CN112729587A - Temperature detection circuit, refrigerator and temperature detection method - Google Patents
Temperature detection circuit, refrigerator and temperature detection method Download PDFInfo
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- CN112729587A CN112729587A CN202011473340.8A CN202011473340A CN112729587A CN 112729587 A CN112729587 A CN 112729587A CN 202011473340 A CN202011473340 A CN 202011473340A CN 112729587 A CN112729587 A CN 112729587A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/22—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor
- G01K7/24—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor in a specially-adapted circuit, e.g. bridge circuit
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F25—REFRIGERATION OR COOLING; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS; MANUFACTURE OR STORAGE OF ICE; LIQUEFACTION SOLIDIFICATION OF GASES
- F25D—REFRIGERATORS; COLD ROOMS; ICE-BOXES; COOLING OR FREEZING APPARATUS NOT OTHERWISE PROVIDED FOR
- F25D11/00—Self-contained movable devices, e.g. domestic refrigerators
- F25D11/02—Self-contained movable devices, e.g. domestic refrigerators with cooling compartments at different temperatures
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F25—REFRIGERATION OR COOLING; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS; MANUFACTURE OR STORAGE OF ICE; LIQUEFACTION SOLIDIFICATION OF GASES
- F25D—REFRIGERATORS; COLD ROOMS; ICE-BOXES; COOLING OR FREEZING APPARATUS NOT OTHERWISE PROVIDED FOR
- F25D29/00—Arrangement or mounting of control or safety devices
- F25D29/003—Arrangement or mounting of control or safety devices for movable devices
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F25—REFRIGERATION OR COOLING; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS; MANUFACTURE OR STORAGE OF ICE; LIQUEFACTION SOLIDIFICATION OF GASES
- F25D—REFRIGERATORS; COLD ROOMS; ICE-BOXES; COOLING OR FREEZING APPARATUS NOT OTHERWISE PROVIDED FOR
- F25D2700/00—Means for sensing or measuring; Sensors therefor
- F25D2700/12—Sensors measuring the inside temperature
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Abstract
The application relates to a temperature detection circuit, a refrigerator and a temperature detection method. The temperature detection circuit comprises a thermistor temperature sensor, a sampling circuit and a main control circuit which are connected in sequence; the thermistor temperature sensor is arranged on an object to be detected when in use; the sampling circuit comprises a sampling unit and a voltage division unit; the main control circuit is used for determining the temperature of the object to be detected by acquiring the voltage value of the sampling unit; the voltage division unit is used for dividing voltage so that the variation of the voltage value of the sampling unit is increased when the variation of the temperature of the object to be detected is the same under the preset condition. That is, according to different preset conditions, through corresponding the partial pressure unit that sets up in order to realize different partial pressures to make when carrying out temperature detection, the collection precision under the preset condition increases, and owing to need not change and use AD conversion chip or the high accuracy digital temperature sensor more than 12, consequently can not lead to the obvious increase of cost and occupy the increase to the operation resource of main chip.
Description
Technical Field
The application relates to the technical field of temperature detection, in particular to a temperature detection circuit, a refrigerator and a temperature detection method.
Background
An electrically controlled refrigerator generally controls the temperature by collecting the temperatures of a refrigerating chamber, a freezing chamber, a temperature-changing chamber and a defrosting heater, and comparing the temperatures with set expected values to start and stop a compressor, a fan, a damper and the heater. The temperature of the refrigerator is slow in response time of rising or falling of the temperature, so that the temperature acquisition precision of a refrigerator sensor in the industry is generally 0.5 degree. However, in some test occasions, such as storage temperature tests, the temperature difference of the freezing chamber before and after defrosting cannot exceed 3K, and the requirement of the test standard cannot be met through shifting 1 degree in the experimental process, so that the control precision of the room temperature needs to be further improved. Common methods for improving the temperature acquisition precision include using an AD conversion chip with more than 12 bits, using a high-precision digital temperature sensor, and the like, but these schemes often bring about a significant increase in cost, and increase in the occupation of operating resources of a main chip.
Disclosure of Invention
The application provides a temperature detection circuit, a refrigerator and a temperature detection method, which aim to solve the problems that the cost is obviously increased when the acquisition precision is increased in the current temperature acquisition scheme, and the occupation of the running resources of a main chip is increased.
The above object of the present application is achieved by the following technical solutions:
in a first aspect, an embodiment of the present application provides a temperature detection circuit, including: the thermistor temperature sensor, the sampling circuit and the master control circuit are connected in sequence; wherein,
the thermistor temperature sensor is arranged on an object to be detected when in use;
the sampling circuit comprises a sampling unit and a voltage division unit;
the main control circuit is used for determining the temperature of the object to be detected by acquiring the voltage value of the sampling unit;
the voltage dividing unit is used for dividing voltage so that the variation of the voltage value of the sampling unit is increased when the variation of the temperature of the object to be detected is the same under the preset condition.
Optionally, the preset condition is that the temperature of the object to be detected is within a preset temperature range.
Optionally, the sampling unit is a precision resistor, a first end of the precision resistor is connected to the thermistor temperature sensor, and a second end of the precision resistor is connected to the main control circuit.
Optionally, the voltage dividing unit is a pull-down resistor, one end of the pull-down resistor is connected with the first end of the precision resistor, and the other end of the pull-down resistor is grounded.
Optionally, different preset temperature ranges are obtained by changing the resistance value of the pull-down resistor.
Optionally, the filter further includes a filter capacitor connected in parallel with the pull-down resistor.
In a second aspect, an embodiment of the present application further provides a refrigerator, which is provided with the temperature detection circuit of any one of the first aspects.
Optionally, the thermistor temperature sensors, the sampling unit and the voltage dividing unit are all multiple and equal in number;
each thermistor temperature sensor is respectively arranged in different compartments of the refrigerator and on an evaporator of the refrigerator.
In a third aspect, an embodiment of the present application further provides a temperature detection method applied to the temperature detection circuit described in any one of the first aspects, where the master control circuit includes a master chip supporting AD conversion, and the method is performed by the master chip, and the method includes:
performing AD sampling at preset time intervals until the sampling times reach preset times;
calculating the average value of the AD samples of the preset times;
and determining the temperature of the object to be detected based on the average value.
Optionally, the main chip is a 10-bit AD conversion chip;
every interval preset time, carry out AD sampling, until the number of times of sampling reaches the preset number of times, calculate the average value of the AD sampling of the preset number of times, include:
performing AD sampling once every preset time interval, and accumulating AD sampling values; the value of the AD sample obtained by accumulation is stored in a first variable, an overflow value is stored in a second variable, the first variable is a 16-bit variable, and the second variable is an 8-bit variable;
shifting the second variable and the first variable to the left by one bit until the sampling times reach the preset times;
assigning the sum of the overflow value of the first variable after being shifted by one bit from the left and the second variable after being shifted by one bit from the left to the second variable again;
assigning the re-assigned value of the second variable to the high 8 bits of the third variable, and assigning the high 8 bits of the first variable shifted left by one bit to the low 8 bits of the third variable; the third variable is a 16-bit variable;
taking the obtained third variable as the average value.
Optionally, the temperature detection circuit is disposed in the refrigerator, and the method further includes:
and controlling the refrigerator based on the temperature of the object to be detected.
The technical scheme provided by the embodiment of the application can have the following beneficial effects:
the embodiment of the application provides an among the temperature detection circuitry, including the thermistor temperature sensor who connects gradually, sampling circuit and master control circuit, wherein thermistor temperature sensor sets up in waiting to detect the object when using, sampling circuit includes sampling unit and voltage division unit, master control circuit is used for confirming the temperature of waiting to detect the object through the voltage value who acquires the sampling unit, voltage division unit is used for through the partial pressure so that under the preset condition, the variation of waiting to detect the temperature of object is the same, the variation increase of voltage value of sampling unit. That is, according to different preset conditions, through corresponding the partial pressure unit that sets up in order to realize different partial pressures to make when carrying out temperature detection, the collection precision under the preset condition increases, and owing to need not change and use AD conversion chip or the high accuracy digital temperature sensor more than 12, consequently can not lead to the obvious increase of cost and occupy the increase to the operation resource of main chip.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the application.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present application and together with the description, serve to explain the principles of the application.
Fig. 1 is a schematic structural diagram of a temperature detection circuit according to an embodiment of the present disclosure;
fig. 2 is a schematic circuit diagram of a temperature detection circuit according to an embodiment of the present disclosure;
fig. 3 is a schematic flow chart of a temperature detection method according to an embodiment of the present disclosure.
Detailed Description
Reference will now be made in detail to the exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, like numbers in different drawings represent the same or similar elements unless otherwise indicated. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present application. Rather, they are merely examples of apparatus and methods consistent with certain aspects of the present application, as detailed in the appended claims.
In order to solve the problems that the cost is increased and the occupation of the operating resources of a main chip is increased when the acquisition precision is increased in a temperature acquisition scheme in the related art, the application provides an improved temperature detection circuit, a refrigerator applying the temperature detection circuit and a temperature detection method. The following examples are given for the purpose of illustration.
Examples
Referring to fig. 1, fig. 1 is a schematic structural diagram of a temperature detection circuit according to an embodiment of the present disclosure. As shown in fig. 1, the temperature detection circuit includes: the temperature sensor comprises a thermistor temperature sensor 1, a sampling circuit 2 and a main control circuit 3 which are connected in sequence; wherein,
the thermistor temperature sensor 1 is arranged on an object to be detected when in use;
the sampling circuit 2 includes a sampling unit 21 and a voltage dividing unit 22;
the main control circuit 3 is used for determining the temperature of the object to be detected by acquiring the voltage value of the sampling unit 21;
the voltage dividing unit 22 is configured to divide the voltage so that the variation of the voltage value of the sampling unit 21 is increased when the variation of the temperature of the object to be detected is the same under the preset condition.
Specifically, the thermistor Temperature sensor measures Temperature using the principle that the resistance value of a conductor or a semiconductor changes with a change in Temperature, and in the present embodiment, the thermistor is preferably an NTC (Negative Temperature Coefficient) resistor. When the input voltage of the circuit is known, the current temperature of the object to be detected can be determined by collecting the voltage value of the sampling unit 21 and by using a corresponding table (provided by a manufacturer, for example) of the voltage value and the temperature.
However, since the resistance of the thermistor varies non-linearly with the temperature, that is, the variation of the resistance varies within different temperature ranges when the temperature variation is the same, the variation of the voltage value of the sampling unit 21 acquired by the main control circuit 3 varies within different temperature ranges when the temperature variation is the same, that is, the sampling accuracy varies, which may result in that the sampling accuracy cannot meet the requirement in a specific scene. Based on this, the sampling circuit 2 of the embodiment further includes a voltage dividing unit 22, and after voltage division is performed by the voltage dividing unit 22, the variation of the voltage value of the sampling unit 21 is increased when the variation of the temperature of the object to be detected is the same under the preset condition (i.e., under the aforementioned specific scene), i.e., the sampling precision under the preset condition is increased, so as to meet the requirement.
In some embodiments, the preset condition is that the temperature of the object to be detected is within a preset temperature range, that is, in this embodiment, the purpose is to improve the temperature acquisition precision when the temperature of the object to be detected is within a specific temperature range. The preset temperature range may be determined according to actual requirements, for example, when the temperature of the object to be detected needs to be acquired for a long time (regularly or irregularly) in a scene to which the scheme of this embodiment is applied, the preset temperature range may be determined according to a temperature range in which the object to be detected normally works for a long time (that is, a temperature range in which the corresponding thermistor temperature sensor 1 works for a long time). Taking an electrically controlled refrigerator mentioned in the background art as an example, a temperature sensor needs to be arranged in a cold storage chamber and other chambers to acquire the internal temperature of the chambers in real time, and the control of refrigeration components such as a compressor and the like is realized based on the temperature of the chambers.
In a specific implementation, the sampling unit 21 may be a precision resistor, a first end of the precision resistor is connected to the thermistor temperature sensor 1, and a second end of the precision resistor is connected to the main control circuit 3. Accordingly, the voltage dividing unit 22 may be a pull-down resistor, one end of which is connected to the first end of the precision resistor (i.e., connected to the thermistor temperature sensor 1), and the other end of which is grounded. Therefore, different preset temperature ranges can be obtained by changing the resistance value of the pull-down resistor, so that the temperature control circuit can adapt to different application scenes.
The technical scheme provided by the embodiment of the application can have the following beneficial effects: in the temperature detection circuit that the embodiment of this application provided, including thermistor temperature sensor 1 that connects gradually, sampling circuit 2 and main control circuit 3, wherein thermistor temperature sensor 1 sets up in waiting to detect the object when using, sampling circuit 2 includes sampling unit 21 and voltage division unit 22, main control circuit 3 is used for confirming the temperature of waiting to detect the object through the voltage value who acquires sampling unit 21, voltage division unit 22 is used for through the partial pressure so that under the preset condition, the change volume of waiting to detect the temperature of object is the same, the change volume of the voltage value of sampling unit 21 increases. That is, according to different preset conditions, the voltage dividing unit 22 is correspondingly arranged to realize different voltage dividing, so that the acquisition precision under the preset conditions is increased when temperature detection is performed, and because the AD conversion chip or the high-precision digital temperature sensor with more than 12 bits does not need to be replaced and used, the obvious increase of cost and the increase of the occupation of the operation resources of the main chip are not caused.
In order to make the technical solution of the present application easier to understand, the following is further explained by a specific example.
In this embodiment, the temperature detection circuit is applied to an electric control refrigerator, the refrigerator includes three compartments of a refrigerating compartment, a temperature changing compartment and a freezing compartment, each compartment is provided with a temperature sensor for controlling the start and stop of the refrigeration of each compartment, and the evaporator is also provided with a temperature sensor for collecting the temperature of the evaporator to control the start and stop of the defrosting of the evaporator, that is, the objects to be detected in this embodiment are the three compartments and the evaporator of the refrigerator respectively. The temperature sensors are NTC resistance temperature sensors, the temperature range is-50 ℃ to 50 ℃, each temperature sensor corresponds to one sampling unit and one voltage division unit, the sampling unit 21 is a precision resistor, and the voltage division unit 22 is a pull-down resistor.
In addition, referring to fig. 2, fig. 2 is a schematic circuit diagram of a temperature detection circuit according to an embodiment of the present application. As shown in fig. 2, in this embodiment, the main chip IC105 of the main control circuit 3 adopts a toshiba chip TMP89FM42AUG with 10-bit AD conversion, and the power supply voltage is 5V, wherein the main control circuit 3 is further provided with a reset circuit 4 composed of a resistor R130, a capacitor C119, and the like.
The temperature sensor is connected to a connector CN9 (conventional scheme, not shown in fig. 3) through a wire, and is connected in series with the precision resistor and then connected to +5V input and ground, specifically: the temperature sensor of the refrigerating chamber is connected with the precision resistor R147 in series and is connected to a pin 22 (LC _ AD pin) of the main chip; the temperature sensor of the temperature-changing chamber is connected with the precision resistor R111 in series and is connected to a 21 pin (BW _ AD pin) of the main chip; the temperature sensor of the freezing chamber is connected with the precision resistor R146 in series and is connected to a pin 23 (LD _ AD pin) of the main chip; the temperature sensor arranged on the evaporator for defrosting is connected in series with the precision resistor R162 and is connected to the 24 pins (LDHS _ AD pins) of the main chip, and the resistance value of each precision resistor is 4.7K omega. On this basis, the sampling circuit 2 further includes 4 pull-down resistors R110, R166, R149, and R150, where one end of each pull-down resistor is connected to the current input end of the corresponding precision resistor and the other end is grounded, specifically: the pull-down resistor R150 is connected with the precision resistor R147 and the temperature sensor of the refrigerating chamber, the pull-down resistor R149 is connected with the precision resistor R146 and the temperature sensor of the freezing chamber, the pull-down resistor R166 is connected with the precision resistor R162 and the temperature sensor for defrosting, and the pull-down resistor R110 is connected with the precision resistor R111 and the temperature sensor of the temperature-changing chamber; therefore, the main chip can obtain the voltage value of each precision resistor after voltage division by the pull-down resistor, and then determine the temperature of each compartment or evaporator according to the corresponding table of the voltage value and the temperature. And the resistance value of the corresponding pull-down resistor is determined according to the long-term working temperature ranges of different temperature sensors, so that the change value of the sampling voltage caused by the temperature change of each chamber or evaporator is large, the AD sampling precision in the temperature range can be improved, and the finally determined temperature precision is improved.
On the basis of the scheme, when the temperature control circuit is specifically applied, the temperature range of the long-term working of the temperature sensor of the refrigerating chamber is 0-10 ℃, and the corresponding voltage division unit can use a pull-down resistor with the resistance value of 5.6K 1 percent (the resistance value is 5.6K, and the precision is 1 percent); the temperature range of the temperature sensor of the temperature-changing chamber in long-term operation is-5 ℃, and a pull-down resistor with the voltage of 5.6K 1% can be used for the corresponding voltage division unit; the temperature range of the long-term working of the temperature sensor of the freezing chamber is-24 to-16 ℃, and a corresponding voltage division unit can use a pull-down resistor with the voltage of 18K 1 percent; the temperature range of the long-term working of the temperature sensor for defrosting is-24-8 ℃, and a pull-down resistor of 12K 1% can be used for a corresponding voltage dividing unit. It should be noted that although the specific temperature ranges of the temperature sensors of the refrigerating chamber and the temperature-changing chamber in the long-term operation are different, the accuracy requirement can be met by using 5.6K 1% of pull-down resistors, so that the pull-down resistors with different parameters can not be further set, that is, the preset temperature range can not be completely the same as the temperature range of the temperature sensor in the long-term operation, as long as the actual accuracy requirement can be met.
In specific application, 3 tables can be preset in the main chip software according to a corresponding table of temperature and voltage on a temperature sensor specification, namely a 10-bit binary table of the temperature sensor conversion voltage respectively corresponding to pull-down resistors of 5.6K, 18K and 12K, wherein the tables comprise corresponding relations of temperature and sampling voltage, the temperature corresponding to the difference value between values is 0.3 ℃, and the temperature range is-50 ℃ to 50 ℃. Therefore, after the main chip is sampled, the corresponding temperature can be obtained directly through table lookup based on the sampling voltage, the precision is 0.3 ℃, and the precision requirement under most conditions can be met.
In addition, as shown in fig. 2, in order to reduce the sampling error, a filter capacitor (i.e., C110, C139, C131, and C132) may be connected in parallel with each pull-down resistor for filtering, and based on the above scheme, a filter capacitor with a capacitance value of 0.1 μ F may be selected (where "104" near each capacitor in fig. 2 indicates 10 × 10 μ F4In pF).
In the above-mentioned scheme, be applied to the refrigerator with the temperature detection circuit of this application to, carry out specific setting according to temperature sensor's long-term operating temperature scope, can improve temperature acquisition precision, and, need not to change better main chip and the temperature sensor of high accuracy, consequently can not cause the obvious increase of cost (the cost of the resistance that increases is much lower than main chip or temperature sensor of change).
In addition, based on the temperature detection circuit, the present application further provides a temperature detection method, referring to fig. 3, fig. 3 is a schematic flow chart of the temperature detection method provided in the present application,
as shown in fig. 3, the method comprises at least the following steps:
s301: performing AD sampling at preset time intervals until the sampling times reach preset times;
s302: calculating the average value of the AD samples of the preset times;
s303: and determining the temperature of the object to be detected based on the average value.
That is, the temperature of the object to be detected is determined by a method of sampling a plurality of times and calculating an average value to reduce a sampling error. The preset number may be 128.
In a specific application, when the main chip is a 10-bit AD conversion chip, the steps S301 and S302 include: performing AD sampling once every preset time interval, and accumulating AD sampling values; the value of the AD sample obtained by accumulation is stored in a first variable, an overflow value is stored in a second variable, the first variable is a 16-bit variable, and the second variable is an 8-bit variable;
shifting the second variable and the first variable to the left by one bit until the sampling times reach the preset times;
assigning the sum of the overflow value of the first variable after being shifted by one bit from the left and the second variable after being shifted by one bit from the left to the second variable again;
assigning the re-assigned value of the second variable to the high 8 bits of the third variable, and assigning the high 8 bits of the first variable shifted left by one bit to the low 8 bits of the third variable; the third variable is a 16-bit variable;
taking the obtained third variable as the average value.
Through the scheme, compared with the traditional method, the operation process is simplified, queuing and maximum and minimum removal are not needed, and therefore the sampling average value can be obtained quickly.
Further, if the above temperature detection circuit and method are applied to a refrigerator, the main chip may sequentially perform temperature collection for temperature sensors disposed in different compartments and/or evaporators according to the above method. Furthermore, after the compartment temperature and/or the evaporator temperature are/is obtained, the start-stop points (i.e., the start-up temperature threshold and the stop temperature threshold) of the compartments and the defrosting heater can be calculated according to the compartment set temperature and the ambient temperature, so that the refrigerator is controlled based on the relationship between the real-time temperature and the start-stop point temperature, including the start-stop of the loads such as the compressor, the fan, the damper, the heater and the like. The ambient temperature can be collected by a display panel of the refrigerator and used for compensating the room temperature to improve the control precision, and a specific compensation scheme is not improved, so that the detailed description is omitted.
Or, in practical application, the conversion values of the temperature and the voltage of the start-stop point of each compartment and the defrosting heater can be preset in the 3 tables, so that after the average sampling value is obtained through calculation, the average sampling value is directly compared with the conversion value of the start-stop point temperature in the table, and further, the control of each load of the refrigerator is realized.
It is understood that the same or similar parts in the above embodiments may be mutually referred to, and the same or similar parts in other embodiments may be referred to for the content which is not described in detail in some embodiments.
It should be noted that, in the description of the present application, the terms "first", "second", etc. are used for descriptive purposes only and are not to be construed as indicating or implying relative importance. Further, in the description of the present application, the meaning of "a plurality" means at least two unless otherwise specified.
Any process or method descriptions in flow charts or otherwise described herein may be understood as representing modules, segments, or portions of code which include one or more executable instructions for implementing specific logical functions or steps of the process, and the scope of the preferred embodiments of the present application includes other implementations in which functions may be executed out of order from that shown or discussed, including substantially concurrently or in reverse order, depending on the functionality involved, as would be understood by those reasonably skilled in the art of the present application.
It should be understood that portions of the present application may be implemented in hardware, software, firmware, or a combination thereof. In the above embodiments, the various steps or methods may be implemented in software or firmware stored in memory and executed by a suitable instruction execution system. For example, if implemented in hardware, as in another embodiment, any one or combination of the following techniques, which are known in the art, may be used: a discrete logic circuit having a logic gate circuit for implementing a logic function on a data signal, an application specific integrated circuit having an appropriate combinational logic gate circuit, a Programmable Gate Array (PGA), a Field Programmable Gate Array (FPGA), or the like.
It will be understood by those skilled in the art that all or part of the steps carried by the method for implementing the above embodiments may be implemented by hardware related to instructions of a program, which may be stored in a computer readable storage medium, and when the program is executed, the program includes one or a combination of the steps of the method embodiments.
In addition, functional units in the embodiments of the present application may be integrated into one processing module, or each unit may exist alone physically, or two or more units are integrated into one module. The integrated module can be realized in a hardware mode, and can also be realized in a software functional module mode. The integrated module, if implemented in the form of a software functional module and sold or used as a stand-alone product, may also be stored in a computer readable storage medium.
The storage medium mentioned above may be a read-only memory, a magnetic or optical disk, etc.
In the description herein, reference to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the application. In this specification, the schematic representations of the terms used above do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
Although embodiments of the present application have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present application, and that variations, modifications, substitutions and alterations may be made to the above embodiments by those of ordinary skill in the art within the scope of the present application.
Claims (11)
1. A temperature sensing circuit, comprising: the thermistor temperature sensor, the sampling circuit and the master control circuit are connected in sequence; wherein,
the thermistor temperature sensor is arranged on an object to be detected when in use;
the sampling circuit comprises a sampling unit and a voltage division unit;
the main control circuit is used for determining the temperature of the object to be detected by acquiring the voltage value of the sampling unit;
the voltage dividing unit is used for dividing voltage so that the variation of the voltage value of the sampling unit is increased when the variation of the temperature of the object to be detected is the same under the preset condition.
2. The temperature detection circuit according to claim 1, wherein the preset condition is that the temperature of the object to be detected is within a preset temperature range.
3. The temperature detection circuit of claim 2, wherein the sampling unit is a precision resistor, a first end of the precision resistor is connected to the thermistor temperature sensor, and a second end of the precision resistor is connected to the main control circuit.
4. The temperature detecting circuit of claim 3, wherein the voltage dividing unit is a pull-down resistor, one end of the pull-down resistor is connected to the first end of the precision resistor, and the other end of the pull-down resistor is grounded.
5. The temperature detection circuit of claim 4, wherein different predetermined temperature ranges are obtained by changing the resistance of the pull-down resistor.
6. The temperature sensing circuit of claim 4 or 5, further comprising a filter capacitor in parallel with the pull-down resistor.
7. A refrigerator characterized in that a temperature detection circuit according to any one of claims 1 to 6 is provided.
8. The refrigerator according to claim 7, wherein the thermistor temperature sensor, the sampling unit and the voltage dividing unit are all plural and equal in number;
each thermistor temperature sensor is respectively arranged in different compartments of the refrigerator and on an evaporator of the refrigerator.
9. A temperature detection method applied to the temperature detection circuit according to any one of claims 1 to 6, wherein the master control circuit includes a master chip supporting AD conversion, and the method is performed by the master chip, and the method includes:
performing AD sampling at preset time intervals until the sampling times reach preset times;
calculating the average value of the AD samples of the preset times;
and determining the temperature of the object to be detected based on the average value.
10. The method of claim 9, wherein the master chip is a 10-bit AD conversion chip;
every interval preset time, carry out AD sampling, until the number of times of sampling reaches the preset number of times, calculate the average value of the AD sampling of the preset number of times, include:
performing AD sampling once every preset time interval, and accumulating AD sampling values; the value of the AD sample obtained by accumulation is stored in a first variable, an overflow value is stored in a second variable, the first variable is a 16-bit variable, and the second variable is an 8-bit variable;
shifting the second variable and the first variable to the left by one bit until the sampling times reach the preset times;
assigning the sum of the overflow value of the first variable after being shifted by one bit from the left and the second variable after being shifted by one bit from the left to the second variable again;
assigning the re-assigned value of the second variable to the high 8 bits of the third variable, and assigning the high 8 bits of the first variable shifted left by one bit to the low 8 bits of the third variable; the third variable is a 16-bit variable;
taking the obtained third variable as the average value.
11. The method of claim 9 or 10, wherein the temperature detection circuit is provided in a refrigerator, the method further comprising:
and controlling the refrigerator based on the temperature of the object to be detected.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011473340.8A CN112729587A (en) | 2020-12-15 | 2020-12-15 | Temperature detection circuit, refrigerator and temperature detection method |
Applications Claiming Priority (1)
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| CN114935238A (en) * | 2022-03-01 | 2022-08-23 | 深圳天溯计量检测股份有限公司 | Intelligent monitoring and calibrating system for refrigerator temperature acquisition |
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