CN112932453A

CN112932453A - Scanning protocol detection method, device, computer equipment and storage medium

Info

Publication number: CN112932453A
Application number: CN202110118418.2A
Authority: CN
Inventors: 贾二维; 王春雨
Original assignee: Shanghai United Imaging Healthcare Co Ltd
Current assignee: Shanghai United Imaging Healthcare Co Ltd
Priority date: 2021-01-28
Filing date: 2021-01-28
Publication date: 2021-06-11

Abstract

The application relates to a scanning protocol detection method, a scanning protocol detection device, computer equipment and a storage medium. The method comprises the following steps: acquiring input scanning parameters and initial inspection conditions; the scanning parameters and the initial checking conditions are related to a scanning protocol; matching the scanning parameters in a preset inspection list to obtain target standard inspection conditions matched with the scanning parameters; the preset inspection list comprises a corresponding relation between a scanning parameter and a standard inspection condition; and detecting the initial inspection condition according to the target standard inspection condition to obtain a corresponding detection result. By adopting the method, the scanning time can be saved.

Description

Scanning protocol detection method, device, computer equipment and storage medium

Technical Field

The present application relates to the field of computer technologies, and in particular, to a scan protocol detection method, an apparatus, a computer device, and a storage medium.

Background

With the continuous development of magnetic resonance technology and application, the number and the kind of magnetic resonance clinical protocols are increasing, which makes the parameter setting in the scanning protocol and the parameter setting between the scanning protocols complicated when the magnetic resonance apparatus is used to scan a patient.

In the related art, when scanning a patient, a doctor generally sets parameters within a scanning protocol and between scanning protocols according to experience, and scans the patient. After obtaining the scanning result, if the scanning result does not meet the requirement, for example, the quality of the scanning image is too low, the doctor resets the parameters in and between the scanning protocols according to the scanning result, and performs scanning on the patient again until the scanning result meets the requirement.

However, there is a problem in that it takes time to scan a patient using the above-described technique.

Disclosure of Invention

In view of the above, there is a need to provide a scan protocol detecting method, apparatus, computer device and storage medium capable of saving scan time during scanning of a patient.

A scan protocol detection method, the method comprising:

acquiring input scanning parameters and initial inspection conditions; the scanning parameters and the initial examination conditions are related to a scanning protocol;

matching the scanning parameters in a preset inspection list to obtain target standard inspection conditions matched with the scanning parameters; the preset checking list comprises a corresponding relation between the scanning parameters and standard checking conditions;

and detecting the initial inspection condition according to the target standard inspection condition to obtain a corresponding detection result.

In one embodiment, the detecting the initial inspection condition according to the target standard inspection condition to obtain a corresponding detection result includes:

judging whether the initial checking condition is the same as the target standard checking condition or not to obtain a judgment result;

and detecting the initial inspection condition according to the judgment result to obtain a corresponding detection result.

In one embodiment, the detecting the initial inspection condition according to the determination result to obtain a corresponding detection result includes:

if the initial checking condition is different from the target standard checking condition, outputting a first warning message; the first warning message is used for indicating the initial checking condition setting error.

if the initial checking condition is different from the target standard checking condition, outputting a second warning message; the second warning message is used for indicating the modification of the initial checking condition and the content of the modification of the initial checking condition.

In one embodiment, the method further includes:

and scanning the object to be detected according to the detection result.

In one embodiment, the scanning the object to be detected according to the detection result includes:

modifying the initial checking condition and determining the modified checking condition;

and scanning the object to be detected by adopting the scanning parameters and the modified inspection conditions.

and if the initial checking condition is the same as the target standard checking condition, determining that the initial checking condition is set correctly.

In one embodiment, the scan parameters include scan parameters within a scan protocol and/or scan parameters between scan protocols.

In one embodiment, the preset check list is established in a manner that:

acquiring a plurality of scanning parameters and a plurality of standard inspection conditions;

and establishing a corresponding relation between each scanning parameter and the standard inspection condition to obtain the inspection list.

A scan protocol detection apparatus, the apparatus comprising:

the acquisition module is used for acquiring the input scanning parameters and the initial inspection conditions; the scanning parameters and the initial examination conditions are related to a scanning protocol;

the matching module is used for matching the scanning parameters in a preset checking list to obtain target standard checking conditions matched with the scanning parameters; the preset checking list comprises a corresponding relation between the scanning parameters and standard checking conditions;

and the detection module is used for detecting the initial detection condition according to the target standard detection condition to obtain a corresponding detection result.

A computer device comprising a memory and a processor, the memory storing a computer program, the processor implementing the following steps when executing the computer program:

A computer-readable storage medium, on which a computer program is stored which, when executed by a processor, carries out the steps of:

According to the scanning protocol detection method, the scanning protocol detection device, the computer equipment and the storage medium, the scanning parameters and the initial inspection conditions related to the scanning protocol are acquired, the scanning parameters are matched in a preset inspection list, the matched target standard inspection conditions are acquired, the initial inspection conditions are detected according to the target standard inspection conditions, and the corresponding detection results are acquired; the preset inspection list comprises the corresponding relation between the scanning parameters and the standard inspection conditions. In the method, the matched target standard inspection condition can be obtained through the input scanning parameters, and the input initial inspection condition is detected through the target standard inspection condition, so that the more accurate inspection condition can be quickly obtained. The patient can be directly scanned through the detection result of the examination condition, so that the scanning parameters and the examination condition do not need to be repeatedly set in the scanning process, and the scanning time of the patient can be saved.

Drawings

FIG. 1 is a diagram illustrating an internal structure of a computer device according to an embodiment;

FIG. 2 is a flow diagram illustrating a scan protocol detection method in accordance with one embodiment;

FIG. 3 is a flowchart illustrating the scanning protocol detection step in another embodiment;

fig. 4 is a block diagram of a scan protocol detection apparatus according to an embodiment.

Detailed Description

In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.

The scan protocol detection method provided by the embodiment of the application can be applied to a magnetic resonance system, the magnetic resonance system comprises a magnetic resonance device and a computer device which are connected, wherein the computer device can control the magnetic resonance device to scan a patient, and data obtained by scanning is transmitted to the computer device for data processing.

The aforementioned computer device may be a terminal or a server, and taking the terminal as an example, an internal structure diagram of the computer device may be as shown in fig. 1. The computer device includes a processor, a memory, a communication interface, a display screen, and an input device connected by a system bus. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device comprises a nonvolatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of an operating system and computer programs in the non-volatile storage medium. The communication interface of the computer device is used for carrying out wired or wireless communication with an external terminal, and the wireless communication can be realized through WIFI, an operator network, NFC (near field communication) or other technologies. The computer program is executed by a processor to implement a scan protocol detection method. The display screen of the computer equipment can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer equipment can be a touch layer covered on the display screen, a key, a track ball or a touch pad arranged on the shell of the computer equipment, an external keyboard, a touch pad or a mouse and the like.

Those skilled in the art will appreciate that the architecture shown in fig. 1 is merely a block diagram of some of the structures associated with the disclosed aspects and is not intended to limit the computing devices to which the disclosed aspects apply, as particular computing devices may include more or less components than those shown, or may combine certain components, or have a different arrangement of components.

The execution subject of the embodiment of the present application may be a computer device, a magnetic resonance system, or a scan protocol detection apparatus, and the technical solution of the present application will be described below with reference to the computer device as the execution subject.

In one embodiment, a scan protocol detection method is provided, and the embodiment relates to a specific process of how to obtain a standard inspection condition through an input inspection condition and an initial inspection condition, and detect the initial inspection condition through the standard inspection condition. As shown in fig. 2, the method may include the steps of:

s202, acquiring input scanning parameters and initial inspection conditions; the scan parameters and the initial examination conditions are associated with a scan protocol.

Wherein the initial inspection condition is an inspection condition set for the scan parameter. The scan parameters may include, for example, the position of the patient's bed, the position of the image, the coils, etc. during the patient scan. Taking the scanning parameters including the bed position and the image position as an example, the initial examination condition may be an examination condition set for the bed position and the image position, for example, the bed position is set to 0, the image position is also set to 0, and the like.

In addition, optionally, the scan parameters include scan parameters within a scan protocol and/or scan parameters between scan protocols. The scan parameters in the scan protocol refer to scan parameters in the same scan protocol, and the scan parameters between the scan protocols refer to scan parameters between different scan protocols. Secondly, the scanning protocol herein may include all protocols related to scanning, and may be one or more scanning protocols.

Specifically, before scanning the object to be tested, the doctor or the technician may select a scanning protocol in advance on the computer device, and input scanning parameters and initial examination conditions related to the scanning protocol, so that the computer device can obtain the input scanning parameters and initial examination conditions. Here, the manner of inputting the scan parameters and the initial examination conditions may be voice input, click option input, or the like.

S204, matching the scanning parameters in a preset inspection list to obtain target standard inspection conditions matched with the scanning parameters; the preset inspection list includes a corresponding relationship between the scanning parameters and the standard inspection conditions.

In this step, a preset check list may be established in advance before the scan parameters are matched. Optionally, the preset check list establishing manner may include: acquiring a plurality of scanning parameters and a plurality of standard inspection conditions; and establishing a corresponding relation between each scanning parameter and the standard inspection condition to obtain the inspection list. That is, a plurality of scan parameters and a plurality of standard inspection conditions may be obtained in advance, where the scan parameters may include scan parameters in a scan protocol and scan parameters between scan protocols, and each scan parameter and each standard inspection condition are correspondingly bound together to obtain a corresponding relationship between each scan parameter and each standard inspection condition, that is, to obtain an inspection list. It should be noted that, when the examination list is created, the scan parameters and the standard examination conditions in the examination list may cover substantially all scan parameters and examination conditions required in the scanning process.

In addition, the scan parameters herein may include not only scan parameters within the scan protocol and scan parameters between scan protocols, but also scan parameters related to workflow, scan parameters related to device License (License) or scan License (License), and other related scan parameters, etc. Accordingly, the standard inspection conditions may include not only standard inspection conditions of scan parameters within a scan protocol and standard inspection conditions of scan parameters between scan protocols, but also standard inspection conditions of scan parameters related to workflow, standard inspection conditions of scan parameters related to device License (License) or scan License (License), and standard inspection conditions of scan parameters related to other related items, and the like.

In the following, taking scan parameters and standard inspection conditions related to a workflow and between scan protocols as an example, a few scan parameters and standard inspection conditions are simply listed, and it should be noted that, the standard inspection conditions in the following scan parameters are not all given specific examples here, but only propose that corresponding standard inspection conditions may be included, and specific examples are as follows:

1. scanning parameters and standard inspection conditions within a scanning protocol

1) Bed position setting requirements and standard inspection conditions;

2) T1/T2/PD protocol: TR/TE requirements and standard inspection conditions;

where T1 refers to T1 weighted imaging (T1WI), highlighting mainly tissue longitudinal relaxation differences. The shorter the T1, the stronger the tissue signature, and the longer the T1, the weaker the tissue signature, where T1 is generally used to view the anatomy of tissue. T2 refers to T2 weighted imaging (T2WI), which highlights mainly tissue transverse relaxation differences. The shorter the T2, the weaker the characteristic tissue signal, the longer the T2, the stronger the characteristic tissue signal, and generally, T2 is mainly used for observing tissue lesion and is more sensitive to tissue bleeding. PD refers to proton density weighted imaging, which can highlight proton density, mainly for joint scanning. TR, Time of repetition, refers to the repetition Time, typically the Time interval between two consecutive radio frequency pulses. TE, Time of Echo, refers to the Echo Time, typically the Time interval between a radio frequency pulse and the corresponding Echo.

Generally, for the T1 image, the TR value is generally selected to be 400-600 ms, and the TE value is selected to be about 15 ms. For T2 images, TE is generally selected to be 80-120ms, and TR is selected to be more than 2000 ms. For PD images, TE is usually selected to be around 15ms, and TR is usually selected to be more than 2000 ms.

Note that the TR/TE requirements for the T1 image, the T2 image, and the PD image may be a part of the standard inspection conditions.

3) Setting requirements for the size of the reversal angle and standard inspection conditions;

where flip angle refers to the flip angle of the focused rf pulse, typically less than 150 degrees, where less than 150 degrees may also be considered part of the standard examination conditions for flip angle.

4) Setting different protocol fat pressing options and standard inspection conditions;

5) setting requirements for rotation angles in the chip and standard inspection conditions;

the rotation angle refers to an in-chip rotation angle, and is generally set to 0 degree or 90 degrees, where 0 degree or 90 degrees may also be considered as part of a standard inspection condition of the rotation angle.

6) Security related option settings and standard inspection conditions.

2. Scanning parameters and standard inspection conditions between scanning protocols

1) Scanning orientation/geometric parameter requirements and standard inspection conditions under the same functional procedure;

all protocols under the same functional procedure keep the scanning orientation and the geometric parameters consistent, and the scanning orientation comprises cor (coronal plane orientation), sag (sagittal plane orientation) and Tra (transverse plane orientation). The geometrical parameters include: number of layers, layer thickness, layer spacing, phase encoding direction, FOV field, etc.

2) Multi-slice layer group protocol requirements and standard inspection conditions.

Wherein, a multi-slice layer may refer to selecting multiple slice layers within a single protocol.

3. Workflow-dependent scan parameters and standard inspection conditions

1) Physiological signal requirements and set conditions;

2) coil selection requirements and setup conditions;

3) binding archiving operation and setting conditions;

4) protocol and coil control behavior requirements and setup conditions.

An example of the check list created in this step is given below, see table 1 below:

TABLE 1

Of course, in addition to the above-mentioned several scanning parameters and standard inspection conditions, other scanning parameters and inspection conditions may be included, and are not specifically limited herein.

After the examination list is established, the obtained scan parameters may be matched in the established examination list, the matched scan parameters are obtained in the examination list, and the standard examination conditions corresponding to the matched scan parameters are further obtained in the examination list and recorded as the target standard examination conditions.

S206, detecting the initial detection condition according to the target standard detection condition to obtain a corresponding detection result.

In this embodiment, the initial inspection condition input in advance may not match the scanning parameter, or the image obtained by scanning using the initial inspection condition may not meet the expected requirement, so that the standard inspection condition needs to be obtained, and the image obtained by scanning using the standard inspection condition may basically meet the expected requirement, so that the initial inspection condition may be detected using the obtained target standard inspection condition, where the detection may include a detection process of analyzing whether the initial inspection condition meets the requirement, or in short, after the initial inspection condition is detected using the target standard inspection condition, a corresponding detection result may be obtained, and the obtained detection result may include a detection result of whether the initial inspection condition needs to be modified, updated, or the like.

After the detection result is obtained, the scanning parameters and the examination conditions corresponding to the detection result can be used for executing the next operation, such as scanning the patient, continuing to set parameters or examine the patient, or alarming the patient.

In the scanning protocol detection method, the scanning parameters are matched in a preset inspection list by acquiring the input scanning parameters and initial inspection conditions related to the scanning protocol to obtain matched target standard inspection conditions, and the initial inspection conditions are detected according to the target standard inspection conditions to obtain corresponding detection results; the preset inspection list comprises the corresponding relation between the scanning parameters and the standard inspection conditions. In the method, the matched target standard inspection condition can be obtained through the input scanning parameters, and the input initial inspection condition is detected through the target standard inspection condition, so that the more accurate inspection condition can be quickly obtained. The patient can be directly scanned through the detection result of the examination condition, so that the scanning parameters and the examination condition do not need to be repeatedly set in the scanning process, and the scanning time of the patient can be saved.

In another embodiment, another scan protocol detection method is provided, and this embodiment relates to a specific process of how to detect an initial inspection condition through a target standard detection condition to obtain a corresponding detection result. On the basis of the above embodiment, as shown in fig. 3, the above S206 may include the following steps:

s302, judging whether the initial checking condition is the same as the target standard checking condition or not, and obtaining a judgment result.

In this step, after the target standard inspection condition matching the input scan parameter is obtained, the target standard inspection condition may be compared with the input initial inspection condition to determine whether the target standard inspection condition is the same as the initial inspection condition, so as to obtain a determination result.

It should be noted that, if the initial inspection condition and the target standard inspection condition both include only one inspection condition, it may be directly determined whether the one inspection condition is the same, and a determination result is obtained.

If any one of the initial inspection condition and the target standard inspection condition includes a plurality of inspection conditions, the target standard inspection condition and the initial inspection condition need to be compared item by item to obtain a comparison result of each item. When comparing item by item, the number of items of the inspection condition included in the initial inspection condition may be the same as or different from the number of items of the inspection condition included in the target standard inspection condition. When the initial checking condition and the target standard checking condition both comprise different numbers of items, for example, the initial checking condition comprises two checking conditions of a1 and a2, and the target standard checking condition comprises three checking conditions of B1, B2 and B3, wherein a1 corresponds to B1, a2 corresponds to B2, and B3 has no corresponding item, then it may be determined whether B1 and a1 are the same, resulting in a first determination result; judging whether the B2 is the same as the A2 or not to obtain a second judgment result; for B3, since there is no corresponding initial checking condition, the third item may not be the same as the judgment result directly.

S304, detecting the initial checking condition according to the judgment result to obtain a corresponding detection result.

In this step, only one examination condition is included in both the initial examination condition and the target standard examination condition for example, and the description thereof is omitted here for the case where any one of the initial examination condition and the target standard examination condition includes a plurality of examination conditions, similar to the case where only one examination condition is included.

After obtaining the judgment result whether the initial checking condition is the same as the target standard checking, in a possible implementation manner, optionally, if the initial checking condition is not the same as the target standard checking condition, outputting a first warning message; the first warning message is used for indicating the initial checking condition setting error. Here, the first warning message may also specifically indicate specific contents of the setting error, such as a geometric parameter setting error, a scanning orientation setting error, and the like, when indicating that the initial inspection condition setting error.

In the above possible implementation manner, optionally, if the initial checking condition is not the same as the target standard checking condition, outputting a second warning message; the second warning message is used for indicating the modification of the initial checking condition and the content of the modification of the initial checking condition. The second warning message may exist simultaneously with the first warning message, for example, while indicating that the initial checking condition is set incorrectly, the second warning message may also prompt that the initially checked condition with the wrong setting may be modified and the specific modification direction.

A specific example is given below for the first and second alert messages. If 1) the set scan parameters are the scan direction, coil and geometric parameters of the protocol under the same functional procedure, the corresponding standard inspection conditions are: the protocol scanning direction, the coil and the geometric parameters under the same functional procedure are kept consistent; 2) the set scanning parameters are automatic coil protocols, and the corresponding standard inspection conditions are as follows: automatic coil protocol switch settings, such as the T1 protocol all on, the T2 protocol all off; 3) the set scanning parameters are the protocol of the T1 image of 2d, which corresponds to the standard examination conditions: 2d T1 image, TR is >900 and TE is < 15.

In one example, assume that during the actual scanning process, the new head protocol set created by the doctor for the patient is as follows:

a)Gre_scout；

b) t1_ fse _ cor, the initial checking condition is: the phase encoding direction is PE;

c) t2_ fse _ cor _ fs, the initial checking condition is: the phase encoding direction is RO;

the examination conditions in a) to c) are determined by using the standard examination conditions in 1), where the standard examination conditions in 1) are that the scanning direction, the coil and the geometric parameters of the protocols under the same functional procedure are consistent, and the phase codes belong to the geometric parameters, but the phase codes are obviously set differently, so that the PE and RO settings in a) to c) are different, that is, the phase codes are set differently between the protocols, that is, the geometric parameters are set differently. An alarm message may be output based on this condition, and a first alarm message may be output indicating that the geometry parameter settings are not consistent, and in particular may indicate that the phase encoding settings are not the same. Of course, a second warning message may also be output indicating that a modification of the phase encoding is required and that the content of the modification may be indicated. The modification content given here may be that the phase encoding directions of Gre _ scout and T1_ fse _ cor are both set as RO, or the phase encoding directions of Gre _ scout and T2_ fse _ cor _ fs are both set as PE, or other cases, and this is not limited specifically here.

In another example, assume that during the actual scanning process, the doctor has the following newly created abdominal protocol suite for the patient:

d)Gre_scout；

e) t1_ fse _ cor, the initial checking condition is: the auto coil option is default (e.g., off);

f) t2_ fse _ cor _ fs, the initial checking condition is: the auto coil option is default (e.g., off);

the inspection conditions in d) -f) herein were judged using the standard inspection conditions in 2) above, in which the standard inspection conditions in 2) above were that the T1 protocol was all on and the T2 protocol was all off, but T1 and T2 were both off, and thus it was seen that the switching settings of the automatic coil in d) -f) herein were different from the standard inspection conditions, that is, the switching settings of the automatic coil were not consistent between the protocols. An alarm message may be output based on this condition and a first alarm message may be output indicating a discrepancy in the switch settings of the automatic coil between the protocols. Of course, a second warning message may also be output indicating that modifications to the switch settings of the automatic coils of each protocol are required and the contents of the modifications. The modification given here may be to turn on the switch of the auto coil corresponding to T1_ fse _ cor.

The above description has been made of the case where the initial inspection conditions are different from the target standard inspection conditions, and the following description is made of the case where the initial inspection conditions are the same as the target standard inspection conditions.

In another possible embodiment, optionally, if the initial checking condition is the same as the target standard checking condition, it is determined that the initial checking condition is set correctly.

Here, if the initial inspection condition and the target standard inspection condition both include one inspection condition, and the one inspection condition is the same, that is, the initial inspection condition and the target standard inspection condition are the same, it can be considered that all the set initial inspection conditions are correct.

If any one of the initial checking condition and the target standard checking condition includes a plurality of checking conditions, if one of the checking conditions is the same, the one checking condition can be considered to be set correctly, and for the other checking conditions which are different, the different checking conditions can be considered to be set incorrectly, and the subsequent adjustment or modification can be performed.

In this embodiment, the initial inspection condition is detected according to the obtained determination result by determining whether the initial inspection condition is the same as the target standard inspection condition, so as to obtain a corresponding detection result. The process is simple and direct through a condition comparison mode, so that the speed of detecting the initial detection condition can be increased, and the efficiency of detecting the whole scanning protocol can be further increased. Further, when the initial examination condition and the target examination condition are not the same, an alarm message can be output, so that a doctor or a technician can know the examination condition with the wrong setting in time, and the examination condition with the wrong setting can be quickly modified.

In another embodiment, another scan protocol detection method is provided, and this embodiment relates to a specific process that an object to be detected can be scanned after the scan protocol detection is completed. On the basis of the above embodiment, the method may further include the steps of:

and step SA, scanning the object to be detected according to the detection result.

In this step, in a possible implementation manner, if the initial inspection condition is different from the target standard inspection condition, optionally, the initial inspection condition may be modified, and the modified inspection condition may be determined; and scanning the object to be detected by adopting the scanning parameters and the modified inspection conditions. That is to say, when the initial inspection condition is set to be incorrect, the initial inspection condition with the incorrect setting may be modified, and after the modification, the scanning protocol is set by using the scanning parameters and the modified inspection condition, and the object to be detected is scanned, so as to obtain the scanning result of the object to be detected.

In another possible implementation, if the initial inspection condition is the same as the target standard inspection condition, a scanning protocol may be set directly using the scanning parameters and the initial inspection condition or the target standard inspection condition, and the object to be detected is scanned to obtain a scanning result of the object to be detected.

In this embodiment, after the detection of the scanning protocol is completed to obtain the detection result, the object to be detected may be scanned according to the detection result. Therefore, the object to be detected is scanned based on the detection result, the object to be detected can be scanned in a targeted manner, and the scanning result is in accordance with the expectation, so that the problem of time waste caused by blind scanning of the object to be detected can be avoided, and the time for scanning the object to be detected can be saved.

It should be understood that although the various steps in the flow charts of fig. 2-3 are shown in order as indicated by the arrows, the steps are not necessarily performed in order as indicated by the arrows. The steps are not performed in the exact order shown and described, and may be performed in other orders, unless explicitly stated otherwise. Moreover, at least some of the steps in fig. 2-3 may include multiple steps or multiple stages, which are not necessarily performed at the same time, but may be performed at different times, which are not necessarily performed in sequence, but may be performed in turn or alternately with other steps or at least some of the other steps.

In one embodiment, as shown in fig. 4, there is provided a scan protocol detecting apparatus including: an obtaining module 10, a matching module 11 and a detecting module 12, wherein:

an obtaining module 10, configured to obtain input scanning parameters and initial inspection conditions; the scanning parameters and the initial examination conditions are related to a scanning protocol;

a matching module 11, configured to match the scanning parameters in a preset inspection list, so as to obtain target standard inspection conditions matched with the scanning parameters; the preset checking list comprises a corresponding relation between the scanning parameters and standard checking conditions;

the detecting module 12 is configured to detect the initial inspection condition according to the target standard inspection condition to obtain a corresponding detection result.

Optionally, the scan parameter includes a scan parameter in a scan protocol and/or a scan parameter between scan protocols.

Optionally, the apparatus may further include an establishing module, configured to obtain a plurality of scanning parameters and a plurality of standard inspection conditions; and establishing a corresponding relation between each scanning parameter and the standard inspection condition to obtain the inspection list.

For the specific definition of the scan protocol detection device, reference may be made to the above definition of the scan protocol detection method, which is not described herein again.

In another embodiment, another scan protocol detecting apparatus is provided, and on the basis of the above embodiment, the detecting module 12 may include a judging unit and a detecting unit, where:

a judging unit, configured to judge whether the initial inspection condition is the same as the target standard inspection condition, and obtain a judgment result;

and the detection unit is used for detecting the initial inspection condition according to the judgment result to obtain a corresponding detection result.

Optionally, the detecting unit is specifically configured to output a first warning message when the initial checking condition is different from the target standard checking condition; the first warning message is used for indicating the initial checking condition setting error.

Optionally, the detecting unit is specifically configured to output a second warning message when the initial checking condition is different from the target standard checking condition; the second warning message is used for indicating the modification of the initial checking condition and the content of the modification of the initial checking condition.

Optionally, the detecting unit is specifically configured to determine that the initial inspection condition is set correctly when the initial inspection condition is the same as the target standard inspection condition.

In another embodiment, another scanning protocol detection apparatus is provided, and on the basis of the above embodiment, the apparatus may further include a scanning module, configured to scan an object to be detected according to the detection result.

Optionally, the scanning module is specifically configured to modify the initial inspection condition, and determine a modified inspection condition; and scanning the object to be detected by adopting the scanning parameters and the modified inspection conditions.

The modules in the scanning protocol detection device can be wholly or partially implemented by software, hardware and a combination thereof. The modules can be embedded in a hardware form or independent from a processor in the computer device, and can also be stored in a memory in the computer device in a software form, so that the processor can call and execute operations corresponding to the modules.

In one embodiment, a computer device is provided, comprising a memory and a processor, the memory having a computer program stored therein, the processor implementing the following steps when executing the computer program:

acquiring input scanning parameters and initial inspection conditions; the scanning parameters and the initial examination conditions are related to a scanning protocol; matching the scanning parameters in a preset inspection list to obtain target standard inspection conditions matched with the scanning parameters; the preset checking list comprises a corresponding relation between the scanning parameters and standard checking conditions; and detecting the initial inspection condition according to the target standard inspection condition to obtain a corresponding detection result.

In one embodiment, the processor, when executing the computer program, further performs the steps of:

judging whether the initial checking condition is the same as the target standard checking condition or not to obtain a judgment result; and detecting the initial inspection condition according to the judgment result to obtain a corresponding detection result.

and scanning the object to be detected according to the detection result.

acquiring a plurality of scanning parameters and a plurality of standard inspection conditions; and establishing a corresponding relation between each scanning parameter and the standard inspection condition to obtain the inspection list.

In one embodiment, a computer-readable storage medium is provided, having a computer program stored thereon, which when executed by a processor, performs the steps of:

In one embodiment, the computer program when executed by the processor further performs the steps of:

and scanning the object to be detected according to the detection result.

It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by hardware instructions of a computer program, which can be stored in a non-volatile computer-readable storage medium, and when executed, can include the processes of the embodiments of the methods described above. Any reference to memory, storage, database or other medium used in the embodiments provided herein can include at least one of non-volatile and volatile memory. Non-volatile Memory may include Read-Only Memory (ROM), magnetic tape, floppy disk, flash Memory, optical storage, or the like. Volatile Memory can include Random Access Memory (RAM) or external cache Memory. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM), among others.

The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.

The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.

Claims

1. A scan protocol detection method, the method comprising:

acquiring input scanning parameters and initial inspection conditions; the scanning parameters and the initial checking conditions are related to a scanning protocol;

matching the scanning parameters in a preset inspection list to obtain target standard inspection conditions matched with the scanning parameters; the preset inspection list comprises a corresponding relation between a scanning parameter and a standard inspection condition;

2. The method according to claim 1, wherein said detecting the initial inspection condition according to the target standard inspection condition to obtain a corresponding detection result comprises:

3. The method according to claim 2, wherein the detecting the initial checking condition according to the judgment result to obtain a corresponding detection result comprises:

if the initial checking condition is different from the target standard checking condition, outputting a first warning message; the first warning message is used for indicating that the initial checking condition is set to be wrong.

4. The method according to claim 2, wherein the detecting the initial checking condition according to the judgment result to obtain a corresponding detection result comprises:

5. The method according to claim 2, wherein the detecting the initial checking condition according to the judgment result to obtain a corresponding detection result comprises:

6. The method according to any of claims 1 to 4, wherein the scan parameters comprise scan parameters within a scan protocol and/or scan parameters between scan protocols.

7. The method according to any one of claims 1 to 4, wherein the preset check list is established in a manner that includes:

8. A scan protocol detection apparatus, the apparatus comprising:

the acquisition module is used for acquiring the input scanning parameters and the initial inspection conditions; the scanning parameters and the initial checking conditions are related to a scanning protocol;

the matching module is used for matching the scanning parameters in a preset checking list to obtain target standard checking conditions matched with the scanning parameters; the preset inspection list comprises a corresponding relation between a scanning parameter and a standard inspection condition;

9. A computer device comprising a memory and a processor, the memory storing a computer program, characterized in that the processor, when executing the computer program, implements the steps of the method of any of claims 1 to 7.

10. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the steps of the method of any one of claims 1 to 7.