CN113820576A - Method and device for testing light-emitting diode device - Google Patents
Method and device for testing light-emitting diode device Download PDFInfo
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- CN113820576A CN113820576A CN202010555755.3A CN202010555755A CN113820576A CN 113820576 A CN113820576 A CN 113820576A CN 202010555755 A CN202010555755 A CN 202010555755A CN 113820576 A CN113820576 A CN 113820576A
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Abstract
The application provides a method and a device for testing a light emitting diode device, which relate to the technical field of semiconductor photoelectricity, wherein the method comprises the steps of obtaining a first image of the light emitting diode device and a first brightness of the light emitting diode device, driving the light emitting diode device, obtaining a second image of the light emitting diode device, and determining the second brightness of the light emitting diode device based on the first brightness, the first image and the second image. The technical scheme provided by the application can improve the accuracy of measuring the brightness of the light-emitting diode device.
Description
Technical Field
The present disclosure relates to the field of semiconductor optoelectronic technologies, and in particular, to a method and an apparatus for testing a light emitting diode device.
Background
With the continuous development of semiconductor optoelectronic technology, various Light Emitting Diode (LED) devices are widely used. Luminance is an important parameter for led devices, and therefore, the luminance of led devices is usually tested during testing and use.
In the prior art, when a light emitting diode device is driven, the luminance of a certain area of the light emitting diode device can be directly read by a luminance meter to be used as the luminance of the light emitting diode device.
However, due to the influence of factors such as the device structure and the manufacturing process of the led device, the luminance of the led is not uniform when the led emits light, and thus the luminance read by the prior art is difficult to accurately represent the actual luminance of the led device.
Disclosure of Invention
In view of the above, the present application provides a method and an apparatus for testing a light emitting diode device to improve the accuracy of measuring the brightness.
In order to achieve the purpose, the following technical scheme is adopted in the application:
in a first aspect, an embodiment of the present application provides a method for testing a photodiode device, including:
obtaining a first image of a light emitting diode device and a first brightness of the light emitting diode device;
driving the light emitting diode device to obtain a second image of the light emitting diode device;
determining a second brightness of the light emitting diode device based on the first brightness, the first image, and the second image.
Optionally, the first brightness is a brightness of the light emitting diode device at a preset position, and the second brightness is an average brightness of the light emitting diode device.
Optionally, the obtaining a first image of a light emitting diode device and a first brightness of the light emitting diode device includes:
acquiring the first image and the first brightness under the condition of current external illumination and no driving of the light emitting diode device;
the driving the light emitting diode device includes:
keeping the current external lighting condition unchanged and driving the light emitting diode device.
Optionally, the determining a second brightness of the light emitting diode device based on the first brightness, the first image, and the second image comprises:
and determining the second brightness based on the first brightness, the pixel characteristic of the first image at the preset position and the pixel characteristic of the second image.
Optionally, the first image and the second image comprise grey scale maps, and the pixel features comprise grey scale values;
the determining the second brightness based on the first brightness, the pixel feature of the first image at the preset position, and the pixel feature of the second image comprises:
determining a gray value of the first image at the preset position;
and determining the second brightness based on the first brightness, the gray value of the first image at the preset position and the gray value of the second image.
Optionally, the determining the second brightness based on the first brightness, the gray-scale value of the first image at the preset position, and the gray-scale value of the second image includes:
determining a brightness distribution of the light emitting diode device in the second image based on the first brightness, the gray-scale value of the first image at the preset position and the gray-scale value distribution of the second image;
determining the second brightness based on a brightness distribution of the light emitting diode device in the second image.
Optionally, the determining the second brightness based on the first brightness, the gray-scale value of the first image at the preset position, and the gray-scale value of the second image includes:
determining an average gray value of the second image based on the gray value distribution of the second image;
and determining the brightness corresponding to the average gray value of the second image based on the first brightness and the gray value of the first image at the preset position, and determining the brightness corresponding to the average gray value as the second brightness.
Optionally, the determining the second brightness based on the first brightness, the gray-scale value of the first image at the preset position, and the gray-scale value of the second image includes:
determining the gray value of the first image at the preset position as a gray value threshold;
acquiring gray value distribution of the second image larger than the gray value threshold;
and determining the second brightness based on the first brightness, the gray value of the first image at the preset position and the gray value distribution of the second image larger than the threshold of the gray value.
Optionally, the preset position is a geometric center of the first image.
Optionally, before the driving the light emitting diode device, the method further includes:
and pre-burning the light emitting diode device.
Optionally, the method further comprises:
determining the second brightness as a starting brightness;
and measuring the time length consumed by the light-emitting diode device to reduce the initial brightness to the preset brightness, and determining the time length as the service life of the light-emitting diode device.
Optionally, the illumination intensity of the current external illumination condition is greater than 0, further including:
determining an actual, supposed light-emitting area of the light-emitting diode device based on pixel characteristics of the first image;
the driving the light emitting diode device includes:
determining a test current input to the light emitting diode device based on the actual light emitting area and a preset current density;
driving the light emitting diode device based on the test current.
Optionally, the determining an actual area of the light emitting diode device that should emit light based on the pixel characteristics of the first image includes:
performing edge detection on the first image, and determining the number of pixels corresponding to the actual light-emitting area of the light-emitting diode device in the first image;
and determining the actual area to be illuminated based on the number of pixels and a preset mapping relation, wherein the preset mapping relation is used for indicating the area of the light emitting diode device corresponding to each pixel in the first image.
In a second aspect, an embodiment of the present application provides an apparatus for testing a light emitting diode device, including:
an obtaining module for obtaining a first image of a light emitting diode device and a first brightness of the light emitting diode device; driving the light emitting diode device to obtain a second image of the light emitting diode device;
a determination module to determine a second brightness of the light emitting diode device based on the first brightness, the first image, and the second image.
Optionally, the first brightness is a brightness of the light emitting diode device at a preset position, and the second brightness is an average brightness of the light emitting diode device.
Optionally, the obtaining module is further configured to:
acquiring the first image and the first brightness under the condition of current external illumination and no driving of the light emitting diode device;
keeping the current external lighting condition unchanged and driving the light emitting diode device.
Optionally, the determining module is further configured to:
and determining the second brightness based on the first brightness, the pixel characteristic of the first image at the preset position and the pixel characteristic of the second image.
Optionally, the first image and the second image comprise grey scale maps, and the pixel features comprise grey scale values;
the determination module is further to:
determining a gray value of the first image at the preset position;
and determining the second brightness based on the first brightness, the gray value of the first image at the preset position and the gray value of the second image.
Optionally, the determining module is further configured to:
determining a brightness distribution of the light emitting diode device in the second image based on the first brightness, the gray-scale value of the first image at the preset position and the gray-scale value distribution of the second image;
determining the second brightness based on a brightness distribution of the light emitting diode device in the second image.
Optionally, the determining module is further configured to:
determining an average gray value of the second image based on the gray value distribution of the second image;
and determining the brightness corresponding to the average gray value of the second image based on the first brightness and the gray value of the first image at the preset position, and determining the brightness corresponding to the average gray value as the second brightness.
Optionally, the determining module is further configured to:
determining the gray value of the first image at the preset position as a gray value threshold;
acquiring gray value distribution of the second image larger than the gray value threshold;
and determining the second brightness based on the first brightness, the gray value of the first image at the preset position and the gray value distribution of the second image larger than the threshold of the gray value.
Optionally, the preset position is a geometric center of the first image.
Optionally, the method further comprises:
and the pre-burning module is used for pre-burning the light emitting diode device.
Optionally, the determining module is further configured to determine the second brightness as a starting brightness;
further comprising:
and the measuring module is used for measuring the time length consumed by the light-emitting diode device for reducing the initial brightness to the preset brightness, and determining the time length as the service life of the light-emitting diode device.
Optionally, the illumination intensity of the current external illumination condition is greater than 0, and the determining module is further configured to determine an actual area of the light emitting diode device that should emit light based on the pixel characteristics of the first image;
the acquisition module is further configured to:
determining a test current input to the light emitting diode device based on the actual light emitting area and a preset current density;
driving the light emitting diode device based on the test current.
Optionally, the determining module is further configured to:
performing edge detection on the first image, and determining the number of pixels corresponding to the actual light-emitting area of the light-emitting diode device in the first image;
and determining the actual area to be illuminated based on the number of pixels and a preset mapping relation, wherein the preset mapping relation is used for indicating the area of the light emitting diode device corresponding to each pixel in the first image.
In a third aspect, an embodiment of the present application provides a computing device, including: a memory for storing a computer program and a processor; the processor is configured to perform the method of the first aspect or any of the embodiments of the first aspect when the computer program is invoked.
In a fourth aspect, the present application provides a computer-readable storage medium, on which a computer program is stored, where the computer program, when executed by a processor, implements the method according to the first aspect or any embodiment of the first aspect.
In a fifth aspect, embodiments of the present application provide a computer program product, which when run on a computing device, causes the computing device to perform any one of the above-mentioned first aspects.
In the embodiment of the present application, a first image and a first luminance of the light emitting diode device may be obtained, and then the light emitting diode device is driven to obtain a second image of the light emitting diode device, so that the second luminance of the light emitting diode device may be determined according to the second image under the condition of driving the light emitting diode device with the first image and the first luminance as references. Compared with the mode of acquiring the brightness of the light-emitting diode device at a certain position to represent the actual brightness of the light-emitting diode device, the accuracy of acquiring the brightness of the light-emitting diode device is obviously improved.
Drawings
Fig. 1 is a flowchart of a method for testing a light emitting diode device according to an embodiment of the present disclosure;
fig. 2 is an image of a light emitting diode device provided in an embodiment of the present application;
FIG. 3 is an image of another LED device provided in an embodiment of the present application;
FIG. 4 is an image of another LED device provided in an embodiment of the present application;
FIG. 5 is an image of another LED device provided in an embodiment of the present application;
fig. 6 is a schematic structural diagram of an apparatus for testing a light emitting diode device according to an embodiment of the present disclosure.
Detailed Description
In the following description, for purposes of explanation and not limitation, specific details are set forth, such as particular system structures, techniques, etc. in order to provide a thorough understanding of the embodiments of the present application. It will be apparent, however, to one skilled in the art that the present application may be practiced in other embodiments that depart from these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.
In order to facilitate understanding of the technical solutions in the embodiments of the present application, an application scenario of the embodiments of the present application is first described below.
The Light Emitting Diode device may include Quantum Dot Light Emitting Diode (QLED) devices, Organic Light-Emitting Diode (OLED) devices, and the like according to a Light Emitting principle; devices of the structure of upright bottom emission, upright top emission, inverted bottom emission, inverted top emission and the like can be included according to the device structure.
The manufacturing process of the light-emitting diode device with the positive bottom emission structure comprises the following steps of firstly depositing a hole injection layer on a transparent anode substrate, then depositing a hole transport layer on the hole injection layer, then depositing a quantum dot light-emitting layer on the hole transport layer, then depositing an oxide electron transport layer on the quantum dot light-emitting layer, and finally depositing a metal cathode on the electron transport layer, wherein the reflection of the cathode to visible light is not lower than 98%; the manufacturing process of the light emitting diode device with the positive top emission structure can comprise the steps of firstly depositing a hole injection layer on a transparent anode substrate, then depositing a hole transport layer on the hole injection layer, and then depositing a quantum dot light emitting layer on the hole transport layer; then depositing an oxide electron transmission layer on the quantum dot light-emitting layer, and finally depositing a cathode on the electron transmission layer, wherein the transmission of the cathode to visible light is not lower than 90%; the manufacturing process of the light-emitting diode device with the inverted bottom emission structure can comprise the steps of firstly depositing an electron transport layer on a cathode substrate, then depositing a quantum dot light-emitting layer on the electron transport layer, then depositing a hole transport layer on the quantum dot light-emitting layer, then depositing a hole injection layer on the hole transport layer, and finally depositing a metal anode on the hole injection layer, wherein the reflection of the anode to visible light is not lower than 98%; the manufacturing process of the light emitting diode device with the inverted top emission structure and the like can comprise the steps of firstly depositing an electron transport layer on a cathode substrate, then depositing a quantum dot light emitting layer on the electron transport layer, then depositing a hole transport layer on the quantum dot light emitting layer, then depositing a hole injection layer on the hole transport layer, and finally depositing an anode on the hole injection layer, wherein the transmission of visible light of the anode is not lower than 90%.
During testing or using the led device, it is usually necessary to measure the brightness of the led device, and the brightness of a certain position of the led device can be read by a brightness meter to represent the brightness of the led device. However, as can be seen from the above description, the led devices may have different structures based on different manufacturing processes, which may cause the led devices with different structures to emit light with different uniformity, and the luminance at a certain position of the led device is no longer representative, so the accuracy of the luminance of the led device is low.
To solve the technical problem, the present application provides a system for testing a light emitting diode device, which may include a testing device and a computing device communicatively connected. The test device may be used to provide a hardware environment for testing the light emitting diode device, such as a recess for placing the light emitting diode device, a contact for providing a test voltage to the light emitting diode device, etc., and may include an integrating sphere measurement device, a silicon photodiode measurement device, or other types of test devices. The computing device may be used to provide a software environment for testing the light emitting diode device, such as setting a test voltage and performing related data calculations, etc.
An image sensor, such as a Charge-coupled Device (CCD) or a Complementary Metal Oxide Semiconductor (CMOS), may be disposed in the test Device at a position opposite to the led test Device, so as to obtain an image of the led when emitting light, and determine a light emitting area of the led and an area of the light emitting area. Of course, in practical applications, the actual light emitting area of the light emitting diode device may be determined in other manners.
It should be noted that the computing device may include a Mobile phone, a tablet Computer, a wearable device, an in-vehicle device, a notebook Computer, an Ultra-Mobile Personal Computer (UMPC), a netbook, a Personal Digital Assistant (PDA), and other devices with data computing capability, and the embodiment of the present application does not limit the specific type of the computing device.
It should also be noted that, in practical applications, the test device may also be integrated with the computing device.
The method for testing the light-emitting diode device can be applied to computing equipment in the test system. The first image and the first brightness of the light emitting diode device can be obtained, and then the light emitting diode device is driven to obtain the second image of the light emitting diode device, so that the second brightness of the light emitting diode device can be determined according to the second image under the condition that the light emitting diode device is driven by taking the first image and the first brightness as references. Compared with the mode of acquiring the brightness of the light-emitting diode device at a certain position to represent the actual brightness of the light-emitting diode device, the accuracy of acquiring the brightness of the light-emitting diode device is obviously improved.
The present application will be specifically described below with reference to the above application scenarios. The following several specific embodiments may be combined with each other, and details of the same or similar concepts or processes may not be repeated in some embodiments.
Fig. 1 is a flowchart illustrating a method for testing a light emitting diode device according to an embodiment of the present disclosure. It should be noted that the method is not limited by the specific sequence shown in fig. 1 and described below, and it should be understood that in other embodiments, the sequence of some steps in the method may be interchanged according to actual needs, or some steps may be omitted or deleted. The method comprises the following steps:
The light emitting diode device to be tested, the test device, and the computing device may be prepared, such as connecting the test device and the computing device, placing the light emitting diode device within the test device, opening a test interface in the computing device, and so on.
In order to ensure that the light emitting diode device can normally emit light, the light emitting diode device may be burned in.
The burn-in may refer to an operation of inputting a first designated voltage or a designated current to the light emitting diode device for a first preset time period before the light emitting diode device normally emits light.
It should be noted that the first specific voltage, the specific current, or the first preset time period may be determined based on the measured luminescent material of the light emitting diode device.
For example, for a blue light quantum dot device, a specified current of 2mA (milliampere) may be input to the blue light quantum dot device (i.e., a quantum dot light emitting diode device of a blue light emitting material) for 2 minutes, so as to pre-light the blue light quantum dot device until the light emitting area of the blue light quantum dot device does not change visually; for a green quantum dot device, a specified current of 2mA may be input to the green quantum dot device for 5 minutes until no visible change occurs in its light emitting area. For a red light quantum dot device, a specified current of 2mA may be input to the red light quantum dot device for 8 minutes until no visible change occurs in the light emitting area.
And 103, acquiring the light-emitting spectrum of the light-emitting diode device, and determining that the light-emitting diode device emits light normally based on the light-emitting spectrum.
In order to ensure that the light emitting diode device can normally emit light and to ensure that the test device can normally detect the light emitting diode device, the light emitting spectrum of the light emitting diode device can be obtained.
The second specified voltage can be input into the light emitting diode device and continuously kept for a second preset time, the light emitting spectrum of the light emitting diode device is detected through the testing device, and when the light emitting spectrum is not smooth, the second specified voltage and the second preset time can be adjusted until the light emitting spectrum is smooth. If the light emitting spectrum of the light emitting diode device can be detected through the test device, the light emitting spectrum is smooth, and the peak is in the range of the preset peak, the light emitting diode device can be determined to be normally emitted, and meanwhile, the test device can be determined to be capable of normally detecting the light emitting diode device.
It should be noted that the second specified voltage, the second preset time duration and the preset peak range may be determined in advance based on the tested light emitting diode device, taking a blue light quantum dot device as an example, the second specified voltage may be 4 volts, the second preset time duration may be 100 milliseconds, and the corresponding preset peak range may be between 450-.
It should be noted that, in practical applications, at least one of the steps 101 and 103 may be omitted, for example, after the step 101 is executed once, a plurality of tests on the light emitting diode device may be performed, and in the case of performing continuous tests on the same light emitting diode device, the step 102 may not be repeatedly executed to perform the burn-in, or in the case of determining that the light emitting diode device and the test device are normal through other methods, the step 103 may be omitted.
In order to facilitate comparison of the light emitting diode devices before and after driving under the same external illumination condition subsequently, the influence of external illumination possibly on light emitting of the light emitting diode devices in a test environment is reduced, so that the accuracy of determining the brightness of the light emitting diode devices is improved, and a first image and a first brightness of the light emitting diode devices can be obtained under the condition that the light emitting diode devices are not driven under the current external illumination.
Since the led device is placed in the testing device for testing, the current lighting condition may be a closed dark environment without light, or may include light from other external light sources, such as sunlight or light. And the interference with determining the brightness of the diode device is smaller as the illumination intensity of the external illumination condition is smaller.
The first image may include a gray scale image or a color image.
Alternatively, the first brightness may be a brightness of the light emitting diode device at a preset position.
It should be noted that the preset position may be obtained by setting in advance, for example, since the center of the led device usually will emit light, the preset position may be the geometric center of the first image, so as to be convenient for determining the brightness of the led device when being driven by using the preset position as a reference.
Wherein the computing device may acquire a first image of the light emitting diode device through an image sensor (such as a CCD) provided in the test device and read the brightness of the preset position through a brightness meter. Alternatively, in other embodiments, the computing device may retrieve the stored first image and the brightness of the preset location from the memory.
Of course, in practical applications, the first brightness may also be a brightness of any position of the light emitting diode device, or the first brightness may also be an average brightness of all or part of the actual light emitting areas of the light emitting diode device when the first image is acquired.
In addition, in another possible implementation manner, the first image and the first brightness may be obtained under other lighting conditions and driving conditions, for example, the first image and the first brightness may be obtained under a specific external lighting condition and without driving the light emitting diode device.
And 105, keeping the current external illumination condition unchanged, driving the light-emitting diode device, and acquiring a second image of the light-emitting diode device.
After step 104 is performed, the test environment may be kept unchanged, and a test voltage may be input to the light emitting diode device to drive the light emitting diode device, and then a second image of the light emitting diode device may be acquired. That is, the difference between step 104 and step 105 may be only whether the light emitting diode device is driven.
It should be noted that the purpose of keeping the current external illumination condition unchanged and driving the light emitting diode device is to reduce the interference of the external illumination on the measurement of the brightness of the light emitting diode device as much as possible, and to further improve the accuracy of the measurement of the brightness. In practical applications, the external lighting condition may be ignored, or the measured brightness may be corrected during subsequent processing according to the external lighting condition.
It should be noted that the second image may be acquired in the same manner as the first image, and the image type of the second image may also be the same as the first image, and for example, may include at least one of a grayscale image and a color image.
Alternatively, a test current input to the light emitting diode device may be determined based on the actual light emitting area and the preset current density, and the light emitting diode device may be driven based on the test current.
Since the light emitting diode device should be referred to when testing the light emitting diode device (for example, calculating the current density). Although a theoretical light-emitting area is designed when designing the light-emitting diode device, in an actual manufacturing process, the light-emitting material may not completely cover the light-emitting layer, for example, a region where burrs or irregularities may occur at the edge of the electrode, resulting in an actual light-emitting area smaller than the designed theoretical light-emitting area. Therefore, in order to accurately control the test current for driving the light emitting diode device, thereby improving the accuracy and reliability of the test of the light emitting diode device, the actual light emitting area of the light emitting diode device can be determined.
It should be noted that the actual light-emitting area may be an area actually covered by the light-emitting material in the light-emitting layer of the light-emitting diode device, that is, an area of the light-emitting diode device actually having light-emitting capability.
When the illumination intensity of the external illumination condition in which the first image is acquired is greater than 0 in the foregoing, the actual light-emitting area of the light-emitting diode device may be determined based on the pixel characteristics of the first image. When the illumination intensity of the external illumination condition for acquiring the first image is equal to 0, the undriven light emitting diode device may be photographed by a white light camera to obtain a third image (the external illumination condition for acquiring the third image may be different from the external illumination condition for acquiring the second image), and then based on the pixel characteristics of the third image, the third image is subjected to edge detection to obtain an actual light-emitting area, where the white light camera may acquire a color image of the photographed object by supplementing a white light source.
For example, as shown in fig. 2, it can be seen from fig. 2 that there is a black stripe-shaped region at the edge of the upper left corner of the light emitting diode device, and the region may not emit light due to burrs or irregularities on the edge of the device electrode. The light emitting diode device is photographed by CCD white light camera, the third image is obtained as shown in fig. 3, and the edge detection is performed on the third image, so that the actual area to be illuminated can be determined. It should be understood that although fig. 3 is a grayscale diagram, the third image actually captured may be in color.
Taking the example of determining the actual light-emitting area of the light-emitting diode device based on the pixel characteristics of the first image, edge detection may be performed on the first image, the number of pixels in the first image corresponding to the actual light-emitting area of the light-emitting diode device is determined, and the actual light-emitting area is determined based on the number of pixels and a preset mapping relationship, where the preset mapping relationship may be used to indicate the area of the light-emitting diode device corresponding to each pixel in the first image.
The image edge represents the ending of one region and the beginning of another region in the image, the pixel set between adjacent regions in the image can form the edge of the image, and the image edge can be understood as the set of pixels with spatial abrupt change of the image gray level. The image edge has two elements, namely: direction and magnitude. The change of the pixel values along the edge trend is relatively smooth; along the direction perpendicular to the edge, the pixel value changes relatively greatly. According to this variation, first and second derivatives can be used to describe and detect edges. Therefore, the edge detection may be performed on the first image to obtain one or more closed regions formed by pixels corresponding to the actual light-emitting region, and the number of pixels corresponding to the actual light-emitting region may be determined by performing statistics on the pixels in the closed regions.
It should be noted that the preset mapping relationship may be determined in advance, since the distance between the image sensor and the light emitting diode device is fixed after the image sensor and the light emitting diode device are placed, the light emitting diode device is photographed by the image sensor, and for different photographed images, the actual area corresponding to each pixel in the light emitting diode device is a constant for each pixel in the image. Therefore, in an alternative embodiment, after the image sensor and the light emitting diode device are placed, the image sensor may capture an image of the light emitting diode device, and the ratio between the area of the light emitting diode device and each pixel, that is, the area size corresponding to each pixel, may be determined by dividing the area of the light emitting diode device by the pixel of the image of the light emitting diode device. Accordingly, the preset mapping relationship may be expressed as y ═ ax, where y may represent an actual light emitting area, x may represent the number of pixels, and a may represent a ratio between an area of the light emitting diode device and each pixel.
For example, the area of the light emitting diode device is 0.004 square centimeter, the light emitting diode device is photographed, the obtained image includes 40 ten thousand pixels, the area size corresponding to each pixel may be 0.004/400000, and the preset mapping relationship may be represented as y ═ x 0.004/400000. Then if the number of pixels in the first image corresponding to the actual due light emission area is 39 ten thousand, the actual due light area of the light emitting diode device can be determined to be 0.0039 square centimeters based on the preset mapping relationship.
It should be noted that the preset current density may be set in advance according to test requirements such as a test mode. The current density is the physical quantity of the current intensity and the flowing direction at a certain point in the circuit. In the constant current test mode, in the process of driving and testing the light emitting diode device, the current density can be kept unchanged, and the test voltage input to the light emitting diode device can be changed; in the constant voltage test mode, a constant test voltage of the light emitting diode device may be given, and a plurality of preset current densities may be determined in advance, and a test current input to the light emitting diode device may be changed according to the preset current densities; in the constant luminance test mode, the luminance of the light emitting diode device can be kept constant by changing the test voltage input to the light emitting diode device and controlling the test current according to the current density set in advance.
When the preset current density and the actual area that should be light-emitting are determined, the test current input to the light-emitting diode device can be determined by the following equation 1:
I＝a·JD (formula 1)
Wherein, JDIs the current density; i is a test current input to the light emitting diode device; a is the actual supposed light emitting area of the light emitting diode device.
And 106, determining a second brightness of the light emitting diode device based on the first brightness, the pixel characteristics of the first image at the preset position and the pixel characteristics of the second image.
Wherein the second brightness may be an average brightness of the light emitting diode device (the entire actual light emitting area or the partial actual light emitting area). Of course, in practical applications, the second brightness may also be the brightness of the led device at any position.
Since the obtained image can reflect information such as the color and brightness of the light emitting diode device when the light emitting diode device is photographed and imaged, the color and brightness of the light emitting diode device can be reflected in the image when the light emitting diode device does not emit light and emits light. The brightness of the LED device at any position corresponds to the pixel characteristics of the same position in the obtained image. Therefore, if the correspondence between the brightness of the same position of the light emitting diode device and the pixel characteristic is determined, such as the correspondence between the brightness of the preset position and the pixel characteristic of the first image at the preset position, the brightness of the light emitting diode device at any position of the second image can be determined according to the pixel characteristic of the any position of the second image.
Wherein the pixel characteristics may comprise pixel values. If the first image or the second image is a gray scale image, the pixel feature may comprise a gray scale value; if the first image or the second image is a color image, the pixel characteristics may include pixel values of at least one color channel.
Alternatively, a gray value of the first image at the preset position may be determined, wherein the gray value of the first image at the preset position corresponds to the brightness of the light emitting diode device at the preset position (i.e. the first brightness), and the second brightness is determined based on the brightness of the light emitting diode device at the preset position, the gray value of the first image at the preset position and the gray value of the second image.
The position of the luminance meter (i.e., the preset position) and the position of the image sensor can be determined, the relative position between the luminance meter and the image sensor is determined according to the position of the luminance meter and the position of the image sensor, and then the preset position in the first image is determined based on the position of the image sensor and the relative position.
Taking the second brightness as the average brightness of all actual light-emitting areas of the light-emitting diode device and the first brightness as the brightness at the preset position as an example, when determining the first brightness, the gray-scale value of the first image at the preset position and the gray-scale value distribution of the second image, the second brightness of the light-emitting diode device can be determined by any one of the following manners:
in one mode, the luminance distribution of the light emitting diode device in the second image is determined based on the luminance of the light emitting diode device at the preset position, the gradation value of the first image at the preset position, and the gradation value distribution of the second image, and the second luminance of the light emitting diode device is determined based on the luminance distribution of the light emitting diode device in the second image.
The brightness corresponding to each gray value can be determined according to the proportional relationship between the brightness of the light emitting diode device at the preset position and the gray value of the first image at each position in the second image, that is, the brightness of the light emitting diode device at each position in the second image is determined, and then the brightness of the light emitting diode device at each position in the second image is subjected to normal distribution calculation to obtain the second brightness of the light emitting diode.
It should be noted that, in practical applications, the luminance and the gray scale value of the led device at the same position may also include a more complicated correspondence relationship.
Alternatively, since a partial region of the light emitting diode device may not emit light, in order to reduce the statistics of the gray scale value of the non-light emitting region and improve the calculation efficiency, the edge detection may be performed on the second image to determine an image region corresponding to the actual light emitting region of the light emitting diode device in the second image, determine the luminance distribution of the light emitting diode device in the actual light emitting region based on the luminance of the light emitting diode device at the preset position, the gray scale value of the first image at the preset position, and the gray scale value distribution of the image region, and determine the second luminance of the light emitting diode device based on the luminance distribution of the light emitting diode device in the actual light emitting region.
It should be noted that the actual light-emitting area may be an area where the light-emitting diode device actually emits light when driven, and the area of the actual light-emitting area may be smaller than or equal to the actual light-emitting area.
In another mode, an average gradation value of the second image is determined based on a gradation value distribution of the second image, a luminance corresponding to the average gradation value of the second image is determined based on the luminance of the light emitting diode device at the preset position and the gradation value of the first image at the preset position, and the luminance corresponding to the average gradation value is determined as the second luminance of the light emitting diode device.
The gray scale value at each position of the second image may be normally distributed to determine an average gray scale value of the second image, and then the second brightness of the light emitting diode device may be determined according to the average gray scale value of the second image according to a proportional relationship between the brightness of the light emitting diode device at the preset position and the gray scale value of the first image at the preset position.
Alternatively, since the first image is obtained under the condition that the light emitting diode device is not driven and the second image is obtained under the condition that the light emitting diode device is driven under the same external light condition, both regions in the second image having a gray value lower than the gray value of the preset position in the first image may be regarded as non-light emission, and then, when the second luminance of the light emitting diode device is determined based on the second image, the region having a gray value smaller than the gray value of the preset position in the first image may be ignored, thereby further improving the reliability of determining the luminance of the light emitting diode device. Therefore, when determining the second brightness of the light emitting diode device based on the brightness of the light emitting diode device at the preset position, the gray scale value of the first image at the preset position, and the gray scale value distribution of the second image, the gray scale value of the first image at the preset position may be determined as the gray scale value threshold, the gray scale value distribution of the second image greater than the gray scale value threshold is obtained, and the second brightness of the light emitting diode device is determined based on the brightness of the light emitting diode device at the preset position, the gray scale value of the first image at the preset position, and the gray scale value distribution of the second image greater than the gray scale value threshold.
The gray value of the first image at the preset position may be subtracted from the gray value of each position of the second image, so as to realize normalization processing of the gray value in the second image, and obtain a gray value distribution of the second image greater than the threshold of the gray value.
Of course, the brightness threshold of the light emitting diode device at the preset position of the first image may also be determined, after the brightness distribution of the light emitting diode device in the second image is determined, the brightness of the light emitting diode device at the preset position of the first image is subtracted from each brightness value, so as to realize the normalization processing of the brightness of the light emitting diode device in the second image, obtain the brightness distribution of the light emitting diode device in the second image, which is greater than the brightness threshold, and then determine the second brightness of the light emitting diode device.
For example, for a light emitting diode device enclosed in a test device, the first image acquired may be as shown in fig. 4 and the second image as shown in fig. 5. Here, the first image is acquired under the condition of the light emitting diode device not being driven, and thus the image is black. Fig. 5 is obtained under the condition of driving the light emitting diode device, and as can be seen from comparison with fig. 4, there is a portion of the region where the gradation value is high, and therefore it can be determined that the light emitting diode device emits light in this portion of the region. If the gray value and the corresponding brightness at any position in the first image are determined, the brightness corresponding to the gray value at any position in fig. 5 can be determined according to the proportional relationship between the gray value and the brightness.
In some embodiments, when the first image and the second image are color images, the first image and the second image may be converted into gray-scale images, and then the brightness of the led device may be determined in the above manner.
The preset brightness may be determined in advance, for example, the preset brightness may be 90% or 95% of the starting brightness. Of course, in practical applications, the preset brightness may be other values, and the magnitude of the preset brightness is not specifically limited in this embodiment of the application.
According to the embodiment of the application, the test current input to the light-emitting diode device can be accurately input, and the brightness of the light-emitting diode device can be accurately determined, so that the brightness change of the light-emitting diode device in the test process can be accurately determined, and the accuracy of determining the service life can be obviously improved.
For example, the operating lives of the light emitting diode devices 1 and 2 were tested by the test methods provided in the prior art and the examples of the present application, respectively, and the test results are shown in table 1 below. Wherein the third column indicates the starting luminance of the led device in cd (candela)/m 2 (square meter); the fourth column is the time period required for the brightness of the light emitting diode device to decrease from the initial brightness to 90% of the initial brightness; the fifth column is the time period required for the luminance of the light emitting diode device to decrease from the initial luminance to 90% of the initial luminance when the initial luminance is converted to 1 Knit.
TABLE 1
As can be seen from table 1, since the test method provided in the embodiment of the present application can more accurately measure the initial brightness of the led device, the finally determined lifetime of the led device (i.e. the fifth column of data in table 1) is more accurate than that in the prior art.
Of course, in practical applications, other performance parameters of the light emitting diode device, such as at least one of current efficiency and external quantum efficiency, may also be tested.
The current efficiency may be a ratio of an amount of a substance actually deposited or dissolved on an electrode at the time of electrolysis to a theoretically calculated deposition or dissolution amount, and the current efficiency of the light emitting diode device may be determined by the following equation 2:
ηA＝L/JD(formula 2)
Wherein eta isATo be current efficiency; and L is the luminous brightness of the LED device and can be obtained by testing the device.
The external quantum efficiency may be the ratio of the number of collected electrons to the number of all incident photons when a photon strikes the surface of the photosensitive device, some of which excite the photosensitive material to generate electron-hole pairs to form a current. The current density of the light emitting diode device can be determined by the following equation 3:
wherein q is the base charge; h is the Planck constant; c is the speed of light in vacuum; λ is the wavelength; g (lambda) is a human eye vision function; s (lambda) is the normalized electroluminescence spectrum.
In the embodiment of the present application, a first image and a first luminance of the light emitting diode device may be obtained, and then the light emitting diode device is driven to obtain a second image of the light emitting diode device, so that the second luminance of the light emitting diode device may be determined according to the second image under the condition of driving the light emitting diode device with the first image and the first luminance as references. Compared with the mode of acquiring the brightness of the light-emitting diode device at a certain position to represent the actual brightness of the light-emitting diode device, the accuracy of acquiring the brightness of the light-emitting diode device is obviously improved.
Based on the same inventive concept, as an implementation of the foregoing method, an embodiment of the present application provides an apparatus for testing a light emitting diode device, where the apparatus embodiment corresponds to the foregoing method embodiment, and for convenience of reading, details in the foregoing method embodiment are not repeated in this apparatus embodiment one by one, but it should be clear that the apparatus in this embodiment can correspondingly implement all the contents in the foregoing method embodiment.
Referring to fig. 6, a schematic structural diagram of an apparatus 600 for testing a light emitting diode device according to an embodiment of the present application is shown in fig. 6, where the apparatus according to the embodiment includes:
an obtaining module 601, configured to obtain a first image of a light emitting diode device and a first brightness of the light emitting diode device; driving the light emitting diode device to obtain a second image of the light emitting diode device;
a determining module 602 for determining a second brightness of the light emitting diode device based on the first brightness, the first image and the second image.
Optionally, the first brightness is a brightness of the light emitting diode device at a preset position, and the second brightness is an average brightness of the light emitting diode device.
Optionally, the obtaining module is further configured to:
acquiring the first image and the first brightness under the condition of current external illumination and no driving of the light emitting diode device;
keeping the current external illumination condition unchanged and driving the light emitting diode device.
Optionally, the determining module is further configured to:
and determining the second brightness based on the first brightness, the pixel characteristic of the first image at the preset position and the pixel characteristic of the second image.
Optionally, the first image and the second image comprise a grey scale map, the pixel characteristic comprises a grey scale value;
the determination module is further configured to:
determining the gray value of the first image at the preset position;
and determining the second brightness based on the first brightness, the gray value of the first image at the preset position and the gray value of the second image.
Optionally, the determining module is further configured to:
determining a brightness distribution of the light emitting diode device in the second image based on the first brightness, the gray-scale value of the first image at the preset position and the gray-scale value distribution of the second image;
the second brightness is determined based on a brightness distribution of the light emitting diode device in the second image.
Optionally, the determining module is further configured to:
determining an average gray value of the second image based on the gray value distribution of the second image;
and determining the brightness corresponding to the average gray value of the second image based on the first brightness and the gray value of the first image at the preset position, and determining the brightness corresponding to the average gray value as the second brightness.
Optionally, the determining module is further configured to:
determining the gray value of the first image at the preset position as a gray value threshold;
acquiring gray value distribution of the second image larger than the gray value threshold;
and determining the second brightness based on the first brightness, the gray value of the first image at the preset position and the gray value distribution of the second image larger than the threshold value of the gray value.
Optionally, the preset position is a geometric center of the first image.
Optionally, the method further comprises:
and the pre-burning module is used for pre-burning the light emitting diode device.
Optionally, the determining module is further configured to determine the second brightness as a starting brightness;
further comprising:
and the measuring module is used for measuring the time length consumed by the light-emitting diode device to reduce the initial brightness to the preset brightness, and determining the time length as the service life of the light-emitting diode device.
Optionally, the illumination intensity of the current external illumination condition is greater than 0, and the determining module is further configured to determine an actual area of the light emitting diode device that should emit light based on the pixel characteristics of the first image;
the acquisition module is further configured to:
determining a test current input to the light emitting diode device based on the actual light emitting area and a preset current density;
driving the light emitting diode device based on the test current.
Optionally, the determining module is further configured to:
performing edge detection on the first image, and determining the number of pixels corresponding to the actual light-emitting area of the light-emitting diode device in the first image;
and determining the actual area to be illuminated based on the number of pixels and a preset mapping relationship, wherein the preset mapping relationship is used for indicating the area of the light emitting diode device corresponding to each pixel in the first image.
The apparatus 600 for testing a light emitting diode device provided in this embodiment may perform the above method embodiments, and the implementation principle and the technical effect are similar, which are not described herein again.
It will be apparent to those skilled in the art that, for convenience and brevity of description, only the above-mentioned division of the functional units and modules is illustrated, and in practical applications, the above-mentioned function distribution may be performed by different functional units and modules according to needs, that is, the internal structure of the apparatus is divided into different functional units or modules to perform all or part of the above-mentioned functions. Each functional unit and module in the embodiments may be integrated in one processing unit, or each unit may exist alone physically, or two or more units are integrated in one unit, and the integrated unit may be implemented in a form of hardware, or in a form of software functional unit. In addition, specific names of the functional units and modules are only for convenience of distinguishing from each other, and are not used for limiting the protection scope of the present application. The specific working processes of the units and modules in the system may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again.
An embodiment of the present application further provides a computing device, where the computing device includes: at least one processor, a memory, and a computer program stored in the memory and executable on the at least one processor, the processor implementing the steps of any of the various method embodiments described above when executing the computer program.
The embodiments of the present application further provide a computer-readable storage medium, where a computer program is stored, and when the computer program is executed by a processor, the computer program implements the steps in the above-mentioned method embodiments.
The embodiments of the present application provide a computer program product, which when executed on a computing device, enables the computing device to implement the steps in the above method embodiments.
The integrated unit, if implemented in the form of a software functional unit and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, all or part of the processes in the methods of the embodiments described above can be implemented by a computer program, which can be stored in a computer-readable storage medium and can implement the steps of the embodiments of the methods described above when the computer program is executed by a processor. Wherein the computer program comprises computer program code, which may be in the form of source code, object code, an executable file or some intermediate form, etc. The computer readable medium may include at least: any entity or device capable of carrying computer program code to a photographing apparatus/terminal apparatus, a recording medium, computer Memory, Read-Only Memory (ROM), Random Access Memory (RAM), an electrical carrier signal, a telecommunications signal, and a software distribution medium. Such as a usb-disk, a removable hard disk, a magnetic or optical disk, etc. In certain jurisdictions, computer-readable media may not be an electrical carrier signal or a telecommunications signal in accordance with legislative and patent practice.
In the above embodiments, the descriptions of the respective embodiments have respective emphasis, and reference may be made to the related descriptions of other embodiments for parts that are not described or illustrated in a certain embodiment.
Those of ordinary skill in the art will appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware or combinations of computer software and electronic hardware. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the implementation. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present application.
In the embodiments provided in the present application, it should be understood that the disclosed apparatus/network device and method may be implemented in other ways. For example, the above-described apparatus/network device embodiments are merely illustrative, and for example, the division of the modules or units is only one logical division, and there may be other divisions when actually implementing, for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not implemented. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices or units, and may be in an electrical, mechanical or other form.
It will be understood that the terms "comprises" and/or "comprising," when used in this specification and the appended claims, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
It should also be understood that the term "and/or" as used in this specification and the appended claims refers to and includes any and all possible combinations of one or more of the associated listed items.
As used in this specification and the appended claims, the term "if" may be interpreted contextually as "when", "upon" or "in response to" determining "or" in response to detecting ". Similarly, the phrase "if it is determined" or "if a [ described condition or event ] is detected" may be interpreted contextually to mean "upon determining" or "in response to determining" or "upon detecting [ described condition or event ]" or "in response to detecting [ described condition or event ]".
Furthermore, in the description of the present application and the appended claims, the terms "first," "second," "third," and the like are used for distinguishing between descriptions and not necessarily for describing or implying relative importance.
Reference throughout this specification to "one embodiment" or "some embodiments," or the like, means that a particular feature, structure, or characteristic described in connection with the embodiment is included in one or more embodiments of the present application. Thus, appearances of the phrases "in one embodiment," "in some embodiments," "in other embodiments," or the like, in various places throughout this specification are not necessarily all referring to the same embodiment, but rather "one or more but not all embodiments" unless specifically stated otherwise. The terms "comprising," "including," "having," and variations thereof mean "including, but not limited to," unless expressly specified otherwise.
The above-mentioned embodiments are only used for illustrating the technical solutions of the present application, and not for limiting the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not substantially depart from the spirit and scope of the embodiments of the present application and are intended to be included within the scope of the present application.
Claims (16)
1. A method of testing a light emitting diode device, comprising:
obtaining a first image of a light emitting diode device and a first brightness of the light emitting diode device;
driving the light emitting diode device to obtain a second image of the light emitting diode device;
determining a second brightness of the light emitting diode device based on the first brightness, the first image, and the second image.
2. The method of claim 1, wherein the first brightness is a brightness of the light emitting diode device at a predetermined position, and the second brightness is an average brightness of the light emitting diode device.
3. The method of claim 1 or 2, wherein the obtaining the first image of the light emitting diode device and the first brightness of the light emitting diode device comprises:
acquiring the first image and the first brightness under the condition of current external illumination and no driving of the light emitting diode device;
the driving the light emitting diode device includes:
keeping the current external lighting condition unchanged and driving the light emitting diode device.
4. The method of claim 2, wherein determining a second brightness of the light emitting diode device based on the first brightness, the first image, and the second image comprises:
and determining the second brightness based on the first brightness, the pixel characteristic of the first image at the preset position and the pixel characteristic of the second image.
5. The method of claim 4, wherein the first image and the second image comprise a grayscale map, and the pixel features comprise grayscale values;
the determining the second brightness based on the first brightness, the pixel feature of the first image at the preset position, and the pixel feature of the second image comprises:
determining a gray value of the first image at the preset position;
and determining the second brightness based on the first brightness, the gray value of the first image at the preset position and the gray value of the second image.
6. The method of claim 5, wherein determining the second brightness based on the first brightness, the grayscale value of the first image at the preset location, and the grayscale value of the second image comprises:
determining a brightness distribution of the light emitting diode device in the second image based on the first brightness, the gray-scale value of the first image at the preset position and the gray-scale value distribution of the second image;
determining the second brightness based on a brightness distribution of the light emitting diode device in the second image.
7. The method of claim 5, wherein determining the second brightness based on the first brightness, the grayscale value of the first image at the preset location, and the grayscale value of the second image comprises:
determining an average gray value of the second image based on the gray value distribution of the second image;
and determining the brightness corresponding to the average gray value of the second image based on the first brightness and the gray value of the first image at the preset position, and determining the brightness corresponding to the average gray value as the second brightness.
8. The method of claim 5, wherein determining the second brightness based on the first brightness, the grayscale value of the first image at the preset location, and the grayscale value of the second image comprises:
determining the gray value of the first image at the preset position as a gray value threshold;
acquiring gray value distribution of the second image larger than the gray value threshold;
and determining the second brightness based on the first brightness, the gray value of the first image at the preset position and the gray value distribution of the second image larger than the threshold of the gray value.
9. The method of claim 2, wherein the predetermined location is a geometric center of the first image.
10. The method of claim 1, further comprising, prior to said driving said light emitting diode device:
and pre-burning the light emitting diode device.
11. The method of any of claims 1-10, further comprising:
determining the second brightness as a starting brightness;
and measuring the time length consumed by the light-emitting diode device to reduce the initial brightness to the preset brightness, and determining the time length as the service life of the light-emitting diode device.
12. The method of claim 11, wherein the current external lighting condition has a lighting intensity greater than 0, further comprising:
determining an actual, supposed light-emitting area of the light-emitting diode device based on pixel characteristics of the first image;
the driving the light emitting diode device includes:
determining a test current input to the light emitting diode device based on the actual light emitting area and a preset current density;
driving the light emitting diode device based on the test current.
13. The method of claim 12, wherein determining an actual area of the light emitting diode device that should emit light based on the pixel characteristics of the first image comprises:
performing edge detection on the first image, and determining the number of pixels corresponding to the actual light-emitting area of the light-emitting diode device in the first image;
and determining the actual area to be illuminated based on the number of pixels and a preset mapping relation, wherein the preset mapping relation is used for indicating the area of the light emitting diode device corresponding to each pixel in the first image.
14. An apparatus for testing a light emitting diode device, comprising:
an obtaining module for obtaining a first image of a light emitting diode device and a first brightness of the light emitting diode device; driving the light emitting diode device to obtain a second image of the light emitting diode device;
a determination module to determine a second brightness of the light emitting diode device based on the first brightness, the first image, and the second image.
15. A computing device, comprising: a memory for storing a computer program and a processor; the processor is adapted to perform the method of any of claims 1-13 when the computer program is invoked.
16. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the method according to any one of claims 1-13.
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