CN113189972B - A single chip microcomputer testing device and method - Google Patents
A single chip microcomputer testing device and method Download PDFInfo
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- CN113189972B CN113189972B CN202110611703.8A CN202110611703A CN113189972B CN 113189972 B CN113189972 B CN 113189972B CN 202110611703 A CN202110611703 A CN 202110611703A CN 113189972 B CN113189972 B CN 113189972B
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0208—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system
- G05B23/0213—Modular or universal configuration of the monitoring system, e.g. monitoring system having modules that may be combined to build monitoring program; monitoring system that can be applied to legacy systems; adaptable monitoring system; using different communication protocols
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/20—Pc systems
- G05B2219/24—Pc safety
- G05B2219/24065—Real time diagnostics
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Abstract
The invention relates to the technical field of single chip microcomputer testing and discloses a single chip microcomputer testing device and method, wherein the single chip microcomputer testing device comprises a locking seat, a power module and a testing circuit, wherein a wiring terminal is arranged on the locking seat, when the single chip microcomputer is placed on the locking seat, one pin of the single chip microcomputer is electrically connected with one wiring terminal, the power module respectively supplies power to the single chip microcomputer and the testing circuit, the single chip microcomputer is electrically connected with the testing circuit through a wire, in actual use, the testing circuit is not electrically connected with the pin of the single chip microcomputer or the wiring terminal electrically connected with the pin of the single chip microcomputer in advance according to a fixed connection circuit, but is arranged in a split mode with the single chip microcomputer, in actual test, the testing pin of the single chip microcomputer can be electrically connected with part of circuits in the testing circuit according to test requirements, the flexibility is high, and single chip microcomputers with different types and different digits can be tested.
Description
Technical Field
The invention relates to the technical field of single-chip microcomputer testing, in particular to a single-chip microcomputer testing device and method.
Background
A single chip microcomputer is a microcomputer system which is formed by integrating a plurality of functional circuits such as a CPU (central processing unit), a RAM (random access memory), a ROM (read only memory), a plurality of I/O (input/output) ports, an interrupt system, a timer, a counter, a display driving circuit, a pulse width modulation circuit, a digital-to-analog conversion circuit and the like with a single silicon chip by adopting a very large scale integrated circuit technology and is widely applied to the field of industrial control. At present, the single chip microcomputer can be divided into 8 bits, 16 bits and 32 bits, and after the single chip microcomputer is produced, specific testing devices are needed to test single chip microcomputers with different digits and different models, so that the testing flexibility is low, and the time consumption is high.
Disclosure of Invention
In view of the shortcomings of the background technology, the invention provides a single-chip microcomputer testing device and a single-chip microcomputer testing method, and aims to solve the technical problem that the existing single-chip microcomputer testing device is low in testing flexibility during testing.
The technical scheme is that the single chip microcomputer testing device comprises a locking seat, a power module and a testing circuit, wherein a wiring terminal is arranged on the locking seat, when the single chip microcomputer is placed on the locking seat, one pin of the single chip microcomputer is electrically connected with one wiring terminal, the power module supplies power to the single chip microcomputer and the testing circuit respectively, and the single chip microcomputer is electrically connected with the testing circuit through a wire.
As a further technical scheme, the power supply module outputs two paths of direct-current voltages respectively, the power supply module supplies power to the singlechip and the test circuit through the change-over switch, and the change-over switch is used for selecting one path of direct-current voltage to be input to the singlechip and the test circuit.
Further, the magnitudes of the two direct current voltages are 5V and 3V, respectively.
The test circuit comprises a common anode light emitting diode circuit, a common cathode light emitting diode circuit, an LCD1602 liquid crystal circuit, an LCD12864 liquid crystal circuit, a buzzer circuit, a stepping motor driving circuit, a matrix keyboard circuit, a low-level trigger key group circuit, a high-level trigger key group circuit, a 138 decoder circuit, an external E2PROM circuit, an infrared receiving circuit, a 2.4G wireless receiving and transmitting circuit, an LED lattice circuit, a temperature sensor circuit, a common anode nixie tube circuit, a common cathode nixie tube circuit, a voltage detection circuit and one or more circuits in the test circuit, wherein the singlechip is electrically connected with one or more circuits in the test circuit through wires.
When in actual use, the singlechip is placed on the locking seat, pins of the singlechip can be electrically connected with part of circuits in the test circuit by using the DuPont wire according to test requirements, and a specific test device is not required to be designed. For example, when the test circuit comprises all the circuits, if the driving capability of the singlechip is required to be tested, the IO pin of the singlechip is electrically connected with the common anode light-emitting diode circuit and the LCD1602 liquid crystal circuit by using the DuPont wire, so that the whole test flexibility is high, and the wiring of the singlechip and the test circuit can be performed according to different test requirements.
A single chip microcomputer testing method is applied to the single chip microcomputer testing device and comprises the following steps of S1, placing the single chip microcomputer on a locking seat, using a wire to electrically connect a testing pin of the single chip microcomputer with a testing circuit according to testing requirements, S2, writing a testing program into the single chip microcomputer, and S3, observing whether the testing circuit responds to the single chip microcomputer or not when the single chip microcomputer operates.
As a further technical scheme, in the step S2, a plurality of test programs are sequentially written into the singlechip to realize different performance tests of the singlechip.
Compared with the prior art, the testing circuit has the advantages that the testing circuit is not electrically connected with the pins of the single chip microcomputer or the wiring terminals electrically connected with the pins of the single chip microcomputer in advance according to the fixed connection circuit, but is arranged in a split mode with the single chip microcomputer, when the testing is actually carried out, the Dupont wire can be used for electrically connecting the testing pins of the single chip microcomputer with part of circuits in the testing circuit for testing according to testing requirements, the flexibility is high, and the single chip microcomputer with different models and different digits can be tested.
Drawings
The invention has the following drawings:
FIG. 1 is a schematic diagram of a single chip microcomputer testing device according to the present invention;
FIG. 2 is a circuit diagram of a DC power supply circuit of the present invention;
FIG. 3 is a circuit diagram of a USB power supply circuit of the present invention;
FIG. 4 is a circuit diagram of an LCD12864 liquid crystal circuit according to the present invention;
FIG. 5 is a circuit diagram of a liquid crystal circuit of an LCD1602 according to the present invention;
FIG. 6 is a circuit diagram of a 138 decoder circuit of the present invention;
FIG. 7 is a circuit diagram of a buzzer circuit according to the present invention;
FIG. 8 is a circuit diagram of a thermistor and a photoresistor of the present invention;
FIG. 9 is a schematic diagram of a common anode LED circuit and a common cathode LED circuit of the present invention;
FIG. 10 is a circuit diagram of an E2PROM circuit of the present invention;
FIG. 11 is a circuit diagram of a matrix keyboard circuit of the present invention;
FIG. 12 is a circuit diagram of a stepper motor drive circuit of the present invention;
FIG. 13 is a circuit diagram of a high level toggle key set circuit of the present invention;
FIG. 14 is a circuit diagram of a common anode nixie tube circuit of the present invention;
FIG. 15 is a circuit diagram of a voltage detection circuit of the present invention;
FIG. 16 is a circuit diagram of a current detection circuit of the present invention;
FIG. 17 is a circuit diagram of an LED array circuit of the present invention;
fig. 18 is a circuit diagram of a 2.4G radio transceiver circuit of the present invention.
Detailed Description
The invention will now be described in further detail with reference to the accompanying drawings. The drawings are simplified schematic representations which merely illustrate the basic structure of the invention and therefore show only the structures which are relevant to the invention.
A single chip microcomputer testing device comprises a locking seat 1, a power module 2 and a testing circuit 3, wherein a wiring terminal is arranged on the locking seat 1, when the single chip microcomputer is placed on the locking seat 1, one pin of the single chip microcomputer is electrically connected with one wiring terminal, the power module 2 supplies power to the single chip microcomputer and the testing circuit 3 respectively, and the single chip microcomputer is electrically connected with the testing circuit 3 through wires.
Referring to fig. 1, in this embodiment, a power module 1 outputs two paths of dc voltages, the magnitudes of the two paths of dc voltages are 5V and 3V, respectively, the power module 1 supplies power to a singlechip and a test circuit through a switch K1, and the switch K1 is used for selecting one path of dc voltage to be input to the singlechip and the test circuit, wherein the switch K1 can select a boat switch. Referring to fig. 1, a power module 1 in this embodiment includes a dc power supply circuit and a USB power supply circuit, and circuit diagrams of the dc power supply circuit and the USB power supply circuit are shown in fig. 2 and 3, respectively, where the dc power supply circuit and the USB power supply circuit can both output a 5V dc voltage and a 3V dc voltage, and the power supply can be flexibly selected by the dc power supply circuit and the USB power supply circuit.
Referring to fig. 1, in this embodiment, the test circuit 3 includes one or more circuits of a common anode light emitting diode circuit, a common cathode light emitting diode circuit, an LCD1602 liquid crystal circuit, an LCD12864 liquid crystal circuit, a buzzer circuit, a stepper motor driving circuit, a matrix keyboard circuit, a low-level trigger key group circuit, a high-level trigger key group circuit, a 138 decoder circuit, an E2PROM circuit, an infrared receiving circuit, a 2.4G wireless transceiver circuit, an LED lattice circuit, a temperature sensor circuit, a common anode nixie tube circuit, a common cathode nixie tube circuit, a voltage detection circuit and a current detection circuit, wherein the buzzer circuit may employ a passive buzzer circuit, the voltage detection circuit may employ a voltmeter, the current detection circuit may employ a ammeter, the common anode nixie tube circuit and the common cathode nixie tube circuit may employ a 7-section 6-bit nixie tube, the LED lattice circuit may employ an 8 x 8LED lattice, and the singlechip is electrically connected with one or more circuits of the test circuit through wires.
In practical use, the test circuit 3 may include all the above circuits, and then a plurality of circuits may be selected from the above circuits according to the test requirement to test a performance of the singlechip, for example, when the driving performance of the singlechip is tested, the dupont wire may be used to enable the IO pin of the singlechip to be sequentially and electrically connected with the LED dot matrix circuit, the common anode nixie tube circuit and the common cathode nixie tube circuit, or when the iic communication protocol of the singlechip is tested to be normal, the dupont wire may be used to electrically connect the communication pin of the singlechip with the E2PROM circuit and the common anode light emitting diode, and when the singlechip is successfully communicated with the E2PROMiic, the common anode light emitting diode may be enabled to emit light to prompt.
In practical use, the test circuit 3 can also select a part of circuits from the circuits according to test requirements to complete one or more performance tests of the singlechip.
A single chip microcomputer testing method is applied to the single chip microcomputer testing device and comprises the following steps of S1, placing the single chip microcomputer on a locking seat, using a wire to electrically connect a testing pin of the single chip microcomputer with a testing circuit according to testing requirements, S2, writing a testing program into the single chip microcomputer, and S3, observing whether the testing circuit responds to the single chip microcomputer when the single chip microcomputer runs.
When the testing method is used for detecting the power supply voltage, the grounding end of the power supply module can be connected to the grounding end of the single chip microcomputer and the voltmeter respectively by using the DuPont wire, the positive electrode end of the power supply module is connected to the power supply end of the single chip microcomputer and the voltmeter respectively, and the power supply voltage of the power supply module is detected by using the voltmeter.
The testing method of the invention is characterized in that when the port characteristic voltage of the singlechip is tested and turned over, the negative electrode of the adjustable stabilized power supply is connected to the grounding end of the singlechip, the positive electrode of the adjustable stabilized power supply is connected to the power end of the singlechip, the ammeter is connected in series between the positive electrode of the adjustable stabilized power supply and the power end of the singlechip, the testing IO pin of the singlechip is connected to the common cathode light emitting diode circuit through the DuPont line, the left circuit in FIG. 9 is the common anode light emitting diode circuit, the right circuit is the common cathode light emitting diode circuit, after the singlechip is placed on the locking seat, a testing program is written into the singlechip, the testing IO pin of the singlechip outputs a high-level signal, then the output voltage of the adjustable stabilized power supply is sequentially adjusted to 5V from 0V, each time 0.1V is increased, the values of the voltmeter and the ammeter are recorded when the common cathode light emitting diode is lightened, the output voltage of the adjustable stabilized power supply is adjusted to 0V from 5V each time, when the common cathode light emitting diode is turned off, the common cathode light emitting diode circuit is recorded, the values of the voltmeter and the ammeter are turned over when the three ports of the singlechip are turned over again and the characteristic voltage of the singlechip is turned over from 100 mA, and the characteristic voltage of the singlechip is turned over from the three ports to 100 mA is turned over, and the LED is turned over normally.
When the driving performance of the singlechip is tested, the power module 1, the ammeter and the singlechip are sequentially connected in series by using the DuPont wire, the ports of the singlechip are sequentially connected with the LED dot matrix circuit, the common anode nixie tube circuit and the common cathode nixie tube circuit by using the DuPont wire, then a test program is input into the singlechip, the LEDs in the LED array circuit are sequentially lightened, the common anode nixie tube circuit and the common cathode nixie tube circuit are displayed from 000001 to 9999, when the singlechip runs the test program, whether the brightness of the LED lamps in the LED array circuit, the common anode nixie tube circuit and the nixie tubes in the common cathode nixie tube circuit is uniform or not is observed, and whether the value tested by the ammeter is in a normal test interval is observed.
According to the test method, when the sleep current of the singlechip is tested, the power supply module 1 is connected in series with the ammeter through the DuPont wire to supply power to the singlechip, the ammeter monitors the power supply voltage of the power supply module, the current of a conventional sleep mode is less than 1uA, the power consumption of a watchdog wake-up sleep mode is less than 6uA, the power consumption of an RTC (TCC) sleep wake-up mode is less than 25uA and is normal, and a conventional sleep program, a watchdog wake-up sleep program and an RTC (TCC) wake-up sleep program are respectively written into the singlechip to test the sleep current of the singlechip.
When the built-in pull-up of a port of the singlechip is tested, the power module 1 supplies power to the singlechip through the DuPont wire, the port of the singlechip is connected to a low-level trigger key group circuit through the DuPont wire, the voltmeter is connected to the GND port and the key port of the singlechip in parallel, a low-level trigger key configuration program is written into the singlechip, one bit of IO port is provided with input for pulling up, the other bit is output, and the like until the test of all pull-up IO ports of the chip is completed, the voltmeter is displayed as high level when the key is not pressed, the voltmeter is displayed as low level when the key is pressed, and the apparent current value of current serially connected to the ground through the pull-up port is that 2V is below 15uA, 3V is below 40uA, 4V is below 75uA, 5V is below 120uA, and 6V is below 170 uA.
When the built-in pull-down of the port of the singlechip is tested, the power supply module supplies power to the singlechip through the DuPont wire, the port of the singlechip is connected to the high-level trigger key group circuit through the DuPont wire, the voltmeter is connected to the VCC port and the key port of the singlechip in parallel, and the high-level trigger key configuration program is written into the singlechip, so that one bit of the IO port is provided with the input and the pull-down, and the other bit is output. And so on until all pull-down IO port tests for the chip are completed. The voltmeter is displayed at a low level when the key is not pressed, and is displayed at a high level when the key is pressed. The pull-down port has a current value of 8uA or less for the VCC series current, 20uA or less for 3V, 40uA or less for 4V, 60uA or less for 5V, and 85uA or less for 6V;
When the built-in E2PROM is tested, the power supply module is connected in series with the ammeter through the DuPont wire to supply power to the singlechip, the port of the singlechip is connected to the high-level trigger key group circuit and the common anode light emitting diode circuit through the DuPont wire, one IO port of the singlechip is set to be key input, 3 IO ports are output to the LEDs, after the key is pressed once, 1 LED lamp is lighted, the singlechip writes data to the E2PROM, after the key is pressed twice, two LEDs are lighted, the singlechip writes data to the E2PROM, after the key is pressed three times, the three LEDs are lighted, the singlechip writes data to the E2PROM, in the state of pressing the key for the second time, whether the state is kept in the state of pressing the key for the third time is detected after the power is turned off, and whether the value of the ammeter in the test is between 100uA and 2mA is observed.
When the invention tests the LCD section output resource of the singlechip, the power module is connected with the ammeter in series through the DuPont line and then supplies power to the singlechip, the LCD port of the singlechip is connected with the LCD1602 liquid crystal circuit and the LCD12864 liquid crystal circuit through the DuPont line in sequence, the io port is connected with the matrix keyboard circuit through the DuPont line, the matrix keyboard is 4*4 matrix keyboards, respectively corresponding to 0 to 9, +, -,/, =, and, =, a test program is input into the singlechip, the white screen is initialized, the LCD1602 liquid crystal screen and the LCD12864 liquid crystal screen are not displayed, then the matrix keyboard is scanned through a simple computer keyboard scanning program, random combination operation (for example, 1+1=2) corresponding to the pressing of the keys is displayed on the LCD liquid crystal screen, whether the display corresponding to the LCD liquid crystal screen is complete, whether the brightness is uniform or not and whether the display value of the ammeter is between normal intervals is observed, and whether the LCD section output resource of the singlechip is qualified or not is judged;
When a square wave pulse signal sent by a singlechip IO port time sequence is tested, a power supply module supplies power to the singlechip through a DuPont wire parallel voltmeter, the singlechip IO port is connected to a stepping motor driving module and a common cathode light-emitting diode circuit through the DuPont wire, the common anode light-emitting diode circuit comprises a green led lamp, a yellow led lamp and a red led lamp, the IO port is connected to a low-level trigger key through the DuPont wire, the singlechip is placed (the IO port connected with the key is set as input, the IO port connected with the motor driving module and the common cathode light-emitting diode circuit is set as output;
When the method is used for testing the square wave performance of the output frequency of the singlechip, the power supply module supplies power to the singlechip through the DuPont wire, the io port of the singlechip is connected to the buzzer circuit through the DuPont wire, the singlechip is placed (the io port of the singlechip outputs the square wave frequency to play a simple music program), and when no oscilloscope exists, whether the square wave performance of the output frequency of the singlechip is qualified or not is judged by whether the sound played by the buzzer is obviously abnormal or not;
When testing the built-in RC oscillator LDO reference anti-interference performance of the singlechip, the power supply module supplies power to the singlechip through the DuPont wire, the io port of the singlechip is connected to the infrared receiving circuit and the 138 decoder circuit through the DuPont wire, the singlechip (the remote controller controls the LED action in the 138 decoder circuit) is placed, and the remote controller observes whether the corresponding LED works normally after being pressed down;
When testing the ic communication protocol of the singlechip, the power supply module is connected in series with the ammeter through the DuPont wire to supply power to the singlechip, the singlechip port is connected to the E2PROM circuit, the high-level trigger key group circuit and the common anode light emitting diode circuit through the DuPont wire, the one-bit IO port of the singlechip is set to be key input, the three-bit IO port is set to be LED output, when the key is pressed once, 1 LED lamp is on, the singlechip writes data into the E2PROM, after the key is pressed twice, two LEDs are on, the singlechip writes data into the E2PROM, after the key is pressed three times, the three LEDs are on, the singlechip writes data into the E2PROM, when the key is pressed twice, whether the power-down re-electrifying detection is kept in the state of the second pressing, and when the key is pressed three times, the power-down re-electrifying detection is kept in the state of the third pressing, and whether the singlechip can normally carry out the ic communication is judged by observing whether the value of the ammeter is between normal intervals in the whole process;
The method comprises the steps that when serial port resources of a singlechip are tested, a power module supplies power to the singlechip through a DuPont wire parallel voltmeter, the serial port of the singlechip is connected to an external 2.4G wireless transceiver circuit through the DuPont wire, an io port of the singlechip is connected with a stepping motor driving circuit and a common cathode light-emitting diode circuit, the common cathode light-emitting diode circuit comprises a green led lamp, a yellow led lamp and a red led lamp, the singlechip is placed, forward rotation, stop, reverse rotation, acceleration and deceleration instructions of the motor are sent by the singlechip firstly through a remote controller, the green led lamp is on when the singlechip receives the forward rotation instructions of the motor, the yellow led lamp is on when the singlechip receives the stop instructions of the motor, and the red led lamp is on when the singlechip receives the reverse rotation instructions of the motor. After the remote controller is pressed down, whether serial port resources of the singlechip are qualified or not is judged by observing whether the light-emitting condition of the common cathode light-emitting diode circuit and the display value of the voltmeter fluctuate when the rotating speed of the motor is increased;
When the method is used for testing the adc resource of the singlechip, the power supply module supplies power to the singlechip through the DuPont line, the singlechip is connected to the LCD12864 liquid crystal circuit through the DuPont line, the ad channel of the singlechip is selected, the internal references 2V, 3V, 4V and VDD are selected, the channel input voltage is gradually increased from 5mV to 5000mV, each time the input voltage is increased by 5mV, and the high eight-bit and low four-bit hexadecimal values acquired by each step are displayed on the LCD12864 liquid crystal screen. Each ad acquisition channel is selected from the internal references of 2V, 3V, 4V and VDD, and each step is acquired for 4 times, and the like until each ad acquisition channel of the tested singlechip is tested. If the error range of the acquired value and the input value is one thousandth, the adc resource of the singlechip is qualified. In addition, in this embodiment, the test circuit 3 further includes a circuit diagram of a thermistor and a photoresistor as shown in fig. 8, and since resistance values of the thermistor Rz and the photoresistor Rg change with changes of temperature and light intensity, two paths of analog signals can be output to test the adc resource of the singlechip through the circuit shown in fig. 8.
Therefore, the invention can sequentially write a plurality of test programs into the singlechip to realize different performance tests of the singlechip, and when different test programs are written, only the DuPont wire is used for electrically connecting the test port corresponding to the singlechip with the related test circuit.
In summary, the test circuit of the invention is not electrically connected with the pins of the singlechip or the wiring terminals electrically connected with the pins of the singlechip in advance according to the fixed connection circuit, but is separately arranged with the singlechip, and when the test is actually performed, the DuPont wire can be used for electrically connecting the test pins of the singlechip with part of circuits in the test circuit for testing according to the test requirement, so that the flexibility is high, and the test circuit can be used for testing singlechips with different types and different digits.
The present invention has been made in view of the above-described circumstances, and it is an object of the present invention to provide a portable electronic device capable of performing various changes and modifications without departing from the scope of the technical spirit of the present invention. The technical scope of the present invention is not limited to the description, but must be determined according to the scope of claims.
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| CN210864693U (en) * | 2019-12-12 | 2020-06-26 | 深圳市晶哲电子科技有限公司 | Simulation board for debugging single chip microcomputer |
| CN214623408U (en) * | 2021-06-02 | 2021-11-05 | 无锡矽杰微电子有限公司 | Singlechip testing arrangement |
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| JP2920561B2 (en) * | 1990-09-25 | 1999-07-19 | 東京エレクトロン株式会社 | Test method for one-chip microcomputer |
| TWI416135B (en) * | 2010-11-26 | 2013-11-21 | Primax Electronics Ltd | Testing method and system for circuit board of keys |
| CN109118916A (en) * | 2018-11-01 | 2019-01-01 | 四川工商学院 | A kind of single chip computer experiment actual training device |
| CN209499719U (en) * | 2018-12-18 | 2019-10-18 | 浙江大学城市学院 | Novel electronic sphygmomanometer control circuit |
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| CN210864693U (en) * | 2019-12-12 | 2020-06-26 | 深圳市晶哲电子科技有限公司 | Simulation board for debugging single chip microcomputer |
| CN214623408U (en) * | 2021-06-02 | 2021-11-05 | 无锡矽杰微电子有限公司 | Singlechip testing arrangement |
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