CN111965692B - Scintillator performance test system and calibration method thereof - Google Patents
Scintillator performance test system and calibration method thereof Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
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- G01T7/005—Details of radiation-measuring instruments calibration techniques
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Abstract
本申请公开了一种闪烁体的性能测试系统及其标定方法，所述系统包括第一探头，第一探头包括第一闪烁体探头和第二闪烁体探头，且第一闪烁体探头放置于第一层，第二闪烁体探头放置于第二层，第一层与第二层相互平行；至少一个测试通道，至少一个测试通道之间相互平行，且均位于第一层和所述第二层之间，每个测试通道用于放置被测试闪烁体，每个测试通道的一端分别设置有一个光探测器件；数据采集模块，第一闪烁体探头、第二闪烁体探头和每个测试通道分别设置一个数据采集模块，用于将信号进行处理并传输至计算机。本公开的测试系统结构简单，无需放射源，安全稳定，实现了多块闪烁体的批量测试，提高了测试效率。
The present application discloses a scintillator performance test system and a calibration method thereof, wherein the system comprises a first probe, the first probe comprises a first scintillator probe and a second scintillator probe, and the first scintillator probe is placed on the first layer, the second scintillator probe is placed on the second layer, and the first layer and the second layer are parallel to each other; at least one test channel, at least one test channel is parallel to each other and is located between the first layer and the second layer, each test channel is used to place the scintillator to be tested, and a light detection device is respectively arranged at one end of each test channel; a data acquisition module, the first scintillator probe, the second scintillator probe and each test channel are respectively provided with a data acquisition module, which is used to process the signal and transmit it to a computer. The test system disclosed in the present invention has a simple structure, does not require a radiation source, is safe and stable, realizes batch testing of multiple scintillators, and improves test efficiency.
Description
Technical Field
The invention relates to the technical field of nuclear detection, in particular to a performance test system of a scintillator and a calibration method thereof.
Background
Currently, nuclear radiation detectors are devices that record and detect nuclear radiation events, and have been widely used in many fields, such as nuclear physics experiments, particle astrophysics, nuclear medicine, geological detection, and industrial detection. Plastic scintillators are organic scintillators, and when charged particles or gamma rays are incident into the scintillator, atoms (molecules) in the scintillator are ionized, excited, and fluorescent light is emitted in the deexcitation process. The scintillator is coupled to a light detecting device (e.g., a photomultiplier tube, etc.) for detecting charged or neutral particles. The plastic scintillator has the advantages of easy preparation into a large volume, no deliquescence, irradiation resistance, short luminescence decay time, low price, stable performance, small influence on environment and the like. In the field of high-energy particle physics, a large number of such particle detectors are used in the field as cosmic ray particle detector arrays, and a scintillator detector is one of the most commonly used nuclear radiation detectors, and generally consists of a scintillator, a light detecting device and an electronic component. The performance of the scintillator, such as luminous light output, is directly related to the performance of the detector, and when the scintillator detector is developed and produced, the performance of the scintillator is a vital task, in certain applications, the field detector array is used in a large amount at a time, and the scintillators of the same model, produced by different scintillators or different batches, have certain differences in light yield and transparency, and particularly show that the number of photons (light output) emitted from the surface of the scintillator is different.
Therefore, the performance such as the light output of a large amount of scintillations is measured, and the scintillator which can meet the use requirement is selected. How to measure the light output of a large number of scintillators or the light output of each scintillator in a scintillator array conveniently, quickly, and accurately is a technical difficulty.
The prior art scheme can only test the performance of one scintillator at a time, and if a large number of scintillators need to be measured, the working efficiency is very low.
Disclosure of Invention
In view of the foregoing drawbacks or shortcomings of the prior art, it is desirable to provide a scintillator performance test system and calibration method thereof that enables batch testing of scintillator light output while also being able to monitor transparency.
In a first aspect, a performance testing system for a scintillator includes:
The first probe comprises a first scintillator probe and a second scintillator probe, the first scintillator probe is arranged on a first layer, the second scintillator probe is arranged on a second layer, and the first layer and the second layer are parallel to each other;
The test channels are parallel to each other and are positioned between the first layer and the second layer, each test channel is used for placing a tested scintillator, and one end of each test channel is provided with a light detector respectively;
And the data acquisition module is respectively arranged on the first scintillator probe, the second scintillator probe and each test channel and used for processing signals and transmitting the signals to the computer.
As an alternative, the method further comprises: the second probe comprises a third scintillator probe and a fourth scintillator probe, the third scintillator probe and the fourth scintillator probe are respectively connected with a data acquisition module, wherein the third scintillator probe and the first scintillator probe are positioned on the same layer and are respectively positioned at two ends of a tested scintillator, and the fourth scintillator probe and the second scintillator probe are positioned on the same layer and are respectively positioned at two ends of the tested scintillator.
As an alternative scheme, the test device further comprises a camera bellows, the first probe and the second probe, and at least one test passing and data acquisition module is located in the camera bellows.
As an alternative scheme, the device comprises an assembly bracket, wherein the assembly bracket at least comprises three layers, a first scintillator probe and a third scintillator probe are arranged on the uppermost layer of the assembly bracket, a second scintillator probe and a fourth scintillator probe are arranged on the lowermost layer of the assembly bracket, a test channel is respectively arranged on each remaining layer, an optical detection device is fixed on the end part of the assembly bracket, and data acquisition modules corresponding to the first scintillator probe, the second scintillator probe, the third scintillator probe, the fourth scintillator probe and the test channel are respectively arranged on the corresponding layers of the assembly bracket.
As an alternative, the connection between the assembly bracket and the test channel is provided with a sliding rail, and the test channel can move along the sliding rail.
As an alternative scheme, the test channel is provided with a mounting groove, the mounting groove extends along the length direction of the test channel, the size of the mounting groove is consistent with that of the tested scintillator, and when the tested scintillator is mounted in the mounting groove, the tested scintillator is in air coupling with the light detector.
As an alternative scheme, the first scintillator probe, the second scintillator probe, the third scintillator probe and the fourth scintillator probe respectively comprise scintillators, grooves are formed in the surfaces of the scintillators, at least one wavelength shift optical fiber is placed in the grooves, and the scintillators are connected with the photomultiplier in a coupling mode through the wavelength shift optical fiber.
Alternatively, the surface of the scintillator is coated with a reflective film, and the reflective film is any one of tyvek paper, an aluminum film or zinc sulfide.
In a second aspect, the present invention provides a calibration method of the test system according to the first aspect, including:
judging whether the test system is stable or not by using a standard scintillator;
If yes, testing the light output values of the same tested scintillator in different test channels;
Calculating the ratio of the light output values of the same tested scintillator in different test channels to obtain correction coefficients, and correcting the test channels according to the correction coefficients.
Alternatively, the process of judging whether the test system is stable by using the standard scintillator includes:
placing a plurality of standard scintillators in each test channel respectively, and testing the light output value of the standard scintillators;
calculating the ratio of the current light output value to the preset light output value of each test channel;
if the ratio is 1, the test system is stable;
If the ratio is not equal to 1, the stability of the test system is corrected according to the ratio, and then the process of correcting the test channel is executed.
According to the test system, through the design of the first probe and the second probe, the influence of other stray photons when mu particles pass through the first scintillator probe, the tested scintillator and the second scintillator probe is eliminated, at least one layer of test channel is arranged, the tested scintillator is placed on the test channel, simultaneous testing of a plurality of scintillators is achieved, mutual light and interference between each tested scintillator cannot occur, and the test efficiency and the test accuracy are improved.
Drawings
Other features, objects and advantages of the present application will become more apparent upon reading of the detailed description of non-limiting embodiments, made with reference to the accompanying drawings in which:
FIG. 1 is a schematic diagram of a scintillator performance testing system according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a scintillator performance testing system according to an embodiment of the present invention;
FIG. 3 is a schematic view showing a partial structure of a connection between a test channel and a mounting bracket in a scintillator performance test system according to an embodiment of the present invention;
FIG. 4 is a flow chart of a correction method of a scintillator performance test system according to an embodiment of the present invention;
FIG. 5 is a graph showing a measured light output profile of the same channel repeated 10 times in one embodiment of the present invention;
FIG. 6 is a graph showing the magnitude of the number of light output counts from a 18 month 8 th layer test of the same standard scintillator in one embodiment of the present invention;
FIG. 7 is a plot of scintillator light output measurements for a batch of one embodiment of the present invention.
Detailed Description
The application is described in further detail below with reference to the drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the application and are not limiting of the application. It should be noted that, for convenience of description, only the portions related to the application are shown in the drawings.
It should be noted that, without conflict, the embodiments of the present application and features of the embodiments may be combined with each other. The application will be described in detail below with reference to the drawings in connection with embodiments.
Because the acquisition amount of each piece of plastic flash data is larger than 1 ten thousand cases, the sea level single mu case rate is not larger than 160Hz in the area of 1 square meter, the probe area is too large to influence the position response uniformity, the case rate is not larger than 10Hz when the probe area is 25cm x 25cm (related to the probe spacing, and the case rate is smaller when the spacing is larger). Thus, at least 17 minutes is required to accumulate 1 ten thousand instances. However, in the existing test process, in order to make the PMT photomultiplier enter a stable operation state, the test system needs to be preheated for 30 minutes. One hour is required to complete one test. For thousands of scintillators, only one can be tested at a time, and the test efficiency is low.
Based on the above-described problems, an embodiment of the present application provides a performance test system of a scintillator, as shown in fig. 1, the test system including:
a first probe 10, the first probe 10 including a first scintillator probe 11 and a second scintillator probe 12, the first scintillator probe 11 being placed on a first layer, the second scintillator probe 12 being placed on a second layer, the first layer and the second layer being parallel to each other;
At least one test channel 30, at least one test channel 30 is parallel to each other and is located between the first layer and the second layer, each test channel 30 is used for placing a scintillator 31 to be tested, and one end of each test channel 30 is respectively provided with a light detecting device 32;
The data acquisition module 40, the first scintillator probe 11, the second scintillator probe 12, and each of the test channels 30 are each provided with a data acquisition module 40 for processing and transmitting signals to the computer 60.
The cosmic ray muons pass through the first scintillator probe 11, the scintillator under test 31, and the second scintillator probe 21 in this order, and photons are excited in the scintillator under test, and the light output signals are detected by the light detecting device 32.
It should be noted that the number of the substrates,
In order to exclude photon interference in the external environment, the whole test process must be guaranteed to be performed in a dark or light-proof environment, so that the whole test system can be placed in a dark box 50 which is completely light-proof.
The present disclosure uses cosmic ray muons as incident charged particles, does not require the use of radioactive sources, and is safe and stable. The muons generated in cosmic rays decay as they pass through the atmosphere, with a resting lifetime of only 2.2 microseconds, which decays rapidly into an electron, an anti-electron neuter and a muon neuter. The mu-seed moves at high speed, and the time expansion effect in the narrow relativity causes the mu-seed to decay for a prolonged time, so that the mu-seed has an opportunity to reach the ground. The cosmic ray has high mu-ion energy and strong penetrating power, atoms (molecules) in the scintillator are ionized and excited when the mu-ion passes through the scintillator, photons are emitted in the process of de-excitation, the photons are beaten on a photomultiplier tube (PMT) coupled on the side face of the scintillator, electric signals are output after photoelectric conversion and multiplication, and the electric signals are digitally recorded with charge quantity and time information through an electronic system, so that the light output performance of the scintillator is obtained.
In the present disclosure, the test channel 30 is located between the first layer and the second layer, where the first layer is provided with the first scintillator probe 11, and the second layer is provided with the second scintillator probe 12, it may be understood that the tested scintillator is placed between the first scintillator probe 11 and the second scintillator probe 12, and the μseed may pass through the first scintillator probe 11, the tested scintillator and the second scintillator probe 12, and when the first scintillator probe 11 and the second scintillator probe 12 detect signals at the same time, it is indicated that the μseed has completely passed through the tested scintillator and the second scintillator probe 12, and by the design of the first scintillator probe 11 and the second scintillator probe 12, it is advantageous to open the door of the signal generated by the tested scintillator as a coincidence signal, so as to select the signal of the μseed instance from numerous spurious signals, thereby obtaining the signal output amplitude of each plastic scintillator.
At least one test channel 30 is included in the present disclosure, each for placement of a scintillator under test. Wherein, each test channel 30 can only put a scintillator, of course also can put the scintillator array that comprises a certain amount of scintillators, through a plurality of test channels 30 simultaneous test, can realize a plurality of scintillators simultaneous test, realized batch test, improve test efficiency.
Placing the tested scintillators in the test channels 30 is beneficial to avoiding light crosstalk between each tested scintillator, and ensuring that the photomultiplier tube arranged at one end of each channel only detects the tested scintillator corresponding to the channel. For example, the first channel is provided with a scintillator B1, the end part is provided with a photomultiplier PMT1, the second channel is provided with a scintillator B2, the end part is provided with a photomultiplier PMT2, the third channel is provided with a scintillator B3, and the end part is provided with a photomultiplier PMT3, and it is understood that the light output of the scintillator B2 corresponds to the light detection of the PMT2 one by one without the influence of light, and the PMT2 cannot detect the scintillator B1 and the scintillator B3.
Each test channel 30 is parallel to each other, which is beneficial to avoiding interference between the scintillators to be tested in different channels, and affecting the accuracy of the test.
In order to more clearly collect the output signals of the first scintillator probe 11, the second scintillator probe 12 and the tested scintillator, as shown in fig. 2, each layer is correspondingly connected with a data collection module 40, and the data collection module 40 is mainly used for carrying out analog-to-digital conversion on the signals of each layer, carrying out integration on the digital signals to find peaks in real time and complete integration, and transmitting the signals to a computer for displaying so as to more intuitively observe the monitoring result. The data acquisition module 40 generally includes an electronics system 41 and a power supply system 42, which are connected to a clock system 43 via optical fibers to synchronize signals and upload data to the computer 60. Specifically, the power system 42 provides voltages to the light detecting device 32 and the electronic system 41, respectively, the light detecting device 32 transmits signals to the electronic system 41, and the electronic system 41 is connected to the clock system 42 so that the test signals of each test channel can be synchronously transmitted to the computer, wherein the clock system 42 can adopt a white rabbit clock system, and the signal synchronization time precision is less than 1ns.
According to the test system, through the design of the first scintillator probe and the first scintillator probe, the influence of other stray photons when mu particles pass through the first scintillator probe, the tested scintillator and the first scintillator probe is eliminated, and at least one layer of test channel is used for placing the tested scintillator on the test channel, so that simultaneous testing of a plurality of scintillators is realized, mutual light and interference between each tested scintillator cannot be avoided, and the test efficiency and the test accuracy are improved.
As a practical way, the assembly bracket 33 is included, the assembly bracket 33 is installed in the camera bellows 50, the assembly bracket 33 includes at least three layers, wherein the uppermost layer of the assembly bracket 33 is provided with the first scintillator probe 11, the lowermost layer of the assembly bracket 33 is provided with the second scintillator probe 12, each of the remaining layers is provided with one test channel 30, the light detecting device 32 is fixed at the end of the assembly bracket 33, and the first scintillator probe 11, the second scintillator probe 12 and the data acquisition module 40 corresponding to each test channel 30 are respectively provided with the corresponding layers of the corresponding assembly bracket 33. The embodiment is beneficial to the uniformity of the structure of the whole test system and is easy to operate.
In a preferred embodiment, the second probe 20 is further comprised, the second probe 20 comprises a third scintillator probe 21 and a fourth scintillator probe 22, wherein the third scintillator probe 21 and the first scintillator probe 11 are located on the same layer and are located at two ends of the scintillator under test, respectively, and the fourth scintillator probe 22 and the second scintillator probe 12 are located on the same layer and are located at two ends of the scintillator under test, respectively. In this embodiment, due to the synergistic effect of the first probe 10 and the second probe 20, since the tested scintillator 31 has a certain length, the distances between the first probe 10 and the second probe 20 relative to the light detecting device 32 are inconsistent, for example, the distance between the first probe 10 and the light detecting device 32 is greater than the distance between the second probe 20 and the light detecting device 32, so that the cosmic ray μ -electrons passing through the first probe 10 will be emitted in the scintillator, and the photons will be attenuated to some extent, so that the cosmic ray μ -sub-signals of the first probe 10 received by the light detecting device 32 will be smaller than those of the second probe 20, and therefore, by comparing the signals of the first probe 20 with those of the second probe 20, the attenuation length of the tested scintillator can be obtained, so as to reflect the transparency of the tested scintillator, that is, if the attenuation length is short, the transparency of the tested scintillator is higher, and conversely, the transparency of the tested scintillator is worse.
Wherein, the tested scintillator is placed between the upper and lower layers of probes, and the size of a single probe is 25cm multiplied by 2cm. Since the count rate of muons at sea level is about 160Hz/m 2, the area of the scintillator cell detector 100cm x 25cm x 2cm is 0.25m 2, and the probability of more than two muons striking the scintillator simultaneously within the coincidence time window is small. The probability of two instances accidentally fitting within a 200ns time window is2 x 10-7Hz.
As an achievable way, a slide rail 34 is provided at the connection of the mounting bracket 33 and the test channel 30 as shown in fig. 3, and the test channel 30 moves along the slide rail 34. In this embodiment, the assembly of the scintillator under test is facilitated.
In a specific embodiment, the test channel 30 is provided with a mounting groove 35, the mounting groove 35 extends along the length direction of the test channel, the size of the mounting groove 35 is consistent with the size of the scintillator 31 to be tested, and when the scintillator 31 to be tested is mounted in the mounting groove 35, the scintillator 31 to be tested is air-coupled with the light detecting device 32. The embodiment is mainly used for light isolation and light crosstalk prevention, the size of the mounting groove 35 is adjusted to meet the requirements of scintillator tests of different specifications, the cross section size of the mounting groove 35 is consistent with that of the tested scintillator, and the depth is smaller than the height of the tested scintillator. When the device is installed on the tested scintillator 31, the tested scintillator 31 is placed in the installation groove 35 by pulling the testing channel 30 out along the sliding rail 34 of the assembly bracket 33, and then the testing channel 30 is pushed in along the sliding rail 34 of the assembly bracket 33, so that the tested scintillator 31 just contacts with the light detecting device 32. The design of the mounting groove 35 is advantageous for ensuring that the tested scintillator is stably fixed on the test channel, so that the distance between the tested scintillator 31 and the light detecting device 32 is kept consistent, and the distance between the tested scintillator 31 and the light detecting device 32 is not changed due to the movement of the test channel, thereby influencing the light output test of the light detecting device 32 on the tested scintillator 31.
As an achievable manner, the first scintillator probe 11, the second scintillator probe 12, the third scintillator probe 21, and the fourth scintillator probe 22 each include a scintillator, a groove (optical fiber installation groove) is provided on the surface of the scintillator, at least one wavelength shift optical fiber is placed in the optical fiber installation groove, and the scintillator is coupled to the photomultiplier through the wavelength shift optical fiber. In order to increase the light collection efficiency, fluorescence generated by the scintillator is emitted from the side surface and enters the photomultiplier, the surface of the scintillator is coated with a reflecting film, and the reflecting film can be tyvek paper, an aluminum film or zinc sulfide and the like.
As an achievable way, the light detecting device 32 can be realized in various ways, for example, a single-channel photomultiplier, a position-sensitive photomultiplier, and a photodiode or a silicon photodiode.
As a realizable manner, in order to make the installation of the data acquisition module 40 stable and convenient for disassembly and maintenance, a fixing plate is further provided on one side of the mounting bracket 33 for fixing the data acquisition module 40, wherein the fixing plate may be provided on the opposite side of the mounting bracket to the photomultiplier, or may be on the side adjacent to the photomultiplier.
The present invention will be specifically described below by way of an example.
According to the number of scintillators to be tested, 10 channels 30 to be tested are designed, so that 12 layers of mounting brackets 33 are required to be designed, and the mounting brackets 33 are placed in the dark box 50 for light shielding. The assembling support 33 is formed by arranging a first probe 10 and a second probe 20 on a first layer and a twelfth layer from top to bottom, movably connecting 10 test channels 30 on the middle ten layers respectively, arranging a light detecting device 32 at one end of each test channel 30, using a photomultiplier tube with the XP3960 model with the diameter of 1.5inch double base as the light detecting device 32, using a glass shell as a material, pulling out one end of the test channel 30 from the assembling support, assembling the scintillators to be tested on the test channel 30, arranging the maximum size of each scintillator to be tested to be 100cm x 25cm x 3.0cm (length x width x thickness) and polystyrene as a material, and pushing one end of the test channel 30 to enable the scintillators to be tested to be coupled with the photomultiplier tube. The first probe 10, the second probe 20 and the photomultiplier corresponding to the scintillator to be tested are all connected to a data acquisition module 40 through signal lines, wherein the data acquisition module 40 includes an electronics module 41 and a power module 42, the size of the electronics module is 17×11×4cm in this embodiment, the chip dissipates heat during operation, the temperature is about 40 ℃ higher than the room temperature, and the size of the power module is 18×12×7cm.
In summary, according to the present disclosure, by designing a plurality of test channels, batch testing of performance of a plurality of scintillators can be achieved, and each tested scintillator cannot cross light and interfere with each other, so that testing efficiency is improved. By the design of the first probe and the second probe, not only the light output performance of the scintillator but also the transparency of the scintillator can be tested. The first probe and the second probe are used for distinguishing two scintillator probes, so that the influence of other stray photons when mu-electrons pass through the first scintillator probe, the tested scintillator and the first scintillator probe is eliminated, and the testing accuracy is improved. The method and the device use the natural cosmic rays to measure the light output of the plastic scintillators in batches, do not need a radioactive source, and are safe and stable.
In the second aspect, during a single scintillator test, the average number of cases recorded by each plastic flash unit exceeds 1 ten thousand, and the relative statistical error of the average value is less than 1%, so that the test system error is a major part affecting the measurement accuracy, and the relative system error is generally required to be less than 3%.
However, due to the differences in photomultiplier tubes, power supplies and electronics modules used in the different layers, variations in the light output of the same scintillator will result from the use of no test channels, and therefore all of the test channels need to be modified to eliminate the variations.
An embodiment of the present invention provides a correction method of a performance test device for a scintillator, as shown in fig. 4, specifically including:
s100, judging whether a test system is stable or not by using a standard scintillator;
S200, if yes, testing the light output values of the same scintillator in different test channels;
S300, calculating the ratio of the light output values of the same scintillator in different test channels to obtain a correction coefficient, and correcting the test channels according to the correction coefficient.
Wherein, at S100, whether the test system is stable or not is judged by using the standard scintillator, specifically including:
And respectively placing a plurality of standard scintillators in each test channel, testing the light output value of the standard scintillators, calculating the ratio of the current light output value to the preset light output value of each test channel, if the ratio is 1, stabilizing the test system, and if the ratio is not 1, correcting the stability of the test system according to the ratio. For the corrected test system, as shown in fig. 5, for the same test channel, entries is the number of tests for 10 times, mean is equal to 60.7, RMS is equal to 0.6824, that is, the relative error of the light output obtained by repeatedly placing the same scintillator for 10 times is recorded as sigma 1,σ1 equal to (RMS)/Mean) about 1.4, the relative error introduced by the correction coefficient is sigma 2, and the 1/2 th power of sigma 2 is obtained according to the error transfer formula and multiplied by sigma 1 is 2.0%, thereby obtaining the corrected relative error of the measured value of each test channel The preset light output value is obtained by testing the standard scintillator when the stability of the test system is corrected last time.
And correcting the stability of the test system, testing and recording the light output values of the same scintillator in different test channels, calculating the ratio of the light output values of the same scintillator in different test channels to obtain a correction coefficient, and correcting the test system according to the correction coefficient.
It should be noted that, before each batch of scintillator to be tested is tested, the stability of the test system needs to be corrected once, so as to ensure the long-time stable operation of the test system.
Illustratively:
A test system comprising 10 test channels, the 18 month monitoring stability is shown in FIG. 6, the abscissa in FIG. 6 is the number of test months, the ordinate is the average value of the number of light output counts, the stability of the 8 th layer test channel is monitored for a long period of time by 10 standard scintillators, and the stability of the 8 th layer remains stable within the system error.
For 10 test channels, the light output values of the same scintillator were tested to obtain the scaling factor between the different layers, as shown in table 1:
TABLE 1 correction factors for calibration of 10 channels
The test system was modified according to the above method and the same 240 scintillators were spot inspected, and the light output was measured using the above measurement system, as shown in fig. 7, with the abscissa representing the light output value, the light output size satisfying the ED design requirement, and the uniformity was less than or equal to 5%.
The above description is only illustrative of the preferred embodiments of the present application and of the principles of the technology employed. It will be appreciated by persons skilled in the art that the scope of the application referred to in the present application is not limited to the specific combinations of the technical features described above, but also covers other technical features formed by any combination of the technical features described above or their equivalents without departing from the inventive concept. Such as the above-mentioned features and the technical features disclosed in the present application (but not limited to) having similar functions are replaced with each other.
Claims (7)
1. A scintillator performance testing system, comprising:
The first probe comprises a first scintillator probe and a second scintillator probe, the first scintillator probe is arranged on a first layer, the second scintillator probe is arranged on a second layer, and the first layer and the second layer are parallel to each other;
The test channels are parallel to each other and are positioned between the first layer and the second layer, each test channel is used for placing a scintillator to be tested, and one end of each test channel is provided with a light detecting device;
The data acquisition module is respectively arranged on the first scintillator probe, the second scintillator probe and each test channel and is used for processing signals and transmitting the signals to a computer;
The second probe comprises a third scintillator probe and a fourth scintillator probe which are respectively connected with one data acquisition module, wherein the third scintillator probe and the first scintillator probe are positioned on the same layer and are respectively positioned at two ends of a tested scintillator, and the fourth scintillator probe and the second scintillator probe are positioned on the same layer and are respectively positioned at two ends of the tested scintillator;
The first scintillator probe, the second scintillator probe, the third scintillator probe and the fourth scintillator probe respectively comprise scintillators, grooves are formed in the surfaces of the scintillators, at least one wavelength shift optical fiber is placed in each groove, and the scintillators are coupled and connected with a photomultiplier through the wavelength shift optical fiber;
the test device further comprises a camera bellows, wherein the first probe and the second probe, and the at least one test channel and the data acquisition module are both positioned in the camera bellows.
2. The test system of claim 1, further comprising a mounting bracket, the mounting bracket comprising at least three layers, wherein an uppermost layer of the mounting bracket is provided with the first scintillator probe and the third scintillator probe, a lowermost layer of the mounting bracket is provided with the second scintillator probe and the fourth scintillator probe, each remaining layer is provided with one test channel, and an end of the mounting bracket is provided with the light detecting device, and data acquisition modules corresponding to the first scintillator probe, the second scintillator probe, the third scintillator probe, the fourth scintillator probe and the test channel are respectively provided on corresponding layers of the mounting bracket.
3. The test system of claim 2, wherein a slide rail is provided at a junction of the mounting bracket and the test channel, the test channel being movable along the slide rail.
4. The test system of claim 1, wherein the test channel has a mounting slot formed therein, the mounting slot extending along a length of the test channel, the mounting slot having a size that is consistent with a size of the scintillator under test, and wherein the scintillator under test is air-coupled to the light detecting device when the scintillator under test is mounted in the mounting slot.
5. The test system of claim 1, wherein the scintillator surface is coated with a reflective film, the reflective film being any one of tyvek paper, aluminum film, or zinc sulfide.
6. A method of calibrating a test system according to any of claims 1-5, comprising:
judging whether the test system is stable or not by using a standard scintillator;
if yes, testing the light output values of the same tested scintillator in the different test channels;
Calculating the ratio of the light output values of the same tested scintillator in different test channels to obtain correction coefficients, and correcting the test channels according to the correction coefficients.
7. The method of calibrating according to claim 6, wherein the determining whether the test system is stable using standard scintillators comprises:
Placing a plurality of standard scintillators in each test channel respectively, and testing the light output value of the standard scintillators;
Calculating the ratio of the current light output value to the preset light output value of each test channel;
If the ratio is 1, the test system is stable;
and if the ratio is not equal to 1, carrying out stability correction on the test system according to the ratio, and then executing the process of correcting the test channel.
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