CN113782650B - 晶圆激光剥离装置及方法 - Google Patents
晶圆激光剥离装置及方法 Download PDFInfo
- Publication number
- CN113782650B CN113782650B CN202111045620.3A CN202111045620A CN113782650B CN 113782650 B CN113782650 B CN 113782650B CN 202111045620 A CN202111045620 A CN 202111045620A CN 113782650 B CN113782650 B CN 113782650B
- Authority
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- China
- Prior art keywords
- wafer
- laser
- light source
- photomask
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Links
- 238000000034 method Methods 0.000 title claims abstract description 29
- 230000007246 mechanism Effects 0.000 claims abstract description 135
- 230000000903 blocking effect Effects 0.000 claims abstract description 40
- 238000007493 shaping process Methods 0.000 claims description 9
- 239000003292 glue Substances 0.000 abstract description 15
- 230000002159 abnormal effect Effects 0.000 abstract description 5
- 230000003287 optical effect Effects 0.000 abstract description 4
- 230000007547 defect Effects 0.000 abstract description 2
- 235000012431 wafers Nutrition 0.000 description 83
- 239000000758 substrate Substances 0.000 description 10
- 239000012790 adhesive layer Substances 0.000 description 8
- 239000010410 layer Substances 0.000 description 8
- 239000000853 adhesive Substances 0.000 description 7
- 230000001070 adhesive effect Effects 0.000 description 7
- 230000000694 effects Effects 0.000 description 7
- 230000008569 process Effects 0.000 description 7
- 229910052594 sapphire Inorganic materials 0.000 description 7
- 239000010980 sapphire Substances 0.000 description 7
- 239000000463 material Substances 0.000 description 6
- 238000005516 engineering process Methods 0.000 description 5
- 230000008859 change Effects 0.000 description 4
- 238000005530 etching Methods 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 230000005856 abnormality Effects 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000010354 integration Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- 229940095676 wafer product Drugs 0.000 description 2
- FOXXZZGDIAQPQI-XKNYDFJKSA-N Asp-Pro-Ser-Ser Chemical compound OC(=O)C[C@H](N)C(=O)N1CCC[C@H]1C(=O)N[C@@H](CO)C(=O)N[C@@H](CO)C(O)=O FOXXZZGDIAQPQI-XKNYDFJKSA-N 0.000 description 1
- 230000003190 augmentative effect Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000004020 luminiscence type Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
- H10H20/011—Manufacture or treatment of bodies, e.g. forming semiconductor layers
- H10H20/018—Bonding of wafers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L21/6836—Wafer tapes, e.g. grinding or dicing support tapes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68381—Details of chemical or physical process used for separating the auxiliary support from a device or wafer
- H01L2221/68386—Separation by peeling
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Laser Beam Processing (AREA)
Abstract
Description
Claims (7)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202111045620.3A CN113782650B (zh) | 2021-09-07 | 2021-09-07 | 晶圆激光剥离装置及方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202111045620.3A CN113782650B (zh) | 2021-09-07 | 2021-09-07 | 晶圆激光剥离装置及方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN113782650A CN113782650A (zh) | 2021-12-10 |
CN113782650B true CN113782650B (zh) | 2024-11-22 |
Family
ID=78841698
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202111045620.3A Active CN113782650B (zh) | 2021-09-07 | 2021-09-07 | 晶圆激光剥离装置及方法 |
Country Status (1)
Country | Link |
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CN (1) | CN113782650B (zh) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN115548173B (zh) * | 2022-09-21 | 2023-08-01 | 东莞市合易自动化科技有限公司 | 一种半导体晶圆将不良晶圆去除的设备 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107452898A (zh) * | 2016-05-31 | 2017-12-08 | 上海微电子装备(集团)股份有限公司 | 一种激光剥离装置和方法 |
CN215988809U (zh) * | 2021-09-07 | 2022-03-08 | 苏州奕格飞半导体技术有限公司 | 晶圆激光剥离装置 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007151319A (ja) * | 2005-11-29 | 2007-06-14 | Tdk Corp | 被覆剥離装置及び被覆剥離方法 |
CN103887157B (zh) * | 2014-03-12 | 2021-08-27 | 京东方科技集团股份有限公司 | 光学掩膜板和激光剥离装置 |
CN107731887B (zh) * | 2017-11-22 | 2020-05-19 | 武汉华星光电半导体显示技术有限公司 | 柔性oled显示面板的制备方法 |
CN117715492A (zh) * | 2018-06-20 | 2024-03-15 | 信越化学工业株式会社 | 转移装置、转移方法、掩膜和显示器的制造方法 |
JP6932676B2 (ja) * | 2018-09-27 | 2021-09-08 | 東レエンジニアリング株式会社 | 転写方法およびこれを用いた画像表示装置の製造方法ならびに転写装置 |
-
2021
- 2021-09-07 CN CN202111045620.3A patent/CN113782650B/zh active Active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107452898A (zh) * | 2016-05-31 | 2017-12-08 | 上海微电子装备(集团)股份有限公司 | 一种激光剥离装置和方法 |
CN215988809U (zh) * | 2021-09-07 | 2022-03-08 | 苏州奕格飞半导体技术有限公司 | 晶圆激光剥离装置 |
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Publication number | Publication date |
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CN113782650A (zh) | 2021-12-10 |
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Effective date of registration: 20241121 Address after: Room 702, 7th Floor, Building 10, Innovation Base, Science and Technology City New Area, Mianyang City, Sichuan Province, 621000 Patentee after: Mianyang Keyun Laser Technology Co.,Ltd. Country or region after: China Address before: 215100 north side of floor 1, building 5, No. 892, Wusong Road, Guoxiang street, Wuzhong Economic Development Zone, Suzhou, Jiangsu Province Patentee before: Suzhou yigefei Semiconductor Technology Co.,Ltd. Country or region before: China |
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