CN112184607A - Millimeter wave terahertz imaging quality improvement method and imaging system - Google Patents
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Abstract
本发明提供一种毫米波太赫兹成像质量提升方法及成像系统，包括：获得被测对象的毫米波太赫兹成像的水平极化图像和垂直极化图像；将所述水平极化图像和垂直极化图像进行图像特征提取，转换得到联合特征图像；对所联合特征图像进行检测处理，得到倒影区域图像；将倒影区域像素替换为毫米波太赫兹成像的背景像素。所述方法及系统能够提高目标检测能力和图像视觉感知度。
The invention provides a millimeter-wave terahertz imaging quality improvement method and an imaging system, including: obtaining a horizontal polarization image and a vertical polarization image of a millimeter-wave terahertz imaging of a measured object; The combined feature image is detected and processed to obtain the image of the reflection area; the pixels of the reflection area are replaced with the background pixels of the millimeter wave terahertz imaging. The method and system can improve target detection capability and image visual perception.
Description
Technical Field
The invention relates to the technical field of millimeter wave terahertz remote sensing and detection, in particular to a millimeter wave terahertz imaging quality improving method and an imaging system.
Background
The millimeter wave terahertz imaging system realizes remote sensing and detection of an observation scene by receiving spontaneous or reflected millimeter wave terahertz heat radiation of a substance, and has the advantages of working all day long, quasi-all-weather working, good concealment, no radiation hazard and the like. Therefore, the method has been applied to the fields of atmospheric remote sensing, ocean monitoring, soil and vegetation remote sensing, human body security inspection, key site monitoring, military exploration and the like.
In millimeter wave terahertz imaging applications, objects are generally detected and identified by using image contrast. In practical imaging, since the surfaces of many objects in a scene are not completely rough to millimeter wave terahertz waves, reflection near an object can be formed on the surfaces, especially the surfaces of a floor, a cement ground, a water surface and the like. The reflection obviously reduces the image quality, brings difficulty to target detection, influences image visual perception and generates interference to observers. In the field of visible light and infrared imaging, some classical and machine learning reflection detection and removal methods are proposed to achieve better effects. However, due to differences in physical principles, these methods cannot be directly used in millimeter wave terahertz imaging applications, specifically: images of different frequency bands have different imaging principles, imaging processes and image characteristics, and an image processing method is based on the principles, the imaging processes and the characteristics, so that tests show that the effect of the method in the fields of visible light and infrared imaging on millimeter wave terahertz images is insufficient, and the problem cannot be solved. In view of this, how to automatically detect and eliminate the reflection in the millimeter wave terahertz imaging to improve the image quality is a problem to be solved urgently at present.
Disclosure of Invention
The invention provides a millimeter wave terahertz imaging quality improving method and system for improving the image quality of a detected object so as to improve the target detection capability and the image visual perception.
According to one aspect of the invention, a millimeter wave terahertz imaging quality improvement method is provided, and comprises the following steps:
obtaining a horizontal polarization image and a vertical polarization image of millimeter wave terahertz imaging of a measured object;
carrying out image feature extraction on the horizontal polarization image and the vertical polarization image, and converting to obtain a combined feature image;
detecting the combined characteristic image to obtain a reflection region image;
and replacing the pixels of the reflection area with background pixels of millimeter wave terahertz imaging.
Further, the step of extracting image features from the horizontally polarized image and the vertically polarized image and converting the images to obtain a combined feature image includes:
obtaining a pixel value of each pixel of the horizontal polarization image and the vertical polarization image;
carrying out binarization processing on pixel values of the horizontal polarization image and the vertical polarization image;
obtaining pixel values of a joint feature image by
Wherein j is a pixel index, pr (j) is a pixel value of j-th pixel of the joint feature image, F is a background pixel average value of the horizontal polarization image and the vertical polarization image, h (j) is a pixel value of j-th pixel of the horizontal polarization image, v (j) is a pixel value of j-th pixel of the vertical polarization image, | x | is an absolute value operator, and Br { } is a binarization operator.
Further, the step of detecting the combined feature image to obtain a reflection region image includes:
performing superpixel segmentation on the combined feature image to obtain a plurality of superpixel segmentation areas;
obtaining the significance of each super-pixel segmentation area so as to obtain a significance image;
and (4) performing binary segmentation on the saliency image to obtain a reflection region image.
Further, the step of obtaining the saliency of each super-pixel segmentation region comprises:
obtaining distances between different super-pixel segmentation areas;
obtaining the weight of each super pixel segmentation area;
obtaining the significance of each super pixel segmentation region according to the following formula through the weight of each super pixel segmentation region and the distance between each super pixel segmentation region and other super pixel segmentation regions
Wherein r isiAnd rkI and k superpixel partition regions for respectively performing superpixel partition on the combined feature image, i is more than or equal to 1 and less than or equal to N, k is more than or equal to 1 and less than or equal to N, i and k are natural numbers, N is the total number of the superpixel partition regions, and W (r)i) Segmenting a region r for a superpixeliWeight of (D)r(rk,ri) Segmenting a region r for a superpixeliAnd a super-pixel division region rkDistance between, S (r)k) Segmenting a region r for a superpixelkThe significance of (a).
Further, the step of obtaining the distance between different super-pixel segmentation areas comprises:
taking the mean value of the pixel values of the joint feature images of the pixels in the super pixel segmentation region as the pixel value of the super pixel segmentation region to obtain the pixel value of each super pixel segmentation region;
obtaining the distance between different super-pixel segmentation areas by
Dr(rk,ri)＝|PRk-PRi|，
Wherein, PRiAnd PRkRespectively a super-pixel division region riAnd rkThe pixel value of (2).
Further, the step of obtaining the weight value of each super-pixel segmentation region includes:
obtaining the number of pixels of each super-pixel segmentation area;
obtaining the weight value of each super pixel segmentation region by the following formula
W(ri)＝N(ri)，
Wherein, N (r)i) Segmenting a region r for a superpixeliThe number of pixels.
According to another aspect of the present invention, there is provided a millimeter wave terahertz imaging system including a focusing lens, a polarization antenna disposed on a focal plane of the focusing lens, a radiometer channel for focusing a millimeter wave terahertz wave from a measured object on the polarization antenna, and a data acquisition processing device for generating a horizontally polarized image and a vertically polarized image of the millimeter wave terahertz imaging of the measured object via the radiometer channel; the data acquisition processing device is arranged on one side of the polarized antenna, which is far away from the focusing lens, and is used for carrying out image feature extraction and detection on the horizontal polarized image and the vertical polarized image to obtain an inverted image area image, replacing pixels of the inverted image area with background pixels of millimeter wave terahertz imaging, and obtaining a quality improvement image.
Furthermore, the polarized antenna and the radiometer channel rotate around the observation axis of the polarized antenna, and a horizontal polarized image and a vertical polarized image are obtained in a time-sharing mode.
Further, the polarized antenna and the radiometer channel are orthogonal polarization acquisition arrays, and horizontal and vertical dual-polarized images are obtained simultaneously.
Furthermore, the data acquisition and processing device comprises a data acquisition unit, a data processor and a data display, wherein the data acquisition unit acquires a horizontal polarization image and a vertical polarization image of the object to be measured; the data processor processes the images acquired by the data acquisition device to acquire quality-improved images; the data display displays the quality-enhanced image.
According to the millimeter wave terahertz imaging quality improving method and the imaging system, horizontal and vertical dual-polarized images of a measured object are obtained, then combined to obtain a combined characteristic image, then an inverted image area image is obtained through detection, and finally pixels of the inverted image area of an original image are replaced by background pixels to obtain an image with improved image quality. The image with improved quality eliminates the detection difficulty and visual interference possibly caused by reflection, and improves the target detection capability and the image visual perception.
Drawings
Fig. 1 is a flowchart of a millimeter wave terahertz imaging quality improvement method involved in an embodiment of the present invention;
fig. 2 is a schematic structural diagram of a millimeter wave terahertz imaging system according to an embodiment of the present invention;
FIG. 3 is an original horizontally polarized image in one embodiment of the invention;
FIG. 4 is an original vertically polarized image in one embodiment of the invention;
FIG. 5 is a joint feature image in one embodiment of the invention;
FIG. 6 is a saliency image in one embodiment of the present invention;
FIG. 7 is a reflection detection image in an embodiment of the present invention;
FIG. 8 is a quality-enhanced image in an embodiment of the present invention;
in the figure: 1. a measured object; 2. a focusing lens; 3. a polarized antenna; 4. a radiometer channel; 5. a data acquisition processing device; 51. a data acquisition unit; 52. a data processor; 53. and a data display.
Detailed Description
Exemplary embodiments will now be described more fully with reference to the accompanying drawings. The exemplary embodiments, however, may be embodied in many different forms and should not be construed as limited to the examples set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the concept of example embodiments to those skilled in the art. The described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments.
Furthermore, the drawings are merely schematic illustrations of the invention and are not necessarily drawn to scale. The same reference numerals in the drawings denote the same or similar parts, and thus their repetitive description will be omitted. Some of the block diagrams shown in the figures are functional entities and do not necessarily correspond to physically or logically separate entities. These functional entities may be implemented in the form of software, or in one or more hardware modules or integrated circuits, or in different networks and/or processor devices and/or microcontroller devices.
In the present invention, the terms "include", "arrange", "disposed" and "disposed" are used to mean open-ended inclusion, and mean that there may be another element/component/etc. in addition to the listed elements/components/etc.; the terms "first," "second," and the like are used merely as labels, and are not limiting as to the number or order of their objects.
In the exemplary embodiment of the invention, a millimeter wave terahertz imaging quality improving method is provided, which can eliminate detection difficulty and visual interference possibly caused by reflection, thereby improving target detection capability and image visual perception. Referring to fig. 1, the millimeter wave terahertz imaging quality improvement method in the exemplary embodiment includes the following steps:
step S1: the method comprises the steps of obtaining a horizontal polarization image H and a vertical polarization image V of millimeter wave terahertz imaging of a tested object, converting the horizontal polarization image H and the vertical polarization image V of an original image into a two-dimensional matrix form through computing equipment, enabling each pixel in the image to represent a numerical value in the two-dimensional matrix, enabling the numerical value to represent the pixel value of the pixel, and enabling the millimeter wave terahertz imaging to be obtained through millimeter wave terahertz imaging equipment.
Step S2: and carrying out image feature extraction on the horizontal polarization image and the vertical polarization image, and converting to obtain a combined feature image PR.
Step S3: and detecting the combined characteristic image to obtain a reflection region image, and detecting the image PR by using a significance analysis method or other known algorithms (such as a K mean algorithm, a Gaussian mixture model algorithm, a mean shift algorithm and the like).
Step S4: and replacing the pixels of the reflection area with millimeter wave terahertz imaging background pixels, wherein the background pixels of the millimeter wave terahertz imaging are selected from a horizontal polarization image H, a vertical polarization image V or other polarization original images.
In step S2, the method includes:
obtaining a pixel value of each pixel of the horizontal polarization image and the vertical polarization image;
carrying out binarization processing on pixel values of the horizontal polarization image and the vertical polarization image;
obtaining pixel values of a joint feature image by
Wherein j is a pixel index, pr (j) is a pixel value of the jth pixel of the combined feature image, F is a background pixel mean value of the horizontal polarization image and the vertical polarization image (a set region is arbitrarily cut out directly from the background region of the millimeter wave terahertz imaging, that is, the background pixel region, and the mean value of all pixel values in the set region is taken), h (j) is a pixel value of the jth pixel of the horizontal polarization image, v (j) is a pixel value of the jth pixel of the vertical polarization image, | | is an absolute value operator, and Br { } is a binarization operator.
In step S3, the method includes:
performing superpixel segmentation on the combined feature image to obtain a plurality of superpixel segmentation areas;
obtaining the significance of each super-pixel segmentation area so as to obtain a significance image;
and (4) performing binary segmentation on the saliency image to obtain a reflection region image.
Preferably, the step of obtaining the saliency of each super-pixel segmentation region comprises:
obtaining distances between different super-pixel segmentation areas;
obtaining the weight of each super pixel segmentation area;
obtaining the significance of each super pixel segmentation region according to the following formula through the weight of each super pixel segmentation region and the distance between each super pixel segmentation region and other super pixel segmentation regions
Wherein r isiAnd rkI and k superpixel partition regions for respectively performing superpixel partition on the combined feature image, i is more than or equal to 1 and less than or equal to N, k is more than or equal to 1 and less than or equal to N, i and k are natural numbers, N is the total number of the superpixel partition regions, and W (r)i) Segmenting a region r for a superpixeliWeight of (D)r(rk,ri) Segmenting a region r for a superpixeliAnd a super-pixel division region rkDistance between, S (r)k) Segmenting a region r for a superpixelkThe significance of (a).
Further, preferably, the step of obtaining the distances between different super-pixel segmentation areas comprises:
taking the mean value of the pixel values of the joint feature images of the pixels in the super pixel segmentation region as the pixel value of the super pixel segmentation region to obtain the pixel value of each super pixel segmentation region;
obtaining the distance between different super-pixel segmentation areas by
Dr(rk,ri)＝|PRk-PRi|，
Wherein, PRiAnd PRkRespectively a super-pixel division region riAnd rkThe pixel value of (2).
Furthermore, preferably, the step of obtaining the weight value of each super-pixel segmentation region comprises:
obtaining the number of pixels of each super-pixel segmentation area;
obtaining the weight value of each super pixel segmentation region by the following formula
Wherein, N (r)i) Segmenting a region r for a superpixeliNumber of pixels of (d), min [ N (r)i)]For all superpixel partition region pixel number minimum, max [ N (r)i)]Dividing the maximum number of pixels in the region for all super pixelsA large value.
Further, preferably, the weight value of each super pixel division region is obtained by the following formula
W(ri)＝N(ri)，
Wherein, N (r)i) Segmenting a region r for a superpixeliThe number of pixels simplifies the method for acquiring the weight, improves the calculation speed and does not reduce the accuracy.
In addition, in an exemplary embodiment of the invention, a millimeter wave terahertz dual-polarization imaging system is further provided to execute the millimeter wave terahertz imaging quality improving method, so that detection difficulty and visual interference possibly caused by reflection are eliminated, and target detection capability and image visual perception are improved. Referring to fig. 2, in the exemplary embodiment, the millimeter wave terahertz dual-polarization imaging system includes a focusing lens 2, a polarization antenna 3, a radiometer channel 4, and a data acquisition processing device 5, where the polarization antenna 3 is disposed on a focal plane of the focusing lens 2, the focusing lens 2 focuses millimeter wave terahertz waves from a measured object on the polarization antenna 3, and a horizontally polarized image and a vertically polarized image of the measured object are generated via the radiometer channel 4; the data acquisition and processing device 5 is arranged on one side of the polarized antenna far away from the focusing lens 2, performs image feature extraction and detection on the horizontal polarized image and the vertical polarized image to obtain a reflection region image, and replaces the reflection region pixel of the original image with the original background pixel to obtain a quality-improved image.
Preferably, the polarized antenna and the radiometer channel rotate around the observation axis of the polarized antenna to obtain the horizontally polarized image and the vertically polarized image in a time-sharing manner.
Furthermore, preferably, the polarized antennas and radiometer channels are orthogonally polarizable acquisition arrays, while obtaining horizontal and vertical dual polarized images.
In one embodiment, the data acquisition and processing device 5 comprises a data acquisition unit 51, a data processor 52 and a data display 53, wherein the data acquisition unit 51 acquires a horizontal polarization image and a vertical polarization image of the measured object; the data processor 52 processes the image collected by the data collector to obtain a quality-improved image; the data display 53 displays the quality-enhanced image.
In a specific embodiment, as shown in fig. 3 to 8, the millimeter wave terahertz imaging quality improvement method and the millimeter wave terahertz dual-polarization imaging system are exemplarily described by taking a typical indoor monitoring imaging for two persons as an example, in the millimeter wave terahertz imaging, a human body forms an obvious reflection on the ground, and the reflection of the human body on the ground in an image is removed by the imaging method, so that the image quality is improved.
Firstly, a horizontally polarized image and a vertically polarized image are obtained by utilizing the millimeter wave terahertz multi-polarization imaging system. In this embodiment, the generated dual-polarization image is, as shown in fig. 3 and 4, a horizontally polarized image H in fig. 3, and a vertically polarized image V in fig. 4. It can be seen that there is an obvious reflection in the image H, and although there is no obvious reflection in the image V, there is a large difference between the image distribution characteristics of the human body region and the image H, and in practical applications, if the image V is directly used to replace the image H, much information will be lost. Therefore, it is necessary to remove the reflection in the image H to retain sufficient physical information.
The images H and V are then converted to a joint feature image PR by:
wherein j is a pixel index, pr (i) is a pixel value of the jth pixel of the joint feature image, F is a background pixel average value of the horizontal polarization image and the vertical polarization image, h (j) is a pixel value of the jth pixel of the horizontal polarization image, v (j) is a pixel value of the jth pixel of the vertical polarization image, | x | is an absolute value operator, and Br { } is a binarization operator.
The conversion in this step is performed by a computing device, and during processing, the H and V polarization images are respectively substituted into the formula in a matrix form to be computed, so as to obtain an image PR, as shown in fig. 5. Similarly, the subsequent calculation process is performed by using the pictures in the form of a matrix.
And then, detecting the image PR by using a detection algorithm to obtain a reflection region image. A saliency analysis method is selected, firstly, superpixel segmentation is carried out on the image PR to obtain N superpixel segmentation areas, and then the saliency S is calculated:
wherein r isiAnd rkI and k regions respectively used for performing superpixel segmentation on PR image, i is more than or equal to 1 and less than or equal to N, k is more than or equal to 1 and less than or equal to N, i and k are natural numbers, and W (r)i) Is a region riWeight of (D)r(rk,ri) Is a region riAnd rkDistance between, weight function W and distance function DrComprises the following steps:
W(ri)＝N(ri)，
Dr(rk,ri)＝|PRk-PRi|，
wherein, N (r)i) Is a region riThe number of pixels. PRiAnd PRkAre respectively regions riAnd rkThe inner pixel corresponds to the mean of the PR values. The above calculation can obtain a saliency image S, as shown in fig. 6, each super-pixel region corresponds to a saliency value. Further, a binary segmentation algorithm is used to perform binary segmentation on the saliency image, where a traditional Otsu method is selected to detect and obtain a reflection region image, as shown in FIG. 7.
And finally, replacing the pixels of the reflection region in the original image H with the pixels of the original background according to the pixel information of the reflection region, wherein the pixels of the original background directly select corresponding pixels from the image V for replacement, and obtaining a final image with improved quality, as shown in FIG. 8. Of course, the original background pixels here can also be selected from other polarized original images. Therefore, all the work of dual-polarization imaging and image quality improvement is completed, the final image is removed of the human reflection, the detection difficulty and the visual interference possibly caused by reflection are eliminated, and the target detection capability and the image visual perception degree are effectively improved.
The image reflection removal has important significance for millimeter wave terahertz imaging application. According to the millimeter wave terahertz imaging quality improving method and the dual-polarization imaging system, the dual-polarization imaging system is used for obtaining the dual-polarization image, more scene information is obtained, the dual-polarization information is fully utilized, the limitation that the traditional single-polarization image is difficult to remove the reflection is broken through, the detection difficulty and the visual interference possibly caused by the reflection are effectively eliminated, the processing algorithm is simple and effective, and the robustness is good.
Other embodiments of the invention will be apparent to those skilled in the art from consideration of the specification and practice of the invention disclosed herein. This application is intended to cover any variations, uses, or adaptations of the invention following, in general, the principles of the invention and including such departures from the present disclosure as come within known or customary practice within the art to which the invention pertains. It is intended that the specification and examples be considered as exemplary only, with a true scope and spirit of the invention being indicated by the following claims.
Claims (10)
1. A millimeter wave terahertz imaging quality improvement method is characterized by comprising the following steps:
obtaining a horizontal polarization image and a vertical polarization image of millimeter wave terahertz imaging of a measured object;
carrying out image feature extraction on the horizontal polarization image and the vertical polarization image, and converting to obtain a combined feature image;
detecting the combined characteristic image to obtain a reflection region image;
and replacing the pixels of the reflection area with background pixels of millimeter wave terahertz imaging.
2. The millimeter wave terahertz imaging quality improvement method according to claim 1, wherein the step of performing image feature extraction on the horizontally polarized image and the vertically polarized image and converting the horizontally polarized image and the vertically polarized image to obtain a combined feature image comprises:
obtaining a pixel value of each pixel of the horizontal polarization image and the vertical polarization image;
carrying out binarization processing on pixel values of the horizontal polarization image and the vertical polarization image;
obtaining pixel values of a joint feature image by
Wherein j is a pixel index, pr (j) is a pixel value of j-th pixel of the joint feature image, F is a background pixel average value of the horizontal polarization image and the vertical polarization image, h (j) is a pixel value of j-th pixel of the horizontal polarization image, v (j) is a pixel value of j-th pixel of the vertical polarization image, | x | is an absolute value operator, and Br { } is a binarization operator.
3. The millimeter wave terahertz imaging quality improvement method according to claim 1, wherein the step of detecting the combined feature image to obtain a reflection region image comprises:
performing superpixel segmentation on the combined feature image to obtain a plurality of superpixel segmentation areas;
obtaining the significance of each super-pixel segmentation area so as to obtain a significance image;
and (4) performing binary segmentation on the saliency image to obtain a reflection region image.
4. The millimeter wave terahertz imaging quality improvement method according to claim 3, wherein the step of obtaining the significance of each super-pixel segmentation region comprises:
obtaining distances between different super-pixel segmentation areas;
obtaining the weight of each super pixel segmentation area;
obtaining the significance of each super pixel segmentation region according to the following formula through the weight of each super pixel segmentation region and the distance between each super pixel segmentation region and other super pixel segmentation regions
Wherein r isiAnd rkI and k superpixel partition regions for respectively performing superpixel partition on the combined feature image, i is more than or equal to 1 and less than or equal to N, k is more than or equal to 1 and less than or equal to N, i and k are natural numbers, N is the total number of the superpixel partition regions, and W (r)i) Segmenting a region r for a superpixeliWeight of (D)r(rk，ri) Segmenting a region r for a superpixeliAnd a super-pixel division region rkDistance between, S (r)k) Segmenting a region r for a superpixelkThe significance of (a).
5. The millimeter wave terahertz imaging quality improvement method according to claim 4, wherein the step of obtaining the distance between different super-pixel segmentation regions comprises:
taking the mean value of the pixel values of the joint feature images of the pixels in the super pixel segmentation region as the pixel value of the super pixel segmentation region to obtain the pixel value of each super pixel segmentation region;
obtaining the distance between different super-pixel segmentation areas by
Dr(rk，ri)＝|PRk-PRi|，
Wherein, PRiAnd PRkRespectively a super-pixel division region riAnd rkThe pixel value of (2).
6. The millimeter wave terahertz imaging quality improvement method according to claim 4, wherein the step of obtaining the weight of each super-pixel segmentation region comprises:
obtaining the number of pixels of each super-pixel segmentation area;
obtaining the weight value of each super pixel segmentation region by the following formula
W(ri)＝N(ri)，
Wherein, N (r)i) Is a super imageElement division region riThe number of pixels.
7. A millimeter wave terahertz imaging system is characterized by comprising a focusing lens, a polarization antenna, a radiometer channel and a data acquisition and processing device, wherein the polarization antenna is arranged on a focal plane of the focusing lens, the focusing lens focuses millimeter wave terahertz waves from a measured object on the polarization antenna, and a horizontal polarization image and a vertical polarization image of the millimeter wave terahertz imaging of the measured object are generated through the radiometer channel; the data acquisition processing device is arranged on one side of the polarized antenna, which is far away from the focusing lens, and is used for carrying out image feature extraction and detection on the horizontal polarized image and the vertical polarized image to obtain an inverted image area image, replacing pixels of the inverted image area with background pixels of millimeter wave terahertz imaging, and obtaining a quality improvement image.
8. The millimeter wave terahertz imaging system of claim 7, wherein the polarized antenna and radiometer channel are rotated about a polarized antenna observation axis to time-share obtain horizontally polarized images and vertically polarized images.
9. The millimeter wave terahertz imaging system of claim 7, wherein the polarized antenna and radiometer channel are orthogonally polarizable collection arrays, while obtaining horizontal and vertical dual polarized images.
10. The millimeter wave terahertz imaging system according to claim 9, wherein the data acquisition and processing device comprises a data acquisition unit, a data processor and a data display, the data acquisition unit acquires a horizontally polarized image and a vertically polarized image of the object to be measured; the data processor processes the images acquired by the data acquisition device to acquire quality-improved images; the data display displays the quality-enhanced image.
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