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CN113785181A - Oled屏幕点缺陷判定方法、装置、存储介质及电子设备 - Google Patents

Oled屏幕点缺陷判定方法、装置、存储介质及电子设备 Download PDF

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Publication number
CN113785181A
CN113785181A CN202080000368.1A CN202080000368A CN113785181A CN 113785181 A CN113785181 A CN 113785181A CN 202080000368 A CN202080000368 A CN 202080000368A CN 113785181 A CN113785181 A CN 113785181A
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image
oled screen
defect
point
size
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CN202080000368.1A
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王帅
姜立
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BOE Technology Group Co Ltd
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BOE Technology Group Co Ltd
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Publication of CN113785181A publication Critical patent/CN113785181A/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Hardware Design (AREA)
  • Electroluminescent Light Sources (AREA)

Abstract

本申请提出一种OLED屏幕点缺陷判定方法、装置、存储介质及电子设备，该方法包括获取OLED屏幕的图像；将图像转换为YUV图像，并提取YUV图像对应的Y图像；根据Y图像的图像特征，识别OLED屏幕点的缺陷位置的轮廓尺寸，并将轮廓尺寸作为轮廓特征；根据轮廓特征对OLED屏幕点进行缺陷判定。通过本申请能够提升OLED屏幕的缺陷点检测效率，提升检测速度，提升缺陷点检测效果。

Description

PCT国内申请，说明书已公开。

Claims (14)

  1. PCT国内申请，权利要求书已公开。
CN202080000368.1A 2020-03-24 2020-03-24 Oled屏幕点缺陷判定方法、装置、存储介质及电子设备 Pending CN113785181A (zh)

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PCT/CN2020/080945 WO2021189259A1 (zh) 2020-03-24 2020-03-24 Oled屏幕点缺陷判定方法、装置、存储介质及电子设备

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CN113785181A true CN113785181A (zh) 2021-12-10

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Cited By (1)

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CN114264669A (zh) * 2022-03-03 2022-04-01 武汉精立电子技术有限公司 屏幕损伤缺陷检测方法、装置、设备及可读存储介质

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CN113870242A (zh) * 2021-10-12 2021-12-31 京东方（河北）移动显示技术有限公司 一种检测盲孔的方法及设备
CN114627092A (zh) * 2022-03-23 2022-06-14 广东利元亨智能装备股份有限公司 缺陷检测方法、装置、电子设备及可读存储介质
CN114881991B (zh) * 2022-05-24 2025-04-08 上海神剑精密机械科技有限公司 激光错位散斑图像自动判定缺陷的方法及系统
CN117115157B (zh) * 2023-10-23 2024-02-06 湖南隆深氢能科技有限公司 基于pem电解槽的缺陷检测方法、系统、终端设备及介质
CN117237336B (zh) * 2023-11-10 2024-02-23 湖南科技大学 一种金属化陶瓷环缺陷检测方法、系统和可读存储介质
CN118762624A (zh) * 2024-08-13 2024-10-11 苏州优视软件有限公司 基于规则限制的定位液晶屏坏点方法、设备、存储介质

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CN109886952B (zh) * 2019-02-25 2021-04-23 京东方科技集团股份有限公司 一种屏幕缺陷点检测方法及其装置、计算机可读介质
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Publication number Priority date Publication date Assignee Title
KR20130017402A (ko) * 2011-08-10 2013-02-20 주식회사 포스코 열간소재의 표면결함검출장치 및 검출방법
CN105334219A (zh) * 2015-09-16 2016-02-17 湖南大学 一种残差分析动态阈值分割的瓶口缺陷检测方法
CN106204614A (zh) * 2016-07-21 2016-12-07 湘潭大学 一种基于机器视觉的工件外观缺陷检测方法
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CN107678192A (zh) * 2017-07-16 2018-02-09 中科院成都信息技术股份有限公司 一种基于机器视觉的Mura缺陷检测方法及系统
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114264669A (zh) * 2022-03-03 2022-04-01 武汉精立电子技术有限公司 屏幕损伤缺陷检测方法、装置、设备及可读存储介质
CN114264669B (zh) * 2022-03-03 2022-05-17 武汉精立电子技术有限公司 屏幕损伤缺陷检测方法、装置、设备及可读存储介质

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