CN112834760B - A sample analysis system and its sample scheduling planning method - Google Patents
A sample analysis system and its sample scheduling planning method Download PDFInfo
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- CN112834760B CN112834760B CN201911166409.XA CN201911166409A CN112834760B CN 112834760 B CN112834760 B CN 112834760B CN 201911166409 A CN201911166409 A CN 201911166409A CN 112834760 B CN112834760 B CN 112834760B
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Abstract
A sample analysis system and a sample scheduling planning method thereof comprise: acquiring all test items of all samples on a sample scheduling unit; judging the types of the test items, wherein the types of the test items comprise a common test item and a private test item; and determining target analysis equipment according to the private test items on the sample scheduling unit, and performing scheduling planning. The invention divides the test items into two types, one is a common test item and the other is a private test item, determines target analysis equipment according to the types of the test items, and provides a new planning and scheduling principle.
Description
Technical Field
The invention relates to a sample analysis system and a sample scheduling planning method thereof.
Background
With the demand for large amounts of measurement samples, in order to meet high throughput and reduced time, sample analysis systems composed of a plurality of sample analysis apparatuses have emerged. For such a system comprising a plurality of analysis devices, typically, samples to be tested are input at the front end of the system, and then the system sequentially distributes the samples to be tested to the corresponding one or more analysis devices for testing.
In order not to make some analysis devices too busy and other analysis devices too idle, the system typically programs and dispatches samples to be tested to the corresponding analysis devices for testing according to the load balancing principle. In a simple example, in a batch of samples to be tested, the analysis device 1 and the analysis device 2 need to be tested, so that a part of the samples in the batch can be planned to be tested by firstly going to the analysis device 1 and then going to the analysis device 2, and the rest part of the samples are planned to be tested by firstly going to the analysis device 2 and then going to the analysis device 1, so that the analysis device 1 and the analysis device 2 are not idle, and the test efficiency is relatively improved from the point of view.
The system plans and dispatches the sample to be tested to each corresponding analysis device according to the principle of load balancing, which sometimes is inflexible, and some new planning and dispatching principles need to be invented and proposed.
Disclosure of Invention
The application provides a sample analysis system and a sample scheduling planning method thereof.
According to a first aspect, there is provided in one embodiment a sample analysis system comprising:
a plurality of analysis devices for testing a sample;
A track connecting each analysis device, and a dispatching device for dispatching the sample to be tested to the corresponding analysis device through the track;
the processor is used for acquiring all test items of all samples on the sample scheduling unit and judging the types of the test items, wherein the types of the test items comprise common test items and private test items; and the processor determines target analysis equipment according to the private test items on the sample scheduling unit and performs scheduling planning.
In one embodiment, the processor determines a target analysis device from the private test items on the sample schedule unit and performs a schedule plan, comprising:
and when the private test item does not exist in the sample scheduling unit, the processor determines one analysis device in the plurality of analysis devices as a target analysis device, and schedules the sample plan in the sample scheduling unit to the target analysis device for testing.
In one embodiment, the processor determines one of the plurality of analysis devices as a target analysis device, comprising:
the processor acquires the load condition of each analysis device;
the processor determines the one analysis device with the smallest current load condition as the target analysis device.
In one embodiment, the processor determines a target analysis device from the private test items on the sample schedule unit and performs a schedule plan, comprising:
when the determined target analysis device is one, the processor schedules the sample plan on the sample scheduling unit to the target analysis device for testing.
In one embodiment, when the processor schedules a sample plan on a sample scheduling unit to the target analysis device for testing, the processor further determines whether the target analysis device exceeds a planned load balancing threshold;
and when judging that the planned load balancing threshold value is exceeded, the processor plans the common test items exceeding the planned load balancing threshold value on the sample scheduling unit to other analysis equipment for testing.
In one embodiment, the processor programs the common test items exceeding the program load balancing threshold value on the sample scheduling unit to other analysis equipment for testing based on the load balancing principle.
In one embodiment, the processor determines a target analysis device from the private test items on the sample schedule unit and performs a schedule plan, comprising:
when there are a plurality of determined target analysis devices, the processor plans the common test items on the sample scheduling unit to the plurality of target analysis devices for testing according to the load balancing principle
According to a second aspect, there is provided in one embodiment a sample analysis system comprising:
a plurality of analysis devices for testing a sample;
a track connecting each analysis device, and a dispatching device for dispatching the sample to be tested to the corresponding analysis device through the track;
the processor is used for acquiring all test items of all samples on the sample scheduling unit and judging the types of the test items, wherein the types of the test items comprise common test items and private test items; the processor plans the target analysis device of the first sample on the sample dispatching unit according to the types of test items of all samples on the sample dispatching unit and/or the states of the analysis devices, and then plans the target analysis device of the next sample according to the target analysis device of the previous sample.
In one embodiment, when the subsequent sample does not have a private test item with a different destination than the previous sample, the processor programs the target analysis device of the subsequent sample to be the same as the target analysis device of the previous sample.
In one embodiment, when the subsequent sample does not have a private test item with a different destination than the previous sample, but the target analysis device of the previous sample exceeds the planning load balancing threshold, the processor plans the subsequent sample as a different target analysis device than the target analysis device of the previous sample.
In one embodiment, when the subsequent sample has a private test item with a different destination than the previous sample, the processor programs the subsequent sample to the target analysis device where its private test item is located
According to a third aspect, an embodiment provides a sample analysis system comprising:
a plurality of analysis devices for testing a sample;
a track connecting each analysis device, and a dispatching device for dispatching the sample to be tested to the corresponding analysis device through the track;
the processor is used for acquiring test items of a sample to be tested, judging the types of the test items, wherein the types of the test items comprise common test items and private test items; if the same sample includes both the common test item and the private test item, the processor determines a target analysis device for the sample based on the private test item of the sample such that both the common test item and the private test item of the sample are performed on the target analysis device.
According to a fourth aspect, an embodiment provides a sample scheduling method of a sample analysis system including a plurality of analysis apparatuses, the method comprising:
Acquiring all test items of all samples on a sample scheduling unit;
judging the types of the test items, wherein the types of the test items comprise a common test item and a private test item;
and determining target analysis equipment according to the private test items on the sample scheduling unit, and performing scheduling planning.
In one embodiment, the determining the target analysis device according to the private test item on the sample scheduling unit and performing scheduling planning includes:
and when the sample scheduling unit does not have a private test item, determining one analysis device in the plurality of analysis devices as a target analysis device, and scheduling the sample plan on the sample scheduling unit to the target analysis device for testing.
In one embodiment, the determining the target analysis device according to the private test item on the sample scheduling unit and performing scheduling planning includes:
when the determined target analysis device is one, the processor schedules the sample plan on the sample scheduling unit to the target analysis device for testing.
In one embodiment, when the sample plan on the sample scheduling unit is scheduled to the target analysis device for testing, it is further determined whether the target analysis device exceeds a planned load balancing threshold;
And when the judgment is that the planned load balancing threshold value is exceeded, planning the common test items exceeding the planned load balancing threshold value on the sample scheduling unit to other analysis equipment for testing.
In one embodiment, common test items exceeding a planned load balancing threshold on a sample scheduling unit are planned to other analysis devices for testing based on a load balancing principle.
In one embodiment, the determining the target analysis device according to the private test item on the sample scheduling unit and performing scheduling planning includes:
when the determined target analysis equipment is provided with a plurality of target analysis equipment, common test items on the sample scheduling unit are planned to the plurality of target analysis equipment for testing according to the load balancing principle.
According to a fifth aspect, an embodiment provides a sample scheduling method of a sample analysis system including a plurality of analysis apparatuses, the method comprising:
acquiring all test items of all samples on a sample scheduling unit;
judging the types of the test items, wherein the types of the test items comprise a common test item and a private test item;
and planning the target analysis equipment of the first sample in the sample scheduling unit according to the types of test items of all samples in the sample scheduling unit and/or the states of the plurality of analysis equipment, and then planning the target analysis equipment of the next sample according to the target analysis equipment of the previous sample.
In one embodiment, when the subsequent sample does not have a private test item with a different destination than the previous sample, the target analysis device for the subsequent sample is programmed to be the same as the target analysis device for the previous sample.
In one embodiment, when the subsequent sample does not have a private test item with a different destination than the previous sample, but the target analysis device of the previous sample exceeds the planning load balancing threshold, the subsequent sample is planned to be a different target analysis device than the target analysis device of the previous sample
According to a sixth aspect, an embodiment provides a sample scheduling method of a sample analysis system including a plurality of analysis apparatuses, the method comprising:
obtaining a test item of a sample to be tested;
judging the types of the test items, wherein the types of the test items comprise common test items and private test items;
if the same sample includes both the common test item and the private test item, determining a target analysis device for the sample based on the private test item of the sample such that both the common test item and the private test item of the sample are performed on the target analysis device.
According to a seventh aspect, an embodiment provides a computer readable storage medium comprising a program executable by a processor to implement a method as described in any of the embodiments herein
According to the sample analysis system, the sample scheduling planning method and the computer readable storage medium of the embodiment, the test items are divided into two types, wherein one type is a common test item, the other type is a private test item, target analysis equipment is determined according to the types of the test items, and a new planning and scheduling principle is provided.
Drawings
FIG. 1 is a schematic diagram of a sample analysis system according to one embodiment;
FIG. 2 is a schematic diagram of a sample analysis system according to another embodiment;
FIG. 3 is a schematic diagram of a sample analysis system according to yet another embodiment;
FIG. 4 is a schematic diagram of a pre-processing module according to one embodiment;
FIG. 5 is a schematic diagram of an aftertreatment module of an embodiment;
FIG. 6 is a schematic diagram of a sample analysis system according to yet another embodiment;
FIG. 7 is a flow chart of a sample dispatch planning method of a sample analysis system according to one embodiment;
FIG. 8 is a flow chart of a sample dispatch planning method of a sample analysis system according to another embodiment;
FIG. 9 is a flow chart of a sample dispatch planning method for a sample analysis system according to yet another embodiment;
FIG. 10 is a flow chart of a sample dispatch planning method for a sample analysis system according to yet another embodiment.
Detailed Description
The invention will be described in further detail below with reference to the drawings by means of specific embodiments. Wherein like elements in different embodiments are numbered alike in association. In the following embodiments, numerous specific details are set forth in order to provide a better understanding of the present application. However, one skilled in the art will readily recognize that some of the features may be omitted, or replaced by other elements, materials, or methods in different situations. In some instances, some operations associated with the present application have not been shown or described in the specification to avoid obscuring the core portions of the present application, and may not be necessary for a person skilled in the art to describe in detail the relevant operations based on the description herein and the general knowledge of one skilled in the art.
Furthermore, the described features, operations, or characteristics of the description may be combined in any suitable manner in various embodiments. Also, various steps or acts in the method descriptions may be interchanged or modified in a manner apparent to those of ordinary skill in the art. Thus, the various orders in the description and drawings are for clarity of description of only certain embodiments, and are not meant to be required orders unless otherwise indicated.
The numbering of the components itself, e.g. "first", "second", etc., is used herein merely to distinguish between the described objects and does not have any sequential or technical meaning. The terms "coupled" and "connected," as used herein, are intended to encompass both direct and indirect coupling (coupling), unless otherwise indicated.
The inventor finds that if the load balancing is taken as a principle when researching the scheduling principle of a system consisting of a plurality of analysis devices, namely, in order to meet the load balancing, a lot of time can cause samples to be scheduled among different analysis devices, so that sample testing can waste a lot of time for scheduling among different analysis devices. The inventor classifies test items into two types when researching the planning and scheduling principle of a sample to be tested, wherein one type is a common test item and the other type is a private test item. The common test item means that the test item can be tested on a plurality of analysis devices, i.e. the plurality of analysis devices can all perform the test item; the private test item means that the test item can be tested on a specific one of the analysis devices, i.e., only one of the analysis devices in the system can make the test item.
The shortcomings of the load balancing principle can then be readily seen from the inventors' research. For example, the system may have two analysis devices M1 and M2, and the sample scheduling unit is exemplified by a sample rack, and the sample rack has 10 sample positions, i.e., can carry 10 samples. If all test items of these 10 samples on the sample rack are common test items, then when planning and scheduling according to the load balancing principle, samples No. 1, 3, 5, 7 and 9 on the sample rack would be planned and scheduled to one of the analysis devices, e.g. the M1 test, samples No. 2, 4, 6, 8 and 10 on the sample rack would be planned and scheduled to the other analysis device, e.g. the M2 test, such that a single sample rack would be frequently transported back and forth between the two analysis devices, a lot of time would be wasted on the sample's scheduling path between the two analysis devices, such that the TAT (TURN-arondtime) of the single sample, referring to the time from the doctor applying for test items to the collection of test reports, would be elongated. For another example, if 10 samples on the sample rack have both common test items and private test items, and the private test items are all on the same analysis device, such as M1, then according to the load balancing principle, it is quite possible to plan all the private test items of the samples on the sample rack for testing on the analysis device M1, and plan all the common test items of the samples on the sample rack for testing on the analysis device M2, so that a single sample rack can be frequently transported back and forth between two analysis devices, and a great amount of time is wasted on the way of sample scheduling between the two analysis devices, so that the TAT time of a single sample is lengthened.
Based on such research and cognition, the inventor proposes to determine the target analysis equipment required by the sample according to the private test items, and then finish the public test items on the same dispatching unit on the target analysis equipment as much as possible, so as to reduce the dispatching of the sample among different analysis equipment as much as possible, and if one analysis equipment can finish all the test items, all the test items can be finished on one analysis equipment as much as possible.
Before describing the planning and scheduling principles of the present invention, a description is given of a sample analysis system.
In some embodiments, a sample analysis system is disclosed, for example, referring to fig. 1, the sample analysis system of some embodiments may include a plurality of analysis devices 30, a track 40 connecting the analysis devices 30, a scheduler 50, and a processor 70; referring to fig. 2, in some embodiments the sample analysis system may further include an input module 10; referring to fig. 3, in some embodiments the sample analysis system may also include one or both of the pre-processing module 20 and the post-processing module 60. It should be noted that three analysis apparatuses 30 are shown in fig. 1 and 2, and two analysis apparatuses 30 are shown in fig. 3, which are only for illustration, and are not intended to limit the number of analysis apparatuses to only two or three.
The input module 10 is for receiving a sample to be placed. The input module 10 is generally an area where a user places a sample, and the input module 10 may automatically scan the sample placed therein, sort the sample, etc. for processing by a next module such as the front processing module 20 or the analysis device 30 while the sample analysis system is in operation.
The preprocessing module 20 is used for completing preprocessing of the sample. In one embodiment, referring to fig. 4, the pre-processing module 20 may include one or more of a centrifugation module 21, a serum detection module 22, a decapping module 23, and a dispensing module 24. The centrifugation module 21 is used for centrifuging the sample to be centrifuged, and the number of the centrifugation modules 21 may be one or more. The serum detection module 22 is configured to detect whether the serum level of the sample is sufficient and/or whether the serum level of the sample is acceptable to determine whether the centrifuged sample is available for subsequent testing. The cap removal module 23 is used to cap, membrane, remove cap and membrane the centrifuged sample—as will be understood, herein the capping, membrane, cap removal and membrane removal of the sample refers to the capping, membrane addition, cap removal and membrane removal of the sample tube containing the sample; typically, the sample after centrifugation requires removal of the cap for subsequent dispensing modules 24 or analytical devices to dispense or aspirate. The dispensing module 24 is used to dispense samples, for example, one sample into multiple samples, for separate measurement in different analysis devices 30. One typical preprocessing flow for the preprocessing module 20 is: the centrifugation module 21 receives the samples scheduled by the input module 10 and performs centrifugation on the samples; the serum detection module 22 detects serum of the sample after centrifugation to determine whether the sample can be used for subsequent measurement, and if the serum is insufficient in quantity or the sample is unqualified, the sample cannot be used for subsequent measurement; if the detection is passed, the sample is dispatched to the cap removing module 23, the cap removing module 23 removes the cap of the sample, if the cap separating module 24 is provided, the cap separating module 24 separates the cap removed sample, then the separated sample is dispatched to the corresponding analysis device 30 for measurement, and if the cap separating module 24 is not provided, the sample is dispatched from the cap removing module 23 to the corresponding analysis device 30 for measurement. It should be noted that the preprocessing module 20 is not necessary in the sample analysis system, and is an optional module.
The analysis device 30 is used for testing the sample. In order to improve efficiency and test throughput, in general, a sample analysis system has a plurality of analysis apparatuses 30, such as a biochemical analysis apparatus, an immunoassay apparatus, a coagulation analysis apparatus, and the like. These analysis devices 30 may be the same type of analysis device or may be different types of analysis devices, which may be configured according to the needs of the user and the department.
The track 40 is used to connect modules in the sample analysis system and the scheduler 50 schedules samples via the track 40. For example, in the sample analysis system shown in fig. 1, the track 40 connects the analysis devices 30 so that the scheduler 50 may schedule samples from one analysis device 30 to another analysis device 30; for another example, in the sample analysis system shown in fig. 2, the track 40 also connects the input module 10 and the analysis devices 30, so that the dispatching device 50 can also dispatch samples from the input module 10 to any analysis device 30; for example, in the sample analysis system shown in fig. 3, the track is further connected to the pre-processing module 20 and the post-processing module 60, so that the input module 10, the pre-processing module 20, the analysis device 30 and the post-processing module 60 are connected, and thus the scheduling device 50 may schedule samples from the input module 10 to the pre-processing module 20, samples from the pre-processing module 20 to any analysis device 30, samples from one analysis device 30 to another analysis device 30, samples from the analysis device 30 to the post-processing module 60, and so on.
The post-processing module 60 is used for completing post-processing of the sample. In one embodiment, referring to fig. 5, the post-processing module 60 includes one or more of a film/capping module 61, a refrigerated storage module 62, and a film/capping module 63. The film/cap module 61 is used for film or cap the sample; the refrigerated storage module 62 is used for storing samples; the stripping/capping module 63 is used to strip or cap the sample. One typical post-processing flow of the post-processing module 60 is: after the sample is sucked by the analysis device 30, the sample is dispatched to the film adding/capping module 61, and the film adding/capping module 61 adds the film or caps the measured sample, and then dispatches the sample to the cold storage module 62 for storage. If the sample needs to be retested, the sample is dispatched from the refrigerated storage module 62 and removed from the film or lid in the film/lid removal module 63 and then dispatched to the analysis device 30 for testing. It should be noted that the post-processing module 60 is not necessary in the sample analysis system and is an optional module.
Referring to fig. 6, as an example of the sample analysis system, each module further includes a module buffer, for example, the centrifugal module 21 has a buffer; the track 40 also has a track buffer (a track with a curved turn in the upper right corner of the figure), and the entire track may be a circulating track. It should be noted that many types of modules are shown in the drawings, but those skilled in the art will understand that the number is not limited herein, and for example, the centrifugal module 21 may be plural, the analysis device 30 may be plural, etc.
The above are some descriptions of sample analysis systems. For a sample analysis system with a plurality of analysis devices, the invention provides a planning and scheduling principle, strategy or scheme, the general idea is to minimize the scheduling of samples among different analysis devices, if one analysis device can be used for completing all test items, all the test items can be completed on one analysis device as much as possible, and the three angles are respectively described below from the sample itself, the adjacent samples before and after, and the overall sample condition on a sample scheduling unit.
From the point of view of the sample itself, all test items of the sample are completed as much as possible on one analysis device.
Thus, in some embodiments, the processor 70 obtains test items of the sample under test and determines the type of test item-as described above, the type of test item includes both common test items and private test items; if the same specimen includes both a common test item and a private test item, the processor 70 determines the target analysis device for the specimen based on the private test item of the specimen such that both the common test item and the private test item of the specimen are conducted on the target analysis device. For example, the sample analysis system comprises three analysis devices M1, M2 and M3, and if the private test items of the sample S are all completed in the analysis device M2, all test items of the sample S, including the common test item and the private test item, are completed in the analysis device M2-it will of course be appreciated that the analysis device M2 is here a common test item capable of supporting the sample S.
In other embodiments, when the processor 70 obtains test items of the sample to be tested and determines that all the test items of the sample to be tested are common test items, then the processor 70 determines one of a plurality of analysis devices in the sample analysis system as a target analysis device and performs all the test items of the sample to be tested on the target analysis device.
The above is an illustration of how to make all test items of a sample as complete as possible on one analysis device from the point of view of the individual sample itself. In the following, it is explained from the perspective of the adjacent samples from the front and rear, how to make the samples located on the same sample scheduling unit complete the test as much as possible in one analysis device.
In some embodiments, the processor 70 obtains all test items for all samples on the sample schedule unit and determines the type of test item; the processor plans the target analysis device of the first sample on the sample dispatching unit according to the types of test items of all samples on the sample dispatching unit and/or the states of the analysis devices, and then plans the target analysis device of the next sample according to the target analysis device of the previous sample.
In particular embodiments, the processor 70 may program the target analysis device for the first sample on the sample schedule unit based on the private test item on the sample schedule unit. For example, the private test items of all samples on the sample schedule unit are in the same analysis device, then the analysis device can be determined to be the target analysis device for the first sample-even though the test items of the first sample are likely to be all common test items. For another example, if private test items of all samples in the sample scheduling unit may be distributed among two analysis apparatuses, either of the two analysis apparatuses may be determined as the target analysis apparatus of the first sample, or further, it may be determined which of the two is the target analysis apparatus of the first sample according to the planned load balancing threshold. This is some illustration of how to determine the target analysis device for the first sample on the sample scheduling unit, and how to follow the previous sample as much as possible after the following, so that they try to complete the test in the same analysis device.
In particular embodiments, when the subsequent sample does not have a private test item with a different destination than the previous sample, the processor 70 programs the target analysis device for the subsequent sample to be the same as the target analysis device for the previous sample. Alternatively, in particular embodiments, when the subsequent sample does not have a private test item with a different destination than the previous sample, but the target analysis device of the previous sample exceeds the planning load balancing threshold, the processor 70 plans the subsequent sample as a different target analysis device than the target analysis device of the previous sample. The above is the case where the latter sample does not have a private test item with a destination different from that of the former sample, and in this way, the latter sample is planned into the same target analysis device as the former sample as much as possible, so that the sample scheduling unit runs and schedules back and forth between different analysis devices differently. In other embodiments, when a subsequent sample has a private test item with a different destination than the previous sample, the processor 70 programs the subsequent sample to the target analysis device where its private test item is located.
The above is an illustration of how to make the following sample follow the preceding sample as much as possible from the perspective of the preceding and following adjacent samples, so that samples located on the same sample scheduling unit can be tested as much as possible at one analysis device. The scheduling of all samples it carries is further planned from how more macroscopically the sample scheduling unit follows.
In some embodiments, the processor 70 obtains all test items for all samples on the sample schedule unit and determines the type of test item; the processor 70 determines the target analysis device from the private test items on the sample dispatch unit and performs a dispatch plan. The general principle and thought of such planning and scheduling is that first, a certain analysis device is determined according to a private test item on a sample scheduling unit, and then a common test item is planned to the certain analysis device, so that the running and scheduling of the sample scheduling unit among different analysis devices are reduced as much as possible. In general, two kinds of conditions of the target analysis equipment are determined according to the private test items on the sample dispatching unit, firstly, the target analysis equipment is determined as one target as far as possible, and the sample dispatching unit can avoid running and dispatching among different analysis equipment by displaying the sample dispatching unit; and if the target analysis equipment determines that a plurality of analysis equipment are needed, the common test items are not distributed to other analysis equipment as much as possible, and the analysis equipment needed by the sample scheduling unit is increased, so that the sample scheduling unit is increased to run and schedule among different analysis equipment. These two cases are described separately below.
In some embodiments, the processor 70 determines the target analysis device from the private test items on the sample schedule unit and performs the schedule planning, including: when there is no private test item on the sample schedule unit, the processor 70 determines one of the plurality of analysis devices in the sample analysis system as a target analysis device, and schedules the sample plan on the sample schedule unit to the target analysis device for testing, i.e., schedules all test items of each sample on the sample schedule unit to the one target analysis device for testing. While there may be a number of strategies for determining one of the analysis devices as the target analysis device, such as selecting the closest analysis device to the input module 10, such as selecting one analysis device randomly, such as selecting a more idle analysis device, the processor 70 may obtain the load condition of each analysis device, and determine the analysis device with the smallest current load condition as the target analysis device. Of course, those skilled in the art will appreciate that the analysis device chosen herein is a device that supports all of the common test items on the sample scheduling unit.
In some embodiments, the processor 70 determines the target analysis device from the private test items on the sample schedule unit and performs the schedule planning, including: when the processor determines that the target analysis device is one according to the private test items in the sample scheduling unit, that is, when all the private test items in the sample scheduling unit can be completed in one analysis device, the analysis device is determined to be the target analysis device, and the processor 70 schedules the samples in the sample scheduling unit to the target analysis device for testing, that is, schedules all the test items of each sample in the sample scheduling unit to the one target analysis device for testing.
The above is the case that the target analysis device determines that there is only one target analysis device, so that the scheduling unit can run and schedule between different analysis devices as much as possible, and of course, in some embodiments, the problem of load balancing can be considered in consideration of the overall principle of reducing the running and scheduling of the scheduling unit between different analysis devices as much as possible. For example, when the processor 70 schedules a sample on a sample scheduling unit to be tested by one of the target analysis devices, the processor 70 also determines whether the target analysis device exceeds a planned load balancing threshold, and when it is determined that the planned load balancing threshold is exceeded, the processor 70 schedules a common test item exceeding the planned load balancing threshold on the sample scheduling unit to be tested by other analysis devices, for example, the common test item exceeding the planned load balancing threshold on the sample scheduling unit is also scheduled to be tested by other analysis devices instead of other analysis devices as much as possible, or alternatively, the common test item exceeding the planned load balancing threshold on the sample scheduling unit may be scheduled to be tested by other analysis devices based on the load balancing principle.
In some embodiments, the processor 70 determines the target analysis device from the private test items on the sample schedule unit and performs the schedule planning, including: when there are a plurality of determined target analysis devices, that is, all private test items in the sample dispatching unit cannot be completed in one analysis device, and the plurality of analysis devices are determined to be target analysis devices only when the completion is required in the plurality of analysis devices, the target analysis devices are naturally a plurality of target analysis devices instead of one target analysis device, and the processor 70 distributes the common test items in the dispatching unit to the plurality of target analysis devices as much as possible to complete, but does not add other new analysis devices as much as possible; in some embodiments, the processor 70 may complete the distribution of the common test items on the scheduling unit to the plurality of target analysis devices by planning the common test items on the sample scheduling unit into the plurality of target analysis devices for testing according to a load balancing principle.
The above is the scheduling of all samples it carries from the sample scheduling unit.
The general idea is to minimize the sample scheduling among different analysis devices, if one analysis device can complete all test items, then all test items can be completed on one analysis device as much as possible, and in some cases, the load balancing principle can be considered at the same time.
In some embodiments of the present invention, a sample scheduling method of a sample analysis system is also disclosed, where the sample analysis system may include a plurality of analysis devices, for example, the sample analysis system may be the sample analysis system disclosed in fig. 1 to 6 above. The sample scheduling method of the sample analysis system is also described in three terms below.
From the point of view of the sample itself, all test items of the sample are completed as much as possible on one analysis device.
Thus, referring to fig. 7, in some embodiments, a sample scheduling method of a sample analysis system includes steps 100 to 120.
Step 100: and obtaining test items of the sample to be tested.
Step 110: the types of test items are determined-as described above, the types of test items include common test items and private test items.
Step 120: if the same sample includes both the common test item and the private test item, determining a target analysis device for the sample based on the private test item of the sample such that both the common test item and the private test item of the sample are performed on the target analysis device. For example, the sample analysis system comprises three analysis devices M1, M2 and M3, and if the private test items of the sample S are all completed in the analysis device M2, all test items of the sample S, including the common test item and the private test item, are completed in the analysis device M2-it will of course be appreciated that the analysis device M2 is here a common test item capable of supporting the sample S.
Referring to fig. 8, in some other embodiments, if step 110 determines that all the test items of the sample to be tested are common test items, then step 130 is performed to determine one of the plurality of analysis devices in the sample analysis system as a target analysis device, and all the test items of the sample to be tested are performed on the target analysis device.
The above is an illustration of how to make all test items of a sample as complete as possible on one analysis device from the point of view of the individual sample itself. In the following, it is explained from the perspective of the adjacent samples from the front and rear, how to make the samples located on the same sample scheduling unit complete the test as much as possible in one analysis device.
Referring to fig. 9, in some embodiments, a sample scheduling method of a sample analysis system includes steps 200 to 230.
Step 200: all test items of all samples on the sample scheduling unit are acquired.
Step 210: the types of test items are determined-as described above, the types of test items include common test items and private test items.
Step 220: and planning target analysis equipment of the first sample in the sample scheduling unit according to the types of test items of all samples in the sample scheduling unit and/or the states of the plurality of analysis equipment.
Step 230: and then planning the target analysis equipment of the next sample according to the target analysis equipment of the previous sample.
In particular embodiments, step 220 may program the target analysis device for the first sample on the sample schedule unit based on the private test item on the sample schedule unit. For example, the private test items of all samples on the sample schedule unit are in the same analysis device, then the analysis device can be determined to be the target analysis device for the first sample-even though the test items of the first sample are likely to be all common test items. For another example, the private test items of all samples in the sample scheduling unit may be distributed in two analysis devices, and the first sample only includes the common class test item, then either one of the two analysis devices may be determined as the target analysis device of the first sample, or further, according to the planned load balancing threshold, it may be determined which of the two is the target analysis device of the first sample. This is some illustration of how to determine the target analysis device for the first sample on a sample scheduling unit, and how to follow the previous sample as much as possible after the following, so that they try to complete the test in the same analysis device, reducing the time that the sample scheduling unit (e.g., sample rack) is transported between different analysis devices.
In particular embodiments, when the subsequent sample does not have a private test item with a different destination than the previous sample, then step 230 programs the target analysis device for the subsequent sample to be the same as the target analysis device for the previous sample. Alternatively, in particular embodiments, when the subsequent sample does not have a private test item with a different destination than the previous sample, but the target analysis device of the previous sample exceeds the planning load balancing threshold, step 230 plans the subsequent sample as a different target analysis device than the target analysis device of the previous sample. The above is the case where the latter sample does not have a private test item with a destination different from that of the former sample, and in this way, the latter sample is planned into the same target analysis device as the former sample as much as possible, so that the sample scheduling unit runs and schedules back and forth between different analysis devices differently. In other embodiments, when the subsequent sample has a private test item with a different destination than the previous sample, step 230 programs the subsequent sample to the target analysis device to which the private test item corresponds.
The above is an illustration of how to make the following sample follow the preceding sample as much as possible from the perspective of the preceding and following adjacent samples, so that samples located on the same sample scheduling unit can be tested as much as possible at one analysis device. The scheduling of all samples it carries is further planned from how more macroscopically the sample scheduling unit follows.
Referring to fig. 10, in some embodiments, a sample scheduling method of a sample analysis system includes steps 300 to 320.
Step 300: all test items of all samples on the sample scheduling unit are acquired.
Step 310: the types of test items are determined-as described above, the types of test items include common test items and private test items.
Step 320: and determining target analysis equipment according to the private test items on the sample scheduling unit, and performing scheduling planning. The general principle and idea of the planning and scheduling of step 320 is to determine a certain analysis device according to the private test item on the sample scheduling unit, and then plan the common test item into the certain analysis device, so as to reduce the running and scheduling of the sample scheduling unit between different analysis devices as much as possible. In general, two kinds of conditions of the target analysis equipment are determined according to the private test items on the sample dispatching unit, firstly, the target analysis equipment is determined as one target as far as possible, and the sample dispatching unit can avoid running and dispatching among different analysis equipment by displaying the sample dispatching unit; and if the target analysis equipment determines that a plurality of analysis equipment are needed, the common test items are not distributed to other analysis equipment as much as possible, and the analysis equipment needed by the sample scheduling unit is increased, so that the sample scheduling unit is increased to run and schedule among different analysis equipment. These two cases are described separately below.
In some embodiments, step 320 determines a target analysis device from the private test items on the sample schedule unit and performs a schedule planning, including: when there is no private test item on the sample scheduling unit, step 320 determines one of the plurality of analysis devices in the sample analysis system as a target analysis device, and schedules the sample plan on the sample scheduling unit to the target analysis device for testing, i.e., schedules all test items of each sample on the sample scheduling unit to the one target analysis device for testing. In particular, there may be a plurality of strategies how to determine one of the analysis devices as the target analysis device, for example, selecting a closest analysis device close to the input module 10, for example, randomly selecting an analysis device, for example, selecting a relatively idle analysis device, and specifically, step 320 may obtain the load condition of each analysis device, and determine the analysis device with the smallest current load condition as the target analysis device. Of course, those skilled in the art will appreciate that the analysis device chosen herein is a device that supports all of the common test items on the sample scheduling unit.
In some embodiments, step 320 determines a target analysis device from the private test items on the sample schedule unit and performs a schedule planning, including: when the target analysis device is determined to be one according to the private test items in the sample scheduling unit in step 320, that is, when all the private test items in the sample scheduling unit can be completed in one analysis device, the analysis device is determined to be the target analysis device, and the sample in the sample scheduling unit is planned and scheduled to the target analysis device for testing in step 320, that is, all the test items of each sample in the sample scheduling unit are planned and scheduled to the one target analysis device for testing.
The above is the case that the target analysis device determines that there is only one target analysis device, so that the scheduling unit can run and schedule between different analysis devices as much as possible, and of course, in some embodiments, the problem of load balancing can be considered in consideration of the overall principle of reducing the running and scheduling of the scheduling unit between different analysis devices as much as possible. For example, when step 320 schedules a sample plan on a sample scheduling unit to the above-mentioned one target analysis device for testing, step 320 also determines whether the target analysis device exceeds a planned load balancing threshold, and when it is determined that the planned load balancing threshold is exceeded, step 320 schedules a common test item exceeding the planned load balancing threshold on the sample scheduling unit to other analysis devices for testing, for example, only the test item is scheduled to other analysis devices instead of other analysis devices for testing, or alternatively, the common test item exceeding the planned load balancing threshold on the sample scheduling unit may be scheduled to other analysis devices for testing based on the load balancing principle.
In some embodiments, step 320 determines a target analysis device from the private test items on the sample schedule unit and performs a schedule planning, including: when there are multiple target analysis devices determined, that is, all private test items in the sample dispatching unit cannot be completed in one analysis device, and only the multiple analysis devices need to be completed, the multiple analysis devices are determined to be target analysis devices, and the target analysis devices are naturally multiple but not one, and step 320 is to allocate the common test items in the dispatching unit to the multiple target analysis devices as much as possible, without adding other new analysis devices as much as possible; in some embodiments, step 320 may be performed by distributing the common test items on the scheduling unit to the plurality of target analysis devices, and may be performed by planning the common test items on the sample scheduling unit to the plurality of target analysis devices for testing according to a load balancing principle.
The above is the scheduling of all samples it carries from the sample scheduling unit.
The general idea is to minimize the sample scheduling among different analysis devices, if one analysis device can complete all test items, then all test items can be completed on one analysis device as much as possible, and in some cases, the load balancing principle can be considered at the same time.
Reference is made to various exemplary embodiments herein. However, those skilled in the art will recognize that changes and modifications may be made to the exemplary embodiments without departing from the scope herein. For example, the various operational steps and components used to perform the operational steps may be implemented in different ways (e.g., one or more steps may be deleted, modified, or combined into other steps) depending on the particular application or taking into account any number of cost functions associated with the operation of the system.
In the above embodiments, it may be implemented in whole or in part by software, hardware, firmware, or any combination thereof. Additionally, as will be appreciated by one of skill in the art, the principles herein may be reflected in a computer program product on a computer readable storage medium preloaded with computer readable program code. Any tangible, non-transitory computer readable storage medium may be used, including magnetic storage devices (hard disks, floppy disks, etc.), optical storage devices (CD-to-ROM, DVD, blu-Ray disks, etc.), flash memory, and/or the like. These computer program instructions may be loaded onto a general purpose computer, special purpose computer, or other programmable data processing apparatus to produce a machine, such that the instructions which execute on the computer or other programmable data processing apparatus create means for implementing the functions specified. These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including means which implement the function specified. The computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified.
While the principles herein have been shown in various embodiments, many modifications of structure, arrangement, proportions, elements, materials, and components, which are particularly adapted to specific environments and operative requirements, may be used without departing from the principles and scope of the present disclosure. The above modifications and other changes or modifications are intended to be included within the scope of this document.
The foregoing detailed description has been described with reference to various embodiments. However, those skilled in the art will recognize that various modifications and changes may be made without departing from the scope of the present disclosure. Accordingly, the present disclosure is to be considered as illustrative and not restrictive in character, and all such modifications are intended to be included within the scope thereof. Also, advantages, other advantages, and solutions to problems have been described above with regard to various embodiments. The benefits, advantages, solutions to problems, and any element(s) that may cause any benefit, advantage, or solution to occur or become more pronounced are not to be construed as a critical, required, or essential feature. The terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, system, article, or apparatus. Furthermore, the term "couple" and any other variants thereof are used herein to refer to physical connections, electrical connections, magnetic connections, optical connections, communication connections, functional connections, and/or any other connection.
Those skilled in the art will recognize that many changes may be made to the details of the above-described embodiments without departing from the underlying principles of the invention. Accordingly, the scope of the invention should be determined only by the following claims.
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