CN113645464A - Test system for testing cameras and method for testing cameras - Google Patents
Test system for testing cameras and method for testing cameras Download PDFInfo
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- CN113645464A CN113645464A CN202110997551.XA CN202110997551A CN113645464A CN 113645464 A CN113645464 A CN 113645464A CN 202110997551 A CN202110997551 A CN 202110997551A CN 113645464 A CN113645464 A CN 113645464A
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Abstract
本申请公开了用于检测摄像头的测试系统和检测摄像头的方法。该测试系统，包括：测试图案、载体，其中，载体用于展示测试图案；测试图案包括周围区域和与周围区域颜色不同的一个中心区域，其中，中心区域为矩形，周围区域环绕中心区域，且周围区域与中心区域的交界线为矩形的边，周围区域为黑色。应用测试系统检测摄像头的方法，可以不用更换载体就可以检测摄像头清晰度、光轴偏移度和摄像头旋转角度。
The present application discloses a test system for detecting a camera and a method for detecting a camera. The test system includes: a test pattern and a carrier, wherein the carrier is used to display the test pattern; the test pattern includes a surrounding area and a central area with a different color from the surrounding area, wherein the central area is a rectangle, and the surrounding area surrounds the central area, and The boundary line between the surrounding area and the central area is the side of the rectangle, and the surrounding area is black. By applying the method of testing the camera to the test system, the clarity of the camera, the deviation of the optical axis and the rotation angle of the camera can be detected without changing the carrier.
Description
Technical Field
The application relates to the technical field of camera detection, in particular to a test system for detecting a camera and a method for detecting the camera.
Background
In a head-mounted electronic apparatus, a camera is an extremely important component. The camera mounted in the head-mounted electronic device needs to be retested for the parameter index, because the mounting process of the head-mounted electronic device and the like usually has a certain influence on the camera. The test chart is commonly used in the related technology for testing different parameter indexes of the camera, for example, the definition test chart of the camera and the optical axis offset test chart of the camera. When index testing is performed on a camera in a head-mounted electronic device or the like, different test charts are generally used for different test indexes.
Disclosure of Invention
The embodiment of the application provides a test system for detecting a camera and a method for detecting the camera.
In a first aspect, the present application provides a test system for detecting a camera, including: the test device comprises a test pattern and a carrier, wherein the carrier is used for displaying the test pattern; the test pattern comprises a peripheral area and a central area with a color different from that of the peripheral area, wherein the central area is rectangular, the peripheral area surrounds the central area, the boundary line between the peripheral area and the central area is a rectangular side, and the peripheral area is black.
In a second aspect, the present application further provides a method for detecting a camera, where the method for detecting a camera uses the foregoing test system for detecting a camera, and includes: controlling a camera to be tested to shoot a test pattern to obtain a test image, wherein the central area in the test image comprises four edges; acquiring a test image, and determining a target region aiming at any one of four sides in the test image so that the target region comprises at least part of the side; and determining the definition of the camera to be detected based on each target area.
In a third aspect, the present application further provides a method for detecting a camera, which performs detection by using the foregoing test system for detecting a camera, where a test pattern includes at least one test point; the method comprises the following steps: controlling a camera to be tested to shoot a test pattern to obtain a test image; acquiring a test image, and determining a central point of the test image; determining a first distance between a camera to be detected and a central point; for a test point of the obtained at least one test point, executing the following sub-offset angle determination steps: detecting the test point in the obtained test image; determining a second distance between the camera to be tested and the test point; determining a sub-offset angle of the camera to be tested relative to the test point based on the first distance and the second distance; and obtaining the offset angle of the camera to be detected based on the determined sub offset angle.
In a fourth aspect, the present application further provides a method for detecting a camera, which performs detection by using the test system for detecting a camera, where the test pattern includes at least two test points; the method comprises the following steps: controlling a camera to be tested to shoot a test pattern to obtain a test image; acquiring a test image, and determining the coordinate value of each test point in a preset coordinate system in the test image; aiming at any two test points of at least two test points in a test image, determining the sub-rotation angle of the camera to be tested based on the coordinate values of the two test points; and determining the rotation angle of the camera to be measured based on the determined sub-rotation angles.
By adopting the test system and the method for detecting the camera by adopting the test system, the peripheral area of the test pattern is set to be black, the central area is a rectangle with a color different from that of black, the test of indexes such as definition, dirt and the like can be carried out by the edges of the rectangle and other relevant parameters set by the application rectangle, namely, when the camera is detected by adopting the test system, the test of each index of the camera can be carried out without replacing a test card, and the test is convenient and simple. And the surrounding area of the test pattern is black, so that the phenomenon that the periphery of the test image which is acquired by the camera and used for testing each index is blackened (or called shading phenomenon or dark corner phenomenon) can be avoided.
Drawings
Other features, objects, and advantages of the disclosure will become apparent from a reading of the following detailed description of non-limiting embodiments which proceeds with reference to the accompanying drawings.
FIG. 1 is a schematic block diagram of one embodiment of a test system for detecting a camera according to the present application;
FIG. 2 is a schematic block diagram of another embodiment of a test system for detecting a camera according to the present application;
FIG. 3 is a schematic block diagram of yet another embodiment of a test system for detecting cameras according to the present application;
FIG. 4 is a schematic block diagram of yet another embodiment of a test system for detecting cameras according to the present application;
FIG. 5 is a schematic flow chart diagram of one embodiment of a method for detecting a camera according to the present application;
FIG. 6 is a schematic flow chart diagram of another embodiment of a method for detecting a camera according to the present application;
fig. 7 is a schematic structural diagram for determining an optical axis offset angle of a camera in the method for detecting a camera according to the present embodiment;
fig. 8 is a schematic flow chart diagram of yet another embodiment of a method for detecting a camera according to the present application.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the technical solutions of the present application will be described in detail and completely with reference to the following specific embodiments of the present application and the accompanying drawings. It is to be understood that the specific embodiments described herein are merely illustrative of the relevant invention and not restrictive of the invention. It should be noted that, for convenience of description, only the portions related to the related invention are shown in the drawings.
It should be noted that, in the present disclosure, the embodiments and features of the embodiments may be combined with each other without conflict. The present disclosure will be described in detail below with reference to the accompanying drawings in conjunction with embodiments.
Referring to FIG. 1, a schematic diagram of one embodiment of a test system for inspecting cameras according to the present application is shown. In this embodiment, the test system for detecting a camera may include: test pattern 1, carrier 2, as shown in fig. 1. The carrier 2 may be various forms of carriers for displaying test patterns, among others. For example, the carrier may be a paper card, and the test pattern may be printed and displayed on the paper card to form a test card. The carrier may also be an electronic display device such as a computer monitor, an electronic display screen of a tablet computer, etc., and the test pattern may be directly displayed on the electronic display device, as shown in fig. 1. It will be appreciated that the system described above may also be used to display the test pattern in other forms, such as by transferring the test pattern directly onto a wall, plate, curtain or other support having a planar surface, in which case the support may be considered a carrier.
In this embodiment, the test pattern 1 may include a central area a and a peripheral area B, as shown in fig. 1, wherein the central area a may be rectangular and has a color different from that of the peripheral area B. The peripheral region B may be black, and thus the central region a may be another color than black, for example, white. The peripheral region B may surround the central region a, as shown in fig. 1, and a boundary line formed by the intersection of the central region a and the peripheral region B is a rectangular side of the central region a. As shown in fig. 1, the boundary between the central area a and the peripheral area B may form four sides of a rectangle, i.e., a first side, a second side, a third side, and a fourth side. It can be understood that, in this embodiment, the color of the central area a is different from that of the peripheral area B, and the peripheral area B is black, so that the first edge, the second edge, the third edge and the fourth edge of the bright-dark boundary can be formed, and thus, each edge of the bright-dark boundary can be used for testing the definition of the camera.
In some optional implementations of the present embodiment, the central area a may be white, as shown in fig. 1. It is understood that the central area a is set to white and the peripheral area B is set to black, so that the degree of contrast in the vicinity of the boundary formed by the central area and the peripheral area can be made larger. Therefore, the definition of the camera can be more accurately tested by the test image obtained by the camera to be tested performing image acquisition on the test pattern. The central area a may also be used to match other colors of the camera, and there is no limitation, for example, the camera is purple light or blue light for a specific ward. Here, the camera to be measured may be, for example, a camera mounted on a head-mounted electronic apparatus in general.
In the related art, the periphery of the test graphic card is usually white, so that when the camera to be tested collects the test image, the collected test image is prone to blacking, and the accuracy of the test index obtained by frame calculation is reduced. In the scheme provided by this embodiment, the peripheral area B is black, and when a camera to be tested (especially a wide-angle camera) uses the test pattern to perform tests on test indexes such as definition, the periphery of an acquired test image is originally black, so that the problem that the periphery of the test image acquired by the camera to be tested is blackened is avoided.
In the related art, the problem of blackening around the test image is generally more apparent the farther to the boundary. When the definition is tested, the ROI area intercepted from the acquired test image uses the test pattern displayed in the test system, so that the white area of the ROI area faces inwards, the black area faces outwards, and the probability that the RIO area is influenced by shading can be reduced.
In the test system provided by the above embodiment of the present application, the test pattern may include, for example, a white central area a and a black peripheral area B, as shown in fig. 1, so that a boundary line formed by the central area a and the peripheral area B in the test pattern may be used to detect the definition of the camera, and the central area a in the test card may be used to detect an index of whether the camera is dirty or not, so that the camera may complete the test of the camera without replacing the displayed test pattern at least when detecting the indexes of the definition, whether the camera is dirty or not. And the surrounding area B is black, so that the problem that the surrounding of the test image acquired by the camera is blackened can be avoided.
In some alternative embodiments, the test pattern may have a size a, the central area a may have a size B, and the peripheral area B may have a size c. Wherein a, b and c are positive numbers, b is more than or equal to 0.25a and less than or equal to 0.75a, and c is more than 0.25b and less than or equal to a-b. The size here can be understood as an area because the area of the central area a and the peripheral area B is reasonably occupied by the whole test pattern, which can avoid the problem of blackening around the test image shot by the camera, i.e. the problem of blackening around the shot test image when the test pattern is shot by the camera. Moreover, the size of the central area A is reasonable, so that the shot image is more accurate when being used for detecting test indexes such as definition.
It can be understood that, in the above numerical range, in consideration of the area where black appears theoretically in the test images captured by different cameras, the area corresponding to the area in the test pattern is set to be black, that is, the corresponding area is located in the range of the surrounding area B. The area ratio of the central region a over the entire test pattern can also be determined by the following factors: the test chart pattern can be used for testing the optical axis, the test chart pattern can be used for testing the definition, and the distance between the camera and the electronic display screen is reasonable. Of course, if only the test of the optical axis deviation index is considered, the area occupation ratio of the central region a in the test pattern is better than that of the relatively large point, and if only the test of the sharpness index is considered, the area occupation ratio of the central region a in the test pattern is better than that of the relatively small point, so that the above factors can be comprehensively considered to determine the occupation ratio of the central region a. The center point of the central area a in the test pattern may not coincide with the center point of the electronic display screen (test card), and of course, for convenience of calculation and reduction of calculation amount, the centers of the two are preferably coincident.
In some alternative embodiments, the rectangular sides of the central area A form an oblique angle α with the longitudinal reference of the test pattern, as shown in FIG. 2, where 3 ° < α < 10 °. The central area A and the longitudinal datum line of the test pattern form a certain angle, so that the accuracy of the test result of the definition of the test pattern for testing the camera can be improved. As an example, the above-described inclination angle α may be 5 °.
In some optional embodiments, in the test pattern, the central area a may further include at least one test point, as shown in fig. 3, wherein the test point is different from the color of the central area a. When the central area a is white, the test point may be black or other color different from white, preferably a color with a large contrast, so that a test image captured by the camera to be detected can be used to more accurately detect the index of the camera.
The diameter of the test point can be 5 mm-30 mm. When the diameter of the test point is larger, as shown in fig. 3, the test pattern can be used for detecting the test index of the wide-angle camera with a larger view; when the diameter of the test point is small, as shown in fig. 4, the test pattern can be used to detect the test index of a general camera with a small field of view. The dimensions of the test points in fig. 3 and 4 need to satisfy the following conditions: in the test image obtained by the wide-angle camera shooting the test pattern shown in fig. 3 and the test image obtained by the ordinary camera shooting the test pattern shown in fig. 4, the sizes of the test points in the test images are basically equal. The test points can be used for testing the optical axis offset angle and/or the rotation angle of the camera, and how to test the optical axis offset angle and/or the rotation angle of the camera will be described in detail below. For example, when the central area a only includes one test point, the test system including the test pattern may be used to detect at least the sharpness and the optical axis offset angle of the camera; when the central area A comprises two test points, the test system comprising the test pattern can be at least used for detecting the definition of the camera, the optical axis offset angle and the rotation angle of the camera.
Alternatively, in the case that the central area a includes at least two test points, that is, the central area a includes at least the first test point t1 and the second test point t2, and the first test point t1 and the second test point t2 may be sequentially arranged along the first direction, as shown in fig. 3. Wherein the first direction is parallel to a first side m of the rectangle formed by the central region, as shown in fig. 3. The first test point t1 and the second test point t2 may be used to detect an optical axis offset angle and a rotation angle of the camera.
Alternatively, central area a may include first test point t1, second test point t2, and fifth test point t5, as shown in fig. 3, and first test point t1, fifth test point t5, and second test point t2 are sequentially arranged in the first direction. The distance from the first test point t1 to the second edge n is d, the distance from the second test point t2 to the third edge is e, and the distance between the first test point t1 and the second test point t2 is f, where d, e, and f are positive numbers, and d ═ e ═ f. In this case, the distance between fifth test point t5 and first test point t1 is equal to the distance between fifth test point t5 and second test point t2, and it can be understood that fifth test point t5 is located at the midpoint of the line connecting first test point t1 and second test point t2, as shown in fig. 3. Wherein the reference value range of d is 50-100 mm. In this implementation manner, in the process of acquiring a test image of a test pattern image by using a camera to be tested, images corresponding to the first test point t1, the fifth test point t5 and the second test point t2 may be used to determine an RIO region of the definition of the camera in the test image, where two RIO regions may be determined in the test image, so that the accuracy of the definition of the camera obtained through calculation is improved. The above relationship among the first test point t1, the fifth test point t5, and the second test point t2 may determine a position of the fifth test point t5 in the test pattern, and further the fifth test point t5 may determine target points on the first edge m and the fourth edge t of the central area a (the target points may be points obtained by making a perpendicular to the first edge and the fourth edge of the fifth test point t 5), and determine two RIO areas on the first edge m and the fourth edge t with the determined target points as a center (if fig. 3 is used as a test image acquired by the camera, the RIO areas may be shown as small rectangular boxes in the drawing).
Alternatively, the central area a may include a first test point t1, a second test point t2, a third test point t3 and a fourth test point t4, as shown in fig. 3. In this case, the third test point t3 and the fourth test point t4 may be sequentially arranged along a second direction, which may be perpendicular to the first direction, as shown in fig. 3. In this implementation manner, the first test point t1 and the second test point t2 may be used to detect an optical axis offset angle and a rotation angle of the camera, and the third test point t3 and the fourth test point t4 may also be used to detect an optical axis offset angle and a rotation angle of the camera. Therefore, for any camera to be tested, at least two optical axis offset angles and two rotation angles can be calculated by using the test pattern comprising the four test points, and therefore, the calculated values can be averaged for the calculated optical axis offset angles/rotation angles, so that the accuracy of the calculated optical axis offset angles/rotation angles of the camera can be improved.
Optionally, the central area a may include a first test point t1, a second test point t2, a third test point t3, a fourth test point t4 and a fifth test point t5, as shown in fig. 3. First test point t1, fifth test point t5, and second test point t2 are sequentially arranged in the first direction, and third test point t3, fifth test point t5, and fourth test point t4 are sequentially arranged in the second direction, as shown in fig. 3. The distance from the third test point t3 to the first edge m is g, the distance from the fourth test point t4 to the fourth edge t is h, and the distance between the third test point t3 and the fourth test point t4 is l, wherein the second direction is perpendicular to the first edge m, the first edge m is parallel to the fourth edge t, g, h, and l are positive numbers, and g ═ h ═ l. Wherein the reference value range of g can also be 50 mm-100 mm. In this implementation manner, in acquiring a test image of a test pattern image by using a camera to be tested, images of the third test point t3, the fifth test point t5 and the fourth test point t4 may also be used to determine an RIO region of the definition of the camera in the test image, where four RIO regions may be determined in the test image, so that the accuracy of the definition of the camera obtained through calculation is further improved. The above relationship among first test point t1, second test point t2, third test point t3, fourth test point t4, and fifth test point t5 may determine a position of fifth test point t5 in a test pattern, and then, the fifth test point t5 may determine target points on first side m, second side n, third side s, and fourth side t of central area a (the target points may be points obtained by making a perpendicular line with respect to first side, second side, third side, and fourth side of fifth test point t 5), and may determine four RIO areas on the first side m, second side n, third side s, and fourth side t with the determined target points as centers (if fig. 3 is used as a test image acquired by a camera, the RIO areas may be shown as small rectangular boxes in the figure). The area of each RIO region may be a fixed value, for example, 120 pixels long by 60 pixels wide.
It is to be understood that the relative positions among first test point t1, second test point t2, third test point t3, fourth test point t4 and fifth test point t5 may be various, for example, first test point t1 and second test point t2 may trisect first side m and fourth side t as shown in fig. 3, or first test point t1, fifth test point t5 and second test point t2 may quartet first side m and fourth side t. In the case where the center area a and the longitudinal reference have a certain inclination angle therebetween, the test points and the sides of the center area a are in the above-described relationship regardless of whether the center area a includes several test points.
In some optional embodiments, the test system for detecting a camera may further include a dark box, and the carrier on which the test pattern is displayed may be disposed in a cavity formed by the dark box, so that the peripheral region B of the test pattern may be connected with the dark box to appear black. Therefore, when the camera to be tested acquires the image of the test pattern displayed by the carrier, the area around the acquired test image is black, and the problem of uneven color around the image is avoided.
In some alternative embodiments, as shown in fig. 5, the test system for detecting a camera may be used to detect various test indexes of a camera installed in a head-mounted electronic device, for example. For the test system in each of the above embodiments, the definition of the camera may be detected by the following method:
and step 130, determining the definition of the camera to be detected based on each target area.
In this embodiment, the test pattern may be as shown in one of fig. 1 to 4, where at least four sides of the central area exist in the test image acquired by the camera to be tested. For any one of the four sides, a target point may be determined on the side, and a target area, or RIO area, may be determined centered on the target point. The target area is composed of a part of pixels corresponding to the central area and a part of pixels corresponding to the peripheral area. And finally, calculating the determined target area to determine the definition of the camera to be detected.
In some optional implementations of this embodiment, the step 120 may be implemented as follows: for any one of the four edges in the test image, the midpoint of the edge may be determined; the midpoint is then determined as the center of the target region, so that the target region can be determined in the test image. The center of each side in the test image can be determined in various ways, for example, the center of each side can be directly determined by means of measurement. The target area determined by the implementation mode in the test image can be located in the middle position of the edge where the target area is located, and the definition value at the position can reflect the definition index of the camera to be tested more truly, so that the accuracy of the definition of the camera to be tested obtained through calculation is improved.
In some optional implementations of the present embodiment, the test pattern may include a first test point t1, a second test point t2, a third test point t3, a fourth test point t4, and a fifth test point t5, as shown in fig. 3 or fig. 4. In this implementation, the midpoint of any one of the four sides in the test image may be determined as follows: aiming at any test point of a first test point, a second test point, a third test point and a fourth test point, respectively determining a first edge nearest to the first test point, a second edge nearest to the second test point, a third edge nearest to the third test point and a fourth edge nearest to the fourth test point from four edges based on the first test point, the second test point, the third test point and the fourth test point; for any one of the first edge, the second edge, the third edge and the fourth edge, determining the midpoint of the edge based on the test point closest to the edge. In this implementation manner, for the test pattern shown in fig. 3, the positions of the first test point t1, the second test point t2, the third test point t3, the fourth test point t4, the fifth test point t5, and the first edge, the second edge, the third edge, and the fourth edge in the captured test pattern may be directly determined, that is, the intersection point of the first test point t1 in the test image to the perpendicular line of the second edge is the midpoint of the second edge. Similarly, the midpoint of the first edge, the midpoint of the third edge, and the midpoint of the fourth edge may be determined. It can be understood that the target region can be determined in the test image by taking the midpoint of each side as the midpoint of the target region and determining the area of the target region.
Alternatively, the test pattern for testing definition may further include a first test point t1, a fifth test point t5, and a second test point t2 arranged in sequence in the first direction, as shown in fig. 3, and the positions of first test point t1, fifth test point t5, and second test point t2 in central area a may be as shown in the above-described embodiment of the test system. At this time, the RIO areas on the first side and the fourth side can be determined at least in the test image acquired by the camera to be tested. Similarly, if the test pattern includes a third test point t3, a fifth test point t5, and a fourth test point t4 that are sequentially arranged along the second direction, as shown in fig. 3, the RIO areas on at least the second side and the third side can be determined in the test image acquired by the camera to be tested. Therefore, for each test pattern in the test system provided by the application, the definition index of the camera to be tested can be detected by adopting the test method. Moreover, under the condition of determining a plurality of RIO areas, a plurality of definition indexes can be calculated, and the accuracy of the obtained definition indexes can be improved by averaging all the definition indexes.
In some optional embodiments, as shown in fig. 6, for a test pattern in the test system provided by the present application, the offset angle of the camera to be tested may be detected by the following steps:
and step 250, obtaining the offset angle of the camera to be measured based on the determined sub-offset angle.
In this embodiment, the test pattern in the test system for testing the camera to be tested may include at least one test point. And when the test pattern only contains one test point, determining the offset angle calculated based on the test point as the offset angle of the camera to be tested. Optionally, under the condition that the test pattern includes a plurality of test points, a plurality of offset angle values can be obtained by respectively calculating based on each test point, and then the offset angle values are processed in an averaging and equalization manner to obtain the offset angle value of the camera to be tested.
Generally, the camera to be measured needs to detect the offset angle value of the camera in the horizontal direction and the vertical direction, so that the camera to be measured can be adjusted in the horizontal direction and the vertical direction, and the adjusted camera can meet the requirement of the electronic equipment where the camera is located.
As an example, a method for determining the offset angle of the camera to be measured in the horizontal direction is given below:
firstly, controlling a camera to be tested to shoot a test pattern containing, for example, a second test point t2 to obtain a test image; then, determining a central point D of a test image shot by the camera to be tested, wherein D is used for representing an intersection point of an ideal optical axis of the camera to be tested and the test chart, and DC is used for representing a distance (namely a first distance) between the camera to be tested and the central point D; then, for the second test point t2, the test point is detected in the obtained test image, and a distance EC (i.e., a second distance) between the camera to be tested and the test point t2 is obtained, where E (the point is the center of the point t2 photographed by the camera to be tested) is used to represent the intersection point of the actual optical axis of the camera to be tested and the test chart, and the horizontal distance of the intersection point D between the point E and the ideal optical axis of the camera is calculated, so as to obtain a distance DE, as shown in fig. 7. Finally, the optical axis angle of the camera to be tested in the horizontal direction relative to the test point t2 can be obtained by using a formula arctan (DE/DC), so that the sub offset angle is obtained. It can be understood that, if only the second test point t2 is included in the test pattern, the determined sub offset angle can be directly used as the offset angle of the camera to be tested. If the test pattern comprises a plurality of test points, the sub-offset angles corresponding to the test points can be determined by the method, and the optical axis offset angles calculated corresponding to the test points are averaged to obtain more accurate optical axis offset angles of the camera to be tested.
Under the condition that the test pattern comprises a first test point t1, a second test point t2, a third test point t3, a fourth test point t4 and a fifth test point t5, a corresponding first sub offset angle, a second sub offset angle, a third sub offset angle, a fourth sub offset angle and a fifth sub offset angle can be obtained respectively, wherein the first sub offset angle is an offset angle of the camera to be tested relative to the first test point t1, the second sub offset angle is an offset angle of the camera to be tested relative to the second test point t2, the third sub offset angle is an offset angle of the camera to be tested relative to the third test point t3, the fourth sub offset angle is an offset angle of the camera to be tested relative to the fourth test point t4, and the fifth sub offset angle is an offset angle of the camera to be tested relative to the fifth test point t 5. Obtaining the offset angle of the camera to be measured based on the five sub-offset angles determined above may include: calculating an offset angle average value of the first sub offset angle, the second sub offset angle, the third sub offset angle, the fourth sub offset angle and the fifth sub offset angle; and determining the average value of the offset angles as the offset angle of the camera to be detected. It can be understood that the test pattern may further include two, three, or four test points, and at this time, an average value of sub-offset angles of the two, three, or four test points is required to be taken as an offset angle of the camera to be tested. The method can improve the accuracy of the calculated offset angle of the camera to be detected.
It can be understood that the camera to be tested installed in the electronic device often causes the optical axis deviation due to the following reasons: the camera has the problem of optical axis deviation, for example, the optical axis deviation is caused when a lens and a lens barrel in a module formed by the camera are installed; and secondly, optical axis deviation caused by the installation process when the camera is installed on the electronic equipment. It can be understood that the method provided by the embodiment can not only determine whether the camera to be detected has angular deviation, but also calculate the angle of the specific deviation of the optical axis of the camera to be detected, and the angle can be used for guiding the adjustment of the camera to be detected, thereby avoiding the electronic equipment being scrapped due to the angular deviation of the camera to be detected, and further improving the yield of the electronic equipment. It can be understood that, if the problem of optical axis offset of the camera itself can be determined under the condition that the problem of optical axis offset cannot be solved by adjusting the camera on the electronic device, the camera on the electronic device needs to be replaced.
In some optional embodiments, as shown in fig. 8, for a test pattern in the test system provided by the present application, the rotation angle of the camera to be tested may be detected through the following steps:
and step 340, determining the rotation angle of the camera to be detected based on the determined sub-rotation angles.
In this embodiment, the test pattern in the test system for testing the camera to be tested at least includes two test points. Specifically, the test pattern for detecting the camera to be tested in this embodiment may include at least two test points in the test pattern as shown in fig. 3. A coordinate system can be established in advance for a test image acquired by the camera to be tested, and the coordinate value of each test point is determined in the coordinate system. Then, for any two test points, the coordinate values are (x1, y1) and (x2, y2), and the sub-rotation angles corresponding to the two test points can be calculated by using a formula arctan ((x1-x2)/(y2-y 1)). It can be understood that, if only two test points are included in the test pattern, the obtained sub-rotation angle can be directly determined as the rotation angle of the camera to be tested; if the test pattern comprises more than two test points, a plurality of sub-rotation angles can be obtained through calculation, and the rotation angle of the camera to be tested can be obtained through processing such as averaging and the like on the plurality of sub-rotation angles.
In some optional implementations of this embodiment, if the test pattern includes more than two test points, for example, the test pattern includes 4 test points in fig. 3: the first test point t1, the second test point t2, the third test point t3 and the fourth test point t4 are used for determining a first sub-rotation angle of the camera to be tested based on a coordinate value of the first test point t1 and a coordinate value of the second test point t 2; determining a second sub-rotation angle of the camera to be tested based on the coordinate value of the third test point t3 and the coordinate value of the fourth test point t 4; and then, calculating the rotation angle average value of the first sub-rotation angle and the second sub-rotation angle, wherein the average value is the rotation angle of the camera to be measured.
The specific calculation is as follows:
if the test pattern includes a first test point t1, a second test point t2, a third test point t3 and a fourth test point t4 as shown in fig. 3, the coordinate value corresponding to the first test point t1 in the test image is (x1, y1), the coordinate value corresponding to the second test point t2 is (x2, y2), the coordinate value corresponding to the third test point t3 is (x3, y3), and the coordinate value corresponding to the fourth test point t4 is (x4, y 4);
calculating the rotation angle through the coordinates of each test point as follows, wherein the rotation angle is clockwise positive: calculating through the first test point t1 and the second test point t 2: sub-rotation angle 1 ═ arctan ((x1-x2)/(y2-y 1)); through the third test point t3 and the fourth test point t 4: sub-rotation angle 2 ═ arctan ((x3-x4)/(y4-y 3)); the rotation angle is (sub rotation angle 1+ sub rotation angle 2)/2, and the average value here can improve the accuracy of the calculated rotation angle of the camera under test of the band.
The scheme disclosed in the application can include in the test index test process to the camera that awaits measuring: the electronic equipment provided with the camera to be tested is fixed on the clamp, and the carrier provided by the application and showing the test patterns is placed at the designated position, so that the optical axis deviation angle, the definition, the rotation angle and the like of the camera to be tested can be tested. The camera to be tested in the electronic equipment acquires images of the test patterns to obtain test images for detecting test indexes, analyzes the acquired test images and can obtain test results of whether the optical axis of the camera to be tested deviates and the deviation angle, definition and rotation angle of the optical axis.
The application has the following characteristics: 1. in the test picture obtained by shooting the test picture card by the wide-angle camera, the black area of the test picture card theoretically can be set to be black, so that the problem that the periphery of the test picture shot by the wide-angle camera is blackened can be avoided, and various test indexes obtained by processing and calculating the test image are improved. 2. By adopting the test system provided by the application, a plurality of test indexes of the camera to be tested can be tested simultaneously, a test chart card does not need to be replaced, and the test efficiency of the camera is improved.
In the scheme that each above-mentioned embodiment of this application provided, adopt the test pattern including two or more test points, need not to change the test pattern that the carrier shows and can test the definition of the camera that awaits measuring, the skew angle of camera, multiple test index such as rotation angle, and then adopt like the test pattern shown in fig. 3, not only need not to change the test pattern that the carrier shows and can test the definition of the camera that awaits measuring, the skew angle of camera, multiple test index such as rotation angle, can also further improve the degree of accuracy of the test index that the test obtained.
The foregoing description is only exemplary of the preferred embodiments of the disclosure and is illustrative of the principles of the technology employed. It will be appreciated by those skilled in the art that the scope of the invention in the embodiments of the present disclosure is not limited to the specific combination of the above-mentioned features, but also encompasses other embodiments in which any combination of the above-mentioned features or their equivalents is made without departing from the inventive concept as defined above. For example, the above features and (but not limited to) technical features with similar functions disclosed in the embodiments of the present disclosure are mutually replaced to form the technical solution.
Claims (17)
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