CN112304748A - Small-size I-shaped sample test device - Google Patents
Small-size I-shaped sample test device Download PDFInfo
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- CN112304748A CN112304748A CN202011270739.6A CN202011270739A CN112304748A CN 112304748 A CN112304748 A CN 112304748A CN 202011270739 A CN202011270739 A CN 202011270739A CN 112304748 A CN112304748 A CN 112304748A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/02—Details
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/02—Details
- G01N3/04—Chucks
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/08—Investigating strength properties of solid materials by application of mechanical stress by applying steady tensile or compressive forces
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/08—Investigating strength properties of solid materials by application of mechanical stress by applying steady tensile or compressive forces
- G01N3/18—Performing tests at high or low temperatures
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- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Abstract
The application belongs to the technical field of aero-engine part tests, and particularly relates to a small-size I-shaped sample test device. Comprises an I-shaped sample, a clamping block, a positioning pin and a switching section. The left side and the right side of the first clamping block are respectively provided with a positioning groove, the middle part of the first clamping block is provided with a T-shaped through groove, the left side and the right side of the second clamping block are respectively provided with a positioning groove, the middle part of the second clamping block is provided with a T-shaped through groove, and the T-shaped through groove of the first clamping block and the T-shaped through groove of the second clamping block which are oppositely arranged form an I-shaped through groove for mounting an I-; the first positioning pin is arranged in the positioning grooves on the left sides of the first clamping block and the second clamping block, and the second positioning pin is arranged in the positioning grooves on the right sides of the first clamping block and the second clamping block; the I-shaped test sample is arranged in the I-shaped through groove; the positioning block is used for limiting the I-shaped test sample in the I-shaped through groove, and the first switching section and the second switching section are respectively used for connecting the first clamping block and the second clamping block with the testing machine. The method is simple and effective, and high in universality.
Description
Technical Field
The application belongs to the technical field of aero-engine part tests, and particularly relates to a small-size I-shaped sample test device.
Background
In the research of aeroengine parts, performance data obtained by testing a standard test piece is mostly directly adopted for design and service life evaluation, however, the actual part processing and forming process and working condition service conditions are complex, taking an engine blade as an example, after a material is cast and formed, the surface smoothness, crystal orientation, thin-wall effect and the like of the blade cannot be truly reflected by the standard test piece, and the actual and accurate material performance data can be obtained by directly sampling on the part in a body. However, due to the size limitation of the sampled parts, only non-standard small-size test pieces can be taken out, and domestic and foreign researches show that the mechanical property test of directly cutting small-size test pieces on the parts is feasible and has higher research value. The sampling form of small-size samples is generally I-shaped, and the samples are suspended and loaded through a special chuck. Compared with a standard sample, the small-size sample assembly puts higher requirements on loading coaxiality, and for example, due to the fact that the sample is not installed in a centering mode or an additional bending moment is introduced in a dislocation mode of a test piece in the test process, the performance test result of the small-size sample is obviously influenced.
The existing test device for the small-size test sample does not consider the consistency of the test sample during test assembly and the coaxiality of the test piece relative to a loading axis of a testing machine in the test process, and the introduced additional bending moment can obviously influence the performance test result of the small-size test sample, so that the test failure is caused, the test data is not true, and the large dispersion exists.
Accordingly, a technical solution is desired to overcome or at least alleviate at least one of the above-mentioned drawbacks of the prior art.
Disclosure of Invention
The purpose of this application is to provide a small-size I-shaped sample test device to solve at least one problem that prior art exists.
The technical scheme of the application is as follows:
a small-size I-shaped specimen testing device comprising:
an I-shaped sample;
the clamping block comprises a first clamping block and a second clamping block which are oppositely arranged, positioning grooves are respectively formed in the left side and the right side of the first clamping block, a T-shaped through groove is formed in the middle of the first clamping block, positioning grooves are respectively formed in the left side and the right side of the second clamping block, a T-shaped through groove is formed in the middle of the second clamping block, the T-shaped through groove of the first clamping block and the T-shaped through groove of the second clamping block which are oppositely arranged form an I-shaped through groove, and the I-shaped sample is arranged in the I-shaped through groove;
the positioning block comprises a first front side positioning block, a first rear side positioning block, a second front side positioning block and a second rear side positioning block, the first front side positioning block and the second rear side positioning block are matched with fasteners and are respectively installed on the corresponding sides of the T-shaped through groove of the first clamping block, and the second front side positioning block and the second rear side positioning block are matched with fasteners and are respectively installed on the corresponding sides of the T-shaped through groove of the second clamping block and are used for limiting the I-shaped test sample in the I-shaped through groove;
the positioning pins comprise first positioning pins and second positioning pins, the first positioning pins are installed in positioning grooves on the left sides of the first clamping block and the second clamping block, and the second positioning pins are installed in positioning grooves on the right sides of the first clamping block and the second clamping block;
the switching section, the switching section includes first switching section and second switching section, the one end of first switching section with first clamp splice is connected, and the other end is connected with the testing machine, the one end of second switching section with the second clamp splice is connected, and the other end is connected with the testing machine.
Optionally, the positioning grooves formed in the left and right sides of the first clamping block and the second clamping block are 3/4 circumferential positioning grooves.
Optionally, slide rails are arranged in the T-shaped through grooves of the first clamping block and the second clamping block, and sliding grooves matched with each other are formed in the positioning block.
Optionally, the fastener is a captive bolt.
Optionally, the locating pin is a ceramic rod.
Optionally, the clamping block, the positioning pin and the adapter section are all made of high-temperature-resistant alloy.
Optionally, the first transition section is connected with the first clamping block through a pin, and the second transition section is connected with the second clamping block through a pin.
Optionally, the first adapter section and the second adapter section are respectively connected with a testing machine through threads.
The invention has at least the following beneficial technical effects:
the small-size I-shaped sample testing device can realize performance tests such as stretching, durability, stretching-stretching fatigue and the like under the conditions of room temperature and high temperature on small-size I-shaped samples, can improve the coaxiality of the test pieces and the loading axis of a testing machine in the process of assembling and loading tests while ensuring the installation consistency of different small-size test pieces, improves the test success rate and the authenticity of material performance tests, reduces the dispersity of test data, and is simple, effective and strong in universality.
Drawings
FIG. 1 is a schematic overall view of a small-scale I-shaped sample testing device according to one embodiment of the present application;
FIG. 2 is a schematic view of a clamping block of a small-scale I-shaped sample testing device according to one embodiment of the present application;
FIG. 3 is a bottom view of FIG. 2;
FIG. 4 is a schematic view of a positioning block of a small-scale I-shaped sample testing device according to an embodiment of the present application;
FIG. 5 is an assembly view of a small-scale I-shaped sample testing device according to one embodiment of the present application.
Wherein:
1-an i-shaped sample; 2-clamping a block; 3-positioning a block; 4-positioning pins; 5-a switching section; 6-pin; 7-captive bolt.
Detailed Description
In order to make the implementation objects, technical solutions and advantages of the present application clearer, the technical solutions in the embodiments of the present application will be described in more detail below with reference to the drawings in the embodiments of the present application. In the drawings, the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The described embodiments are a subset of the embodiments in the present application and not all embodiments in the present application. The embodiments described below with reference to the drawings are exemplary and intended to be used for explaining the present application and should not be construed as limiting the present application. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application. Embodiments of the present application will be described in detail below with reference to the accompanying drawings.
In the description of the present application, it is to be understood that the terms "center", "longitudinal", "lateral", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", and the like indicate orientations or positional relationships based on those shown in the drawings, and are used merely for convenience in describing the present application and for simplifying the description, and do not indicate or imply that the referenced device or element must have a particular orientation, be constructed in a particular orientation, and be operated, and therefore should not be construed as limiting the scope of the present application.
The present application is described in further detail below with reference to fig. 1 to 5.
The application provides a small-size I-shaped sample test device includes: i-shaped sample 1, clamp splice 2, locating piece 3, locating pin 4 and changeover portion 5.
Specifically, as shown in fig. 1, the clamp splice 2 includes the relative first clamp splice and the relative second clamp splice that sets up, the constant head tank has been seted up respectively to the left and right sides of first clamp splice, the T shape has been seted up at the middle part and has been led to the groove, the constant head tank has been seted up respectively to the left and right sides of second clamp splice, the T shape has been seted up at the middle part and has been led to the groove, the T shape of the relative first clamp splice that sets up leads to the groove and form the I-shaped logical groove that can hold I-shaped sample 1 with the T shape of second clamp splice, I-shaped sample 1 sets up in the I-shaped logical groove.
Further, the positioning block 3 comprises a first front side positioning block, a first rear side positioning block, a second front side positioning block and a second rear side positioning block, the first front side positioning block and the first rear side positioning block are matched with fasteners and are respectively installed on corresponding sides of the T-shaped through groove of the first clamping block, the second front side positioning block and the second rear side positioning block are matched with fasteners and are respectively installed on corresponding sides of the T-shaped through groove of the second clamping block, and the four positioning blocks 3 are used for limiting the I-shaped test sample 1 in the I-shaped through groove. The locating pin 4 comprises a first locating pin and a second locating pin, the first locating pin is installed in a locating groove on the left side of the first clamping block and the left side of the second clamping block, the second locating pin is installed in a locating groove on the right side of the first clamping block and the right side of the second clamping block, and the locating pin 4 can avoid the clamping block 2 from being in an abnormal position. The switching section 5 comprises two first switching sections and two second switching sections, one end of each first switching section is connected with the first clamping block, the other end of each first switching section is connected with the testing machine, one end of each second switching section is connected with the second clamping block, and the other end of each second switching section is connected with the testing machine.
In one embodiment of the present application, in the two clamping blocks 2, the positioning grooves formed on the left and right sides of the first clamping block and the second clamping block are both 3/4 circumferential positioning grooves. Insert locating pin 4 in 3/4 circumference constant head tank that left side and right side that first clamp splice and second clamp splice correspond were seted up, 3/4 circumference constant head tank can guarantee that locating pin 4 does not deviate from in assembly and experiment from clamp splice 2, still can let the testing personnel observe the cooperation condition of locating pin 4 and constant head tank, and locating pin 4 that is located 3/4 circumference constant head tank can guarantee first clamp splice and second clamp splice coplane, avoids clamp splice 2 ectopic to introduce additional moment of flexure to I-shaped sample 1.
Advantageously, as shown in fig. 2 and 4, in an embodiment of the present application, sliding rails are disposed in the T-shaped through grooves of the first clamping block and the second clamping block, a matching sliding groove is disposed on the positioning block 3, the positioning block 3 is mounted in the T-shaped through groove of the clamping block 2 through the matching of the sliding groove and the sliding rails, and the positioning block 3 is connected to the clamping block 2 through a fastener, such as a constraining bolt 7. The small-size I-shaped sample test device comprises an I-shaped sample 1, wherein the I-shaped sample 1 is embedded into an I-shaped through groove formed by two oppositely arranged clamping blocks 2, a positioning block 3 and the clamping blocks 2 have better matching tolerance, a sliding groove of the positioning block 3 can slide in a sliding rail arranged in the clamping blocks 2, 4 positioning blocks 3 are attached to four surfaces of the I-shaped sample 1 in the upper, lower, front and back directions, a constraint bolt 7 is matched with the clamping blocks 2 through threads, the size of the surface part of the clamping block 2 can be further constrained by the positioning block 3, the size of the positioning block 3 can be further constrained, the positioning block 3 is symmetrically constrained in the front and back directions of the clamping blocks 2, the central position of the I-shaped sample 1, which is located at the upper clamping block 2 and the lower clamping blocks 2, the.
In one embodiment of the present application, to avoid high temperature oxidation adhesion, the locating pin 4 may be selected from a ceramic rod of suitable dimensions. In addition, when a high-temperature test is performed, except that the positioning pin 4 is made of a ceramic rod, other elements, such as the clamping block 2, the positioning block 3, the positioning pin 4, the adapter section 5 and the constraint bolt 7, are made of high-temperature-resistant alloy parts.
In one embodiment of the application, the first transition segment is connected to the first clamping block by a pin 6, and the second transition segment is also connected to the second clamping block by a pin 6. In this embodiment, first switching section and second switching section are connected through screw and the cooperation of testing machine respectively, can guarantee that better loading is coaxial.
The small-size I-shaped sample test device is connected with corresponding tensile, lasting, fatigue and other testing machines after assembling all elements, and comprehensive test research of the systems including tensile, lasting, fatigue and the like is carried out.
The small-size I-shaped sample test device mainly solves the problem of research on effective test of I-shaped small-size samples under laboratory conditions. The performance tests of stretching, durability, stretching-stretching fatigue and the like of small-size test pieces under the conditions of room temperature and high temperature can be realized. Compared with the prior art, the test device can ensure the installation consistency of different small-size test pieces, improve the coaxiality of the test pieces and the loading axis of the test machine in the assembling and loading test processes, reduce the influence of additional bending moment and the like of the test pieces in the assembling and testing processes, improve the test success rate and the authenticity of material performance test, and reduce the dispersity of test data. The test device is simple and effective, and high in universality.
The above description is only for the specific embodiments of the present application, but the scope of the present application is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present application should be covered within the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (8)
1. The utility model provides a small-size I-shaped sample test device which characterized in that includes:
an I-shaped test piece (1);
the fixture comprises a clamping block (2), wherein the clamping block (2) comprises a first clamping block and a second clamping block which are oppositely arranged, positioning grooves are respectively formed in the left side and the right side of the first clamping block, a T-shaped through groove is formed in the middle of the first clamping block, positioning grooves are respectively formed in the left side and the right side of the second clamping block, a T-shaped through groove is formed in the middle of the second clamping block, the T-shaped through groove of the first clamping block and the T-shaped through groove of the second clamping block which are oppositely arranged form an I-shaped through groove, and an I-shaped sample (1) is arranged in the I-shaped;
the positioning block (3) comprises a first front side positioning block, a first rear side positioning block, a second front side positioning block and a second rear side positioning block, the first front side positioning block and the second rear side positioning block are matched with fasteners and are respectively installed on the corresponding sides of the T-shaped through groove of the first clamping block, and the second front side positioning block and the second rear side positioning block are matched with fasteners and are respectively installed on the corresponding sides of the T-shaped through groove of the second clamping block and are used for limiting the I-shaped test sample (1) in the I-shaped through groove;
the positioning pins (4) comprise first positioning pins and second positioning pins, the first positioning pins are installed in positioning grooves on the left sides of the first clamping block and the second clamping block, and the second positioning pins are installed in positioning grooves on the right sides of the first clamping block and the second clamping block;
switching section (5), switching section (5) include first switching section and second switching section, the one end of first switching section with first clamp splice is connected, and the other end is connected with the testing machine, the one end of second switching section with the second clamp splice is connected, and the other end is connected with the testing machine.
2. The small-sized I-shaped sample testing device according to claim 1, wherein the positioning grooves formed on the left and right sides of the first clamping block and the second clamping block are 3/4 circumferential positioning grooves.
3. The small-size I-shaped sample test device according to claim 2, wherein the T-shaped through grooves of the first clamping block and the second clamping block are provided with slide rails, and the positioning block (3) is provided with a sliding groove which is matched with the sliding groove.
4. The small-size i-shaped specimen testing device according to claim 1, characterized in that said fastener is a restraining bolt (7).
5. The small-sized i-shaped test specimen testing device according to claim 1, characterized in that the positioning pin (4) is a ceramic rod.
6. The small-sized I-shaped sample testing device according to claim 5, wherein the clamping block (2), the positioning block (3), the positioning pin (4) and the adapter section (5) are all made of high-temperature-resistant alloy.
7. The small-format i-shaped specimen testing device according to claim 1, characterized in that the first changeover section is connected with the first block by a pin (6), and the second changeover section is connected with the second block by a pin (6).
8. The small-form factor i-shaped specimen testing device according to claim 7, wherein the first transition section and the second transition section are each connected to a testing machine by a screw thread.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011270739.6A CN112304748A (en) | 2020-11-13 | 2020-11-13 | Small-size I-shaped sample test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011270739.6A CN112304748A (en) | 2020-11-13 | 2020-11-13 | Small-size I-shaped sample test device |
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| Publication Number | Publication Date |
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| CN112304748A true CN112304748A (en) | 2021-02-02 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202011270739.6A Pending CN112304748A (en) | 2020-11-13 | 2020-11-13 | Small-size I-shaped sample test device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113310801A (en) * | 2021-05-14 | 2021-08-27 | 人本股份有限公司 | Tool for ball bearing riveting retainer tensile test |
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| CN104007009A (en) * | 2014-01-06 | 2014-08-27 | 西南交通大学 | Material test fixture for clamping minute sample |
| CN103969118A (en) * | 2014-05-16 | 2014-08-06 | 北京航空航天大学 | A new type of non-notched compression test fixture for composite materials |
| CN206546295U (en) * | 2017-03-13 | 2017-10-10 | 内蒙古工业大学 | A kind of non-standard stretching sample fixture |
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| CN113310801A (en) * | 2021-05-14 | 2021-08-27 | 人本股份有限公司 | Tool for ball bearing riveting retainer tensile test |
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Application publication date: 20210202 |