CN112526317A

CN112526317A - Integrated circuit test data recording method

Info

Publication number: CN112526317A
Application number: CN202011272703.1A
Authority: CN
Inventors: 邵嘉阳; 吴勇佳; 徐倩云; 王静; 崔孝叶
Original assignee: Sino IC Technology Co Ltd
Current assignee: Sino IC Technology Co Ltd
Priority date: 2020-11-13
Filing date: 2020-11-13
Publication date: 2021-03-19

Abstract

The invention discloses a method for recording test data of an integrated circuit, which comprises the following steps that 1) all numbers of the circuit of the batch are recorded in a number pool; 2) during testing, the positions of all circuits are defined according to the positions on the test circuit board, and an operator only needs to input numbers according to the corresponding positions of the circuits on the circuit board in software; 3) comparing whether the input circuit number is in the number pool or not; 4) comparing whether the input circuit number appears in the previous test; 5) and generating a report according to the serial number and the result recorded in the SQL.

Description

Integrated circuit test data recording method

Technical Field

The invention relates to the technical field of semiconductor circuit testing, in particular to a method for recording test data of an integrated circuit.

Background

In semiconductor circuit testing, there is a particular class of circuits in which a production lot of the circuit, a unique circuit number of the circuit in the lot, is burned into the housing of the circuit using a laser. The test data of such circuits requires that each circuit separately records a file and the number of the circuit is used as the file name.

In the circuit testing process, due to the requirement of production efficiency, many times, a plurality of circuits need to be tested at one time, for example, 4 or more circuits need to be tested at one time, and after the test is completed, data is stored into a plurality of files, 4 files or more. The operator obtains the circuit number from the circuit shell and renames the file according to the circuit number. In actual operation, an operator sometimes misreads a circuit number, so that two different circuits have the same data file name, or the number of a data file does not exist in an actual circuit, and it is also possible to record circuit files in a staggered manner, for example, the number of a first circuit is recorded in a second file, and the number of a second circuit is recorded in the first file. And carrying out multiple testing rounds on the same circuit, wherein the qualified circuit after the previous testing round is tested in the current testing round. After the test is completed, a test report including the serial number of each circuit, the test result of each time, and the like needs to be generated.

The invention provides a method for recording integrated circuit test data, which can simplify the operation of operators, reduce the operation difficulty of the operators, improve the production quality of test operators, reduce the time required by data inspection and object checking of test statisticians and conveniently and quickly generate reports.

Disclosure of Invention

The technical scheme adopted by the invention for solving the technical problems is to provide an integrated circuit test data recording method, which can avoid data numbering and object corresponding errors, quickly generate a test report and improve test quality and statistical efficiency, wherein the specific technical scheme is as follows:

an integrated circuit test data recording method, specifically to

1) Recording all numbers of the batch of circuits in a number pool;

2) during testing, the positions of all circuits are defined according to the positions on the test circuit board, and an operator only needs to input numbers according to the corresponding positions of the circuits on the circuit board in software;

3) comparing whether the input circuit number is in the number pool or not;

4) comparing whether the input circuit number appears in the previous test;

5) and generating a report according to the serial number and the result recorded in the SQL.

The integrated circuit test data recording method comprises the following steps: during test production, after an operator puts the circuit in the clamp for fixing, the tester is controlled to generate test data after testing.

The integrated circuit test data recording method comprises the following steps: the computer tool of the testing machine firstly checks whether the serial number in the database is in the serial number pool, and if the serial number is not pre-imported into the serial number pool, the input serial number of the first test round of the operator is used as the serial number pool; if the circuit number is the number in the number pool, judging whether the number is a qualified chip of the previous round of test, otherwise checking the number of the current circuit again to determine whether the input number of the current round is correct, if not, inputting again, otherwise, checking the chip of the previous round to find out the number which is input by mistake in the previous round; if the circuit number is a qualified chip of the uploading test, judging whether the number is already generated in the current test, if the number is repeated, checking whether the current input error or the previously input number is wrong through a tested object, and modifying in time; if all the previous codes are in compliance, the input number is judged to be the correct number.

Compared with the prior art, the invention has the following beneficial effects:

the key point of the technical scheme is that a picture which is the same as that of a circuit board is generated by using a test UI, an independent data file can be generated by automatically pressing a number only by inputting a circuit number at a specified position, the key point is that the number is verified by using SQL to avoid the occurrence of number errors, and the key point is that a test report is generated by using the number and a test result recorded in the SQL.

Drawings

Fig. 1 is a schematic diagram of a network structure of a method for recording test data of an integrated circuit.

FIG. 2 is a schematic view of a number entry interface.

In the figure:

1 data server 2 office computer 3 database server 4 tester computer

Detailed Description

The invention is further described below with reference to the figures and examples.

The circuit comprises: a semiconductor integrated circuit chip.

Test data: the file for recording the test result in the integrated circuit test process contains all the electric parameter values, the functional test result and other test results to be recorded.

Circuit numbering: the circuit number in the batch is typically marked on the circuit housing.

Circuit batch number: circuit production lot information is typically marked on the circuit housing.

SQL is a repository that organizes, stores and manages data according to a data structure, enabling fast access to data.

The invention needs the operator to import the numbering pool in SQL first, and the numbering pool is used as the checking basis for the operator to input the circuit number.

During test production, after an operator puts the circuit in the clamp for fixing, the tester is controlled to generate test data after testing. This product 8site is tested together and after testing is complete, the tester generates 8 test data. An operator has a tool on the computer of the testing machine, which is shown in fig. 2, the tool is testing software in the prior art, a picture identical to the circuit board is displayed in an operation interface of the tool, and the operator only needs to look at a position in the operation interface, take out a circuit at the position, and input a circuit number on a circuit shell.

The tool will first check whether the number in the database is in the numbering pool, and if there is no numbering pool imported in advance, use the input number of the first test round of the operator as the numbering pool. If the circuit number is the number in the number pool, judging whether the number is a qualified chip of the previous round of test, otherwise checking the number of the current circuit again, determining whether the input number of the current round is correct, if not, re-inputting the input number, otherwise, checking the chip of the previous round and finding out the wrong number of the previous round. If the circuit number is the chip qualified in the uploading test, whether the number appears in the current test is judged, if the number is repeated, whether the input error is the input error or the input number is the error before is checked through a test completed object, and the input error is corrected in time. If all the previous numbers are in compliance, the input number is judged to be the correct number.

After all production links are completed, a test report can be quickly generated by using the test numbers and the records of the test results in the SQL.

Claims

1. An integrated circuit test data recording method, characterized by:

1) recording all numbers of the batch of circuits in a number pool;

3) comparing whether the input circuit number is in the number pool or not;

4) comparing whether the input circuit number appears in the previous test;

2. The integrated circuit test data recording method of claim 1, wherein: during test production, after an operator puts the circuit in the clamp for fixing, the tester is controlled to generate test data after testing.

3. The integrated circuit test data recording method of claim 2, wherein: the computer tool of the testing machine firstly checks whether the number in the database is in the number pool, and if the number pool is not imported in advance, the input number of the first test round of the operator is used as the number pool; if the circuit number is a number in the number pool, judging whether the number is a qualified chip of the previous round of test, otherwise checking the number of the current circuit again to determine whether the input number of the current round is correct, if not, re-inputting, otherwise, checking the chip of the previous round to find out the wrong number of the previous round; if the circuit number is the chip qualified in the uploading test, judging whether the number is already generated in the current test, if the number is repeated, checking whether the current input error or the previously input number is wrong through a tested object, and modifying in time; if all the previous codes are in compliance, the input number is judged to be the correct number.