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CN113203638A - Method and system for testing shearing large strain of metal sheet under microscopic scale - Google Patents

Method and system for testing shearing large strain of metal sheet under microscopic scale Download PDF

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CN113203638A
CN113203638A CN202110426342.XA CN202110426342A CN113203638A CN 113203638 A CN113203638 A CN 113203638A CN 202110426342 A CN202110426342 A CN 202110426342A CN 113203638 A CN113203638 A CN 113203638A
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何霁
韩国丰
李淑慧
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    • G01N3/24Investigating strength properties of solid materials by application of mechanical stress by applying steady shearing forces
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Abstract

本发明提供了一种微观尺度下金属薄板剪切大应变测试方法及系统,涉及实验固体力学技术领域,该方法包括:试样预处理步骤:对待剪切的试样表面需要进行应变测试的区域依次进行清洁、磨光、抛光和再清洁处理;标记点制备步骤:根据测试需求确定标记点的分布和间距,在预处理后的试样测试区域制备标记点;试样变形过程采集记录步骤:采集记录试样变形过程中标记点的相对位置;应变计算步骤:根据标记点相对位置的变化计算测试区域的应变。本发明能够使得的应变结果更加接近真实情况,避免间接计算方法中存在的问题。

Figure 202110426342

The invention provides a method and a system for measuring large shear strain of a metal sheet at a microscopic scale, and relates to the technical field of experimental solid mechanics. Clean, polish, polish and re-clean in sequence; mark point preparation steps: determine the distribution and spacing of mark points according to test requirements, and prepare mark points in the pretreated sample test area; sample deformation process acquisition and recording steps: Collect and record the relative positions of the marked points during the deformation process of the sample; strain calculation step: calculate the strain of the test area according to the change of the relative positions of the marked points. The invention can make the strain result closer to the real situation and avoid the problems existing in the indirect calculation method.

Figure 202110426342

Description

一种微观尺度下金属薄板剪切大应变测试方法及系统A method and system for measuring large shear strain of metal sheet at microscopic scale

技术领域technical field

本发明涉及实验固体力学技术领域,具体地,涉及一种微观尺度下金属薄板剪切大应变测试方法及系统。The invention relates to the technical field of experimental solid mechanics, in particular to a method and a system for testing large shear strain of a metal sheet at a microscopic scale.

背景技术Background technique

与单向拉伸测试相比,金属薄板剪切测试因其无颈缩、可实现大应变等优点受到关注,结合数字图像相关(Digital Image Correlation,DIC)这种先进的应变测试手段,剪切可以被用来进行金属薄板硬化、屈服和断裂等行为的表征,大大加深人们对薄板材料变形行为的认识。但是,近期一些研究发现,剪切测试中DIC应变计算结果与虚拟应变片尺寸(Virtual Strain Gauge Size,LVGS)参数设置相关,特别是在大应变阶段,变形集中在微区,微区应变计算结果对LVGS更加敏感。一般来说,DIC应变计算结果会随着LVGS的减小而收敛,该收敛值即被认为是测试所得值,但由于DIC测试系统性能、试样散斑尺寸和环境噪声等因素的限制,LVGS无法设置的很小,致使剪切大变形阶段应变计算结果可能未完全收敛。通过调研资料发现,目前大部分研究者进行的剪切DIC测试中,使用的LVGS值最小只能达到0.1mm左右,计算结果的收敛性难以评价。Compared with uniaxial tensile test, sheet metal shear test has attracted attention because of its advantages of no necking and large strain. Combined with Digital Image Correlation (DIC), an advanced strain test method, shear It can be used to characterize the hardening, yielding and fracture behavior of metal sheets, which greatly deepens people's understanding of the deformation behavior of sheet materials. However, some recent studies have found that the DIC strain calculation results in the shear test are related to the Virtual Strain Gauge Size (LVGS) parameter settings, especially in the large strain stage, the deformation is concentrated in the micro area, and the micro area strain calculation results More sensitive to LVGS. Generally speaking, the DIC strain calculation results will converge with the decrease of LVGS, and the convergence value is regarded as the value obtained from the test. It cannot be set too small, so that the strain calculation results may not be fully converged in the stage of large shear deformation. According to the research data, it is found that in the shear DIC test conducted by most researchers, the minimum LVGS value used can only reach about 0.1mm, and the convergence of the calculation results is difficult to evaluate.

近年来,学者们在微观尺度对金属薄板的剪切大变形应变进行了一系列的研究和测量。Ghahremaninezhad和Scales等人分别于2013年和2016年(A.Ghahremaninezhad,etal.,Int.J.Fracture,2013;M.Scales et al.,Int.J.Solids Struct.,2016.)对铝合金试样剪切变形集中区域晶粒取向进行了方向测量,计算得出微区应变,发现微区应变比DIC测试所得应变大,即DIC低估了材料的应变,但其方法存在的问题是需要对剪切变形的模式做出一定的假设,假设模式是否与实际模式一致有待考量。2017年~2020年,Rahmaan和Pathak等人通过材料微观结构取向测量和变形前后硬度测试等方法进行了一系列间接测量和计算工作(Rahmaan,T.,et al.,Int.J.Impact Eng.,2017;Pathak,N.,et al.,Exp.Mech.,2019;Pathak,N.,et al.,J.Mech.Phys.Solids,2020),发现在剪切大应变阶段,传统DIC手段计算得到的应变比真实应变小,即DIC测试结果可能已经失真,但是,Rahmaan和Pathak等人工作的问题在于对剪切变形模式和材料力学行为进行了理论假设,在理论假设基础上才能计算得到应变,理论假设对计算结果的影响难以评估,同时,其提出的材料微观结构取向测量方法无法消除试样刚性转动对测试结果的影响,这进一步限制了其应用。In recent years, scholars have carried out a series of studies and measurements on the shear large deformation strain of metal sheets at the microscopic scale. Ghahremaninezhad and Scales et al. in 2013 and 2016 respectively (A. Ghahremaninezhad, et al., Int. J. Fracture, 2013; M. Scales et al., Int. J. Solids Struct., 2016.) on aluminum alloy test The direction of the grain orientation in the concentrated area of shear deformation of the sample was measured, and the micro-strain was calculated. It was found that the micro-strain was larger than the strain obtained by the DIC test, that is, the DIC underestimated the strain of the material. The model of shear deformation makes certain assumptions, and whether the assumed model is consistent with the actual model remains to be considered. From 2017 to 2020, Rahmaan and Pathak et al. carried out a series of indirect measurement and calculation work by means of material microstructure orientation measurement and hardness test before and after deformation (Rahmaan, T., et al., Int.J.Impact Eng. , 2017; Pathak, N., et al., Exp.Mech., 2019; Pathak, N., et al., J.Mech.Phys.Solids, 2020), found that in the large shear strain stage, the traditional DIC method The calculated strain is smaller than the real strain, that is, the DIC test results may have been distorted. However, the problem with the work of Rahmaan and Pathak et al. The influence of strain and theoretical assumptions on the calculation results is difficult to evaluate. At the same time, the proposed method for measuring the orientation of the material microstructure cannot eliminate the influence of the rigid rotation of the sample on the test results, which further limits its application.

综上,目前剪切测试的DIC应变计算中存在LVGS难以进一步减小、应变间接计算结果可靠性难以评估等问题,需要一种可靠的微观尺度下的金属薄板剪切大应变测试方法。In summary, there are problems in the current DIC strain calculation of shear test, such as difficulty in further reducing LVGS, and difficulty in evaluating the reliability of indirect calculation results of strain.

发明内容SUMMARY OF THE INVENTION

针对现有技术中的缺陷,本发明的目的是提供一种微观尺度下金属薄板剪切大应变测试方法及系统,以解决上述问题。Aiming at the defects in the prior art, the purpose of the present invention is to provide a method and system for measuring large shear strain of a metal sheet at a microscopic scale, so as to solve the above problems.

根据本发明提供的一种微观尺度下金属薄板剪切大应变测试方法及系统,所述方案如下:According to a method and system for measuring large shear strain of a metal sheet at a microscopic scale provided by the present invention, the scheme is as follows:

第一方面,提供了一种微观尺度下金属薄板剪切大应变测试方法,所述方法包括:In a first aspect, a method for testing large shear strain of a metal sheet at a microscopic scale is provided, the method comprising:

试样预处理步骤:对待剪切的试样表面需要进行应变测试的区域依次进行清洁、磨光、抛光和再清洁处理;Sample pretreatment steps: The area of the surface of the sample to be sheared that needs to be subjected to strain testing is cleaned, polished, polished and re-cleaned in sequence;

标记点制备步骤:根据测试需求确定标记点的分布和间距,在试样测试区域制备标记点;Marking point preparation steps: Determine the distribution and spacing of the marking points according to the test requirements, and prepare the marking points in the test area of the sample;

试样变形过程采集记录步骤:采集记录试样变形过程中标记点的相对位置;The step of collecting and recording the deformation process of the sample: collecting and recording the relative positions of the marked points during the deformation process of the sample;

应变计算步骤:根据标记点相对位置的变化计算测试区域的应变。Strain calculation step: Calculate the strain of the test area according to the change of the relative position of the marked points.

优选的,所述试样预处理步骤中的清洁和再清洁处理通过酒精、丙酮进行。Preferably, the cleaning and re-cleaning treatments in the sample pretreatment step are performed by alcohol and acetone.

优选的,所述试样预处理步骤中的磨光处理依次通过400目、800目和1200目砂纸进行,每道次磨光时间1~3min。Preferably, the polishing treatment in the sample pretreatment step is sequentially performed with 400-mesh, 800-mesh, and 1200-mesh sandpaper, and the polishing time for each pass is 1-3 minutes.

优选的,所述试样预处理步骤中的抛光处理依次通过9μm金刚石悬浮液、3μm金刚石悬浮液和0.03μm二氧化硅悬浮液进行,每道次抛光时间3~10min。Preferably, the polishing treatment in the sample pretreatment step is sequentially performed by 9 μm diamond suspension, 3 μm diamond suspension and 0.03 μm silica suspension, and the polishing time for each pass is 3-10 minutes.

优选的,所述标记点制备步骤中的标记点制备方法为显微硬度点标记法或纳米压痕标记法。Preferably, the marking point preparation method in the marking point preparation step is a microhardness point marking method or a nanoindentation marking method.

优选的,所述试样变形过程采集记录步骤中的采集记录试样变形过程通过原位法或准原位法进行。Preferably, the acquisition and recording of the sample deformation process in the sample deformation process acquisition and recording step is performed by an in-situ method or a quasi-in-situ method.

优选的,所述试样变形过程采集记录步骤中,根据标记点的大小和分布特点,采集记录试样变形过程的记录装置为光学显微镜、激光共聚焦显微镜或扫描电子显微镜。Preferably, in the step of collecting and recording the deformation process of the sample, according to the size and distribution characteristics of the marked points, the recording device for collecting and recording the deformation process of the sample is an optical microscope, a laser confocal microscope or a scanning electron microscope.

优选的,所述应变计算步骤中的应变计算的方法为九点法或七点法。Preferably, the strain calculation method in the strain calculation step is a nine-point method or a seven-point method.

第二方面,提供了一种微观尺度下金属薄板剪切大应变测试系统,所述系统包括:In a second aspect, there is provided a large-strain testing system for sheet metal shearing at a microscopic scale, the system comprising:

试样预处理模块:对待剪切的试样表面需要进行应变测试的区域依次进行清洁、磨光、抛光和再清洁处理;Sample pretreatment module: The area of the sample surface to be sheared that needs to be strain tested is cleaned, polished, polished and re-cleaned in sequence;

标记点制备模块:根据测试需求确定标记点的分布和间距,在试样测试区域制备标记点;Marking point preparation module: Determine the distribution and spacing of the marking points according to the test requirements, and prepare the marking points in the test area of the sample;

试样变形过程采集记录模块:采集记录试样变形过程中标记点的相对位置;Sample deformation process acquisition and recording module: collect and record the relative positions of the marked points during the sample deformation process;

应变计算模块:根据标记点相对位置的变化计算测试区域的应变。Strain calculation module: Calculate the strain of the test area according to the change of the relative position of the marked points.

优选的,所述应变计算模块中应变计算的方法为九点法或七点法。Preferably, the strain calculation method in the strain calculation module is a nine-point method or a seven-point method.

与现有技术相比,本发明具有如下的有益效果:Compared with the prior art, the present invention has the following beneficial effects:

1、与传统DIC方法相比,本发明能实现更小的LVGS,即小于0.05mm,获得微观尺度下材料的应变,所得的应变结果更加接近真实情况;1. Compared with the traditional DIC method, the present invention can achieve a smaller LVGS, that is, less than 0.05mm, obtain the strain of the material at the microscopic scale, and the obtained strain result is closer to the real situation;

2、本发明标记点制备方法简单、稳定、可靠,且成本低廉;2. The marking point preparation method of the present invention is simple, stable, reliable, and low in cost;

3、本发明的应变计算方法简单直接,无需对剪切变形模型进行理论假设,避免了间接计算方法存在的问题。3. The strain calculation method of the present invention is simple and direct, does not need to make theoretical assumptions on the shear deformation model, and avoids the problems existing in the indirect calculation method.

附图说明Description of drawings

通过阅读参照以下附图对非限制性实施例所作的详细描述,本发明的其它特征、目的和优点将会变得更明显:Other features, objects and advantages of the present invention will become more apparent by reading the detailed description of non-limiting embodiments with reference to the following drawings:

图1为本发明的流程图;Fig. 1 is the flow chart of the present invention;

图2为本发明实施例制备的标记点示意图;Fig. 2 is the schematic diagram of the marking point prepared in the embodiment of the present invention;

图3为本发明实施例制备的标记点及其变形实物图;Fig. 3 is the marking point and its deformation physical map prepared by the embodiment of the present invention;

图4为本发明实施例九点法应变计算原理示意图;FIG. 4 is a schematic diagram of a nine-point method strain calculation principle according to an embodiment of the present invention;

图5为本发明实施例九点法应变计算结果;Fig. 5 is the strain calculation result of the nine-point method according to the embodiment of the present invention;

图6为本发明实施例标记点示意图;6 is a schematic diagram of a marking point according to an embodiment of the present invention;

图7为本发明实施例七点法应变计算原理示意图。FIG. 7 is a schematic diagram of the principle of seven-point method strain calculation according to an embodiment of the present invention.

具体实施方式Detailed ways

下面结合具体实施例对本发明进行详细说明。以下实施例将有助于本领域的技术人员进一步理解本发明,但不以任何形式限制本发明。应当指出的是,对本领域的普通技术人员来说,在不脱离本发明构思的前提下,还可以做出若干变化和改进。这些都属于本发明的保护范围。The present invention will be described in detail below with reference to specific embodiments. The following examples will help those skilled in the art to further understand the present invention, but do not limit the present invention in any form. It should be noted that, for those skilled in the art, several changes and improvements can be made without departing from the inventive concept. These all belong to the protection scope of the present invention.

本发明实施例提供了一种微观尺度下金属薄板剪切大应变测试方法,叙述了1.6mm厚DP980板微观尺度下剪切大应变准原位测试方法。The embodiment of the present invention provides a method for testing large shear strain of a metal thin plate on a microscopic scale, and describes a quasi-in-situ testing method for large shearing strain on a 1.6 mm thick DP980 plate on a microscopic scale.

实施例1:Example 1:

参照图1所示,具体包括:试样预处理步骤:对待DP980剪切试样表面需要进行应变测试的区域依次进行清洁、磨光、抛光和再清洁处理,其中清洁和再清洁使用酒精进行,磨光处理依次通过400目、800目和1200目砂纸进行,每道次磨光时间2min;抛光处理依次通过9μm金刚石悬浮液、3μm金刚石悬浮液和0.03μm二氧化硅悬浮液进行,其中使用9μm金刚石悬浮液抛光3min,之后使用3μm金刚石悬浮液抛光3min,最后使用0.03μm二氧化硅悬浮液抛光5min,抛光完成后试样表面不应存在肉眼可见划痕。Referring to Fig. 1, it specifically includes: sample pretreatment steps: cleaning, polishing, polishing and re-cleaning are performed in sequence on the area of the DP980 sheared sample surface that needs to be subjected to strain testing, wherein cleaning and re-cleaning are performed with alcohol, The polishing treatment was carried out with 400-mesh, 800-mesh and 1200-mesh sandpaper in sequence, and the polishing time was 2min per pass; the polishing treatment was successively carried out through 9 μm diamond suspension, 3 μm diamond suspension and 0.03 μm silica suspension, in which 9 μm diamond suspension was used. The diamond suspension was polished for 3 min, then polished with 3 μm diamond suspension for 3 min, and finally polished with 0.03 μm silica suspension for 5 min. After polishing, there should be no visible scratches on the surface of the sample.

参照图2和图3所示,标记点制备步骤:根据测试需求确定标记点的分布和间距,在试样测试区域制备标记点,在试样变形过程中标记点应清晰可见。标记点制备方法可以采用显微硬度点标记法或纳米压痕标记法。本实施例使用显微硬度点标记法,采用维氏硬度计在试样表面制备标记点,加载力98.07mN,保载时间10s,制备所得的标记点大小约为0.01mm,LVSG值约为0.04mm。Referring to Figures 2 and 3, marking point preparation steps: determine the distribution and spacing of marking points according to test requirements, prepare marking points in the test area of the sample, and the marking points should be clearly visible during the deformation process of the sample. The marking point preparation method may adopt the microhardness point marking method or the nanoindentation marking method. In this example, the micro-hardness point marking method is used, and a Vickers hardness tester is used to prepare marking points on the surface of the sample. The loading force is 98.07 mN, and the holding time is 10 s. The size of the prepared marking points is about 0.01 mm, and the LVSG value is about 0.04. mm.

试样变形过程采集记录步骤:本实例采用准原位法采集记录试样变形过程中标记点的相对位置变化,即将试样在加载装置上加载到特定位移,根据标记点的大小和分布特点,采集记录试样变形过程的记录装置为光学显微镜、激光共聚焦显微镜或扫描电子显微镜。在本实施例中卸载之后取出试样并放在光学显微镜下观测,调整合适的放大倍数,记录该加载步下标记点形貌图片,反复执行上述过程,记录得到一系列加载步下的标记点形貌图片。The sample deformation process acquisition and recording steps: In this example, the quasi-in situ method is used to collect and record the relative position changes of the marked points during the deformation process of the sample, that is, the sample is loaded on the loading device to a specific displacement. According to the size and distribution characteristics of the marked points, The recording device for collecting and recording the deformation process of the sample is an optical microscope, a laser confocal microscope or a scanning electron microscope. In this example, after unloading, take out the sample and place it under an optical microscope for observation, adjust the appropriate magnification, record the topographic picture of the marked point under the loading step, repeat the above process, and record a series of marked points under the loading step. Topographical picture.

应变计算步骤:根据标记点相对位置的变化计算测试区域的应变,其中,应变计算的方法可以选用九点法。Strain calculation step: Calculate the strain of the test area according to the change of the relative position of the marked point, among which, the method of strain calculation can be the nine-point method.

参照图4所示,采用九点法计算应变,图4中为标记点P(i,j)在初始状态和第k步加载后与其邻近标记点的相对位置关系,在图片上量取各点坐标,可以得到以下两个矩阵:Referring to Figure 4, the nine-point method is used to calculate the strain. Figure 4 shows the relative positional relationship between the marked point P (i, j) and its adjacent marked points after loading in the initial state and the kth step. Measure each point on the picture. coordinates, the following two matrices can be obtained:

Figure BDA0003029662940000041
Figure BDA0003029662940000041

Figure BDA0003029662940000042
Figure BDA0003029662940000042

其中,

Figure BDA0003029662940000051
表示根据A、B两点坐标差得到的列向量,根据上述两个矩阵,可以得到标记点P(i,j)在第k步加载后的变形梯度:in,
Figure BDA0003029662940000051
Represents the column vector obtained according to the coordinate difference of the two points A and B. According to the above two matrices, the deformation gradient of the marked point P (i, j) after loading in the kth step can be obtained:

Figure BDA0003029662940000052
Figure BDA0003029662940000052

其中(A)+表示矩阵A的Moore-Penrose逆,根据变形梯度可进一步计算得到该标记点相应的应变张量,重复上述过程可以得到其他标记点对应的变形梯度和应变张量。Among them, (A) + represents the Moore-Penrose inverse of matrix A. According to the deformation gradient, the corresponding strain tensor of the marked point can be further calculated, and the deformation gradient and strain tensor corresponding to other marked points can be obtained by repeating the above process.

参照图5所示,为本实施例计算得到的某加载步下试样测试区域的Mises应变分布。Referring to FIG. 5 , the Mises strain distribution of the test area of the sample under a certain loading step calculated in this embodiment is obtained.

实施例2:Example 2:

试样预处理步骤:对DP980剪切试样表面需要进行应变测试的区域依次进行清洁、磨光、抛光和再清洁处理,其中清洁和再清洁使用酒精进行,磨光处理依次通过400目、800目和1200目砂纸进行,每道次磨光时间2min;抛光处理依次通过9μm金刚石悬浮液、3μm金刚石悬浮液和0.03μm二氧化硅悬浮液进行,其中使用9μm金刚石悬浮液抛光3min,之后使用3μm金刚石悬浮液抛光3min,最后使用0.03μm二氧化硅悬浮液抛光5min。Sample pretreatment steps: Clean, polish, polish and re-clean the area of the surface of the DP980 sheared sample that needs to be subjected to strain testing in sequence. The cleaning and re-cleaning are carried out with alcohol, and the polishing treatment is performed through 400 mesh, 800 mesh in turn. mesh and 1200-grit sandpaper, and the polishing time is 2min per pass; the polishing treatment is carried out sequentially through 9μm diamond suspension, 3μm diamond suspension and 0.03μm silica suspension, of which the 9μm diamond suspension is used for polishing for 3min, and then 3μm is used. The diamond suspension was polished for 3 min, and finally a 0.03 μm silica suspension was used for 5 min.

标记点制备步骤:根据测试需求确定标记点的分布和间距,在试样测试区域制备标记点,本实施例采用纳米压痕仪在试样表面制备标记点,加载力小于9.807mN,加载速度小于20nm/s,所得标记点如图6所示,使用纳米压痕仪的目的是为了制备更小尺寸和间距的标记点,可以进一步减小LVSG值。Marking point preparation steps: Determine the distribution and spacing of marking points according to the test requirements, and prepare marking points in the test area of the sample. In this example, a nano-indenter is used to prepare marking points on the surface of the sample. The loading force is less than 9.807mN, and the loading speed is less than 20nm/s, the obtained marking points are shown in Figure 6. The purpose of using the nanoindenter is to prepare marking points with smaller size and spacing, which can further reduce the LVSG value.

试样变形过程采集记录:本实例采用原位法采集记录试样变形过程中标记点的相对位置变化,即将试样在扫描电子显微镜原位加载装置上进行加载,调整扫描电子显微镜至合适的放大倍数,在加载的同时记录标记点形貌图片,使用原位法的主要目的是能更加全面的了解试样的变形历程。Collection and record of sample deformation process: In this example, the in-situ method is used to collect and record the relative position changes of the marked points during the deformation process of the sample, that is, load the sample on the scanning electron microscope in-situ loading device, and adjust the scanning electron microscope to a suitable magnification. The main purpose of using the in situ method is to have a more comprehensive understanding of the deformation history of the sample.

应变计算:本实施例采用七点法计算应变,参照图7所示,为标记点P(i,j)在初始状态和第k步加载后与其邻近标记点的相对位置关系,在图片上量取各点坐标,可以得到以下两个矩阵:Strain calculation: In this embodiment, the seven-point method is used to calculate the strain. Referring to Figure 7, it is the relative positional relationship between the marked point P (i, j) and its adjacent marked points after the initial state and the k-th step after loading. Taking the coordinates of each point, the following two matrices can be obtained:

Figure BDA0003029662940000053
Figure BDA0003029662940000053

Figure BDA0003029662940000054
Figure BDA0003029662940000054

其中

Figure BDA0003029662940000055
表示根据A、B两点坐标差得到的列向量,根据上述两个矩阵,可以得到标记点P(i,j)在第k步加载后的变形梯度:in
Figure BDA0003029662940000055
Represents the column vector obtained according to the coordinate difference of the two points A and B. According to the above two matrices, the deformation gradient of the marked point P (i, j) after loading in the kth step can be obtained:

Figure BDA0003029662940000061
Figure BDA0003029662940000061

其中(A)+表示矩阵A的Moore-Penrose逆,根据变形梯度可进一步计算得到该标记点相应的应变张量,重复上述过程可以得到其他标记点对应的变形梯度和应变张量。使用七点法的目的是其对试样复杂形状边界的适应性更好。Among them, (A) + represents the Moore-Penrose inverse of matrix A. According to the deformation gradient, the corresponding strain tensor of the marked point can be further calculated, and the deformation gradient and strain tensor corresponding to other marked points can be obtained by repeating the above process. The purpose of using the seven-point method is to better adapt to the complex shape boundary of the specimen.

本发明提供的一种微观尺度下金属薄板剪切大应变测试方法,将本发明与传统DIC方法相比,本发明能实现更小的LVGS,即小于0.05mm,获得微观尺度下材料的应变,所得的应变结果更加接近真实情况;且本发明标记点制备方法简单、稳定、可靠,且成本低廉;应变计算方法简单直接,无需对剪切变形模型进行理论假设,避免了间接计算方法存在的问题。The invention provides a method for measuring large shear strain of metal sheet at microscopic scale. Compared with the traditional DIC method, the present invention can realize a smaller LVGS, that is, less than 0.05mm, and obtain the strain of the material at the microscopic scale. The obtained strain result is closer to the real situation; and the marking point preparation method of the present invention is simple, stable, reliable, and low in cost; the strain calculation method is simple and direct, and does not need to make theoretical assumptions on the shear deformation model, and avoids the problems existing in the indirect calculation method .

本领域技术人员知道,除了以纯计算机可读程序代码方式实现本发明提供的系统及其各个装置、模块、单元以外,完全可以通过将方法步骤进行逻辑编程来使得本发明提供的系统及其各个装置、模块、单元以逻辑门、开关、专用集成电路、可编程逻辑控制器以及嵌入式微控制器等的形式来实现相同功能。所以,本发明提供的系统及其各项装置、模块、单元可以被认为是一种硬件部件,而对其内包括的用于实现各种功能的装置、模块、单元也可以视为硬件部件内的结构;也可以将用于实现各种功能的装置、模块、单元视为既可以是实现方法的软件模块又可以是硬件部件内的结构。Those skilled in the art know that, in addition to implementing the system provided by the present invention and its various devices, modules and units in the form of purely computer-readable program codes, the system provided by the present invention and its various devices can be implemented by logically programming the method steps. , modules, and units realize the same function in the form of logic gates, switches, application-specific integrated circuits, programmable logic controllers, and embedded microcontrollers. Therefore, the system provided by the present invention and its various devices, modules and units can be regarded as a kind of hardware components, and the devices, modules and units included in it for realizing various functions can also be regarded as hardware components. The device, module and unit for realizing various functions can also be regarded as both a software module for realizing the method and a structure within a hardware component.

以上对本发明的具体实施例进行了描述。需要理解的是,本发明并不局限于上述特定实施方式,本领域技术人员可以在权利要求的范围内做出各种变化或修改,这并不影响本发明的实质内容。在不冲突的情况下,本申请的实施例和实施例中的特征可以任意相互组合。Specific embodiments of the present invention have been described above. It should be understood that the present invention is not limited to the above-mentioned specific embodiments, and those skilled in the art can make various changes or modifications within the scope of the claims, which do not affect the essential content of the present invention. The embodiments of the present application and features in the embodiments may be combined with each other arbitrarily, provided that there is no conflict.

Claims (10)

1. A method for testing large shearing strain of a metal sheet under a microscopic scale is characterized by comprising the following steps:
sample pretreatment: sequentially cleaning, polishing and cleaning again an area needing strain testing on the surface of a sample to be sheared;
marking point preparation: determining the distribution and the spacing of the marking points according to the test requirements, and preparing the marking points in the test area of the pretreated sample;
collecting and recording the sample deformation process: collecting and recording the relative position of a marking point in the sample deformation process;
and strain calculation: and calculating the strain of the test area according to the change of the relative positions of the marking points.
2. The method for testing shear large strain of a metal sheet under microscopic scale according to claim 1, wherein the cleaning and re-cleaning processes in the sample pretreatment step are performed by alcohol or acetone.
3. The method for testing the large shearing strain of the metal sheet under the microscopic scale according to claim 1, wherein the polishing treatment in the sample pretreatment step is sequentially performed by 400-mesh, 800-mesh and 1200-mesh sandpaper, and the polishing time of each pass is 1-3 min.
4. The method for testing the shearing large strain of the metal sheet under the microscopic scale according to claim 1, wherein the polishing treatment in the sample pretreatment step is sequentially carried out by using a 9 μm diamond suspension, a 3 μm diamond suspension and a 0.03 μm silicon dioxide suspension, and the polishing time of each pass is 3-10 min.
5. The method for testing the shear large strain of the metal sheet under the microscale of claim 1, wherein the method for preparing the mark points in the step for preparing the mark points is a microhardness point marking method or a nanoindentation marking method.
6. The method for testing the shearing large strain of the metal sheet under the microscopic scale according to claim 1, wherein the step of acquiring and recording the deformation process of the sample is carried out by an in-situ method or a quasi-in-situ method.
7. The method for testing the large shearing strain of the metal sheet under the microscale according to claim 1, wherein in the step of collecting and recording the deformation process of the sample, the recording device for collecting and recording the deformation process of the sample is an optical microscope, a laser confocal microscope or a scanning electron microscope according to the size and distribution characteristics of the marking points.
8. The method for testing large shear strain of a metal sheet under the microscopic scale according to claim 1, wherein the method for calculating the strain in the strain calculating step is nine-point method or seven-point method.
9. A large shear strain test system for a metal sheet under a microscopic scale is characterized by comprising:
a sample pretreatment module: sequentially cleaning, polishing and cleaning again an area needing strain testing on the surface of a sample to be sheared;
a marking point preparation module: determining the distribution and the spacing of the marking points according to the test requirements, and preparing the marking points in the test area of the pretreated sample;
the sample deformation process acquisition and recording module: collecting and recording the relative position of a marking point in the sample deformation process;
a strain calculation module: and calculating the strain of the test area according to the change of the relative positions of the marking points.
10. The micro-scale sheet metal shear large strain test system according to claim 6, wherein the strain calculation method in the strain calculation module is nine-point method or seven-point method.
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