CN113809016B - Composite substrate - Google Patents
Composite substrate Download PDFInfo
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- CN113809016B CN113809016B CN202010961991.5A CN202010961991A CN113809016B CN 113809016 B CN113809016 B CN 113809016B CN 202010961991 A CN202010961991 A CN 202010961991A CN 113809016 B CN113809016 B CN 113809016B
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- 239000000758 substrate Substances 0.000 title claims abstract description 157
- 239000002131 composite material Substances 0.000 title claims abstract description 44
- 229910052751 metal Inorganic materials 0.000 claims abstract description 76
- 239000002184 metal Substances 0.000 claims abstract description 76
- 239000000919 ceramic Substances 0.000 claims abstract description 69
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 claims abstract description 66
- 229910000679 solder Inorganic materials 0.000 claims abstract description 62
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims abstract description 60
- 229910010271 silicon carbide Inorganic materials 0.000 claims abstract description 56
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 51
- 239000010949 copper Substances 0.000 claims abstract description 33
- 229910052802 copper Inorganic materials 0.000 claims abstract description 28
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 25
- 238000005245 sintering Methods 0.000 claims description 11
- 239000000463 material Substances 0.000 claims description 9
- 229910052581 Si3N4 Inorganic materials 0.000 claims description 5
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims description 5
- PIGFYZPCRLYGLF-UHFFFAOYSA-N Aluminum nitride Chemical compound [Al]#N PIGFYZPCRLYGLF-UHFFFAOYSA-N 0.000 claims description 4
- LTPBRCUWZOMYOC-UHFFFAOYSA-N Beryllium oxide Chemical compound O=[Be] LTPBRCUWZOMYOC-UHFFFAOYSA-N 0.000 claims description 4
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 claims description 4
- MZLGASXMSKOWSE-UHFFFAOYSA-N tantalum nitride Chemical compound [Ta]#N MZLGASXMSKOWSE-UHFFFAOYSA-N 0.000 claims description 3
- 238000005530 etching Methods 0.000 claims description 2
- 230000000694 effects Effects 0.000 abstract description 24
- 239000000203 mixture Substances 0.000 abstract description 22
- 239000010936 titanium Substances 0.000 abstract description 13
- 238000000034 method Methods 0.000 abstract description 12
- 230000017525 heat dissipation Effects 0.000 abstract description 11
- 238000007731 hot pressing Methods 0.000 abstract description 11
- 229910052709 silver Inorganic materials 0.000 abstract description 10
- 229910052719 titanium Inorganic materials 0.000 abstract description 10
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 abstract description 8
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 abstract description 8
- 239000004332 silver Substances 0.000 abstract description 8
- 229910052725 zinc Inorganic materials 0.000 abstract description 5
- 239000011701 zinc Substances 0.000 abstract description 5
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 abstract description 4
- 238000001465 metallisation Methods 0.000 description 10
- 238000005219 brazing Methods 0.000 description 9
- 238000004381 surface treatment Methods 0.000 description 9
- 239000011347 resin Substances 0.000 description 8
- 229920005989 resin Polymers 0.000 description 8
- 229910010293 ceramic material Inorganic materials 0.000 description 7
- 239000000126 substance Substances 0.000 description 7
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 6
- 229910045601 alloy Inorganic materials 0.000 description 4
- 239000000956 alloy Substances 0.000 description 4
- 230000006835 compression Effects 0.000 description 4
- 238000007906 compression Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 238000009736 wetting Methods 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 3
- 238000002844 melting Methods 0.000 description 3
- 230000008018 melting Effects 0.000 description 3
- 150000002739 metals Chemical class 0.000 description 3
- 229910052759 nickel Inorganic materials 0.000 description 3
- 238000004806 packaging method and process Methods 0.000 description 3
- 238000007747 plating Methods 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- 238000009825 accumulation Methods 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- 238000009713 electroplating Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 238000005304 joining Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- JBQYATWDVHIOAR-UHFFFAOYSA-N tellanylidenegermanium Chemical compound [Te]=[Ge] JBQYATWDVHIOAR-UHFFFAOYSA-N 0.000 description 2
- 238000011282 treatment Methods 0.000 description 2
- SWPMTVXRLXPNDP-UHFFFAOYSA-N 4-hydroxy-2,6,6-trimethylcyclohexene-1-carbaldehyde Chemical compound CC1=C(C=O)C(C)(C)CC(O)C1 SWPMTVXRLXPNDP-UHFFFAOYSA-N 0.000 description 1
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- 101001121408 Homo sapiens L-amino-acid oxidase Proteins 0.000 description 1
- 101000827703 Homo sapiens Polyphosphoinositide phosphatase Proteins 0.000 description 1
- 102100026388 L-amino-acid oxidase Human genes 0.000 description 1
- 102100023591 Polyphosphoinositide phosphatase Human genes 0.000 description 1
- 101100012902 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) FIG2 gene Proteins 0.000 description 1
- 101100233916 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) KAR5 gene Proteins 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 230000032683 aging Effects 0.000 description 1
- 238000007743 anodising Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000010292 electrical insulation Methods 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 238000011112 process operation Methods 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 230000008646 thermal stress Effects 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/12—Mountings, e.g. non-detachable insulating substrates
- H01L23/14—Mountings, e.g. non-detachable insulating substrates characterised by the material or its electrical properties
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/12—Mountings, e.g. non-detachable insulating substrates
- H01L23/14—Mountings, e.g. non-detachable insulating substrates characterised by the material or its electrical properties
- H01L23/15—Ceramic or glass substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/373—Cooling facilitated by selection of materials for the device or materials for thermal expansion adaptation, e.g. carbon
- H01L23/3735—Laminates or multilayers, e.g. direct bond copper ceramic substrates
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Materials Engineering (AREA)
- Ceramic Products (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
Abstract
本发明公开了一种复合基板,包括上下层叠的陶瓷基板及铝基碳化硅基板,并于陶瓷基板与铝基碳化硅基板之间通过活性金属焊料进行热压接合形成一接合面,其中该铝基碳化硅基板含有50~83vol%的SiC,活性金属焊料选自银、铜、钛、锌及铝所组成的群组的任一,此种复合基板仅需选用适当SiC组成的铝基碳化硅基板,并利用其本身所具有高耐热及低热膨胀的特性,当承受高温热压时,就可以通过活性金属焊料直接与陶瓷基板共同压合形成整体散热效果佳且连续致密的接合界面,以简化制程、提高接合的强度与良率,成本更加便宜,同时可提高散热效果及耐冲击强度,对于抵抗冲击和震动等机械性质及产品可靠度等,都有优越的表现,也更加适用于车用领域。
The invention discloses a composite substrate, comprising a ceramic substrate and an aluminum-based silicon carbide substrate stacked up and down, and a bonding surface is formed by hot pressing the ceramic substrate and the aluminum-based silicon carbide substrate through active metal solder, wherein the aluminum-based silicon carbide substrate contains 50-83 vol% SiC, and the active metal solder is selected from any one of the group consisting of silver, copper, titanium, zinc and aluminum. This composite substrate only needs to select an aluminum-based silicon carbide substrate with a suitable SiC composition, and utilizes its own high heat resistance and low thermal expansion characteristics. When subjected to high temperature hot pressing, the active metal solder can be directly pressed together with the ceramic substrate to form a continuous and dense bonding interface with good overall heat dissipation effect, so as to simplify the process, improve the bonding strength and yield, and make the cost cheaper. At the same time, the heat dissipation effect and impact resistance can be improved, and the mechanical properties such as impact resistance and vibration resistance and product reliability have excellent performance, and are more suitable for the automotive field.
Description
技术领域Technical Field
本发明涉及一种复合基板,特别涉及仅需选用具有适当SiC组成的AlSiC基板,就可以通过活性金属焊料直接与陶瓷基板进行热压接合形成一整体散热效果佳且连续致密的接合界面,以简化制程、提高接合的强度与良率,成本更加便宜。The present invention relates to a composite substrate, and more particularly to an AlSiC substrate having an appropriate SiC composition, which can be directly hot-pressed and bonded to a ceramic substrate by active metal solder to form a continuous and dense bonding interface with good overall heat dissipation effect, thereby simplifying the manufacturing process, improving the bonding strength and yield, and making the cost lower.
背景技术Background technique
陶瓷的机械强度佳,并具有良好的耐热性、化学稳定性、抗氧化性、电绝缘性、致密性与光学特性等,也可藉由成分改变其性质应用于不同需求制程中,所以陶瓷被广泛地应用于电子器件、光电与半导体组件封装、汽车、通讯领域、航天科技、化工等产业,而陶瓷材料制成的陶瓷基板,则因陶瓷材料本身具有的导热率高、耐热性好、高绝缘、高强度、与芯片材料热匹配等性能,非常适合作为功率器件的封装基板,可将热源(如芯片、半导体器件)产生的热量从陶瓷基板导出,以满足大功率电子器件的使用需求。Ceramics have excellent mechanical strength, and have good heat resistance, chemical stability, oxidation resistance, electrical insulation, density and optical properties. They can also be applied to different processes by changing their properties through composition. Therefore, ceramics are widely used in electronic devices, optoelectronics and semiconductor component packaging, automobiles, communications, aerospace technology, chemical industry and other industries. Ceramic substrates made of ceramic materials are very suitable as packaging substrates for power devices because of the high thermal conductivity, good heat resistance, high insulation, high strength, and thermal matching with chip materials of the ceramic materials themselves. The heat generated by heat sources (such as chips, semiconductor devices) can be exported from the ceramic substrate to meet the use requirements of high-power electronic devices.
一般陶瓷基板材料包括氧化铝(Al2O3)、氮化铝(AlN)、氮化硅(Si3N4)、氧化铍(BeO)、碳化硅(SiC)等,为了获得较佳的热与电性能、机械强度、气密性及较小尺寸变化等,在实际的应用上,常会将陶瓷材料与金属(如铝或铜等)散热组件或线路作接合,其接合的方式包含扩散接合、硬焊及焊接等,并在利用硬焊的方式接合金属与陶瓷基板的过程中,使用一般的合金焊料难以与陶瓷材料润湿,便会造成合金焊料与陶瓷材料间的接合强度不足。在此种情况之下,可利用预金属化法与活性硬焊法来改善其润湿性,其中预金属化法是陶瓷材料的接合面在硬焊前先施行金属化的处理,而活性硬焊法系在合金焊料(如镍、铜、银等)中添加微量活性金属(如钛、锆等)配制成一活性金属焊料,可与陶瓷材料反应、产生润湿效果而达到接合的目的,且因制程的操作十分简便,故在陶瓷封装与金属化的应用极为广泛。Common ceramic substrate materials include aluminum oxide (Al 2 O 3 ), aluminum nitride (AlN), silicon nitride (Si 3 N 4 ), beryllium oxide (BeO), silicon carbide (SiC), etc. In order to obtain better thermal and electrical properties, mechanical strength, air tightness and smaller dimensional changes, in actual applications, ceramic materials are often joined with metal (such as aluminum or copper) heat dissipation components or circuits. The joining methods include diffusion bonding, brazing and welding. In the process of joining metal and ceramic substrate by brazing, it is difficult for ordinary alloy solder to wet the ceramic material, which will result in insufficient bonding strength between the alloy solder and the ceramic material. In this case, pre-metallization and active brazing methods can be used to improve wettability. The pre-metallization method is to metallize the joint surface of the ceramic material before brazing, while the active brazing method is to add a trace amount of active metal (such as titanium, zirconium, etc.) to the alloy solder (such as nickel, copper, silver, etc.) to prepare an active metal solder, which can react with the ceramic material to produce a wetting effect and achieve the purpose of bonding. Moreover, since the process operation is very simple, it is widely used in ceramic packaging and metallization.
然而,传统陶瓷基板与铝金属基板[如铝基金属板或散热鳍片(Heat Sink)等]进行接合的方式,一般是将陶瓷基板其中一面与铜金属通过活性金属硬焊(AMB)材料(简称为活性金属焊料)先进行焊接形成AMB基板以后,再对铜层进行选择性蚀刻始产生铜金属线路布局,而陶瓷基板的另一面则通过导热胶(如黏着剂或树脂等)或其他表面处理[如金属化(如镀镍、金、锡等)或阳极氧化处理等]方式与铝金属基板进行热压接合形成一复合基板,便可藉由陶瓷基板表面的铜金属线路搭载工作芯片吸收负载产生的热能,并以热传导的方式通过接合界面传递至铝金属基板或被铝金属基板所吸收来进行散热,进而减低过度热能蓄积于陶瓷基板所引发的热冲击或影响工作芯片运作效能。However, the conventional method of bonding a ceramic substrate to an aluminum metal substrate [such as an aluminum-based metal plate or a heat sink, etc.] is generally to first weld one side of the ceramic substrate to copper metal through an active metal brazing (AMB) material (referred to as active metal solder) to form an AMB substrate, and then selectively etch the copper layer to produce a copper metal circuit layout, while the other side of the ceramic substrate is thermally pressed to the aluminum metal substrate through a thermal conductive glue (such as an adhesive or resin, etc.) or other surface treatments [such as metallization (such as nickel plating, gold, tin, etc.) or anodizing treatment, etc.] to form a composite substrate, so that the copper metal circuit on the surface of the ceramic substrate can carry a working chip to absorb the heat energy generated by the load, and transfer it to the aluminum metal substrate through the bonding interface in the form of heat conduction or be absorbed by the aluminum metal substrate to dissipate heat, thereby reducing the thermal shock caused by excessive heat energy accumulated in the ceramic substrate or affecting the operating performance of the working chip.
但该陶瓷基板选用黏着剂或树脂与铝金属基板进行接合,其虽可在低温下进行,降低了接合的过程中产生的热应力问题,不过树脂对热的传导效果较差,在界面会妨碍热传导,以致使接合后复合基板整体的热阻值增加,长时间使用亦会因老化造成界面剥离,且因树脂无法在陶瓷基板上润湿,进而引发散热效果不佳及界面缝隙等问题;又,若是陶瓷基板选用表面处理方式与铝金属基板进行接合时,如化学镀、高温烧结、蒸镀、溅镀等金属化处理,其所施加表面处理的材料含有复杂化学组成,收缩膨胀等变异因素较多,造成热压接合后很容易发现有界面接合力差、致密性不良、易氧化或金属化层厚度不易控制等问题。换言之,无论选择树脂或表面处理方式都不是复合基板的理想选项,尤其是不利于同时讲究高导热来对外散热及耐冲击的车用领域发展,也是此行业者长久以来欲改善的重要课题及问题所在。However, the ceramic substrate uses adhesive or resin to bond with the aluminum metal substrate. Although it can be done at low temperature, reducing the thermal stress problem generated during the bonding process, the resin has a poor heat conduction effect, which will hinder heat conduction at the interface, resulting in an increase in the overall thermal resistance of the composite substrate after bonding. Long-term use will also cause interface peeling due to aging, and because the resin cannot wet on the ceramic substrate, it will cause problems such as poor heat dissipation and interface gaps. In addition, if the ceramic substrate uses a surface treatment method to bond with the aluminum metal substrate, such as chemical plating, high-temperature sintering, evaporation, sputtering and other metallization treatments, the surface treatment materials have complex chemical compositions and many variable factors such as shrinkage and expansion, resulting in problems such as poor interface bonding force, poor density, easy oxidation or difficult to control the thickness of the metallization layer after hot pressing bonding. In other words, whether choosing resin or surface treatment is not an ideal option for composite substrates, especially not conducive to the development of the automotive field that requires high thermal conductivity to dissipate heat and impact resistance at the same time, and it is also an important topic and problem that the industry has long wanted to improve.
发明内容Summary of the invention
故,发明人有鉴于上述缺失,乃搜集相关资料,经由多方的评估及考虑,并以从事于此行业所累积的多年经验,持续试作与修改,始设计出此种复合基板。Therefore, in view of the above shortcomings, the inventor collected relevant information, evaluated and considered various aspects, and used the years of experience accumulated in this industry to continuously test and modify, and finally designed this composite substrate.
本发明的主要目的乃在于复合基板是以具有适当含量占比的SiC的铝基碳化硅基板取代铝金属基板,并利用其耐热温度及耐热系数较传统金属基板高,且热膨胀变化小不易发生高温变形,具有高耐热及低热膨胀的特性,当承受高温热压时,就可以通过活性金属焊料直接与陶瓷基板共同压合形成一整体散热效果佳且连续致密的接合界面,不仅可以简化制程,并提高接合的强度与良率,成本更加便宜,同时可提高散热效果及耐冲击强度,相较传统复合基板对于抵抗冲击和震动等机械性质及产品可靠度等都有优越的表现,也更加适用于车用领域。The main purpose of the present invention is to replace the aluminum metal substrate with an aluminum-based silicon carbide substrate with an appropriate content of SiC in the composite substrate, and utilize its higher heat resistance temperature and heat resistance coefficient than the traditional metal substrate, and the small thermal expansion change is not easy to deform at high temperature, and has the characteristics of high heat resistance and low thermal expansion. When subjected to high temperature hot pressing, it can be directly pressed with the ceramic substrate through active metal solder to form an overall good heat dissipation effect and continuous and dense bonding interface, which can not only simplify the process, and improve the strength and yield of the bonding, but also be cheaper. At the same time, it can improve the heat dissipation effect and impact resistance. Compared with traditional composite substrates, it has superior performance in mechanical properties such as resistance to impact and vibration and product reliability, and is more suitable for the automotive field.
本发明的次要目的乃在于复合基板所选用的活性金属焊料选自银、铜、钛、锌及铝所组成的群组的任一,并利用其活性金属具有的高活性,可提高焊料熔化后对陶瓷的润湿反应,使铝基碳化硅基板不需进行金属化表面处理,就可以直接与陶瓷基板进行热压接合,最终形成无任何界面缝隙或界面剥离的复合基板,且因活性金属焊料的热阻值较传统接合界面使用的树脂低许多,所以对热的传导效果更佳,可将热源所产生的热量通过陶瓷基板、活性金属焊料快速热传导至铝基碳化硅基板对外释放,以减少热量蓄积于陶瓷基板上,整体的散热效果更为良好。A secondary purpose of the present invention is that the active metal solder used in the composite substrate is selected from any one of the group consisting of silver, copper, titanium, zinc and aluminum, and the high activity of the active metal can be used to improve the wetting reaction of the solder to the ceramic after melting, so that the aluminum-based silicon carbide substrate can be directly hot-pressed and bonded with the ceramic substrate without metallization surface treatment, and finally a composite substrate without any interface gap or interface peeling is formed. In addition, because the thermal resistance of the active metal solder is much lower than that of the resin used in the traditional bonding interface, the heat conduction effect is better, and the heat generated by the heat source can be quickly thermally conducted to the aluminum-based silicon carbide substrate through the ceramic substrate and the active metal solder for external release, so as to reduce the heat accumulation on the ceramic substrate, and the overall heat dissipation effect is better.
本发明的另一目的乃在于复合基板的接合界面,缺乏金属化表面处理含有复杂化学组成、收缩膨胀等变异因素所引发界面接合力差、致密性不良等问题,并于铝基碳化硅基板通过活性金属焊料与陶瓷基板直接热压接合后可形成一连续致密的接合界面,相较传统复合基板常见因为热膨胀变形所引发接口缝隙或界面剥离,更能有效提高其耐冲击的强度,产品可靠度更为优越。Another purpose of the present invention is to solve the problems of poor interface bonding strength and poor density caused by the lack of metallized surface treatment, complex chemical composition, shrinkage and expansion and other variable factors at the bonding interface of the composite substrate. A continuous and dense bonding interface can be formed after the aluminum-based silicon carbide substrate is directly hot-pressed with the ceramic substrate through active metal solder. Compared with the interface gap or interface peeling caused by thermal expansion deformation commonly seen in traditional composite substrates, it can more effectively improve its impact resistance and product reliability.
为了达到上述目的,本发明采用了以下技术手段:In order to achieve the above object, the present invention adopts the following technical means:
本发明一种复合基板,包括上下层叠的陶瓷基板及铝基碳化硅基板,并于该陶瓷基板与该铝基碳化硅基板之间含有活性金属焊料所形成的一接合面,该铝基碳化硅基板含有体积百分比为50~83vol%的碳化硅(SiC),该活性金属焊料选自银(Ag)、铜(Cu)、钛(Ti)、锌(Zn)及铝(Al)所组成的群组的任一。The present invention discloses a composite substrate, comprising a ceramic substrate and an aluminum-based silicon carbide substrate stacked up and down, and a bonding surface formed by an active metal solder is contained between the ceramic substrate and the aluminum-based silicon carbide substrate, wherein the aluminum-based silicon carbide substrate contains 50 to 83 vol% of silicon carbide (SiC) by volume, and the active metal solder is selected from any one of the group consisting of silver (Ag), copper (Cu), titanium (Ti), zinc (Zn) and aluminum (Al).
其中,优选的,该陶瓷基板包含陶瓷基底及该陶瓷基底至少一侧表面上形成的金属层结构。Preferably, the ceramic substrate comprises a ceramic base and a metal layer structure formed on at least one side surface of the ceramic base.
其中,优选的,该陶瓷基底材料为氮化硅(Si3N4)、氮化坦(TaN)、氮化铝(AlN)、氧化铍(BeO)、氧化铝(Al2O4)或碳化硅(SiC)。Preferably, the ceramic substrate material is silicon nitride (Si 3 N 4 ), tantalum nitride (TaN), aluminum nitride (AlN), beryllium oxide (BeO), aluminum oxide (Al 2 O 4 ) or silicon carbide (SiC).
其中,优选的,该金属层结构是在该陶瓷基底上表面附着有一铜金属层,再蚀刻形成一铜金属线路。Preferably, the metal layer structure is a copper metal layer attached to the upper surface of the ceramic substrate, which is then etched to form a copper metal circuit.
其中,优选的,该铝基碳化硅基板含有体积百分比为63vol%的SiC。Preferably, the aluminum-based silicon carbide substrate contains 63 vol% SiC.
其中,优选的,该活性金属焊料含有体积百分比为70vol%的Ag、28vol%的Cu及2vol%的Ti。Preferably, the active metal solder contains 70 vol% Ag, 28 vol% Cu and 2 vol% Ti.
其中,优选的,该活性金属焊料含有体积百分比为10vol%的Ag、85vol%的Cu及5vol%的Ti。Preferably, the active metal solder contains 10 vol% Ag, 85 vol% Cu and 5 vol% Ti.
其中,优选的,该活性金属焊料含有体积百分比为80vol%的Zn及20vol%的Al。Preferably, the active metal solder contains 80 vol% Zn and 20 vol% Al.
其中,优选的,该活性金属焊料所形成的接合面是通过热压接合形成。Preferably, the joint surface formed by the active metal solder is formed by thermal compression bonding.
附图说明BRIEF DESCRIPTION OF THE DRAWINGS
图1为本发明复合基板的结构示意图;FIG1 is a schematic structural diagram of a composite substrate of the present invention;
图2为本发明活性金属焊料组成的数据表;FIG2 is a data table showing the composition of active metal solder of the present invention;
图3为本发明复合基板于热压接合时的示意图;FIG3 is a schematic diagram of a composite substrate of the present invention during thermal compression bonding;
图4为本发明实施例所试验的数据及接合面效果判定表。FIG. 4 is a table showing the test data and the joint surface effect determination table of the embodiment of the present invention.
符号说明Symbol Description
1:陶瓷基板1: Ceramic substrate
2:铝基碳化硅基板2: Aluminum-based silicon carbide substrate
3:活性金属焊料3: Active metal solder
L:荷重L: Load
具体实施方式Detailed ways
为达成上述目的及功效,本发明所采用的技术手段及其构造,兹绘图就本发明的较佳实施例详加说明其构造与功能如下,俾利完全了解。In order to achieve the above-mentioned purpose and effect, the technical means and structure adopted by the present invention are illustrated in detail with reference to the preferred embodiment of the present invention, and its structure and function are as follows, so as to facilitate a complete understanding.
请参阅图1~4所示,是分别为本发明复合基板的结构示意图、活性金属焊料组成的数据表、复合基板于热压接合时的示意图及实施例所试验的数据及接合面效果判定表,由图中可清楚看出,本发明的复合基板是包括上下层叠的陶瓷基板1及铝基碳化硅(AlSiC)基板2,并于陶瓷基板1与铝基碳化硅基板2之间是通过活性金属焊料[是活性金属硬焊(AMB)材料的简称]3进行热压接合形成一接合面,其中该上层陶瓷基板1包含陶瓷基底及其至少一侧表面上的金属层结构,陶瓷基底材料较佳实施可为氮化硅(Si3N4),但并不以此为限,亦可为氮化坦(TaN)、氮化铝(AlN)、氧化铍(BeO)、氧化铝(Al2O4)或碳化硅(SiC)等,且该金属层结构是通过高/低温共烧陶瓷(HTCC/LTCC)、直接覆铜(DBC)、直接电镀铜(DPC)或活性金属硬焊(AMB)等技术,在陶瓷基底上表面附着有一铜金属层,再于铜金属层上进行蚀刻形成铜金属线路,便可将芯片、半导体或功率器件等搭载或封装在陶瓷基板1上,并与铜金属线路通过焊料、引线键合等方式形成电性连接。Please refer to Figures 1 to 4, which are respectively a schematic diagram of the structure of the composite substrate of the present invention, a data table of the composition of the active metal solder, a schematic diagram of the composite substrate during hot pressing bonding, and data tested in the embodiment and a bonding surface effect determination table. It can be clearly seen from the figures that the composite substrate of the present invention includes a ceramic substrate 1 and an aluminum-based silicon carbide (AlSiC) substrate 2 stacked up and down, and the ceramic substrate 1 and the aluminum-based silicon carbide substrate 2 are hot-pressed and bonded by an active metal solder [the abbreviation of active metal brazing (AMB) material] 3 to form a bonding surface, wherein the upper ceramic substrate 1 includes a ceramic substrate and a metal layer structure on at least one side of the surface thereof. The ceramic substrate material is preferably silicon nitride (Si 3 N 4 ), but is not limited thereto, and can also be tantalum nitride (TaN), aluminum nitride (AlN), beryllium oxide (BeO), aluminum oxide (Al 2 O 4 ) or silicon carbide (SiC), etc., and the metal layer structure is a copper metal layer attached to the upper surface of the ceramic substrate through high/low temperature co-fired ceramics (HTCC/LTCC), direct copper bonding (DBC), direct electroplated copper (DPC) or active metal brazing (AMB) and other technologies, and then etching is performed on the copper metal layer to form a copper metal circuit, so that chips, semiconductors or power devices can be mounted or packaged on the ceramic substrate 1, and electrically connected to the copper metal circuit through solder, wire bonding, etc.
在本实施例中,上述的复合基板下层是铝基碳化硅基板2,其特性主要取决于SiC的体积百分比(vol%,即组成的含量)、分布与粒径大小等,可通过改变其组成的含量而加以调整,由于铝基碳化硅基板2含有50~83vol%的SiC,较佳实施为63vol%,并因为含有50vol%以上的SiC,其耐热温度及耐热系数较传统金属基板或陶瓷基板为高,且热膨胀变化小不易发生高温变形,使铝基碳化硅基板2本身具有高耐热及低热膨胀的特性,即可取代铝金属基板,并与陶瓷基板1通过活性金属焊料3直接进行热压接合形成一复合基板。In the present embodiment, the lower layer of the composite substrate is an aluminum-based silicon carbide substrate 2, and its characteristics are mainly determined by the volume percentage (vol%, i.e., the content of the composition), distribution and particle size of SiC, etc., which can be adjusted by changing the content of the composition. Since the aluminum-based silicon carbide substrate 2 contains 50-83 vol% SiC, preferably 63 vol%, and because it contains more than 50 vol% SiC, its heat resistance temperature and heat resistance coefficient are higher than those of traditional metal substrates or ceramic substrates, and its thermal expansion change is small and it is not easy to deform at high temperature, so that the aluminum-based silicon carbide substrate 2 itself has the characteristics of high heat resistance and low thermal expansion, and can replace the aluminum metal substrate, and can be directly hot-pressed with the ceramic substrate 1 through the active metal solder 3 to form a composite substrate.
如图2、3所示,本发明实施例所选用的活性金属焊料3组成配比主要有三种,其中焊料A含有体积百分比为70vol%的银(Ag)、28vol%的铜(Cu)及2vol%的钛(Ti),焊料B含有体积百分比为10vol%的银(Ag)、85vol%的铜(Cu)及5vol%的钛(Ti),以及焊料C含有体积百分比为80vol%的锌(Zn)及20vol%的铝(Al),该些焊料是利用活性金属(如钛、锌)与银、铜、铝等金属所配制而成,由于活性金属为具有高活性,可提高焊料熔化后对陶瓷的润湿反应,所以使陶瓷表面无需金属化,就可与金属实现接合的目的。As shown in FIGS. 2 and 3 , there are three main composition ratios of the active metal solder 3 used in the embodiment of the present invention, wherein solder A contains 70 vol% silver (Ag), 28 vol% copper (Cu) and 2 vol% titanium (Ti) by volume, solder B contains 10 vol% silver (Ag), 85 vol% copper (Cu) and 5 vol% titanium (Ti) by volume, and solder C contains 80 vol% zinc (Zn) and 20 vol% aluminum (Al) by volume. These solders are prepared using active metals (such as titanium, zinc) and metals such as silver, copper, and aluminum. Since the active metals are highly active, they can improve the wetting reaction of the solder to the ceramic after it is melted, so that the ceramic surface does not need to be metallized to achieve the purpose of bonding with the metal.
当陶瓷基板1、铝基碳化硅基板2与活性金属焊料3进行热压接合时,可使用真空加热炉或熔炉将活性金属焊料3加热到熔点以上的烧结温度(如较佳为580℃~865℃温度区间),如图4的数据表所示,烧结温度依焊料组成的配比不同可分别为865℃、510℃或580℃等,并使活性金属焊料3熔化持温一段时间后,可充分填充于陶瓷基板1与铝基碳化硅基板2的间进行润湿反应,再使用预定荷重L可分别为0.58kgf/cm2(0.075Mpa)、1.17kgf/cm2(0.11Mpa)或0.21kgf/cm2(0.028Mpa)进行热压接合,或者是可使用加热棒来加热荷重L(如热压头),并由热压头直接热压陶瓷基板1来加热活性金属焊料3达到预定的烧结温度,而随着活性硬焊温度或持温时间增加,便可利用铝基碳化硅基板2本身具有高耐热及低热膨胀的特性,使其承受高温热压时,可通过活性金属焊料3与陶瓷基板1共同压合形成一具有致密接合面的复合基板,并由复合基板的接合界面显微金相组织,可观察到活性金属焊料3的合金焊料能有效的填满陶瓷基板1与铝基碳化硅基板2的表面孔隙,具有良好的润湿性,以供陶瓷基板1与铝基碳化硅基板能够紧密接合,且二者间的接合界面无缝隙产生,也不易发生挠曲变形,最终形成无任何界面缝隙或界面剥离的复合基板。When the ceramic substrate 1, the aluminum-based silicon carbide substrate 2 and the active metal solder 3 are heat-pressed, a vacuum heating furnace or a melting furnace can be used to heat the active metal solder 3 to a sintering temperature above the melting point (e.g., preferably a temperature range of 580°C to 865°C). As shown in the data table of FIG. 4 , the sintering temperature can be 865°C, 510°C or 580°C, etc., depending on the composition ratio of the solder. After the active metal solder 3 is melted and kept at the temperature for a period of time, it can be fully filled between the ceramic substrate 1 and the aluminum-based silicon carbide substrate 2 for wetting reaction. Then, the predetermined load L can be 0.58kgf/cm 2 (0.075Mpa), 1.17kgf/cm 2 (0.11Mpa) or 0.21kgf/cm 2 (0.028Mpa) for hot pressing bonding, or a heating rod can be used to heat the load L (such as a hot pressing head), and the hot pressing head can be used to directly hot press the ceramic substrate 1 to heat the active metal solder 3 to a predetermined sintering temperature. As the active brazing temperature or the temperature holding time increases, the aluminum-based silicon carbide substrate 2 itself can be used to have the characteristics of high heat resistance and low thermal expansion. When it is subjected to high-temperature hot pressing, the active metal solder 3 and the ceramic substrate 1 can be pressed together to form a composite substrate with a dense bonding surface. From the microscopic metallographic structure of the bonding interface of the composite substrate, it can be observed that the alloy solder of the active metal solder 3 can effectively fill the surface pores of the ceramic substrate 1 and the aluminum-based silicon carbide substrate 2, and has good wettability, so that the ceramic substrate 1 and the aluminum-based silicon carbide substrate can be tightly bonded, and there is no gap in the bonding interface between the two, and it is not easy to bend and deform, and finally a composite substrate without any interface gap or interface peeling is formed.
具体而言,可观察如图4所列示本发明复合基板的实施例1~10试验数据,其中该复合基板结构上层陶瓷基板1选用的陶瓷基底材料是厚度0.32mm的氮化硅(Si3N4),下层铝基碳化硅(AlSiC)基板2组成是厚度3.00mm、含量占比可分别为50%、63%与83%的碳化硅(SiC),并通过活性金属焊料3不同的组成配比(如焊料A至C),在不同的荷重L及烧结温度下进行热压接合形成具有接合面的复合基板。Specifically, the test data of Examples 1 to 10 of the composite substrate of the present invention are shown in FIG4 , wherein the ceramic base material selected for the upper ceramic substrate 1 of the composite substrate structure is silicon nitride (Si 3 N 4 ) with a thickness of 0.32 mm, and the lower aluminum-based silicon carbide (AlSiC) substrate 2 is composed of silicon carbide (SiC) with a thickness of 3.00 mm and a content of 50%, 63% and 83% respectively, and hot pressing bonding is performed by different composition ratios of active metal solder 3 (such as solders A to C) at different loads L and sintering temperatures to form a composite substrate with a bonding surface.
根据实施例1~4的接合面效果判定的结果,可发现在相同的荷重L(如0.58kgf/cm2)及烧结温度(如865℃)下,不论是选用焊料A或焊料B组成配比,只要铝基碳化硅基板2的SiC组成含量高于50%(如63%或83%),其接合面效果判定皆为良好,但是根据实施例5~7可发现在烧结温度(如865℃)不变之下,随着荷重L从0.58kgf/cm2增加至1.17kgf/cm2,铝基碳化硅基板2的SiC组成含量为50%或铝基碳化硅基板2经过预金属化表面处理(如表面电镀)时,不论是选用焊料A或焊料B组成配比,其接合面效果判定皆为不良。According to the results of the determination of the bonding surface effect of Examples 1 to 4, it can be found that under the same load L (such as 0.58 kgf/cm 2 ) and sintering temperature (such as 865°C), no matter whether the composition ratio of solder A or solder B is selected, as long as the SiC composition content of the aluminum-based silicon carbide substrate 2 is higher than 50% (such as 63% or 83%), the bonding surface effect is determined to be good. However, according to Examples 5 to 7, it can be found that under the condition of the sintering temperature (such as 865°C) being unchanged, as the load L increases from 0.58 kgf/cm 2 to 1.17 kgf/cm 2 , when the SiC composition content of the aluminum-based silicon carbide substrate 2 is 50% or the aluminum-based silicon carbide substrate 2 undergoes a pre-metallization surface treatment (such as surface electroplating), no matter whether the composition ratio of solder A or solder B is selected, the bonding surface effect is determined to be poor.
此外,根据实施例8~10的接合面效果判定的结果,可发现当铝基碳化硅基板2的SiC组成含量为63%,并选用焊料C组成配比时,在较低的荷重L为0.21kgf/cm2、烧结温度为580℃进行热压接合,其接合面效果判定为良好,但是在烧结温度降低至510℃,荷重L不变时,其接合面效果判定皆为不良,所以本发明实施例的活性金属焊料3三种不同的焊料组成,可搭配SiC组成含量为介于50%~83%的铝基碳化硅基板2进行选用,并通过调整其热压接合制程的荷重L及烧结温度,均可适用于本发明的复合基板。In addition, according to the results of the determination of the bonding surface effect of Examples 8 to 10, it can be found that when the SiC composition content of the aluminum-based silicon carbide substrate 2 is 63% and the solder C composition ratio is selected, the thermal compression bonding is performed at a lower load L of 0.21 kgf/ cm2 and a sintering temperature of 580°C, and the bonding surface effect is determined to be good. However, when the sintering temperature is reduced to 510°C and the load L remains unchanged, the bonding surface effect is determined to be poor. Therefore, the three different solder compositions of the active metal solder 3 of the embodiment of the present invention can be selected in combination with the aluminum-based silicon carbide substrate 2 with a SiC composition content between 50% and 83%, and by adjusting the load L and sintering temperature of the thermal compression bonding process, they can all be applied to the composite substrate of the present invention.
当本发明的复合基板在上层陶瓷基板1搭载或封装有芯片、半导体或功率器件等热源时,可通过陶瓷基底先吸收热源及铜金属线路所产生的热量,并经由活性金属焊料3快速热传导至下层铝基碳化硅基板2进行吸收,再释放至外界,由于本实施例选用的活性金属焊料3的热阻值均较传统接合使用的树脂低的许多,所以对热的传导效果更佳,并以具有适当SiC组成的铝基碳化硅基板2取代铝金属基板,不需进行金属化表面处理(如表面电镀铜、化学镀镍等),就可以通过活性金属焊料3与陶瓷基板1直接热压接合,最终形成一整体散热效果佳且连续致密的接合界面,不仅可简化复合基板制程,并提高接合的强度与良率,使成本更加便宜,同时可提高散热效果及耐冲击强度,相较传统复合基板对于抵抗冲击负荷和承受震动等机械性质及产品可靠度等,都有显著优越的表现,也更加适用于车用领域。When the composite substrate of the present invention is equipped with or encapsulated with a heat source such as a chip, a semiconductor or a power device on the upper ceramic substrate 1, the heat generated by the heat source and the copper metal circuit can be first absorbed by the ceramic substrate, and then quickly heat-conducted to the lower aluminum-based silicon carbide substrate 2 through the active metal solder 3 for absorption, and then released to the outside. Since the thermal resistance of the active metal solder 3 selected in this embodiment is much lower than that of the resin used in the traditional bonding, the heat conduction effect is better, and the aluminum-based silicon carbide substrate 2 with a suitable SiC composition replaces the aluminum metal substrate. Without metallization surface treatment (such as surface electroplating copper, chemical nickel plating, etc.), it can be directly hot-pressed and bonded with the ceramic substrate 1 through the active metal solder 3, and finally a continuous and dense bonding interface with good overall heat dissipation effect is formed, which can not only simplify the composite substrate manufacturing process, but also improve the bonding strength and yield, making the cost cheaper, and at the same time improve the heat dissipation effect and impact resistance. Compared with the traditional composite substrate, it has significantly superior performance in mechanical properties such as resistance to impact load and vibration and product reliability, and is more suitable for the automotive field.
是以,本发明主要提供一种复合基板是以具有适当含量占比的SiC组成的铝基碳化硅基板2取代铝金属基板,并利用其具有高耐热及低热膨胀特性,当承受高温热压时,就可以通过活性金属焊料3直接与陶瓷基板1共同压合形成致密的接合界面,最终形成一无任何接口缝隙或接口剥离的复合基板,且该活性金属焊料是选自银、铜、钛、锌及铝所组成的群组的任一,由于复合基板的接合界面未含有树脂,热传导效果更佳,可减少热量蓄积于陶瓷基板上,整体的散热效果更为良好;另,接合界面缺乏金属化表面处理含有复杂化学组成、收缩膨胀等变异因素所引发界面接合力差、致密性不良等问题,相较传统复合基板常见因为热膨胀变形所引发接口缝隙或界面剥离,更能有效提高其耐冲击的强度,对于抵抗冲击和震动等机械性质及产品可靠度等,都有优越的表现。Therefore, the present invention mainly provides a composite substrate that replaces the aluminum metal substrate with an aluminum-based silicon carbide substrate 2 composed of SiC with an appropriate content ratio, and utilizes its high heat resistance and low thermal expansion characteristics. When subjected to high temperature hot pressing, it can be directly pressed together with the ceramic substrate 1 through the active metal solder 3 to form a dense bonding interface, and finally form a composite substrate without any interface gap or interface peeling, and the active metal solder is selected from any of the group consisting of silver, copper, titanium, zinc and aluminum. Since the bonding interface of the composite substrate does not contain resin, the heat conduction effect is better, the heat accumulation on the ceramic substrate can be reduced, and the overall heat dissipation effect is better; in addition, the bonding interface lacks metallization surface treatment and contains complex chemical composition, shrinkage and expansion and other variation factors caused by poor interface bonding force, poor density and other problems. Compared with the traditional composite substrate that is often caused by thermal expansion deformation and interface gaps or interface peeling, it can more effectively improve its impact resistance, and has superior performance in mechanical properties such as resistance to impact and vibration and product reliability.
上述详细说明为针对本发明一种较佳的可行实施例说明而已,但该实施例并非用以限定本发明的申请专利范围,凡其他未脱离本发明所揭示的技艺精神下所完成的均等变化与修饰变更,均应包含于本发明所涵盖的专利范围中。The above detailed description is only for a preferred feasible embodiment of the present invention, but the embodiment is not used to limit the scope of the patent application of the present invention. All other equivalent changes and modifications that do not deviate from the technical spirit disclosed by the present invention should be included in the patent scope covered by the present invention.
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