CN113109602B - 一种电子通讯元件的移动式测试装置 - Google Patents
一种电子通讯元件的移动式测试装置 Download PDFInfo
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- CN113109602B CN113109602B CN202110447534.9A CN202110447534A CN113109602B CN 113109602 B CN113109602 B CN 113109602B CN 202110447534 A CN202110447534 A CN 202110447534A CN 113109602 B CN113109602 B CN 113109602B
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- 238000012360 testing method Methods 0.000 title claims abstract description 106
- 238000004891 communication Methods 0.000 title claims abstract description 30
- 230000007246 mechanism Effects 0.000 claims abstract description 66
- 238000009434 installation Methods 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 7
- 238000000034 method Methods 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 3
- 230000000670 limiting effect Effects 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 230000009471 action Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000003139 buffering effect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
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- 125000006850 spacer group Chemical group 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
- Tests Of Electronic Circuits (AREA)
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CN202110447534.9A CN113109602B (zh) | 2021-04-25 | 2021-04-25 | 一种电子通讯元件的移动式测试装置 |
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CN202110447534.9A CN113109602B (zh) | 2021-04-25 | 2021-04-25 | 一种电子通讯元件的移动式测试装置 |
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CN113109602A CN113109602A (zh) | 2021-07-13 |
CN113109602B true CN113109602B (zh) | 2022-11-18 |
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Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3996516A (en) * | 1973-08-23 | 1976-12-07 | Lm-Electronic Luther & Maelzer | Apparatus and process for testing printed circuits |
US5014000A (en) * | 1989-06-23 | 1991-05-07 | Schlagheck Jerry G | Vibratory screening fixture |
US6462533B1 (en) * | 1999-11-30 | 2002-10-08 | Nec Machinery Corporation | IC test system for testing BGA packages |
CN103162925A (zh) * | 2011-12-15 | 2013-06-19 | 海洋王照明科技股份有限公司 | 用于振动测试装置上的围框结构及振动测试装置 |
CN105352687A (zh) * | 2015-10-20 | 2016-02-24 | 格兰达技术(深圳)有限公司 | 一种仪器振动测试系统及其应用 |
CN205067040U (zh) * | 2015-10-20 | 2016-03-02 | 格兰达技术(深圳)有限公司 | 一种用于仪器振动测试的振动装置 |
CN206906534U (zh) * | 2017-04-14 | 2018-01-19 | 上海汪青自动化科技有限公司 | 动力电池模组pcb测试装置 |
JP2019211407A (ja) * | 2018-06-08 | 2019-12-12 | 日置電機株式会社 | 移動装置、基板検査装置および制御方法 |
CN111661624A (zh) * | 2019-03-07 | 2020-09-15 | 万润科技股份有限公司 | 载盘与使用载盘的搬送方法、装置及设备 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3694439B2 (ja) * | 1999-12-07 | 2005-09-14 | 日本電波工業株式会社 | 水晶振動子の周波数分類装置及び検出方法 |
JP4594167B2 (ja) * | 2005-05-31 | 2010-12-08 | ヤマハ発動機株式会社 | Icハンドラー |
CN205102997U (zh) * | 2015-11-04 | 2016-03-23 | 中航锂电(洛阳)有限公司 | 一种振动测试夹具及采用该振动测试夹具的振动测试装置 |
CN210270072U (zh) * | 2019-06-11 | 2020-04-07 | 苏州杰锐思智能科技股份有限公司 | 一种pcb产品导通测试用装置 |
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2021
- 2021-04-25 CN CN202110447534.9A patent/CN113109602B/zh active Active
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3996516A (en) * | 1973-08-23 | 1976-12-07 | Lm-Electronic Luther & Maelzer | Apparatus and process for testing printed circuits |
US5014000A (en) * | 1989-06-23 | 1991-05-07 | Schlagheck Jerry G | Vibratory screening fixture |
US6462533B1 (en) * | 1999-11-30 | 2002-10-08 | Nec Machinery Corporation | IC test system for testing BGA packages |
CN103162925A (zh) * | 2011-12-15 | 2013-06-19 | 海洋王照明科技股份有限公司 | 用于振动测试装置上的围框结构及振动测试装置 |
CN105352687A (zh) * | 2015-10-20 | 2016-02-24 | 格兰达技术(深圳)有限公司 | 一种仪器振动测试系统及其应用 |
CN205067040U (zh) * | 2015-10-20 | 2016-03-02 | 格兰达技术(深圳)有限公司 | 一种用于仪器振动测试的振动装置 |
CN206906534U (zh) * | 2017-04-14 | 2018-01-19 | 上海汪青自动化科技有限公司 | 动力电池模组pcb测试装置 |
JP2019211407A (ja) * | 2018-06-08 | 2019-12-12 | 日置電機株式会社 | 移動装置、基板検査装置および制御方法 |
CN111661624A (zh) * | 2019-03-07 | 2020-09-15 | 万润科技股份有限公司 | 载盘与使用载盘的搬送方法、装置及设备 |
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CN113109602A (zh) | 2021-07-13 |
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Effective date of registration: 20240109 Address after: 230000 floor 1, building 2, phase I, e-commerce Park, Jinggang Road, Shushan Economic Development Zone, Hefei City, Anhui Province Patentee after: Dragon totem Technology (Hefei) Co.,Ltd. Address before: No. 528, binwen Road, Binjiang District, Hangzhou City, Zhejiang Province 310051 Patentee before: ZHEJIANG INSTITUTE OF MECHANICAL & ELECTRICAL ENGINEERING |
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