CN113866539A - Test method, system and test device for voltage sag withstand characteristics of equipment under test - Google Patents
Test method, system and test device for voltage sag withstand characteristics of equipment under test Download PDFInfo
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Abstract
本发明公开了一种待测设备的电压暂降耐受特性测试方法及系统、测试装置。该发明包括：在接收到测试启动信号时，控制晶闸管关断并控制超级电容通过逆变器将输出电压按照预设测试参数进行输出，其中，晶闸管关断后，待测设备处于电压暂降耐受特性的测试状态，晶闸管、超级电容以及逆变器构成测试装置。通过本发明，解决了相关技术中现有模拟电压源体积大、成本高、在现场使用不便捷的问题。
The invention discloses a test method, system and test device for the voltage sag tolerance characteristic of a device to be tested. The invention includes: when receiving a test start signal, controlling the thyristor to turn off and controlling the super capacitor to output the output voltage through the inverter according to preset test parameters, wherein after the thyristor is turned off, the device to be tested is in a voltage sag tolerance Depending on the test state of the characteristics, the thyristor, the super capacitor and the inverter constitute the test device. The invention solves the problems in the related art that the existing analog voltage source is large in size, high in cost and inconvenient to use on site.
Description
Technical Field
The invention relates to the field of power grid testing, in particular to a method, a system and a device for testing voltage sag tolerance characteristics of equipment to be tested.
Background
With the continuous deepening of the domestic industrialization process, the requirements of various electric equipment on the power supply quality are higher and higher, wherein the loss caused by the voltage sag/rise problem of a public power grid accounts for more than 65 percent. Because voltage sag/transient rise occurs randomly in practice, in order to evaluate the tolerance of the electric equipment to the voltage sag/transient rise, a test device capable of simulating the power grid fault is needed, and basic data is provided for equipment manufacturers and power supply departments to ensure safe and reliable operation of the equipment.
The existing testing device is also a load in nature, expected voltage is generated by performing secondary conversion on the voltage of a power grid, but the existing testing device has the defects of high cost, large volume and difficulty in field use, so most of load voltage tolerance characteristic testing tests are performed in a laboratory, and voltage tolerance characteristic data of a plurality of field electric devices in actual use cannot be acquired. The structure of the existing testing device is shown in fig. 1, and the following defects exist: the system is connected between a power grid and equipment in series, and needs to be designed according to a long-term working system, so that the required cost is high; the device is isolated from the power grid, and the fault condition of the power grid cannot be simulated really; the device is generally suitable for laboratory tests, and field tests are difficult to use.
In view of the above problems in the related art, no effective solution has been proposed.
Disclosure of Invention
The invention mainly aims to provide a method, a system and a device for testing voltage sag tolerance characteristics of equipment to be tested, so as to solve the problems that the existing analog voltage source in the related art is large in size, high in cost and inconvenient to use on site.
In order to achieve the above object, according to an aspect of the present invention, there is provided a voltage sag tolerance characteristic test method of a device under test. The invention comprises the following steps: and when a test starting signal is received, the thyristor is controlled to be switched off, the super capacitor is controlled to output the output voltage through the inverter according to preset test parameters, after the thyristor is switched off, the equipment to be tested is in a test state of voltage sag tolerance characteristics, and the thyristor, the super capacitor and the inverter form a test device.
Further, before controlling the thyristor to turn off when the test start signal is received, the method further includes: and determining a preset moment, and sending a test starting signal when the time reaches the preset moment.
Further, before the thyristor is controlled to be turned off and the inverter is controlled to output the voltage of the super capacitor according to preset test parameters when the test start signal is received, the method comprises the following steps: determining preset test parameters, wherein the preset test parameters at least comprise the following test parameters: the amplitude of the output voltage of the super capacitor, the duration of the output voltage, the recovery phase of the output voltage and the delivery form of the output voltage.
Further, before controlling the thyristor to turn off when the test start signal is received, the method further includes: obtaining output voltage, working current of equipment to be tested, inductance value and a plurality of switching frequencies corresponding to the switching tubes, wherein the inductance value is the inductance value corresponding to the inductance of the equipment in the thyristor, and the switching tubes are the switching tubes arranged in the thyristor; and calculating the driving signals of the plurality of switching tubes according to the output voltage, the working current, the inductance value and the plurality of switching frequencies.
In order to achieve the above object, according to another aspect of the present invention, there is provided a voltage sag tolerance characteristic test system of a device under test. The system comprises: the first control unit is used for controlling the thyristor to be switched off and controlling the super capacitor to output the output voltage according to preset test parameters through the inverter when receiving a test starting signal, wherein after the thyristor is switched off, the equipment to be tested is in a test state of voltage sag tolerance characteristics, and the thyristor, the super capacitor and the inverter form a test device.
Further, the system further comprises: the first determining unit is used for determining a preset time before controlling the thyristor to be turned off when the test starting signal is received, and sending the test starting signal when the time reaches the preset time.
In order to achieve the above object, according to another aspect of the present invention, a voltage sag tolerance characteristic testing apparatus of a device under test is provided. The test device includes: one end of the thyristor is connected with a power supply of the equipment to be tested, and the other end of the thyristor is connected with the equipment to be tested and is used for being turned off when a test starting signal is received; the inverter is connected with the thyristor in parallel and used for converting the output voltage of the super capacitor when the thyristor is turned off; and the super capacitor is connected with the inverter and used for outputting output voltage according to preset test parameters.
Furthermore, the thyristor also comprises a plurality of switching tubes and an inductor, and the plurality of switching tubes force the thyristor to be turned off through the driving signal and the inductor.
In order to achieve the above object, according to another aspect of the present application, there is provided a computer-readable storage medium including a stored program, wherein the program performs a method of determining a code generation efficiency evaluation value based on multiple indices of any one of the above.
In order to achieve the above object, according to another aspect of the present application, there is provided a processor for executing a program, wherein the program performs a method of determining a code generation efficiency evaluation value based on multiple indices of any one of the above.
The invention adopts the following steps: when a test starting signal is received, the thyristor is controlled to be turned off, the super capacitor is controlled to output the output voltage through the inverter according to preset test parameters, after the thyristor is turned off, the equipment to be tested is in a test state of voltage sag tolerance characteristics, and the thyristor, the super capacitor and the inverter form a test device, so that the problems that an existing analog voltage source in the related art is large in size, high in cost and inconvenient to use on site are solved. And further, the effects of improving the power supply quality of the power grid and improving the lean management level are achieved.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate an embodiment of the invention and, together with the description, serve to explain the invention and not to limit the invention. In the drawings:
FIG. 1 is a schematic diagram of a prior art testing apparatus;
fig. 2 is a flowchart of a method for testing voltage sag tolerance characteristics of a device under test according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of a testing apparatus according to an embodiment of the present invention;
fig. 4 is a schematic diagram of a voltage sag tolerance characteristic testing system of a device under test according to an embodiment of the present invention;
wherein the following reference numerals are included:
301. a thyristor; 302. an inverter; 303. a super capacitor; 304, mains supply; 305, a device under test.
Detailed Description
It should be noted that the embodiments and features of the embodiments may be combined with each other without conflict. The present invention will be described in detail below with reference to the embodiments with reference to the attached drawings.
In order to make the technical solutions of the present invention better understood, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that the terms "first," "second," and the like in the description and claims of the present invention and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used may be interchanged under appropriate circumstances in order to facilitate the description of the embodiments of the invention herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
According to an embodiment of the invention, a method for testing voltage sag tolerance characteristics of a device to be tested is provided.
Fig. 2 is a flowchart of a method for testing voltage sag tolerance characteristics of a device under test according to an embodiment of the present invention. As shown in fig. 2, the present invention comprises the steps of:
step S201, when a test starting signal is received, the thyristor is controlled to be turned off, the super capacitor is controlled to output the output voltage through the inverter according to preset test parameters, after the thyristor is turned off, the equipment to be tested is in a test state of voltage sag tolerance characteristics, and the thyristor, the super capacitor and the inverter form a test device.
The application provides a test device for voltage sag tolerance characteristics, a specific schematic diagram is shown in fig. 3, the test device specifically includes a thyristor, an inverter and a super capacitor, the bidirectional antiparallel thyristor is used as a state control switch to switch between a mains supply and the inverter for power supply, the test device and a device to be tested are connected in parallel in a power grid, and the super capacitor is used as an energy storage medium in the test device to meet the requirement of instantaneous high-power output; the device is designed according to short-time work, and the cost is lower; the modular cascade application meets the mobility requirement of field test.
Meanwhile, the testing device is in a standby state at ordinary times, and enters the testing device when receiving the testing starting signal.
Further, the test device is characterized in that: the volume is small, the field test requirement of dozens of times can be met under the full-state of the stored energy, and the voltage sag phenomenon is improved to a certain extent.
The testing device provided by the application adopts a topological structure, the power module, the energy storage module and the power distribution module are separated and used in a cascading manner, and the field application is facilitated, wherein the energy storage module adopts a super capacitor as an energy medium; the thyristor of 2ms is quickly turned off; when the power supply is switched from the inversion power supply (test is carried out) to the commercial power supply (test is finished), the parameters can be set, wherein the amplitude precision of the output voltage is 1V, and the phase precision is 5 degrees; the weight of each module at a rated power of 50kVA is not more than 50 kg; the modules are connected by adopting quick plugging terminals.
In an optional example, before controlling the thyristor to turn off when the test enable signal is received, the method further comprises: and determining a preset moment, and sending a test starting signal when the time reaches the preset moment.
In an optional example, before controlling the thyristor to turn off and controlling the inverter to output the voltage to the super capacitor according to preset test parameters when receiving the test start signal, the method includes: determining preset test parameters, wherein the preset test parameters at least comprise the following test parameters: the amplitude of the output voltage of the super capacitor, the duration of the output voltage, the recovery phase of the output voltage and the delivery form of the output voltage.
In the above, according to the test requirement, setting the expected sag/swell test parameters on the human-computer interface specifically includes: the method comprises the following steps of outputting a voltage amplitude U of the super capacitor, testing a starting moment T, testing duration T, a recovery phase phi of the output voltage and an output form of the output voltage: single-phase or three-phase (n ═ 1,3), etc., where the device under test is in a ramp-down/ramp-up state for the test duration T.
The specific test process comprises the following steps: during the normal power supply of the commercial power, starting from the time T0, the testing device is started, the thyristor is turned off, meanwhile, the testing device is enabled to output the set voltage for the duration T, and then the power supply of the commercial power is recovered to the time T1. And testing the voltage sag tolerance of the device to be tested within the duration T.
In an optional example, before controlling the thyristor to turn off when the test enable signal is received, the method further comprises: obtaining output voltage, working current of equipment to be tested, inductance value and a plurality of switching frequencies corresponding to the switching tubes, wherein the inductance value is the inductance value corresponding to the inductance of the equipment in the thyristor, and the switching tubes are the switching tubes arranged in the thyristor; and calculating the driving signals of the plurality of switching tubes according to the output voltage, the working current, the inductance value and the plurality of switching frequencies.
The inside of the testing device is of a standard three-phase inversion topological structure, and the direct current bus adopts the super capacitor as an energy storage medium. The inverted alternating current output is processed by a low-pass filter to obtain a voltage ur，urAnd usActing on inductor L to generate inductor current iL. Wherein u issAnd outputting voltage for the device. When the thyristor is on (not started test), usEqual to the grid voltage;
at the start of the test, usEqual to the expected voltage. The three satisfy the following relations:
in the above relationship: Δ iLThe current transformer is used for sampling and obtaining the working current of the load. When the on-off state of the thyristor is switched, the current sampling value of the previous moment can be used; the inductor L forces the thyristor to be turned off; u. ofsWaiting for the grid voltage or command value (human-machine interface input); l is an inductance design value; the integration time dt is equal to the inverse of the switching frequency, 50 us. This gives:
ur＝us-LdiL/dt (2)
the driving signal u of the switching tube Q1-Q6 can be obtainedr *。
In the related art, only the inductor L is considered to work in a steady state, and the inductor L in the present application needs to consider that enough energy can be output in a dynamic (state transition instant) process to force the thyristor to turn off. The tolerance test on the low-voltage electric equipment is not limited in a laboratory any more, the advantages of small size and mobility can be conveniently used for carrying out the tolerance test on the high-power electric equipment in an actual scene, and the tolerance test method has positive effects on obtaining actual electric load characteristic data, improving power supply quality of a power grid and improving lean management level.
Specifically, the inductance L needs to consider that a large enough energy can be output in a dynamic (state transition instant) process to force the thyristor to turn off; the thyristor not only has the rectifying function of single-phase conduction, but also has the function of controlling the positioning switch, can control larger power by using tiny power, and can be turned off within 2ms by using the rapid turn-off technology of the thyristor; the super capacitor provides rapid energy release to meet the requirement of high power, so that the fuel cell can be only used as an energy source; the inverter converts DC12V DC into AC220V AC which is the same as the commercial power and is used by common electrical appliances, is a convenient power converter, adopts super capacitor as energy storage medium, has long service life, can be charged and discharged rapidly, and is suitable for mobile equipment.
According to the voltage sag tolerance characteristic testing method of the equipment to be tested, provided by the embodiment of the invention, when a test starting signal is received, the thyristor is controlled to be switched off, the super capacitor is controlled to output the output voltage according to the preset test parameters through the inverter, the equipment to be tested is in the test state of the voltage sag tolerance characteristic after the thyristor is switched off, and the thyristor, the super capacitor and the inverter form a testing device, so that the problems that the conventional analog voltage source in the related art is large in size, high in cost and inconvenient to use on site are solved. And further, the effects of improving the power supply quality of the power grid and improving the lean management level are achieved.
Fig. 3 is a schematic diagram of a testing apparatus according to an embodiment of the present invention. As shown in fig. 3, the test apparatus includes: one end of the thyristor 301 is connected with a power supply of the equipment to be tested, and the other end of the thyristor is connected with the equipment to be tested and is used for being turned off when a test starting signal is received; the inverter 302 is connected with the thyristor in parallel and used for converting the output voltage of the super capacitor when the thyristor is turned off; and the super capacitor 303 is connected with the inverter and used for outputting output voltage according to preset test parameters.
In an alternative example, the thyristor 301 further includes a plurality of switching tubes and an inductor, and the plurality of switching tubes force the thyristor 301 to turn off through the driving signal and the inductor.
It should be noted that the steps illustrated in the flowcharts of the figures may be performed in a computer system such as a set of computer-executable instructions and that, although a logical order is illustrated in the flowcharts, in some cases, the steps illustrated or described may be performed in an order different than presented herein.
The embodiment of the present invention further provides a voltage sag tolerance characteristic testing system of a device to be tested, and it should be noted that the voltage sag tolerance characteristic testing system of the device to be tested according to the embodiment of the present invention may be used to execute the voltage sag tolerance characteristic testing method for a device to be tested according to the embodiment of the present invention. The following describes a voltage sag tolerance characteristic testing system of a device under test according to an embodiment of the present invention.
Fig. 4 is a schematic diagram of a voltage sag tolerance characteristic testing system of a device under test according to an embodiment of the invention. As shown in fig. 4, the system includes: the first control unit 401 is configured to control the thyristor to be turned off and control the super capacitor to output the output voltage according to preset test parameters through the inverter when the test start signal is received, where after the thyristor is turned off, the device to be tested is in a test state of voltage sag tolerance characteristics, and the thyristor, the super capacitor, and the inverter constitute a test system.
In an optional example, the system further comprises: the first determining unit is used for determining a preset time before controlling the thyristor to be turned off when the test starting signal is received, and sending the test starting signal when the time reaches the preset time.
In an alternative example, the system includes: the second determining unit is used for determining preset test parameters before controlling the thyristor to be switched off and controlling the inverter to output the voltage to the super capacitor according to the preset test parameters when receiving the test starting signal, wherein the preset test parameters at least comprise the following test parameters: the amplitude of the output voltage of the super capacitor, the duration of the output voltage, the recovery phase of the output voltage and the delivery form of the output voltage.
In an optional example, the system further comprises: the thyristor switching device comprises an acquisition unit, a control unit and a switching unit, wherein the acquisition unit is used for acquiring output voltage, working current and inductance of equipment to be tested and a plurality of switching frequencies corresponding to switching tubes before controlling the thyristor to be switched off when receiving a test starting signal, the inductance is the inductance corresponding to the inductance of the equipment in the thyristor, and the switching tubes are the switching tubes arranged in the thyristor; and the calculating unit is used for calculating the driving signals of the plurality of switching tubes according to the output voltage, the working current, the inductance value and the plurality of switching frequencies.
According to the voltage sag tolerance characteristic testing method and system for the equipment to be tested, provided by the embodiment of the invention, when a test starting signal is received, the thyristor is controlled to be turned off, the super capacitor is controlled to output the output voltage according to the preset test parameters through the inverter, after the thyristor is turned off, the equipment to be tested is in the test state of the voltage sag tolerance characteristic, and the thyristor, the super capacitor and the inverter form the testing system, so that the problems that the existing analog voltage source in the related art is large in size, high in cost and inconvenient to use on site are solved, and the effects of improving the power supply quality of a power grid and improving the lean management level are further achieved.
The voltage sag tolerance characteristic testing system of the device to be tested comprises a processor and a memory, wherein the first control unit 401 and the like are stored in the memory as program units, and the processor executes the program units stored in the memory to realize corresponding functions.
The processor comprises a kernel, and the kernel calls the corresponding program unit from the memory. The kernel can be set to be one or more than one, and the problems that the existing analog voltage source in the related technology is large in size, high in cost and inconvenient to use on site are solved by adjusting kernel test parameters.
The memory may include volatile memory in a computer readable medium, Random Access Memory (RAM) and/or nonvolatile memory such as Read Only Memory (ROM) or flash memory (flash RAM), and the memory includes at least one memory chip.
The embodiment of the invention provides a computer-readable storage medium, wherein a program is stored on the computer-readable storage medium, and when the program is executed by a processor, the method for testing the voltage sag tolerance characteristics of the device to be tested is realized.
The embodiment of the invention provides a processor, which is used for running a program, wherein the method for testing the voltage sag tolerance characteristics of equipment to be tested is executed when the program runs.
An embodiment of the present invention provides an apparatus, where the apparatus includes a processor, a computer-readable storage medium, and a program stored on the computer-readable storage medium and executable on the processor, and when the processor executes the program, the following steps are implemented: and when a test starting signal is received, the thyristor is controlled to be switched off, the super capacitor is controlled to output the output voltage through the inverter according to preset test parameters, after the thyristor is switched off, the equipment to be tested is in a test state of voltage sag tolerance characteristics, and the thyristor, the super capacitor and the inverter form a test device.
In an optional example, before controlling the thyristor to turn off when the test enable signal is received, the method further comprises: and determining a preset moment, and sending a test starting signal when the time reaches the preset moment.
In an optional example, before controlling the thyristor to turn off and controlling the inverter to output the voltage to the super capacitor according to preset test parameters when receiving the test start signal, the method includes: determining preset test parameters, wherein the preset test parameters at least comprise the following test parameters: the amplitude of the output voltage of the super capacitor, the duration of the output voltage, the recovery phase of the output voltage and the delivery form of the output voltage.
In an optional example, before controlling the thyristor to turn off when the test enable signal is received, the method further comprises: obtaining output voltage, working current of equipment to be tested, inductance value and a plurality of switching frequencies corresponding to the switching tubes, wherein the inductance value is the inductance value corresponding to the inductance of the equipment in the thyristor, and the switching tubes are the switching tubes arranged in the thyristor; and calculating the driving signals of the plurality of switching tubes according to the output voltage, the working current, the inductance value and the plurality of switching frequencies.
The device herein may be a server, a PC, a PAD, a mobile phone, etc.
The invention also provides a computer program product adapted to perform a program for initializing the following method steps when executed on a data processing device: and when a test starting signal is received, the thyristor is controlled to be switched off, the super capacitor is controlled to output the output voltage through the inverter according to preset test parameters, after the thyristor is switched off, the equipment to be tested is in a test state of voltage sag tolerance characteristics, and the thyristor, the super capacitor and the inverter form a test device.
In an optional example, before controlling the thyristor to turn off when the test enable signal is received, the method further comprises: and determining a preset moment, and sending a test starting signal when the time reaches the preset moment.
In an optional example, before controlling the thyristor to turn off and controlling the inverter to output the voltage to the super capacitor according to preset test parameters when receiving the test start signal, the method includes: determining preset test parameters, wherein the preset test parameters at least comprise the following test parameters: the amplitude of the output voltage of the super capacitor, the duration of the output voltage, the recovery phase of the output voltage and the delivery form of the output voltage.
In an optional example, before controlling the thyristor to turn off when the test enable signal is received, the method further comprises: obtaining output voltage, working current of equipment to be tested, inductance value and a plurality of switching frequencies corresponding to the switching tubes, wherein the inductance value is the inductance value corresponding to the inductance of the equipment in the thyristor, and the switching tubes are the switching tubes arranged in the thyristor; and calculating the driving signals of the plurality of switching tubes according to the output voltage, the working current, the inductance value and the plurality of switching frequencies.
As will be appreciated by one skilled in the art, embodiments of the present invention may be provided as a method, system, or computer program product. Accordingly, the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present invention may take the form of a computer program product embodied on one or more computer-usable computer-readable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The present invention is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the invention. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
In a typical configuration, a computing device includes one or more processors (CPUs), input/output interfaces, network interfaces, and memory.
The memory may include forms of volatile memory in a computer readable medium, Random Access Memory (RAM) and/or non-volatile memory, such as Read Only Memory (ROM) or flash memory (flash RAM). The memory is an example of a computer-readable medium.
Computer-readable media, including both non-transitory and non-transitory, removable and non-removable media, may implement information storage by any method or technology. The information may be computer readable instructions, data structures, modules of a program, or other data. Examples of the computer-readable storage medium of the computer include, but are not limited to, a phase change memory (PRAM), a Static Random Access Memory (SRAM), a Dynamic Random Access Memory (DRAM), other types of Random Access Memories (RAM), a Read Only Memory (ROM), an electrically erasable programmable read only memory (eeprom) (which, upon receiving a test start signal, controls a thyristor to be turned off and controls a super capacitor to output an output voltage according to preset test parameters through an inverter, wherein, after the thyristor is turned off, the device under test is in a test state of voltage sag tolerance characteristics, and the thyristor, the super capacitor, and the inverter constitute a test apparatus, and upon receiving the test start signal, controls the thyristor to be turned off and controls the super capacitor to output the output voltage according to the preset test parameters through the inverter, wherein, after the thyristor is turned off, the device under test is in a test state of voltage sag tolerance characteristics, the thyristor, the super capacitor and the inverter form a testing device. PROM), flash memory or other memory technology, compact disc read only memory (CD-ROM), Digital Versatile Disc (DVD) or other optical storage, magnetic cassettes, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other non-transmission medium, which can be used to store information that can be accessed by a computing device. As defined herein, the computer readable medium does not include a temporary storage computer readable medium (transient m, when receiving a test start signal, controls the thyristor to turn off and controls the super capacitor to output the output voltage according to preset test parameters through the inverter, wherein after the thyristor is turned off, the device under test is in a test state of voltage sag tolerance characteristics, and the thyristor, the super capacitor and the inverter constitute a test device.
It should also be noted that the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in the process, method, article, or apparatus that comprises the element.
As will be appreciated by one skilled in the art, embodiments of the present invention may be provided as a method, system, or computer program product. Accordingly, the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present invention may take the form of a computer program product embodied on one or more computer-usable computer-readable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The above are merely examples of the present invention, and are not intended to limit the present invention. Various modifications and alterations to this invention will become apparent to those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention should be included in the scope of the claims of the present invention.
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