CN112256905B - Method and device for displaying defect hot spot distribution of image data set - Google Patents
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Abstract
The invention provides a method and a device for displaying defect hot spot distribution of an image data set, wherein the method comprises the following steps: acquiring a sample image; processing the sample image; marking defects of the processed sample image to be used as a sample image data set; and displaying all the defect labels in the image data set on the same image according to a preset rule. The display method can visually present the defect distribution condition of the product, reduce the time cost and the labor cost for counting the defect thermal distribution, improve the production efficiency, provide microscopic historical reference for related workers, and contribute to improving the product quality and reducing the product defects through the defect distribution of the image data set.
Description
Technical Field
The invention relates to the technical field of defect detection, in particular to a method for displaying defect hot spot distribution of an image data set, a device for displaying defect hot spot distribution of the image data set, computer equipment and a non-transitory computer readable storage medium.
Background
The existing product defect detection technology is widely applied, only the defects are detected, technicians cannot visually check the distribution condition of the defects, and the defects are manually screened at the time cost and the labor cost.
Disclosure of Invention
The invention provides a method for displaying defect hotspot distribution of an image data set to solve the technical problems, which can visually present the defect distribution condition of a product, reduce the time cost and the labor cost for counting the defect thermal distribution, improve the production efficiency, provide microscopic historical reference for related workers, and contribute to improving the product quality and reducing the product defects through the defect distribution of the image data set. .
The technical scheme adopted by the invention is as follows:
a method for displaying defect hot spot distribution of an image data set comprises the following steps: acquiring a sample image; processing the sample image; performing defect labeling on the processed sample image to obtain a sample image data set; and displaying all the defect labels in the image data set on the same image according to a preset rule.
According to an embodiment of the present invention, the defect labeling of the processed sample image as a sample image data set includes: marking the defect type and the defect coordinate of the processed sample image; when the defect type of the sample image is a preset defect type, extracting an external quadrangle of the original defect; and saving the coordinates of the original defect and the coordinates of the circumscribed quadrangle of the original defect as a sample image data set.
According to an embodiment of the present invention, displaying all the defect labels in the image data set on the same image according to a preset rule includes: acquiring all optical surfaces in the sample image dataset, wherein the optical surfaces comprise: one or more of a front surface, a side surface, a back surface and a back surface; acquiring all defect types according to a sample image dataset of the target optical surface; acquiring a target defect type, and acquiring a defect label of each sample image according to the target defect type and a sample image data set of the target optical surface; and when the target defect type is the preset defect type, displaying a circumscribed quadrangle of the original defect in the sample image data set of the target optical surface.
According to an embodiment of the present invention, displaying all the defect labels in the image data set on the same image according to a preset rule further includes: and when the target defect type is not the preset defect type, displaying the original defect in the sample image data set of the target optical surface.
According to one embodiment of the invention, processing the sample image comprises: acquiring a reference image, and acquiring an image to be aligned according to the reference image; converting the image to be aligned into a gray scale image; obtaining an estimation matrix based on OpenCV; and aligning the image to be aligned with the reference image according to the estimation matrix.
The invention also provides a device for displaying the distribution of the defect hot spots of the image data set, which comprises: the acquisition module is used for acquiring a sample image; the processing module is used for processing the sample image; the marking module is used for marking the defects of the processed sample image to be used as a sample image data set; and the display module is used for displaying all the defect labels in the image data set on the same image according to a preset rule.
The invention further provides computer equipment which comprises a memory, a processor and a computer program which is stored on the memory and can run on the processor, wherein when the processor executes the program, the method for displaying the defect hotspot distribution of the image data set is realized.
The invention also proposes a non-transitory computer-readable storage medium on which a computer program is stored which, when executed by a processor, implements the above-mentioned image dataset defect hotspot distribution display method.
The invention has the beneficial effects that:
according to the invention, the sample image is firstly obtained and processed, then the processed sample image is subjected to defect labeling to be used as the sample image data set, and all the defect labels in the image data set are displayed on the same image according to the preset rule, so that the defect distribution condition of the product can be visually presented, the time cost and the labor cost for counting the defect thermal distribution are reduced, the production efficiency is improved, the microscopic historical reference is provided for related workers, and the defect distribution of the image data set is beneficial to improving the product quality and reducing the product defects.
Drawings
FIG. 1 is a flowchart of a method for displaying defect hot spot distribution of an image data set according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of processing a sample image according to one embodiment of the invention;
FIG. 3 is a schematic diagram illustrating defect labeling of a processed sample image according to an embodiment of the present invention;
FIG. 4 is a schematic diagram of defect labeling of a processed sample image according to another embodiment of the present invention;
FIG. 5 is a flow chart of an image dataset defect hotspot distribution display according to one embodiment of the present invention;
fig. 6 is a schematic block diagram of an image dataset defect hot spot distribution display apparatus according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Fig. 1 is a flowchart of a method for displaying defect hot spot distribution of an image data set according to an embodiment of the present invention.
As shown in fig. 1, the method for displaying defect hot spot distribution of an image data set according to an embodiment of the present invention may include the following steps:
and S1, acquiring a sample image.
Specifically, taking image acquisition under the industrial internet of things as an example, an operator uses a high-definition camera to acquire a sample image (for example, a mobile phone backboard) on an industrial field, and stores the acquired sample image for convenient calling.
S2, the sample image is processed.
According to one embodiment of the invention, processing a sample image comprises: acquiring a reference image, and acquiring an image to be aligned according to the reference image; converting an image to be aligned into a gray scale image; obtaining an estimation matrix based on OpenCV; and aligning the image to be aligned with the reference image according to the estimation matrix.
Specifically, due to the influence of the angle, position, etc. when the image is captured by the camera, the image captured by the operator at the industrial site may have some deviation, such as translation, rotation, or other 3D transformation. This does not ensure that each picture in a batch of defect images can be aligned one-to-one, and thus the defect distribution of all images cannot be displayed on one base image. To solve this problem, an image alignment algorithm based on OpenCV may be employed to achieve the alignment of the images.
Specifically, as shown in fig. 2, a reference image is obtained first, that is, the image is used as a reference, the rest images are compared with the reference image, then an image to be aligned is obtained, the image to be aligned is converted into a grayscale image based on OpenCV, and a motion model is selected according to a positional relationship between the image to be aligned and the reference image, for example, when the image to be aligned needs to be translated to be aligned with the reference image, a motion model capable of translating the image to be aligned is selected, and for example, when the image to be aligned needs to be rotated to be aligned with the reference image, a motion model capable of rotating the image to be aligned is selected. And then storing the motion model, calling a findTransform ECC function to estimate a warp matrix based on OpenCV, and inputting the image to be aligned into the estimation matrix, wherein the image to be aligned is aligned with the reference image.
And S3, marking the processed sample image as a sample image data set by using the defect.
According to an embodiment of the present invention, the defect labeling of the processed sample image as the sample image data set includes: marking the defect type and the defect coordinate of the processed sample image; when the defect type of the sample image is a preset defect type, extracting a circumscribed quadrangle of the original defect; and saving the coordinates of the original defect and the coordinates of the circumscribed quadrangle of the original defect as a sample image data set.
Specifically, as shown in fig. 3, the image defect marking is performed on the image after the alignment is obtained according to the above embodiment, and generally, the defect on the image generally includes: scratches, cracks, burrs, black dots, etc., line segments, polygons, dots, quadrangles, etc. And marking the defects through manual marking or a corresponding algorithm, then auditing the defect marks on the sample image to prevent multi-mark or missing marks and storing the final defect marks. Since there may be various situations for marking the defect, before saving the final marking, the defect coordinate needs to be generated into a circumscribed quadrangle based on PostGIS and finally saved.
Specifically, as shown in fig. 4, one of the sample images in the sample image dataset is obtained, a certain defect on the sample image is obtained, an annotation coordinate corresponding to the defect is obtained, and an annotation type corresponding to the defect is obtained. If the mark type of the defect is a preset defect type (such as a line segment, a polygon or a round point), uniformly calling a library function of the PostGIS package to extract a circumscribed quadrangle of the defect. And storing the original defect coordinates corresponding to the defect and the coordinates of the external quadrangle as a sample image data set.
And S4, displaying all the defect labels in the image data set on the same image according to a preset rule.
According to an embodiment of the present invention, displaying all defect labels in an image data set on the same image according to a preset rule includes: acquiring all optical surfaces in the sample image dataset, wherein the optical surfaces comprise: one or more of a front surface, a side surface, a back surface and a back surface; acquiring all defect types according to a sample image dataset of the target optical surface; acquiring a target defect type, and acquiring a defect label of each sample image according to the target defect type and a sample image data set of a target optical surface; and when the target defect type is a preset defect type, displaying a circumscribed quadrangle of the original defect in the sample image data set of the target optical surface.
Further, according to an embodiment of the present invention, displaying all the defect labels in the image data set on the same image according to a preset rule, further includes: and when the target defect type is not the preset defect type, displaying the original defect in the sample image data set of the target optical surface.
Specifically, as shown in fig. 5, all optical surfaces contained in the sample image dataset are acquired, for example, the back plate of a cell phone includes a front surface, a side surface, a back surface, and a back surface. Selecting one of the optical surfaces as a target optical surface, taking the front surface as an example, acquiring image data of all front surfaces in the sample image data set as a front surface sample image data set, and acquiring all defect types in the front surface sample image data set, for example, all defect types include: cracks, scratches, bubbles, etc. Assuming that the target defects are cracks and bubbles, acquiring a defect label (possibly a round point, a line segment, a polygon or a quadrangle, etc.) on each picture in the front sample image dataset according to the target optical surface and the defect type. When the target defect type is a preset defect type, displaying a circumscribed quadrangle corresponding to the original defect label on each picture in the image data set; and when the target defect type is not the preset defect type, displaying the original defect in the sample image data set of the target optical surface. This allows to display all defect distributions in the sample image data set on one complete image.
Therefore, the display method disclosed by the invention is combined with an application scene of the industrial Internet of things, the problem of centralized defect distribution of image data is solved, on one hand, the defect distribution condition of a product is visually presented in an industrial field, the time cost and the labor cost for counting the thermal distribution of the defects can be greatly reduced, the production efficiency is improved, and microscopic historical references are provided for defect markers and auditors; on the other hand, the defect heat distribution of the image data set can indirectly help an enterprise decision maker to improve the product quality and reduce the product defects.
In summary, according to the method for displaying defect hotspot distribution of the image data set, the sample image is obtained and processed, then the processed sample image is subjected to defect labeling to serve as the sample image data set, and all the defect labels in the image data set are displayed on the same image according to the preset rule, so that the defect distribution condition of the product can be visually presented, the time cost and the labor cost for counting the thermal distribution of the defects are reduced, the production efficiency is improved, microscopic historical references are provided for related workers, and the method is helpful for improving the product quality and reducing the product defects through the defect distribution of the image data set.
Corresponding to the method for displaying the distribution of the defect hot spots of the image data set in the embodiment, the invention further provides a device for displaying the distribution of the defect hot spots of the image data set.
Fig. 6 is a schematic block diagram of an image dataset defect hot spot distribution display apparatus according to an embodiment of the present invention.
As shown in fig. 6, the apparatus for displaying defect hot spot distribution of image data set according to an embodiment of the present invention may include: the system comprises an acquisition module 10, a processing module 20, a labeling module 30 and a display module 40.
The acquiring module 10 is used for acquiring a sample image. The processing module 20 is used for processing the sample image. The labeling module 30 is configured to perform defect labeling on the processed sample image as a sample image data set. The display module 40 is configured to display all defect labels in the image data set on the same image according to a preset rule.
According to an embodiment of the present invention, the labeling module 30 performs defect labeling on the processed sample image, as a sample image data set, specifically, for labeling the defect type and the defect coordinate of the processed sample image; when the defect type of the sample image is a preset defect type, extracting a circumscribed quadrangle of the original defect; and saving the coordinates of the original defect and the coordinates of the circumscribed quadrangle of the original defect as a sample image data set.
According to an embodiment of the present invention, the display module 40 displays all defect labels in the image data set on the same image according to a preset rule, and is specifically configured to obtain all optical surfaces in the sample image data set, where the optical surfaces include: one or more of a front surface, a side surface, a back surface and a back surface; acquiring all defect types according to a sample image dataset of the target optical surface; acquiring a target defect type, and acquiring a defect label of each sample image according to the target defect type and a sample image data set of a target optical surface; and when the target defect type is a preset defect type, displaying a circumscribed quadrangle of the original defect in the sample image data set of the target optical surface.
According to an embodiment of the present invention, the display module 40 displays all defect labels in the image data set on the same image according to a preset rule, and is specifically configured to display original defects in the sample image data set of the target optical surface when the target defect type is not the preset defect type.
According to one embodiment of the present invention, the processing module 20 processes the sample image, including: acquiring a reference image, and acquiring an image to be aligned according to the reference image; converting an image to be aligned into a gray scale image; obtaining an estimation matrix based on OpenCV; and aligning the image to be aligned with the reference image according to the estimation matrix.
It should be noted that, for details that are not disclosed in the image data set defect hot spot distribution display apparatus according to the embodiment of the present invention, please refer to details disclosed in the image data set defect hot spot distribution display method according to the embodiment of the present invention, and details are not described herein again.
The image data set defect hotspot distribution display device comprises an acquisition module, a processing module, a labeling module and a display module, wherein the acquisition module acquires a sample image, the processing module processes the sample image, the labeling module labels defects of the processed sample image to obtain a sample image data set, and the display module displays all defect labels in the image data set on the same image according to a preset rule. Therefore, the defect distribution condition of the product can be visually presented, the time cost and the labor cost for counting the defect thermal distribution are reduced, the production efficiency is improved, microscopic historical references are provided for related workers, and the product quality is improved and the product defects are reduced through the defect distribution of the image data set.
The invention further provides a computer device corresponding to the embodiment.
The computer device of the embodiment of the invention comprises a memory, a processor and a computer program which is stored on the memory and can run on the processor, and when the processor executes the computer program, the method for displaying the defect hotspot distribution of the image data set according to the embodiment of the invention can be realized.
According to the computer equipment provided by the embodiment of the invention, when the processor executes the computer program stored on the memory, the sample image is firstly obtained and processed, then the processed sample image is subjected to defect marking to be used as the sample image data set, and all defect marks in the image data set are displayed on the same image according to the preset rule, so that the defect distribution condition of a product can be visually presented, the time cost and the labor cost for counting the defect thermal distribution are reduced, the production efficiency is improved, the microscopic historical reference is provided for related workers, and the defect distribution of the image data set is beneficial to improving the product quality and reducing the product defects.
The invention also provides a non-transitory computer readable storage medium corresponding to the above embodiment.
A non-transitory computer-readable storage medium of an embodiment of the present invention has stored thereon a computer program which, when executed by a processor, can implement the method for displaying the distribution of defective hotspots in an image dataset according to the above-described embodiment of the present invention.
According to the non-transitory computer-readable storage medium of the embodiment of the invention, when the processor executes the computer program stored on the processor, the processor firstly acquires and processes the sample image, then performs defect labeling on the processed sample image to serve as a sample image data set, and displays all defect labels in the image data set on the same image according to the preset rule, so that the defect distribution condition of a product can be visually presented, the time cost and the labor cost for counting the thermal distribution of defects are reduced, the production efficiency is improved, microscopic historical references are provided for related workers, and the defect distribution of the image data set is beneficial to improving the product quality and reducing the product defects.
In the description of the present invention, the terms "first" and "second" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implying any number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. The meaning of "plurality" is two or more unless specifically limited otherwise.
In the present invention, unless otherwise expressly stated or limited, the terms "mounted," "connected," "secured," and the like are to be construed broadly and can, for example, be fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meanings of the above terms in the present invention can be understood according to specific situations by those of ordinary skill in the art.
In the present invention, unless otherwise expressly stated or limited, the first feature "on" or "under" the second feature may be directly contacting the first and second features or indirectly contacting the first and second features through an intermediate. Also, a first feature "on," "over," and "above" a second feature may be directly or diagonally above the second feature, or may simply indicate that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature may be directly under or obliquely under the first feature, or may simply mean that the first feature is at a lesser elevation than the second feature.
In the description herein, references to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, various embodiments or examples and features of different embodiments or examples described in this specification can be combined and combined by one skilled in the art without contradiction.
Any process or method descriptions in flow charts or otherwise described herein may be understood as representing modules, segments, or portions of code which include one or more executable instructions for implementing specific logical functions or steps of the process, and alternate implementations are included within the scope of the preferred embodiment of the present invention in which functions may be executed out of order from that shown or discussed, including substantially concurrently or in reverse order, depending on the functionality involved, as would be understood by those reasonably skilled in the art of the present invention.
The logic and/or steps represented in the flowcharts or otherwise described herein, e.g., an ordered listing of executable instructions that can be considered to implement logical functions, can be embodied in any computer-readable medium for use by or in connection with an instruction execution system, apparatus, or device, such as a computer-based system, processor-containing system, or other system that can fetch the instructions from the instruction execution system, apparatus, or device and execute the instructions. For the purposes of this description, a "computer-readable medium" can be any means that can contain, store, communicate, propagate, or transport the program for use by or in connection with the instruction execution system, apparatus, or device. More specific examples (a non-exhaustive list) of the computer-readable medium would include the following: an electrical connection (electronic device) having one or more wires, a portable computer diskette (magnetic device), a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber device, and a portable compact disc read-only memory (CDROM). Additionally, the computer-readable medium could even be paper or another suitable medium upon which the program is printed, as the program can be electronically captured, via for instance optical scanning of the paper or other medium, then compiled, interpreted or otherwise processed in a suitable manner if necessary, and then stored in a computer memory.
It should be understood that portions of the present invention may be implemented in hardware, software, firmware, or a combination thereof. In the above embodiments, the various steps or methods may be implemented in software or firmware stored in memory and executed by a suitable instruction execution system. For example, if implemented in hardware, as in another embodiment, any one or combination of the following techniques, which are known in the art, may be used: a discrete logic circuit having a logic gate circuit for implementing a logic function on a data signal, an application specific integrated circuit having an appropriate combinational logic gate circuit, a Programmable Gate Array (PGA), a Field Programmable Gate Array (FPGA), or the like.
It will be understood by those skilled in the art that all or part of the steps carried by the method for implementing the above embodiments may be implemented by hardware related to instructions of a program, which may be stored in a computer readable storage medium, and when the program is executed, the program includes one or a combination of the steps of the method embodiments.
In addition, functional units in the embodiments of the present invention may be integrated into one processing module, or each unit may exist alone physically, or two or more units are integrated into one module. The integrated module can be realized in a hardware mode, and can also be realized in a software functional module mode. The integrated module, if implemented in the form of a software functional module and sold or used as a separate product, may also be stored in a computer-readable storage medium.
The storage medium mentioned above may be a read-only memory, a magnetic or optical disk, etc. Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention, and that variations, modifications, substitutions and alterations can be made to the above embodiments by those of ordinary skill in the art within the scope of the present invention.
Claims (6)
1. A method for displaying defect hot spot distribution of an image data set is characterized by comprising the following steps:
acquiring a sample image;
processing the sample image, wherein processing the sample image comprises:
acquiring a reference image, and acquiring an image to be aligned according to the reference image;
converting the image to be aligned into a gray scale image;
calling a findTransform ECC function based on OpenCV to obtain an estimated warp matrix;
aligning the image to be aligned with the reference image according to an estimated warp matrix and combining a motion model, wherein the motion model is selected according to the position relation between the image to be aligned and the reference image;
performing defect labeling on the processed sample image to obtain a sample image data set;
displaying all the defect labels in the image data set on the same image according to a preset rule, wherein the displaying all the defect labels in the image data set on the same image according to the preset rule comprises: acquiring all optical surfaces in the sample image dataset, wherein the optical surfaces comprise: one or more of a front surface, a side surface, a back surface and a back surface; acquiring all defect types according to a sample image dataset of the target optical surface; acquiring a target defect type, and acquiring a defect label of each sample image according to the target defect type and a sample image data set of the target optical surface; and when the target defect type is a preset defect type, displaying a circumscribed quadrangle of the original defect in the sample image data set of the target optical surface.
2. The method for displaying the distribution of the defect hot spots of the image data set according to claim 1, wherein the step of performing defect labeling on the processed sample image as the sample image data set comprises:
marking the defect type and the defect coordinate of the processed sample image;
when the defect type of the sample image is a preset defect type, extracting an external quadrangle of the original defect;
and saving the coordinates of the original defect and the coordinates of the circumscribed quadrangle of the original defect as a sample image data set.
3. The method for displaying distribution of defect hot spots in an image data set according to claim 2, wherein all defect labels in the image data set are displayed on the same image according to a preset rule, further comprising:
and when the target defect type is not the preset defect type, displaying the original defect in the sample image data set of the target optical surface.
4. An image dataset defect hotspot distribution display device, comprising:
the acquisition module is used for acquiring a sample image;
a processing module, configured to process the sample image, wherein the processing module is specifically configured to:
acquiring a reference image, and acquiring an image to be aligned according to the reference image;
converting the image to be aligned into a gray scale image;
calling a findTransform ECC function based on OpenCV to obtain an estimated warp matrix;
aligning the image to be aligned with the reference image according to an estimated warp matrix and combining a motion model, wherein the motion model is selected according to the position relation between the image to be aligned and the reference image;
the marking module is used for marking the defects of the processed sample image to be used as a sample image data set;
a display module, configured to display all defect labels in the image dataset on the same image according to a preset rule, where the display module is specifically configured to: acquiring all optical surfaces in the sample image dataset, wherein the optical surfaces comprise: one or more of a front surface, a side surface, a back surface and a back surface; acquiring all defect types according to a sample image dataset of the target optical surface; acquiring a target defect type, and acquiring a defect label of each sample image according to the target defect type and a sample image data set of the target optical surface; and when the target defect type is a preset defect type, displaying a circumscribed quadrangle of the original defect in the sample image data set of the target optical surface.
5. A computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, characterized in that the processor, when executing the program, implements the image dataset defect hotspot distribution display method according to any one of claims 1-3.
6. A non-transitory computer-readable storage medium having stored thereon a computer program, which when executed by a processor implements the image dataset defect hotspot distribution display method of any one of claims 1-3.
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| CN202011144671.7A CN112256905B (en) | 2020-10-23 | 2020-10-23 | Method and device for displaying defect hot spot distribution of image data set |
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| CN202011144671.7A CN112256905B (en) | 2020-10-23 | 2020-10-23 | Method and device for displaying defect hot spot distribution of image data set |
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| CN105092591A (en) * | 2015-08-27 | 2015-11-25 | 任红霞 | Image-processing-based workpiece defect positioning method |
| CN105139400A (en) * | 2015-08-27 | 2015-12-09 | 任红霞 | Workpiece defect positioning system based on image processing |
| CN105372263A (en) * | 2015-12-14 | 2016-03-02 | 昆明理工大学 | Eddy current heating type pipeline defect infrared imaging testing device and test method |
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| CN105092591A (en) * | 2015-08-27 | 2015-11-25 | 任红霞 | Image-processing-based workpiece defect positioning method |
| CN105139400A (en) * | 2015-08-27 | 2015-12-09 | 任红霞 | Workpiece defect positioning system based on image processing |
| CN105372263A (en) * | 2015-12-14 | 2016-03-02 | 昆明理工大学 | Eddy current heating type pipeline defect infrared imaging testing device and test method |
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