CN112394529B - Unit beam splitting and combining interferometer - Google Patents

Abstract

The invention relates to a single-element beam splitting and combining interferometer, which includes an element, and a light beam is divided into two beams after entering the element, that is, a first beam of light and a second beam of light, and the first beam of light and the second beam of light are After even and odd times of reflection in the component, the two beams of light are recombined in the component after reflection, and finally emitted from the component. The present invention solves the problems that the existing interferometer is composed of multiple elements, which is quite complex and lacks stability, and can realize beam splitting and beam combining in the elements at the same time through the parity of the number of reflections, and has the advantages of compactness, stability, high integration, and high efficiency. It can replace the traditional multi-element interferometer in many application scenarios, such as, but not limited to, it has wide potential in vector light field generation, vortex beam topological charge measurement, quantum optical logic gate, etc. application.

Description

A single-element beam splitting and combining interferometer

technical field

The invention relates to the technical field of interferometers and prism devices, in particular to a single-element beam splitting and combining interferometer.

Background technique

The functions of existing prisms are usually light splitting, changing the direction of propagation, dispersion, polarization splitting, etc. A prism that realizes the dual process of "beam splitting + beam combining" in a single prism is still blank. In light field regulation and application, the most common means and requirements are: first split the beam (splitting the amplitude or splitting the wavefront), and then modulate the two beams separately before combining the beams for output. The most commonly used method is to use various interference optical paths: such as Sagnac interferometer, Mach-Zehnder interferometer, Michelson interferometer, etc. However, the use of this type of interferometer often requires multiple optical elements to form an optical path, and in order to ensure sufficient space for placing these elements, the interference arm is often relatively long, and the combination of multiple elements and long optical paths affects the stability of the optical path. cause negative impact. Therefore, how to integrate the simple and stable advantages of single prisms and the light field control functions of interferometers into one component is of great scientific and practical importance for occasions that require a large number of interferometers such as light field control and high-dimensional quantum optics experiments. significance. Research and invention based on this train of thought is almost blank at present.

At the same time, this single-element interferometer has very important application value and significance in vector light field generation, vortex topological charge measurement, and quantum optics. The current vector light field generation methods are mainly divided into active generation methods and passive generation methods. Among them, the active generation method usually refers to directly generating vector beams with non-uniform distribution of spatial polarization in the laser resonator. For example, in 2005 and 2006, respectively A research team designed a special resonator to generate a radial vector light field. In 2016, the Forbes group used a vortex phase element and a polarization element in the laser resonator to generate a variety of vector light fields in the cavity. The efficiency of this generation method is High and stable, but poor flexibility, often can not flexibly switch between a variety of vector light fields. The passive generation method mainly uses various phase, amplitude, and polarization control elements outside the laser resonator to generate a vector field. This type of method is often more flexible, especially with the development of liquid crystal spatial light modulators, it can often flexibly generate various vector light fields. For example, Wang Huitian's research group has constructed an arbitrary vector light field generation system using spatial light modulators and 4f systems , but the passive method to generate vector light fields often involves a large number of optical components, and most of them are based on the principle of beam splitting interference. Although various interferometers have their own characteristics, they all involve multiple components to cooperate to complete the interference. Stablize. Therefore, a simple, stable and efficient vector light field generating device is of great significance for the wide application of vector light field.

In addition, the vortex light field has made great progress in the past 30 years, and has been widely used in the fields of optical micromanipulation, super-resolution microscopic imaging, micro-nano processing, nonlinear optics, quantum optics, etc. Among them, how to efficiently and accurately test The topological charge of the vortex light site is very important for various applications. Researchers have invented a series of methods to measure the topological charge of the vortex light field: using the rotating Doppler effect, using the special diffraction or interference pattern of the vortex beam, etc. For example, double-slit interference, triangular hole diffraction, cylindrical lens focusing, Mach-Zehnder interferometer and other methods are used to measure topological charges. However, this type of method has certain limitations, and often cannot take into account simplicity and readability, especially when the topological charge to be measured is very large, it is not easy to read. Therefore, a simple and compact device suitable for measuring topological charges of any size is of great significance for the application of vortex light.

To sum up, how to provide a single-element beam splitting and combining interferometer to solve the problems existing in the prior art is of great significance to its application.

Contents of the invention

In view of this, the purpose of this application is to provide a single-element beam splitting and combining interferometer, which is suitable for the flat valve structure of high-temperature medium on-off, realizes safe and reliable on-off of high-temperature medium pipelines, and satisfies high-temperature oil and gas transmission, chemical smelting and nuclear power plant cooling and other high-temperature environments.

In order to achieve the above purpose, the present application provides the following technical solutions.

A single-element beam splitting and combining interferometer, including an element, a light beam is divided into two beams after entering the element, that is, the first beam and the second beam, and the first beam and the second beam are separated in the element After even-numbered and odd-numbered reflections, the two beams of light are recombined in the component after reflection, and finally emitted from the component.

Preferably, the element includes a beam-splitting plane, and the beam-splitting plane is a polarizing beam-splitting plane or a non-polarizing beam-splitting plane.

Preferably, the first beam of light undergoes 2 reflections in the element, and the second beam of light undergoes 3 or 5 reflections in the element.

Preferably, the light beam incident end and the light beam exit end of the element both have a right-angle structure.

Preferably, the number of prism faces on the side of the element corresponding to the first light beam is 2 greater than the number of reflections of the first light beam, and the number of prism faces on the side corresponding to the second light beam of the element is equal to the number of reflection times of the second light beam. The number of reflections is the same, and the distribution of prisms on both sides of the element is symmetrical along the central normal of the middle beam splitting plane.

Preferably, the number of prism faces on the side of the element corresponding to the first beam of light is four, that is, mirror A1, mirror A2, mirror A3, and mirror A4, the angle between the mirror A1 and the mirror A2, the angle between the mirror A3 and the mirror The included angles of A4 are both 154° to 160°, and the included angles between the mirror surface A2 and the mirror surface A3 are 132° to 138°.

Preferably, the number of prism faces on the side of the element corresponding to the second beam of light is three, that is, mirror B1, mirror B2, and mirror B3, the angle between mirror B1 and mirror B2, and the angle between mirror B2 and mirror B3 The angles are all 132-138°.

Preferably, the number of prism faces on the side of the element corresponding to the second beam of light is five, namely mirror B1, mirror B2, mirror B3, mirror B4, mirror B5, the angle between the mirror B1 and mirror B2, the mirror surface The included angles between B4 and the mirror surface B5 are both 162° to 168°, and the included angles between the mirror surface B2 and the mirror surface B3, and the included angles between the mirror surface B3 and the mirror surface B4 are both 147° to 153°.

A vector light field generating device includes the above-mentioned single-element beam splitting and combining interferometer.

A vortex light field topological charge measuring device includes the above-mentioned single-element beam splitting and combining interferometer.

Beneficial technical effect that the present invention obtains:

1) The present invention solves the problems that the existing interferometer is composed of multiple components, which is quite complicated and lacks stability. The present invention can realize beam splitting and beam combining in the components at the same time through different parity of the number of reflections, and has the advantages of compactness, stability and high integration It can replace traditional multi-element interferometers in many application scenarios, such as, but not limited to, vector light field generation, vortex beam topological charge measurement, quantum optical logic gates, etc. has wide potential applications.

2) The parity of the number of reflections experienced by the two beams of light in the component of the present invention is different. In applications such as the incidence of vortex beams, the topological charges of the two beams of vortex lights that are internally split can be opposite to each other (the orbital angular momentum state is positive). In many optical measurements and quantum optics applications involving vortex light, it can replace the traditional multi-element interference optical path to achieve ultra-compact and extremely high stability of the optical path.

3) After the light beam of the present invention is incident, it first encounters the beam-splitting plane inside the element (the beam-splitting plane can be designed and processed as a polarized beam-splitting plane or a non-polarized beam-splitting plane), which divides the beam into two paths, and the two paths of light are in the element. After experiencing odd and even times of reflection respectively, and finally passing through the beam splitting plane in the component, the two paths of light are interfered and recombined together.

4) The reflection of the light beam of the present invention can be realized by total internal reflection, and can also be realized by other reflection methods such as a dielectric film; the beam splitting plane can be designed and processed as a polarization beam splitting plane, that is, the light is divided into orthogonal polarization components, or it can be ordinary The beam splitting plane is insensitive to polarization. In addition, the two-way splitting ratio of the beam splitting plane can also be flexibly designed and processed.

The above description is only an overview of the technical solution of the present application. In order to understand the technical means of the present application more clearly, it can be implemented according to the contents of the description, and in order to make the above and other purposes, features and advantages of the present application more obvious and understandable , the preferred embodiments of the application and accompanying drawings are described in detail below.

According to the following detailed description of specific embodiments of the application in conjunction with the accompanying drawings, those skilled in the art will be more aware of the above and other objectives, advantages and features of the application.

Description of drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings that need to be used in the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are For some embodiments of the present application, those of ordinary skill in the art can also obtain other drawings based on these drawings without creative effort. Throughout the drawings, similar elements or parts are generally identified by similar reference numerals. In the drawings, elements or parts are not necessarily drawn in actual scale.

FIG. 1 is a schematic structural diagram of a single-element beam splitting and combining interferometer in an embodiment of the present disclosure;

Fig. 2 is an optical path diagram of a single-element beam splitting and combining interferometer in an embodiment of the present disclosure;

3 is a schematic structural diagram of a single-element beam splitting and combining interferometer in another embodiment of the present disclosure;

4 is an optical path diagram of a single-element beam splitting and combining interferometer in another embodiment of the present disclosure;

5 is a schematic structural diagram of a vector light field generating device in an embodiment of the present disclosure;

FIG. 6 is a local linearly polarized vector light field generated based on the vector light field generation device in FIG. 5 .

FIG. 7 is a hybrid polarization vector light field generated based on the vector light field generation device in FIG. 5 .

FIG. 8 is a high-order Poincaré sphere vector light field generated based on the vector light field generating device in FIG. 5 .

Fig. 9 is an example result of measuring the topological charge of the vortex light field by using the present invention.

In the above drawings: 100, the first beam of light; 110, the mirror A1; 120, the mirror A2; 130, the mirror A3; 140, the mirror A4; 200, the second beam of light; 210, the mirror B1; 220, the mirror B2; 230, mirror surface B3; 240, mirror surface B4; 250, mirror surface B5; 300, beam splitting plane; 400, incident end; 500, emission end; 600, 1/2 wave plate; 700, wave plate; 800, analyzer.

detailed description

In order to make the purposes, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments It is a part of the embodiments of this application, not all of them. In the following description, specific details, such as specific configurations and components, are provided merely to help a comprehensive understanding of the embodiments of the present application. Accordingly, those of ordinary skill in the art should recognize that various changes and modifications of the embodiments described herein can be made without departing from the scope and spirit of the application. Also, descriptions of well-known functions and constructions are omitted in the embodiments for clarity and conciseness.

It should be understood that references to "one embodiment" or "the present embodiment" throughout the specification mean that a particular feature, structure or characteristic related to the embodiment is included in at least one embodiment of the present application. Thus, appearances of "one embodiment" or "the present embodiment" in various places throughout the specification do not necessarily refer to the same embodiment. Furthermore, the particular features, structures or characteristics may be combined in any suitable manner in one or more embodiments.

Furthermore, the application may repeat reference numbers and/or letters in different instances. This repetition is for the purposes of simplicity and clarity and does not in itself indicate a relationship between the various embodiments and/or arrangements discussed.

The term "and/or" in this article is just an association relationship describing associated objects, which means that there may be three relationships, for example, A and/or B, which can mean: A exists alone, B exists alone, and A and B exist simultaneously. In the three cases of B, the term "/and" in this article is to describe another associated object relationship, which means that there can be two relationships, for example, A/ and B, which can mean: there is A alone, and there are two cases of A and B alone , In addition, the character "/" in this article generally indicates that the contextual objects are an "or" relationship.

The term "at least one" in this article is just an association relationship describing associated objects, which means that there can be three relationships, for example, at least one of A and B can mean: A exists alone, A and B exist simultaneously, There are three cases of B alone.

It should also be noted that in this article, relational terms such as first and second etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply that these entities or operations Any such actual relationship or order exists between. Moreover, the terms "comprises", "comprises" or any other variation thereof are intended to cover a non-exclusive inclusion.

Example 1

A single-element beam-splitting and combining interferometer, including elements, a light beam is divided into two beams after entering the element, that is, a first beam of light 100 and a second beam of light 200, and the first beam of light 100 and the second beam of light 200 After even and odd times of reflection in the component, the two beams of light are recombined in the component after reflection, and finally emitted from the combined beam of the component.

The element includes a beam-splitting plane 300, which is a polarization beam-splitting plane 300, that is, splitting light into orthogonal polarization components.

Alternatively, the light-splitting plane 300 is a non-polarized light-splitting plane, which is an ordinary light-splitting plane, that is, it is not sensitive to polarization.

The beam splitting plane 300 divides the light beam into two paths of light, that is, the first beam of light 100 and the second beam of light 200. These two paths of light respectively experience odd and even times of reflection in the element, and finally pass through the beam splitting plane 300 Combining beams, the two paths of light interfere and recombine together. The reflection of the light beam can be realized by total internal reflection, or by other reflection methods such as dielectric film.

Further, the two-way splitting ratio of the splitting plane 300 can also be flexibly designed and processed.

The number of prism surfaces on the side of the element corresponding to the first beam of light 100 is 2 greater than the number of reflections of the first beam of light 100, and the number of prism surfaces on the side of the element corresponding to the side of the second beam of light 200 is the same as that of the second beam of light 200. The number of reflections of the light 200 is the same, and the distribution of prisms on both sides of the element is symmetrical along the central normal of the middle beam splitting plane 300 .

Both the light beam incident end 400 and the light beam exit end 500 of the element are in a right-angle structure.

As shown in Figure 1-2, the first beam of light 100 undergoes 2 reflections in the element, and the second beam of light 200 undergoes 3 reflections in the element (including 2 reflections of the beam splitting plane 300 and 1 reflection from the side of the component), and finally exits the combined beam from the component.

The number of prism surfaces on the side of the element corresponding to the first beam of light 100 is four, namely mirror A1110, mirror A2120, mirror A3130, and mirror A4140, the angle between the mirror A1110 and the mirror A2120, the mirror A3130 and the mirror A4140 The included angles are all 154-160°, and the included angles between the mirror surface A2120 and the mirror surface A3130 are 132-138°.

Preferably, the included angle between the mirror A1110 and the mirror A2120, the included angle between the mirror A3130 and the mirror A4140 are both 157.5°, and the included angle between the mirror A2120 and the mirror A3130 is 135°.

The number of prism faces on the side of the element corresponding to the second beam of light 200 is three, namely mirror B1210, mirror B2220, and mirror B3230, the angle between the mirror B1210 and the mirror B2220, the angle between the mirror B2220 and the mirror B3230 Both are 132-138°.

Preferably, the included angle between the mirror B1210 and the mirror B2220, and the included angle between the mirror B2220 and the mirror B3230 are both 135°.

Example 2

Based on the above-mentioned embodiment 1, the similarities will not be repeated, the difference is that, as shown in Figures 3-4, the first beam of light 100 is reflected twice in the element, and the second beam of light 200 After 5 reflections in the element (including 2 reflections at the beam splitting plane 300 and 3 reflections at the side of the element), it finally exits the combined beam of the element.

The number of prism surfaces on the side of the element corresponding to the first beam of light 100 is four, namely mirror A1110, mirror A2120, mirror A3130, and mirror A4140, the angle between the mirror A1110 and the mirror A2120, the mirror A3130 and the mirror A4140 The included angles are all 154-160°, and the included angles between the mirror surface A2120 and the mirror surface A3130 are 132-138°.

Preferably, the included angle between the mirror A1110 and the mirror A2120, the included angle between the mirror A3130 and the mirror A4140 are both 157.5°, and the included angle between the mirror A2120 and the mirror A3130 is 135°.

The number of prism surfaces of the element corresponding to the side of the second beam of light 200 is five, namely mirror B1210, mirror B2220, mirror B3230, mirror B4240, mirror B5250, the angle between the mirror B1210 and mirror B2220, the mirror B4240 The angles between the mirror surface B5250 and the mirror surface B5250 are all 162-168°, the angles between the mirror surface B2220 and the mirror surface B3230, and the angles between the mirror surface B3230 and the mirror surface B4240 are all 147-153°.

Preferably, the angle between the mirror surface B1210 and the mirror surface B2220, the angle between the mirror surface B4240 and the mirror surface B5250 are all 165°, the angle between the mirror surface B2220 and the mirror surface B3230, and the angle between the mirror surface B3230 and the mirror surface B4240 are all 150° .

It should be noted that the two beams of light in the present invention are not limited to 2 and 3, 2 and 5 reflections in the element through even and odd reflections, and can be other odd and even combinations, for example, 4 and 7 times, 4 times and 9 times etc.

The above-mentioned single-element beam splitting and combining interferometer realizes beam splitting, interference, and beam combining in one element, and the parity of the reflection times of the two beams of light in the element is different. It is an integrated orthogonal polarization or same polarization single element interferometer , has a wide variety of applications.

In the above-mentioned single-element beam-splitting and combining interferometer, the parity of the two light reflections is different. Therefore, when the vortex beam is incident on the element, it is divided into two beams inside the element, of which one beam is reflected by an even number of times. , the topological charge of the vortex remains unchanged, and the other beam of light undergoes an odd number of reflections, and the topological charge of the vortex is opposite. Two beams carrying opposite topological charges are recombined inside the element before exiting. When the beam-splitting plane 300 is designed as a polarization beam-splitting plane, the two beams are respectively in the horizontal polarization state and the vertical polarization state. Therefore, the beam combining before exiting will be It is the synthesis of vortex beams carrying opposite topological charges of orthogonal linear polarization base vectors, and naturally forms vector beam output.

Example 3

Based on the above-mentioned embodiment 2, construct a compact vector light field generating device, as shown in Figure 5, place a 1/2 wave plate 600 in front of the polarization interference prism, when the horizontally polarized vortex beam is incident on the 1/2 wave plate 600 , the polarization direction is rotated to 2θ. According to Marius’s law, after the beam enters the single-element beam splitting and combining interferometer in Embodiment 2, if the beam splitting plane 300 is polarized beam splitting, the internally divided two beams of light The intensity ratio is: cos ² 2θ sin ² 2θ. In addition, a 1/4 wave plate can be placed or not placed at the output end of the component (polarization interference prism). If a 1/4 wave plate is placed and the optical axis direction is adjusted to 45° , the two beam components are combined and modulated into left and right circularly polarized light respectively. At this time, two left and right circularly polarized lights carrying opposite topological charges can be superimposed to generate a local linear polarization vector light field. By adding a Babinet-like phase retarder to change the phase difference between the horizontal and vertical polarization components, the type of the generated vector light field can be changed by adjusting the phase difference between the two synthesized base vectors.

FIG. 6 shows the local linear polarization vector light field generated by using the single-element beam splitting and combining interferometer in Embodiment 2 and the optical path in FIG. 5 . Wherein, the first row is the exit light spot that does not pass through the analyzer 800 , and the second to fifth rows are the light spot patterns after passing through the horizontal, vertical, 45°, -45° analyzer 800 respectively. The first column is the direction of the analyzer 800, the second column is the radial polarization vector field, the third column is the handedness vector light field, and the fourth column is the exit vector of the vortex beam with a topological charge of 3 passing through the device in Figure 5 Light field, the fifth column is the vector light field generated by the vortex beam with a topological charge of 5 passing through the device in Figure 5.

其本质是一类杂化矢量光场，即椭偏率沿旋向角度变化的矢量光场，为了表征各点椭偏度及长轴取向，完全标定偏振态空间分布，图7测量给出了Stokes参量的空间分布。图7中前两行的杂化场具有始终为0的Stokes参量之一：S2＝0。第三行表示椭圆偏振基矢合成的杂化矢量场，椭圆偏振基矢的实现通过将WP处放置1/4波片且旋转其角度实现。第四行杂化场为入射涡旋拓扑荷为3的情况。In one embodiment, if the wave plate (WP) 700 in FIG. 5 is a 1/2 wave plate 600 or when the wave plate is removed, the outgoing beam base vectors are respectively +45° and -45° linear polarization base vectors, Then the obtained vector light field expression:

Its essence is a kind of hybrid vector light field, that is, the vector light field whose ellipticity changes along the hand angle. In order to characterize the ellipticity and long-axis orientation of each point, and completely calibrate the spatial distribution of the polarization state, the measurement in Fig. 7 gives Spatial distribution of Stokes parameters. The hybridization fields in the first two rows of FIG. 7 have one of the Stokes parameters always zero: S2=0. The third row represents the hybridization vector field synthesized by the elliptical polarization basis vector, and the realization of the ellipse polarization basis vector is realized by placing a 1/4 wave plate at WP and rotating its angle. The hybrid field in the fourth row is the case where the incident vortex topological charge is 3.

Example 4

其中

和

为左右旋圆偏振基矢，而a，b则为相对强度，基于这一原理和光路配置，生成了图8中第1，2，4行所示的以左右旋圆偏振基矢的高阶庞加莱球矢量场，其中，第4行为入射涡旋拓扑荷为5的情况。倘若元件(棱镜)后的1/4波片的快轴非45°方向，则可以生成以椭圆偏振为基矢的非等光强相反拓扑荷涡旋场的叠加，叠加后输出端出射场为类似图8第3行所示的矢量场结果。Based on the above-mentioned embodiment 3, a high-order Poincaré sphere vector field is generated, and the high-order Poincaré sphere is characterized by a uniform ellipticity in space and only a spatial change in the orientation of the major axis. The specific generated operation method is to change the polarization direction of the incident light by rotating the 1/2 wave plate 600 of the incident end 400, and then change the light intensity ratio of the two beams of light in the element, and obtain a vector light field of unequal light intensity synthesis at the exit end . At this time, when the orientation of the fast axis of the 1/4 wave plate placed behind the element (prism) is 45°, the expression for the exit end is:

in

and

is the right-handed circular polarization base vector, and a and b are the relative intensities. Based on this principle and optical path configuration, the high-order Poincaré sphere vector field, where the fourth row is the case where the incident vortex topological charge is 5. If the fast axis of the 1/4 wave plate behind the element (prism) is not in the direction of 45°, then the superposition of the vortex field with non-equal light intensity and opposite topological charge can be generated with ellipsoidal polarization as the base vector. After the superposition, the outgoing field at the output end is Similar to the vector field result shown in row 3 of Figure 8.

Example 5

Based on the above-mentioned embodiment 2, it is used as the measurement of the topological charge of the vortex light field. For example, the vortex beam carrying any topological charge m is incident on the beam-splitting and combining interferometer of this single element, and the optical path of FIG. 5 is used to analyze the polarization. , the petal-shaped light spot can be obtained, and after analysis, the number of bright petals is always equal to twice the absolute value of the topological charge of the incident vortex light field. Therefore, the absolute value of the topological charge of the vortex light field can be measured by counting the number of petals . In order to further judge whether the topological charge of the vortex light field is positive or negative, a vortex phase plate with a topological charge of 1 can be added to the incident end 400 after one measurement, and two measurements are performed. If the number of petals is compared with the first measurement result If it increases, it means that the topological charge of the vortex light field to be measured is a positive number, otherwise, it is a negative number. In the secondary measurement, the topological charge of the additional vortex phase plate is not necessarily 1, and it can be any other value.

Figure 9 shows an example of the measurement of topological charges. Columns 1 and 2 represent the outgoing light spot directly detected by the analyzer 800 and the light spot near the focal plane after passing through the analyzer 800 and the focus of the lens. Columns 3 and 4 Respectively represent the speckle pattern after the analyzer and the focal field pattern near the focal plane obtained by the secondary measurement after adding the vortex phase plate with an additional topological charge of 1. From top to bottom, each row represents the measurement result of a topological charge vortex field, and the topological charges are: +4, -4, +32, -32, +64, +65. By counting the number of petals in the first two columns, you can get the number of petals in each row from top to bottom: 8, 8, 64, 64, 128, 130. After adding a vortex phase plate with a topological charge of +1 and performing a second measurement, the spot patterns of the last two columns are obtained, and the number of petals is 10, 6, 66, 62, 130, 132 respectively. From the measurement results, it can be completely confirmed that the vortex topological charges are: +4, -4, +32, -32, +64, +65.

The above examples prove that the single-element beam splitting and combining interferometer can accurately and completely measure the topological charge of the optical vortex. In addition, in this example, only the structure in which the beam-splitting plane 300 is a polarization beam-splitting plane is used. If another structure is used: that is, the internal beam-splitting plane 300 is a polarization-independent beam-splitting plane, then when measuring the topological charge, the wave plate and The analyzer 800 measures the topological charge of the vortex beam more concisely.

The above descriptions are only preferred embodiments of the present invention, which do not limit the protection scope of the present invention. For those skilled in the art, the present invention may have various modifications and changes. Within the spirit and principles of the present invention, changes, modifications, substitutions, integrations and parameter changes of these embodiments without departing from the principles and spirit of the present invention by conventional substitutions or capable of achieving the same function fall within the scope of the present invention. Into the protection scope of the present invention.

Claims (3)

1. A single-element beam-splitting and combining interferometer is characterized in that it comprises an element, and the light beam enters the element and is divided into two beams of light, i.e. a first beam of light (100) and a second beam of light (200), the first beam of light (100) and the second beam of light (200). The first beam of light (100) and the second beam of light (200) undergo even-numbered and odd-numbered reflections respectively in the element, and after reflection, the two beams of light are recombined in the element and finally emitted from the element; The element includes a beam splitting plane (300), and the beam splitting plane (300) is a polarization beam splitting plane (300) or a non-polarization beam splitting plane (300); The first beam of light (100) undergoes 2 reflections in the element, and the second beam of light (200) undergoes 3 or 5 reflections in the element; Both the light beam incident end (400) and the light beam exit end (500) of the element are of right-angle structure; The number of surfaces of the prism on the side of the element corresponding to the first beam of light (100) is 2 greater than the number of reflections of the first beam of light (100), and the number of surfaces of the prism on the side of the element corresponding to the side of the second beam of light (200) is larger The number of surfaces is the same as the number of reflections of the second beam of light (200), and the distribution of prisms on both sides of the element is symmetrical along the central normal of the middle splitting plane (300); The number of prism faces on the side of the element corresponding to the first beam of light (100) is four, namely mirror A1 (110), mirror A2 (120), mirror A3 (130), and mirror A4 (140). The angle between mirror surface A1 (110) and mirror surface A2 (120), the angle between mirror surface A3 (130) and mirror surface A4 (140) are all 157.5°, and the angle between mirror surface A2 (120) and mirror surface A3 (130) is 135°; When the second beam of light (200) is reflected three times in the element: the number of prism surfaces on the side of the element corresponding to the second beam of light (200) is three, that is, the mirror surface B1 (210), the mirror surface B2 (220), mirror surface B3 (230), the angle between described mirror surface B1 (210) and mirror surface B2 (220), the angle between mirror surface B2 (220) and mirror surface B3 (230) are all 135 °; Or when the second beam of light (200) is reflected five times in the element, the number of prism surfaces on the side of the element corresponding to the second beam of light (200) is five, that is, the mirror surface B1 (210), Mirror surface B2 (220), mirror surface B3 (230), mirror surface B4 (240), mirror surface B5 (250), the included angle between mirror surface B1 (210) and mirror surface B2 (220), mirror surface B4 (240) and mirror surface B5 ( The included angle of 250) is 165°, the included angle between the mirror surface B2 (220) and the mirror surface B3 (230), and the angle between the mirror surface B3 (230) and the mirror surface B4 (240) are all 150°; When the second beam of light (200) is reflected 3 times or 5 times in the element, the included angle between the mirror surface A1 (110) and the beam splitting plane (300) is 45°, and the angle between the mirror surface B1 and the The included angle of the light splitting plane (300) is 45°. 2. A vector light field generation device, characterized in that it comprises the single-element beam splitting and combining interferometer according to claim 1. 3. A vortex light field topological charge measurement device, characterized in that it comprises the single-element beam splitting and combining interferometer according to claim 1.

Images