[go: up one dir, main page]

CN112501578A - Coating quality control method of gradient coating machine - Google Patents

Coating quality control method of gradient coating machine Download PDF

Info

Publication number
CN112501578A
CN112501578A CN201911278479.4A CN201911278479A CN112501578A CN 112501578 A CN112501578 A CN 112501578A CN 201911278479 A CN201911278479 A CN 201911278479A CN 112501578 A CN112501578 A CN 112501578A
Authority
CN
China
Prior art keywords
film thickness
coating
film
instrument
preset
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201911278479.4A
Other languages
Chinese (zh)
Inventor
黄乐
孙桂红
黄国兴
祝海生
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Xiangtan Hongda Vacuum Technology Co ltd
Original Assignee
Xiangtan Hongda Vacuum Technology Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Xiangtan Hongda Vacuum Technology Co ltd filed Critical Xiangtan Hongda Vacuum Technology Co ltd
Priority to CN201911278479.4A priority Critical patent/CN112501578A/en
Publication of CN112501578A publication Critical patent/CN112501578A/en
Pending legal-status Critical Current

Links

Images

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/54Controlling or regulating the coating process
    • C23C14/542Controlling the film thickness or evaporation rate
    • C23C14/545Controlling the film thickness or evaporation rate using measurement on deposited material
    • C23C14/546Controlling the film thickness or evaporation rate using measurement on deposited material using crystal oscillators
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/35Sputtering by application of a magnetic field, e.g. magnetron sputtering

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physical Vapour Deposition (AREA)

Abstract

The invention discloses a coating quality control method of a gradient color coating machine, wherein the coating machine is provided with a film thickness instrument, the film thickness instrument comprises a crystal oscillator probe and a film thickness control instrument host, the crystal oscillator probe is fixed on the side surface of a workpiece rotating stand, the film thickness instrument monitors the film thickness in real time, and after each layer of coating, if the film thickness instrument detects that the film thickness is less than the preset film thickness, the same color system sputtering is continued; and if the film thickness detected by the film thickness meter is within the preset film thickness range, performing film coating on the next layer. The invention provides a coating quality control method of a gradient color coating machine, which can more accurately monitor the film thickness, feed back detection data in real time, correct the detection data at any time and improve the coating quality.

Description

Coating quality control method of gradient coating machine
Technical Field
The invention relates to the technical field of sputtering coating, in particular to a coating quality control method of a gradient color coating machine.
Background
The vacuum coating machine mainly refers to a coating machine which needs to be carried out under a higher vacuum degree, and specifically comprises various types, including vacuum ion evaporation, magnetron sputtering, MBE molecular beam epitaxy, PLD laser sputtering deposition and the like.
Sputtering-type coating is simply understood as bombarding a target material with electrons or high-energy laser, and causing surface components to be sputtered out in the form of atomic groups or ions and finally deposited on the surface of a substrate, and subjected to a film-forming process to finally form a thin film.
Magnetron sputtering is one type of Physical Vapor Deposition (PVD). The general sputtering method can be used for preparing multi-materials such as metal, semiconductor, insulator and the like, and has the advantages of simple equipment, easy control, large film coating area, strong adhesive force and the like. The magnetron sputtering method developed in the last 70 th century realizes high speed, low temperature and low damage. Since the high-speed sputtering is performed under a low pressure, it is necessary to effectively increase the ionization rate of the gas. Magnetron sputtering increases the sputtering rate by introducing a magnetic field at the surface of the target cathode, using the confinement of the magnetic field to charged particles to increase the plasma density.
The film coating machine generally adopts a film thickness meter to monitor the change of film thickness in the film coating process, and the traditional method of fixing the probe above the furnace has the most convenient installation, transmission and use, but has larger monitoring error. Later, vertical film plating machines have appeared, which employ vertical sputtering targets for sputter deposition, and after monitoring, the unqualified products are picked up, resulting in longer process time.
Disclosure of Invention
The technical problem to be solved by the invention is as follows: aiming at the technical problems in the prior art, the invention provides a coating quality control method of a gradient color coating machine.
In order to solve the technical problems, the technical scheme provided by the invention is as follows:
a coating quality control method of a gradient color coating machine is characterized in that the coating machine is provided with a film thickness instrument, the film thickness instrument comprises a crystal oscillator probe and a film thickness control instrument host, the crystal oscillator probe is fixed on the side surface of a workpiece rotating stand, the film thickness instrument monitors the film thickness in real time, and after each layer of coating film is coated, if the film thickness detected by the film thickness instrument is smaller than the preset film thickness, the same color series sputtering is continuously carried out; and if the film thickness detected by the film thickness meter is within the preset film thickness range, performing film coating on the next layer.
The further improvement of the technical scheme is as follows:
in the above technical solution, preferably, the surface of the crystal oscillator piece of the crystal oscillator probe and the plated surface of the workpiece need to be on the same plane.
In the above technical scheme, preferably, the electrical lead and the signal wire of the crystal oscillator probe penetrate through the furnace body to be connected with the film thickness controller host, and the film thickness controller host is provided with the WiFi wireless transmission module for transmitting the data monitored by the crystal oscillator probe to a computer beside the furnace in real time.
In the above technical solution, preferably, during the film coating, a baffle is added between the target and the workpiece.
In the above technical solution, preferably, the method comprises the following steps:
step 1, preheating stage:
(1) providing compressed air and cooling water for the vacuum unit;
(2) the power is turned on and the maintenance pump is started.
Step 2, working stage
(1) After the film coating chamber is filled with the atmosphere, opening a gate, closing the gate filled with the piece to be coated and the coating material, and fastening a door lock;
(2) when the vacuum pressure is less than 2Pa, closing the rough pumping valve; after the rough pumping valve is closed, pressing a fine pumping valve opening button to perform fine pumping on the coating chamber;
(3) setting the rotating speed of the workpiece; when the preset vacuum coating pressure is reached, coating starts;
(4) the film thickness meter monitors the film thickness in real time, and after each layer of film is coated, if the film thickness meter detects that the film thickness is smaller than the preset film thickness, the same-color sputtering is continued; and if the film thickness detected by the film thickness meter is within the preset film thickness range, performing film coating on the next layer.
Compared with the prior art, the coating quality control method of the gradient color coating machine provided by the invention has the following advantages:
the film coating quality control method of the gradient color film coating machine has the advantages of simple structure of the film thickness instrument, easy manufacture, upgrading by modifying the existing film thickness monitoring device, and complete compatibility with the original film coating source and film coating process. The film thickness meter and the workpiece rotate together, so that the film thickness is monitored more accurately, detection data are fed back in real time, correction is carried out at any time, and the quality of a coated film is improved.
Drawings
FIG. 1 is a schematic diagram of the structure of the application and implementation of the invention.
FIG. 2 is a schematic diagram of the effect of coating at different positions when the present invention is applied.
Detailed Description
The following describes in detail specific embodiments of the present invention. It should be understood that the detailed description and specific examples, while indicating the present invention, are given by way of illustration and explanation only, not limitation.
Fig. 1 shows an embodiment of the coating quality control method of the gradient color coating machine of the invention, the coating machine comprises a crystal oscillator probe and a film thickness control instrument host, the crystal oscillator probe is fixed on the side surface of a workpiece rotating stand, and the crystal oscillator piece surface of the crystal oscillator probe and the coating surface of the workpiece need to be on the same plane. The electric lead and the signal wire of the crystal oscillator probe penetrate out of the furnace body to be connected with the film thickness control instrument host, and the WiFi wireless transmission module is arranged on the film thickness control instrument host and used for transmitting data monitored by the crystal oscillator probe to a computer beside the furnace in real time.
The control method of the invention is plating pretreatment → charging → vacuumizing → target washing and ion cleaning → plating → cooling and discharging → post-treatment. When the gradient color coating is carried out, a baffle plate is additionally arranged between the target material and the workpiece, the thickness of the film deposited at the position corresponding to the large area of the baffle plate is small, and the thickness deposited at the position corresponding to the small area of the baffle plate is large.
As shown in fig. 2, the film formation angles a > B > C at the points a, B and C and the distance da < db < dc between the film formation region and the evaporation source finally cause the thicknesses of the three points a, B and C to be significantly different, the thicknesses of the film formation regions at the three points are different, and the macroscopic result, namely the transmitted light after reflection is different, so that the iridescent effect is formed. And adjusting process parameters in different sections to bombard different targets, and changing the thickness and the layer number of the coating.
The control method comprises the following steps:
step 1, preheating stage:
(1) providing compressed air and cooling water for the vacuum unit;
(2) the power is turned on and the maintenance pump is started.
Step 2, working stage
(1) After the film coating chamber is filled with the atmosphere, opening a gate, closing the gate filled with the piece to be coated and the coating material, and fastening a door lock;
(2) starting a rough pumping pump and a slide valve pump;
(3) opening a rough pumping valve to carry out rough pumping on the coating chamber;
(4) when the vacuum pressure is less than 2Pa, closing the rough pumping valve; after the rough pumping valve is closed, pressing a fine pumping valve opening button to perform fine pumping on the coating chamber;
(5) setting the rotating speed of the workpiece; when the preset vacuum coating pressure is reached, coating starts;
(6) the film thickness meter monitors the film thickness in real time, and after one layer of film is coated, if the film thickness meter detects that the film thickness is smaller than the preset film thickness, the same-color sputtering is continued; and if the film thickness detected by the film thickness meter is within the preset film thickness range, performing film coating on the next layer.
When coating, bombarding a specific target material by using ultrahigh-speed electrons, shielding one part of ion cloud by using a specific shade, and only allowing the other part of ion cloud to be attached to the surface of glass to form an extremely thin nano coating. By controlling the thickness of the plating layer, a nanometer-level thickness difference is formed, and then the ground color is sprayed.
Step 3, shutdown phase
(1) After the plated part is taken out, the control mode knob is required to be in a manual position, a gate is closed, and a door lock is fastened;
(2) pressing a diffusion pump off button, turning off a diffusion pump power supply, and maintaining the pump to continuously work;
(3) opening a rough pumping button, and starting pumping the vacuum chamber;
(4) after the atmosphere in the vacuum chamber is basically exhausted (about 10 minutes), pressing a rough pumping valve closing button, and closing the rough pumping valve;
(5) after about 2 hours, the lower end of the diffusion pump shell is generally cooled to below 60 ℃, a maintenance pump turn-off button is pressed, and the maintenance pump is stopped;
(6) turning off the control power supply;
(7) and (4) turning off a main power switch, turning off a main power supply, stopping supplying cooling water and compressed air, and stopping working of the equipment.
The above embodiments are merely preferred embodiments of the present invention, which is not intended to limit the present invention in any way. Although the present invention has been described with reference to the preferred embodiments, it is not intended to be limited thereto. Therefore, any simple modification, equivalent change and modification made to the above embodiments according to the technical spirit of the present invention should fall within the protection scope of the technical scheme of the present invention, unless the technical spirit of the present invention departs from the content of the technical scheme of the present invention.

Claims (5)

1. A coating quality control method of a gradient color coating machine is characterized in that the coating machine is provided with a film thickness instrument, the film thickness instrument comprises a crystal oscillator probe and a film thickness control instrument host, the crystal oscillator probe is fixed on the side surface of a workpiece rotating stand, the film thickness instrument monitors the film thickness in real time, and after each layer of coating, if the film thickness instrument detects that the film thickness is smaller than a preset film thickness, the same color system sputtering is continued; and if the film thickness detected by the film thickness meter is within the preset film thickness range, performing film coating on the next layer.
2. The method of claim 1, wherein the surface of the crystal plate of the crystal probe and the surface of the workpiece are in the same plane.
3. The method for controlling the coating quality of a gradient color coating machine according to claim 2, wherein the electrical lead and the signal wire of the crystal oscillator probe penetrate through the furnace body to be connected with the main machine of the film thickness control instrument, and the main machine of the film thickness control instrument is provided with a WiFi wireless transmission module for transmitting the data monitored by the crystal oscillator probe to a computer beside the furnace in real time.
4. The method of claim 3, wherein a baffle is added between the target and the workpiece during coating.
5. The method for controlling the coating quality of a gradient color coating machine according to claim 4, comprising the following steps:
step 1, preheating stage:
(1) providing compressed air and cooling water for the vacuum unit;
(2) switching on a power supply, and starting a maintaining pump;
step 2, working stage
(1) After the film coating chamber is filled with the atmosphere, opening a gate, closing the gate filled with the piece to be coated and the coating material, and fastening a door lock;
(2) when the vacuum pressure is less than 2Pa, closing the rough pumping valve; after the rough pumping valve is closed, pressing a fine pumping valve opening button to perform fine pumping on the coating chamber;
(3) setting the rotating speed of the workpiece; when the preset vacuum coating pressure is reached, coating starts;
(4) the film thickness meter monitors the film thickness in real time, and after each layer of film is coated, if the film thickness meter detects that the film thickness is smaller than the preset film thickness, the same-color sputtering is continued; and if the film thickness detected by the film thickness meter is within the preset film thickness range, performing film coating on the next layer.
CN201911278479.4A 2019-12-13 2019-12-13 Coating quality control method of gradient coating machine Pending CN112501578A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201911278479.4A CN112501578A (en) 2019-12-13 2019-12-13 Coating quality control method of gradient coating machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201911278479.4A CN112501578A (en) 2019-12-13 2019-12-13 Coating quality control method of gradient coating machine

Publications (1)

Publication Number Publication Date
CN112501578A true CN112501578A (en) 2021-03-16

Family

ID=74923661

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201911278479.4A Pending CN112501578A (en) 2019-12-13 2019-12-13 Coating quality control method of gradient coating machine

Country Status (1)

Country Link
CN (1) CN112501578A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114664684A (en) * 2022-03-25 2022-06-24 成都海威华芯科技有限公司 A method for measuring the thickness of metal layers in the production of semiconductor devices
CN115406489A (en) * 2022-11-01 2022-11-29 山东申华光学科技有限公司 Monitoring and early warning method and system for film coating of film coating machine

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005042160A (en) * 2003-07-22 2005-02-17 Matsushita Electric Ind Co Ltd Method and device for controlling film thickness
CN102888591A (en) * 2012-10-31 2013-01-23 上海膜林科技有限公司 Discrete crystal control film thickness control device
CN103469172A (en) * 2013-08-31 2013-12-25 上海膜林科技有限公司 Control method of coating thickness of quartz crystal and coating device of quartz crystal
CN104120399A (en) * 2014-08-04 2014-10-29 熊丹 Vacuum coating device and vacuum coating method thereof
CN104131261A (en) * 2014-07-08 2014-11-05 东莞市汇成真空科技有限公司 Vacuum optical coating machine capable of moving along with workpiece and in-place dynamically monitoring membrane thickness
CN106191779A (en) * 2015-04-30 2016-12-07 北京科技大学 A kind of polymer vacuum electron beam evaporation coating machine
CN205774776U (en) * 2016-06-30 2016-12-07 光驰科技(上海)有限公司 Multi-vaporizing-source coating apparatus
CN108728810A (en) * 2018-08-16 2018-11-02 广东振华科技股份有限公司 A kind of vacuum and low temperature magnetron sputtering coater
CN208762573U (en) * 2018-08-16 2019-04-19 广东振华科技股份有限公司 A kind of vacuum and low temperature magnetron sputtering coater

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005042160A (en) * 2003-07-22 2005-02-17 Matsushita Electric Ind Co Ltd Method and device for controlling film thickness
CN102888591A (en) * 2012-10-31 2013-01-23 上海膜林科技有限公司 Discrete crystal control film thickness control device
CN103469172A (en) * 2013-08-31 2013-12-25 上海膜林科技有限公司 Control method of coating thickness of quartz crystal and coating device of quartz crystal
CN104131261A (en) * 2014-07-08 2014-11-05 东莞市汇成真空科技有限公司 Vacuum optical coating machine capable of moving along with workpiece and in-place dynamically monitoring membrane thickness
CN104120399A (en) * 2014-08-04 2014-10-29 熊丹 Vacuum coating device and vacuum coating method thereof
CN106191779A (en) * 2015-04-30 2016-12-07 北京科技大学 A kind of polymer vacuum electron beam evaporation coating machine
CN205774776U (en) * 2016-06-30 2016-12-07 光驰科技(上海)有限公司 Multi-vaporizing-source coating apparatus
CN108728810A (en) * 2018-08-16 2018-11-02 广东振华科技股份有限公司 A kind of vacuum and low temperature magnetron sputtering coater
CN208762573U (en) * 2018-08-16 2019-04-19 广东振华科技股份有限公司 A kind of vacuum and low temperature magnetron sputtering coater

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114664684A (en) * 2022-03-25 2022-06-24 成都海威华芯科技有限公司 A method for measuring the thickness of metal layers in the production of semiconductor devices
CN115406489A (en) * 2022-11-01 2022-11-29 山东申华光学科技有限公司 Monitoring and early warning method and system for film coating of film coating machine
CN115406489B (en) * 2022-11-01 2023-01-24 山东申华光学科技有限公司 Monitoring and early warning method and system for film coating of film coating machine

Similar Documents

Publication Publication Date Title
CN102912306B (en) High-power pulsed magnetron sputtering equipment and process automatically controlled by computer
US6153271A (en) Electron beam evaporation of transparent indium tin oxide
CN105543792A (en) Magnetron sputtering device and magnetron sputtering method
KR20150016983A (en) Method for sputtering for processes with a pre-stabilized plasma
KR20120079716A (en) Anti-fingerprint coating method and device
CN210065893U (en) Self-cleaning etching anode device
WO2004017356A2 (en) Process and apparatus for pulsed dc magnetron reactive sputtering of thin film coatings on large substrates using smaller sputter cathodes
JP4482972B2 (en) Optical thin film manufacturing equipment
CN112501578A (en) Coating quality control method of gradient coating machine
US20130157044A1 (en) Coated article and method for making same
CN113957399A (en) Control method of magnetron sputtering coating system
US8512860B2 (en) Housing and method for making the same
US8568907B2 (en) Housing and method for making the same
US8512859B2 (en) Housing and method for making the same
WO2014062338A1 (en) Chamber pasting method in a pvd chamber for reactive re-sputtering dielectric material
US8597782B2 (en) Housing and method for making the same
CN102732889B (en) Method and apparatus for removing metal on wafer clamp
CN101864559B (en) Grid mesh magnetron sputtering hafnium evaporation method
US12170194B2 (en) Magnetron plasma sputtering arrangement
US8597804B2 (en) Housing and method for making the same
US8568905B2 (en) Housing and method for making the same
US8568906B2 (en) Housing and method for making the same
TWI417410B (en) A manufacturing method of electric conduction film
US8568904B2 (en) Housing and method for making the same
CN118703943A (en) A vacuum environment low-temperature large-area copper film plating system and copper film plating method

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication

Application publication date: 20210316

RJ01 Rejection of invention patent application after publication