CN113252986B - A multi-pin double-pin test device for connectors - Google Patents
A multi-pin double-pin test device for connectors Download PDFInfo
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- CN113252986B CN113252986B CN202110670235.1A CN202110670235A CN113252986B CN 113252986 B CN113252986 B CN 113252986B CN 202110670235 A CN202110670235 A CN 202110670235A CN 113252986 B CN113252986 B CN 113252986B
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- 238000012360 testing method Methods 0.000 title claims abstract description 230
- 230000007246 mechanism Effects 0.000 claims abstract description 121
- 239000000463 material Substances 0.000 claims description 4
- 241000755266 Kathetostoma giganteum Species 0.000 claims 8
- 238000002955 isolation Methods 0.000 claims 1
- 238000001514 detection method Methods 0.000 abstract description 18
- 238000010586 diagram Methods 0.000 description 4
- 238000004891 communication Methods 0.000 description 2
- 230000003993 interaction Effects 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000005389 magnetism Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
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- 239000000523 sample Substances 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/08—Measuring resistance by measuring both voltage and current
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/54—Testing for continuity
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
本发明涉及自动检测领域，公开了一种连接器的多PIN双针测试装置，包括压板机构、测试机构和顶块机构。压板机构将待测连接器夹持固定，然后压板机构将待测连接器压合在测试机构上，顶块机构驱动测试机构向上移动，带动其上的四组测试针组与待测连接器的PIN针接触，构成开尔文四线检测，通过使用单独的对载电流和电压检测电极，实现对待测连接器PIN针阻抗的测试。相比于传统的两端子测试，本发明消除了布线和接触电阻的阻抗，测试结果更精确，同时将人工测试替代为机器自动测试，测试速度更快，可靠性更高。
The present invention relates to the field of automatic detection, and discloses a multi-PIN double-pin test device for a connector, including a pressure plate mechanism, a test mechanism, and a top block mechanism. The pressure plate mechanism clamps and fixes the connector to be tested, and then the pressure plate mechanism presses the connector to be tested onto the test mechanism. The top block mechanism drives the test mechanism to move upward, driving the four groups of test pins thereon to contact the PIN pins of the connector to be tested, forming a Kelvin four-wire detection. By using separate electrodes for carrying current and voltage detection, the impedance of the PIN pins of the connector to be tested is tested. Compared with the traditional two-terminal test, the present invention eliminates the impedance of wiring and contact resistance, and the test results are more accurate. At the same time, the manual test is replaced by the machine automatic test, and the test speed is faster and the reliability is higher.
Description
Technical Field
The invention relates to the field of automatic detection, in particular to a multi-PIN double-PIN testing device of a connector.
Background
In order to achieve the purposes of automatic control or transmission interaction, the electronic equipment needs to be used as a medium for signal transmission through a connector, wherein the most common is a PIN connector, one end of the PIN is connected with a wiring harness, and the other end of the PIN is inserted into a corresponding electronic equipment communication interface.
Before leaving the factory, the PIN connector needs to be subjected to strict quality tests, including testing impedance and on-off between PINs.
In the prior art, on-off test and impedance test of a PIN needle are completed manually, a worker needs to put a PIN needle connector into a special test tool, a conductive probe on the test tool is contacted with the PIN needle connector, whether current passes through the PIN needle or not is detected, so that whether the PIN needle can be electrified or not is judged, and the impedance value of the PIN needle is measured through calculation. The test mode can not accurately test the impedance between PIN needles, has low efficiency, and is easy to cause test errors due to negligence of workers.
Disclosure of Invention
The invention aims to provide a multi-PIN double-PIN testing device of a connector, which is used for solving the problem that impedance between PIN PINs cannot be accurately and efficiently tested in the prior art.
To achieve the purpose, the invention adopts the following technical scheme:
a multi-PIN double-needle testing device of a connector comprises a pressing plate mechanism, a testing mechanism and a top block mechanism;
The pressing plate mechanism is configured to be fixedly connected to the base, is positioned above the testing mechanism and is used for clamping the connector to be tested and pressing the connector to be tested on the testing mechanism;
The testing mechanism is connected with the base, and comprises a left flat head testing needle group, a left sharp head testing needle group, a right flat head testing needle group and a right sharp head testing needle group, wherein the left flat head testing needle group and the left sharp head testing needle group are arranged on the left side of the testing mechanism, and the right flat head testing needle group and the right sharp head testing needle group are arranged on the right side of the testing mechanism;
the jack-up mechanism is configured to be fixedly connected to the base, is located below the testing mechanism and is used for jacking up the testing mechanism, so that the testing mechanism is in contact with the PIN of the connector to be tested.
Preferably, the test mechanism further comprises a test table, a guide post, a spring and a test needle fixing block;
the test bench is fixedly connected to the base;
the guide post is movably connected below the test bench;
The spring is sleeved on the outer ring of the guide post and is positioned between the test table and the test needle fixing block;
the test needle fixing block is located below the guide post and fixedly connected with the guide post and the spring, and the left flat head test needle set, the left sharp head test needle set, the right flat head test needle set and the right sharp head test needle set are respectively fixed on the test needle fixing block.
Preferably, the left flat head test needle set is located outside the left pointed test needle set, and the right flat head test needle set is located outside the right pointed test needle set.
Preferably, the left-tipped test needle group and the right-tipped test needle group are equal in height, and the heights of the left-tipped test needle group and the right-tipped test needle group are not lower than the heights of the left-tipped test needle group and the right-tipped test needle group.
Preferably, the multi-PIN double-PIN testing device of the connector further comprises a fine tuning sliding table, wherein the fine tuning sliding table is fixedly connected below the testing mechanism and used for fine tuning the pressing position of the pressing plate mechanism relative to the testing mechanism.
Preferably, the multi-PIN double-PIN testing device of the connector comprises at least two stations, wherein each station comprises the pressing plate mechanism, the testing mechanism, the top block mechanism and the fine tuning sliding table.
Preferably, the pressing plate mechanism comprises a pressing plate, a clamp and a pressing plate driving mechanism, wherein the pressing plate is movably connected to the base, the clamp is fixedly connected to the pressing plate and used for clamping the connector to be tested, and the pressing plate driving mechanism is fixedly connected with the base and used for driving the pressing plate to ascend or descend.
Preferably, the top block mechanism comprises a top block and a top block driving mechanism, and the top block driving mechanism is fixedly connected with the base and used for driving the top block to ascend or descend.
Preferably, the test bench is provided with a positioning hole, and the test bench is fixedly connected to the base through a fastener and the positioning hole.
Preferably, the material of the test mechanism is magnetically isolated.
The beneficial effects of the invention are as follows:
The invention provides a multi-PIN double-PIN testing device of a connector, which is characterized in that a pressing plate mechanism clamps and presses the connector to be tested on a testing mechanism, a top block mechanism drives four groups of testing PIN groups in the testing mechanism to be contacted with PIN PINs of the connector to be tested to form Kelvin four-wire detection, also called four-terminal detection, and the testing of the PIN impedance of the connector to be tested is realized by using independent opposite current and voltage detection electrodes. Compared with the traditional two-end test, the invention eliminates the impedance of wiring and contact resistance, the test result is more accurate, and meanwhile, the manual test is replaced by the automatic test of a machine, the test speed is faster, and the reliability is higher.
Drawings
Fig. 1 is a schematic diagram of the overall structure of a multi-PIN double-PIN testing device of a connector according to the present invention;
FIG. 2 is a schematic diagram of a single-station structure of a multi-PIN, dual-PIN test device for connectors according to the present invention;
FIG. 3 is a schematic diagram of a partial structure of a test pin set and a connector to be tested according to the present invention;
Fig. 4 is a schematic diagram showing a partial structure of a test pin set and a connector to be tested according to the present invention.
In the figure, a 1-pressing plate mechanism, a 11-pressing plate, a 12-clamp, a 13-pressing plate driving mechanism, a 2-testing mechanism, a 21-left flat head testing needle set, a 22-left flat head testing needle set, a 23-right flat head testing needle set, a 24-right flat head testing needle set, a 25-testing table, a 26-guiding column, a 27-testing needle fixing block, a 3-top block mechanism, a 31-top block, a 32-top block driving mechanism, a 4-fine tuning sliding table and a 100-connector to be tested are arranged.
Detailed Description
The invention is described in further detail below with reference to the drawings and examples. It is to be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the invention. It should be further noted that, for convenience of description, only some, but not all of the structures related to the present invention are shown in the drawings.
In the description of the present invention, unless explicitly stated or limited otherwise, the terms "connected," "connected," and "fixed" are to be construed broadly, and may, for example, be fixedly connected, detachably connected, or integrally formed, mechanically connected, electrically connected, directly connected, indirectly connected through an intervening medium, or in communication between two elements or in an interaction relationship between two elements. The specific meaning of the above terms in the present invention will be understood in specific cases by those of ordinary skill in the art.
In the present invention, unless expressly stated or limited otherwise, a first feature "above" or "below" a second feature may include both the first and second features being in direct contact, as well as the first and second features not being in direct contact but being in contact with each other through additional features therebetween. Moreover, a first feature being "above," "over" and "on" a second feature includes the first feature being directly above and obliquely above the second feature, or simply indicating that the first feature is higher in level than the second feature. The first feature being "under", "below" and "beneath" the second feature includes the first feature being directly under and obliquely below the second feature, or simply means that the first feature is less level than the second feature.
In the description of the present embodiment, the terms "upper", "lower", "right", etc. orientation or positional relationship are based on the orientation or positional relationship shown in the drawings, and are merely for convenience of description and simplicity of operation, and do not indicate or imply that the apparatus or elements referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as limiting the invention. Furthermore, the terms "first," "second," and the like, are used merely for distinguishing between descriptions and not for distinguishing between them.
As shown in fig. 1 to 4, an embodiment of the present invention provides a multi-PIN and dual-PIN testing device for a connector, which includes a platen mechanism 1, a testing mechanism 2, and a top block mechanism 3. The pressing plate mechanism 1 is configured to be fixedly connected to the base, and the pressing plate mechanism 1 is located above the testing mechanism 2 and is used for clamping the connector 100 to be tested and pressing the connector 100 to be tested onto the testing mechanism 2. The testing mechanism 2 comprises a left flat head testing needle group 21, a left sharp head testing needle group 22, a right flat head testing needle group 23 and a right sharp head testing needle group 24, wherein the left flat head testing needle group 21 and the left sharp head testing needle group 22 are arranged on the left side of the testing mechanism 2, and the right flat head testing needle group 23 and the right sharp head testing needle group 24 are arranged on the right side of the testing mechanism 2. The jack-up mechanism 3 is configured to be fixedly connected to the base, and the jack-up mechanism 3 is located below the test mechanism 2 and is used for jack-up the test mechanism 2 so that the test mechanism 2 contacts with the PIN of the connector 100 to be tested.
According to the multi-PIN double-PIN testing device for the connector, the to-be-tested connector is clamped and fixed by the pressing plate mechanism 1, then the to-be-tested connector 100 is pressed on the testing mechanism 2 by the pressing plate mechanism 1, the top block mechanism 3 drives the testing mechanism 2 to move upwards to drive four groups of testing PIN groups on the pressing plate mechanism to be in contact with the PIN PINs of the to-be-tested connector 100, kelvin four-wire detection is formed, so that the four-terminal detection is also called four-terminal detection, and the testing of the PIN PIN impedance of the to-be-tested connector 100 is realized by using independent load current and voltage detection electrodes. Compared with the traditional two-end test, the invention eliminates the impedance of wiring and contact resistance, the test result is more accurate, and meanwhile, the manual test is replaced by the automatic test of a machine, the test speed is faster, and the reliability is higher.
Preferably, left flat head test needle set 21 is located outside of left pointed test needle set 22 and right flat head test needle set 23 is located outside of right pointed test needle set 24. By implanting the flat PINs at the PIN of the connector 100 to be tested, the inner implanted flat PINs form a kelvin four-wire test, solving the problem of low resistance test accuracy. In addition, the PIN of the connector 100 to be tested is pointed, so that the contact area can be effectively increased by adopting the flat head for the test PIN group connected with the PIN, the main structure (not the PIN) of the PIN is a sheet, and the contact area is large, so that the contact can be ensured by adopting the pointed head for the test PIN group connected with the main structure (not the PIN) of the PIN, the volume of the test PIN group is reduced, and the equipment cost is reduced.
Preferably, the test mechanism 2 further comprises a test bench 25, a guide post 26, a spring and a test needle fixing block 27. The test bench 25 is fixedly attached to the base. A guide post 26 is movably connected below the test bench 25. The spring is sleeved on the outer ring of the guide post 26 and is positioned between the test bench 25 and the test needle fixing block 27. The test needle fixing block 27 is located below the guide post 26 and fixedly connected with the guide post 26 and the spring, and the left flat head test needle set 21, the left sharp head test needle set 22, the right flat head test needle set 23 and the right sharp head test needle set 24 are respectively fixed on the test needle fixing block 27.
Illustratively, when the test PIN fixture 27 is lifted up by the ejector mechanism 3, the springs are compressed, and the test PIN fixture 27 approaches the test bed 25 along the guide posts 26, and moves to the working position, the left flat head test PIN set 21, the left pointed test PIN set 22, the right flat head test PIN set 23, and the right pointed test PIN set 24 are all in contact with the PIN PINs of the connector 100 to be tested.
Preferably, the left and right hand tip test needle sets 22, 24 are of equal height, the left and right hand tip test needle sets 21, 23 are of equal height, and neither the left nor right hand tip test needle sets 22, 24 are of lower height than the left and right hand tip test needle sets 21, 23. The PIN PINs of the connector 100 to be tested are usually of a bent structure, so the height of the test PIN group is correspondingly arranged in a non-uniform height structure.
Preferably, the multi-PIN double-PIN testing device of the connector further comprises a fine tuning sliding table 4, wherein the fine tuning sliding table 4 is fixedly connected below the testing mechanism 2 and used for fine tuning the pressing position of the pressing plate mechanism 1 relative to the testing mechanism 2. The arrangement can ensure that the connector 100 to be tested clamped by the pressing plate mechanism 1 is in accurate contact with the testing mechanism 2, so that detection errors and even detection failures caused by position deviation of equipment after repeated use are prevented.
Preferably, the multi-PIN double-PIN testing device of the connector comprises at least two stations, and each station comprises a pressing plate mechanism 1, a testing mechanism 2, a jacking block mechanism 3 and a fine tuning sliding table 4. In practical application, the number of stations can be flexibly selected according to arrangement space and processing requirements, so that the detection efficiency is improved, and meanwhile, the equipment redundancy is avoided.
Preferably, the pressing plate mechanism 1 comprises a pressing plate 11, a clamp 12 and a pressing plate driving mechanism 13, wherein the pressing plate 11 is movably connected to the base, the clamp 12 is fixedly connected to the pressing plate 11 and used for clamping the connector 100 to be tested, and the pressing plate driving mechanism 13 is fixedly connected with the base and used for driving the pressing plate 11 to ascend or descend. In this embodiment, the air cylinder is used as the platen driving mechanism 13, and in other embodiments, the air cylinder may be replaced by other power devices such as a motor and a hydraulic cylinder, which is still within the scope of protection of this patent.
Further, the fixture 12 can be adaptively replaced according to different to-be-tested pieces, so that the adaptability of the device is enhanced.
Preferably, the top block mechanism 3 includes a top block 31 and a top block driving mechanism 32, where the top block driving mechanism 32 is fixedly connected with the base and is used to drive the top block 31 to rise or fall. In this embodiment, the cylinder is also used as the top block driving mechanism 32, and in other embodiments, the cylinder may be replaced by another power device such as a motor or a hydraulic cylinder. Accordingly, the top block 31 may be a linkage mechanism or a magnetic attraction mechanism, but still fall within the protection scope of the present patent.
Preferably, the test bench 25 is provided with a positioning hole, and the test bench 25 is fixedly connected to the base through a fastener and the positioning hole.
Preferably, the material of the testing mechanism 2 is magnetically isolated to deflect the magnetic field lines away from the detection means. In the embodiment, the connector 100 to be tested has magnetism, and in order to prevent the magnetic interference of the connector 100 to be tested from detecting the result, the material of the testing mechanism 2 needs to be magnetically isolated, so that the magnetic force lines deviate from the detecting device.
The invention has the working process that the clamp 12 on the pressing plate mechanism 1 clamps and fixes the connector 100 to be tested, then the pressing plate 11 presses the connector 100 to be tested on the test bench 25 of the test mechanism 2, the top block mechanism 3 drives the test needle fixing block 27 of the test mechanism 2 to move upwards, and 4 groups of test needle groups on the top block mechanism are driven to contact with PIN needles of the connector 100 to be tested, thereby forming Kelvin four-wire detection, also called four-terminal detection, and the measurement of the PIN needle impedance of the connector 100 to be tested is realized by using independent opposite current and voltage detection electrodes.
It is to be understood that the above examples of the present invention are provided for clarity of illustration only and are not limiting of the embodiments of the present invention. Various obvious changes, rearrangements and substitutions can be made by those skilled in the art without departing from the scope of the invention. It is not necessary here nor is it exhaustive of all embodiments. Any modification, equivalent replacement, improvement, etc. which come within the spirit and principles of the invention are desired to be protected by the following claims.
Claims (10)
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| Application Number | Priority Date | Filing Date | Title |
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| CN202110670235.1A CN113252986B (en) | 2021-06-17 | 2021-06-17 | A multi-pin double-pin test device for connectors |
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| CN202110670235.1A CN113252986B (en) | 2021-06-17 | 2021-06-17 | A multi-pin double-pin test device for connectors |
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| CN113252986B true CN113252986B (en) | 2025-02-14 |
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| CN115184654A (en) * | 2022-07-20 | 2022-10-14 | 燕麦(杭州)智能制造有限公司 | Test pin die, test method, and storage medium |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN216926921U (en) * | 2021-06-17 | 2022-07-08 | 昆山迈致治具科技有限公司 | A multi-PIN double-pin test device for connectors |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| JP2007256248A (en) * | 2006-03-20 | 2007-10-04 | Denken:Kk | Kelvin-contact type socket for can package semiconductor device characteristic inspection |
| CN205193108U (en) * | 2015-11-20 | 2016-04-27 | 苏州博众精工科技有限公司 | Semi -automatic accredited testing organization |
| CN107255593B (en) * | 2017-07-18 | 2019-12-17 | 泰德兴精密电子（昆山）有限公司 | PIN resilience detection method |
| CN107589301B (en) * | 2017-09-30 | 2024-03-12 | 南京协辰电子科技有限公司 | Impedance test probe and PCB impedance test machine |
| CN110031748A (en) * | 2019-04-29 | 2019-07-19 | 西安国是电子科技有限公司 | Integrated circuit component test device and test method |
| CN210109140U (en) * | 2019-04-30 | 2020-02-21 | 东莞市国梦电机有限公司 | Terminal fixture with high test efficiency |
| CN210071888U (en) * | 2019-06-05 | 2020-02-14 | 合云峰 | Electronic product test fixture |
| CN212540622U (en) * | 2020-05-07 | 2021-02-12 | 烟台艾睿光电科技有限公司 | Chip testing device |
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| CN216926921U (en) * | 2021-06-17 | 2022-07-08 | 昆山迈致治具科技有限公司 | A multi-PIN double-pin test device for connectors |
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