CN113175884B - 一种光谱共焦测量系统的标定装置及标定方法 - Google Patents
一种光谱共焦测量系统的标定装置及标定方法 Download PDFInfo
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- CN113175884B CN113175884B CN202110453701.0A CN202110453701A CN113175884B CN 113175884 B CN113175884 B CN 113175884B CN 202110453701 A CN202110453701 A CN 202110453701A CN 113175884 B CN113175884 B CN 113175884B
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- 238000001228 spectrum Methods 0.000 title claims abstract description 46
- 238000005259 measurement Methods 0.000 title claims abstract description 38
- 238000000034 method Methods 0.000 title claims abstract description 16
- 230000003595 spectral effect Effects 0.000 claims abstract description 80
- 238000006073 displacement reaction Methods 0.000 claims abstract description 44
- 239000006185 dispersion Substances 0.000 claims abstract description 38
- 239000013307 optical fiber Substances 0.000 claims abstract description 38
- 238000010606 normalization Methods 0.000 claims abstract description 6
- 238000011088 calibration curve Methods 0.000 claims abstract description 4
- 239000000835 fiber Substances 0.000 claims description 11
- 230000008878 coupling Effects 0.000 claims description 8
- 238000010168 coupling process Methods 0.000 claims description 8
- 238000005859 coupling reaction Methods 0.000 claims description 8
- 230000003287 optical effect Effects 0.000 claims description 5
- 238000010586 diagram Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/042—Calibration or calibration artifacts
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- Physics & Mathematics (AREA)
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Families Citing this family (5)
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CN113740033B (zh) * | 2021-08-17 | 2023-05-02 | 中国科学院合肥物质科学研究院 | 一种光谱共焦测量系统中光学测头的光束方向校准方法 |
CN114018157A (zh) * | 2021-10-28 | 2022-02-08 | 上海兰宝传感科技股份有限公司 | 一种光谱共焦的面阵位移测量装置、测量方法及标定方法 |
CN114370820B (zh) * | 2022-03-22 | 2022-07-01 | 武汉精立电子技术有限公司 | 光谱共焦位移传感器的峰值提取方法、检测方法及系统 |
CN114754676B (zh) * | 2022-04-13 | 2025-04-18 | 武汉德立赛科技有限公司 | 线光谱共焦标定方法、装置、设备、系统及存储介质 |
CN115541016A (zh) * | 2022-09-15 | 2022-12-30 | 光子集成(温州)创新研究院 | 一种单色仪 |
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