CN113776788A - Parameter testing method and device for laser - Google Patents
Parameter testing method and device for laser Download PDFInfo
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Abstract
The invention provides a parameter testing method and a parameter testing device of a laser, according to the characteristic that the size of a light spot on a horizontal plane where a focus is located is minimum, an approximate range of the focus is determined by a large rough seeking step length in a preset focus range, and then an accurate range of the focus is determined by a fine seeking step length in the approximate range of the focus, so that the focus can be finally found without scanning each point in each plane, the testing time of the focus is greatly reduced, and the testing efficiency is improved.
Description
Technical Field
The invention relates to the field of laser testing, in particular to a method and a device for testing parameters of a laser.
Background
A conventional method for testing a focal length of a semiconductor Laser (LD) is shown in fig. 1, where 1 is a semiconductor Laser, 2 is an optical fiber, and 3 is a Laser detector, and a Laser beam emitted by the semiconductor Laser 1 is coupled and emitted to the Laser detector through the optical fiber 2, and is generally coupled through the optical fiber 2 and emitted through a focusing system (not shown in the figure) by a manual coupling stage or a self-coupling stage. The laser device is characterized in that a laser beam forms a light spot with the minimum size at the focal position of the laser device and reaches the maximum light power, and the focal point of the laser device is positioned and measured by scanning the light power of each point of the laser beam emitted by the laser device through optical fiber coupling in the horizontal plane at different heights, so that the focal distance of the laser device is finally obtained. However, this method needs to measure the optical power of each point in a plurality of planes at different heights to find the point with the maximum optical power, so the efficiency is very low, and the testing efficiency is seriously affected.
Therefore, the invention provides a parameter testing method and device of a laser, which can find the focus of the laser at a higher speed and improve the testing efficiency.
Disclosure of Invention
In order to solve the above problems, embodiments of the present invention provide a method and an apparatus for testing parameters of a laser.
In a first aspect, an embodiment of the present invention provides a method for testing parameters of a laser, including:
determining a fine seeking stepping length according to the preset focal length precision;
determining a rough seek step length according to the preset focal length range, wherein the rough seek step length is greater than the fine seek step length;
within the preset focal length range, gradually obtaining the spot sizes in the horizontal plane under a plurality of different first heights in a stepwise and progressive manner in the vertical direction by the rough step length;
if the change trend of the spot sizes in the horizontal planes under the three continuous different first heights is changed from big to small and big, the spot sizes in the horizontal planes under a plurality of different second heights are gradually obtained in a stepwise manner in the vertical direction by the fine seeking step length within the height range covered by the three continuous different first heights;
and if the change trend of the sizes of the light spots in the horizontal planes at the three continuous different second heights is changed from small to large, taking the horizontal plane at the second height of the three continuous different second heights as the horizontal plane where the focus of the laser is located to obtain the focal length of the laser.
In some embodiments, the parametric test method further comprises:
measuring the sizes of light spots in a horizontal plane at a plurality of different third heights near the horizontal plane where the focus is located;
and drawing a fitting curve according to the plurality of different third heights and the sizes of the light spots in the horizontal plane under the plurality of different third heights so as to correct the actual height of the horizontal plane where the focal point of the laser is located.
In some embodiments, the determining a rough step length according to the preset focal length range specifically includes:
establishing a total step function equation corresponding to the sum of the coarse step number and the fine step number according to the preset focal length range, the fine step length and the relationship between the fine step length and the coarse step length;
and (4) performing derivation on the total step function equation to minimize the total step, and acquiring the coarse seeking step length corresponding to the minimum total step.
In some embodiments, acquiring the spot size of the laser beam in the horizontal plane at each of the different heights specifically includes:
shooting horizontal plane images of the laser beam at different heights through an infrared camera, and determining the position of a light power peak value in a horizontal plane at each height;
and acquiring the spot position and the spot size in the horizontal plane under each height according to the optical power peak position in the horizontal plane under each height.
In some embodiments, the parametric test method further comprises:
and acquiring a horizontal direction divergence angle and a vertical direction divergence angle of the laser according to the three-dimensional coordinate of the focus and the three-dimensional coordinate of the edge of the light spot in the other horizontal plane with the height different from that of the horizontal plane in which the focus is positioned.
In some embodiments, the parametric test method further comprises:
and acquiring a horizontal deflection angle and a vertical deflection angle of the laser according to the three-dimensional coordinate of the focus and the three-dimensional coordinate of any point in a plane vertical to the horizontal plane where the focus is located.
In a second aspect, an embodiment of the present invention provides a parameter testing apparatus for a laser, including:
the fine seeking stepping length determining module is used for determining the fine seeking stepping length according to the preset focal length precision;
the rough seek step length determining module is used for determining the rough seek step length according to the preset focal length range;
the rough seeking module is used for gradually obtaining the sizes of light spots in a horizontal plane under a plurality of different first heights in a vertical direction in a progressive mode according to the rough seeking stepping length within the preset focal length range;
the fine searching module is used for gradually obtaining the light spot sizes in the horizontal planes at a plurality of different second heights in a vertical direction by the fine searching step length within the height range covered by the three continuous different first heights if the change trend of the light spot sizes in the horizontal planes at the three continuous different first heights is changed from big to small to big;
and the focal length obtaining module is used for taking the horizontal plane at the second height of the three continuous different second heights as the horizontal plane where the focal point of the laser is located to obtain the focal length of the laser if the change trend of the sizes of the light spots in the horizontal planes at the three continuous different second heights is changed from big to small to big.
In some embodiments, the parametric test device further comprises a correction module;
the correction module is used for measuring the sizes of light spots in a plurality of different horizontal planes at a third height near the horizontal plane where the focus is located; and drawing a fitting curve according to the plurality of different third heights and the spot sizes in the horizontal plane at the plurality of different third heights so as to correct the actual height of the horizontal plane where the focal point of the laser is located.
In a third aspect, an embodiment of the present invention provides an electronic device, which includes a memory, a processor, and a computer program stored in the memory and executable on the processor, where the processor executes the computer program to implement the method for testing the parameters of the laser as described above.
In a fourth aspect, an embodiment of the present invention provides a computer storage medium, on which a computer program is stored, which, when executed by a processor, implements the method for testing the parameters of a laser as described above.
According to the method and the device for testing the parameters of the laser, provided by the embodiment of the invention, according to the characteristic that the size of a light spot on a horizontal plane where the focus is located is minimum, the approximate range of the focus is determined by a larger rough seeking step length within the preset focus range, and then the accurate range of the focus is determined by a fine seeking step length within the approximate range of the focus, so that the focus can be finally found without scanning each point in each plane, the test time of the focus is greatly reduced, and the test efficiency is improved.
Drawings
The technical solution and other advantages of the present invention will become apparent from the following detailed description of specific embodiments of the present invention, which is to be read in connection with the accompanying drawings.
FIG. 1 is a schematic diagram of a prior art coupling station;
fig. 2 is a schematic flowchart of a method for testing parameters of a laser according to an embodiment of the present invention;
fig. 3 is a schematic diagram of scanning horizontal planes at different heights by the parameter testing method of the laser according to the embodiment of the present invention;
FIG. 4 is a schematic diagram of a fit curve plotted against spot sizes in a horizontal plane at a plurality of different third heights and a plurality of different third heights, according to an embodiment of the present invention;
FIG. 5 is a schematic diagram of a method for testing the divergence angle of a laser according to the present invention;
FIG. 6 is a schematic diagram of a method for testing a deflection angle of a laser according to an embodiment of the present invention;
fig. 7 is a schematic structural diagram of a parameter testing apparatus of a laser according to an embodiment of the present invention;
fig. 8 is a schematic structural diagram of an electronic device according to an embodiment of the present invention.
Detailed Description
The technical solution in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. It is to be understood that the described embodiments are merely exemplary of the invention, and not restrictive of the full scope of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
At present, when the focal length of a laser is measured, the point with the maximum optical power can be found only by measuring the optical power of each point of a laser beam emitted by the laser in a horizontal plane at different heights, so that the focal point of the laser is found.
In view of the above, as shown in fig. 2, an embodiment of the present invention provides a method for testing parameters of a laser, including:
s1, determining the fine seeking step length according to the preset focal length precision;
specifically, the focal length accuracy of the laser generally has a requirement, and the fine seek step length is determined according to a preset focal length accuracy under the condition that the measurement error of the beam analyzer is smaller than the required measurement accuracy.
S2, determining a coarse seek step length according to a preset focal length range, wherein the coarse seek step length is greater than the fine seek step length;
specifically, the qualified range of the focal length of the laser is also required, and if no focus is found in the qualified range of the required focal length, it is indicated that the focal length of the laser does not meet the requirement, so that the rough step length is determined in the preset focal length range.
It will be appreciated that the acceptable range of focal lengths for lasers is typically tens of times the accuracy of the focal length, so that the coarse seek step length is greater than the fine seek step length.
It should be noted that the horizontal planes of the first height, the second height and the third height in the following embodiments are all part of the horizontal planes of different heights in fig. 3 (e.g., the horizontal planes 101, 102, 103 and 104, etc., and the small circle in each horizontal plane is the light spot in the horizontal plane), and the first height, the second height and the third height are only different categories set for explaining the rough search process and the fine search process. Wherein, the vertical direction, namely Z axis, is along the emitting direction of the laser beam, and the horizontal plane, namely XY axis plane, is perpendicular to the emitting direction of the laser beam.
S3, gradually obtaining the spot sizes in the horizontal plane under a plurality of different first heights in a vertical direction (Z axis) by the rough step length within a preset focal length range;
specifically, within a preset focal length range, the light spot size in the horizontal plane at each different first height is obtained by gradually stepping to each different first height in the vertical direction by the rough stepping length.
S4, if the change trend of the spot sizes in the horizontal planes at three consecutive different first heights is changed from big to small to big, the spot sizes in the horizontal planes at a plurality of different second heights are obtained step by step in the vertical direction by the fine step length within the height range covered by the three consecutive different first heights;
specifically, according to the principle that the spot size of the horizontal plane on which the focus is located is the smallest, that is, the spot size from the spot size far away from the plane on which the focus is located to the plane close to the focus is gradually decreased, and the spot size from the spot size near the plane on which the focus is located to the plane far away from the focus is gradually increased, when the horizontal planes at three consecutive different first heights are gradually increased by the rough step length, the spot size from the horizontal plane at the first height to the horizontal plane at the second first height is gradually decreased, and the spot size from the horizontal plane at the second first height is increased, it is described that the plane on which the focus (the smallest spot) is located from the horizontal plane at the first height to the horizontal plane at the third first height.
Further, the spot size in the horizontal plane at a plurality of second heights is acquired in stepwise vertical increments with a fine step length between the first height and the third first height.
And S5, if the change trend of the spot size in the horizontal planes at the three continuous different second heights is changed from small to large, taking the horizontal plane at the second height of the three continuous different second heights as the horizontal plane where the focus of the laser is located to obtain the focal length of the laser.
Specifically, when the horizontal planes at three consecutive different second heights are stepped by the fine stepping length, the light spot in the horizontal plane at the first second height decreases from large to small, and the light spot in the horizontal plane at the second height increases from small to large, so that the plane where the focus (the minimum light spot) is located in the horizontal planes from the first second height to the third second height, and the horizontal plane at the second height is used as the horizontal plane where the focus of the laser is located, so as to obtain the focal length of the laser.
According to the method and the device for testing the parameters of the laser, the approximate range of the focal length is determined by the larger rough seeking step length within the preset focal length range according to the characteristic that the size of the light spot of the horizontal plane where the focal point is located is the smallest, and then the accurate range of the focal length is determined by the fine seeking step length within the approximate range of the focal length, so that the focal point can be finally found without scanning each point in each plane, the testing time of the focal length is greatly reduced, and the testing efficiency is improved.
Based on the above embodiment, in step S5, the parameter testing method further includes:
s51, measuring the sizes of light spots in a horizontal plane at a plurality of different third heights near the horizontal plane where the focus is located;
and S52, drawing a fitting curve according to the spot sizes in the horizontal planes at the plurality of different third heights and the plurality of different third heights so as to correct the actual height of the horizontal plane where the focal point of the laser is located.
It should be noted that, since the level of the focus point is located between the level at the first second height and the level at the third second height in step S5, the level at the second height may not be the most accurate level of the focus point. Therefore, the plane of the most accurate focus can be determined by drawing a curve fitting the height and the spot size.
Specifically, as shown in fig. 4, a fitting curve is drawn for a plurality of different third heights (heights h1, h2, h3, h4, h5, h6, etc.) near the horizontal plane where the focus is located and the spot sizes in the horizontal planes at the plurality of different third heights, so as to fit a height h7 corresponding to the horizontal plane where the spot is smallest, and the height is taken as the actual plane where the focus is located, so as to correct the height of the horizontal plane where the focus is located, which is obtained in step S5.
Based on the above embodiment, in step S2, determining the rough step length according to the preset focal length range specifically includes:
s21, establishing a total step function equation corresponding to the sum of the coarse step number and the fine step number according to the preset focal length range, the fine step length and the relationship between the fine step length and the coarse step length;
and S22, deriving the function equation of the total step number to minimize the total step number, and acquiring the rough step length corresponding to the minimum total step number.
It should be noted that, since the fine seek length is determined by the preset focal length accuracy, the fine seek length mainly affects the finally determined focal length accuracy, and the coarse seek length determines the speed of initially determining the fine seek range within the preset focal length range, and therefore the coarse seek length mainly affects the test speed.
In this embodiment, the sum of the coarse seek step number and the fine seek step number is the total step number required by scanning, and the total step number determines the final test speed. Therefore, the total step function equation can be established by presetting the focal length range and the fine seek step length based on the relationship between the fine seek step length and the coarse seek step length, and then deriving the total step function equation to obtain the minimum total step number, thereby obtaining the coarse seek step length which can minimize the total step number.
Specifically, a coarse seek step length is set to be l2, and a fine seek step length is set to be l1, wherein l2= N × l 1; the preset focal length range is L1, the preset focal length range is L, the rough seek step number is L/L2, i.e., L/(N × L1), the height range covered by the first height level and the second first height level determined by rough seek is 2 times the rough seek step length 2 × L2, i.e., 2N × L1, and thus the fine seek step number is 2N, thereby establishing a total step number function equation as: f (N) = L/(N × L1) + 2N.
Further, the total step function equation f (N) = L/(N × L1) +2N is derived to obtain the minimum value of N, i.e., 2-L /（N 2 *l1）=0Obtaining:
if L =2mm, L1=0.01mm, then N =10, and the coarse seek step length L2 is 0.1mm, i.e., with a coarse seek step length of 0.1mm, the minimum total number of steps can be obtained, so that the test speed is optimized.
Based on the above embodiment, in each step, acquiring the spot size of the laser beam in the horizontal plane at each different height specifically includes:
horizontal plane images of the laser beam at different heights are shot through an infrared camera (not shown in the figure), and the position of the peak value of the optical power in the horizontal plane at each height is determined;
and acquiring the spot position and the spot size in the horizontal plane under each height according to the optical power peak position in the horizontal plane under each height.
Specifically, the wavelength of the semiconductor laser is usually above 800nm, which is invisible light, so that the conventional method for measuring the focal length needs to scan all points in each horizontal plane to find the point with the maximum optical power, which is time-consuming. Therefore, in the embodiment, an infrared camera capable of shooting 700-2000 nm wavelength is selected, the infrared camera is bound to the vertical axis (Z axis) to move up and down, so as to shoot images of each horizontal plane, the optical power peak position of each horizontal plane at each height is obtained, and then the light spot position in each horizontal plane at each height is determined according to the optical power peak position in each horizontal plane at each height, so as to obtain the light spot size.
That is to say, this embodiment can be through binding infrared camera to the Z axle, then the position of adjustment infrared camera in the Z axle to shoot the image of each not horizontal plane of co-altitude, test the luminous power peak position in each not horizontal plane of co-altitude according to image analysis, thereby confirm facula position and the facula size in each not horizontal plane of co-altitude, improve efficiency of software testing greatly. That is, the speed of determining the plane of the focal point in the vertical direction is increased in steps S1 to S5, and the speed of searching for the spot in each horizontal plane with different heights is increased in the present embodiment, so that the speed of searching for the focal point and determining the focal distance can be further increased compared with the prior art on the basis of steps S1 to S5.
Based on the above embodiment, the parameter testing method further includes:
and S6, acquiring the horizontal direction divergence angle and the vertical direction divergence angle of the laser according to the three-dimensional coordinates of the focus and the three-dimensional coordinates of the edge of the light spot in another horizontal plane with the height different from that of the horizontal plane in which the focus is positioned.
It should be noted that, in order to ensure accurate acquisition of the actual divergence angle of the laser, another plane is generally selected which is farther away from the focal point.
For example, according to the fact that the laser beam emitted by the laser is a gaussian beam, fig. 5 shows a longitudinal section of the laser beam, and the three-dimensional coordinates of the focal point O are (0, 0, 0), the center of the spot of the other horizontal plane 20 is O1, the edge of the spot of the other horizontal plane 20 in the longitudinal section is the point B and the point C, and the three-dimensional coordinates of the point B or the point C are (x1, y1, z 1).
If the vertical distance between the plane 10 where the focal point O is located and the other horizontal plane 20 is H (i.e., z 1), when the divergence angle θ 1 in the horizontal direction (X direction) of the laser is determined, the following is obtained from tan (θ 1/2) = X1/z 1: θ 1=2arctan (x 1/H); similarly, when the vertical direction (Y direction) divergence angle θ 2 of the laser is obtained, θ 2=2arctan (Y1/H).
Based on the above embodiment, the parameter testing method further includes:
and S7, acquiring the horizontal deflection angle and the vertical deflection angle of the laser according to the three-dimensional coordinates of the focus and the three-dimensional coordinates of any point in a plane vertical to the horizontal plane where the focus is located.
It should be noted that, ideally, the laser beam emitted by the laser is emitted vertically to the light-emitting plane (i.e. each horizontal plane), but actually, due to errors, the laser beam may not be absolutely perpendicular to each horizontal plane, but may have a certain angle with each horizontal plane, that is, the drift angle of the laser.
Specifically, as shown in fig. 5, there is a plane (indicated by a dotted line passing through the point O of the plane 10 where the focal point is located in fig. 5) perpendicular to the plane 10 where the focal point is located, and the coordinate of any point D in the plane is (x 2, y2, z 2) (not shown in fig. 5). As shown in fig. 6, if the projection of the point D on the horizontal plane (XY-axis plane) is point E, the projection of the point E on the X-axis is point G, and the projection of the point E on the Y-axis is point F, the off-angle of the laser in the horizontal direction (X-direction) is:
θ3=arctan(OG / DE)=arctan(x2 / z2) The declination angle of the laser in the vertical direction (Y direction) is:
θ4=arctan(OF / DE)=arctan(y2 / z2)。
based on the foregoing embodiments, as shown in fig. 7, an embodiment of the present invention further provides a testing apparatus for a laser, including:
a fine seek step length determining module 701, configured to determine a fine seek step length according to a preset focal length precision;
a rough seek step length determination module 702, configured to determine a rough seek step length according to a preset focal length range;
the rough seeking module 703 is configured to gradually obtain, in a preset focal length range, light spot sizes in a horizontal plane at a plurality of different first heights in a vertical direction by a rough seeking step length;
the fine searching module 704 is configured to, if the trend of change of the spot sizes in the horizontal planes at three consecutive different first heights changes from small to large, gradually obtain the spot sizes in the horizontal planes at multiple different second heights in a stepwise manner in the vertical direction by the fine searching step length within the height range covered by the three consecutive different first heights;
the focal length obtaining module 705 is configured to, if a variation trend of the spot size in the horizontal plane at the consecutive three different second heights changes from small to large, use the horizontal plane at the second height of the consecutive three different second heights as the horizontal plane where the focal point of the laser is located, so as to obtain the focal length of the laser.
Furthermore, the parameter testing device of the laser also comprises a correction module;
the correction module is used for measuring the sizes of light spots in a horizontal plane at a plurality of different third heights near the horizontal plane where the focus is located; and drawing a fitting curve according to the plurality of different third heights and the spot sizes in the horizontal plane at the plurality of different third heights so as to correct the actual height of the horizontal plane where the focal point of the laser is located.
Fig. 8 is a schematic structural diagram of an electronic device according to an embodiment of the present invention, and as shown in fig. 8, the embodiment provides an electronic device, which may include: a processor (processor)801, a communication Interface (Communications Interface)802, a memory (memory)803 and a communication bus 804, wherein the processor 801, the communication Interface 802 and the memory 803 complete communication with each other through the communication bus 804. The communication interface 802 may be used for information transmission between the server and the smart tv. The processor 801 may call logic instructions in the memory 803 to perform methods including, for example: s1, determining the fine seeking step length according to the preset focal length precision; s2, determining a coarse seek step length according to the preset focal length range, wherein the coarse seek step length is greater than the fine seek step length; s3, gradually obtaining the spot sizes in the horizontal plane under a plurality of different first heights in a vertical direction by the rough step length within the preset focal length range; s4, if the change trend of the spot sizes in the horizontal planes at three consecutive different first heights is changed from big to small to big, in the height range covered by the three consecutive different first heights, the spot sizes in the horizontal planes at a plurality of different second heights are gradually obtained in a stepwise manner in the vertical direction by the fine seeking step length; and S5, if the change trend of the spot size in the horizontal plane under the three continuous different second heights is changed from small to large, taking the horizontal plane under the second height of the three continuous different second heights as the horizontal plane where the focus of the laser is located, so as to obtain the focal length of the laser.
The present embodiments also provide a computer program product comprising a computer program stored on a non-transitory computer-readable storage medium, the computer program comprising program instructions that, when executed by a computer, enable the computer to perform the methods provided by the above-described method embodiments, for example, including: s1, determining the fine seeking step length according to the preset focal length precision; s2, determining a coarse seek step length according to the preset focal length range, wherein the coarse seek step length is greater than the fine seek step length; s3, gradually obtaining the spot sizes in the horizontal plane under a plurality of different first heights in a vertical direction by the rough step length within the preset focal length range; s4, if the change trend of the spot sizes in the horizontal planes at three consecutive different first heights is changed from big to small to big, in the height range covered by the three consecutive different first heights, the spot sizes in the horizontal planes at a plurality of different second heights are gradually obtained in a stepwise manner in the vertical direction by the fine seeking step length; and S5, if the change trend of the spot size in the horizontal plane under the three continuous different second heights is changed from small to large, taking the horizontal plane under the second height of the three continuous different second heights as the horizontal plane where the focus of the laser is located, so as to obtain the focal length of the laser.
The present embodiments also provide a non-transitory computer-readable storage medium storing computer instructions that cause the computer to perform the methods provided by the above method embodiments, for example, including: s1, determining the fine seeking step length according to the preset focal length precision; s2, determining a coarse seek step length according to the preset focal length range, wherein the coarse seek step length is greater than the fine seek step length; s3, gradually obtaining the spot sizes in the horizontal plane under a plurality of different first heights in a vertical direction by the rough step length within the preset focal length range; s4, if the change trend of the spot sizes in the horizontal planes at three consecutive different first heights is changed from big to small to big, in the height range covered by the three consecutive different first heights, the spot sizes in the horizontal planes at a plurality of different second heights are gradually obtained in a stepwise manner in the vertical direction by the fine seeking step length; and S5, if the change trend of the spot size in the horizontal plane under the three continuous different second heights is changed from small to large, taking the horizontal plane under the second height of the three continuous different second heights as the horizontal plane where the focus of the laser is located, so as to obtain the focal length of the laser.
The above-described embodiments of the apparatus are merely illustrative, and the units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment. One of ordinary skill in the art can understand and implement it without inventive effort.
Through the above description of the embodiments, those skilled in the art will clearly understand that each embodiment can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware. With this understanding in mind, the above-described technical solutions may be embodied in the form of a software product, which can be stored in a computer-readable storage medium such as ROM/RAM, magnetic disk, optical disk, etc., and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute the methods described in the embodiments or some parts of the embodiments.
In the foregoing embodiments, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments.
The above description of the embodiments is only for helping understanding the technical solution of the present invention and its core idea; those of ordinary skill in the art will understand that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (10)
1. A method for testing parameters of a laser, comprising:
determining a fine seeking stepping length according to the preset focal length precision;
determining a rough seek step length according to the preset focal length range, wherein the rough seek step length is greater than the fine seek step length;
within the preset focal length range, gradually obtaining the spot sizes in the horizontal plane under a plurality of different first heights in a stepwise and progressive manner in the vertical direction by the rough step length;
if the change trend of the spot sizes in the horizontal planes under the three continuous different first heights is changed from big to small and big, the spot sizes in the horizontal planes under a plurality of different second heights are gradually obtained in a stepwise manner in the vertical direction by the fine seeking step length within the height range covered by the three continuous different first heights;
and if the change trend of the sizes of the light spots in the horizontal planes at the three continuous different second heights is changed from small to large, taking the horizontal plane at the second height of the three continuous different second heights as the horizontal plane where the focus of the laser is located to obtain the focal length of the laser.
2. The method for parametric testing of a laser of claim 1, further comprising:
measuring the sizes of light spots in a horizontal plane at a plurality of different third heights near the horizontal plane where the focus is located;
and drawing a fitting curve according to the plurality of different third heights and the sizes of the light spots in the horizontal plane under the plurality of different third heights so as to correct the actual height of the horizontal plane where the focal point of the laser is located.
3. The method for testing parameters of a laser according to claim 1, wherein said determining a rough step length according to the preset focal length range specifically comprises:
establishing a total step function equation corresponding to the sum of the coarse step number and the fine step number according to the preset focal length range, the fine step length and the relationship between the fine step length and the coarse step length;
and (4) performing derivation on the total step function equation to minimize the total step, and acquiring the coarse seeking step length corresponding to the minimum total step.
4. The method for parametric measurement of a laser according to claim 1, wherein the obtaining of the spot size of the laser beam in each horizontal plane at different heights comprises:
shooting horizontal plane images of the laser beam at different heights through an infrared camera, and determining the position of a light power peak value in a horizontal plane at each height;
and acquiring the spot position and the spot size in the horizontal plane under each height according to the optical power peak position in the horizontal plane under each height.
5. The method for parametric testing of a laser of claim 1, further comprising:
and acquiring a horizontal direction divergence angle and a vertical direction divergence angle of the laser according to the three-dimensional coordinate of the focus and the three-dimensional coordinate of the edge of the light spot in the other horizontal plane with the height different from that of the horizontal plane where the focus is located.
6. The method for parametric testing of a laser of claim 1, further comprising:
respectively acquiring the three-dimensional coordinate of the focus and the three-dimensional coordinate of any point in a plane vertical to the horizontal plane where the focus is located;
and acquiring a horizontal deflection angle and a vertical deflection angle of the laser according to the focus and the three-dimensional coordinates of any point in a plane vertical to the horizontal plane where the focus is located.
7. A parametric test device for a laser, comprising:
the fine seeking stepping length determining module is used for determining the fine seeking stepping length according to the preset focal length precision;
the rough seek step length determining module is used for determining the rough seek step length according to the preset focal length range;
the rough seeking module is used for gradually obtaining the sizes of light spots in a horizontal plane under a plurality of different first heights in a vertical direction in a progressive mode according to the rough seeking stepping length within the preset focal length range;
the fine searching module is used for gradually obtaining the light spot sizes in the horizontal planes at a plurality of different second heights in a vertical direction by the fine searching step length within the height range covered by the three continuous different first heights if the change trend of the light spot sizes in the horizontal planes at the three continuous different first heights is changed from big to small to big;
and the focal length obtaining module is used for taking the horizontal plane at the second height of the three continuous different second heights as the horizontal plane where the focal point of the laser is located to obtain the focal length of the laser if the change trend of the sizes of the light spots in the horizontal planes at the three continuous different second heights is changed from big to small to big.
8. The parametric test device of claim 7, further comprising a correction module;
the correction module is used for measuring the sizes of light spots in a plurality of different horizontal planes at a third height near the horizontal plane where the focus is located; and drawing a fitting curve according to the plurality of different third heights and the spot sizes in the horizontal plane at the plurality of different third heights so as to correct the actual height of the horizontal plane where the focal point of the laser is located.
9. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor implements the method for parametric testing of a laser according to any of claims 1-6 when executing the computer program.
10. A computer-readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out a method for parametric testing of a laser according to any one of claims 1 to 6.
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