Disclosure of Invention
In order to solve the problems in the prior art, the invention provides a method and a device for installing and debugging a 3D contour measuring instrument, which can quantitatively judge whether the measuring instrument scans along a straight line at a constant speed. The technical scheme is as follows:
an embodiment of the present application provides a 3D profile measuring instrument installation and debugging method, including:
controlling a profile measuring instrument to linearly scan a preset standard test object in an ideal state at a constant speed to obtain an actual scanning result;
and comparing the actual scanning result with the scanning result of the profile measuring instrument under the ideal constant-speed linear scanning track, and judging whether the motion track of the profile measuring instrument meets the constant speed of the preset precision requirement and the linear of the preset precision requirement.
Preferably, the comparing the actual scanning result with the scanning result of the ideal constant-speed linear scanning track of the profile measuring instrument to determine whether the motion track of the profile measuring instrument meets the constant speed required by the preset precision requirement and the linear of the preset precision requirement includes:
judging whether the height of each position point in the scanning result is consistent with the actual height and whether the width of all contour lines in the scanning result, which is vertical to the movement direction, is consistent with the actual width, if so, the contour measuring instrument is in strict linear movement, otherwise, acquiring the jitter degree of the contour measuring instrument in the linear movement process according to all height difference data and the width difference data;
judging whether the lengths of all the contour lines in the scanning result along the movement direction of the contour measuring instrument are consistent with the actual lengths, if so, determining that the contour measuring instrument strictly moves at a constant speed, otherwise, acquiring the non-constant speed degree of the contour measuring instrument in the process of constant speed movement according to the length difference data;
and if any one of the jitter degree and the non-uniform speed degree exceeds the corresponding preset precision requirement, adjusting the 3D contour measuring instrument.
Preferably, the controlling the profile measuring instrument linearly scans the preset standard test object in an ideal state at a constant speed, and the method comprises the step of correcting the preset standard test object in a non-ideal state to an ideal state, wherein the ideal state is an ideal spatial position, and the correction adopts a spatial coordinate system correction mode.
Preferably, the preset standard test object adopts a calibration plate, the calibration plate comprises a base plate and a plurality of three-dimensional mark blocks fixed on the base plate, and the shape of each three-dimensional mark block meets the condition that all contour lines of the three-dimensional mark blocks are visible lines in a top view of the calibration plate.
Preferably, the ideal spatial positions are: the plane of the calibration plate is vertical to the plane of the laser line, and one edge of the calibration plate is parallel to the moving direction of the profile measuring instrument.
Preferably, the correcting the preset standard test object in the non-ideal state to the ideal state includes:
acquiring first point cloud data acquired by a measuring instrument when a calibration plate is in a non-ideal state, selecting one point in the first point cloud data as a first position point, and acquiring three different points different from the first position point in the point cloud data as second position points;
acquiring a point corresponding to the first position point as a third position point and acquiring a point corresponding to the second position point as a fourth position point based on second point cloud data acquired by a measuring instrument when the calibration plate is in an ideal state;
in the first point cloud data, establishing a first space coordinate system by taking a first position point as an origin and taking a plane parallel to the base plate as a coordinate plane, and acquiring a first coordinate of a second position point;
in the second point cloud data, a third position point is taken as an origin, a plane parallel to the base plate is taken as a coordinate plane, a second space coordinate system is established, and a second coordinate of the fourth position point is obtained;
and establishing a coordinate system conversion model of the first point cloud data and the second point cloud data based on the first coordinate of the second position point and the second coordinate of the fourth position point, and acquiring the coordinate of the first point cloud data projected to the second coordinate system.
Preferably, the three-dimensional mark block is in a regular quadrangular frustum pyramid shape structure.
Preferably, the first position point is a position with the minimum height coordinate of the upper surface of the regular quadrangular frustum pyramid stereo marking block in the first point cloud data.
Preferably, the first position point and the second position point are four corner points of a plane where the upper surface of the calibration plate regular quadrangular frustum pyramid three-dimensional mark block is located.
Preferably, the comparing the actual scanning result with the scanning result of the ideal constant-speed linear scanning track of the profile measuring instrument to determine whether the motion track of the profile measuring instrument meets the constant speed required by the preset precision requirement and the linear of the preset precision requirement includes:
acquiring coordinates of the first point cloud data projected to a second coordinate system;
judging whether the height coordinates of points on the upper surfaces of all regular quadrangular frustum pyramid solid mark blocks in the scanning result are equal and the widths perpendicular to the movement direction are consistent according to the projected coordinates, if so, the profile measuring instrument performs strict linear movement, otherwise, acquiring the jitter degree of the profile measuring instrument during the linear movement according to the height coordinate change and the width change;
judging whether the lengths of the squares on the upper surfaces of all the regular quadrangular frustum pyramid three-dimensional mark blocks in the scanning result along the motion direction of the profile measuring instrument are the same according to the projected coordinates, if so, determining that the profile measuring instrument moves strictly at a constant speed, otherwise, acquiring the non-constant speed degree of the profile measuring instrument in the process of constant speed motion according to the length change;
and if any one of the jitter degree and the non-uniform speed degree exceeds the corresponding preset precision requirement, adjusting the 3D contour measuring instrument.
Preferably, an upper and lower jitter degree among the jitter degrees is determined based on a variance of the height coordinate, a left and right jitter degree is determined based on a variance of the width change, and the non-uniform speed degree is determined based on a variance of the length data.
An aspect of the embodiment of the present application provides a 3D profile measuring instrument installation and debugging device, includes:
the scanning result unit is used for controlling the profile measuring instrument to linearly scan a preset standard test object in an ideal state at a constant speed to obtain an actual scanning result;
and the profile measuring instrument scanning process analysis unit is used for comparing the actual scanning result with the constant-speed linear scanning result of the profile measuring instrument in an ideal state and judging whether the motion track of the profile measuring instrument meets the constant speed of the preset precision requirement and the straight line of the preset precision requirement.
Preferably, the scan result unit further includes:
and the scanning result correcting unit is used for correcting the preset standard test object in the non-ideal state to an ideal state, wherein the ideal state is an ideal spatial position.
An aspect of an embodiment of the present application provides a computer device, including: a processor and a memory;
the processor is connected with the memory, wherein the memory is used for storing a computer program, and the processor is used for calling the computer program to enable the computer equipment to execute the 3D contour measuring instrument installation and debugging method.
In one aspect, embodiments of the present invention provide a computer-readable storage medium, in which a computer program is stored, where the computer program is adapted to be loaded and executed by a processor, so as to enable a computer device having the processor to execute the 3D profilometer installation and debugging method.
The method and the device for installing and debugging the 3D contour measuring instrument have the following beneficial effects:
1. the method comprises the steps of obtaining an actual scanning result by controlling the profile measuring instrument to linearly scan a preset standard test object in an ideal state at a constant speed, and judging whether the motion track of the profile measuring instrument meets the requirements of the preset precision on the constant speed and the preset precision on the straight line or not based on comparison between the actual scanning result and the scanning result of the profile measuring instrument in the ideal constant speed linear scanning track, so that quantitative judgment on whether the line laser profile measuring instrument scans at the constant speed along the straight line or not in the using process is realized.
2. Through N × N regular quadrangular frustum three-dimensional mark blocks which are arranged on the calibration plate at equal intervals, the interval between the square center positions of the upper surface of each adjacent three-dimensional mark block is N times of the side length of a square, and the inclination angle between the side surface of each regular quadrangular frustum three-dimensional mark block and the base plate is set to be 45 degrees, the non-dead-angle scanning of the line laser profile measuring instrument on the profile of each position on the calibration plate is realized, and the definition of a scanning result image is improved.
3. By judging whether the height coordinates of points on the upper surfaces of all regular quadrangular frustum pyramid three-dimensional mark blocks are 0, whether squares on the upper surfaces of the regular quadrangular frustum pyramid three-dimensional mark blocks are equal in length and width and have no deformation and judging whether the lengths of the squares on the upper surfaces of all regular quadrangular frustum pyramid three-dimensional mark blocks along the motion direction of the profile measuring instrument are equal in length in the scanning image of a preset calibration plate, the quantitative analysis of the non-uniform velocity degree and the non-linear degree (jitter degree) in the motion track of the line laser profile measuring instrument is realized.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
Referring to fig. 1, a 3D profilometer installation and debugging method provided in the embodiment of the present application includes:
the method comprises the steps of controlling a profile measuring instrument to linearly scan a preset standard test object in an ideal state at a constant speed to obtain an actual scanning result, wherein the process of controlling the profile measuring instrument to linearly scan at the constant speed can be controlling the profile measuring instrument to linearly move at the constant speed while a scanned object is kept static, or controlling the profile measuring instrument to keep static while the scanned object linearly moves at the constant speed, namely the profile measuring instrument linearly scans the measured object at the constant speed;
and comparing the actual scanning result with the scanning result of the profile measuring instrument under the ideal constant-speed linear scanning track, and judging whether the motion track of the profile measuring instrument meets the constant speed of the preset precision requirement and the linear of the preset precision requirement.
Specifically, the preset standard test object adopts a calibration plate, the calibration plate comprises a base plate and a plurality of three-dimensional mark blocks fixed on the base plate, the shapes of the three-dimensional mark blocks meet that all contour lines of the three-dimensional mark blocks are visible lines in a top view of the calibration plate, so that scanning dead angles of the contour measuring instrument are avoided, in order to simplify the processes of judging, calculating and analyzing point cloud data scanned by the contour measuring instrument in the embodiment of the application, the three-dimensional mark blocks are arranged in a regular quadrangular frustum shape structure and are arranged in an N-row N-column matrix array on the base plate, the distance between the center positions of squares on the upper surface of the two adjacent three-dimensional mark blocks is N times of the side length of the square, and N in the embodiment takes a value of 2.
Referring to fig. 2-1 and 2-2, in the embodiment of the present application, a frustum-shaped structure shown in fig. 2-2, in which the area of the upper surface is smaller than that of the lower surface, is adopted instead of the structure shown in fig. 2-1, which has the area of the upper surface equal to or larger than that of the lower surface, so that the scanning dead angle existing in the process of scanning the calibration board when the laser line of the profile measuring instrument is not perpendicular to the plane where the calibration board is located is effectively avoided.
Of course, the height of the three-dimensional mark block is determined based on the measurement range and measurement accuracy of the measuring instrument. Generally, 1/4 of the measurement range in the z (height) direction can be taken, and in actual use, the measurement is carried out near the reference distance of the measuring instrument.
When the 3D profile measuring instrument is installed and debugged, the calibration plate is placed under the measuring instrument, and the measuring instrument moves to scan, theoretically, when the profile measuring instrument moves at a constant speed along a straight line and the calibration plate is positioned under the profile measuring instrument, the profile of each position on a scanned image of the calibration plate should be uniform without stretching deformation (see fig. 3). However, on one hand, due to the installation error of the measuring instrument and the work itself, the placement of the calibration plate cannot be guaranteed to be located under the scanning track of the profile measuring instrument, that is, the spatial position of the calibration plate is located in a non-ideal state, and on the other hand, the profile measuring instrument is not necessarily in a strict linear motion and a uniform motion, that is, the scanning track of the profile measuring instrument is not an ideal uniform linear scanning track, so that the profile of each position of the scanned calibration plate is also uneven or deformed in a stretching manner.
Therefore, after the non-ideal state of the first aspect is not considered, that is, after it is determined that the placement of the calibration plate is adjusted to the ideal state, the comparison is performed based on the actual scanning result and the scanning result of the profile measuring instrument under the ideal constant-speed linear scanning trajectory, and whether the motion trajectory of the profile measuring instrument meets the constant speed of the preset precision requirement and the straight line of the preset precision requirement is determined, including:
judging whether the height of each position point in the scanning result is consistent with the actual height and whether the width of all contour lines in the scanning result, which is perpendicular to the moving direction, is consistent with the actual width, if so, the contour measuring instrument is in strict linear motion, otherwise, acquiring the jitter degree of the contour measuring instrument in the linear motion process according to all height difference data and the width difference data;
judging whether the lengths of all contour lines in the scanning result along the movement direction of the contour measuring instrument are consistent with the actual lengths, if so, the contour measuring instrument moves at a strict uniform speed, otherwise, acquiring the non-uniform speed degree of the contour measuring instrument in the uniform speed movement process according to the length difference data;
and if any one of the jitter degree and the non-uniform speed degree exceeds the corresponding preset precision requirement, adjusting the 3D contour measuring instrument.
In the embodiment of the present application, the controlling of the profile measuring instrument to linearly scan the preset standard test object in the ideal state at a constant speed includes calibrating the preset standard test object in the ideal state to the ideal state, where the ideal state is an ideal spatial position, the ideal spatial position of the calibration plate is a position where the plane of the calibration plate is perpendicular to the plane of the laser line, and one side of the calibration plate is parallel to the moving direction of the profile measuring instrument.
The preset standard test object in the non-ideal state is corrected to the ideal state by adopting a space coordinate system correction mode.
Specifically, the spatial coordinate system correction includes:
acquiring first point cloud data acquired by a measuring instrument when a calibration plate is in a non-ideal state, selecting one point in the first point cloud data as a first position point, and acquiring three different points in the point cloud data, which are different from the first position point, as second position points;
acquiring a point corresponding to the first position point as a third position point and acquiring a point corresponding to the second position point as a fourth position point based on second point cloud data acquired by a measuring instrument when the calibration plate is in an ideal state;
in the first point cloud data, a first position point is taken as an origin, a plane parallel to the base plate is taken as a coordinate plane (the coordinate plane refers to a plane formed by any two coordinate axes in a rectangular spatial coordinate system, such as an XOY coordinate plane), a first spatial coordinate system is established, and a first coordinate of the second position point is obtained;
in the second point cloud data, a third position point is taken as an origin, a plane parallel to the base plate is taken as a coordinate plane, a second space coordinate system is established, and a second coordinate of the fourth position point is obtained;
and establishing a coordinate system conversion model of the first point cloud data and the second point cloud data based on the first coordinate of the second position point and the second coordinate of the fourth position point, and acquiring the coordinate of the first point cloud data projected to the second coordinate system.
In the embodiment of the application, the first position point is re-determined to serve as the origin of the first coordinate system based on the original first point cloud data, and a first position point capable of reducing the calculation amount in the coordinate conversion process can be selected to establish the first coordinate system based on the consideration of the data calculation complexity. Furthermore, considering the position change that the calibration board can take place in the in-service use, namely the situation of calibration board side perk, under the condition that the three-dimensional marking block of calibration board sets up for regular quadrangular frustum pyramid shape structure, the first position point in this application adopts the position that the height coordinate of the upper surface of the regular quadrangular frustum pyramid three-dimensional marking block is minimum in the first point cloud data, namely the point in the area that the calibration board does not take place the perk under the side perk state. Furthermore, the first position point and the second position point respectively adopt four corner points of a plane where the upper surface of the regular quadrangular frustum pyramid three-dimensional mark block of the calibration plate is located, and on the basis, the established first space coordinate system takes the first position point as an origin and the plane where the upper surface of the regular quadrangular frustum pyramid three-dimensional mark block is located as a coordinate system established by a coordinate plane; the second space coordinate system is a coordinate system established by taking the third position point as an origin and taking the plane of the upper surface of the regular quadrangular frustum pyramid three-dimensional mark block as a coordinate plane;
specifically, the method for acquiring the first coordinate of the second position point and the second coordinate of the fourth position point includes:
as shown in fig. 5, in the point cloud data acquired by the measuring instrument when the calibration plate is in a non-ideal state, the intersection point is taken by fitting or four corner points, i.e., four points a, B, C, and D, are directly taken, where the point a is the point with the minimum height. Translating the original point of the original coordinate system of the first point cloud data to a point A, establishing a first coordinate system, and subtracting the coordinate values of the scanned point A from the corresponding three points B, C and D to obtain first coordinates (x) of the points B, C and D in the first coordinate system
B ,y
B ,z
B )、(x
C ,y
C ,z
C )、(x
D ,y
D ,z
D ) After coordinate transformation, i.e. in the second coordinate system, the points A ', B', C 'and D' corresponding to the calibration plateThe second coordinate is (0, 0),
Specifically, a coordinate system conversion model of the first point cloud data and the second point cloud data is established based on a first coordinate of the second position point and a second coordinate of the fourth position point, namely, a set of coordinates of corresponding points is formed based on the first coordinate of the second position point and the second coordinate of the fourth position point corresponding to the second position point, the coordinate system conversion model to be solved containing different unknown parameter numbers is determined according to the position condition of the calibration plate, the corresponding point coordinates of the set number are matched for solving, and then the coordinates of the first point cloud data projected to the second coordinate system can be determined according to the solved model.
Specifically, when the position of the calibration board cannot be guaranteed to be in the ideal spatial position, the position of the calibration board may be in the following 3 cases:
first, only rotation occurs with respect to the ideal spatial position, see fig. 4-1;
second, rotation occurs relative to the ideal spatial position while one side of the calibration plate tilts, see fig. 4-2;
thirdly, the rotation occurs relative to the ideal spatial position while the two sides of the calibration plate are tilted, see fig. 4-3.
For the position of the first calibration plate, the established coordinate system conversion model to be solved is as follows:
let the coordinates of the points on the calibration plate before rotation be
The coordinate of the point on the calibration plate after the rotation is ≥>
The following relationship is satisfied between the two:
the unknown number t exists in the model x ,t y ,t z γ, coordinates of a set of corresponding points (e.g. [ x ]) A ,y A ,z A ] T →[x A ′,y A ′,z A ′] T ) 3 equations can be provided, so that the unknowns can be calculated through the coordinates of the two groups of corresponding points, and the corresponding relation of all the points on the calibration plate before and after rotation is obtained.
For the position of the second calibration plate, it is equivalent to that the coordinate system rotates around the Z axis γ first, and then rotates around the X axis α, and the established coordinate system conversion model to be solved is:
the presence of t in this model x ,t y ,t z And the alpha and gamma parameters can be used for calculating the unknown number through the coordinates of the two groups of corresponding points.
For the position of the third calibration plate, it is equivalent to that the coordinate system rotates around the Z axis γ, then rotates around the X axis α, and then rotates around the Y axis β, and the established coordinate system conversion model to be solved is:
the presence of t in this model x ,t y ,t z And the alpha, beta and gamma 6 unknowns can be solved by using the coordinates of the two groups of corresponding points. In actual operation, in order to prevent the equations of multiple sets of corresponding points from being linearly related, the coordinate transformation relationship can be obtained by using 3 points on the calibration plate. More generally, the unknowns can be solved by performing least squares fitting on a plurality of sets of points, which can improve the accuracy and robustness of the calculated transformation matrix.
Further, under the condition that the three-dimensional mark block of the calibration plate is in the shape of a regular quadrangular frustum pyramid, in the method for installing and debugging the 3D profile measuring instrument in the embodiment of the application, based on the comparison between the actual scanning result and the scanning result of the ideal constant-speed linear scanning track of the profile measuring instrument, whether the motion track of the profile measuring instrument meets the constant speed of the preset precision requirement or not and the straight line of the preset precision requirement is judged, and the method comprises the following steps:
acquiring coordinates of the first point cloud data projected to a second coordinate system;
judging whether the height coordinates of the points on the upper surfaces of all the square three-dimensional mark blocks are equal and the widths perpendicular to the moving direction are consistent, if so, the contour measuring instrument performs strict linear motion, otherwise, acquiring the shaking degree of the contour measuring instrument in the linear motion process according to the height coordinate change and the width change, wherein the first position point adopts the position with the minimum height coordinate of the upper surfaces of the square three-dimensional mark blocks in the first point cloud data, and under the condition that the first position point is taken as the original point of a coordinate system, judging whether the height coordinates of the points on the upper surfaces of all the square three-dimensional mark blocks are 0 can judge whether the contour measuring instrument shakes in the vertical direction, further, under the condition that the base plate is arranged in a rectangular structure, and each side of each square on the upper surface of each square three-dimensional mark block is parallel to the side of the rectangular base plate, judging whether the widths perpendicular to the moving direction of the upper surfaces of the square three-dimensional mark blocks are equal and the length of the actual side length is required;
judging whether the lengths of the squares on the upper surfaces of all the regular quadrangular frustum pyramid three-dimensional mark blocks along the movement direction of the profile measuring instrument are the same or not, if so, the profile measuring instrument moves at a strict constant speed, otherwise, acquiring the non-constant speed degree of the profile measuring instrument in the constant speed movement process according to the length change, and further, under the condition that the base plate is of a rectangular structure and each side edge of the square on the upper surface of each three-dimensional mark block is correspondingly parallel to the side edge of the rectangular base plate, judging whether the lengths of the squares on the upper surfaces of all the three-dimensional mark blocks parallel to the movement direction are the same or not only if the side lengths of the squares on the upper surfaces of all the three-dimensional mark blocks are the same and the actual side length is required;
and if any one of the jitter degree and the non-uniform speed degree exceeds the corresponding preset precision requirement, adjusting the 3D contour measuring instrument.
Specifically, the up-down shaking degree among the shaking degrees may be based on the variance of the height coordinate
Determination of variance
The larger the measuring instrument moves, the smoother the measuring instrument moves and the larger the jitter degree is;
left and right of the degree of jitter may be based on the variance of the width variation
Determining;
the degree of non-uniform velocity may be based on a variance of the length data
Determine, variance >>
The larger the meter movement, the less uniform the meter movement.
If any one of the jitter degree and the non-uniform speed degree exceeds the corresponding preset precision requirement, the 3D contour measuring instrument is adjusted, and the square deviation can be adjusted when the 3D contour measuring instrument is used in the actual working condition
The method can also be used for detecting whether the measuring instrument is fixed and the movement of the measured object is horizontal and uniform, such as placing objects on a conveyor belt in a production line.
The 3D profilometer installation and debugging method provided by the embodiment of the present application is described above in detail, and the method can also be implemented by a corresponding device, and the 3D profilometer installation and debugging device provided by the embodiment of the present application is described below in detail.
Referring to fig. 6, the 3D profilometer installation and debugging device of the embodiment of the present application includes:
the scanning result unit is used for controlling the profile measuring instrument to linearly scan a preset standard test object in an ideal state at a constant speed to obtain an actual scanning result;
and the profile measuring instrument scanning process analysis unit is used for comparing the actual scanning result with the constant-speed linear scanning result of the profile measuring instrument in an ideal state and judging whether the motion track of the profile measuring instrument meets the constant speed of the preset precision requirement and the straight line of the preset precision requirement.
Further, the scan result unit further includes:
and the scanning result correcting unit is used for correcting the preset standard test object in the non-ideal state to an ideal state, wherein the ideal state is an ideal spatial position.
An embodiment of the present application further provides a computer device, including: a processor and a memory;
the processor is connected with the memory, wherein the memory is used for storing a computer program, and the processor is used for calling the computer program to enable the computer device to execute the 3D profilometer installation and debugging method in the above embodiment.
It will be appreciated that the processor may be an integrated circuit chip having signal processing capabilities. In implementation, the steps of the above method embodiments may be performed by integrated logic circuits in hardware or instructions in software in a processor.
The processor may be a microprocessor or any conventional processor. The steps of the method disclosed in connection with the embodiments of the present invention may be directly performed by a hardware decoding processor, or may be performed by a combination of hardware and software modules in the decoding processor. The software modules may be located in a Random Access Memory (RAM), a flash Memory (flash Memory), a Read-Only Memory (ROM), a Programmable ROM (PROM), an Erasable PROM (EPROM), a register, and other readable storage media known in the art. The readable storage medium is located in the memory, and the processor reads the information in the memory and combines the hardware to complete the steps of the method.
It will be appreciated that the memory in the embodiments of the present application can be either volatile memory or nonvolatile memory, or can include both volatile and nonvolatile memory.
The embodiment of the present application further provides a computer-readable storage medium, in which a computer program is stored, where the computer program is suitable for being loaded and executed by a processor, so that a computer device with the processor executes the 3D profilometer installation and debugging method in the above embodiment.
The computer-readable storage medium includes: permanent and non-permanent, removable and non-removable media may be tangible devices that retain and store instructions for use by an instruction execution apparatus. The computer-readable storage medium includes: electronic memory devices, magnetic memory devices, optical memory devices, electromagnetic memory devices, semiconductor memory devices, and any suitable combination of the foregoing.
In the several embodiments provided in the present application, it should be understood that the disclosed apparatus, electronic device, and method may be implemented in other ways. For example, the above-described apparatus embodiments are merely illustrative, and for example, the division of the modules or units is only one type of logical functional division, and other divisions may be realized in practice, for example, multiple units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices or units, and may also be an electrical, mechanical or other form of connection.
Based on such understanding, the technical solutions of the embodiments of the present invention may substantially or partially contribute to the prior art, or all or part of the technical solutions may be embodied in the form of a software product stored in a storage medium, and including several instructions for causing a computer device (including a personal computer, a server, a data center or other network devices) to execute all or part of the steps of the methods described in the embodiments of the present application. And the storage medium includes various media that can store the program code as listed in the foregoing.
The present invention is not limited to the above-described embodiments, and those skilled in the art will be able to make various modifications without creative efforts from the above-described conception, and fall within the scope of the present invention.