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CN113341351A - Omnidirectional magnetic induction intensity testing instrument calibration and time-frequency testing method and device - Google Patents

Omnidirectional magnetic induction intensity testing instrument calibration and time-frequency testing method and device Download PDF

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CN113341351A
CN113341351A CN202110640883.2A CN202110640883A CN113341351A CN 113341351 A CN113341351 A CN 113341351A CN 202110640883 A CN202110640883 A CN 202110640883A CN 113341351 A CN113341351 A CN 113341351A
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magnetic induction
time
induction intensity
voltage
real
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钟森鸣
王晓军
林泓延
宾坤
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Guangdong Polytechnic Normal University
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration
    • G01R33/0035—Calibration of single magnetic sensors, e.g. integrated calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/0206—Three-component magnetometers
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    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
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Abstract

The invention discloses a method and a device for calibrating an omnidirectional magnetic induction intensity testing instrument and testing time frequency, which relate to the technical field of electric field testing and comprise the following steps: obtaining the average value of magnetic induction intensity RMS within the time length T1 of the preset stable sine alternating magnetic field
Figure DDA0003106552010000011
And X, Y, Z three-directional magnetic induction voltage signals; x, Y, Z calculating three groups of sine signal vectors and voltage RMS average value in the same period
Figure DDA0003106552010000012
And is compared with the RMS average value of the magnetic induction
Figure DDA0003106552010000013
Constructing a linear regression equation to obtain a slope and an intercept, and completing calibration as a voltage signal and actual magnetic induction conversion formula; any real-time voltage time domain signal is obtained again, and the real-time voltage time domain signal can be converted into a real-time magnetic induction intensity value; and processing the real-time domain magnetic induction intensity value according to a fast Fourier algorithm to obtain a frequency domain signal. This application has the effect that reduces equipment cost improves the magnetic induction intensity test means.

Description

Omnidirectional magnetic induction intensity testing instrument calibration and time-frequency testing method and device
Technical Field
The application relates to the technical field of electric field testing, in particular to a method and a device for calibrating an omnidirectional magnetic induction intensity testing instrument and testing time frequency.
Background
When the GB/T37130-; as the standard is just started, corresponding testing equipment is lacked in China or the accuracy of the domestic equipment is insufficient, equipment (such as ELT-400) of Narda company in Germany is often used for testing, but the equipment can only carry out time domain testing, displays RMS mean value/peak value within 1 second at the frequency of 4Hz, and cannot carry out frequency domain testing required by GB/T37130-.
Disclosure of Invention
In order to better test the exposure of the electromagnetic field of the vehicle relative to the human body, the application provides a method and a device for calibrating an omnidirectional magnetic induction intensity test instrument and testing time frequency.
In a first aspect, the present application provides a method for calibrating an omnidirectional magnetic induction intensity test instrument and performing a time-frequency test, which adopts the following technical scheme:
a method for calibrating an omnidirectional magnetic induction intensity testing instrument and testing time frequency comprises the following steps:
obtaining the average value of magnetic induction intensity RMS within the time length T1 of the preset stable sine alternating magnetic field
Figure BDA0003106551990000011
And X, Y, Z three-directional magnetic induction voltage signals;
x, Y, Z calculating three groups of sine signal vectors and voltage RMS average value in the same period
Figure BDA0003106551990000012
And is compared with the RMS average value of the magnetic induction
Figure BDA0003106551990000013
Constructing a linear regression equation to obtain a slope and an intercept, and completing calibration as a voltage signal and actual magnetic induction conversion formula;
acquiring any real-time voltage time domain signal again, namely acquiring a real-time domain magnetic induction intensity value again; and the number of the first and second groups,
processing the real-time domain magnetic induction intensity value according to a fast Fourier algorithm to obtain a frequency domain signal;
wherein the real-time domain magnetic induction intensity values are: and the voltage time domain real-time signal is obtained by processing according to the calibrated slope, the calibrated intercept and the linear regression equation.
Optionally, the steady sinusoidal alternating magnetic field is generated by a uniform magnetic field generator.
Optionally, the RMS average value of the magnetic induction over the period of T1
Figure BDA0003106551990000014
And X, Y, Z the magnetic induction voltage signals in three directions are: the magnetic field is obtained by an omnidirectional magnetic field probe of a magnetic induction intensity testing instrument, processed and output by a host machine of the magnetic induction intensity testing instrument and obtained by analog/digital conversion.
Optionally, the linear regression equation is
Figure BDA0003106551990000021
In a second aspect, the present application provides a time-frequency testing apparatus, which adopts the following technical scheme:
a time-frequency testing device comprises a memory and a processor, wherein the memory is stored with a computer program which can be loaded by the processor and executes the method.
In summary, the present application includes at least one of the following beneficial technical effects:
based on a magnetic induction intensity testing instrument which can only test a time domain, the correct RMS average value of the magnetic induction intensity within a period of time and an electric signal corresponding to X, Y, Z three-direction magnetic induction intensity are obtained, so that the magnetic induction intensity time-frequency test can be realized, the equipment cost is reduced, and the magnetic induction intensity testing means is improved.
Drawings
Fig. 1 is a schematic flow diagram of the present application.
Detailed Description
The present application is described in further detail below with reference to fig. 1.
The embodiment of the application discloses a method for calibrating an omnidirectional magnetic induction intensity testing instrument and testing time frequency, which comprises the following steps:
obtaining the average value of magnetic induction intensity RMS within the time length T1 of the preset stable sine alternating magnetic field
Figure BDA0003106551990000022
And X, Y, Z three-directional magnetic induction voltage signals;
x, Y, Z calculating three groups of sine signal vectors and voltage RMS average value in the same period
Figure BDA0003106551990000023
And is compared with the RMS average value of the magnetic induction
Figure BDA0003106551990000024
Constructing a linear regression equation to obtain a slope and an intercept, and completing calibration as a voltage signal and actual magnetic induction conversion formula;
acquiring any real-time voltage time domain signal again, namely acquiring a real-time domain magnetic induction intensity value again; processing the real-time domain magnetic induction intensity value according to a fast Fourier algorithm to obtain a frequency domain signal; wherein the real-time domain magnetic induction intensity values are: and the voltage time domain real-time signal is obtained by processing according to the calibrated slope, the calibrated intercept and the linear regression equation.
The method can be realized by an upper computer, and specifically comprises the following steps:
s1, generating a stable sinusoidal alternating magnetic field by using a uniform magnetic field generator (such as a Helmholtz coil);
s2, reading magnetic induction intensity by using an omnidirectional magnetic field probe in an omnidirectional magnetic induction intensity testing instrument (such as ELT-400) and outputting the magnetic induction intensity to a matched host;
s3, displaying the RMS average value of the magnetic induction intensity in 1 second (T1 duration) by the host computer
Figure BDA0003106551990000031
And outputting X, Y, Z three-direction magnetic induction intensity electric signals;
wherein, the voltage signal in the X direction is: u shapeX＝(UX_1，UX_2，……，UX_n) The Y-direction voltage signal is: u shapeY＝(UY_1，UY_2，......，UY_n) The Z-direction voltage signal is: u shapeZ＝(UZ_1，UZ_2，......，UZ_n) N is the data volume;
converting the analog electric signal into a digital signal by adopting an analog-to-digital converter or an oscilloscope and transmitting the digital signal to an upper computer;
s4, calculating X, Y, Z three groups of sinusoidal signal vectors and RMS average in the same period
Figure BDA0003106551990000032
The calculation result of the upper computer and the display value of the host computer
Figure BDA0003106551990000033
Constructing a linear regression equation, wherein the obtained slope (k) and intercept (b) are conversion coefficients of the voltage signal and the actual magnetic induction intensity, thereby completing calibration; wherein the linear regression equation is
Figure BDA0003106551990000034
And S5, reading the time domain voltage value by using the omnidirectional magnetic field probe, converting the time domain voltage value into a time domain magnetic induction intensity value through a host computer of the omnidirectional magnetic field probe, and converting the time domain magnetic induction intensity value into a frequency domain signal through a fast Fourier algorithm, thereby completing the time-frequency test of the magnetic induction intensity.
Specifically, taking as an example that the frequency of the current supplied to the helmholtz coil is 50Hz, and the X, Y, Z three-direction voltage signals are all in phase:
sine function of voltage in X direction is UX＝Umax_Xsin(100πt)；
Sine function of voltage in Y direction is UY＝Umax_Ysin(100πt)；
Z-direction voltage sine function is UZ＝Umax_Zsin(100πt)；
The voltage RMS average is obtained by the following equation:
Figure BDA0003106551990000041
and the results in the data sheet were obtained:
Figure BDA0003106551990000042
Figure BDA0003106551990000043
and
Figure BDA0003106551990000044
the linear regression formula is
Figure BDA0003106551990000045
At the moment, any voltage time domain signal can be converted into a magnetic induction intensity time domain signal, and then a frequency domain signal is obtained through FFT (fast Fourier transform algorithm).
The technical scheme can be used for human body protection test of the power supply magnetic field, and meanwhile, the test efficiency is greatly improved.
The embodiment of the application also discloses a time frequency testing device. The time-frequency testing device comprises a memory and a processor, wherein the memory stores a computer program which can be loaded by the processor and executes the method.
The above embodiments are preferred embodiments of the present application, and the protection scope of the present application is not limited by the above embodiments, so: all equivalent changes made according to the structure, shape and principle of the present application shall be covered by the protection scope of the present application.

Claims (6)

1.一种全向磁感应强度测试仪器标定与时频测试方法，其特征在于，包括：1. an omnidirectional magnetic induction test instrument calibration and time-frequency test method, is characterized in that, comprises: 获取预设稳定正弦交变磁场的T1时长内的磁感应强度RMS平均值
Figure FDA0003106551980000011
及X、Y、Z三个方向的磁感应强度电压信号；Obtain the RMS average value of the magnetic induction intensity within the T1 duration of the preset stable sinusoidal alternating magnetic field
Figure FDA0003106551980000011
And the magnetic induction intensity voltage signal in the three directions of X, Y and Z; 计算X、Y、Z三组正弦信号矢量和同一段时间内的电压RMS平均值
Figure FDA0003106551980000012
并与磁感应强度RMS平均值
Figure FDA0003106551980000013
构造线性回归方程，得到斜率和截距，并作为电压信号与实际磁感应强度转换公式完成标定；Calculate X, Y, Z three sets of sinusoidal signal vectors and the voltage RMS average value in the same period of time
Figure FDA0003106551980000012
And with the average value of magnetic induction intensity RMS
Figure FDA0003106551980000013
Construct the linear regression equation, obtain the slope and intercept, and complete the calibration as the conversion formula between the voltage signal and the actual magnetic induction intensity; 再次获取任意实时电压时域信号，即获取实时的时域磁感应强度值；以及，Obtaining any real-time voltage time-domain signal again, that is, obtaining a real-time time-domain magnetic induction value; and, 根据快速傅里叶算法处理实时的时域磁感应强度值，得到频域信号；其中，所述实时的时域磁感应强度值为：电压时域实时信号根据标定的斜率、截距和线性回归方程处理得到。Process the real-time time-domain magnetic induction value according to the fast Fourier algorithm to obtain a frequency-domain signal; wherein, the real-time time-domain magnetic induction value is: the voltage time domain real-time signal is processed according to the calibrated slope, intercept and linear regression equation get. 2.根据权利要求1所述的全向磁感应强度测试仪器标定与时频测试方法，其特征在于：所述稳定正弦交变磁场通过均匀磁场发生器生成。2 . The omnidirectional magnetic induction intensity testing instrument calibration and time-frequency testing method according to claim 1 , wherein the stable sinusoidal alternating magnetic field is generated by a uniform magnetic field generator. 3 . 3.根据权利要求2所述的全向磁感应强度测试仪器标定与时频测试方法，其特征在于：所述均匀磁场发生器为亥姆霍兹线圈。3 . The omnidirectional magnetic induction intensity testing instrument calibration and time-frequency testing method according to claim 2 , wherein the uniform magnetic field generator is a Helmholtz coil. 4 . 4.根据权利要求1所述的全向磁感应强度测试仪器标定与时频测试方法，其特征在于：所述T1时长内的磁感应强度RMS平均值
Figure FDA0003106551980000014
及X、Y、Z三个方向的磁感应强度电压信号为：通过磁感应强度测试仪器的全向磁场探头获取，通过其主机处理输出，并通过模/数转换后得到。4. omnidirectional magnetic induction intensity testing instrument calibration and time-frequency testing method according to claim 1, is characterized in that: the magnetic induction intensity RMS average value in described T1 duration
Figure FDA0003106551980000014
And the magnetic induction intensity voltage signals in the three directions of X, Y, and Z are: obtained by the omnidirectional magnetic field probe of the magnetic induction intensity test instrument, processed and output by its host, and obtained after analog/digital conversion. 5.根据权利要求1所述的全向磁感应强度测试仪器标定与时频测试方法，其特征在于：所述线性回归方程为
Figure FDA0003106551980000015
5. Omnidirectional magnetic induction intensity testing instrument calibration and time-frequency testing method according to claim 1, is characterized in that: described linear regression equation is
Figure FDA0003106551980000015
 6.一种时频测试装置，其特征在于，包括存储器和处理器，所述存储器上存储有能够被处理器加载并执行如权利要求1至5中任一种方法的计算机程序。6 . A time-frequency testing device, characterized in that it comprises a memory and a processor, wherein the memory stores a computer program capable of being loaded by the processor and executing the method according to any one of claims 1 to 5 .
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