CN112543408B - Closed diaphragm piezoelectric MEMS loudspeaker and preparation method thereof - Google Patents
Closed diaphragm piezoelectric MEMS loudspeaker and preparation method thereof Download PDFInfo
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Abstract
Description
技术领域technical field
本发明涉及MEMS微扬声器领域,具体地,涉及一种封闭式振动膜压电MEMS扬声器及其制备方法。The invention relates to the field of MEMS micro-speakers, in particular to a closed-type vibrating film piezoelectric MEMS speaker and a preparation method thereof.
背景技术Background technique
微扬声器广泛应用于可穿戴电子产品,如手机、智能家电、耳机、电脑和人机界面。随着可穿戴电子设备的发展需求,微型扬声器的发展趋向于小型化、轻量化、低功耗、高声压级。MEMS(Micro-Electro-Mechanical Systems)技术的快速发展,使得更小更低功耗的器件成为现实,MEMS电动式、电容式和压电式微型扬声器提供了传统扬声器的可替代方案。Micro speakers are widely used in wearable electronic products such as mobile phones, smart home appliances, headphones, computers and human-machine interfaces. With the development of wearable electronic devices, the development of micro speakers tends to be miniaturized, lightweight, low power consumption, and high sound pressure level. The rapid development of MEMS (Micro-Electro-Mechanical Systems) technology has made smaller and lower power consumption devices a reality. MEMS electrodynamic, capacitive and piezoelectric micro speakers provide an alternative to traditional speakers.
电动式MEMS微扬声器是根据电机原理来实现电声转换,电动式MEMS微型扬声器由于具有更好的声学性能而成为现有扬声器中最常见的类型。然而,电动式MEMS扬声器由于对磁体的要求,存在电流大、封装工艺复杂等缺点。传统的电动式微扬声器虽然能耗低、制造工艺变化大、音质中等,但仍没有被MEMS器件所取代。主要原因是管芯片尺寸相对较大且仍无法产生足够的声压级。静电式MEMS扬声器是利用两个独立的产生静电力的电极驱动隔膜并推动空气。虽然电容式MEMS微型扬声器是占据市场的主导扬声器产品,且由于静电扬声器具有振膜质量极轻,解析力极佳,能充分表现音乐神韵的优点,但其振动膜片位移和声压级受到间隙的限制,更有吸合效应和高驱动电压的应用局限性。压电MEMS微扬声器是基于压电薄膜材料的压电效应实现声压输出,与电容式MEMS微型扬声器相比,具有制造简单、信噪比高、响应速度快、无尘等优点。到目前为止,压电扬声器已经开发出各种压电材料,如ZnO、AlN、PZT、PMN-PT、PZN-PT等。PZT压电材料因其具有较高的压电电荷常数和机电耦合系数,而成为应用最广泛的一种压电材料。然而,MEMS压电扬声器面临着声压级相对较低的问题。Electrodynamic MEMS micro-speakers realize electro-acoustic conversion based on the principle of electric motors. Electro-dynamic MEMS micro-speakers have become the most common type of existing speakers due to their better acoustic performance. However, the electrodynamic MEMS speaker has disadvantages such as large current and complicated packaging process due to the requirement for the magnet. Although traditional electrodynamic microspeakers have low energy consumption, large manufacturing process variations, and moderate sound quality, they have not been replaced by MEMS devices. The main reason is that the tube chip size is relatively large and still cannot generate sufficient sound pressure level. Electrostatic MEMS speakers use two separate electrodes that generate electrostatic forces to drive the diaphragm and push the air. Although the capacitive MEMS micro-speaker is the dominant speaker product in the market, and the electrostatic speaker has the advantages of extremely light diaphragm, excellent resolution, and can fully express the charm of music, the displacement of the diaphragm and the sound pressure level are affected by the gap. The limitations of the pull-in effect and the application limitations of high driving voltage. Piezoelectric MEMS micro-speaker is based on the piezoelectric effect of piezoelectric film materials to achieve sound pressure output. Compared with capacitive MEMS micro-speakers, it has the advantages of simple manufacture, high signal-to-noise ratio, fast response speed, and dust-free. So far, piezoelectric speakers have developed various piezoelectric materials, such as ZnO, AlN, PZT, PMN-PT, PZN-PT, etc. PZT piezoelectric material has become the most widely used piezoelectric material because of its high piezoelectric charge constant and electromechanical coupling coefficient. However, MEMS piezoelectric speakers suffer from relatively low sound pressure levels.
经过针对现有技术的检索发现:After searching for the prior art, it was found that:
Haoran Wang,Zhenfang Chen等人在Sensors and Actuators A:Physical撰写了“A high-SPL piezoelectric MEMS loud speaker based on thinceramic PZT”。报道了一种基于陶瓷PZT的圆形封闭膜压电MEMS扬声器,它可以在较小的驱动电压下产生高的声压级,且共振频率在4.2kHz,使得在20-20kHz的频率范围内声压级较高,但是封闭式振动膜的偏移位移不够大,阻碍了其声压级的进一步提高。Haoran Wang, Zhenfang Chen et al wrote "A high-SPL piezoelectric MEMS loud speaker based on thinceramic PZT" in Sensors and Actuators A:Physical. reported a circular closed-film piezoelectric MEMS speaker based on ceramic PZT, which can generate high sound pressure level at a small driving voltage and has a resonant frequency of 4.2 kHz, which makes the sound in the frequency range of 20-20 kHz. The pressure level is high, but the offset displacement of the closed diaphragm is not large enough, which hinders the further improvement of its sound pressure level.
Hsu-Hsiang Cheng,Weileun Fang等人在“2020IEEE 33rd InternationalConference on Micro Electro Mechanical Systems(MEMS)”会议撰写“Piezoelectricmicrospeaker using novel driving approach and electrode design for frequencyrange improvement”。介绍了一种包含边缘电极和中心电极的双电极驱动模式,不仅可以由边缘电极驱动膜片以活塞振动模式来维持低频时的声压级,而且还可以通过中心电极的驱动进一步增加高频时的声压级。改进后的压电MEMS扬声器,在2Vpp的驱动电压下,从2.6kHz到20kHz比以前设计的压电MEMS扬声器提高了15dB。虽然提高了低频时的声压级,但其在高频时声压级较低,在10kHz到20kHz之间甚至有时候只有52dB左右。Hsu-Hsiang Cheng, Weileun Fang and others wrote "Piezoelectricmicrospeaker using novel driving approach and electrode design for frequencyrange improvement" at "2020IEEE 33rd International Conference on Micro Electro Mechanical Systems (MEMS)". A dual-electrode drive mode including an edge electrode and a center electrode is introduced. Not only can the edge electrode drive the diaphragm in a piston vibration mode to maintain the sound pressure level at low frequencies, but also drive the center electrode to further increase the sound pressure level at high frequencies. sound pressure level. The improved piezoelectric MEMS speaker has a 15dB improvement over the previously designed piezoelectric MEMS speaker from 2.6kHz to 20kHz at a driving voltage of 2V pp . Although the sound pressure level at low frequencies is increased, the sound pressure level at high frequencies is lower, sometimes only about 52dB between 10kHz and 20kHz.
Shih-Hsiung Tseng,Weileun Fang等人在“2020IEEE 33rd InternationalConference on Micro Electro Mechanical Systems(MEMS)”会议撰写“Sound pressureand low frequency enhancement using novel PZT MEMS microspeaker design”。介绍了一种压电MEMS阵列式微型扬声器,包括四个三角形板、一个连接质量块和双驱动电极,三角板上的内外电极以180°的异相驱动。在驱动电压仅为2Vpp时,此具有5个阵列的微扬声器在100Hz、1kHz时的声压级分别为81.4dB和84.7dB。但是此阵列式压电MEMS扬声器的结构和制备工艺都很复杂。Shih-Hsiung Tseng, Weileun Fang and others wrote "Sound pressure and low frequency enhancement using novel PZT MEMS microspeaker design" at the "2020 IEEE 33rd International Conference on Micro Electro Mechanical Systems (MEMS)" conference. A piezoelectric MEMS array micro-speaker is introduced, which includes four triangular plates, a connection mass and double driving electrodes. The inner and outer electrodes on the triangular plate are driven out of phase by 180°. When the driving voltage is only 2V pp , the sound pressure level of this microspeaker with 5 arrays is 81.4dB and 84.7dB at 100Hz and 1kHz, respectively. However, the structure and fabrication process of the array piezoelectric MEMS speaker are complicated.
F.Stoppel,C.Eisermann等人在2017 19th International Conference onSolid-State Sensors,Actuators and Microsystems撰文“Novel membrane-less two-way MEMS loudspeaker loudspeaker based on piezoelectric dual-concentricactuators”,展示了一种基于同心级联PZT驱动器的新型双通道压电MEMS扬声器,在800Hz以上的频率下实现了95dB的声压级,虽然结构是不封闭式膜结构,但其存在着声压级泄露的问题。F.Stoppel, C.Eisermann et al. in the 2017 19th International Conference on Solid-State Sensors, Actuators and Microsystems "Novel membrane-less two-way MEMS loudspeaker loudspeaker based on piezoelectric dual-concentricactuators", demonstrated a concentric cascade based The new dual-channel piezoelectric MEMS speaker of the PZT driver achieves a sound pressure level of 95dB at frequencies above 800Hz. Although the structure is an open membrane structure, it has the problem of sound pressure level leakage.
综上所述,目前报道的压电MEMS扬声器,有封闭膜式压电MEMS扬声器,有不封闭膜式的压电MEMS扬声器,而对于兼有封闭膜式与不封闭膜式振动膜优点的压电MEMS扬声器,既有较大的振动膜振动偏移位移,又不会产生声压级的泄露。目前未见报道。随着可穿戴电子设备的发展,性能更好,全覆盖频率,声压级更高的压电MEMS扬声器成为必然趋势。To sum up, the currently reported piezoelectric MEMS speakers include closed-membrane piezoelectric MEMS speakers and non-closed-membrane piezoelectric MEMS speakers. The electric MEMS loudspeaker not only has a large vibration excursion and displacement of the diaphragm, but also does not produce the leakage of the sound pressure level. There are no reports so far. With the development of wearable electronic devices, piezoelectric MEMS speakers with better performance, full frequency coverage and higher sound pressure level have become an inevitable trend.
发明内容SUMMARY OF THE INVENTION
针对现有技术中的缺陷,提出一种封闭式振动膜压电MEMS扬声器及其制备方法。Aiming at the defects in the prior art, a closed diaphragm piezoelectric MEMS speaker and a preparation method thereof are proposed.
本发明第一个方面提供一种封闭式振动膜压电MEMS扬声器的制备方法,包括:A first aspect of the present invention provides a method for preparing a closed diaphragm piezoelectric MEMS speaker, comprising:
在基底上制备第一电极,在第一电极上制备压电层,在所述压电层上制备第二电极;preparing a first electrode on the substrate, preparing a piezoelectric layer on the first electrode, and preparing a second electrode on the piezoelectric layer;
依次对所述第二电极、所述压电层及所述第一电极进行刻蚀,得到图形化的第二电极、压电层及第一电极,由图形化的第二电极、压电层及第一电极构成图形化的振动膜单元;所述图形化的振动膜单元为具有六个相同尺寸三角形,且六个三角形沿周向紧邻布置并共用同一个顶点;The second electrode, the piezoelectric layer and the first electrode are sequentially etched to obtain the patterned second electrode, the piezoelectric layer and the first electrode. and the first electrode to form a patterned vibrating film unit; the patterned vibrating film unit has six triangles of the same size, and the six triangles are arranged next to each other along the circumferential direction and share the same vertex;
对所述基底进行刻蚀,在所述基底上刻蚀出呈射线状分布的沟槽间隙,所述沟槽间隙的尺寸与三角形的两个边长相匹配,即在相邻两个三角形之间具有一间隙,并将六个三角形的未刻蚀沟槽间隙的第三条边做为束缚边缘部分,六个三角形的第三条边之间首尾相互连接形成一封闭的六边形;所述图形化的振动膜单元共用一个第一电极和第二电极,得到器件;The substrate is etched, and groove gaps in a radial distribution are etched on the substrate, and the size of the groove gap matches the length of the two sides of the triangle, that is, between two adjacent triangles There is a gap, and the third sides of the six triangular unetched trench gaps are used as bound edge parts, and the third sides of the six triangles are connected end to end to form a closed hexagon; the The patterned vibrating membrane unit shares a first electrode and a second electrode to obtain a device;
在所述器件的上表面沉积一层封装材料,使所述沟槽间隙的间隙侧壁和底部封闭;depositing a layer of encapsulation material on the upper surface of the device to close the sidewall and bottom of the trench gap;
对所述器件的下表面进行刻蚀,在所述图形化的振动膜单元的背面形成背部腔,且所述背部腔的外轮廓覆盖所述图形化的振动膜单元的外轮廓。The lower surface of the device is etched to form a back cavity on the back of the patterned diaphragm unit, and the outer contour of the back cavity covers the outer contour of the patterned diaphragm unit.
上述制备步骤中,通过在背部腔刻蚀之前,对刻蚀出的沟槽间隙进行封闭;通过底部的衬底沉积封装材料提供沉积表面,才能沉积一层较薄的薄膜封闭间隙。否则,当背部腔刻蚀后,再对沟槽间隙间隙封装,导致间隙太大,这样沉积厚度要大于间隙才能封闭间隙,不仅薄膜太厚,而且薄膜宽度太狭窄,和间隙宽度一样。这样振动时,不能达到振动位移偏大的效果。通过对刻蚀出的沟槽间隙进行封闭,使振动膜由不封闭转化为封闭式结构,防止气流和声压级的泄露,使得制备的压电MEMS扬声器具有不封闭膜振动偏移位移大的优点的同时,又兼有封闭膜不泄露声压级的优点。In the above preparation steps, before the back cavity is etched, the etched trench gap is sealed; and a thin film can be deposited to seal the gap by depositing a packaging material on the bottom substrate to provide a deposition surface. Otherwise, after the back cavity is etched, the trench gap is encapsulated, resulting in a gap that is too large, so that the deposition thickness must be larger than the gap to close the gap, not only the film is too thick, but also the film width is too narrow, which is the same as the gap width. When vibrating in this way, the effect of large vibration displacement cannot be achieved. By sealing the etched groove gap, the vibrating membrane is transformed from an unclosed structure to a closed structure to prevent the leakage of air flow and sound pressure level, so that the prepared piezoelectric MEMS speaker has a large vibration offset displacement of the unclosed membrane. At the same time, it also has the advantage that the closed membrane does not leak the sound pressure level.
所述图形化的振动膜的图形针对但不限于六个尺寸相同的三角形振动膜单元,还适用于三角形、梯型、圆形、环形和方形等所有图形。The pattern of the patterned vibrating membrane is aimed at but not limited to six triangular vibrating membrane units with the same size, and is also applicable to all graphics such as triangle, trapezoid, circle, ring and square.
优选地,依次对所述第二电极、所述压电层及所述第一电极进行刻蚀,得到图形化的第二电极、压电层及第一电极,由图形化的第二电极、压电层及第一电极构成图形化的振动膜单元;其中,将所述第二电极、所述压电层及所述第一电极在一个正六边形的图形内,沿着所述正六边形的图形的三个相互交叉对角线刻蚀得到具有六个三角形的第二电极、具有六个三角形的压电层及具有六个三角形的第一电极。Preferably, the second electrode, the piezoelectric layer and the first electrode are sequentially etched to obtain the patterned second electrode, the piezoelectric layer and the first electrode. The piezoelectric layer and the first electrode form a patterned vibrating film unit; wherein, the second electrode, the piezoelectric layer and the first electrode are arranged in a regular hexagon pattern along the regular hexagon. Three mutually intersecting diagonal lines of the shaped pattern are etched to obtain a second electrode having six triangles, a piezoelectric layer having six triangles, and a first electrode having six triangles.
所述刻蚀线针对但不限于三交叉刻蚀线,还适用于十字交叉刻蚀线,四交叉刻蚀线等所有数目交叉刻蚀线。The etching lines are aimed at, but not limited to, three-cross etching lines, and are also applicable to all number of cross-cut etching lines, such as cross-cross etching lines and four-cross etching lines.
优选地,具有六个三角形的压电层的边缘大于所述具有六个三角形的第二电极的边缘,以使所述第二电极与所述第一电极隔离,避免上下层电极之间连通。Preferably, the edge of the piezoelectric layer with six triangles is larger than the edge of the second electrode with six triangles, so as to isolate the second electrode from the first electrode and avoid communication between the upper and lower electrodes.
优选地,所述背部腔的尺寸大于所述图形化的第二电极的尺寸,以保证所述背部腔能覆盖整个图形化的振动膜单元。Preferably, the size of the back cavity is larger than the size of the patterned second electrode, so as to ensure that the back cavity can cover the entire patterned diaphragm unit.
优选地,所述沟槽间隙的宽度在3μm-20μm;所述沟槽间隙的深度在5μm-100μm。Preferably, the width of the trench gap is 3 μm-20 μm; the depth of the trench gap is 5 μm-100 μm.
优选地,所述基底采用SOI晶圆、柔性基底、金属基底或非金属基底中任一种。Preferably, the substrate adopts any one of SOI wafer, flexible substrate, metal substrate or non-metallic substrate.
更加优选地,非金属基底可选用PDMS(聚二甲基硅氧烷),PE(聚乙烯),PI(聚酰亚胺)等柔性材料基底。More preferably, the non-metallic substrate can be a flexible material substrate such as PDMS (polydimethylsiloxane), PE (polyethylene), PI (polyimide).
优选地,所述第一电极、所述第二电极材料为Pt(铂)、Au(金)、Cr(铬)或Al(铝)的任一种;Preferably, the material of the first electrode and the second electrode is any one of Pt (platinum), Au (gold), Cr (chromium) or Al (aluminum);
优选地,所述压电层的材料为PZT压电陶瓷(锆钛酸铅压电陶瓷)、ZnO(氧化锌)、AlN(氮化铝)、PMN-PT(铌镁酸铅-钛酸铅)或PVDF(聚偏氟乙烯)的任一种。Preferably, the material of the piezoelectric layer is PZT piezoelectric ceramics (lead zirconate titanate piezoelectric ceramics), ZnO (zinc oxide), AlN (aluminum nitride), PMN-PT (lead magnesium niobate-lead titanate) ) or PVDF (polyvinylidene fluoride).
优选地,所述封装层的材料为Parylene C(聚对二氯甲苯)、PI(聚酰亚胺)、硅橡胶、环氧树脂的任一种。Preferably, the material of the encapsulation layer is any one of Parylene C (polyparadichlorotoluene), PI (polyimide), silicone rubber, and epoxy resin.
优选地,所述背部腔的腔体为呈正六边形中空空间。Preferably, the cavity of the back cavity is a regular hexagonal hollow space.
本发明第二个方面提供一种压电MEMS扬声器,由上述的封闭式振动膜压电MEMS扬声器制备方法制备得到。A second aspect of the present invention provides a piezoelectric MEMS speaker, which is prepared by the above-mentioned method for preparing a closed diaphragm piezoelectric MEMS speaker.
优选地,压电MEMS扬声器,包括:Preferably, a piezoelectric MEMS speaker, comprising:
基底,base,
以及依次设置于所述基底上方的第一电极、压电层及第二电极;and a first electrode, a piezoelectric layer and a second electrode sequentially arranged above the substrate;
由所述基底、所述第一电极、所述压电层及所述第二电极构成具有正六边形的振动膜结构,且所述正六边形的振动膜结构由三个对角线交叉分割成六个尺寸相等的三角形,相邻所述三角形之间设有沟槽间隙;在所述正六边形的振动膜结构表面、所述沟槽间隙的侧壁及底部设有封装层,使所述沟槽间隙的侧壁及底部封闭;The base, the first electrode, the piezoelectric layer and the second electrode form a vibrating membrane structure with a regular hexagon, and the regular hexagonal vibrating membrane structure is divided by three diagonal lines. Six triangles of equal size are formed, and trench gaps are arranged between adjacent triangles; an encapsulation layer is arranged on the surface of the regular hexagonal vibrating membrane structure, the sidewalls and the bottom of the trench gap, so that all the The side walls and bottom of the groove gap are closed;
所述振动膜结构的背面设有向上凹陷的中空腔体的背部腔,所述背部腔的腔体与所述沟槽间隙之间间隔一层所述封装层;且所述背部腔的外轮廓覆盖所述正六边形的振动膜结构的外轮廓。The back of the vibrating membrane structure is provided with a back cavity of a hollow cavity which is recessed upward, and a layer of the encapsulation layer is spaced between the cavity of the back cavity and the groove gap; and the outer contour of the back cavity is cover the outer contour of the regular hexagonal vibrating membrane structure.
与现有技术相比,本发明具有如下至少一种的有益效果:Compared with the prior art, the present invention has at least one of the following beneficial effects:
本发明上述制备方法,通过在背部腔刻蚀之前对上表面以及刻蚀出的间隙侧壁和间隙底部沉积一层封装材料,巧妙地封闭了不封闭式振动膜的间隙,防止气流和声压级的泄露,使得制备的压电MEMS扬声器具有不封闭膜振动偏移位移大的优点的同时,又兼有封闭膜不泄露声压级的优点;所制备的MEMS扬声器完全覆盖了人耳能够听到的20Hz-20000Hz频率范围,且能达到足够满足商业应用的声压级,结构紧凑,体积较小,性能优异;可用于手机扬声器,耳机,助听器等可穿戴电子设备。In the above preparation method of the present invention, by depositing a layer of encapsulation material on the upper surface and the etched sidewall and bottom of the gap before the back cavity is etched, the gap of the non-closed vibrating membrane is subtly closed to prevent airflow and sound pressure. Therefore, the prepared piezoelectric MEMS speaker has the advantages of not sealing the membrane and large vibration displacement, and at the same time, it also has the advantages of not leaking the sound pressure level of the sealing membrane; the prepared MEMS speaker completely covers the human ear can hear It can reach the frequency range of 20Hz-20000Hz, and can reach the sound pressure level enough for commercial applications, with compact structure, small size and excellent performance; it can be used in mobile phone speakers, earphones, hearing aids and other wearable electronic devices.
附图说明Description of drawings
通过阅读参照以下附图对非限制性实施例所作的详细描述,本发明的其它特征、目的和优点将会变得更明显:Other features, objects and advantages of the present invention will become more apparent by reading the detailed description of non-limiting embodiments with reference to the following drawings:
图1是本发明一优选实施例的由封闭式振动膜压电MEMS扬声器的制备方法流程示意图;FIG. 1 is a schematic flowchart of a method for preparing a piezoelectric MEMS speaker with a closed vibrating membrane according to a preferred embodiment of the present invention;
图2是本发明一优选实施例的器件正面视图;2 is a front view of a device according to a preferred embodiment of the present invention;
图3是本发明一优选实施例的器件背部腔视图;3 is a view of the back cavity of the device according to a preferred embodiment of the present invention;
图4是本发明一优选实施例的器件表面沉积Parylene C后正面视图;4 is a front view of the device surface after depositing Parylene C according to a preferred embodiment of the present invention;
图5是本发明一优选实施例的器件表面沉积ParyleneC后剖视图;5 is a cross-sectional view of the device surface after depositing ParyleneC according to a preferred embodiment of the present invention;
图中标记分别表示为:第二电极焊盘1,第一电极焊盘2,沟槽间隙3,六个三角形的振动膜4,基底5,背部腔6,ParyleneC7。The marks in the figure are respectively: the
具体实施方式Detailed ways
下面结合具体实施例对本发明进行详细说明。以下实施例将有助于本领域的技术人员进一步理解本发明,但不以任何形式限制本发明。应当指出的是,对本领域的普通技术人员来说,在不脱离本发明构思的前提下,还可以做出若干变形和改进。这些都属于本发明的保护范围。The present invention will be described in detail below with reference to specific embodiments. The following examples will help those skilled in the art to further understand the present invention, but do not limit the present invention in any form. It should be noted that, for those skilled in the art, several modifications and improvements can be made without departing from the concept of the present invention. These all belong to the protection scope of the present invention.
实施例1Example 1
参照图1所示,为本发明一优选实施例封闭式振动膜压电MEMS扬声器的制备方法流程图,包括以下步骤:Referring to FIG. 1, it is a flow chart of a method for preparing a closed diaphragm piezoelectric MEMS speaker according to a preferred embodiment of the present invention, including the following steps:
S1、如图1中(a)所示,在SOI晶圆基底上溅射厚度为100nm的Pt,得到第一电极;在第一电极上溅射厚度为1μm的PZT材料,得到压电层;在压电层上溅射厚度为100nm的Pt,得到第二电极;完成PZT-SOI晶圆的制备;S1, as shown in (a) in Figure 1, sputtering Pt with a thickness of 100 nm on the SOI wafer substrate to obtain a first electrode; sputtering a PZT material with a thickness of 1 μm on the first electrode to obtain a piezoelectric layer; Sputtering Pt with a thickness of 100 nm on the piezoelectric layer to obtain the second electrode; complete the preparation of the PZT-SOI wafer;
在制备完成的PZT-SOI晶圆正面上涂覆光刻胶5μm,前烘90s,曝光45s,显影45s,去离子水冲洗30s,氮气吹干,后烘12min,然后采用离子束刻蚀第二层电极8min,第二层电极图形化结束,去胶;得到六个三角形图形的第二层电极。作为一优选方式,采用离子束刻蚀第二电极;具体刻蚀过程为在一个边长为1mm正六边形图形内进行,沿着正六边形图形的三个相互交叉对角线刻蚀而出,得到六个尺寸相同的三角形图形;刻蚀间隙为50μm。用于连接第二电极方形焊盘1的线宽为30μm,第二电极方形型焊盘长、宽均为300μm。On the front side of the prepared PZT-SOI wafer, a photoresist of 5 μm was coated, pre-baked for 90 s, exposed for 45 s, developed for 45 s, rinsed with deionized water for 30 s, blown dry with nitrogen, post-baked for 12 min, and then etched by ion beam for a second time. After 8 minutes of layer electrodes, the patterning of the second layer electrodes was completed, and the glue was removed; the second layer electrodes with six triangular patterns were obtained. As a preferred way, ion beam is used to etch the second electrode; the specific etching process is carried out in a regular hexagonal pattern with a side length of 1 mm, and is etched along three mutually intersecting diagonal lines of the regular hexagonal pattern. , six triangular patterns with the same size are obtained; the etching gap is 50 μm. The line width for connecting the second electrode
S2、如图1中(b)所示,在正面涂覆光刻胶5μm,前烘90s,曝光45s,显影45s,去离子水冲洗30s,氮气吹干,后烘12min,湿法刻蚀PZT 90s。然后将PZT浸入配置好的刻蚀液中进行刻蚀,PZT刻蚀沟槽宽为20μm;并使用磁力搅拌器搅拌刻蚀液,以提高刻蚀均匀性和速度;然后将刻蚀后的PZT-SOI放入配置好的HNO3溶液中浸泡3min;最后放入去离子水中浸泡几分钟,以清洗去除表面杂质。氮气吹干,真空干燥;得到六个三角形图形的压电层;且六个三角形图形的压电层的边缘比六个三角形图形的第二层电极大30μm,以用来隔离第二电极,避免第二电极与第一电极上下连通。S2. As shown in (b) of Figure 1, coat photoresist 5μm on the front side, pre-bake for 90s, expose for 45s, develop for 45s, rinse with deionized water for 30s, blow dry with nitrogen, post-bake for 12min, and wet-etch PZT 90s. Then, the PZT was immersed in the prepared etching solution for etching, and the width of the PZT etching groove was 20 μm; the etching solution was stirred with a magnetic stirrer to improve the etching uniformity and speed; then the etched PZT -SOI is soaked in the prepared HNO 3 solution for 3 minutes; finally, it is soaked in deionized water for a few minutes to clean and remove surface impurities. Blow dry with nitrogen and vacuum dried; six triangular shaped piezoelectric layers are obtained; and the edge of the six triangular shaped piezoelectric layers is 30 μm larger than the second layer electrode of the six triangular shaped shaped electrodes to isolate the second electrode and avoid The second electrode communicates with the first electrode up and down.
作为一优选方式,上述步骤中,PZT的刻蚀溶液可采用以下方法配制:先将0.6gNH4F缓慢加入1ml去离子水中,并不断搅拌,直至完全溶解;接着将1ml NH4F(40%)缓慢倒入5ml HF溶液中,不断搅拌,使其混合均匀,形成BHF溶液;然后将1ml BHF、25ml HCl以及100ml H2O配置完成刻蚀混合液,充分搅拌,使其充分混合均匀;然后将PZT浸入刻蚀液中进行刻蚀,并使用磁力搅拌器搅拌刻蚀液,以提高刻蚀均匀性和速度。As a preferred way, in the above steps, the etching solution of PZT can be prepared by the following method: first, 0.6g NH 4 F is slowly added into 1ml deionized water, and stirred continuously until it is completely dissolved; then 1ml NH 4 F (40% ) slowly poured into 5ml HF solution, stirring constantly to make it evenly mixed to form a BHF solution; then 1ml BHF, 25ml HCl and 100ml H 2 O were prepared to complete the etching mixture, fully stirred to make it fully mixed; then The PZT was immersed in the etching solution for etching, and the etching solution was stirred with a magnetic stirrer to improve the etching uniformity and speed.
作为一优选方式,上述步骤中,PZT刻蚀时搅拌速度为130r/min,PZT刻蚀时搅拌温度为常温。As a preferred manner, in the above steps, the stirring speed during PZT etching is 130 r/min, and the stirring temperature during PZT etching is normal temperature.
作为一优选方式,上述步骤中,所需HNO3溶液可以采用以下方法配制:将10ml HNO3放入13ml H2O形成溶液,搅拌均匀。As a preferred mode, in the above steps, the required HNO solution can be prepared by the following method : put 10ml HNO into 13ml H 2 O to form a solution, and stir evenly.
S3、如图1中(c)所示,正面涂覆光刻胶5μm,前烘90s,曝光45s,显影40s,去离子水冲洗30s,氮气吹干,后烘12min,然后采用离子束刻蚀第一电极Pt8min,刻蚀间隙为20μm,第一电极图形化结束,去胶,得到六个尺寸均相同的三角形的第一电极。湿法刻蚀PZT形成第一电极方形焊盘长、宽均为300μm。S3. As shown in (c) in Figure 1, the front side is coated with photoresist of 5 μm, pre-baked for 90s, exposed for 45s, developed for 40s, rinsed with deionized water for 30s, blown dry with nitrogen, post-baked for 12min, and then etched by ion beam The first electrode is Pt8min, the etching gap is 20 μm, the patterning of the first electrode is completed, the glue is removed, and six triangular first electrodes with the same size are obtained. Wet etching PZT to form a first electrode square pad with a length and a width of 300 μm.
S4、如图1中(d)所示,正面涂覆光刻胶5μm,NMC介质刻蚀0.5μm SiO2,NMC深硅刻蚀2μm Si,NMC介质刻蚀1.1μm SiO2,NMC深硅刻蚀大约15μm Si形成了六个尺寸均相同的沟槽间隙,且该沟槽间隙的长度与三角形边长匹配;Si、SiO2刻蚀沟槽宽度均为5μm;得到器件。S4. As shown in (d) in Figure 1, the front side is coated with photoresist of 5 μm, the NMC medium is etched with 0.5 μm SiO 2 , the NMC deep silicon is etched with 2 μm Si, the NMC medium is etched with 1.1 μm SiO 2 , and the NMC deep silicon is etched About 15 μm Si was etched to form six trench gaps with the same size, and the length of the trench gaps matched the length of the triangle sides; Si and SiO 2 were etched with trench widths of 5 μm; devices were obtained.
S5、如图1中(e)所示,对器件表面和沟槽间隙的间隙侧壁和间隙底部进行Parylene C沉积,Parylene C沉积厚度为0.5μm,封闭了刻蚀出的沟槽间隙。S5. As shown in (e) in Figure 1, Parylene C is deposited on the surface of the device and the gap sidewalls and bottom of the gap of the trench. The thickness of the Parylene C deposition is 0.5 μm, which closes the etched trench gap.
S6、如图1中(f)所示,正面涂覆5μm光刻胶保护,背部涂覆20μm光刻胶,前烘2min,显影130s,去离子水冲洗30s,氮气吹干,后烘12min,NMC介质刻蚀1.5μm SiO2,NMC深硅刻蚀600μm Si,然后NMC深硅刻蚀1.1μm中间埋氧层SiO2,其背部腔和振动膜之间的间隙制备完成;背部腔的半径比第二电极轮廓大0.2mm,以保证背部腔能覆盖整个正面振动膜。S6. As shown in (f) of Figure 1, the front side is coated with 5μm photoresist for protection, the back side is coated with 20μm photoresist, pre-baking for 2min, developing for 130s, rinsing with deionized water for 30s, blowing dry with nitrogen, and post-baking for 12min, NMC dielectric etch 1.5μm SiO 2 , NMC deep silicon etch 600μm Si, then NMC deep silicon etch 1.1μm intermediate buried oxide layer SiO 2 , the gap between the back cavity and the vibrating membrane is completed; the ratio of the radius of the back cavity The outline of the second electrode is 0.2mm larger to ensure that the back cavity can cover the entire front diaphragm.
采用上述步骤得到的压电MEMS扬声器的结构,结合图2、图3、图4及图5所示,图中器件包括第二电极焊盘1,第一电极焊盘2,间隙3,六个三角形的振动膜4,基底5,背部腔6和Parylene C 7;由图中可见,六个三角形的振动膜4包括六个尺寸相等的三角形,且六个三角形沿周向紧邻布置并共用同一个顶点;由六个三角形振动膜4整体上组成一个中间不封闭的正六边形振动膜;在器件的表面上沉积一层Parylene C 7,Parylene C 7覆盖于沟槽间隙的间隙侧壁表面和间隙底部表面上使其封闭;在六个三角形的振动膜4的背面设置向上凹陷的中空腔体的背部腔6,背部腔6的腔体与沟槽间隙之间间隔一层Parylene C 7,即实现将振动膜由不封闭转化为封闭式。The structure of the piezoelectric MEMS speaker obtained by the above steps is shown in FIG. 2 , FIG. 3 , FIG. 4 and FIG. 5 . In the figure, the device includes a
实施例2Example 2
参照图1所示,为本发明一优选实施例封闭式振动膜压电MEMS扬声器的制备方法流程图,包括以下步骤:Referring to FIG. 1, it is a flow chart of a method for preparing a closed diaphragm piezoelectric MEMS speaker according to a preferred embodiment of the present invention, including the following steps:
S1、如图1中(a)所示,在SOI晶圆基底上溅射厚度为120nm的Pt,得到第一电极;在第一电极上溅射厚度为2μm的PZT材料,得到压电层;在压电层上溅射厚度为120nm的Pt,得到第二电极;完成PZT-SOI晶圆的制备;在制备好的PZT-SOI晶圆正面上涂覆光刻胶5μm,前烘90s,曝光45s,显影50s,去离子水冲洗30s,氮气吹干,后烘12min,然后采用离子束刻蚀上电极(第二电极)Pt 8min,上电极图形化结束,去胶;S1, as shown in FIG. 1 (a), sputtering Pt with a thickness of 120 nm on the SOI wafer substrate to obtain a first electrode; sputtering a PZT material with a thickness of 2 μm on the first electrode to obtain a piezoelectric layer; Pt with a thickness of 120 nm was sputtered on the piezoelectric layer to obtain the second electrode; the preparation of the PZT-SOI wafer was completed; the front side of the prepared PZT-SOI wafer was coated with a photoresist of 5 μm, pre-baked for 90 s, and exposed to light 45s, develop for 50s, rinse with deionized water for 30s, blow dry with nitrogen, post-bake for 12min, then use ion beam to etch the upper electrode (second electrode) Pt for 8min, the patterning of the upper electrode is completed, and the glue is removed;
作为一优选方式,刻蚀出的六个三角形振动膜单元整体上组成一个中间不封闭的正六边形振动膜,即所刻蚀出的六个三角形共用一个顶点,且相互连通;从而使得仅振动偏移大,又防止声压级泄露。正六边形的边长可以为0.5mm。As a preferred way, the six etched triangular vibrating membrane units as a whole form a regular hexagonal vibrating membrane whose middle is not closed, that is, the six etched triangles share a vertex and are connected to each other; The offset is large, and the sound pressure level is prevented from leaking. The side length of the regular hexagon may be 0.5mm.
作为一优选方式,六个三角形振动膜单元由沿着正六边形振动膜的3个相互交叉对角线交点对称排列;刻蚀间隙为40μm。As a preferred manner, the six triangular vibrating membrane units are symmetrically arranged along the intersections of three mutually intersecting diagonal lines of the regular hexagonal vibrating membrane; the etching gap is 40 μm.
作为一优选方式,连接方型焊盘的线宽为20μm,方型焊盘长、宽均为200μm。As a preferred manner, the line width connecting the square pads is 20 μm, and the length and width of the square pads are both 200 μm.
S2、如图1中(b)所示,在正面涂覆光刻胶5μm,前烘90s,曝光45s,显影50s,去离子水冲洗30s,氮气吹干,后烘12min,湿法刻蚀PZT90s。然后将PZT浸入配置好的刻蚀液中进行刻蚀,并使用磁力搅拌器搅拌刻蚀液,以提高刻蚀均匀性和速度;然后将刻蚀后的PZT-SOI放入配置好的HNO3溶液中中浸泡3min;最后放入去离子水中浸泡几分钟,以清洗去除表面杂质。氮气吹干,真空干燥。PZT刻蚀出的六个尺寸均相同的三角形的压电层边缘比第二电极轮廓大30μm,以用来隔离第二电极,避免上下层电极连通。PZT刻蚀沟槽宽为10μm。S2. As shown in (b) of Figure 1, coat photoresist 5μm on the front side, pre-bake for 90s, expose for 45s, develop for 50s, rinse with deionized water for 30s, blow dry with nitrogen, post-bake for 12min, and wet-etch PZT for 90s . Then, the PZT was immersed in the prepared etching solution for etching, and a magnetic stirrer was used to stir the etching solution to improve the etching uniformity and speed; then the etched PZT-SOI was placed in the prepared HNO 3 Soak in the solution for 3 minutes; finally, soak in deionized water for a few minutes to clean and remove surface impurities. Dry under nitrogen and vacuum dry. The edges of the six triangular piezoelectric layers etched by PZT are 30 μm larger than the outline of the second electrode to isolate the second electrode and prevent the upper and lower electrodes from being connected. The width of the PZT etched trench is 10 μm.
作为一优选方式,上述步骤中PZT的刻蚀溶液可以采用以下方法配制:先将0.6gNH4F缓慢加入1ml去离子水中,并不断搅拌,直至完全溶解;接着将1ml NH4F(40%)缓慢倒入5ml HF溶液中,不断搅拌,使其混合均匀,形成BHF溶液;然后将1ml BHF、25ml HCl以及100ml H2O配置完成刻蚀混合液,充分搅拌,使其充分混合均匀;然后将PZT浸入刻蚀液中进行刻蚀,并使用磁力搅拌器搅拌刻蚀液,以提高刻蚀均匀性和速度;As a preferred way, the etching solution of PZT in the above steps can be prepared by the following method: first, 0.6g NH 4 F is slowly added into 1ml deionized water, and stirred continuously until it is completely dissolved; then 1ml NH 4 F (40%) Slowly pour it into 5ml of HF solution, stir continuously to make it evenly mixed to form a BHF solution; then prepare 1ml of BHF, 25ml of HCl and 100ml of H 2 O to complete the etching mixture, stir well to make it fully mixed; then PZT is immersed in the etching solution for etching, and a magnetic stirrer is used to stir the etching solution to improve the etching uniformity and speed;
作为一优选方式,上述步骤中,PZT刻蚀时搅拌速度为120r/min,PZT刻蚀时搅拌温度为常温。As a preferred manner, in the above steps, the stirring speed during PZT etching is 120 r/min, and the stirring temperature during PZT etching is normal temperature.
作为一优选方式,上述步骤中,所需HNO3溶液采用以下方法配制:将11ml HNO3放入14ml H2O形成溶液,搅拌均匀。As a preferred way, in the above steps, the required HNO 3 solution is prepared by the following method: put 11 ml of HNO 3 into 14 ml of H 2 O to form a solution, and stir evenly.
S3、如图1中(c)所示,正面涂覆光刻胶5μm,前烘90s,曝光50s,显影40s,去离子水冲洗30s,氮气吹干,后烘12min,然后采用离子束刻蚀下电极Pt 8min,下电极图形化结束,去胶,得到六个尺寸均相同的三角形的第一电极。湿法刻蚀PZT后漏出下电极方形焊盘长宽均为200μm。S3. As shown in (c) in Figure 1, the front side is coated with photoresist of 5 μm, pre-baking 90s, exposing 50s, developing 40s, rinsing with deionized water for 30s, blowing dry with nitrogen, post-baking 12min, and then using ion beam etching The lower electrode was Pt for 8min, the patterning of the lower electrode was completed, the glue was removed, and six triangular first electrodes with the same size were obtained. After wet etching PZT, the length and width of the bottom electrode square pad are 200 μm.
作为优选的实施方式,下电极Pt进行离子束刻蚀间隙为10μm。As a preferred embodiment, the ion beam etching gap of the lower electrode Pt is 10 μm.
S4、如图1中(d)所示,正面涂覆光刻胶5μm,NMC介质刻蚀0.5μm SiO2,NMC深硅刻蚀2μm Si,NMC介质刻蚀1.1μm SiO2,NMC深硅刻蚀20μm Si,形成了六个尺寸均相同的三角形振动膜沟槽间隙。Si、SiO2刻蚀沟槽宽度均为10μm。S4. As shown in (d) of Figure 1, the front side is coated with photoresist of 5 μm, the NMC medium is etched with 0.5 μm SiO 2 , the NMC deep silicon is etched with 2 μm Si, the NMC medium is etched with 1.1 μm SiO 2 , and the NMC deep silicon is etched 20μm Si was etched to form six triangular diaphragm trench gaps with the same size. The widths of the Si and SiO 2 etched trenches are both 10 μm.
S5、如图1中(e)所示,对器件表面和沟槽间隙的间隙侧壁表面和间隙底部的表面进行Parylene C沉积。Parylene C沉积厚度为1μm。封闭了刻蚀出的沟槽间隙。S5. As shown in (e) of FIG. 1, Parylene C is deposited on the surface of the device surface and the surface of the gap sidewall of the trench gap and the surface of the gap bottom. The Parylene C deposition thickness is 1 μm. The etched trench gap is closed.
S6、如图1中(f)所示,正面涂覆5μm光刻胶保护,背部涂覆20μm光刻胶,前烘2min,显影130s,去离子水冲洗30s,氮气吹干,后烘12min,NMC介质刻蚀1.5μm SiO2,NMC深硅刻蚀600μm Si,然后NMC深硅刻蚀1.1μm中间埋氧层SiO2,其背部腔和振动膜之间的间隙制备完成;背部腔的半径比上电极大0.25mm,以保证背部腔能覆盖整个正面振动膜。S6. As shown in (f) of Figure 1, the front side is coated with 5μm photoresist for protection, the back side is coated with 20μm photoresist, pre-baking for 2min, developing for 130s, rinsing with deionized water for 30s, blowing dry with nitrogen, and post-baking for 12min, NMC dielectric etch 1.5μm SiO 2 , NMC deep silicon etch 600μm Si, then NMC deep silicon etch 1.1μm intermediate buried oxide layer SiO 2 , the gap between the back cavity and the vibrating membrane is completed; the ratio of the radius of the back cavity The upper electrode is 0.25mm larger to ensure that the back cavity can cover the entire front diaphragm.
在具体实施时,上述实施例中的刻蚀PZT方法针对但不限于湿法刻蚀,还适用于离子束刻蚀等各种干法刻蚀、激光切割等所有可以制备成沟槽的技术;Si与SiO2刻蚀方法针对但不限于干法刻蚀,还适用于湿法刻蚀、激光切割等所有可以制备成沟槽的技术。In specific implementation, the etching PZT method in the above-mentioned embodiment is aimed at but not limited to wet etching, and is also applicable to all kinds of dry etching such as ion beam etching, laser cutting and other technologies that can be prepared into grooves; The Si and SiO 2 etching method is aimed at, but not limited to, dry etching, and is also applicable to all techniques that can form trenches, such as wet etching and laser cutting.
以上对本发明的具体实施例进行了描述。需要理解的是,本发明并不局限于上述特定实施方式,本领域技术人员可以在权利要求的范围内做出各种变形或修改,这并不影响本发明的实质。Specific embodiments of the present invention have been described above. It should be understood that the present invention is not limited to the above specific embodiments, and those skilled in the art can make various variations or modifications within the scope of the claims, which do not affect the essence of the present invention.
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Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0999723A3 (en) * | 1998-11-05 | 2002-07-17 | Matsushita Electric Industrial Co., Ltd. | Piezoelectric speaker, method for producing the same, and speaker system including the same |
CN101262712A (en) * | 2007-03-09 | 2008-09-10 | 付庆兴 | A voice directional spreading sound system |
CN201657307U (en) * | 2010-04-12 | 2010-11-24 | 瑞声光电科技(常州)有限公司 | Piezoelectric speaker |
CN103460721A (en) * | 2011-03-31 | 2013-12-18 | 巴克-卡琳公司 | Acoustic transducer with gap-controlling geometry and method of manufacturing an acoustic transducer |
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KR20120036631A (en) * | 2010-10-08 | 2012-04-18 | 삼성전자주식회사 | Piezoelectric micro-speaker and method for fabricating the same |
KR101500559B1 (en) * | 2013-12-23 | 2015-03-09 | 범진시엔엘 주식회사 | Piezoelectric Speaker |
-
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Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0999723A3 (en) * | 1998-11-05 | 2002-07-17 | Matsushita Electric Industrial Co., Ltd. | Piezoelectric speaker, method for producing the same, and speaker system including the same |
CN101262712A (en) * | 2007-03-09 | 2008-09-10 | 付庆兴 | A voice directional spreading sound system |
CN201657307U (en) * | 2010-04-12 | 2010-11-24 | 瑞声光电科技(常州)有限公司 | Piezoelectric speaker |
CN103460721A (en) * | 2011-03-31 | 2013-12-18 | 巴克-卡琳公司 | Acoustic transducer with gap-controlling geometry and method of manufacturing an acoustic transducer |
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