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CN113447681A - Single-end spring test probe - Google Patents

Single-end spring test probe Download PDF

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Publication number
CN113447681A
CN113447681A CN202110715705.1A CN202110715705A CN113447681A CN 113447681 A CN113447681 A CN 113447681A CN 202110715705 A CN202110715705 A CN 202110715705A CN 113447681 A CN113447681 A CN 113447681A
Authority
CN
China
Prior art keywords
spring
section part
section
diameter
test probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202110715705.1A
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Chinese (zh)
Inventor
彭启南
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Suzhou Dick Microelectronics Co ltd
Original Assignee
Suzhou Dick Microelectronics Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Suzhou Dick Microelectronics Co ltd filed Critical Suzhou Dick Microelectronics Co ltd
Priority to CN202110715705.1A priority Critical patent/CN113447681A/en
Publication of CN113447681A publication Critical patent/CN113447681A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716Elastic
    • G01R1/06722Spring-loaded

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

The invention discloses a single-head spring test probe, which comprises a TOP needle head and a central spring, wherein the TOP needle head comprises a front section part, a middle section part and a tail section part which are integrally formed, the front section part, the middle section part and the tail section part are all of cylindrical structures, the upper end of the front section part is provided with a needle head structure, the middle part of the middle section part is provided with a flange clamping groove, the diameter of the central spring is reduced from the middle part to the two end parts, the middle section part is clamped at any one end of the central spring through the flange clamping groove, the upper ends of the front section part and the middle section part are both positioned outside the end, and the lower end and the tail section part of the middle section part are both positioned inside a spring ring at the end and can be in contact with the spring ring at the end; meanwhile, the early cost is also reduced.

Description

Single-end spring test probe
Technical Field
The invention relates to the technical field of probes, in particular to a single-head spring test probe.
Background
The probe is a contact medium for electrical test and is a high-end precise electronic hardware component. The existing double-head spring test probe is complex and complex in combination assembly and high in assembly process difficulty, and has the defects of high early cost and low assembly efficiency. Therefore, for a single-head spring test probe, the existing double-head spring test probe has the defects of complex and complicated assembly, high difficulty of assembly process, high early cost and low assembly efficiency and is a problem to be solved.
Disclosure of Invention
In order to overcome the defects, the invention aims to provide a single-head spring test probe which is simple in structure and few in assembly parts, reduces the difficulty of an assembly process and further improves the assembly efficiency; meanwhile, the early cost is also reduced.
In order to achieve the above purposes, the invention adopts the technical scheme that: the utility model provides a single-end spring test probe, including TOP syringe needle and center spring, the TOP syringe needle includes integrated into one piece's front end portion, well section portion and tail section portion and anterior segment portion, well section portion and tail section portion are the cylinder structure, the upper end of front end portion is provided with the syringe needle structure, the middle part of well section portion is provided with the flange draw-in groove, the diameter of center spring diminishes to both ends position by big from the middle part, well section portion passes through flange draw-in groove chucking in arbitrary one end and the anterior segment portion of center spring, the upper end of well section portion all is located the outside of this end, the lower extreme of well section portion, tail section portion all is located the inside of this end spring coil and the homoenergetic contacts with the spring coil of this end.
The single-head spring test probe has the beneficial effects that the diameter of the central spring is reduced from the middle part to the two end parts, so that a spring step is formed between the middle part of the central spring and the two ends of the central spring; adopt the mode of interference crimping, the user is manual to be gone into the flange draw-in groove with the arbitrary one end card of center spring, and the upper end of front end portion, well section portion all is located the outside of this end, and the lower extreme of well section portion, tail section portion all are located the inside of this end spring coil and homoenergetic and contact with the spring coil of this end, realize that TOP syringe needle and center spring are connected and are difficult separately and reinforcing electronic signal transport reaches service condition. The redesign effectively reduces the early cost because the middle needle tube and the bottom needle head of the part are reduced; after the middle pipe and the bottom needle head are riveted, the combination assembly process only needs to sleeve the end ring of the central spring into the flange clamping groove on the TOP needle head to realize the connection of the two, so that a new product is formed by combination assembly, the assembly process is simple and easy, and the assembly efficiency is effectively improved.
The invention is further improved in that the outer diameter and the inner diameter of the spring ring of the central spring are both reduced from the middle part to the two end parts. The spring ring external diameter and the spring ring internal diameter of the central spring are all reduced from the middle part to the two end parts, a spring step is formed between the middle part of the central spring and the two ends of the central spring, and the connection is not easy to separate and the electronic signal transmission is enhanced to achieve the using condition.
As a further improvement of the invention, the front section part is of a structure with a narrow top and a wide bottom, the middle section part is of a structure with a wide top and a narrow bottom, the lower end of the front section part is jointed with the upper end of the middle section part, the diameter of the lower end of the front section part is smaller than that of the upper end of the middle section part, the lower end of the middle section part is jointed with the upper end of the tail section part, and the diameter of the lower end of the middle section part is larger than that of the tail section part. The front section part, the middle section part and the tail section part are integrally formed by punching.
The invention is further improved in that the central axis of the front section part, the central axis of the middle section part and the central axis of the tail section part are all overlapped.
As a further improvement of the invention, a limit table is also arranged at the joint of the upper end of the middle section part and the middle part thereof. The limiting table further prevents the central spring from shifting.
As a further improvement of the invention, the lower end of the tail section part extends downwards to form a convex part. The projections further enhance signal delivery to achieve use conditions.
The invention has the further improvement that the diameter of the lower end of the middle section part and the diameter of the tail section part are both larger than the diameter of any end of the central spring, and the spring ring at any end of the central spring can be clamped on the flange clamping groove in a one-circle or multi-circle mode. The diameter of the lower end of the middle section part and the diameter of the tail section part are slightly larger than the diameter of any end of the central spring, and the central spring is stably clamped on the TOP needle head in an interference compression joint mode, and meanwhile, the electronic signal transmission is enhanced to reach the use condition.
As a further improvement of the invention, the needle head structure is a plurality of saw teeth which are arranged at the upper end of the front section at equal intervals, and a ring shape is formed among the plurality of saw teeth. The plurality of sawteeth facilitate detection of external devices.
Drawings
FIG. 1 is a structural view of the present embodiment;
figure 2 is a view showing the structure of the TOP needle of this embodiment.
In the figure:
1-a central spring; 2-a front section; 3-middle section; 4-tail section; 5-flange clamping groove; 6-a limiting table; 7-a boss; 8-saw teeth.
Detailed Description
The following detailed description of the preferred embodiments of the present invention, taken in conjunction with the accompanying drawings, will make the advantages and features of the invention easier to understand by those skilled in the art, and thus will clearly and clearly define the scope of the invention.
Referring to fig. 1-2, the single-ended spring test probe of the present embodiment includes a TOP needle and a central spring 1, the TOP needle includes a front section 2, a middle section 3, a rear section 4, and the front section 2, the middle section 3, and the rear section 4, which are integrally formed, the upper end of the front section 2 is provided with a needle structure, the middle portion of the middle section 3 is provided with a flange slot 5, the diameter of the central spring 1 decreases from the middle portion to the two end portions, the middle section 3 is clamped at any end of the central spring 1 and the front section 2 through the flange slot 5, the upper end of the middle section 3 is located outside the end, the lower end of the middle section 3, and the rear section 4 are both located inside the end spring ring and can contact with the end spring ring. The diameter of the central spring 1 is reduced from the middle part to the two end parts, so that a spring step is formed between the middle part of the central spring 1 and the two ends of the central spring; adopt the mode of interference crimping, the user is manual to be gone into flange draw-in groove 5 with central spring 1's arbitrary one end card, and anterior segment portion 2, the upper end of middle-section portion 3 all are located the outside of this end, and middle-section portion 3's lower extreme, tail section portion 4 all are located the inside of this end spring coil and the homoenergetic contacts with the spring coil of this end, realize TOP syringe needle and central spring 1 and be connected difficult separately and reinforcing electronic signal transport and reach service condition. The redesign effectively reduces the early cost because the middle needle tube and the bottom needle head of the part are reduced; after a middle pipe and a bottom needle head are riveted, the combined assembly process only needs to sleeve the end ring of the central spring 1 into the flange clamping groove 5 on the TOP needle head to realize the connection of the two, so that the combined assembly forms a new product, the assembly process is simple and easy, and the assembly efficiency is effectively improved
In the present embodiment, the outer diameter and the inner diameter of the coil spring of the center spring 1 both decrease from the middle portion to the end portions. The spring ring external diameter and the spring ring internal diameter of central spring 1 all diminish from the middle part to both ends position, all can form a spring step between the middle part of central spring 1 and its both ends, realize connecting difficult separately and reinforcing electronic signal and carry and reach service condition.
The front section 2 of this embodiment is wide structure under the narrow top, and well section 3 is narrow structure under the wide top, and the diameter that the lower extreme of front section 2 and the upper end of well section 3 joined and front section 2 lower extreme is less than the diameter of well section 3 upper end, and the diameter that the lower extreme of well section 3 and the upper end of tail section 4 joined and well section 3 lower extreme is greater than the diameter of tail section 4. The front section 2, the middle section 3 and the tail section 4 are integrally formed by punching.
The axis of anterior segment portion 2, the axis of middle-stage portion 3 and the axis of tail section portion 4 of this embodiment all coincide.
The joint of the upper end of the middle section part 3 and the middle part thereof of the embodiment is also provided with a limit table 6. The stop block 6 further prevents the displacement of the center spring 1.
The lower end of the tail section 4 of this embodiment extends downwardly with a boss 7. The projections 7 further enhance signal transmission to achieve use conditions.
The diameter of the lower end of the middle section part 3 and the diameter of the tail section part 4 are both larger than the diameter of any end of the central spring 1, and the spring ring at any end of the central spring 1 can be clamped on the flange clamping groove 5 in one or more circles. The diameter of the lower end of the middle section part 3 and the diameter of the tail section part 4 are slightly larger than the diameter of any end of the central spring 1, the central spring 1 is stably clamped on the TOP needle head in an interference compression joint mode, and meanwhile, electronic signal transmission is enhanced to reach the using condition.
The needle structure of the embodiment is a plurality of saw teeth 8 which are arranged at the upper end of the front section 2 at equal intervals, and a ring shape is formed between the plurality of saw teeth 8. The plurality of serrations 8 facilitate testing of the external device.
The above embodiments are merely illustrative of the technical concept and features of the present invention, and the present invention is not limited thereto, and any equivalent changes or modifications made according to the spirit of the present invention should be included in the scope of the present invention.

Claims (8)

1. A single-ended spring test probe, comprising: including TOP syringe needle and center spring (1), the TOP syringe needle includes integrated into one piece's front end portion (2), middle-section portion (3) and tail-section portion (4) and front end portion (2), middle-section portion (3) and tail-section portion (4) are the cylinder structure, the upper end of front end portion (2) is provided with the syringe needle structure, the middle part of middle-section portion (3) is provided with flange draw-in groove (5), the diameter of center spring (1) diminishes by big from the middle part to both ends position, middle-section portion (3) all are located the outside of this end through flange draw-in groove (5) chucking in arbitrary one end of center spring (1) and the upper end of front end portion (2), middle-section portion (3), the lower extreme of middle-section portion (3), tail-section portion (4) all are located the inside of this end spring coil and the homoenergetic contacts with the spring coil of this end.
2. The single-ended spring test probe of claim 1, wherein: the outer diameter of the spring ring and the inner diameter of the spring ring of the central spring (1) are both reduced from the middle part to the two end parts.
3. The single-ended spring test probe of claim 1, wherein: the front section part (2) is of a structure with a narrow top and a wide bottom, the middle section part (3) is of a structure with a wide top and a narrow bottom, the lower end of the front section part (2) is connected with the upper end of the middle section part (3), the diameter of the lower end of the front section part (2) is smaller than that of the upper end of the middle section part (3), the lower end of the middle section part (3) is connected with the upper end of the tail section part (4), and the diameter of the lower end of the middle section part (3) is larger than that of the tail section part (4).
4. A single-ended spring test probe according to claim 1 or 3, wherein: the central axis of the front section part (2), the central axis of the middle section part (3) and the central axis of the tail section part (4) are coincided.
5. A single-ended spring test probe according to claim 1 or 3, wherein: the joint of the upper end of the middle section part (3) and the middle part thereof is also provided with a limit table (6).
6. A single-ended spring test probe according to claim 1 or 3, wherein: the lower end of the tail section part (4) extends downwards to form a convex part (7).
7. The single-ended spring test probe of claim 1, wherein: the diameter of the lower end of the middle section part (3) and the diameter of the tail section part (4) are both larger than the diameter of any end of the central spring (1), and the spring ring at any end of the central spring (1) can be clamped on the flange clamping groove (5) in a one-circle or multi-circle mode.
8. The single-ended spring test probe of claim 1, wherein: the needle head structure is a plurality of saw teeth (8) which are arranged at the upper end of the front section part (2) at equal intervals, and a plurality of saw teeth (8) form a ring shape.
CN202110715705.1A 2021-06-23 2021-06-23 Single-end spring test probe Pending CN113447681A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202110715705.1A CN113447681A (en) 2021-06-23 2021-06-23 Single-end spring test probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202110715705.1A CN113447681A (en) 2021-06-23 2021-06-23 Single-end spring test probe

Publications (1)

Publication Number Publication Date
CN113447681A true CN113447681A (en) 2021-09-28

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CN202110715705.1A Pending CN113447681A (en) 2021-06-23 2021-06-23 Single-end spring test probe

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113804929A (en) * 2021-10-09 2021-12-17 南通芯盟测试研究院运营管理有限公司 Bidirectional telescopic probe
TWI851970B (en) * 2022-03-03 2024-08-11 日榮精密工業股份有限公司 Flexible electrical contact device

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201181302Y (en) * 2008-03-18 2009-01-14 东莞中探探针有限公司 Coaxial isolation type large current probe
CN201181303Y (en) * 2008-03-18 2009-01-14 东莞中探探针有限公司 Integrated large-current probe
WO2009084906A2 (en) * 2008-01-02 2009-07-09 Nakamura, Toshiyuki The proble pin composed in one body and the method of making it
CN201348641Y (en) * 2009-01-20 2009-11-18 金英杰 Semiconductor test probe
CN102466740A (en) * 2010-11-12 2012-05-23 金英杰 Semiconductor Kelvin test probe
JP2017003551A (en) * 2015-06-08 2017-01-05 文 光中 Vertical coil spring probe
CN210954122U (en) * 2019-10-31 2020-07-07 袁勃然 Semiconductor test probe
CN112230027A (en) * 2020-12-18 2021-01-15 苏州和林微纳科技股份有限公司 High-frequency coaxial signal probe test unit
CN113009196A (en) * 2021-03-02 2021-06-22 上海捷策创电子科技有限公司 Probe for chip test and chip test device
CN214374931U (en) * 2021-01-06 2021-10-08 精贺科技有限公司 Probe device and probe device set

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009084906A2 (en) * 2008-01-02 2009-07-09 Nakamura, Toshiyuki The proble pin composed in one body and the method of making it
CN201181302Y (en) * 2008-03-18 2009-01-14 东莞中探探针有限公司 Coaxial isolation type large current probe
CN201181303Y (en) * 2008-03-18 2009-01-14 东莞中探探针有限公司 Integrated large-current probe
CN201348641Y (en) * 2009-01-20 2009-11-18 金英杰 Semiconductor test probe
CN102466740A (en) * 2010-11-12 2012-05-23 金英杰 Semiconductor Kelvin test probe
JP2017003551A (en) * 2015-06-08 2017-01-05 文 光中 Vertical coil spring probe
CN210954122U (en) * 2019-10-31 2020-07-07 袁勃然 Semiconductor test probe
CN112230027A (en) * 2020-12-18 2021-01-15 苏州和林微纳科技股份有限公司 High-frequency coaxial signal probe test unit
CN214374931U (en) * 2021-01-06 2021-10-08 精贺科技有限公司 Probe device and probe device set
CN113009196A (en) * 2021-03-02 2021-06-22 上海捷策创电子科技有限公司 Probe for chip test and chip test device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113804929A (en) * 2021-10-09 2021-12-17 南通芯盟测试研究院运营管理有限公司 Bidirectional telescopic probe
TWI851970B (en) * 2022-03-03 2024-08-11 日榮精密工業股份有限公司 Flexible electrical contact device

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Application publication date: 20210928