CN112798149B - Multichannel thermal resistance measuring device and redundant multichannel thermal resistance measuring device - Google Patents
Multichannel thermal resistance measuring device and redundant multichannel thermal resistance measuring device Download PDFInfo
- Publication number
- CN112798149B CN112798149B CN202011600577.8A CN202011600577A CN112798149B CN 112798149 B CN112798149 B CN 112798149B CN 202011600577 A CN202011600577 A CN 202011600577A CN 112798149 B CN112798149 B CN 112798149B
- Authority
- CN
- China
- Prior art keywords
- constant current
- current source
- channel
- thermal resistance
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K15/00—Testing or calibrating of thermometers
- G01K15/007—Testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K15/00—Testing or calibrating of thermometers
- G01K15/002—Calibrated temperature sources, temperature standards therefor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses a multi-channel thermal resistance measuring device, which comprises a test constant current source, a bit supplementing constant current source, a mutual exclusion change-over switch group and a plurality of channel circuits, wherein the test constant current source is connected with the bit supplementing constant current source; the test constant current source and the bit supplementing constant current source are mutually connected to the channel circuit through the mutually exclusive change-over switch group; the channel circuit comprises a working channel circuit and an idle channel circuit, the working channel circuit is powered by the mutually exclusive change-over switch group through the test constant current source, and the idle channel circuit is powered by the bit supplementing constant current source. The mutual exclusion switch group is used for switching the bit supplementing constant current source and the testing constant current source, so that the charging and discharging processes of the capacitor in the circuit are avoided, the current flowing through the thermal resistor to be tested is free from jumping, the measuring efficiency is greatly improved, and the measuring accuracy is improved. The invention also provides a redundant multichannel thermal resistance measuring device and temperature measuring equipment with the beneficial effects.
Description
Technical Field
The invention relates to the field of process automation, in particular to a multi-channel thermal resistance measuring device, a redundant multi-channel thermal resistance measuring device and temperature measuring equipment.
Background
In the field of process automation, the efficiency and accuracy of RTD (thermal resistance) measurement are always important in the field, and in order to ensure efficiency and save cost, a multi-channel thermal resistance measurement device is often adopted in the field, that is, a single thermal resistance measurement device comprises a plurality of channel circuits, each channel circuit is connected with a thermal resistance to be measured, and the multi-channel thermal resistance measurement device sequentially obtains electrical signals of different thermal resistances through different channel circuits according to a preset sequence. However, due to the coupling capacitance in the measured thermal resistor or connected with the measured thermal resistor, or the capacitance carried by the multichannel thermal resistor measuring device, when the original idle channel circuit starts to be electrified to enter the working state or is electrified to enter the idle state, the current flowing through the thermal resistor jumps, the equilibrium state in normal use cannot be immediately reached, a certain charge and discharge time is needed, the measured data is meaningful, the efficiency of thermal resistor measurement is greatly slowed down, and the measurement accuracy is reduced.
Therefore, how to make the current flowing through the thermal resistor not jump, reduce the charge and discharge time of the capacitor in the circuit, and further improve the measurement efficiency and accuracy is a problem to be solved by those skilled in the art.
Disclosure of Invention
The invention aims to provide a multi-channel thermal resistance measuring device, a redundant multi-channel thermal resistance measuring device and temperature measuring equipment, which are used for solving the problems of overlong charge and discharge time of a capacitor in a circuit and low testing efficiency and accuracy in the current jump flowing through a thermal resistor in the prior art.
In order to solve the technical problems, the invention provides a multi-channel thermal resistance measuring device, which comprises a testing constant current source, a bit supplementing constant current source, a mutual exclusion change-over switch group and a plurality of channel circuits;
the test constant current source and the bit supplementing constant current source are mutually connected to the channel circuit through the mutually exclusive change-over switch group;
the channel circuit comprises a working channel circuit and an idle channel circuit, the working channel circuit is powered by the mutually exclusive change-over switch group through the test constant current source, and the idle channel circuit is powered by the bit supplementing constant current source.
Optionally, in the multi-channel thermal resistance measuring device, the mutual exclusion switch group includes a plurality of bidirectional switches;
the bidirectional switch comprises two MOS tubes which are arranged in series.
Optionally, in the multi-channel thermal resistance measuring device, the multi-channel thermal resistance measuring device includes a plurality of the bit-complement constant current sources;
and the bit supplementing constant current source corresponds to the channel circuit.
Optionally, in the multi-channel thermal resistance measuring device, the test constant current source is a voltage-current conversion circuit.
Optionally, in the multi-channel thermal resistance measuring device, the bit compensating constant current source is a voltage/resistance circuit;
the voltage/resistance circuit comprises a voltage supply source and a current limiting resistor connected with the voltage supply source in series.
Optionally, in the multi-channel thermal resistance measuring device, the channel circuit is any one of a two-wire system wiring circuit, a three-wire system wiring circuit and a four-wire system wiring circuit.
Optionally, in the multi-channel thermal resistance measuring device, the number of channel circuits included in the multi-channel thermal resistance measuring device is 2 to 16, including the end point value.
A redundant multichannel thermal resistance measuring device comprising a plurality of multichannel thermal resistance measuring devices as described in any of the preceding claims.
Optionally, in the redundant multi-channel thermal resistance measuring device, the working channel circuits of the multiple multi-channel thermal resistance measuring devices at the same time are different in corresponding thermal resistance to be measured.
A temperature measuring device comprising a multichannel thermal resistance measuring apparatus as claimed in any one of the preceding claims.
The invention provides a multichannel thermal resistance measuring device which comprises a testing constant current source, a bit supplementing constant current source, a mutual exclusion change-over switch group and a plurality of channel circuits, wherein the testing constant current source is connected with the bit supplementing constant current source; the test constant current source and the bit supplementing constant current source are mutually connected to the channel circuit through the mutually exclusive change-over switch group; the channel circuit comprises a working channel circuit and an idle channel circuit, the working channel circuit is powered by the mutually exclusive change-over switch group through the test constant current source, and the idle channel circuit is powered by the bit supplementing constant current source.
The position supplementing constant current source is additionally arranged, the test constant current source and the position supplementing constant current source are mutually and mutually connected through the mutual exclusion switch group, and power is supplied to the channel circuit, namely the measurement channel can only be switched between two states of power supply of the test constant current source or power supply of the position supplementing constant current source, and the test constant current source is used for supplying power to the working channel circuit which is measuring the electrical parameters of the thermal resistor to be measured, so that a measuring result with high accuracy is obtained; for an idle channel circuit which is not measured, various capacitors in the circuit are guaranteed to be in the same electric state as the electric state during formal measurement by using the low-precision constant current power supply, when the idle channel circuit is converted into a working channel circuit, the complementary constant current source is directly switched into the test constant current source through the mutual exclusion switch group, so that the charging and discharging processes of the capacitors in the circuit are avoided, the current flowing through the thermal resistor to be measured is not jumped, the measurement efficiency is greatly improved, and the measurement accuracy is improved. The invention also provides a redundant multichannel thermal resistance measuring device and temperature measuring equipment with the beneficial effects.
Drawings
For a clearer description of embodiments of the invention or of the prior art, the drawings that are used in the description of the embodiments or of the prior art will be briefly described, it being apparent that the drawings in the description below are only some embodiments of the invention, and that other drawings can be obtained from them without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of a multi-channel thermal resistance measuring device according to an embodiment of the present invention;
FIG. 2 is a schematic circuit diagram of a multi-channel thermal resistance measuring device according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of MOS transistors connected in series in one embodiment of the multi-channel thermal resistance measuring device according to the present invention;
FIG. 4 is a schematic circuit diagram of a redundant multichannel thermal resistance measuring device according to an embodiment of the present invention;
FIG. 5 is a schematic diagram of a control circuit of a mutually exclusive switch set according to an embodiment of the multi-channel thermal resistance measuring device of the present invention.
Detailed Description
In order to better understand the aspects of the present invention, the present invention will be described in further detail with reference to the accompanying drawings and detailed description. It will be apparent that the described embodiments are only some, but not all, embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
The invention provides a multi-channel thermal resistance measuring device, a structural schematic diagram of one specific embodiment of which is shown in fig. 1, which is called as a specific embodiment I, and comprises a test constant current source 1, a bit supplementing constant current source 2, a mutual exclusion change-over switch group 3 and a plurality of channel circuits 4;
the test constant current source 1 and the bit supplementing constant current source 2 are mutually exclusive connected to the channel circuit 4 through the mutually exclusive switching switch group 3;
the channel circuit 4 comprises a working channel circuit and an idle channel circuit, the working channel circuit is powered by the mutually exclusive change-over switch group through the test constant current source 1, and the idle channel circuit is powered by the bit supplementing constant current source 2.
It is not difficult to find that the test constant current source 1 in the invention needs to provide current for the electrical signal test process of the thermal resistor, so that the precision requirement is higher, and the complementary constant current source 2 only needs to ensure that the charge and discharge states of the capacitors in the circuit are consistent with those in the formal measurement, so that the current precision requirement is not high, namely the precision requirement of the complementary constant current source 2 is low.
In addition, the multichannel thermal resistance measuring device comprises a plurality of bit supplementing constant current sources 2; the bit-filling constant current source 2 corresponds to the channel circuit 4; namely, each channel circuit 4 corresponds to one bit-supplementing constant current source 2, the bit-supplementing constant current power supply has low requirement and lower cost, and each channel circuit 4 is provided with one bit-supplementing constant current power supply, so that the circuit layout is more flexible, the wiring difficulty is lower, and the application range is wider. Furthermore, the multichannel thermal resistance measuring device only comprises one testing constant current source 1, the testing constant current source 1 has high precision requirement and high cost, and only one production cost is low. In the example shown in fig. 1, each channel circuit 4 corresponds to a test constant current source 1 and a bit compensating constant current source 2, and the selection can be made according to specific situations in actual use.
Further, the test constant current source 1 is a voltage-current conversion circuit, and as an example, the test constant current source 1 provides a constant current of 0.5mA for the voltage-current conversion circuit (the specific current source can be adjusted according to the need). The test constant current source 1 adopts an INA132 integrated differential operational amplifier chip of TI and a REF3212 reference source chip. The maximum accuracy is 0.2%; low quiescent current, about 100 μa.
Still further, the bit-complement constant current source 2 is a voltage/resistance circuit; the voltage/resistance circuit comprises a voltage supply source V3 and a current limiting resistor R3 connected in series with the voltage supply source V3, and the current of the low-precision constant current source is obtained in a voltage/resistance mode, so that the current is not really constant current, but the current close to the constant current source is obtained by connecting a large resistor (namely the current limiting resistor R3 with the resistance far exceeding the resistance of other components in the circuit) in series at the output end of the voltage source. Continuing to connect to the example, the common power supply (such as 24V) in the board card is used, and after a resistor with a certain resistance value (for example, 40K) is connected in series, the external RTD is powered, so that the current flowing through the RTD is about 0.5 mA.
In addition, the channel circuit 4 is any one of a two-wire system wiring circuit, a three-wire system wiring circuit and a four-wire system wiring circuit, and of course, other wiring methods may be selected to connect the thermal resistor to be tested according to actual situations.
The number of the channel circuits 4 included in the multi-channel thermal resistance measuring device is 2 to 16, including any one of the end points, such as 2.0, 5.0 or 16.0, and of course, the number of the channel circuits may also be changed correspondingly according to actual situations.
It should be noted that, in fig. 1, RTD1 refers to the thermal resistance to be measured in the first channel circuit 4, RTDn refers to the thermal resistance to be measured in the nth channel circuit 4, and it is not difficult to see in fig. 1 that the mutually exclusive switch group 3 corresponding to the channel circuit 4 corresponding to RTD1 points to the testing constant current source 1, that is, the channel circuit 4 corresponding to RTD1 is the working channel circuit, and correspondingly, the channel circuit 4 corresponding to RTDn is the idle channel circuit.
Fig. 2 is a circuit configuration diagram of a specific embodiment of the multi-channel thermal resistance measurement device provided in the present application, where I1 and I2 in the drawing are the test constant current sources 1, I3 and I4 are the bit-filling constant current sources 2, and it should be noted that in the embodiment shown in fig. 2, the test constant current sources 1 corresponding to different channel circuits 4 are I1 and I2, but I3 and I4 are different bit-filling constant current sources 2 corresponding to different channel circuits 4.
Taking fig. 2 as an example, the thermal resistance measurement principle is illustrated:
1) In one acquisition period, the MOS switch (i.e. the mutual exclusion switch group 3) is used for switching control, N paths of thermal resistance signals are sequentially connected to a rear-end acquisition circuit, and the current channel signals are acquired by the AD and transmitted to subsequent processing (not shown in the figure).
2) I1 and I2 are two high-precision constant current sources, s0_ A, S0_ B, S0 _0_ C, S0_ D, S0 _0_ E, S0_ F, S0 _0_ G, S3 and S8 are MOS analog switches. 2. When the three-wire system is connected, the I1 and the I2 are controlled by the analog switch to be switched simultaneously, and n paths of thermal resistance signals are sequentially connected. The low-precision constant current I3 is controlled by the switch S3, and is mutually exclusive with the switching of the I1 and the I2, and the I3 is conducted when the I1 and the I2 are not conducted, so that the current flowing through the thermal resistor does not jump, and the charging and discharging time of a channel filter circuit part is reduced.
3) And when the four-wire system is connected, the I2 is disconnected, and the switching of the constant current source I1 and the low-precision constant current source I3 is the same as the two-wire system and the three-wire system.
4) The redundancy switching is realized by controlling the switch by the master-slave signal of the module. When the module is a main module, the switch is normally switched, and n-channel thermal resistance signals are sequentially connected. The switch is completely disconnected when the slave module is started, so that the collection of the master module is not affected.
5) In the figure, the analog switch is connected in series by two MOS tubes, so that a bidirectional switch can be realized, and the influence of a parasitic diode is prevented from causing reverse uncontrollable current when the MOS tube switch is disconnected. The function of the switch S0_C is to prevent the current of the constant current source I1 of the main module from being shunted into the main module when the module is used as a slave by redundancy, and the accuracy of the main module is affected.
6) The switching control of the channel switch is shown in fig. 5, and the MCU controls the 3-8 decoder (138 devices in the figure) to sequentially gate 8 channels. When the master board is the master module, the master-slave signal is at a low level, and is at a high level after not being gated, so that the switching of the switches S3 (corresponding to S3 of FIG. 2), S0 (corresponding to S0_ A, S0_ B, S0_ C, S0 _0_ D, S0 _0_ E, S0_ F, S0 _G) and S8 (corresponding to S8 of FIG. 2) is not affected, and the switching principle controlled by the MCU is that the constant current source I2 is disconnected when the four-wire system is wired, and the S8 (corresponding to S8 of FIG. 2) is disconnected by outputting a low level through the wire system control signal. When the master is the slave, the master-slave signal is high, and goes low after not gate, and all of S3 (corresponding to S3 in fig. 2), S0 (corresponding to s0_ A, S0_ B, S0 _0_ C, S0 _0_ D, S0_ E, S0_ F, S0 _g) and S8 (corresponding to S8 in fig. 2) are turned off.
Taking two-wire system wiring as an example, A, B wires of each channel are respectively connected with two ends of the thermal resistor during wiring, and C and B are short-circuited at the terminal. When the signal of the channel 1 corresponding to the RTD1 is collected, s0_ A, S0_ B, S0 _0_ C, S0_ D, S0_ E, S0 _0_ F, S0 _0_ G, S8 is simultaneously turned on, and the corresponding switch of the channel 2 is turned off. Constant current source currents I1, I2 flow through channel 1 signal acquisition conditioning section, channel 2 s0_ D, S0_ E, S0 _0_ F, S0_g is off, so channel 1 current does not flow through channel 2 s0_ D, S0_ E, S0_ F, S0_g to channel 2. S3 of the channel 1 is disconnected, the low-precision constant current I3 is disconnected, S3 of the channel 2 is conducted, and the low-precision constant current (namely the current of the bit supplementing constant current source 2) flows through a diode and a thermal resistor in the figure to the field in the board. Because the switch s0_ D, S0_e of the channel 2 is turned off, a low-precision constant current does not flow to the channel 1 through the switch s0_ D, S0_e of the channel 2, and the channels do not affect each other.
And for short-circuit and overrange faults, the current flow direction is the same as that of no faults, and the analysis shows that the short-circuit and overrange faults of the channel can not affect other channels. The channel disconnection, grounding, channel power frequency and high-frequency interference analysis are not redundant, and other channel circuits 4 are not affected.
The invention provides a multichannel thermal resistance measuring device, which comprises a test constant current source 1, a bit supplementing constant current source 2, a mutual exclusion change-over switch group 3 and a plurality of channel circuits 4; the test constant current source 1 and the bit supplementing constant current source 2 are mutually exclusive connected to the channel circuit 4 through the mutually exclusive switching switch group 3; the channel circuit 4 comprises a working channel circuit and an idle channel circuit, the working channel circuit is powered by the mutually exclusive change-over switch group through the test constant current source 1, and the idle channel circuit is powered by the bit supplementing constant current source 2. In the application, the position supplementing constant current source 2 is additionally arranged, the test constant current source 1 and the position supplementing constant current source 2 are mutually connected in a mutually exclusive mode through the mutual exclusion switch group, and the channel circuit 4 is powered, namely, the measurement channel can only be switched between two states of power supply of the test constant current source 1 or power supply of the position supplementing constant current source 2, and the test constant current source 1 is used for power supply of a working channel circuit for measuring electrical parameters of a thermal resistor to be measured, so that a measurement result with high accuracy is obtained; for an idle channel circuit which is not measured, various capacitors in the circuit are guaranteed to be in the same electric state as the actual measurement by using the low-precision constant current power supply, when the idle channel circuit is converted into a working channel circuit, the bit supplementing constant current source 2 is directly switched into the test constant current source 1 through the mutual exclusion switch group, so that the charging and discharging processes of the capacitors in the circuit are avoided, the current flowing through the thermal resistor to be measured is not jumped, the measurement efficiency is greatly improved, and the measurement accuracy is improved.
On the basis of the first embodiment, the mutually exclusive switch group 3 is further defined to obtain a second embodiment, and the structural schematic diagram of the second embodiment is the same as that of the first embodiment, and the second embodiment comprises a test constant current source 1, a bit supplementing constant current source 2, the mutually exclusive switch group 3 and a plurality of channel circuits 4;
the test constant current source 1 and the bit supplementing constant current source 2 are mutually exclusive connected to the channel circuit 4 through the mutually exclusive switching switch group 3;
the channel circuit 4 comprises a working channel circuit and an idle channel circuit, the working channel circuit is powered by the mutually exclusive change-over switch group through the test constant current source 1, and the idle channel circuit is powered by the bit supplementing constant current source 2;
the mutual exclusion switch group comprises a plurality of bidirectional switches;
the bidirectional switch comprises two MOS tubes which are arranged in series.
For example, as the MOSFET used as the analog switch, a 2N7002K surface mount N-channel field effect transistor (fet) of ON Semiconductor company is selected, which has ESD protection, HBM mode 2000V, low ON-resistance, vgs=4.5v, and id=200ma of not more than 2.5Ω.
In the circuit in the specific embodiment, two MOS tubes are connected in series to realize a bidirectional switch, so that the possibility that current still flows at the DS end through a parasitic diode of the MOS switch when the MOS switch is disconnected can be completely eliminated, the mutual influence among different channel circuits 4 is avoided, and the working stability and the measurement accuracy of the device are improved.
Fig. 3 is a schematic diagram of a connection mode of two MOS transistors connected in series to form a bidirectional switch, and Q9 and Q75 are two MOS transistors connected in series. Of course, fig. 3 is only one mode, and other connection modes can be selected according to specific situations in actual use, so long as the requirement of the bidirectional switch is met.
The invention also provides a redundant multichannel thermal resistance measuring device, the structural schematic diagram of one specific embodiment of the device is shown in fig. 4, and the device is called as a specific embodiment III, and the redundant multichannel thermal resistance measuring device comprises a plurality of multichannel thermal resistance measuring devices according to any one of the above.
In a preferred embodiment, in the redundant multi-channel thermal resistance measuring device, the plurality of the multi-channel thermal resistance measuring devices are different in thermal resistance to be measured corresponding to the same-time working channel circuit. Because the redundant multichannel thermal resistance measuring device provided by the invention still maintains the capacitance state of the idle channel circuit through the bit supplementing constant current source 2, current jump does not occur, and the capacitor is not required to be electrified or discharged, and because the time of the multichannel thermal resistance measuring device for measuring all channel circuits 4 in one round is far less than the time of the capacitor electrification and discharge in a single channel in normal operation, each channel thermal resistance value can be quickly and accurately acquired in the switching of a master module and a slave module, and the measuring efficiency is improved.
Furthermore, by using two MOS transistors connected in series to realize the bidirectional switch, the mutual influence between different redundancies (namely between different multi-channel thermal resistance measuring devices) can be further avoided.
The modules 1 and 2 in fig. 4 are two redundant multi-channel thermal resistance measuring devices, and the number of the redundant multi-channel thermal resistance measuring devices can be set according to specific situations, taking fig. 4 as an example, taking the module 1 as a slave module and the module 2 as a master module as a representative analysis. The channel switches of the slave modules 1 are all off, and the switches of the master modules 1 are sequentially switched. At the D terminal of each channel, s0_ A, S0_ B, S0 _0_c of the slave module 1 is disconnected and the current of the master module does not flow from the D terminal into the slave module. Also, the current of the master module does not flow from the a, B terminals into the slave module. The current of the main module flows into the auxiliary module from the C terminal and then flows to the field of the auxiliary module through the current resistor, which is equivalent to connecting the same resistor in parallel with the C terminal of the main module to the field, because the C terminal is a collecting common terminal, the collecting precision of the module is not affected. The modules do not affect each other in the redundant configuration.
The invention also provides a temperature measuring device which comprises the multi-channel thermal resistance measuring device. The invention provides a multichannel thermal resistance measuring device, which comprises a test constant current source 1, a bit supplementing constant current source 2, a mutual exclusion change-over switch group 3 and a plurality of channel circuits 4; the test constant current source 1 and the bit supplementing constant current source 2 are mutually exclusive connected to the channel circuit 4 through the mutually exclusive switching switch group 3; the channel circuit 4 comprises a working channel circuit and an idle channel circuit, the working channel circuit is powered by the mutually exclusive change-over switch group through the test constant current source 1, and the idle channel circuit is powered by the bit supplementing constant current source 2. In the application, the position supplementing constant current source 2 is additionally arranged, the test constant current source 1 and the position supplementing constant current source 2 are mutually connected in a mutually exclusive mode through the mutual exclusion switch group, and the channel circuit 4 is powered, namely, the measurement channel can only be switched between two states of power supply of the test constant current source 1 or power supply of the position supplementing constant current source 2, and the test constant current source 1 is used for power supply of a working channel circuit for measuring electrical parameters of a thermal resistor to be measured, so that a measurement result with high accuracy is obtained; for an idle channel circuit which is not measured, various capacitors in the circuit are guaranteed to be in the same electric state as the actual measurement by using the low-precision constant current power supply, when the idle channel circuit is converted into a working channel circuit, the bit supplementing constant current source 2 is directly switched into the test constant current source 1 through the mutual exclusion switch group, so that the charging and discharging processes of the capacitors in the circuit are avoided, the current flowing through the thermal resistor to be measured is not jumped, the measurement efficiency is greatly improved, and the measurement accuracy is improved.
In this specification, each embodiment is described in a progressive manner, and each embodiment is mainly described in a different point from other embodiments, so that the same or similar parts between the embodiments are referred to each other. For the device disclosed in the embodiment, since it corresponds to the method disclosed in the embodiment, the description is relatively simple, and the relevant points refer to the description of the method section.
It should be noted that in this specification, relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
Those of skill would further appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, computer software, or combinations of both, and that the various illustrative elements and steps are described above generally in terms of functionality in order to clearly illustrate the interchangeability of hardware and software. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the solution. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present invention.
The multi-channel thermal resistance measuring device, the redundant multi-channel thermal resistance measuring device and the temperature measuring equipment provided by the invention are described in detail. The principles and embodiments of the present invention have been described herein with reference to specific examples, the description of which is intended only to facilitate an understanding of the method of the present invention and its core ideas. It should be noted that it will be apparent to those skilled in the art that various modifications and adaptations of the invention can be made without departing from the principles of the invention and these modifications and adaptations are intended to be within the scope of the invention as defined in the following claims.
Claims (10)
1. The multichannel thermal resistance measuring device is characterized by comprising a testing constant current source, a bit supplementing constant current source, a mutual exclusion change-over switch group and a plurality of channel circuits;
the test constant current source and the bit supplementing constant current source are mutually connected to the channel circuit through the mutually exclusive change-over switch group;
the channel circuit comprises a working channel circuit and an idle channel circuit, the working channel circuit is powered by the mutually exclusive change-over switch group through the test constant current source, and the idle channel circuit is powered by the bit supplementing constant current source;
for a working channel circuit which is measuring the electrical parameters of the thermal resistor to be measured, the testing constant current source is used for supplying power; for an idle channel circuit which is not measured, the bit-filling constant current source is utilized to ensure that the capacitance in the idle channel circuit is in the same electric state as that in the measurement;
when the idle channel circuit is converted into the working channel circuit, the bit supplementing constant current source is switched into the test constant current source through the mutual exclusion change-over switch group.
2. The multi-channel thermal resistance measurement device of claim 1, wherein the set of mutually exclusive switches comprises a plurality of bi-directional switches;
the bidirectional switch comprises two MOS tubes which are arranged in series.
3. The multi-channel thermal resistance measuring device according to claim 1, wherein the multi-channel thermal resistance measuring device includes a plurality of the bit-complement constant current sources;
and the bit supplementing constant current source corresponds to the channel circuit.
4. The multi-channel thermal resistance measuring device according to claim 1, wherein the test constant current source is a voltage-current conversion circuit.
5. The multi-channel thermal resistance measuring device according to claim 1, wherein the bit-complement constant current source is a voltage/resistance circuit;
the voltage/resistance circuit comprises a voltage supply source and a current limiting resistor connected with the voltage supply source in series.
6. The multi-channel thermal resistance measuring device according to claim 1, wherein the channel circuit is any one of a two-wire wiring circuit, a three-wire wiring circuit, and a four-wire wiring circuit.
7. The multi-channel thermal resistance measuring device of claim 1, wherein the multi-channel thermal resistance measuring device comprises a number of channel circuits ranging from 2 to 16, inclusive.
8. A redundant multichannel thermal resistance measuring device, characterized in that it comprises a plurality of multichannel thermal resistance measuring devices according to any of claims 1 to 7.
9. The redundant multichannel thermal resistance measuring device according to claim 8, wherein the plurality of multichannel thermal resistance measuring devices are different in the thermal resistance to be measured corresponding to the same-time working channel circuit.
10. A temperature measuring device, characterized in that it comprises a multichannel thermal resistance measuring arrangement according to any one of claims 1 to 7.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011600577.8A CN112798149B (en) | 2020-12-29 | 2020-12-29 | Multichannel thermal resistance measuring device and redundant multichannel thermal resistance measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011600577.8A CN112798149B (en) | 2020-12-29 | 2020-12-29 | Multichannel thermal resistance measuring device and redundant multichannel thermal resistance measuring device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN112798149A CN112798149A (en) | 2021-05-14 |
| CN112798149B true CN112798149B (en) | 2024-02-02 |
Family
ID=75805703
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202011600577.8A Active CN112798149B (en) | 2020-12-29 | 2020-12-29 | Multichannel thermal resistance measuring device and redundant multichannel thermal resistance measuring device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN112798149B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117367616A (en) * | 2022-06-30 | 2024-01-09 | 深圳市中兴微电子技术有限公司 | Temperature sensor, temperature sensor packaging method and temperature measuring method |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0979918A (en) * | 1995-09-13 | 1997-03-28 | Tokimec Inc | Method and circuit for measuring temperature using resistance temperature detector |
| JPH1056796A (en) * | 1996-08-09 | 1998-02-24 | Denso Corp | Conduction path switching circuit for electric load |
| JP2007327809A (en) * | 2006-06-07 | 2007-12-20 | Hayashi Denko Kk | Multi-channel temperature measurement circuit |
| JP2008309762A (en) * | 2007-06-18 | 2008-12-25 | Mitsubishi Materials Corp | Detector of liquid level and temperature around thermistor periphery |
| WO2017147947A1 (en) * | 2016-03-04 | 2017-09-08 | 广州时艺音响科技有限公司 | High power field effect transistor complementary output circuit having no source resistance |
-
2020
- 2020-12-29 CN CN202011600577.8A patent/CN112798149B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0979918A (en) * | 1995-09-13 | 1997-03-28 | Tokimec Inc | Method and circuit for measuring temperature using resistance temperature detector |
| JPH1056796A (en) * | 1996-08-09 | 1998-02-24 | Denso Corp | Conduction path switching circuit for electric load |
| JP2007327809A (en) * | 2006-06-07 | 2007-12-20 | Hayashi Denko Kk | Multi-channel temperature measurement circuit |
| JP2008309762A (en) * | 2007-06-18 | 2008-12-25 | Mitsubishi Materials Corp | Detector of liquid level and temperature around thermistor periphery |
| WO2017147947A1 (en) * | 2016-03-04 | 2017-09-08 | 广州时艺音响科技有限公司 | High power field effect transistor complementary output circuit having no source resistance |
Also Published As
| Publication number | Publication date |
|---|---|
| CN112798149A (en) | 2021-05-14 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN104865515B (en) | A kind of multichannel integrated operational amplifier performance parameter Online Transaction Processing | |
| JP4915658B2 (en) | Storage cell terminal voltage and internal impedance measurement circuit | |
| CN111256862B (en) | High-precision self-calibration intelligent temperature acquisition and control circuit | |
| CN108139443A (en) | Test system | |
| JP2007514148A5 (en) | ||
| CN112798149B (en) | Multichannel thermal resistance measuring device and redundant multichannel thermal resistance measuring device | |
| US20150055264A1 (en) | Current-limiting circuit and apparatus | |
| CN112083309B (en) | Intelligent test system and method for memory plate | |
| CN222189426U (en) | Multi-channel current test device | |
| CN103698578A (en) | Power output control method of automatic electric power meter reading system and automatic electric power meter reading system | |
| CN112187050A (en) | Precise low-cost programmable power supply module for test equipment | |
| CN211085507U (en) | Single ADC multichannel temperature monitoring circuit controlled by GPIO | |
| CN220064275U (en) | Transconductance parameter test circuit and test system | |
| CN109142871B (en) | Linear voltage-stabilized power supply alternating current output impedance test circuit and method | |
| CN107492929B (en) | Charging circuit provided with current protection circuit | |
| CN108572273B (en) | Low current measuring circuit and measuring method thereof | |
| CN111123073B (en) | Quick self-checking device of hardware board card | |
| CN214041542U (en) | Constant current circuit for direct current resistance tester | |
| CN108318751B (en) | Board card for instrument test | |
| CN114295962A (en) | Power chip test system | |
| CN219574293U (en) | Interelectrode voltage test circuit and test system | |
| CN222545490U (en) | Calibration circuit of precise measurement unit | |
| CN119088158B (en) | Digital programmable power supply suitable for embedded integrated circuit testing and power supply testing method | |
| CN116318049B (en) | High-precision resistor circuit | |
| CN221595167U (en) | A test device and test system for four functional pin optocouplers |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |