CN113364461B - Analog-to-digital conversion calibration method and system for chip to be tested - Google Patents
Analog-to-digital conversion calibration method and system for chip to be tested Download PDFInfo
- Publication number
- CN113364461B CN113364461B CN202110708045.4A CN202110708045A CN113364461B CN 113364461 B CN113364461 B CN 113364461B CN 202110708045 A CN202110708045 A CN 202110708045A CN 113364461 B CN113364461 B CN 113364461B
- Authority
- CN
- China
- Prior art keywords
- analog
- voltage value
- value
- digital conversion
- reference voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000006243 chemical reaction Methods 0.000 title claims abstract description 102
- 238000000034 method Methods 0.000 title claims abstract description 53
- 238000013139 quantization Methods 0.000 claims description 21
- 238000012360 testing method Methods 0.000 abstract description 6
- 230000009286 beneficial effect Effects 0.000 abstract description 3
- 238000005516 engineering process Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000004364 calculation method Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1009—Calibration
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Analogue/Digital Conversion (AREA)
Abstract
The present invention relates to the field of chip testing, and in particular, to a method and a system for calibrating analog-to-digital conversion of a chip to be tested. The method specifically comprises the following steps: step S1, controlling a chip to be tested to output a fixed reference voltage value, and performing analog-to-digital conversion on the reference voltage value to obtain an analog-to-digital converted reference quantized value; step S2, controlling the chip to be tested to work normally and outputting a current working voltage value, performing analog-to-digital conversion on the current working voltage value, and obtaining a current quantized value after analog-to-digital conversion; and step S3, acquiring the current working voltage value of the chip to be tested according to the reference voltage value, the reference quantized value and the current quantized value. The technical scheme of the invention has the beneficial effects that: the analog-to-digital conversion calibration method and system for the chip to be tested not only can solve the problem of chip consistency, but also can simplify the structure of a calibration circuit and improve the calibration precision.
Description
Technical Field
The present invention relates to the field of chip testing, and in particular, to a method and a system for calibrating analog-to-digital conversion of a chip to be tested.
Background
With the widespread use of digital technology in the fields of signal processing, control, etc., the work implemented by analog circuits in the past is being increasingly handled by digital circuits, and accordingly, the technology by which ADC is used to implement conversion between analog circuit technology and digital circuit technology is being increasingly used.
For example, in the testing process of chips such as MCUs, SOCs, videos, and the like, ADCs are also often used to achieve high-precision detection and calibration of the chips.
However, in the prior art, due to production process errors, the consistency of chips is difficult to be ensured, so that accurate test results cannot be obtained during ADC test, and further, the calibrated chips still have errors. There is a need to address the problem of chip uniformity due to process variations.
Disclosure of Invention
Aiming at the problems in the prior art, the invention provides an analog-to-digital conversion calibration method and system for a chip to be tested.
The analog-to-digital conversion calibration method of the chip to be tested specifically comprises the following steps:
step S1, controlling a chip to be tested to output a fixed reference voltage value, and performing analog-to-digital conversion on the reference voltage value to obtain an analog-to-digital converted reference quantized value;
Step S2, controlling the chip to be tested to work normally and outputting a current working voltage value, performing analog-to-digital conversion on the current working voltage value, and obtaining a current quantized value after analog-to-digital conversion;
and step S3, acquiring the current working voltage value of the chip to be tested according to the reference voltage value, the reference quantized value and the current quantized value.
Preferably, the step S3 is performed by using the following formula to obtain the current operating voltage value:
Wherein V Currently, the method is that is used to represent the current operating voltage value;
v Reference to is used to represent the reference voltage value;
d Reference to is used to represent the reference quantization value;
d Currently, the method is that is used to represent the current quantized value.
Preferably, in the step S1, the reference voltage value is subjected to analog-to-digital conversion by using the following formula to obtain the reference quantized value;
Wherein D Reference to is used to represent the reference quantization value;
v Reference to is used to represent the reference voltage value;
v ref is used to represent the quantization reference voltage used in analog-to-digital conversion;
n is used to represent the number of bits of resolution employed in performing the analog-to-digital conversion.
Preferably, the step S1 is to control the chip to be tested to output a fixed reference voltage value, and perform analog-to-digital conversion on the reference voltage value by using the quantized reference voltage to obtain the reference quantized value after analog-to-digital conversion, and store the reference voltage value, the quantized reference voltage and the reference quantized value;
And step S3, acquiring the stored reference voltage value, the quantized reference voltage and the reference quantized value, and processing to obtain the current working voltage value of the chip to be tested according to the current quantized value.
The analog-to-digital conversion calibration system of the chip to be tested specifically comprises:
the first control module is used for controlling the chip to be tested to output a fixed reference voltage value in advance;
the second control module is used for controlling the chip to be tested to work normally and outputting the current working voltage value;
the analog-to-digital conversion module is used for carrying out analog-to-digital conversion on the output reference voltage value and outputting an analog-to-digital converted reference quantized value, and carrying out analog-to-digital conversion on the current working voltage value and outputting an analog-to-digital converted current quantized value;
And the processing module is connected with the first control module, the second control module and the analog-to-digital conversion module and is used for acquiring the current working voltage value of the chip to be tested according to the reference voltage value, the reference quantized value and the current quantized value.
Preferably, the processing module processes the current operating voltage value by adopting the following formula:
Wherein V Currently, the method is that is used to represent the current operating voltage value;
v Reference to is used to represent the reference voltage value;
d Reference to is used to represent the reference quantization value;
d Currently, the method is that is used to represent the current quantized value.
Preferably, the analog-to-digital conversion module performs analog-to-digital conversion on the reference voltage value by adopting the following formula to generate the reference quantized value;
Wherein D Reference to is used to represent the reference quantization value;
v Reference to is used to represent the reference voltage value;
V ref is used to represent the quantization reference voltage used by the analog-to-digital conversion module;
N is used to represent the number of bits for performing the resolution employed by the analog-to-digital conversion module.
Preferably, the analog-to-digital conversion module performs analog-to-digital conversion on the reference voltage value by using the quantized reference voltage to obtain the reference quantized value after analog-to-digital conversion;
the storage module is respectively connected with the first control module, the analog-to-digital conversion module and the processing module and is used for acquiring and storing the reference voltage value, the quantized reference voltage and the reference quantized value;
The processing module acquires the reference voltage value, the quantized reference voltage and the reference quantized value from the storage module, and processes the current working voltage value of the chip to be detected according to the current quantized value.
The technical scheme of the invention has the beneficial effects that: the analog-to-digital conversion calibration method and system for the chip to be tested not only can solve the problem of chip consistency, but also can simplify the structure of a calibration circuit and improve the calibration precision.
Drawings
FIG. 1 is a flow chart of an analog-to-digital conversion calibration method of a chip under test according to a preferred embodiment of the present invention;
Fig. 2 is a schematic flow chart of storing a reference voltage value, a quantized reference voltage and a reference quantized value in advance in an analog-to-digital conversion calibration method of a chip to be tested according to a preferred embodiment of the present invention.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
It should be noted that, without conflict, the embodiments of the present invention and features of the embodiments may be combined with each other.
The invention is further described below with reference to the drawings and specific examples, which are not intended to be limiting.
The invention provides an analog-to-digital conversion calibration method and system for a chip to be tested.
The method for calibrating the analog-to-digital conversion of the chip to be tested, as shown in fig. 1, specifically comprises the following steps:
Step S1, controlling a chip to be tested to output a fixed reference voltage value, and performing analog-to-digital conversion on the reference voltage value to obtain an analog-to-digital converted reference quantized value;
step S2, obtaining a current working voltage value of the chip to be tested for normal operation, and performing analog-to-digital conversion on the current working voltage value to obtain a current quantized value after analog-to-digital conversion;
and step S3, obtaining the current working voltage value of the chip to be tested according to the reference voltage value, the reference quantized value and the current quantized value.
Specifically, considering the production process errors of chips in the prior art, the consistency of the chips is difficult to ensure, and therefore, the chips cannot be calibrated with high precision, or the calibrated factory chips still have errors. The invention provides an analog-digital conversion calibration method of a chip to be tested, which comprises the steps of executing step S1 in advance, controlling the internal generation or the external generation of a fixed and accurate reference voltage value of the chip to be tested, carrying out analog-digital conversion on the reference voltage value to obtain an analog-digital converted reference quantized value, executing step S2, controlling the chip to be tested to normally work so as to simulate the actual application of the chip to be tested, further obtaining the current working voltage value of the chip to be tested at the moment, carrying out analog-digital conversion on the current working voltage value to obtain an analog-digital converted current quantized value, and finally executing step S3, and obtaining the current working voltage value of the chip to be tested according to the numerical proportion relation among the reference voltage value, the reference quantized value and the current quantized value.
It should be noted that in step S1 and step S2, the reference voltage value signal and the current working voltage value signal of the chip to be tested may be sampled from the chip to be tested in sequence through the analog-to-digital conversion circuit, and analog-to-digital conversion may be performed to obtain the reference quantized value and the current quantized value, respectively.
In a preferred embodiment of the present invention, in step S1, the reference voltage value is subjected to analog-to-digital conversion by using the following formula to obtain a reference quantized value;
Wherein D Reference to is used to represent a reference quantization value;
V Reference to is used to represent the reference voltage value;
v ref is used to represent the quantization reference voltage used in analog-to-digital conversion;
n is used to represent the number of bits of resolution employed in performing the analog-to-digital conversion.
In the numerical conversion counting process, D Reference to is calculated by adopting a rounding method in consideration of convenience of subsequent calculation, namely, the reference quantized value D Reference to is an integer, the decimal point is greater than 0.5 carry, and the decimal point is smaller than 0.5 carry.
Correspondingly, in step S2, the method is also adopted to perform analog-to-digital conversion on the current working voltage value to obtain the current quantized value;
Wherein D Currently, the method is that is used to represent the current quantization value;
v Currently, the method is that is used to represent the current operating voltage value;
v ref is used to represent the quantization reference voltage used in analog-to-digital conversion;
n is used to represent the number of bits of resolution employed in performing the analog-to-digital conversion.
In the numerical conversion counting process, D Currently, the method is that is calculated by adopting a rounding method in consideration of the uniformity of the subsequent numerical units, namely the current quantized value D Currently, the method is that is an integer, the decimal point is greater than 0.5 carry, and the decimal point is smaller than 0.5 carry.
That is, the proportional relationship between the current quantized value and the current operating voltage value finally obtained in step S2 is as above, and considering that the proportional relationship between the reference quantized value and the reference voltage value in step S1 is the same, a specific value of the current operating voltage value may be obtained using the proportional relationship, as shown in detail below,
Step S3, the current working voltage value is obtained through the following formula:
Wherein V Currently, the method is that is used to represent the current operating voltage value;
V Reference to is used to represent the reference voltage value;
D Reference to is used to represent a reference quantization value;
D Currently, the method is that is used to represent the current quantized value.
Thus, the current working voltage value can be obtained through processing the reference quantized value and the reference voltage value obtained in the step S1 and the current quantized value obtained in the step S2.
In the preferred embodiment of the present invention, as shown in fig. 2, step S1, controlling a chip to be tested to output a fixed reference voltage value, performing analog-to-digital conversion on the reference voltage value by using a quantized reference voltage to obtain an analog-to-digital converted reference quantized value, and storing the reference voltage value, the quantized reference voltage and the reference quantized value;
And S3, acquiring a stored reference voltage value, a quantized reference voltage and a reference quantized value, and processing according to the current quantized value to obtain the current working voltage value of the chip to be tested.
Specifically, in order to facilitate process calibration of the chip to be tested, step S1 may be performed in advance, and when the chip leaves the factory, the reference voltage value, the reference quantized value and the quantized reference voltage adopted in the analog-to-digital conversion process obtained in step S1 are stored in a memory of the chip, and in practical application, after the current quantized value is obtained through analog-to-digital conversion, the current working voltage value may be obtained through the reference voltage value, the reference quantized value and the current quantized value.
The analog-to-digital conversion calibration system of the chip to be tested specifically comprises:
The first control module is used for controlling the chip to be tested to output a fixed reference voltage value in advance;
the second control module is used for controlling the chip to be tested to work normally and outputting the current working voltage value;
The analog-to-digital conversion module is used for carrying out analog-to-digital conversion on the output reference voltage value and outputting an analog-to-digital converted reference quantized value, and carrying out analog-to-digital conversion on the current working voltage value and outputting a current quantized value after analog-to-digital conversion;
and the processing module is connected with the first control module, the second control module and the analog-to-digital conversion module and is used for acquiring the current working voltage value of the chip to be tested according to the reference voltage value, the reference quantized value and the current quantized value.
Specifically, considering that the consistency of chips is difficult to guarantee due to the production process errors of chips in the prior art, the invention provides an analog-to-digital conversion calibration system for chips to be tested, which is characterized in that a reference voltage value, a reference quantized value and a current quantized value are respectively obtained through a first control module, a second control module, an analog-to-digital conversion module and a processing module, so that the current working voltage value of the chips to be tested is obtained, and further consistency calibration is realized, and the obtaining process is clear in the description and is not repeated here.
In a preferred embodiment of the present invention, the analog-to-digital conversion module may also perform analog-to-digital conversion on the reference voltage value by using the above formula (1) to generate a reference quantized value, which is specifically as follows;
Wherein D Reference to is used to represent a reference quantization value;
V Reference to is used to represent the reference voltage value;
V ref is used to represent the quantized reference voltage used by the analog-to-digital conversion module;
n is used to represent the number of bits of resolution employed by the analog-to-digital conversion block.
Correspondingly, in step S2, the analog-to-digital conversion module may also perform analog-to-digital conversion by using the current operating voltage value of the above formula (2) to obtain a current quantized value, which is specifically as follows;
Wherein D Currently, the method is that is used to represent the current quantization value;
v Currently, the method is that is used to represent the current operating voltage value;
v ref is used to represent the quantization reference voltage used in analog-to-digital conversion;
n is used to represent the number of bits of resolution employed in performing the analog-to-digital conversion.
Correspondingly, the processing module adopts the formula (3) to process to obtain the current working voltage value:
Wherein V Currently, the method is that is used to represent the current operating voltage value;
V Reference to is used to represent the reference voltage value;
D Reference to is used to represent a reference quantization value;
D Currently, the method is that is used to represent the current quantized value.
Thus, the current working voltage value can be obtained through processing the reference quantized value and the reference voltage value obtained by the formula (1) and the current quantized value obtained by the formula (2).
In a preferred embodiment of the invention, the analog-to-digital conversion module adopts the quantized reference voltage to carry out analog-to-digital conversion on the reference voltage value to obtain the reference quantized value after analog-to-digital conversion;
The storage module is respectively connected with the first control module, the analog-to-digital conversion module and the processing module and is used for acquiring and storing a reference voltage value, a quantized reference voltage and a reference quantized value;
The processing module is used for acquiring the reference voltage value, the quantized reference voltage and the reference quantized value from the storage module, and processing the reference voltage value, the quantized reference voltage and the reference quantized value according to the current quantized value to obtain the current working voltage value of the chip to be detected.
Specifically, a storage module can be provided in advance for facilitating process calibration of the chip to be tested, and when the chip leaves a factory, the reference voltage value, the reference quantized value and the quantized reference voltage adopted in the analog-to-digital conversion process are stored in the storage module, and in practical application, after the current quantized value is obtained through analog-to-digital conversion, the processing module can obtain the current working voltage value through the reference voltage value, the reference quantized value and the current quantized value.
The technical scheme of the invention has the beneficial effects that: the analog-to-digital conversion calibration method and system for the chip to be tested not only can solve the problem of chip consistency, but also can simplify the structure of a calibration circuit and improve the calibration precision.
The foregoing is merely illustrative of the preferred embodiments of the present invention and is not intended to limit the embodiments and scope of the present invention, and it should be appreciated by those skilled in the art that equivalent substitutions and obvious variations may be made using the description and illustrations of the present invention, and are intended to be included in the scope of the present invention.
Claims (6)
1. The analog-to-digital conversion calibration method of the chip to be tested is characterized by comprising the following steps of:
Step S1, controlling a chip to be tested to output a fixed reference voltage value, and performing analog-to-digital conversion on the reference voltage value to obtain an analog-to-digital converted reference quantized value;
Step S2, controlling the chip to be tested to work normally and outputting a current working voltage value, and performing analog-to-digital conversion on the current working voltage value to obtain a current quantized value after analog-to-digital conversion;
step S3, obtaining the current working voltage value of the chip to be tested according to the reference voltage value, the reference quantized value and the current quantized value;
and step S3, processing by adopting the following formula to obtain the current working voltage value:
Wherein V Currently, the method is that is used to represent the current operating voltage value;
v Reference to is used to represent the reference voltage value;
d Reference to is used to represent the reference quantization value;
d Currently, the method is that is used to represent the current quantized value.
2. The method according to claim 1, wherein in the step S1, the reference voltage value is subjected to analog-to-digital conversion by using the following formula to obtain the reference quantized value;
Wherein D Reference to is used to represent the reference quantization value;
v Reference to is used to represent the reference voltage value;
v ref is used to represent the quantization reference voltage used in analog-to-digital conversion;
n is used to represent the number of bits of resolution employed in performing the analog-to-digital conversion.
3. The method according to claim 2, wherein the step S1 is performed to control the chip to be tested to output a fixed reference voltage value, and perform analog-to-digital conversion on the reference voltage value by using the quantized reference voltage, so as to obtain the reference quantized value after analog-to-digital conversion, and store the reference voltage value, the quantized reference voltage and the reference quantized value;
And step S3, acquiring the stored reference voltage value, the quantized reference voltage and the reference quantized value, and processing to obtain the current working voltage value of the chip to be tested according to the current quantized value.
4. An analog-to-digital conversion calibration system for a chip to be tested, comprising:
The first control module is used for controlling the chip to be tested to output a fixed reference voltage value in advance;
the second control module is used for controlling the chip to be tested to work normally and outputting the current working voltage value;
the analog-to-digital conversion module is used for carrying out analog-to-digital conversion on the output reference voltage value and outputting an analog-to-digital converted reference quantized value, and carrying out analog-to-digital conversion on the current working voltage value and outputting an analog-to-digital converted current quantized value;
The processing module is connected with the first control module, the second control module and the analog-to-digital conversion module and is used for acquiring the current working voltage value of the chip to be tested according to the reference voltage value, the reference quantized value and the current quantized value;
the processing module processes and obtains the current working voltage value by adopting the following formula:
Wherein V Currently, the method is that is used to represent the current operating voltage value;
v Reference to is used to represent the reference voltage value;
d Reference to is used to represent the reference quantization value;
d Currently, the method is that is used to represent the current quantized value.
5. The analog-to-digital conversion calibration system of claim 4, wherein said analog-to-digital conversion module applies an analog-to-digital conversion to said reference voltage value to generate said reference quantized value using the formula;
Wherein D Reference to is used to represent the reference quantization value;
v Reference to is used to represent the reference voltage value;
V ref is used to represent the quantization reference voltage used by the analog-to-digital conversion module;
N is used to represent the number of bits for performing the resolution employed by the analog-to-digital conversion module.
6. The analog-to-digital conversion calibration system of claim 5, wherein said analog-to-digital conversion module performs analog-to-digital conversion on said reference voltage value using said quantized reference voltage to obtain an analog-to-digital converted reference quantized value;
the storage module is respectively connected with the first control module, the analog-to-digital conversion module and the processing module and is used for acquiring and storing the reference voltage value, the quantized reference voltage and the reference quantized value;
The processing module acquires the reference voltage value, the quantized reference voltage and the reference quantized value from the storage module, and processes the current working voltage value of the chip to be detected according to the current quantized value.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110708045.4A CN113364461B (en) | 2021-06-24 | 2021-06-24 | Analog-to-digital conversion calibration method and system for chip to be tested |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110708045.4A CN113364461B (en) | 2021-06-24 | 2021-06-24 | Analog-to-digital conversion calibration method and system for chip to be tested |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN113364461A CN113364461A (en) | 2021-09-07 |
| CN113364461B true CN113364461B (en) | 2024-05-03 |
Family
ID=77536267
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202110708045.4A Active CN113364461B (en) | 2021-06-24 | 2021-06-24 | Analog-to-digital conversion calibration method and system for chip to be tested |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN113364461B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114675074B (en) * | 2022-04-13 | 2022-09-27 | 深圳市航顺芯片技术研发有限公司 | VDDA correction device and correction method of MCU |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102769466A (en) * | 2012-07-03 | 2012-11-07 | 深圳市芯海科技有限公司 | Analog-to-digital conversion method and device |
| CN103762982A (en) * | 2014-01-16 | 2014-04-30 | 东南大学 | Capacitance mismatch fast calibrating circuit of analog-digital converter and calibrating method |
| WO2015085469A1 (en) * | 2013-12-09 | 2015-06-18 | 吉瑞高新科技股份有限公司 | System and method for detecting power supply voltage and power supply system |
| WO2015154671A1 (en) * | 2014-04-09 | 2015-10-15 | 华为技术有限公司 | Self-calibration method and device for pipeline successive approximation type analogue to digital convertor |
| WO2017118987A1 (en) * | 2016-01-06 | 2017-07-13 | B. G. Negev Technologies And Applications Ltd., At Ben-Gurion University | A low resolution adc-dsp optimization based on non-uniform quantization and mlse for data centers interconnects |
| CN109104192A (en) * | 2018-07-27 | 2018-12-28 | 北京遥测技术研究所 | A kind of rail-to-rail ADC integrated circuit based on Data Fusion Structure |
| CN109521263A (en) * | 2018-11-19 | 2019-03-26 | 深圳和而泰小家电智能科技有限公司 | A voltage testing method and device |
| CN112953535A (en) * | 2019-12-11 | 2021-06-11 | 上海交通大学 | Gain error calibration device and method for analog-digital converter with segmented structure |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8941518B2 (en) * | 2012-02-14 | 2015-01-27 | Hittite Microwave Corporation | Methods and apparatus for calibrating pipeline analog-to-digital converters having multiple channels |
| US11209927B2 (en) * | 2017-12-11 | 2021-12-28 | Google Llc | Apparatus for sensing user input |
-
2021
- 2021-06-24 CN CN202110708045.4A patent/CN113364461B/en active Active
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102769466A (en) * | 2012-07-03 | 2012-11-07 | 深圳市芯海科技有限公司 | Analog-to-digital conversion method and device |
| WO2015085469A1 (en) * | 2013-12-09 | 2015-06-18 | 吉瑞高新科技股份有限公司 | System and method for detecting power supply voltage and power supply system |
| CN103762982A (en) * | 2014-01-16 | 2014-04-30 | 东南大学 | Capacitance mismatch fast calibrating circuit of analog-digital converter and calibrating method |
| WO2015154671A1 (en) * | 2014-04-09 | 2015-10-15 | 华为技术有限公司 | Self-calibration method and device for pipeline successive approximation type analogue to digital convertor |
| WO2017118987A1 (en) * | 2016-01-06 | 2017-07-13 | B. G. Negev Technologies And Applications Ltd., At Ben-Gurion University | A low resolution adc-dsp optimization based on non-uniform quantization and mlse for data centers interconnects |
| CN109104192A (en) * | 2018-07-27 | 2018-12-28 | 北京遥测技术研究所 | A kind of rail-to-rail ADC integrated circuit based on Data Fusion Structure |
| CN109521263A (en) * | 2018-11-19 | 2019-03-26 | 深圳和而泰小家电智能科技有限公司 | A voltage testing method and device |
| CN112953535A (en) * | 2019-12-11 | 2021-06-11 | 上海交通大学 | Gain error calibration device and method for analog-digital converter with segmented structure |
Also Published As
| Publication number | Publication date |
|---|---|
| CN113364461A (en) | 2021-09-07 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN106374923B (en) | High-precision ADC reference voltage calibration system and calibration method | |
| US7479914B2 (en) | A-D converter and A-D convert method | |
| US9362938B2 (en) | Error measurement and calibration of analog to digital converters | |
| JP2009118488A (en) | DA converter and AD converter | |
| CN110568397B (en) | Electric energy meter correction method and system based on MCU software | |
| CN112688687B (en) | Method and device for acquiring physical information to be tested, computer equipment and storage medium | |
| CN103529379B (en) | For the choosing method in low-resolution signal source in high-precision adc test | |
| CN111257626B (en) | Method and device for calibrating internal reference voltage of chip | |
| CN109150183A (en) | The Capacitor Mismatch Calibration of SAR-ADC based on metastable state detection | |
| CN113364461B (en) | Analog-to-digital conversion calibration method and system for chip to be tested | |
| CN111953346A (en) | Test method, system, chip and household appliance for analog-to-digital converter | |
| TWI407129B (en) | Adjustable voltage comparing circuit and adjustable voltage examining module | |
| CN116106811A (en) | Error calibration method and system for multichannel voltage acquisition chip | |
| CN118801882B (en) | Analog-to-digital conversion device, digital signal calibration method and device | |
| CN112152623A (en) | System and method for testing analog-to-digital converter | |
| US7535388B2 (en) | Calculation of ADC and DAC errors in LSI chip | |
| CN108387834B (en) | Wide area ADC error correction test method and device | |
| CN114675074B (en) | VDDA correction device and correction method of MCU | |
| Jin et al. | A digital self-calibration algorithm for ADCs based on histogram test using low-linearity input signals | |
| CN112910462B (en) | pipeline-SAR ADC digital interstage gain calibration method based on metastable state detection | |
| CN106788436B (en) | Voltage coefficient calibration method applied to PIP capacitor array in SARADC | |
| CN115940948A (en) | Calibration method, storage medium, calibration device and chip of analog-to-digital converter | |
| CN113155003A (en) | Sensor calibration method and system based on photoetching machine | |
| Li et al. | An ultra-fast ADC linearity test and calibration method | |
| CN111490786B (en) | Calibration method and device of digital-to-analog converter |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |