CN112380798B - Parameter checking method, device, equipment and storage medium - Google Patents

Abstract

The present application provides a parameter inspection method, device, device and storage medium. The method includes: receiving an inspection instruction, wherein the inspection instruction carries an identifier of a circuit to be tested and an identifier of a target function to be tested; according to the target function identifier , obtain at least one target module information in which the target function is configured, and the target module is a sub-circuit module in the circuit to be tested; analyze the circuit to be tested based on the identifier of the circuit to be tested, and from the analysis result Extract the target instantiation unit parameters included in each of the target modules; check the correctness of the target instantiation unit parameters, and generate a check result. The present application analyzes the extracted structural information of the circuit to be tested according to the user configuration information to generate the target parameter report and check status of the target module, which greatly reduces the workload of manual verification and improves the verification efficiency.

Description

Parameter inspection method, device, equipment and storage medium

technical field

The present application relates to the technical field of integrated circuits, and in particular, to a parameter checking method, device, device and storage medium.

Background technique

SOC (System on Chip, system-on-chip) is a system or product formed by combining multiple integrated circuits with specific functions on a chip, which includes a complete hardware system and its embedded software.

With the development of information technology, SOC has more and more functions and larger scale. For the reusability of SOC design, some common and configurable bottom units are generally established. On the basis of simplifying the design, according to different examples parameters to meet the needs of different designs. For example, for a clock domain crossing (Clock Domain Crossing, hereinafter referred to as CDC) module, its simulation model usually provides different parameters to realize different cross-clock domain synchronizers, such as different synchronizer stages, to be synchronized The bit width of the signal, and whether there is a set terminal or a reset terminal, etc. For the instantiated units of these common modules, different configuration parameters will make their design forms and functions vary widely. Still taking the above-mentioned CDC module as an example, whether it is instantiated as a 2-stage or 3-stage synchronizer, the supporting design circuit is different. However, when designers use these general-purpose modules, they cannot always be aware of whether the parameters are used correctly. When the instantiation of common modules is everywhere in the entire design, manpower can no longer ensure that their use is correct, so how to ensure the correctness of these parameters, so as to ensure the correctness of the design, It has also become the scope that verifiers need to verify. In the existing technology, the correctness of the parameters is generally ensured by manually reviewing the design code. The parameters of the module are based on the instantiation unit. The same module may have different parameter values in different instantiation units, so it needs to be reviewed. All instantiation units, the workload is huge.

Contents of the invention

The purpose of the embodiment of the present application is to provide a parameter inspection method, device, device and storage medium, which analyzes and extracts the structure information of the circuit to be tested according to the user configuration information to generate the target parameter report and inspection status of the target module, greatly reducing the The workload of manual verification is reduced, and the efficiency of verification is improved.

The first aspect of the embodiment of the present application provides a parameter inspection method, including: receiving an inspection instruction, the inspection instruction carries the identifier of the circuit to be tested and the identifier of the target function to be tested; according to the identifier of the target function, obtain the Information about at least one target module configured with the target function, the target module being a sub-circuit module in the circuit to be tested; analyzing the circuit to be tested based on the identification of the circuit to be tested, and extracting each The target instantiation unit parameter included in the target module; checking the correctness of the target instantiation unit parameter, and generating a check result.

In one embodiment, analyzing the circuit under test based on the identification of the circuit under test, and extracting the target instantiation unit parameters included in each target module from the analysis result includes: based on the circuit under test Parsing the circuit under test according to the identification of the test circuit, extracting the instantiation parameters of each instantiation unit of the test circuit; for each target module, traversing the instantiation parameters of each instantiation unit of the test circuit parameters, select all target instantiation units belonging to the target module, and extract parameters of the target instantiation units.

In one embodiment, the checking the correctness of the target instantiation unit parameters and generating the checking result includes: separately obtaining the target parameters configured for each of the target modules; for each of the target modules, respectively Each target instantiated unit parameter is compared with the target parameter to generate a parameter comparison result, and the checking result is the parameter comparison result.

In one embodiment, for each of the target modules, each target instantiation unit parameter is compared with the target parameter to generate a parameter comparison result, and the check result is the parameter comparison The results include: for each of the target modules, separately judge whether the parameters of each of the target instantiation units are the same as the target parameters, and if they are the same, record in the check result that the target instantiation unit passes the parameter check , otherwise, it is recorded in the check result that the target instantiation unit fails the parameter check.

In one embodiment, after checking the correctness of the parameters of the target instantiation unit and generating the check result, it further includes: performing the parameter check result of each target instantiation unit according to the target module to which it belongs Store in groups.

In an embodiment, the method further includes: grouping and storing the target parameters and parameter inspection results of each target instantiation unit according to the target function to which it belongs, and generating a parameter report for each target function.

In an embodiment, the method further includes: calculating a parameter inspection passing rate of each target function based on the parameter report, and outputting prompt information.

The second aspect of the embodiment of the present application provides a parameter inspection device, including: a receiving module, configured to receive an inspection instruction, the inspection instruction carrying the identifier of the circuit to be tested and the identifier of the target function to be tested; Obtaining at least one target module information on which the target function is configured according to the target function identifier, the target module is a sub-circuit module in the circuit under test; an analysis module is used for Identifying and analyzing the circuit to be tested, extracting target instantiation unit parameters included in each target module from the analysis results; a check module, used to check the correctness of the target instantiation unit parameters, and generate a check result.

In one embodiment, the parsing module is configured to: parse the circuit under test based on the identification of the circuit under test, and extract instantiation parameters of each instantiation unit of the circuit under test; The target module traverses the instantiation parameters of each instantiation unit of the circuit under test, selects all target instantiation units belonging to the target module, and extracts the target instantiation unit parameters.

In one embodiment, the checking module is used to: separately obtain the configured target parameters of each of the target modules; The parameter comparison is to generate a parameter comparison result, and the checking result is the parameter comparison result.

In one embodiment, for each of the target modules, each target instantiation unit parameter is compared with the target parameter to generate a parameter comparison result, and the check result is the parameter comparison The results include: for each of the target modules, separately judge whether the parameters of each of the target instantiation units are the same as the target parameters, and if they are the same, record in the check result that the target instantiation unit passes the parameter check , otherwise, it is recorded in the check result that the target instantiation unit fails the parameter check.

In an embodiment, it further includes: a storage module, configured to check the correctness of the parameters of the target instantiation unit and generate the check result, and store the parameter check result of each target instantiation unit according to the corresponding The target modules are grouped and stored.

In one embodiment, it further includes: a generating module, configured to group and store the target parameters and parameter inspection results of each target instantiation unit according to the target function to which it belongs, and generate each target Function's parameter report.

In one embodiment, it further includes: an output module, configured to calculate the parameter inspection pass rate of each target function based on the parameter report, and output prompt information.

The third aspect of the embodiment of the present application provides an electronic device, including: a memory, used to store computer programs; a processor, used to execute the method of the third aspect of the embodiment of the present application and any embodiment thereof, to check the The correctness of the parameters of the target instantiation unit in the circuit.

The fourth aspect of the embodiment of the present application provides a non-transitory electronic device-readable storage medium, including: a program that, when run by the electronic device, enables the electronic device to execute the first aspect of the embodiment of the present application and any other A method of an embodiment.

The parameter inspection method, device, equipment and storage medium provided by this application extract all parameters corresponding to the target module from the structural information of the circuit to be tested by analyzing the compiled circuit to be tested and according to the user's query instructions and configuration files. The parameters of the instantiated unit are checked, and the check results are generated for reference by the verifier, which greatly reduces the workload of parameter checking and improves the efficiency of parameter verification.

Description of drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present application, the accompanying drawings that need to be used in the embodiments of the present application will be briefly introduced below. It should be understood that the following drawings only show some embodiments of the present application, so It should not be regarded as a limitation on the scope, and those skilled in the art can also obtain other related drawings according to these drawings without creative work.

FIG. 1 is a schematic structural diagram of an electronic device according to an embodiment of the present application;

FIG. 2 is a schematic flowchart of a parameter checking method according to an embodiment of the present application;

FIG. 3 is a schematic flowchart of a parameter checking method according to an embodiment of the present application;

FIG. 4 is a schematic flowchart of a parameter checking method according to an embodiment of the present application;

FIG. 5 is a schematic structural diagram of a parameter inspection device according to an embodiment of the present application.

Detailed ways

The technical solutions in the embodiments of the present application will be described below with reference to the drawings in the embodiments of the present application. In the description of the present application, the terms "first", "second" and the like are only used for distinguishing descriptions, and cannot be understood as indicating or implying relative importance.

As shown in FIG. 1 , this embodiment provides an electronic device 1 , including: at least one processor 11 and a memory 12 , and one processor is taken as an example in FIG. 1 . Processor 11 and memory 12 are connected via bus 10 . The memory 12 stores instructions that can be executed by the processor 11, and the instructions are executed by the processor 11, so that the electronic device 1 can execute all or part of the flow of the method in the following embodiments to check the target instantiation unit in the circuit to be tested The correctness of the parameters.

In one embodiment, the electronic device 1 may be a mobile phone, a tablet computer, a notebook computer, a desktop computer and other devices.

Please refer to FIG. 2, which is a parameter inspection method of an embodiment of the present application. This method can be executed by the electronic device 1 shown in FIG. 1, and can be applied to the parameter inspection scene of an integrated circuit to verify the target in the circuit The correctness of instantiation unit parameters. The method comprises the steps of:

Step 201: Receive an inspection instruction, which carries the identification of the circuit to be tested and the identification of the target function to be tested.

In this step, in an actual scenario, the user can specify the circuit module to be tested, that is, trigger an inspection instruction for a certain circuit to be tested that needs parameter verification, and the inspection instruction can at least include the identification of the circuit to be tested and the Target feature ID.

In actual scenarios, since the designed circuit module may contain multiple instantiation parameters, and these instantiation parameters may correspond to different functions, the parameters to be checked can be classified according to different function models, so that examine. Take the aforementioned CDC module as the circuit to be tested as an example. For example, the parameter TYPE corresponds to the form of the synchronizer, the parameter MetaEn corresponds to the metastable modeling enable, and the parameter CheckEn corresponds to the switch of the checker, which can be divided into different target functions Check targets, such as CDC Meta and CDC Check, etc.

The configuration file interface can be opened to obtain the inspection instructions and configuration files provided by the user. The configuration file can include the identification of the target function (Model item) to be tested, the corresponding underlying sub-circuit module name (Module item) and target parameters (Parameter item ),As shown in Table 1:

Table 1. Configuration files

Among them, feature[i] indicates the target function that needs to be checked for item i, such as CDC Meta and CDC Check, etc., module[i][0]...module[i][Ni] indicates the sub-circuit module to be checked, and the subsequent parameter setting indicates the parameter configuration value or configuration expression required when the sub-circuit module needs to support this function. The configuration file can be maintained by the user, and the user can delete each feature according to actual needs, and can easily expand the items to be checked.

In one embodiment, taking the CDC module as the circuit to be tested as an example, when the parameters of the CDC module need to be verified, the user can trigger the inspection instruction and receive the inspection instruction in real time.

In one embodiment, taking CDC module parameter inspection as an example, the identification of the circuit to be tested in the inspection instruction can be CDC, and the information carried in the inspection instruction can be expressed in the form of a configuration file, as shown in Table 2:

Table 2. Configuration files for check directives

In Table 2, the user specifies two target functions to be tested that need to be checked in the CDC module, and the target functions to be tested are identified as CDC Meta and CDC Check respectively. Wherein, each target function may have corresponding target module information and corresponding parameters.

Step 202: Obtain at least one target module information on which the target function is configured according to the target function identifier, where the target module is a sub-circuit module in the circuit to be tested.

In this step, the acquired user configuration files (such as Table 2) are analyzed item by item to obtain the target module and its parameter settings corresponding to each target function to be checked. The target module is a sub-circuit module in the circuit to be tested. One target function may correspond to one or more target modules. For example, in Table 2, the target function CDC Meta corresponds to a target module cdc_model_rand, and the target function CDC Check corresponds to two target modules cdc_model_ext and cdc_model_rand.

Step 203: Analyze the circuit under test based on the identification of the circuit under test, and extract the target instantiation unit parameters included in each target module from the analysis result.

In this step, assuming that the circuit to be tested is marked with CDC, the circuit to be tested is a cross-clock domain module, and the checked circuit to be tested is analyzed to extract the required circuit structure information. For example, the circuit to be tested can be analyzed through the interface provided by the NPI (Native Program Interface) of Verdi (Synopsys' simulation analysis tool), and the circuit hierarchy, sub-circuit module name and instantiation parameters can be generated according to the circuit design input. and other information, and then extract the target instantiation unit parameters included in each target module from the parsing result.

Step 204: Check the correctness of the parameters of the target instantiation unit, and generate a check result.

In this step, the parameters of the target instantiated unit are check items determined based on the user’s configuration file. For a circuit to be tested, only the correctness of the parameters of the target instantiated unit is checked, reducing the cost of a comprehensive inspection of the entire circuit to be tested. Huge workload, improve parameter verification efficiency.

The above parameter inspection method extracts the parameters of all instantiated units corresponding to the target module from the structural information of the circuit under test according to the user's query instructions and configuration files by analyzing the compiled circuit to be tested, and performs inspection. The inspection results are generated for reference by verification personnel, which greatly reduces the workload of parameter inspection and improves the efficiency of parameter verification.

Please refer to FIG. 3, which is a parameter inspection method according to an embodiment of the present application. This method can be executed by the electronic device 1 shown in FIG. The correctness of instantiation unit parameters. The method comprises the steps of:

Step 301: Receive an inspection instruction, which carries the identification of the circuit to be tested and the identification of the target function to be tested. For details, refer to the description of step 201 in the foregoing embodiments.

Step 302: Obtain at least one target module information on which the target function is configured according to the target function identifier, where the target module is a sub-circuit module in the circuit to be tested. For details, refer to the description of step 202 in the foregoing embodiments.

Step 303: Analyze the circuit under test based on the identification of the circuit under test, and extract instantiation parameters of each instantiated unit of the circuit under test.

In this step, for example, the circuit to be tested can be analyzed through the interface provided by Verdi's NPI, and an intermediate file including circuit hierarchy, sub-circuit module name and instantiation parameters can be generated according to the circuit design input, as shown in Table 3:

Table 3. Circuit structure design information extracted by Verdi

… … Hierarchy_Path[i] Module_Name[i] Hierarchy_Path[i+1] Module_Name[i+1] ... … Hierarchy_Path[j] Module_Name[j] Parameter_List[j] … …

Among them, Hierarchy_Path[i] represents the hierarchical structure of the i-th instantiation unit, and Module_Name[i] represents the sub-circuit module corresponding to the i-th instantiation unit. Since this instantiation unit has no instantiation parameters, it is Hierarchy_Path [i+1] Hierarchy of the i+1th instantiated unit. Hierarchy_Path[j] represents the hierarchical structure of the jth instantiation unit, Module_Name[j] represents the subcircuit module corresponding to the jth instantiation unit, and the subsequent Parameter_List[j] represents the instantiation of the jth instantiation unit parameter.

In one embodiment, the instantiation parameters of a single instantiation unit may be as shown in Table 4:

Table 4. Instantiation parameter information of the jth instantiation unit

Parameter[j][0]=Value[j][0] … Parameter[j][k]=Value[j][k] … Parameter[j][N_j]＝Value[j][N_j]

Among them, Parameter[j][k] represents the k-th instantiation parameter of the j-th instantiation unit, Value[j][k] represents the value of the k-th instantiation parameter of the j-th instantiation unit, and Nj represents The jth instantiation unit has Nj instantiation parameters in total.

Step 304: For each target module, traverse the instantiation parameters of each instantiation unit of the circuit under test, select all target instantiation units belonging to the target module, and extract target instantiation unit parameters.

In this step, one target function may correspond to multiple target modules. For each target module, traverse the structure information of the circuit to be tested analyzed in step 303, select all target instantiation units belonging to the target module, and extract the target instance unit parameters.

Step 305: Obtain the configured target parameters of each target module.

In this step, the target parameter is a preset standard parameter. Only when the instantiation parameter of the corresponding instantiation unit in the circuit to be tested meets the target parameter, the instantiation unit is considered to have passed the parameter verification, which can be set based on actual needs. The value of the target parameter.

Taking Table 2 as an example, for example, in order to realize the target function CDC Meta, all instantiation units corresponding to the target module cdc_model_rand must configure the parameter MetaEn as 1. For example, in order to realize the target function CDC Check, all instantiation units corresponding to the target module cdc_model_ext must configure the parameter AssertEn to 1. For example, in order to realize the target function CDCCheck, all instantiation units corresponding to the target module cdc_model_rand must configure the parameter CheckEn as 1.

Step 306: For each target module, compare each target instantiation unit parameter with the target parameter, generate a parameter comparison result, and check the result as the parameter comparison result.

In this step, the target parameter is a preset standard parameter, and each target instantiation unit parameter is compared with its corresponding target parameter one by one to obtain respective comparison results as respective corresponding inspection results.

In one embodiment, for each target module, it is judged whether the parameters of each target instantiation unit are the same as the target parameters. If they are the same, the check result records that the target instantiation unit passes the parameter check; otherwise, the check result records the target instance The chemical unit failed the parameter check.

In one embodiment, for an instantiation unit of a certain design module, its parameter comparison result can be stored in a hash array as shown in Table 5:

Table 5. Parameter comparison results of an instantiated unit

Among them, the value of the key hier represents the hierarchical structure path extracted from the design information. Since there may be multiple parameters, the parameter part can be represented by a two-dimensional hash array. The index of the first dimension is Params to distinguish it from Hier and Status. The keys of the second dimension, Params[0] to Params[N], represent The configuration file extracts N target parameters from the design information, and the values of keys Params[0] to Params[N] represent the values of these target parameters. feature[0]status to feature[M]status indicate the result of checking according to the target parameter settings of the configuration file. If it matches the expectation, it is PASS (passed), otherwise it is FAIL (failed).

For example, taking the target function CDC Meta as an example, analyze the instantiation unit hierarchy 0, the instantiation parameter MetaEn is 1, which meets the configuration requirements in Table 2, the check result is PASS, and the final status can be marked as Done. For the instantiation unit hierarchy N, whose instantiation parameter MetaEn is 0, does not meet the configuration requirements in Table 2, and the check result is FAIL.

Step 307: Group and store the parameter checking results of each target instantiation unit according to the target modules it belongs to.

In this step, one target module can correspond to one or more target instantiation units, and the parameter comparison information of each target instantiation unit can be represented by a hash array similar to that shown in Table 5, referred to as sub_hash. After the structure information of the entire circuit to be tested, a hash array containing parameter comparison information of all target module instantiation units will be generated, which is called instance hash, and its structure is shown in Table 6:

Table 6. Instance hash - parameter comparison information of all module instantiation units

Wherein, module[i] indicates the i-th target module, and Mi indicates that the module has a total of Mi instantiation units, and the information of each instantiation unit is stored in the hash array shown in Table 5.

Step 308: Store the target parameters and parameter inspection results of each target instantiation unit in groups according to the target functions they belong to, and generate a parameter report for each target function.

In this step, a parameter report in the form of an Excel table can be generated according to the information of the example hash in Table 6, and the parameter report includes parameter reports of different target modules with different target functions. Specifically, taking the CDC module as an example of the circuit to be tested, the parameter report of a certain target module of a certain target function can be shown in Table 7:

Table 7. Parameter report for a target function of the CDC module

Progress xxx

Among them, in addition to the target parameter information (Parameter[0]...Parameter[M]), it also contains the check result information (Check Status) of each target instantiation unit, that is, if it conforms to the target parameter settings defined in the configuration file, then It is PASS, and the final Check Status will be automatically marked as Done. If it does not meet the target parameter settings defined in the configuration file, Check Status will be FAIL.

Step 309: Based on the parameter report, calculate the pass rate of parameter inspection for each target function, and output prompt information.

In this step, there may be parts that failed the inspection in the results of the automatic parameter inspection, which can be manually inspected, so based on the parameter report, the parameter inspection pass rate of each target function can be calculated and prompted to the user. For user's reference which parts need to be checked manually.

For example, in Table 7, the Progress part at the top of the table is the completion rate of the Status column automatically counted by the formula, which is used to represent the progress of the parameter inspection. Among them, the instantiated unit whose Check Status is FAIL needs manual inspection. If the inspection of all FAIL units is completed manually, filling in the Status can achieve a 100% completion rate.

In one embodiment, when the parameter report shown in Table 6 is generated, the history record of the generated and completed parameter inspection report can also be read at the same time, and the status of the completed parameter inspection part can be merged into the new parameter report, and then it can be repeated. Use the historical parameter report, so you can only focus on the current part of the circuit to be tested to improve efficiency.

In one embodiment, taking the configuration file of the CDC module of the circuit to be tested by the user shown in Table 2 as an example, its parameter report can be as shown in Table 8:

Table 8. Parameter report for the CDC module corresponding to Table 7

Progress 80.2%

Among them, the target instantiation unit corresponding to hierarchy 0 is analyzed, the instantiation parameter MetaEn is 1, which meets the configuration requirements in Table 2, the check status is PASS, and the final status is marked as Done. For the target instantiation unit hierarchyN, its instantiation parameter MetaEn is 0, which does not meet the configuration requirements in Table 2, and the inspection status is FAIL, which can be checked manually. The Progress at the head of the table is 80.2%, which means that the target instantiation units whose inspection status is PASS account for 80.2% of the total, and the rest are FAIL, which can be manually inspected one by one and filled in Status based on the inspection results. The inspector only needs to pay attention to Progress item to track the progress of the inspection.

As shown in FIG. 4, it is a parameter inspection method of an embodiment of the present application. This method can be executed by the electronic device 1 shown in FIG. 1, and can be applied to the parameter inspection scene of an integrated circuit to verify the Correctness of target instantiation unit parameters. The method comprises the steps of:

Step 401: Read the configuration file.

Step 402: read the structural information of the circuit to be tested,

Step 403: Determine whether each instantiated unit in the structure information corresponds to the configured target module that needs to be checked. If yes, go to step 404 , otherwise go to step 408 .

Step 404: Further obtain the corresponding actual parameters.

Step 405: Extract target parameters according to user configuration to verify correctness of actual parameters.

Step 406: Store the inspection results according to Table 6. For details, refer to the description in the embodiment shown in FIG. 3 above.

Step 407: Determine whether there is unprocessed structure information, if yes, go to step 408, otherwise go to step 409.

Step 408: Read the next piece of structural information, return to step 403.

Step 409: Generate a parameter report for each target function.

Please refer to FIG. 5, which is a parameter inspection device 500 according to an embodiment of the present application. This device can be applied to the electronic device 1 shown in FIG. 1, and can be applied to the parameter inspection scene of an integrated circuit to verify the Correctness of target instantiation unit parameters. The device includes: receiving module 501, obtaining module 502, parsing module 503 and checking module 504, and the principle relationship of each module is as follows:

The receiving module 501 is configured to receive an inspection instruction, and the inspection instruction carries the identification of the circuit to be tested and the identification of the target function to be tested. For details, refer to the description of step 201 in the foregoing embodiments.

The acquiring module 502 is configured to acquire at least one target module information on which the target function is configured according to the target function identifier, where the target module is a sub-circuit module in the circuit to be tested. For details, refer to the description of step 202 in the foregoing embodiments.

The analysis module 503 is configured to analyze the circuit under test based on the identification of the circuit under test, and extract the target instantiation unit parameters included in each target module from the analysis result. For details, refer to the description of step 203 in the foregoing embodiments.

The checking module 504 is configured to check the correctness of the parameters of the target instantiation unit and generate a checking result. For details, refer to the description of step 204 in the foregoing embodiments.

In one embodiment, the analysis module 503 is configured to: analyze the circuit under test based on the identification of the circuit under test, and extract instantiation parameters of each instantiation unit of the circuit under test. For each target module, traverse the instantiation parameters of each instantiation unit of the circuit under test, select all target instantiation units belonging to the target module, and extract the target instantiation unit parameters. For details, refer to the description of step 303 to step 304 in the foregoing embodiment.

In one embodiment, the checking module 504 is configured to: respectively acquire the configured target parameters of each target module. For each target module, compare the parameters of each target instantiation unit with the target parameters, generate a parameter comparison result, and check the result as the parameter comparison result. For details, refer to the description of step 305 to step 306 in the foregoing embodiment.

In one embodiment, for each target module, each target instantiation unit parameter is compared with the target parameter to generate a parameter comparison result, and the checking result is the parameter comparison result, including: for each target module, respectively Determine whether the parameters of each target instantiation unit are the same as the target parameters. If they are the same, record in the check result that the target instantiation unit passes the parameter check; otherwise, record in the check result that the target instantiation unit fails the parameter check. For details, refer to the description of step 306 in the foregoing embodiments.

In one embodiment, it also includes: a storage module 505, which is used to group and store the parameter checking results of each target instantiation unit according to the target module it belongs to after checking the correctness of the target instantiation unit parameters and generating the check results . For details, refer to the description of step 307 in the foregoing embodiments.

In one embodiment, it further includes: a generation module 506, configured to group and store the target parameters and parameter inspection results of each target instantiation unit according to the target function it belongs to, and generate a parameter report for each target function. For details, refer to the description of step 308 in the foregoing embodiments.

In one embodiment, it further includes: an output module 507, configured to calculate the pass rate of the parameter inspection of each target function based on the parameter report, and output prompt information. For details, refer to the description of step 309 in the foregoing embodiments.

For the detailed description of the above-mentioned parameter checking apparatus 500, please refer to the description of relevant method steps in the above-mentioned embodiments.

An embodiment of the present invention also provides a non-transitory electronic device-readable storage medium, including: a program that, when running on the electronic device, enables the electronic device to execute all or part of the procedures of the methods in the above embodiments. Wherein, the storage medium may be a magnetic disk, an optical disk, a read-only memory (Read-Only Memory, ROM), a random access memory (Random Access Memory, RAM), a flash memory (Flash Memory), a hard disk (Hard Disk Drive, abbreviated : HDD) or solid-state drive (Solid-State Drive, SSD), etc. The storage medium may also include a combination of the above-mentioned kinds of memories.

Although the embodiments of the present invention have been described in conjunction with the accompanying drawings, those skilled in the art can make various modifications and variations without departing from the spirit and scope of the present invention, and such modifications and variations all fall into the scope of the appended claims. within the limited range.

Claims (13)

1. A parameter checking method, characterized in that, comprising: receiving an inspection instruction, the inspection instruction carrying the identification of the circuit to be tested and the identification of the target function to be tested; Obtain information about at least one target module configured with the target function according to the target function identifier, where the target module is a sub-circuit module in the circuit to be tested; Analyzing the circuit under test based on the identification of the circuit under test, extracting target instantiation unit parameters included in each target module from the analysis result; Check the correctness of the parameters of the target instantiation unit, and generate a check result; Wherein, the analysis of the circuit under test based on the identification of the circuit under test, and extracting the target instantiation unit parameters included in each target module from the analysis result include: Analyzing the circuit under test based on the identification of the circuit under test, and extracting instantiation parameters of each instantiation unit of the circuit under test; For each target module, traverse the instantiation parameters of each instantiation unit of the circuit under test, select all target instantiation units belonging to the target module, and extract the target instantiation unit parameters. 2. The method according to claim 1, wherein the checking the correctness of the target instantiation unit parameters and generating a check result comprises: Respectively acquire the configured target parameters of each of the target modules; For each of the target modules, each target instantiation unit parameter is compared with the target parameter to generate a parameter comparison result, and the checking result is the parameter comparison result. 3. The method according to claim 2, wherein, for each of the target modules, each target instantiation unit parameter is compared with the target parameter to generate a parameter comparison result, The inspection result is the parameter comparison result, including: For each of the target modules, judge whether each target instantiation unit parameter is the same as the target parameter, if they are the same, record in the check result that the target instantiation unit passes the parameter check, otherwise, the CheckResults records that the target instantiation unit failed parameter checks. 4. The method according to claim 1, further comprising: The parameter checking results of each target instantiation unit are grouped and stored according to the target modules to which they belong. 5. The method of claim 2, further comprising: The target parameters and parameter inspection results of each target instantiation unit are grouped and stored according to the target function to which they belong, and a parameter report for each target function is generated. 6. The method according to claim 5, further comprising: Based on the parameter report, calculate the pass rate of parameter inspection for each target function, and output prompt information. 7. A parameter checking device, characterized in that it comprises: A receiving module, configured to receive an inspection instruction, wherein the inspection instruction carries the identification of the circuit to be tested and the identification of the target function to be tested; An acquisition module, configured to acquire information about at least one target module configured with the target function according to the target function identifier, where the target module is a sub-circuit module in the circuit to be tested; An analysis module, configured to analyze the circuit under test based on the identification of the circuit under test, and extract the target instantiation unit parameters included in each target module from the analysis result; A check module, configured to check the correctness of the parameters of the target instantiation unit, and generate a check result; Wherein, the parsing module is used for: Analyzing the circuit under test based on the identification of the circuit under test, and extracting instantiation parameters of each instantiation unit of the circuit under test; For each target module, traverse the instantiation parameters of each instantiation unit of the circuit under test, select all target instantiation units belonging to the target module, and extract the target instantiation unit parameters. 8. The device according to claim 7, wherein the checking module is used for: Respectively acquire the configured target parameters of each of the target modules; For each of the target modules, each target instantiation unit parameter is compared with the target parameter to generate a parameter comparison result, and the checking result is the parameter comparison result. 9. The device according to claim 7, further comprising: The storage module is configured to, after checking the correctness of the parameters of the target instantiation unit and generating the check result, group and store the parameter check results of each target instantiation unit according to the target module to which it belongs. 10. The device according to claim 8, further comprising: A generating module, configured to group and store the target parameters and parameter inspection results of each target instantiation unit according to the target function it belongs to, and generate a parameter report for each target function. 11. The device according to claim 10, further comprising: An output module, configured to calculate the parameter inspection pass rate of each target function based on the parameter report, and output prompt information. 12. An electronic device, characterized in that it comprises: memory for storing computer programs; A processor, configured to execute the method according to any one of claims 1 to 6, to check the correctness of the parameters of the target instantiation unit in the circuit to be tested. 13. A storage medium readable by a non-transitory electronic device, characterized by comprising: a program that, when run by an electronic device, causes the electronic device to execute the method according to any one of claims 1 to 6 .

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