CN113030704A - Mainboard test equipment, method and system and readable storage medium - Google Patents
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- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
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Abstract
The invention discloses a mainboard test device, which can automatically read the measured values of two extreme values of each point in a test board and a standard board, automatically compare the point positions by comparing difference errors through a processor, and avoid the leakage of judgment of personnel by automatically judging the difference values through the processor, thereby starting to identify bad point positions from a plurality of tested point positions and carrying out abnormal prompt of the point positions. The invention also discloses a mainboard testing method, a mainboard testing system and a readable storage medium, and the mainboard testing system and the readable storage medium have corresponding technical effects.
Description
Technical Field
The present invention relates to the field of test technologies, and in particular, to a motherboard test apparatus, a motherboard test method, a motherboard test system, and a readable storage medium.
Background
In the process of analyzing and maintaining the defects of the server mainboard, two extreme values of hundreds of thousands of points on a BGA (ball grid array package) bonding pad are often measured to find out the defective points. Two extreme values, the diode value in the whole course, also called as the resistance value to ground, or the ground measurement value, are commonly used voltage drop measurement methods to measure the voltage drop from the ground point to the test point. The implementation of the two extreme values is simple, the multimeter can be switched on to the diode, then the red meter pen is grounded, and the black meter pen is connected to the position to be measured. And then the reading on the multimeter is read.
The common method for finding out the bad point according to the measured two-pole values of hundreds of thousands of points on the BGA bonding pad is to use two universal meters to find out a good product, connect the good product and the bad product together to make the good product and the bad product share the same ground, adjust the two universal meters to two-pole value gears, measure the same points on the two mainboards, observe the two-pole values of the two universal meters, judge the difference of the two values by a measurer, and thus judge and find out the bad point.
The method needs a measurer to continuously measure by lowering head and observe two extreme values by raising head and compare the difference of the numerical values of the multimeters, thereby being time-consuming, labor-consuming and extremely low in realization efficiency; and a measurer is easy to enter a fatigue state when measuring a large number of point locations of the mainboard one by one, and easily misses a bad point location, thereby influencing the analysis accuracy rate.
In summary, how to improve the efficiency and accuracy of test analysis is a technical problem that those skilled in the art are in urgent need to solve.
Disclosure of Invention
The invention aims to provide mainboard testing equipment, a mainboard testing method, a mainboard testing system and a readable storage medium, which can improve testing and analyzing efficiency, so that a user is assisted to find out bad point positions more accurately and conveniently.
In order to solve the technical problems, the invention provides the following technical scheme:
a motherboard testing apparatus comprising:
the data collector is used for acquiring the dipolar values of the test points in the test board collected by the dipolar value collection equipment as test values, and the dipolar values of the test points in the standard board corresponding to the test board as standard values; sending the test value and the standard value to a processor;
the processor is used for calculating the difference value between the test value and the standard value; judging whether the difference value belongs to a preset error range or not; if not, controlling a prompter to prompt the abnormity of the test point;
and the prompter is used for prompting the abnormity of the test point according to the instruction of the processor.
Optionally, the processor is a single chip microcomputer.
Optionally, the prompter is a buzzer.
Optionally, the motherboard testing device further includes: an LED display connected with the processor;
the LED display is used for outputting the difference value and/or the test value and the standard value.
A mainboard test method comprises the following steps:
acquiring dipolar values of test points in a test board acquired by two extreme value acquisition devices as test values, and acquiring dipolar values of the test points in a standard board corresponding to the test board as standard values;
calculating the difference between the test value and the standard value;
judging whether the difference value belongs to a preset error range or not;
and if not, carrying out abnormity prompt on the test point.
Optionally, the obtaining, as the test value, the two-pole value of the test point in the test board collected by the two extreme value collecting devices, and as the standard value, the two-pole value of the test point in the standard board corresponding to the test board include:
acquiring a dipolar value reading after a preset interval after the first dipolar value reading of a test point in a test board by two extremum acquisition equipment as a test value;
and acquiring a dipolar value reading after a preset interval after the initial dipolar value reading of the test point in the standard board corresponding to the test board by the dipolar value acquisition equipment, and taking the dipolar value reading as a standard value.
A motherboard testing system, comprising: the mainboard test equipment, the test board, the standard board and the dipolar value acquisition equipment are arranged on the mainboard;
the two-pole value acquisition equipment is connected with a data collector in the mainboard test equipment and is used for acquiring the two-pole values of the test points in the test board and the two-pole values of the test points in the standard board corresponding to the test board;
the mainboard test equipment is used for acquiring the dipolar values of the test points in the test board acquired by the dipolar value acquisition equipment as test values, and acquiring the dipolar values of the test points in the standard board corresponding to the test board as standard values; calculating the difference between the test value and the standard value; judging whether the difference value belongs to a preset error range or not; and if not, carrying out abnormity prompt on the test point.
Optionally, the dipolar value acquisition device includes: the first diode and second diode acquisition equipment;
the first two extreme value acquisition equipment is used for acquiring two extreme values of a test point in the test board;
the second dipolar value acquisition equipment is used for acquiring dipolar values of the test points in the standard board corresponding to the test board;
the data collector is connected to the first diode and second diode collecting device, respectively, and is configured to obtain the diode value collected by the first diode and second diode collecting device as a test value, and obtain the diode value collected by the second diode collecting device as a standard value.
Optionally, the dipolar value acquiring device is: a multimeter.
A readable storage medium having stored thereon a computer program which, when executed by a processor, implements the steps of the motherboard testing method.
According to the mainboard test equipment provided by the embodiment of the invention, the measured values of two extreme values of each point in the test board and the standard board are automatically read, the difference error is compared by the processor, the excellent comparison of the point positions is automatically carried out, the loss of judgment of personnel can be avoided by the way that the processor automatically judges the difference value, so that the bad point positions can be identified from a plurality of point positions to be tested and the abnormal prompt of the point positions can be carried out, thus, the tester only needs to carry out concentration measurement, and does not need to raise the head to observe maintenance data, thereby reducing the measurement fatigue of the maintainer, improving the efficiency of test analysis, avoiding the loss of any bad point position, and further improving the efficiency and the accuracy of mainboard analysis and maintenance.
Accordingly, embodiments of the present invention further provide a method, a system and a readable storage medium corresponding to the above motherboard testing device, which have the above technical effects and are not described herein again.
Drawings
In order to more clearly illustrate the embodiments of the present invention or technical solutions in related arts, the drawings used in the description of the embodiments or related arts will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
Fig. 1 is a schematic structural diagram of a motherboard testing apparatus according to an embodiment of the present invention;
fig. 2 is a schematic diagram illustrating a specific structural connection of a motherboard testing apparatus according to an embodiment of the present invention;
FIG. 3 is a flowchart illustrating a method for testing a motherboard according to an embodiment of the present invention;
FIG. 4 is a schematic structural diagram of a motherboard testing system according to an embodiment of the present invention;
fig. 5 is a schematic structural diagram of a system corresponding to two binary value acquisition devices according to an embodiment of the present invention.
Detailed Description
The core of the invention is to provide a mainboard test device which can improve the test analysis efficiency, thereby assisting a user to find a bad point position more accurately and conveniently.
In order that those skilled in the art will better understand the disclosure, the invention will be described in further detail with reference to the accompanying drawings and specific embodiments. It is to be understood that the described embodiments are merely exemplary of the invention, and not restrictive of the full scope of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1, fig. 1 is a schematic structural diagram of a motherboard testing apparatus according to an embodiment of the present invention, the apparatus mainly includes: a data collector 101, a processor 102 connected to the data collector 101, and a prompter 103 connected to the processor 102.
The data collector 101 is connected to the two-extreme value collecting device, the two-extreme value collecting device is connected to the testing board and the standard board, and the user operates the two-extreme value collecting device to collect the two-extreme values of the testing board and each point in the standard board corresponding to the testing board.
The data collector 101 is connected to the two extreme value collecting device, and is used for obtaining the two extreme values of the test points in the test board collected by the two extreme value collecting device as the test values, and the two extreme values of the test points in the standard board corresponding to the test board as the standard values; the test board is a mainboard for detecting bad point positions, the standard board is a circuit board which has the same circuit structure as the test board and has no bad point positions with the test board, the data acquisition device respectively acquires dipolar values acquired by dipolar value acquisition equipment from the same point positions in the test board and the standard board, the dipolar values of the test board acquired by the dipolar value acquisition equipment are used as test values, and the dipolar values of corresponding point positions in the standard board are used as standard values.
And after the data acquisition unit acquires the test value and the standard value, the test value and the standard value are sent to the processor, so that the processor can perform subsequent test processing according to the two values. In order to ensure the accuracy of the second-level value, 0.5s of delay time can be set, and the second-level value 0.5s after the first reading is taken as a test value and a standard value.
It should be noted that, in this embodiment, a data acquisition mode of the data acquisition unit is not limited, and the data acquisition unit may import the test value and the standard value from the interface of the two-level value acquisition device through interface protocols such as RS232, RS485, and USB, or directly read the two-level value from the LED display interface of the multimeter. In addition, the specific equipment type of the data collector for connecting and acquiring the acquisition values of the two extreme value acquisition equipment is not limited, the existing equipment with the function can be directly selected, and the existing parts or equipment capable of realizing the functions can be directly assembled into the mainboard test equipment; the circuit board or the device with the above functions may also be designed autonomously, and the specific device type of the data collector is not limited in this embodiment, and the selection of the relevant device may be referred to, and is not limited herein.
The processor 102 is connected with the data collector 101, and the processor 102 receives the test value and the standard value sent by the data collector 101 and is mainly used for calculating a difference value between the test value and the standard value; judging whether the difference value belongs to a preset error range or not; if not, controlling a prompter to prompt the abnormity of the test point; the error range may be a data interval, for example, [0,5], indicating that the difference is between 0 and 5 (including 0 and 5), or may be a specific numerical value, for example, 5, if the difference is less than or equal to 5, it indicates that the point location is normal, if the difference is greater than 5, it indicates that the point location is abnormal, or calculating the difference between the difference and the error range (5), if the difference is greater than 0, it indicates that the point location is abnormal, and if the difference is less than or equal to 0, it indicates that the point location is a positive stubble. In this embodiment, the specific setting form of the error range is not limited, and the processor needs to configure corresponding processing logic for different setting forms, and since the setting form of the error range is not limited, the processing logic for determining whether the difference value belongs to the preset error range in the processor is not limited in this embodiment, and only the magnitude comparison logic is taken as an example for description, and the following description may be referred to for other processing logics, which is not described herein again.
The processing logic implemented by the processor mainly includes difference calculation (calculating the difference between the test value and the standard value) and magnitude comparison (comparing whether the difference belongs to a preset error range), and the processing logic is simple, so that the selection and use of specific equipment types of the processor are less limited, and in order to reduce the equipment cost, the processor 102 can specifically select a single chip microcomputer or other devices, and certainly, the selection and use of specific devices of the processor in this embodiment are not limited, and the determination of the devices can be performed according to actual use requirements. The device having the processing logic (difference calculation and size comparison) may be directly selected, or a corresponding processing logic may be configured in the selected device, which is not limited in this embodiment.
If the difference is judged not to belong to the preset error range by the processing logic of the processor, the processor triggers the prompter 103, and the prompter 103 performs test point abnormity prompting according to the instruction of the processor.
In this embodiment, the specific device type of the reminder 103 is not limited, and the reminder has a reminding function, for example, an indicator light, a buzzer, a vibrator, an alarm, or the like may be used. Wherein, for convenience of customers need not the new line inspection just can in time obtain the test result, the prompting device can select for use the device that has sound or vibrations, for example bee calling organ, if the treater judges that the difference does not belong to and predetermines error range, the treater triggers bee calling organ and starts, the user hears alright know in real time that current test point is unusual after the sound of bee calling organ.
Further, in an embodiment of the present application, the motherboard testing apparatus may further include: the LED display is connected with the processor;
the LED display obtains the difference value and/or the test value and the standard value from the processor for outputting the difference value and/or the test value and the standard value, in this embodiment, the type of data displayed in the display is not limited, and corresponding data can be imported from the processor according to the data reading requirement of the actual user.
In addition, the main board test equipment may further include: and the key panel is used for receiving the error range set by the user, is connected with the processor and transmits the error range set by the user to the processor after acquiring the error range. In order to facilitate the operation of the user, the key panel may include numeric keys 0 to 9, a confirmation key, a clear key, a function key (reserved key), and the like, and the corresponding key setting may be specifically performed according to the actual use requirement. As shown in fig. 2, a specific structural connection diagram of the motherboard testing device is shown (the processor is a single chip, the prompter is a buzzer, and further includes an LED display and a key panel), and then further, the LED display may be further connected to the key panel for obtaining and displaying an error value set by a user and received through the key panel, or connected to the processor for obtaining and displaying an error value received by the processor, which is not limited in this embodiment.
It should be noted that, in this embodiment, the processing logic of the processor when the difference value belongs to the preset error range is not limited, and the exception prompt of the prompt may not be triggered, for example: when the calculated difference value is within the set error range, the buzzer does not sound, the test value is normal, and when the calculated difference value exceeds the set error range, the buzzer sounds to prompt a tester that the test point is abnormal; or the control prompter performs non-abnormal prompt different from the abnormal prompt, for example, if the abnormal prompt is LED flashing red light, the non-abnormal prompt may be LED turning on green light, and the like, and the configuration of the corresponding processing logic may be performed according to the actual test requirement, which is not described herein.
Based on the introduction, mainboard test equipment that this embodiment provided, through the measured value of two extreme values of automatic reading test panel and each point position in the standard board, and carry out the good comparison of difference error's the automatic point position that carries on through the treater, the way of distinguishing the difference value automatically through the treater can avoid the loss of personnel's judgement, thereby can start the unusual suggestion of discerning bad point position and carrying out the point position from a plurality of point positions of test, the tester only needs to concentrate on measuring like this, need not to raise one's head and survey maintenance data, thereby reduce maintenance personal's measurement fatigue, promote test analysis efficiency, any bad point position of loss-free, thereby improve mainboard analysis maintenance efficiency and precision.
Referring to fig. 3, fig. 3 is a flowchart of a motherboard testing method according to an embodiment of the present invention, the method including the following steps:
s101, acquiring a dipolar value of a test point in a test board acquired by dipolar value acquisition equipment as a test value, and acquiring a second extreme value of the test point in a standard board corresponding to the test board as a standard value;
the acquisition of the two-pole value acquisition equipment can be immediately performed after the acquisition of the test board and the standard board detects the reading, in order to avoid the acquisition error of the two-pole value acquisition equipment, the two-pole value of the test point in the test board acquired by the two-pole value acquisition equipment is acquired as the test value, and the two extreme values of the test point in the standard board corresponding to the test board are acquired, and the process of the standard value can be specifically performed according to the following steps:
(1) acquiring a dipolar value reading after a preset interval after the first dipolar value reading of a test point in a test board by two extremum acquisition equipment as a test value;
(2) and acquiring the dipolar value reading after the first dipolar value reading of the test point in the standard board corresponding to the test board by the two extremum acquisition devices and presetting an interval, wherein the dipolar value reading is used as the standard value.
For example, if the preset interval is 0.5s, the delay time of 0.5s is set, and the secondary value 0.5s after the first reading is obtained as the test value and the standard value.
S102, calculating a difference value between the test value and the standard value;
s103, judging whether the difference value belongs to a preset error range; if not, triggering S104;
the preset error range can be set autonomously by a tester according to maintenance experience, and can also be determined automatically according to big data analysis, and the setting mode of the error range is not limited in the embodiment.
If the difference value belongs to the preset error range, it indicates that the point location of the currently tested test board is normal, and if the difference value does not belong to the preset error range, it indicates that the point location of the currently tested test board is abnormal, S104 is triggered.
If the difference does not fall within the preset error range, the method is not limited in this embodiment, no operation may be performed, and the test point may also be normally prompted.
And S104, prompting the abnormality of the test point.
The prompt mode of the abnormal prompt in the embodiment is not limited, and the abnormal prompt can be prompted by light, can be prompted by buzzing and the like, and can be set according to actual use requirements.
It should be noted that the motherboard testing method described in this embodiment may refer to the content of the motherboard testing device described in the foregoing embodiment, and the specific implementation is not described herein again.
Referring to fig. 4, fig. 4 is a schematic structural diagram of a motherboard testing system according to an embodiment of the present invention, the system mainly includes: the system comprises a mainboard test device, a test board, a standard board and a dipolar value acquisition device;
the mainboard test equipment is connected with the dipolar value acquisition equipment, and the dipolar value acquisition equipment is connected with the test board and the standard board.
The two-pole value acquisition equipment is connected with a data collector in the mainboard test equipment and is used for acquiring the two-pole value of the test point in the test board and the two extreme values of the test point in the standard board corresponding to the test board;
the mainboard test equipment is used for acquiring the dipolar values of the test points in the test board acquired by the dipolar value acquisition equipment as test values, and taking the two extreme values of the test points in the standard board corresponding to the test board as standard values; calculating the difference between the test value and the standard value; judging whether the difference value belongs to a preset error range or not; and if not, carrying out abnormity prompt on the test point.
The structure and the working process of the motherboard testing device can refer to the description of the above embodiments, and are not described herein again.
In this embodiment, as to the device type and the number of the two-pole value acquisition devices (one device may be used, or a plurality of devices may be used without limitation).
In one embodiment, two diode value acquiring devices may be provided, specifically including: a first extreme value collecting device and a second extreme value collecting device, as shown in fig. 5, are a schematic system structure diagram corresponding to the two extreme value collecting devices (the two extreme value collecting devices are a universal meter 1 and a universal meter 2, and the motherboard testing device is in the structure shown in fig. 2);
the first two extreme value acquisition equipment is mainly used for acquiring the two extreme values of the test points in the test board;
the second extreme value acquisition equipment is mainly used for acquiring two extreme values of the test points in the standard board corresponding to the test board;
the data collector is connected to the first diode and second diode collecting device respectively, and is configured to obtain the diode value collected by the first diode and second diode collecting device as a test value, and obtain the diode value collected by the second diode collecting device as a standard value.
Through setting up two extreme value collection equipment and gathering test panel and standard board respectively, can reduce the position comparison to a large amount of position locations in the mainboard to confirm at the same position location in test panel and the standard board, reduce the comparison process of position location, simplified test personnel's work, test personnel only need according to the same initial position location and order one by one in a pair of two boards each point location measure can, the corresponding society can work efficiency that can be improved, reduce the condition that the same position location determination error appears in two boards.
The present embodiment discloses a readable storage medium, on which a program is stored, and the program, when executed by a processor, implements the steps of the motherboard testing method described in the above embodiments, which can be referred to in the description of the motherboard testing method in the above embodiments.
The readable storage medium may be a usb disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and various other readable storage media capable of storing program codes.
Those of skill would further appreciate that the various illustrative components and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, computer software, or combinations of both, and that the various illustrative components and steps have been described above generally in terms of their functionality in order to clearly illustrate this interchangeability of hardware and software. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the implementation. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present invention.
Claims (10)
1. A motherboard testing apparatus, comprising:
the data collector is used for acquiring the dipolar values of the test points in the test board collected by the dipolar value collection equipment as test values, and the dipolar values of the test points in the standard board corresponding to the test board as standard values; sending the test value and the standard value to a processor;
the processor is used for calculating the difference value between the test value and the standard value; judging whether the difference value belongs to a preset error range or not; if not, controlling a prompter to prompt the abnormity of the test point;
and the prompter is used for prompting the abnormity of the test point according to the instruction of the processor.
2. The motherboard testing device of claim 1, wherein the processor is a single-chip microcomputer.
3. Mainboard testing device of claim 1, wherein the prompter is a buzzer.
4. The motherboard testing apparatus as recited in claim 1, further comprising: an LED display connected with the processor;
the LED display is used for outputting the difference value and/or the test value and the standard value.
5. A mainboard test method is characterized by comprising the following steps:
acquiring dipolar values of test points in a test board acquired by two extreme value acquisition devices as test values, and acquiring dipolar values of the test points in a standard board corresponding to the test board as standard values;
calculating the difference between the test value and the standard value;
judging whether the difference value belongs to a preset error range or not;
and if not, carrying out abnormity prompt on the test point.
6. The method for testing a motherboard according to claim 5, wherein the obtaining of the two extreme value collecting devices collects the two extreme value values of the test points in the test board as the test values, and the two extreme value values of the test points in the standard board corresponding to the test board as the standard values comprises:
acquiring a dipolar value reading after a preset interval after the first dipolar value reading of a test point in a test board by two extremum acquisition equipment as a test value;
and acquiring a dipolar value reading after a preset interval after the initial dipolar value reading of the test point in the standard board corresponding to the test board by the dipolar value acquisition equipment, and taking the dipolar value reading as a standard value.
7. A motherboard testing system, comprising: the motherboard testing device as claimed in any one of claims 1 to 4, and a test board, a standard board, a binary value acquisition device;
the two-pole value acquisition equipment is connected with a data collector in the mainboard test equipment and is used for acquiring the two-pole values of the test points in the test board and the two-pole values of the test points in the standard board corresponding to the test board;
the mainboard test equipment is used for acquiring the dipolar values of the test points in the test board acquired by the dipolar value acquisition equipment as test values, and acquiring the dipolar values of the test points in the standard board corresponding to the test board as standard values; calculating the difference between the test value and the standard value; judging whether the difference value belongs to a preset error range or not; and if not, carrying out abnormity prompt on the test point.
8. The motherboard testing system of claim 7, wherein the two extremum capturing devices comprise: the first diode and second diode acquisition equipment;
the first binary extreme value acquisition equipment is used for acquiring the binary values of the test points in the test board;
the second dipolar value acquisition equipment is used for acquiring dipolar values of the test points in the standard board corresponding to the test board;
the data collector is connected to the first diode and second diode collecting device, respectively, and is configured to obtain the diode collected by the first diode and second diode collecting device as the test value, and obtain the diode collected by the second diode collecting device as the standard value.
9. The motherboard testing system of claim 7, wherein the two extremum capturing devices are: a multimeter.
10. A readable storage medium, having stored thereon a computer program for implementing the steps of the motherboard testing method as claimed in claim 5 or 6 when being executed by a processor.
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