operation is convenient; in the main control unit, an NPN regulation and control unit and a PNP regulation and control unit are used for selecting a test mode;
when the NPN test mode is selected, the NPN test port 110 is used to electrically connect with a DIO interface to be tested, and the NPN status indicator lamp 111 is used to indicate a detection result;
when the PNP test mode is selected, the PNP test port 120 is used to electrically connect to a DIO interface to be tested, and the PNP status indicator lamp 121 is used to indicate a detection result;
therefore, the main control unit selects the test mode, and the test fixture carries out specific test and result display, so that the DIO interface of the industrial personal computer can be visually and quickly detected, and the detection working efficiency is improved; meanwhile, the detection mode is simple and effective, the test result is visual, and the method is suitable for batch production.
In practical use, the testing device designs NPN and PNP testing items according to two working modes of DIO, integrates the two modules into a testing jig, and is convenient to operate.
Further, the main control unit further comprises a software debugging window interface, wherein the software debugging window interface comprises an NPN test button 210 and a PNP test button 220; the NPN test button 210 is in signal connection with the NPN regulation and control unit; the PNP test button 220 is in signal connection with the PNP regulation unit.
In practical use, according to two working modes of DIO, the principle is as follows:
as shown in fig. 3, in the NPN mode, when the DO terminal gives a low level through software or the like, the LED lights up;
as shown in fig. 4, in the PNP mode, when the DO terminal gives a high level through software or the like, the LED lights up;
as shown in fig. 2, the testing can be performed through a DIO software debug window.
Furthermore, the software debugging window interface also comprises a first DIO voltage writing unit and a second DIO voltage writing unit;
the first DIO voltage writing unit is located at the position of the NPN test button 210, and is configured to write voltage data for the NPN test port 110;
the second DIO voltage writing unit is located at the location of the PNP test button 220 for writing voltage data for the PNP test port 120.
In actual use, firstly, a test software is started, and a corresponding test mode, NPN or PNP mode is selected; then, voltage data of the corresponding status indicator lamp is set.
Therefore, voltage data can be written and tested by self.
Further, the first DIO voltage writing unit includes a first data writing frame, a first data writing button 211; the first data write box is used for setting a low level value by a user, and the first data write button 211 is used for confirmation by the user;
the second DIO voltage writing unit comprises a second data writing frame and a second data writing button; the second data write box is used for setting a high level value by a user, and the second data write button is used for confirming by the user.
In actual operation, when voltage data of the status indicator lamp corresponding to each test mode is set, NPN writes "0" (i.e., after the first data write frame is filled with "0" and the first data write button 211 is clicked), the LED lights; the PNP writes a "1" (i.e., the second data write box fills in a "1", and after clicking the second data write button), the LED will light up.
Therefore, the condition of each DIO interface on the industrial personal computer is tested by observing whether the LED corresponding to the DIO interface is on or not.
Further, the NPN test circuit comprises 8 groups of NPN test ports and NPN status indicator lamps;
the PNP test circuit comprises 8 groups of PNP test ports and PNP status indicator lamps.
Further, the NPN status indicator 111 and the PNP status indicator 121 are both LED indicators.
In actual use, 8 sets of LED circuits are designed according to the characteristics of 8 sets of DIO ports, and the LEDs of the corresponding ports can be lightened through the level sent out by software.
In actual operation, multiple sets or single sets of interfaces may be tested simultaneously.
Further, the NPN test circuit also comprises 8 first voltage dividing resistors which are respectively electrically connected with the 8 NPN status indicator lamps;
the PNP test circuit also comprises 8 second voltage-dividing resistors which are respectively electrically connected with the 8 PNP status indicator lamps.
Therefore, each status indicator lamp is guaranteed to be normally powered and can normally work.
Further, the test fixture further comprises a 12V power interface 130 and a power indicator 131, which are used for connecting a power supply and displaying a power-on state.
Furthermore, the test fixture is a handheld test fixture.
In actual use, after the test fixture is inserted into a DIO port of the industrial personal computer, the power supply can be switched on to carry out normal detection.
The handheld test fixture is convenient to carry and use.
The invention also provides a testing method of the DIO interface of the industrial personal computer, which is based on the testing device of the DIO interface of the industrial personal computer, and the method comprises the following steps:
step A: electrically connecting the test fixture with a DIO interface to be tested by the industrial personal computer, and connecting a power supply;
and B: opening a software debugging window interface, and selecting an NPN test mode or a PNP test mode;
when the NPN test mode is selected, writing a low level value in the first data writing frame, clicking the first data writing button 211 for confirmation, and observing whether the NPN status indicator lamp 111 is lit;
when the PNP test mode is selected, a high level value is written in the second data writing frame, the second data writing button is clicked to confirm, and whether the PNP status indicator lamp 121 is lit or not is observed.
In actual operation, the test method is as follows:
1. inserting the jig on a DIO port of an industrial personal computer, and switching on a power supply;
2. opening the testing software, and selecting a corresponding testing mode, NPN or PNP;
3. setting corresponding LED lamp group data; NPN writes '0', LED lights; PNP writes into '1', LED lights; multiple groups or groups may be tested;
4. after setting, click the "write" button to see whether the LED corresponding to the DIO port is on.
It should be understood that although the present description refers to embodiments, not every embodiment contains only a single technical solution, and such description is for clarity only, and those skilled in the art should make the description as a whole, and the technical solutions in the embodiments can also be combined appropriately to form other embodiments understood by those skilled in the art.
The above-listed detailed description is only a specific description of a possible embodiment of the present invention and is not intended to limit the scope of the present invention, and equivalent embodiments or modifications made without departing from the technical spirit of the present invention are included in the scope of the present invention.

Claims (10)

1.一种工控机DIO接口的测试装置,其特征在于,包括:1. a test device of industrial computer DIO interface, is characterized in that, comprises: 测试治具,包括NPN测试电路、PNP测试电路;所述NPN测试电路包括NPN测试端口、NPN状态指示灯,所述NPN测试端口用于与所述工控机待测试的DIO接口电性连接,当所述NPN测试端口的输入为低电平时,所述NPN状态指示灯点亮;所述PNP测试电路包括PNP测试端口、PNP状态指示灯,所述PNP测试端口用于与所述工控机待测试的DIO接口电性连接,当所述PNP测试端口的输入为高电平时,所述PNP状态指示灯点亮;The test fixture includes an NPN test circuit and a PNP test circuit; the NPN test circuit includes an NPN test port and an NPN status indicator, and the NPN test port is used for electrical connection with the DIO interface to be tested by the industrial computer. When the input of the NPN test port is at a low level, the NPN status indicator light is on; the PNP test circuit includes a PNP test port and a PNP status indicator light, and the PNP test port is used to be tested with the industrial computer The DIO interface is electrically connected, and when the input of the PNP test port is at a high level, the PNP status indicator light is on; 以及主控单元,与所述测试治具电性连接;所述主控单元包括NPN调控单元、PNP调控单元;所述NPN调控单元与所述NPN测试电路电性连接;所述PNP调控单元与所述PNP测试电路电性连接。and a main control unit, which is electrically connected to the test fixture; the main control unit includes an NPN control unit and a PNP control unit; the NPN control unit is electrically connected to the NPN test circuit; the PNP control unit is connected to the NPN control unit. The PNP test circuit is electrically connected. 2.根据权利要求1所述的工控机DIO接口的测试装置,其特征在于,所述主控单元还包括软件调试窗口界面,所述软件调试窗口界面包括NPN测试按钮、PNP测试按钮;所述NPN测试按钮与所述NPN调控单元信号连接;所述PNP测试按钮与所述PNP调控单元信号连接。2. the testing device of industrial computer DIO interface according to claim 1, is characterized in that, described main control unit also comprises software debugging window interface, and described software debugging window interface comprises NPN test button, PNP test button; Described The NPN test button is signal-connected with the NPN control unit; the PNP test button is signal-connected with the PNP control unit. 3.根据权利要求2所述的工控机DIO接口的测试装置,其特征在于,所述软件调试窗口界面还包括第一DIO电压写入单元、第二DIO电压写入单元;3. The test device of the industrial computer DIO interface according to claim 2, wherein the software debugging window interface also comprises the first DIO voltage writing unit and the second DIO voltage writing unit; 所述第一DIO电压写入单元位于所述NPN测试按钮位置处,用于为所述NPN测试端口写入电压数据;The first DIO voltage writing unit is located at the position of the NPN test button, and is used for writing voltage data for the NPN test port; 所述第二DIO电压写入单元位于所述PNP测试按钮位置处,用于为所述PNP测试端口写入电压数据。The second DIO voltage writing unit is located at the position of the PNP test button, and is used for writing voltage data for the PNP test port. 4.根据权利要求3所述的工控机DIO接口的测试装置,其特征在于,所述第一DIO电压写入单元包括第一数据写入框、第一数据写入按钮;所述第一数据写入框用于用户设置低电平数值,所述第一数据写入按钮用于用户确认;4. The test device for the DIO interface of an industrial computer according to claim 3, wherein the first DIO voltage writing unit comprises a first data writing frame and a first data writing button; the first data The writing box is used for the user to set the low level value, and the first data writing button is used for the user to confirm; 所述第二DIO电压写入单元包括第二数据写入框、第二数据写入按钮;所述第二数据写入框用于用户设置高电平数值,所述第二数据写入按钮用于用户确认。The second DIO voltage writing unit includes a second data writing box and a second data writing button; the second data writing box is used for the user to set a high level value, and the second data writing button is used for setting a high level value. Confirmed by the user. 5.根据权利要求4所述的工控机DIO接口的测试装置,其特征在于,所述NPN测试电路包括8组所述NPN测试端口和所述NPN状态指示灯;5. the test device of industrial computer DIO interface according to claim 4, is characterized in that, described NPN test circuit comprises 8 groups of described NPN test ports and described NPN state indicator light; 所述PNP测试电路包括8组所述PNP测试端口和所述PNP状态指示灯。The PNP test circuit includes 8 groups of the PNP test ports and the PNP status indicator lights. 6.根据权利要求5所述的工控机DIO接口的测试装置,其特征在于,所述NPN测试电路还包括8个第一分压电阻,分别与8个所述NPN状态指示灯电性连接;6. The test device of the DIO interface of industrial computer according to claim 5, is characterized in that, described NPN test circuit also comprises 8 first voltage divider resistors, and is electrically connected with 8 described NPN status indicator lights respectively; 所述PNP测试电路还包括8个第二分压电阻,分别与8个所述PNP状态指示灯电性连接。The PNP test circuit further includes 8 second voltage dividing resistors, which are respectively electrically connected to the 8 PNP status indicators. 7.根据权利要求4所述的工控机DIO接口的测试装置,其特征在于,所述NPN状态指示灯、所述PNP状态指示灯均为LED指示灯。7 . The testing device for the DIO interface of an industrial computer according to claim 4 , wherein the NPN status indicator and the PNP status indicator are both LED indicators. 8 . 8.根据权利要求4所述的工控机DIO接口的测试装置,其特征在于,所述测试治具还包括12V电源接口、电源指示灯,用于连接电源并显示通电状态。8 . The test device for the DIO interface of an industrial computer according to claim 4 , wherein the test fixture further comprises a 12V power supply interface and a power indicator light for connecting to a power supply and displaying a power-on state. 9 . 9.根据权利要求4所述的工控机DIO接口的测试装置,其特征在于,所述测试治具为手持式测试治具。9 . The test device for the DIO interface of an industrial computer according to claim 4 , wherein the test fixture is a hand-held test fixture. 10 . 10.一种工控机DIO接口的测试方法,其特征在于,基于如上权利要求4-9任一项所述的工控机DIO接口的测试装置,所述方法包括:10. A method for testing an industrial computer DIO interface, characterized in that, based on the test device of the industrial computer DIO interface as claimed in any one of claims 4-9, the method comprises: 步骤A:将所述测试治具与所述工控机待测试的DIO接口电性连接,并接通电源;Step A: electrically connect the test fixture with the DIO interface to be tested on the industrial computer, and turn on the power supply; 步骤B:打开所述软件调试窗口界面,选择NPN测试模式或PNP测试模式;Step B: open the software debugging window interface, select NPN test mode or PNP test mode; 当选择NPN测试模式时,在所述第一数据写入框中写入低电平数值、点击第一数据写入按钮进行确认,并观测所述NPN状态指示灯是否点亮;When selecting the NPN test mode, write a low-level value in the first data write box, click the first data write button to confirm, and observe whether the NPN status indicator light is on; 当选择PNP测试模式时,在所述第二数据写入框中写入高电平数值、点击第二数据写入按钮进行确认,并观测所述PNP状态指示灯是否点亮。When the PNP test mode is selected, write a high-level value in the second data writing box, click the second data writing button to confirm, and observe whether the PNP status indicator light is on.
CN202111127945.6A 2021-09-26 2021-09-26 A test device and test method for DIO interface of industrial computer Pending CN113934194A (en)

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