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CN111950222B - Method for generating circuit layout by using simulation software - Google Patents

Method for generating circuit layout by using simulation software Download PDF

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Publication number
CN111950222B
CN111950222B CN201910357312.0A CN201910357312A CN111950222B CN 111950222 B CN111950222 B CN 111950222B CN 201910357312 A CN201910357312 A CN 201910357312A CN 111950222 B CN111950222 B CN 111950222B
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block
reserved space
size
space
blocks
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CN111950222A (en
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刘建成
刘时志
张云智
高淑怡
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Realtek Semiconductor Corp
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Realtek Semiconductor Corp
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Abstract

A method for generating a circuit layout using simulation software, comprising the steps of: (A) Programming a plurality of blocks on a circuit board, wherein each block comprises: an operation space and a reserved space; (B) Determining the size of the reserved space in the block according to at least one specific condition; (C) Determining whether to adjust the size of the reserved space in the block determined in the step (B) according to at least one judging condition; and (D) when the step (C) judges that adjustment is not needed, generating the circuit layout according to the size of the reserved space in the block determined in the step (B).

Description

使用模拟软件产生电路布局的方法Method for generating circuit layout using simulation software

技术领域Technical Field

本公开涉及电源完整性(power integrity,PI)的应用,尤其涉及一种能够妥善判定电路布局的方法,以改善电路无法正常运行的问题。The present disclosure relates to the application of power integrity (PI), and more particularly to a method for properly determining a circuit layout to improve the problem that the circuit cannot operate normally.

背景技术Background technique

电路布局,诸如印刷电路板布局(PCB layout),考量到电压衰退(又称IR Drop)的问题,元件之间通常会预留空间来摆放电容(此操作又称DCAP),作为电路工作异常的解决方案。上述电压衰退又分静态电压衰退以及动态电压衰退,其中静态电压衰退主要跟电源网络的结构和连线细节有关,因此静态电压衰退主要考虑电阻效应,分析电阻的影响即可。动态电压衰退是电源在电路开关切换的时候电流波动引起的电压压降。这种现象产生在时钟的触发沿,往往在短时间内在整个芯片上产生很大的电流,这个瞬间的大电流引起了电压衰退现象。同时开关的晶体管数量越多,越容易触发动态电压衰退现象。Circuit layout, such as printed circuit board layout (PCB layout), takes into account the problem of voltage decay (also known as IR Drop). Space is usually reserved between components to place capacitors (this operation is also called DCAP) as a solution to abnormal circuit operation. The above voltage decay is divided into static voltage decay and dynamic voltage decay. Among them, static voltage decay is mainly related to the structure and connection details of the power supply network. Therefore, static voltage decay mainly considers the resistance effect and analyzes the influence of resistance. Dynamic voltage decay is the voltage drop caused by current fluctuations when the power supply switches the circuit. This phenomenon occurs at the trigger edge of the clock, and often generates a large current on the entire chip in a short period of time. This instantaneous large current causes the voltage decay phenomenon. The more transistors that are switched at the same time, the easier it is to trigger the dynamic voltage decay phenomenon.

然而,现有技术缺乏一种妥善的机制来决定元件之间究竟要预留多少空间来摆放电容,举例来说,现有机制并未考虑到电路的双态触变率(toggle rate),只单纯地从现有的空间内尽可能找出挪出可供摆放电容的空间。请参见图1,图1为现有技术预留DCAP空间的电路布局示意图,由于现有的方法属于随机的预留空间或是根据经验来猜测,这样对于减少电压衰退而言很没有效率。比方说,如果有些区块已经被摆放得很满(空间使用度很高),便没有足够空间来摆放电容值较高的DCAP(电容的电容值大小与体积成正比)来抑制动态电压衰退,而偏偏这样的元件摆放密度较高的区块的双态触变率通常较高,例如一些靠近处理芯片(CPU)、显示芯片(GPU)以及存储器(DDR)的热点(hotspot)区块(如图中所圈选的位置)。相对地,在元件摆放密度不高的空旷区块则有非常充裕的空间摆放DCAP,但这样的区块通常双态触变率不会很高。However, the prior art lacks a proper mechanism to determine how much space should be reserved between components for placing capacitors. For example, the prior art mechanism does not take into account the toggle rate of the circuit, and simply tries to find as much space as possible from the existing space to place capacitors. Please refer to FIG1, which is a schematic diagram of the circuit layout for reserving DCAP space in the prior art. Since the prior art method is to reserve space randomly or guess based on experience, it is very inefficient in reducing voltage decay. For example, if some blocks are already very full (space utilization is very high), there is not enough space to place DCAPs with higher capacitance values (the capacitance value of the capacitor is proportional to the volume) to suppress dynamic voltage decay. However, the toggle rate of such blocks with higher component placement density is usually higher, such as some hotspot blocks close to the processing chip (CPU), display chip (GPU) and memory (DDR) (as circled in the figure). In contrast, there is ample space to place DCAPs in empty blocks with low component placement density, but such blocks usually do not have a very high toggle rate.

综上所述,现有技术对于电压衰减防治的电路布局效率上非常差,如此一来也造成效能下降以及成本大幅提升。In summary, the circuit layout efficiency of the prior art for voltage drop prevention is very poor, which also results in reduced performance and significantly increased costs.

发明内容Summary of the invention

有鉴于传统的电路设计方法并没有考虑双态触变率(toggle rate)对电路规划的影响,本发明提出一种基于双态触变率的程度来决定预留DCAP空间的方法,并且通过软件来分析信息,以妥善地决定DCAP空间的方案,以达到降低动态电压的目的,并且实现电路配置的最佳化。In view of the fact that the traditional circuit design method does not consider the impact of the toggle rate on circuit planning, the present invention proposes a method for determining the reserved DCAP space based on the degree of the toggle rate, and analyzes the information through software to properly determine the DCAP space solution to achieve the purpose of reducing the dynamic voltage and realizing the optimization of the circuit configuration.

本发明的一实施例提供了一种使用模拟软件产生电路布局的方法,包含以下步骤:(A).在一电路板上规划出多个区块,其中这些区块中每一区块包含:一操作空间以及一预留空间;(B).根据至少一特定条件来决定所述区块中预留空间的大小;(C).根据至少一判断条件来决定是否调整步骤(B)中所决定出的所述区块中预留空间的大小;以及(D).当步骤(C)判断不需要调整时,根据步骤(B)中所决定出的所述区块中预留空间的大小来产生该电路布局。An embodiment of the present invention provides a method for generating a circuit layout using simulation software, comprising the following steps: (A). planning a plurality of blocks on a circuit board, wherein each of the blocks comprises: an operating space and a reserved space; (B). determining the size of the reserved space in the block according to at least one specific condition; (C). determining whether to adjust the size of the reserved space in the block determined in step (B) according to at least one judgment condition; and (D). generating the circuit layout according to the size of the reserved space in the block determined in step (B) when step (C) determines that no adjustment is required.

附图说明BRIEF DESCRIPTION OF THE DRAWINGS

图1为现有技术预留DCAP空间的电路布局示意图。FIG. 1 is a schematic diagram of a circuit layout for reserving DCAP space in the prior art.

图2为本发明产生电路布局的方框图。FIG. 2 is a block diagram of a circuit layout for generating the present invention.

图3是按照区块的双态触变率大小而产生的区块分类表。FIG. 3 is a block classification table generated according to the size of the two-state thixotropic rate of the block.

图4为使用图2所示的架构所得到的电路布局的示意图。FIG. 4 is a schematic diagram of a circuit layout obtained by using the architecture shown in FIG. 2 .

图5为根据本发明的一实施例的使用模拟软件产生电路布局的方法。FIG. 5 is a diagram illustrating a method for generating a circuit layout using simulation software according to an embodiment of the present invention.

符号说明Symbol Description

202~212、502~508 步骤Steps 202-212, 502-508

FFG1~FFG8 区块群组FFG1~FFG8 Block Group

Cell(n)~Cell(n-31) 区块Cell(n)~Cell(n-31) Block

DCAP2~DCAP16 预留的电容摆放空间DCAP2~DCAP16 Reserved space for capacitor placement

具体实施方式Detailed ways

请参考图2,图2为本发明产生电路布局的方框图,首先,于步骤202中提供电路板上每个区块的双态触变率数据(可汇整为双态触变率的数据表)。步骤204是根据搜集到的双态触变率数据以及网表(netlist)的信息来产生初步的区块配置方案,此时,电路板上会规划出多个区块,其中所述区块中每一区块包含用于设置元件的操作空间以及DCAP预留空间,通过双态触变率数据表可获得每一个区块的存取率。Please refer to FIG. 2, which is a block diagram of the circuit layout generated by the present invention. First, in step 202, the two-state tactile rate data of each block on the circuit board is provided (which can be summarized as a two-state tactile rate data table). Step 204 is to generate a preliminary block configuration plan based on the collected two-state tactile rate data and netlist information. At this time, multiple blocks will be planned on the circuit board, wherein each of the blocks includes an operation space for setting components and a DCAP reserved space. The access rate of each block can be obtained through the two-state tactile rate data table.

关于步骤204,请参见图3,图3是按照区块的双态触变率大小而产生的区块分类表,其中被归类到区块群组FFG1的区块cell(n)、cell(n-1)、cell(n-2)、cell(n-3)具有最高的双态触变率,因此被设定为DCAP16(“DCAP”所搭配到的数字越大,便会预留更大的空间供摆放电容)。举例来说,设定为DCAP8的区块所分配到的电容预留空间会小于设定为DCAP16的区块所分配到的电容预留空间,而设定为DCAP4的区块所分配到的电容预留空间会小于设定为DCAP8的区块所分配到的电容预留空间,以此类推。请注意,虽然在本发明的举例中是以电容来作为电压衰退的解决方案,但本发明并不以此为限,只要能达到相同效果,电容亦可用别的被动元件来取代。Regarding step 204, please refer to FIG. 3, which is a block classification table generated according to the size of the two-state thixotropic rate of the block, wherein the blocks cell(n), cell(n-1), cell(n-2), and cell(n-3) classified into the block group FFG1 have the highest two-state thixotropic rate, and are therefore set as DCAP16 (the larger the number matched to "DCAP", the more space will be reserved for placing capacitors). For example, the capacitor reserved space allocated to the block set as DCAP8 will be smaller than the capacitor reserved space allocated to the block set as DCAP16, and the capacitor reserved space allocated to the block set as DCAP4 will be smaller than the capacitor reserved space allocated to the block set as DCAP8, and so on. Please note that although capacitors are used as a solution to voltage degradation in the examples of the present invention, the present invention is not limited to this, and capacitors can also be replaced by other passive components as long as the same effect can be achieved.

图3中间的虚线表示当前的分组只用到FFG1~FFG4四个区块群组,当需要进行更细的分组时,虚线可作下拉。举例来说,当虚线下移一行时,区块的分组即变成了5组。考量到不使预留空间的总面积占全部区块的比例太高,分组要分到多细(亦即虚线要下拉的幅度)必须有所折衷(Trade off)。请注意,步骤206可进一步通过软件功能(诸如sdc和floorplan)来优化元件的摆放,以产生候选电路布局。The dotted line in the middle of FIG. 3 indicates that the current grouping only uses four block groups FFG1 to FFG4. When a finer grouping is required, the dotted line can be pulled down. For example, when the dotted line moves down one row, the block grouping becomes 5 groups. Considering that the total area of the reserved space does not account for too high a proportion of all blocks, how fine the grouping should be (i.e., the extent to which the dotted line should be pulled down) must be compromised. Please note that step 206 can further optimize the placement of components through software functions (such as sdc and floorplan) to generate candidate circuit layouts.

以上是以分别对应多个区块的双态触变率来进行所述区块的排序,其中区块被分配到的预留空间与其双态触变率成正比,亦即双态触变率可能较高的区块会分配到更大的DCAP区块。除此之外,本发明亦可考量区块是否位于热点(例如邻近CPU、GPU、DDR等的位置)或邻近于热点,例如考量每一区块与热点之间的距离。The above is to sort the blocks according to the binary tactile rates corresponding to the multiple blocks, wherein the reserved space allocated to the block is proportional to its binary tactile rate, that is, the block with a higher binary tactile rate may be allocated a larger DCAP block. In addition, the present invention may also consider whether the block is located at a hot spot (e.g., a location adjacent to a CPU, GPU, DDR, etc.) or adjacent to a hot spot, for example, considering the distance between each block and the hot spot.

为了尽可能利用多余的电路空间来作为DCAP的用途,以及在兼顾DCAP之余能够不去占用到重要的元件摆放空间,在步骤208中,本发明可另行以“DCAP区块不占用所有区块面积的1%~3%(例如2%)”来作为判断条件,这是考量到若预留的DCAP空间太大,整体电路的效率将会受到影响。当判断出预留空间超出总区块面积的预定值(或预定百分比)时,则流程必须回到步骤204、206以重新产生候选电路布局。In order to make full use of the extra circuit space for DCAP and not occupy important component placement space while taking into account DCAP, in step 208, the present invention can use "DCAP block does not occupy 1% to 3% (e.g., 2%) of all block areas" as a judgment condition. This is because if the reserved DCAP space is too large, the efficiency of the overall circuit will be affected. When it is determined that the reserved space exceeds the predetermined value (or predetermined percentage) of the total block area, the process must return to steps 204 and 206 to regenerate candidate circuit layouts.

接着,步骤210继续对候选电路布局进行进一步检视,倘若所决定出的对应区块的DCAP空间大小能够令整体的动态电压衰减(dynamic IR drop)达到预定目标,则以当前的电路布局作为输出最终布局,步骤212产生电路布局,其中预定目标可以是令电路布局能够正常工作的范围,等本发明并不以为限。Next, step 210 continues to further examine the candidate circuit layouts. If the determined DCAP space size of the corresponding block can make the overall dynamic IR drop reach the predetermined target, the current circuit layout is used as the output final layout. Step 212 generates a circuit layout, wherein the predetermined target can be a range that enables the circuit layout to work normally, etc., and the present invention is not limited thereto.

请参考图4,图4为使用图2所示的架构所得到的电路布局的示意图,相较于图1,圈选的热点位置具有充足的DCAP区块,且在整体布局上并没有未使用到的大片区块。Please refer to FIG. 4 , which is a schematic diagram of a circuit layout obtained by using the architecture shown in FIG. 2 . Compared with FIG. 1 , the circled hotspot locations have sufficient DCAP blocks, and there are no unused large blocks in the overall layout.

请参考图5,图5为根据本发明的一实施例的使用模拟软件产生电路布局的方法。请注意,假若可获得实质上相同的结果,则这些步骤并不一定要遵照图5所示的执行次序来执行。图5的方法可简单归纳如下:Please refer to FIG. 5 , which is a method for generating a circuit layout using simulation software according to an embodiment of the present invention. Please note that if substantially the same result can be obtained, the steps do not necessarily have to be executed in the order shown in FIG. 5 . The method of FIG. 5 can be simply summarized as follows:

502:在一电路板上规划出多个区块,其中每一区块包含:一操作空间以及一预留空间;502: Plan a plurality of blocks on a circuit board, wherein each block includes: an operation space and a reserved space;

504:根据至少一特定条件来决定所述区块中预留空间的大小;504: Determine the size of the reserved space in the block according to at least one specific condition;

506:根据至少一判断条件来决定是否需要修正所决定出的所述区块中预留空间的大小,若是,流程回到步骤504;若否,流程进入步骤508;506: Determine whether the size of the reserved space in the determined block needs to be modified according to at least one judgment condition. If so, the process returns to step 504; if not, the process proceeds to step 508;

508:根据所决定出的所述区块中预留空间的大小来产生电路布局。508: Generate a circuit layout according to the determined size of the reserved space in the block.

由于本领域技术人员在阅读完以上段落后应可轻易了解图5中每一步骤的细节,为简洁之故,在此将省略进一步的描述。Since those skilled in the art can easily understand the details of each step in FIG. 5 after reading the above paragraphs, further description will be omitted here for the sake of brevity.

综上所述,通过实施本发明的技术特征,电路板上多余的空间可得到妥善地利用。此外,由于本发明是通过软件来依据双态触变率数据表产生对应的电路布局,因此在产生速度上极为快速,且在空间利用上极为精确,不会遗留大片无法利用到的区块,也不会牺牲到重要电路元件的摆放。In summary, by implementing the technical features of the present invention, the extra space on the circuit board can be properly utilized. In addition, since the present invention generates the corresponding circuit layout according to the two-state thixotropic rate data table through software, the generation speed is extremely fast and the space utilization is extremely accurate, without leaving large unusable blocks and sacrificing the placement of important circuit components.

以上所述仅为本发明的优选实施例,凡依本发明权利要求所做的均等变化与修饰,皆应属本发明的涵盖范围。The above descriptions are only preferred embodiments of the present invention. All equivalent changes and modifications made according to the claims of the present invention should fall within the scope of the present invention.

Claims (9)

1. A method of generating a circuit layout using simulation software, comprising the steps of:
(A) Programming a plurality of blocks on a circuit board, wherein each block comprises: an operation space and a reserved space;
(B) Determining the size of the reserved space in the block according to at least one specific condition;
(C) Determining whether to adjust the size of the reserved space in the block determined in the step (B) according to at least one judging condition; and
(D) Generating the circuit layout according to the size of the reserved space in the block determined in the step (B) when the step (C) judges that the adjustment is not needed,
Wherein the at least one specific condition comprises: the at least one judgment condition comprises: whether the total reserved space in the block exceeds a preset value.
2. A method of generating a circuit layout using simulation software, comprising the steps of:
(A) Programming a plurality of blocks on a circuit board, wherein each block comprises: an operation space and a reserved space;
(B) Determining the size of the reserved space in the block according to at least one specific condition;
(C) Determining whether to adjust the size of the reserved space in the block determined in the step (B) according to at least one judging condition; and
(D) Generating the circuit layout according to the size of the reserved space in the block determined in the step (B) when the step (C) judges that the adjustment is not needed,
Wherein the at least one specific condition comprises: the at least one judgment condition comprises: whether the size of the reserved space in the block determined in the step (B) enables the overall dynamic voltage attenuation to reach a preset target or not.
3. A method of generating a circuit layout using simulation software, comprising the steps of:
(A) Programming a plurality of blocks on a circuit board, wherein each block comprises: an operation space and a reserved space;
(B) Determining the size of the reserved space in the block according to at least one specific condition;
(C) Determining whether to adjust the size of the reserved space in the block determined in the step (B) according to at least one judging condition; and
(D) Generating the circuit layout according to the size of the reserved space in the block determined in the step (B) when the step (C) judges that the adjustment is not needed,
Wherein the at least one specific condition further comprises: whether the blocks are located at the hot spot or the distance between each of the blocks and the hot spot, and the at least one judgment condition includes: whether the total reserved space in the block exceeds a preset value.
4. A method of generating a circuit layout using simulation software, comprising the steps of:
(A) Programming a plurality of blocks on a circuit board, wherein each block comprises: an operation space and a reserved space;
(B) Determining the size of the reserved space in the block according to at least one specific condition;
(C) Determining whether to adjust the size of the reserved space in the block determined in the step (B) according to at least one judging condition; and
(D) Generating the circuit layout according to the size of the reserved space in the block determined in the step (B) when the step (C) judges that the adjustment is not needed,
Wherein the at least one specific condition further comprises: whether the blocks are located at the hot spot or the distance between each of the blocks and the hot spot, and the at least one judgment condition includes: whether the size of the reserved space in the block determined in the step (B) enables the overall dynamic voltage attenuation to reach a preset target or not.
5. The method of any one of claims 1 to 4, wherein when step (C) determines that adjustment is required, step (a) is skipped.
6. The method of claim 1 or 2, wherein step (B) further comprises: the blocks are ordered according to the magnitude of the bi-state thixotropic rate corresponding to the block, wherein the reserved space to which a block is allocated is proportional to its bi-state thixotropic rate.
7. A method as claimed in claim 1 or 3, wherein the predetermined value is a predetermined percentage of the total area of the block, and the predetermined percentage is 1% to 3%.
8. The method of claim 2 or 4, wherein the predetermined goal is that the circuit layout is capable of maintaining a state of normal operation.
9. The method of any one of claims 1 to 4, wherein a headspace in the block is used to set a capacitance.
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