CN112748266A - Double-end probe and probe tool - Google Patents
Double-end probe and probe tool Download PDFInfo
- Publication number
- CN112748266A CN112748266A CN202011531720.2A CN202011531720A CN112748266A CN 112748266 A CN112748266 A CN 112748266A CN 202011531720 A CN202011531720 A CN 202011531720A CN 112748266 A CN112748266 A CN 112748266A
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- 239000000523 sample Substances 0.000 title claims abstract description 85
- 238000000576 coating method Methods 0.000 claims abstract description 73
- 239000011248 coating agent Substances 0.000 claims abstract description 68
- 239000007769 metal material Substances 0.000 claims description 4
- 229920000642 polymer Polymers 0.000 claims description 3
- 230000009977 dual effect Effects 0.000 claims 3
- 238000012360 testing method Methods 0.000 abstract description 30
- 239000000463 material Substances 0.000 abstract description 12
- 238000000034 method Methods 0.000 abstract description 5
- 238000009413 insulation Methods 0.000 description 9
- 238000007747 plating Methods 0.000 description 8
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 6
- 230000002035 prolonged effect Effects 0.000 description 5
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 3
- 229910052737 gold Inorganic materials 0.000 description 3
- 239000010931 gold Substances 0.000 description 3
- 229910052759 nickel Inorganic materials 0.000 description 3
- 229910052703 rhodium Inorganic materials 0.000 description 3
- 239000010948 rhodium Substances 0.000 description 3
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 description 3
- 230000007547 defect Effects 0.000 description 2
- 239000010410 layer Substances 0.000 description 2
- 239000002699 waste material Substances 0.000 description 2
- 238000005299 abrasion Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000002146 bilateral effect Effects 0.000 description 1
- 239000011247 coating layer Substances 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
The invention provides a double-ended probe, which comprises a main body, wherein the main body comprises a connecting part, a first protruding part and a second protruding part, the first protruding part and the second protruding part are respectively arranged at two ends of the connecting part, an insulating coating is arranged on the outer surface of the connecting part, the first protruding part and the second protruding part are exposed outside the insulating coating, the insulating coating has a certain thickness, the insulating coating forms a first annular cross section and a second annular cross section on the connecting part, the first annular cross section is close to the first protruding part, the distance between the end part of the first protruding part and the first annular cross section is a first distance, the second annular cross section is close to the second protruding part, the distance between the end part of the second protruding part and the second annular cross section is a second distance, and the lengths of the first distance and the second distance are the same. The invention provides a probe jig which comprises a jig body and the double-ended probe, wherein the jig body is used for fixing the double-ended probe. The method has the effects of prolonging the service life of the probe, saving probe materials and reducing test cost.
Description
Technical Field
The invention belongs to the technical field of electronic equipment testing, and particularly relates to a double-ended probe and a probe jig.
Background
In the field of testing of electronic equipment integrated circuits, one end of a probe needs to be fixed on a jig, the jig is controlled to enable the other end of the probe to be in contact with the integrated circuit for multiple times, the probe is more and more in contact with the integrated circuit along with testing, one end of the probe used for testing is seriously abraded, and the service life of the probe is prolonged after one probe is generally subjected to testing contact for 100 ten thousand times. When the service life of the probe is reached, because one end used for testing is frequently used and worn, one end used for fixing is not subjected to excessive friction with a fixed jig, so the wear is not serious, the end used for testing of the probe is usually worn to a scrapped state, but one end used for fixing can be normally used, only one end of the replaced probe is actually scrapped, but only one end of the probe is forced to be used for testing, only through the method of replacing the probe, the test can be continuously carried out, the material waste is caused, the material cost is increased, and the maintenance and test efficiency is low.
Disclosure of Invention
The invention aims to overcome the defects in the prior art, provides a double-ended probe and a probe jig, solves the problem that only one end of the probe in the prior art can be used for testing and cannot be fully utilized for testing, and overcomes the defects of probe material waste and high testing cost.
In a first aspect, the present invention provides a dual-headed probe including a body including a connection portion, a first protrusion portion and a second protrusion portion, the first protruding part and the second protruding part are respectively arranged at two ends of the connecting part, the outer surface of the connecting part is provided with an insulating coating, the first and second protrusions are exposed outside of the insulating coating, the insulating coating has a thickness, the insulating coating forming a first annular cross-section and a second annular cross-section on the connection portion, the first annular cross-section being proximate the first protrusion, the distance between the end of the first projection and the first annular cross-section is a first distance, the second annular cross-section is proximate to the second projection, the distance between the end of the second protrusion and the second annular cross-section is a second distance, and the first distance is the same as the second distance in length.
Further, the insulating coating comprises a first thickness insulating coating and a second thickness insulating coating, the first thickness insulating coating forms a first annular cross section and a second annular cross section on the connecting portion, the second thickness insulating coating forms a third annular cross section and a fourth annular cross section on the first thickness insulating coating, the third annular cross section is close to the first annular cross section, the distance between the third annular cross section and the first annular cross section is a third distance, the fourth annular cross section is close to the second annular cross section, the distance between the fourth annular cross section and the second annular cross section is a fourth distance, and the third distance is as long as the fourth distance.
Further, the first projection end is one of rounded, pointed, or flattened in shape, and the second projection end is one of rounded, pointed, or flattened in shape.
Further, the length range of the first distance is between 1 and 5mm, and correspondingly, the length range of the second distance is also between 1 and 5 mm.
Further, the length of the first distance is 3mm, and the length of the second distance is 3 mm.
Further, the length range of the third distance is between 5 and 10mm, and correspondingly, the length range of the fourth distance is also between 5 and 10 mm.
Further, the length of the first distance is 8mm, and the length of the second distance is 8 mm.
Further, the material of the insulating coating is a polymer with soft property.
Further, the body is made of a metal material.
In a second aspect, the invention provides a probe fixture, which comprises a fixture body and the above-mentioned double-ended probe, wherein the fixture body is used for fixing the double-ended probe.
The invention has the beneficial effects that:
1. the invention provides a double-end probe, wherein a first protruding part and a second protruding part are exposed outside an insulating coating, the distance between the end part of the first protruding part and the first annular cross section is the same as the distance between the end part of the second protruding part and the second annular cross section, when the first protruding part for testing is worn to reach a scrapped state, the double-end probe can be directly installed in a turning mode, the first protruding part which is seriously worn is reversely used for fixing, and the second protruding part which is not seriously worn is reversely used for testing, so that the maximum utilization rate of a probe material is reached, the service life of the probe is prolonged, the probe material is saved, and the testing cost is reduced.
2. The probe provided by the invention is provided with two layers of insulating coatings, namely a first thickness insulating coating and a second thickness insulating coating, wherein the first thickness insulating coating forms a first annular section and a second annular section, the second thickness insulating coating forms a third annular section and a fourth annular section, and the third annular section and the fourth annular section play a role in collision and limiting in the test process, so that the test propelling distance of the first protruding part and the second protruding part is facilitated.
Drawings
The invention is further illustrated by means of the attached drawings, but the embodiments in the drawings do not constitute any limitation to the invention, and for a person skilled in the art, other drawings can be obtained on the basis of the following drawings without inventive effort.
FIG. 1 is a central sectional view of the overall structure of a double-ended probe according to example 1, in the state where only one insulating coating layer is provided.
FIG. 2 is a central sectional view of the overall structure of a double-ended probe according to example 1 in a state where two insulating coatings are provided.
Detailed Description
The technical solutions of the present invention will be described clearly and completely with reference to the accompanying drawings, and it should be understood that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc., indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplicity of description, but do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
Example 1:
referring to fig. 1, embodiment 1 provides a double-ended probe, which includes a main body made of a metal material, and the main body is configured to ensure electrical conductivity, and may be in a straight needle shape, a needle shape with a bent angle, or a needle shape with a circular arc, and the shape may be determined according to actual needs. The main body comprises a connecting part 10, a first protruding part 11 and a second protruding part 12, the first protruding part 11 and the second protruding part 12 are respectively arranged at two ends of the connecting part 10, the first protruding part 11 and the second protruding part 12 are respectively in smooth transition connection with the connecting part 10, an insulating coating 2 is arranged on the outer surface of the connecting part 10, the first protruding part 11 and the second protruding part 12 are exposed outside the insulating coating 2, the insulating coating 2 is not arranged on the outer surfaces of the first protruding part 11 and the second protruding part 12, and the electrical conductivity of the two ends is ensured; the insulating coating 2 has a thickness that forms a height difference on the body, the insulating coating 2 forms a first annular section 31 and a second annular section 32 on the connecting portion 10, the first annular section 31 and the second annular section 32 each have a diameter larger than that of the body when viewed in a cross section, the first annular section 31 is adjacent to the first protruding portion 11, and the second annular section 32 is adjacent to the second protruding portion 12, so that the first protruding portion 11, the first annular section 31, the second annular section 32, and the second protruding portion 12 are sequentially arranged on the body, wherein a distance between an end of the first protruding portion 11 and the first annular section 31 is a first distance 41, a distance between an end of the second protruding portion 12 and the second annular section 32 is a second distance 42, and the first distance 41 and the second distance 42 have the same length.
In the first mounting state, the first protruding portion 11 of the double-ended probe is used for testing, the second protruding portion 12 is used for fixing, and as the number of times of use is increased, the first protruding portion 11 is worn more and more, but because the fixing between the second protruding portion 12 and the jig body is firmer, the degree of wear of the second protruding portion 12 is much smaller than that of the first protruding portion 11, and therefore, when the service life of the first protruding portion 11 is reached, the degree of wear of the second protruding portion 12 is also small; due to the bilateral symmetry of the main body, the first distance 41 and the second distance 42 have the same length, and at this time, the double-ended probe can be switched to a second installation state, that is, the first protrusion 11 with serious wear is used for fixing, and the second protrusion 12 with no serious wear is used for testing, and in addition, the first protrusion 11 and the second protrusion 12 not only have the first distance 41 and the second distance 42 with the same length, but also have the same structural feature for fixing, and under the condition that the testing is not affected, the structural feature can be arranged on the main body part corresponding to the first distance 41 and the second distance 42. The service life of the first protruding part 11 at one end is 100 ten thousand times, and by the mode, the service life of one probe can be prolonged to more than 150 ten thousand times by taking the initial abrasion of the second protruding part 12 during fixing into consideration, so that the maximum utilization rate of probe materials is greatly improved, the service life of the probe is prolonged, the probe materials are saved, and the test cost is reduced.
Referring to fig. 2, as a preferred mode, the insulating coating 2 includes a first thickness insulating coating 21 and a second thickness insulating coating 22, the first thickness insulating coating 21 forms a first annular section 31 and a second annular section 32 on the connection portion 10, the second thickness insulating coating 22 forms a third annular section 33 and a fourth annular section 34 on the first thickness insulating coating 21, the third annular section 33 is close to the first annular section 31, the distance between the third annular section 33 and the first annular section 31 is a third distance 43, the fourth annular section 34 is close to the second annular section 32, the distance between the fourth annular section 34 and the second annular section 32 is a fourth distance 44, and the third distance 43 and the fourth distance 44 are the same in length.
It should be noted that, a first thickness insulation coating 21 is laid on the main body, and then a second thickness insulation coating 22 is laid on the first thickness insulation coating 21, by this way of overlapping, the first thickness insulation coating 21 forms a first annular section 31 and a second annular section 32 on the connecting portion 10, the second thickness insulation coating 22 forms a third annular section 33 and a fourth annular section 34 on the first thickness insulation coating 21, the diameters of the third annular section 33 and the fourth annular section 34 are larger than the diameters of the first annular section 31 and the second annular section 32, therefore, on the main body, the first protrusion 11, the first annular section 31, the third annular section 33, the fourth annular section 34, the second annular section 32, and the second protrusion 12 are arranged in sequence, wherein, the insulation coating 2 inside the first annular section 31 and the second annular section 32 mainly plays an insulation role, the insulating coating 21 with the first thickness covers the main body in a large range, the first protruding part 11 and the second protruding part 12 are used as exposed parts, the exposed length is reduced to the minimum, the phenomena of discharge short circuit and the like cannot occur when a plurality of probes are tested side by side, and the probes are protected from being ignited; the third annular section 33 and the fourth annular section 34 respectively form a limiting step on the main body, and the limiting steps play a role in limiting collision, so that the test of the first protruding part 11 and the second protruding part 12 is facilitated; and if the test is not needed at a certain measuring point, the probes can be fixed on the jig body, and the phenomena of discharge and the like can not occur due to the high insulation reliability between the adjacent probes, namely, the jig and the probes are not needed to be adjusted, so that the adaptability is strong.
As a preferable mode, the shape of the end of the first protrusion 11 is one of a round head shape, a pointed head shape and a flat head shape, and similarly, the shape of the end of the second protrusion 12 is one of a round head shape, a pointed head shape and a flat head shape, and this configuration is according to actual needs, and this configuration may be various configurations without departing from the inventive concept of the present invention.
Referring to FIG. 1, as an embodiment, the first distance 41 is between 1 and 5mm in length, and correspondingly, the second distance 42 is between 1 and 5mm in length. Preferably, the first distance 41 is 3mm in length and the second distance 42 is 3mm in length. In the case of only one insulating coating 2, it is suitable to use this length, which is distinguished from the prior art design in which one end is exposed to 3mm and the other end is exposed to 2mm, and in this embodiment, the lengths of the first distance 41 and the second distance 42 are both 3mm, providing an interchangeable structural condition.
Referring to fig. 2, as an embodiment, in the case of two insulating coatings 2, the length of the third distance 43 ranges from 5 to 10mm, and correspondingly, the length of the fourth distance 44 also ranges from 5 to 10 mm. Preferably, the first distance 41 is 8mm in length and the second distance 42 is 8mm in length. In addition, the first distance 41 is between 0.05 mm and 0.5mm in length, and correspondingly, the second distance 42 is between 0.05 mm and 0.5mm in length. Preferably, the first distance 41 is 0.3mm in length and the second distance 42 is 0.3mm in length.
Of course, the lengths of the first distance 41, the second distance 42, the third distance 43 and the fourth distance 44 can be adjusted accordingly according to actual needs.
In this embodiment, the material of the insulating coating 2 is a polymer having a soft property; the main body is made of metal materials, and the main body 1 can be subjected to gold plating, nickel plating or rhodium plating to enhance the strength, hardness and wear resistance.
Example 2:
the complete manufacturing process for the double-head probe can be carried out according to the following steps:
straightening the probe bar, and cutting out a bar with a proper length;
grinding two ends of the bar into a specified shape, and checking the overall appearance and shape of the probe;
plating nickel and then plating gold or plating rhodium on the whole probe;
coating an insulating coating of the probe body;
and finally, checking the manufacturing condition and finishing production.
Example 3:
the complete manufacturing process for the double-coated probe can be carried out according to the following steps:
straightening the probe bar, and cutting out a bar with a proper length;
grinding two ends of the bar into a specified shape, and checking the overall appearance and shape of the probe;
coating an insulating coating of the probe body;
aiming at the exposed part of the probe, firstly plating nickel, and then plating gold or rhodium;
and finally, checking the manufacturing condition and finishing production.
In the case of two insulating coatings, in the process of coating the insulating coating 2, the insulating coating 21 with the first thickness may be coated on the needle body, and then the insulating coating 22 with the second thickness may be coated on the insulating coating 21 with the first thickness; it is also possible to first apply the first thickness of insulating coating 21 to both ends of the probe and then apply the second thickness of insulating coating 22 to the middle of the probe body. The above two modes can be interchanged.
Example 4:
this embodiment 4 provides a probe tool, including the double-end probe in tool body and embodiment 1, the tool body is used for fixed double-end probe, and the both ends of double-end probe all can be fixed in the tool body.
Compared with the prior art, the invention provides a double-ended probe, wherein the first protruding part 11 and the second protruding part 12 are exposed outside the insulating coating 2, the distance between the end part of the first protruding part 11 and the first annular section 31 is the same as the distance between the end part of the second protruding part 12 and the second annular section 32, when the first protruding part 11 for testing is worn to a scrapped state, the double-ended probe can be directly installed in a turning mode, the first protruding part 11 which is seriously worn is reversely used for fixing, and the second protruding part 12 which is not seriously worn is reversely used for testing, so that the maximum utilization rate of probe materials is achieved, the service life of the probe is prolonged, the probe materials are saved, and the testing cost is reduced.
The probe provided by the invention is provided with two layers of insulating coatings 2, namely a first thickness insulating coating 21 and a second thickness insulating coating 22, wherein the first thickness insulating coating 21 forms a first annular section 31 and a second annular section 32, the second thickness insulating coating 22 forms a third annular section 33 and a fourth annular section 34, and the third annular section 33 and the fourth annular section 34 play a role in collision and limitation in the test process, so that the test advancing distance of the first protruding part 11 and the second protruding part 12 is facilitated.
Finally, it should be emphasized that the present invention is not limited to the above-described embodiments, but only the preferred embodiments of the invention have been described above, and the present invention is not limited to the above-described embodiments, and any modifications, equivalent substitutions, improvements, etc. within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (10)
1. A double-ended probe comprising a body, the body comprising a connecting portion, a first protrusion portion and a second protrusion portion, the first protruding part and the second protruding part are respectively arranged at two ends of the connecting part, the outer surface of the connecting part is provided with an insulating coating, the first and second protrusions are exposed outside of the insulating coating, the insulating coating has a thickness, the insulating coating forming a first annular cross-section and a second annular cross-section on the connection portion, the first annular cross-section being proximate the first protrusion, the distance between the end of the first projection and the first annular cross-section is a first distance, the second annular cross-section is proximate to the second projection, the distance between the end of the second protrusion and the second annular cross-section is a second distance, and the first distance is the same as the second distance in length.
2. The double-ended probe of claim 2, wherein the insulating coating comprises a first thickness insulating coating and a second thickness insulating coating, the first thickness insulating coating forming a first annular cross-section and a second annular cross-section on the connection portion, the second thickness insulating coating forming a third annular cross-section and a fourth annular cross-section on the first thickness insulating coating, the third annular cross-section being proximate to the first annular cross-section, a distance between the third annular cross-section and the first annular cross-section being a third distance, the fourth annular cross-section being proximate to the second annular cross-section, a distance between the fourth annular cross-section and the second annular cross-section being a fourth distance, the third distance being the same length as the fourth distance.
3. A double-ended probe according to claim 1 or 2, wherein said first lug end is one of round, pointed or flat in shape and said second lug end is one of round, pointed or flat in shape.
4. The double-ended probe according to claim 3, wherein said first distance has a length in the range of 1-5 mm, and correspondingly said second distance has a length in the range of 1-5 mm.
5. The dual head probe of claim 4, wherein the first distance is 3mm in length and the second distance is 3mm in length.
6. A double-ended probe according to claim 4 or 5, wherein said third distance has a length in the range of 5-10 mm, and correspondingly said fourth distance has a length in the range of 5-10 mm.
7. The dual head probe of claim 6, wherein the first distance is 8mm in length and the second distance is 8mm in length.
8. The dual-headed probe of claim 7 wherein the insulating coating is a polymer having soft properties.
9. The dual head probe of claim 8, wherein the body is made of a metallic material.
10. A probe jig comprising a jig body for fixing the double-ended probe and the double-ended probe according to any one of claims 1 to 9.
Priority Applications (1)
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CN202011531720.2A CN112748266A (en) | 2020-12-22 | 2020-12-22 | Double-end probe and probe tool |
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CN202011531720.2A CN112748266A (en) | 2020-12-22 | 2020-12-22 | Double-end probe and probe tool |
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CN202011531720.2A Pending CN112748266A (en) | 2020-12-22 | 2020-12-22 | Double-end probe and probe tool |
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Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007033363A (en) * | 2005-07-29 | 2007-02-08 | Hioki Ee Corp | Probe, probe unit, and circuit board inspection device |
KR20120135048A (en) * | 2011-06-03 | 2012-12-12 | 히오끼 덴끼 가부시끼가이샤 | Probe unit, circuit board inspection apparatus and method for manufacturing probe unit |
CN203772908U (en) * | 2014-04-11 | 2014-08-13 | 东莞市连威电子有限公司 | Insulated metal probe |
CN110068711A (en) * | 2018-01-24 | 2019-07-30 | 中华精测科技股份有限公司 | Probe card device and rectangular probe |
CN214252386U (en) * | 2020-12-22 | 2021-09-21 | 珠海拓优电子有限公司 | Double-end probe and probe tool |
-
2020
- 2020-12-22 CN CN202011531720.2A patent/CN112748266A/en active Pending
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007033363A (en) * | 2005-07-29 | 2007-02-08 | Hioki Ee Corp | Probe, probe unit, and circuit board inspection device |
KR20120135048A (en) * | 2011-06-03 | 2012-12-12 | 히오끼 덴끼 가부시끼가이샤 | Probe unit, circuit board inspection apparatus and method for manufacturing probe unit |
CN203772908U (en) * | 2014-04-11 | 2014-08-13 | 东莞市连威电子有限公司 | Insulated metal probe |
CN110068711A (en) * | 2018-01-24 | 2019-07-30 | 中华精测科技股份有限公司 | Probe card device and rectangular probe |
CN214252386U (en) * | 2020-12-22 | 2021-09-21 | 珠海拓优电子有限公司 | Double-end probe and probe tool |
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