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CN111900102A - Single Wafer Wet Processing Equipment - Google Patents

Single Wafer Wet Processing Equipment Download PDF

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CN111900102A
CN111900102A CN201910372200.2A CN201910372200A CN111900102A CN 111900102 A CN111900102 A CN 111900102A CN 201910372200 A CN201910372200 A CN 201910372200A CN 111900102 A CN111900102 A CN 111900102A
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liquid
gas
recovery
bellows
wet processing
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陈贤鸿
吴宗恩
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Grand Plastic Technology Corp
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67023Apparatus for fluid treatment for general liquid treatment, e.g. etching followed by cleaning
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67028Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H01L21/6704Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing

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Abstract

本揭示提供一种单晶圆湿处理设备,包含:旋转台,用于放置晶圆;液体供应装置,用于对所述晶圆施加多种工艺液体;液体回收装置,包含多个回收环,其中每一所述回收环用于收集对应的其中一种工艺液体及其夹带的气液混合物;以及多个气体回收装置,分别与所述液体回收装置的所述多个回收环对应连接,用于将收集的所述气液混合物排出。

Figure 201910372200

The present disclosure provides a single wafer wet processing equipment, comprising: a rotating table for placing a wafer; a liquid supply device for applying a variety of process liquids to the wafer; a liquid recovery device, comprising a plurality of recovery rings, wherein each of the recovery rings is used to collect a corresponding one of the process liquids and a gas-liquid mixture entrained therein; and a plurality of gas recovery devices, respectively connected to the plurality of recovery rings of the liquid recovery device, for discharging the collected gas-liquid mixture.

Figure 201910372200

Description

单晶圆湿处理设备Single Wafer Wet Processing Equipment

技术领域technical field

本揭示涉及一种湿处理设备,特别是涉及一种单晶圆湿处理设备。The present disclosure relates to a wet processing equipment, in particular to a single wafer wet processing equipment.

背景技术Background technique

在半导体晶圆的工艺中,需要对半导体晶圆的元件设置面进行多道处理步骤,包含蚀刻、清洗等湿式处理程序。随着半导体晶圆的工艺复杂度增加,现已发展出一种单晶圆湿处理机台,其中采用一个旋转台对应多个液体回收模组的设计,使得单晶圆湿处理机台可对旋转台上的晶圆施加多种不同的化学液体,并且通过对应的回收模组收集所述化学液体。通过施加不同的化学液体可对半导体晶圆上的多种金属层或其他材料薄膜层进行清洗蚀刻。也就是说,在单晶圆湿处理机台中会使用多种不同的化学液体,这使得用于收集化学液体及其夹带的气液混合物的收集装置的功能要求变得格外严格。In the process of the semiconductor wafer, it is necessary to perform multiple processing steps on the component installation surface of the semiconductor wafer, including wet processing procedures such as etching and cleaning. As the process complexity of semiconductor wafers increases, a single-wafer wet processing machine has been developed, in which a rotary table is used to correspond to the design of multiple liquid recovery modules, so that the single-wafer wet processing machine can A variety of different chemical liquids are applied to the wafers on the rotary table, and the chemical liquids are collected by corresponding recycling modules. Various metal layers or thin film layers of other materials on semiconductor wafers can be cleaned and etched by applying different chemical liquids. That is, many different chemical liquids are used in a single-wafer wet processing tool, which makes the functional requirements of the collection device for collecting chemical liquids and their entrained gas-liquid mixtures extremely strict.

然而,现有的单晶圆湿处理机台是采用多个液体回收模组共同连接至一个气体回收装置的设计。也就是说,虽然现有的单晶圆湿处理机台可通过多个液体回收模组来对应收集不同的化学液体,却无法将不同的化学液体夹带的不同的气液混合物分别独立收集。上述单一个气体回收装置的设计会导致不同的气液混合物在气体回收装置内混杂在一起。由于不同的气液混合物含有(例如酸、碱、溶剂等)不同性质的药液,如果混杂在一起容易产生额外的化学反应,进而造成人员或机台的伤害,并且还会增加处理回收气体的困难度。再者,倘若混杂在一起的混合物回流到多个液体回收模组内部时,则会造成液体回收模组收集到的化学液体与混合物之间发生交叉污染的问题。However, the existing single-wafer wet processing machine adopts a design in which multiple liquid recovery modules are jointly connected to a gas recovery device. That is to say, although the existing single-wafer wet processing machine can collect different chemical liquids correspondingly through a plurality of liquid recovery modules, it cannot independently collect different gas-liquid mixtures entrained by different chemical liquids. The design of the single gas recovery unit described above can result in the mixing of different gas-liquid mixtures within the gas recovery unit. Since different gas-liquid mixtures contain chemical liquids with different properties (such as acids, bases, solvents, etc.), if they are mixed together, additional chemical reactions are likely to occur, thereby causing injury to personnel or machines, and will also increase the processing time of recovered gas. Difficulty. Furthermore, if the mixed mixture flows back into the multiple liquid recovery modules, the problem of cross-contamination between the chemical liquid collected by the liquid recovery modules and the mixture will occur.

有鉴于此,有必要提出一种单晶圆湿处理设备,以解决现有技术中存在的问题。In view of this, it is necessary to propose a single-wafer wet processing equipment to solve the problems existing in the prior art.

发明内容SUMMARY OF THE INVENTION

为解决上述现有技术的问题,本揭示的目的在于提供一种单晶圆湿处理设备,其可针对不同工艺液体所夹带的气液混合物进行独立回收作业,以避免不同的气液混合物混杂在一起。In order to solve the above-mentioned problems of the prior art, the purpose of the present disclosure is to provide a single-wafer wet processing equipment, which can independently recover gas-liquid mixtures entrained by different process liquids, so as to avoid mixing of different gas-liquid mixtures in the Together.

为达成上述目的,本揭示提供一种单晶圆湿处理设备,包含:旋转台,用于放置晶圆;液体供应装置,设置在所述旋转台上方,用于对所述晶圆施加多种工艺液体;液体回收装置,环绕地设置在所述旋转台的周围,并且可沿着垂直方向相对所述旋转台移动,其中所述液体回收装置包含多个沿着所述垂直方向堆叠设置的回收环,且每一所述回收环用于收集对应的其中一种工艺液体及其夹带的气液混合物;以及多个气体回收装置,分别与所述液体回收装置的所述多个回收环对应连接,其中每一所述气体回收装置包含:风箱,包含第一连接口和第二连接口,其中所述第一连接口与对应的回收环连接,使得所述回收环内的所述气液混合物通过所述第一连接口进入所述风箱的内部;以及排气管,与所述风箱的所述第二连接口连接,用于将收集的所述气液混合物排出。In order to achieve the above object, the present disclosure provides a single-wafer wet processing equipment, comprising: a rotary table for placing wafers; a liquid supply device disposed above the rotary table for applying various Process liquid; a liquid recovery device, arranged circumferentially around the rotary table and movable relative to the rotary table in a vertical direction, wherein the liquid recovery device comprises a plurality of recovery devices stacked along the vertical direction ring, and each of the recovery rings is used to collect a corresponding one of the process liquids and the entrained gas-liquid mixture; and a plurality of gas recovery devices, respectively connected to the plurality of recovery rings of the liquid recovery device correspondingly , wherein each of the gas recovery devices comprises: a bellows, including a first connection port and a second connection port, wherein the first connection port is connected with the corresponding recovery ring, so that the gas-liquid mixture in the recovery ring is into the interior of the bellows through the first connection port; and an exhaust pipe, connected with the second connection port of the bellows, for discharging the collected gas-liquid mixture.

本揭示其中之一优选实施例中,每一所述气体回收装置的所述风箱还包含:上表面、下表面、侧表面、空腔,所述上表面与所述下表面相对设置,且所述侧表面位在所述上表面与所述下表面之间,以及所述空腔是由所述上表面、所述下表面、和所述侧表面互相连接而组成,其中所述第一连接口设置在所述侧表面,以及所述第二连接口设置在所述上表面。In one of the preferred embodiments of the present disclosure, the bellows of each of the gas recovery devices further includes: an upper surface, a lower surface, a side surface, and a cavity, the upper surface and the lower surface are disposed opposite to each other, and the the side surface is located between the upper surface and the lower surface, and the cavity is formed by interconnecting the upper surface, the lower surface, and the side surface, wherein the first connection A port is provided on the side surface, and the second connection port is provided on the upper surface.

本揭示其中之一优选实施例中,每一所述气体回收装置的所述风箱还包含:排液口,设置在所述下表面,使得所述气液混合物通过所述风箱而产生的凝结液体通过所述排液口排出。In one of the preferred embodiments of the present disclosure, the bellows of each of the gas recovery devices further comprises: a liquid drain, disposed on the lower surface, so that the gas-liquid mixture passes through the condensed liquid produced by the bellows It is discharged through the discharge port.

本揭示其中之一优选实施例中,所述液体回收装置的每一所述回收环包含:液体接收口,与所述旋转台对准;分隔板,设置在所述回收环的内部以分隔出内环空间和外环空间,其中所述内环空间用于承接从所述液体接收口进入的所述工艺液体及其夹带的所述气液混合物,并且所述分隔板阻挡所述工艺液体从所述内环空间流至所述外环空间,以及所述分隔板上形成有多个通孔,用于让所述内环空间内的所述气液混合物通过所述多个通孔进入所述外环空间;以及液体收集口,与所述内环空间连通,用于让所述工艺液体从所述液体收集口排出;以及多个气体回收装置,分别与所述液体回收装置的所述多个回收环对应连接,用于将收集的所述气液混合物排出。In one of the preferred embodiments of the present disclosure, each of the recovery rings of the liquid recovery device includes: a liquid receiving port aligned with the rotary table; a partition plate disposed inside the recovery ring to separate Out of the inner annular space and the outer annular space, wherein the inner annular space is used to receive the process liquid entering from the liquid receiving port and the entrained gas-liquid mixture, and the partition plate blocks the process Liquid flows from the inner annular space to the outer annular space, and a plurality of through holes are formed on the partition plate for allowing the gas-liquid mixture in the inner annular space to pass through the plurality of through holes. a hole enters the outer annular space; and a liquid collection port communicated with the inner annular space for discharging the process liquid from the liquid collection port; and a plurality of gas recovery devices, respectively connected to the liquid recovery device The plurality of recovery rings are connected correspondingly to discharge the collected gas-liquid mixture.

本揭示其中之一优选实施例中,每一所述回收环还包含:环形上盖;环形底板,与所述环形上盖对应设置;外环壁,与所述环形上盖的外周缘和所述环形底板的外周缘连接;气体通道口,设置在所述外环壁上,且与对应的其中之一所述气体回收装置连接,其中所述分隔板设置在所述环形上盖和所述环形底板之间,以及所述液体接收口位在所述环形上盖的内周缘和所述环形底板的内周缘之间。In one of the preferred embodiments of the present disclosure, each of the recovery rings further includes: an annular upper cover; an annular bottom plate, which is arranged corresponding to the annular upper cover; The outer peripheral edge of the annular bottom plate is connected; the gas channel port is arranged on the outer annular wall and is connected with the corresponding one of the gas recovery devices, wherein the partition plate is arranged on the annular upper cover and the between the annular bottom plates, and the liquid receiving port is located between the inner peripheral edge of the annular upper cover and the inner peripheral edge of the annular bottom plate.

本揭示其中之一优选实施例中,每一所述气体回收装置的所述风箱还包含观视窗,且通过所述观视窗可看到所述风箱的内部;以及其中所述单晶圆湿处理设备还包含多个水管路,且每一所述气体回收装置的所述风箱与一个所述水管路连接,以及通过所述水管路将洁净水传输至所述风箱以清洗所述风箱的内部。In one of the preferred embodiments of the present disclosure, the bellows of each of the gas recovery devices further includes a viewing window, and the interior of the bellows can be seen through the viewing window; and wherein the single-wafer wet processing The apparatus further includes a plurality of water pipes, and the bellows of each of the gas recovery devices is connected to one of the water pipes, and clean water is transmitted to the bellows through the water pipes to clean the inside of the bellows.

本揭示还提供一种单晶圆湿处理设备,包含:旋转台,用于放置晶圆;液体供应装置,设置在所述旋转台上方,用于对所述晶圆施加多种工艺液体;液体回收装置,环绕地设置在所述旋转台的周围,并且可沿着垂直方向相对所述旋转台移动,其中所述液体回收装置包含多个沿着所述垂直方向堆叠设置的回收环,其中每一所述回收环包含:液体接收口,与所述旋转台对准,用于接收对应的其中一种工艺液体及其夹带的气液混合物;分隔板,设置在所述回收环的内部以分隔出内环空间和外环空间,其中所述内环空间用于承接从所述液体接收口进入的所述工艺液体及其夹带的所述气液混合物,并且所述分隔板阻挡所述工艺液体从所述内环空间流至所述外环空间,以及所述分隔板上形成有多个通孔,用于让所述内环空间内的所述气液混合物通过所述多个通孔进入所述外环空间;以及液体收集口,与所述内环空间连通,用于让所述工艺液体从所述液体收集口排出;以及多个气体回收装置,分别与所述液体回收装置的所述多个回收环对应连接,用于将收集的所述气液混合物排出。The present disclosure also provides a single-wafer wet processing equipment, comprising: a rotary table for placing wafers; a liquid supply device disposed above the rotary table for applying various process liquids to the wafers; liquid A recovery device is circumferentially arranged around the rotary table and can move relative to the rotary table in a vertical direction, wherein the liquid recovery device comprises a plurality of recovery rings stacked and arranged in the vertical direction, wherein each The recovery ring includes: a liquid receiving port, aligned with the rotary table, for receiving one of the corresponding process liquids and the gas-liquid mixture entrained therein; a partition plate, arranged inside the recovery ring to The inner annular space and the outer annular space are separated, wherein the inner annular space is used to receive the process liquid and the entrained gas-liquid mixture entering from the liquid receiving port, and the partition plate blocks the Process liquid flows from the inner annular space to the outer annular space, and a plurality of through holes are formed on the partition plate for allowing the gas-liquid mixture in the inner annular space to pass through the plurality of through holes a through hole enters the outer annular space; and a liquid collection port communicated with the inner annular space for discharging the process liquid from the liquid collection port; and a plurality of gas recovery devices, respectively recovering from the liquid The plurality of recovery rings of the device are correspondingly connected for discharging the collected gas-liquid mixture.

本揭示其中之一优选实施例中,每一所述回收环还包含:环形上盖;环形底板,与所述环形上盖对应设置;外环壁,与所述环形上盖的外周缘和所述环形底板的外周缘连接;气体通道口,设置在所述外环壁上,且与对应的其中之一所述气体回收装置连接,其中所述分隔板设置在所述环形上盖和所述环形底板之间,以及所述液体接收口位在所述环形上盖的内周缘和所述环形底板的内周缘之间。In one of the preferred embodiments of the present disclosure, each of the recovery rings further includes: an annular upper cover; an annular bottom plate, which is arranged corresponding to the annular upper cover; The outer peripheral edge of the annular bottom plate is connected; the gas channel port is arranged on the outer annular wall and is connected with the corresponding one of the gas recovery devices, wherein the partition plate is arranged on the annular upper cover and the between the annular bottom plates, and the liquid receiving port is located between the inner peripheral edge of the annular upper cover and the inner peripheral edge of the annular bottom plate.

本揭示其中之一优选实施例中,每一所述气体回收装置包含:风箱,包含第一连接口和第二连接口,其中所述第一连接口与对应的回收环连接,使得所述回收环内的所述气液混合物通过所述第一连接口进入所述风箱的内部;以及排气管,与所述风箱的所述第二连接口连接,用于将收集的所述气液混合物排出。In one of the preferred embodiments of the present disclosure, each of the gas recovery devices includes: a bellows, including a first connection port and a second connection port, wherein the first connection port is connected to a corresponding recovery ring, so that the recovery The gas-liquid mixture in the ring enters the inside of the bellows through the first connection port; and an exhaust pipe is connected to the second connection port of the bellows, and is used for collecting the gas-liquid mixture discharge.

本揭示其中之一优选实施例中,每一所述气体回收装置的所述风箱还包含:上表面、下表面、侧表面、空腔,所述上表面与所述下表面相对设置,且所述侧表面位在所述上表面与所述下表面之间,以及所述空腔是由所述上表面、所述下表面、和所述侧表面互相连接而组成,其中所述第一连接口设置在所述侧表面,以及所述第二连接口设置在所述上表面。In one of the preferred embodiments of the present disclosure, the bellows of each of the gas recovery devices further includes: an upper surface, a lower surface, a side surface, and a cavity, the upper surface and the lower surface are disposed opposite to each other, and the the side surface is located between the upper surface and the lower surface, and the cavity is formed by interconnecting the upper surface, the lower surface, and the side surface, wherein the first connection A port is provided on the side surface, and the second connection port is provided on the upper surface.

本揭示其中之一优选实施例中,每一所述气体回收装置的所述风箱还包含:排液口,设置在所述下表面,使得所述气液混合物通过所述风箱而产生的凝结液体通过所述排液口排出。In one of the preferred embodiments of the present disclosure, the bellows of each of the gas recovery devices further comprises: a liquid drain, disposed on the lower surface, so that the gas-liquid mixture passes through the condensed liquid produced by the bellows It is discharged through the discharge port.

本揭示其中之一优选实施例中,每一所述气体回收装置的所述风箱还包含观视窗,且通过所述观视窗可看到所述风箱的内部;以及其中所述单晶圆湿处理设备还包含多个水管路,且每一所述气体回收装置的所述风箱与一个所述水管路连接,以及通过所述水管路将洁净水传输至所述风箱以清洗所述风箱的内部。In one of the preferred embodiments of the present disclosure, the bellows of each of the gas recovery devices further includes a viewing window, and the interior of the bellows can be seen through the viewing window; and wherein the single-wafer wet processing The apparatus further includes a plurality of water pipes, and the bellows of each of the gas recovery devices is connected to one of the water pipes, and clean water is transmitted to the bellows through the water pipes to clean the inside of the bellows.

相较于先前技术,本揭示通过设置与回收环的数量相同的气体回收装置,并且每一回收环与一个气体回收装置对应连接。藉此设计,可通过不同的气体回收装置对来自于不同回收环的工艺气体独立进行抽气作业,以避免不同工艺液体夹带的不同气液混合物混杂在一起,进而产生额外的化学反应,造成单晶圆湿处理设备或人员的伤害,并且还降低了处理回收气体的复杂度。再者,还可以避免混杂的废气回流至旋转台或回收环所造成晶圆或者是其他处理腔体的污染。Compared with the prior art, the present disclosure provides the same number of gas recovery devices as recovery rings, and each recovery ring is correspondingly connected to one gas recovery device. With this design, the process gas from different recovery rings can be independently pumped through different gas recovery devices, so as to avoid mixing of different gas-liquid mixtures entrained by different process liquids, thereby generating additional chemical reactions, resulting in single Injuries to wet wafer processing equipment or personnel, and also reduces the complexity of handling recovered gas. Furthermore, the contamination of the wafer or other processing chambers caused by the mixed exhaust gas flowing back to the rotary table or the recycling ring can be avoided.

附图说明Description of drawings

图1显示本揭示的优选实施例的单晶圆湿处理设备的立体示意图;FIG. 1 shows a schematic perspective view of a single-wafer wet processing apparatus according to a preferred embodiment of the present disclosure;

图2显示图1的单晶圆湿处理设备的局部剖面放大图;FIG. 2 shows an enlarged partial cross-sectional view of the single-wafer wet processing apparatus of FIG. 1;

图3显示图1的单晶圆湿处理设备的回收环与气体回收装置的局部示意图;FIG. 3 shows a partial schematic diagram of a recovery ring and a gas recovery device of the single-wafer wet processing apparatus of FIG. 1;

图4显示图3的回收环的零件爆炸图;以及Figure 4 shows an exploded view of the parts of the recovery ring of Figure 3; and

图5显示图1的单晶圆湿处理设备的另一局部剖面放大图。FIG. 5 shows another partial cross-sectional enlarged view of the single-wafer wet processing apparatus of FIG. 1 .

具体实施方式Detailed ways

为了让本揭示的上述及其他目的、特征、优点能更明显易懂,下文将特举本揭示优选实施例,并配合所附图式,作详细说明如下。In order to make the above-mentioned and other objects, features, and advantages of the present disclosure more clearly understood, the preferred embodiments of the present disclosure will be exemplified below, and will be described in detail in conjunction with the accompanying drawings.

请参照图1,其显示本揭示的优选实施例的单晶圆湿处理设备1的立体示意图。单晶圆湿处理设备1包含旋转台10、液体供应装置(未显示于图中)、液体回收装置20、多个气体回收装置30、和升降装置40。在本实施例中气体回收装置30的数量为四个,惟本揭示不局限于此。旋转台10用于放置单一片晶圆(未显示于图中)。在本实施例中,旋转台10的顶部包含一真空吸盘,并且通过真空吸盘的施加的吸力,使得晶圆可被固定在旋转台10的顶部。旋转台10配置有驱动机构,用于驱使旋转台10绕轴旋转。在其他实施例中亦可采用其他的方式来将晶圆固定在旋转台上,例如采用夹持装置等。再者,液体供应装置设置在旋转台10上方,用于对晶圆施加多种工艺液体。具体来说,液体供应装置包含喷嘴和多条液体传输管线,其中喷嘴设置为与旋转台10的顶部对准,以及多条液体传输管线的一端与喷嘴连接,另一端分别连接至不同的工艺液体的供应端。藉此设计,可根据工艺需求来控制液体供应装置施加对应的工艺液体至旋转台10上的晶圆,以对晶圆进行蚀刻或清洗等作业。Please refer to FIG. 1 , which shows a schematic perspective view of a single-wafer wet processing apparatus 1 according to a preferred embodiment of the present disclosure. The single-wafer wet processing apparatus 1 includes a rotary table 10 , a liquid supply device (not shown in the figure), a liquid recovery device 20 , a plurality of gas recovery devices 30 , and a lift device 40 . In this embodiment, the number of the gas recovery devices 30 is four, but the present disclosure is not limited thereto. The turntable 10 is used to place a single wafer (not shown in the figure). In this embodiment, the top of the rotary table 10 includes a vacuum suction cup, and the wafer can be fixed on the top of the rotary table 10 by the suction force applied by the vacuum suction cup. The turntable 10 is provided with a drive mechanism for driving the turntable 10 to rotate about an axis. In other embodiments, the wafer may be fixed on the rotary table in other manners, such as using a clamping device. Furthermore, a liquid supply device is provided above the turntable 10 for applying various process liquids to the wafer. Specifically, the liquid supply device includes a nozzle and a plurality of liquid transfer lines, wherein the nozzle is arranged to be aligned with the top of the rotary table 10 , and one end of the plurality of liquid transfer lines is connected to the nozzle, and the other end is respectively connected to different process liquids supply side. With this design, the liquid supply device can be controlled to apply the corresponding process liquid to the wafer on the turntable 10 according to process requirements, so as to perform operations such as etching or cleaning the wafer.

如图1所示,液体回收装置20环绕地设置在旋转台10的周围,用于收集从旋转台10上晶圆表面因离心力甩出的工艺液体,并且将所述工艺液体排出。多个气体回收装置30与液体回收装置20对应连接,用于将收集的气液混合物排出。本实施例的液体回收装置20与气体回收装置30的具体结构将于后详述。升降装置40与液体回收装置20连接,用于控制液体回收装置20沿着一垂直方向相对旋转台10升降移动。并且,由于多个气体回收装置30与液体回收装置20连接,故当液体回收装置20升降时,连带地多个气体回收装置30会一起上升或下降。As shown in FIG. 1 , the liquid recovery device 20 is disposed around the turntable 10 for collecting the process liquid thrown off by the centrifugal force from the wafer surface on the turntable 10 and discharging the process liquid. A plurality of gas recovery devices 30 are correspondingly connected to the liquid recovery device 20 for discharging the collected gas-liquid mixture. The specific structures of the liquid recovery device 20 and the gas recovery device 30 in this embodiment will be described in detail later. The lifting device 40 is connected to the liquid recovery device 20 for controlling the liquid recovery device 20 to move up and down relative to the rotary table 10 along a vertical direction. In addition, since the plurality of gas recovery devices 30 are connected to the liquid recovery device 20, when the liquid recovery device 20 is raised and lowered, the plurality of gas recovery devices 30 are also raised or lowered together.

请参照图1和图2,图2显示图1的单晶圆湿处理设备1的局部剖面放大图。液体回收装置20包含多个沿着垂直方向堆叠设置的回收环21~24。每一回收环21~24用于收集对应的其中一种工艺液体及其夹带的气液混合物。通过升降装置40的控制,使所述多个回收环21~24一起同步移动,如此可使指定的回收环21~24移动至与旋转台10对准,其中对准是指其中之一回收环21~24的液体接收口与旋转台10上的晶圆相邻,使得当液体供应装置施加工艺液体至旋转台10上的晶圆,且旋转台10旋转时,旋转台10上晶圆表面因离心力甩出的工艺液体可被相邻的其中之一回收环21~24收集。也就是说,本揭示的单晶圆湿处理设备1是一种具有移动式液体回收装置20的清洗蚀刻设备,它可使在旋转台10上的晶圆保持水平固定,不作上下移动。当进行单晶圆旋转清洗或蚀刻工艺时,根据执行的步骤控制指定的回收环移动至对准旋转台10,接着由晶圆上方的液体供应装置喷洒特定的工艺液体至晶圆表面,并由旋转台10带动晶圆旋转,以收集此特定的工艺液体及其夹带的气液混合物。Please refer to FIGS. 1 and 2 . FIG. 2 shows an enlarged partial cross-sectional view of the single-wafer wet processing apparatus 1 of FIG. 1 . The liquid recovery device 20 includes a plurality of recovery rings 21 to 24 stacked in a vertical direction. Each recovery ring 21-24 is used to collect a corresponding one of the process liquids and the entrained gas-liquid mixture. Through the control of the lifting device 40, the plurality of recovery rings 21-24 are moved synchronously together, so that the designated recovery rings 21-24 can be moved to be aligned with the rotary table 10, wherein the alignment refers to one of the recovery rings The liquid receiving ports 21 to 24 are adjacent to the wafer on the turntable 10, so that when the liquid supply device applies the process liquid to the wafer on the turntable 10 and the turntable 10 rotates, the surface of the wafer on the turntable 10 is affected by The process liquid thrown out by centrifugal force can be collected by one of the adjacent recovery rings 21-24. That is, the single-wafer wet processing apparatus 1 of the present disclosure is a cleaning and etching apparatus with a mobile liquid recovery device 20 , which can keep the wafer on the turntable 10 horizontally fixed without moving up and down. When a single wafer spin cleaning or etching process is performed, the designated recovery ring is controlled to move to the alignment turntable 10 according to the steps performed, and then the specific process liquid is sprayed onto the wafer surface by the liquid supply device above the wafer. The rotary table 10 rotates the wafer to collect the specific process liquid and its entrained gas-liquid mixture.

请参照图2和图3,其中图3显示图1的单晶圆湿处理设备1的回收环21与气体回收装置30的局部示意图。图3是以位在第一层的回收环21和与其连接的气体回收装置30作为说明。应当理解的是,其余回收环22~24的结构与第一层的回收环21的结构大致相同。如图2所示,回收环21包含环形上盖201、环形底板202、外环壁203、液体接收口204。又,如图3所示,回收环21还包含分隔板205、气体通道口206、和液体收集口207。回收环21的环形底板202与环形上盖201对应设置。本实施例中,所述多个回收环21~24是沿着垂直方向堆叠设置,并且位在上方的回收环的环形底板202是作为下方的回收环的环形上盖201,进而使得每一回收环内部的空间得以最大化,节省液体回收装置20的使用材料,以及有效地缩减液体回收装置20的整体体积。回收环21的外环壁203与环形上盖201的外周缘和环形底板202的外周缘连接。环形上盖201、环形底板202、和外环壁203彼此连接并且定义出回收环21的内部空间。回收环21的液体接收口204位在环形上盖201的内周缘和环形底板202的内周缘之间。当指定的回收环21移动至对准旋转台10,指定的回收环21的液体接收口204会与旋转台10对准,使得回收环21可通过液体接收口204接收对应的工艺液体及其夹带的气液混合物。Please refer to FIGS. 2 and 3 , wherein FIG. 3 shows a partial schematic view of the recovery ring 21 and the gas recovery device 30 of the single-wafer wet processing apparatus 1 of FIG. 1 . Figure 3 illustrates the recovery loop 21 on the first floor and the gas recovery device 30 connected to it. It should be understood that the structures of the remaining recovery rings 22 to 24 are substantially the same as those of the recovery ring 21 of the first layer. As shown in FIG. 2 , the recovery ring 21 includes an annular upper cover 201 , an annular bottom plate 202 , an outer annular wall 203 , and a liquid receiving port 204 . Also, as shown in FIG. 3 , the recovery ring 21 further includes a partition plate 205 , a gas passage port 206 , and a liquid collection port 207 . The annular bottom plate 202 of the recovery ring 21 is arranged corresponding to the annular upper cover 201 . In this embodiment, the plurality of recovery rings 21 to 24 are stacked along the vertical direction, and the annular bottom plate 202 of the upper recovery ring is used as the annular upper cover 201 of the lower recovery ring, so that each recovery ring can be The space inside the ring is maximized, the materials used for the liquid recovery device 20 are saved, and the overall volume of the liquid recovery device 20 is effectively reduced. The outer ring wall 203 of the recovery ring 21 is connected with the outer peripheral edge of the annular upper cover 201 and the outer peripheral edge of the annular bottom plate 202 . The annular upper cover 201 , the annular bottom plate 202 , and the outer annular wall 203 are connected to each other and define the inner space of the recovery ring 21 . The liquid receiving port 204 of the recovery ring 21 is located between the inner peripheral edge of the annular upper cover 201 and the inner peripheral edge of the annular bottom plate 202 . When the designated recovery ring 21 is moved to align with the rotary table 10, the liquid receiving port 204 of the designated recovery ring 21 will be aligned with the rotary table 10, so that the recovery ring 21 can receive the corresponding process liquid and its entrainment through the liquid receiving port 204 gas-liquid mixture.

如图3所示,回收环21的分隔板205设置在回收环21的内部以将回收环21的内部空间分隔出一内环空间208和一外环空间209。内环空间208用于承接从液体接收口204进入的工艺液体及其夹带的气液混合物,并且通过分隔板205的阻挡可防止工艺液体从内环空间208流至外环空间209。分隔板205上形成有多个通孔2051,使得内环空间208内的气液混合物可通过所述多个通孔2051进入外环空间209。在本实施例中,分隔板205上形成有28个通孔2051,惟不局限于此。优选地,分隔板205的通孔2051的孔径约为5至10mm,以确保一方面能将工艺液体夹带的气液混合物从内环空间208充分地抽至外环空间209,另一方面还能将工艺液体阻隔在内环空间208中。As shown in FIG. 3 , the partition plate 205 of the recovery ring 21 is disposed inside the recovery ring 21 to separate the inner space of the recovery ring 21 into an inner ring space 208 and an outer ring space 209 . The inner annular space 208 is used to receive the process liquid entering from the liquid receiving port 204 and its entrained gas-liquid mixture, and the blocking by the partition plate 205 can prevent the process liquid from flowing from the inner annular space 208 to the outer annular space 209 . A plurality of through holes 2051 are formed on the partition plate 205 , so that the gas-liquid mixture in the inner annular space 208 can enter the outer annular space 209 through the plurality of through holes 2051 . In this embodiment, 28 through holes 2051 are formed on the partition plate 205, but not limited thereto. Preferably, the diameter of the through hole 2051 of the partition plate 205 is about 5 to 10 mm, so as to ensure that the gas-liquid mixture entrained by the process liquid can be fully pumped from the inner annular space 208 to the outer annular space 209 on the one hand, and on the other hand, it can also be The process liquid can be trapped in the inner annular space 208 .

如图3所示,回收环21的气体通道口206设置在外环壁203上,且气体通道口206与对应的气体回收装置30连接,如此回收环21收集到的气液混合物进入外环空间209之后可通过气体通道口206传送至气体回收装置30。回收环21的液体收集口207与内环空间208连通,用于让工艺液体从液体收集口207排出。具体来说,液体收集口207位于回收环21的水平位置的最低点,使得回收环21所收集的工艺液体因重力而流动到液体收集口207。并且,回收环21的液体收集口207与对应的回收管连接,进而将收集到的工艺液体排放或回收。举例来说,如图2所示,位在第二层的回收环22与单晶圆湿处理设备1内部的回收管50连接,并且回收环22收集的工艺液体是通过路径51排出。可选地,回收管50可与循环系统连接,以将处理后的工艺液体再次回送到单晶圆湿处理设备1的液体供应装置。优选地,液体收集口207的孔径约为10至15mm,以确保能让蚀刻后的杂质、收集的工艺液体或其形成的结晶通过。As shown in FIG. 3 , the gas channel port 206 of the recovery ring 21 is provided on the outer ring wall 203, and the gas channel port 206 is connected to the corresponding gas recovery device 30, so that the gas-liquid mixture collected by the recovery ring 21 enters the outer ring space 209 can then be conveyed to the gas recovery device 30 through the gas passage port 206 . The liquid collection port 207 of the recovery ring 21 communicates with the inner annular space 208 for discharging the process liquid from the liquid collection port 207 . Specifically, the liquid collection port 207 is located at the lowest point of the horizontal position of the recovery ring 21 , so that the process liquid collected by the recovery ring 21 flows to the liquid collection port 207 due to gravity. In addition, the liquid collection port 207 of the recovery ring 21 is connected to the corresponding recovery pipe, so as to discharge or recover the collected process liquid. For example, as shown in FIG. 2 , the recovery ring 22 on the second layer is connected to the recovery pipe 50 inside the single-wafer wet processing equipment 1 , and the process liquid collected by the recovery ring 22 is discharged through the path 51 . Optionally, the recovery pipe 50 may be connected with a circulation system to return the processed process liquid to the liquid supply device of the single-wafer wet processing apparatus 1 again. Preferably, the diameter of the liquid collection port 207 is about 10 to 15 mm, so as to ensure that the etched impurities, the collected process liquid or the crystals formed thereof can pass through.

请参照图4,其显示图3的回收环21的零件爆炸图。分隔板205的板面平行于回收环21的堆叠方向。分隔板205的一侧安装在环形底板202的下沟槽2021内,以及分隔板205的另一侧安装在环形上盖201的上沟槽2011(参见图5)内。通过上述分隔板205的安装方式,可方便分隔板205的组装以及替换。再者,在本实施例中,回收环21的分隔板205是采用四片式结构,藉此设计,当其中一片分隔板205的通孔2051阻塞时,可只针对所述片分隔板205进行替换,而不需要将整组分隔板205全部换掉。在其他实施例中可以采用其他数量的分隔板,不局限于此。应当注意的是,分隔板205的多个通孔2051彼此是以相等或相近的间隔排列成一环状,以形成一环状抽气构造,进而确保回收环21的抽取气流是均匀的,可充分抽取清洗或蚀刻的工艺液体所夹带的气液混合物。并且,藉此环状抽气构造的设计,可避免在对晶圆进行蚀刻作业时,晶圆上的工艺液体被朝向单一方向的大气流影响而偏向某一边,造成晶圆的蚀刻不均匀。Please refer to FIG. 4 , which shows an exploded view of the parts of the recovery ring 21 of FIG. 3 . The plate surface of the partition plate 205 is parallel to the stacking direction of the recovery ring 21 . One side of the partition plate 205 is installed in the lower groove 2021 of the annular bottom plate 202 , and the other side of the partition plate 205 is installed in the upper groove 2011 (see FIG. 5 ) of the annular upper cover 201 . Through the above-mentioned installation method of the partition plate 205 , the assembly and replacement of the partition plate 205 can be facilitated. Furthermore, in the present embodiment, the separation plate 205 of the recovery ring 21 adopts a four-piece structure, so that when the through hole 2051 of one of the separation plates 205 is blocked, only the said piece can be separated. Plates 205 are replaced without having to replace the entire set of separator plates 205. Other numbers of divider plates may be used in other embodiments, without limitation. It should be noted that the plurality of through holes 2051 of the partition plate 205 are arranged in a ring shape at equal or similar intervals to form a ring-shaped air extraction structure, thereby ensuring that the extraction air flow of the recovery ring 21 is uniform, which can be avoided. Fully extract the gas-liquid mixture entrained in the cleaning or etching process liquid. In addition, the design of the annular gas extraction structure can prevent the process liquid on the wafer from being deflected to a certain side due to the influence of the atmospheric airflow in a single direction during the etching operation of the wafer, resulting in uneven etching of the wafer.

如图1和图2所示,气体回收装置30的数量与回收环21~24的数量相同,并且每一回收环21~24与一个气体回收装置30对应连接。藉此设计,可通过不同的气体回收装置30针对来自于不同回收环21~24的工艺气体独立进行抽气作业,以避免不同工艺液体夹带的不同气液混合物混杂在一起,进而产生额外的化学反应,造成单晶圆湿处理设备1或人员的伤害,并且还降低了处理回收气体的复杂度。再者,还可以避免混杂的废气回流至旋转台10或回收环21~24,进而造成晶圆或者是其他处理腔体的污染。As shown in FIG. 1 and FIG. 2 , the number of gas recovery devices 30 is the same as the number of recovery rings 21 to 24 , and each recovery ring 21 to 24 is correspondingly connected to one gas recovery device 30 . With this design, the process gas from different recovery rings 21-24 can be independently pumped through different gas recovery devices 30, so as to avoid mixing of different gas-liquid mixtures entrained by different process liquids, thereby generating additional chemical The reaction causes harm to the single-wafer wet processing equipment 1 or personnel, and also reduces the complexity of processing the recovered gas. Furthermore, it is also possible to prevent the mixed waste gas from flowing back to the turntable 10 or the recycling rings 21-24, thereby causing contamination of the wafer or other processing chambers.

请参照图5,其显示图1的单晶圆湿处理设备1的另一局部剖面放大图。图5是以位在第一层的回收环21和与其连接的气体回收装置30作为说明。应当理解的是,其余回收环22~24和其余气体回收装置30的结构与第一层的回收环21和气体回收装置30的结构大致相同。气体回收装置30对回收环21施加负压,使得回收环21和气体回收装置30的内部会产生如同路径61的气流。具体来说,回收环21收集到的气液混合物会从内环空间208通过分隔板205的通孔2051抽至外环空间209。并且,外环空间209中的气液混合物会通过外环壁203上的气体通道口206传送至气体回收装置30内部。Please refer to FIG. 5 , which shows another partial cross-sectional enlarged view of the single-wafer wet processing apparatus 1 of FIG. 1 . FIG. 5 illustrates the recovery loop 21 on the first floor and the gas recovery device 30 connected thereto. It should be understood that the structures of the remaining recovery rings 22 to 24 and the remaining gas recovery device 30 are substantially the same as those of the recovery ring 21 and the gas recovery device 30 of the first layer. The gas recovery device 30 applies negative pressure to the recovery ring 21 , so that the recovery ring 21 and the inside of the gas recovery device 30 generate a gas flow like the path 61 . Specifically, the gas-liquid mixture collected by the recovery ring 21 will be pumped from the inner annular space 208 to the outer annular space 209 through the through hole 2051 of the partition plate 205 . In addition, the gas-liquid mixture in the outer annular space 209 will be transferred to the inside of the gas recovery device 30 through the gas passage opening 206 on the outer annular wall 203 .

如图5所示,气体回收装置30包含风箱31和排气管32。风箱31包含上表面301、下表面302、侧表面303、空腔304、第一连接口305、第二连接口306、和排液口307。风箱31的上表面301与下表面302相对设置,并且侧表面303位在上表面301与下表面302之间。上表面301、下表面302、和侧表面303互相连接而组成空腔304。风箱31的侧表面303形成有第一连接口305,上表面301形成有第二连接口306,以及下表面302形成有排液口307。风箱31的第一连接口305与回收环21的气体通道口206连接,使得回收环21内的气液混合物通过第一连接口305进入风箱31的空腔304内部。排气管32与风箱31的的第二连接口306连接,用于将收集的气液混合物排出。再者,当气液混合物通过风箱31时,部分的气体会凝结成液体。为了避免液体堆积在风箱31的空腔304中,通过位在风箱31的下表面302的排液口307的设置可将凝结液体沿着路径62通过排液口307排出,以保持风箱31内部的干净。As shown in FIG. 5 , the gas recovery device 30 includes a wind box 31 and an exhaust pipe 32 . The bellows 31 includes an upper surface 301 , a lower surface 302 , a side surface 303 , a cavity 304 , a first connection port 305 , a second connection port 306 , and a liquid discharge port 307 . The upper surface 301 of the bellows 31 is disposed opposite to the lower surface 302 , and the side surface 303 is located between the upper surface 301 and the lower surface 302 . The upper surface 301 , the lower surface 302 , and the side surface 303 are connected to each other to form a cavity 304 . The side surface 303 of the bellows 31 is formed with a first connection port 305 , the upper surface 301 is formed with a second connection port 306 , and the lower surface 302 is formed with a liquid discharge port 307 . The first connection port 305 of the bellows 31 is connected to the gas passage port 206 of the recovery ring 21 , so that the gas-liquid mixture in the recovery ring 21 enters the cavity 304 of the bellows 31 through the first connection port 305 . The exhaust pipe 32 is connected to the second connection port 306 of the bellows 31 for discharging the collected gas-liquid mixture. Furthermore, when the gas-liquid mixture passes through the bellows 31, part of the gas will condense into liquid. In order to prevent liquid from accumulating in the cavity 304 of the bellows 31 , the condensed liquid can be drained through the drain 307 along the path 62 through the arrangement of the liquid discharge port 307 located on the lower surface 302 of the bellows 31 , so as to maintain the internal air of the bellows 31 . clean.

此外,如图3所示,单晶圆湿处理设备1还包含多个水管路70,且每一气体回收装置30的风箱31与一个水管路70连接。又,每一气体回收装置30的风箱31还包含观视窗80。因此,当人员通过观视窗80看到风箱31内部有结晶或异物堆积时,可通过水管路70清洗所述风箱的内部。具体来说,通过水管路70将小量的洁净水传输至风箱31内部,使得结晶或异物沿着路径62(如图5所示)从风箱31的排液口307排出。In addition, as shown in FIG. 3 , the single-wafer wet processing apparatus 1 further includes a plurality of water pipelines 70 , and the bellows 31 of each gas recovery device 30 is connected to one water pipeline 70 . In addition, the bellows 31 of each gas recovery device 30 further includes a viewing window 80 . Therefore, when a person sees crystals or foreign matter accumulation inside the bellows 31 through the viewing window 80 , the inside of the bellows can be cleaned through the water pipeline 70 . Specifically, a small amount of clean water is transmitted to the inside of the bellows 31 through the water pipeline 70 , so that crystals or foreign matter are discharged from the liquid discharge port 307 of the bellows 31 along the path 62 (as shown in FIG. 5 ).

综上所述,本揭示通过设置与回收环的数量相同的气体回收装置,并且每一回收环与一个气体回收装置对应连接。藉此设计,可通过不同的气体回收装置对来自于不同回收环的工艺气体独立进行抽气作业,以避免不同工艺液体夹带的不同气液混合物混杂在一起,进而产生额外的化学反应,造成单晶圆湿处理设备或人员的伤害,并且还降低了处理回收气体的复杂度。再者,还可以避免混杂的废气回流至旋转台或回收环,进而造成晶圆或者是其他处理腔体的污染。To sum up, the present disclosure provides the same number of gas recovery devices as recovery rings, and each recovery ring is correspondingly connected to one gas recovery device. With this design, the process gas from different recovery rings can be independently pumped through different gas recovery devices, so as to avoid mixing of different gas-liquid mixtures entrained by different process liquids, thereby generating additional chemical reactions, resulting in single Injuries to wet wafer processing equipment or personnel, and also reduces the complexity of handling recovered gas. Furthermore, it is also possible to prevent the mixed exhaust gas from flowing back to the turntable or the recycling ring, thereby causing contamination of the wafer or other processing chambers.

以上仅是本揭示的优选实施方式,应当指出,对于本领域技术人员,在不脱离本揭示原理的前提下,还可以做出若干改进和润饰,这些改进和润饰也应视为本揭示的保护范围。The above are only the preferred embodiments of the present disclosure. It should be pointed out that those skilled in the art can make several improvements and modifications without departing from the principles of the present disclosure, and these improvements and modifications should also be regarded as the protection of the present disclosure. scope.

Claims (12)

1.一种单晶圆湿处理设备,其特征在于,包含:1. a single wafer wet processing equipment, is characterized in that, comprises: 旋转台,用于放置晶圆;Rotary stage for placing wafers; 液体供应装置,设置在所述旋转台上方,用于对所述晶圆施加多种工艺液体;a liquid supply device, arranged above the rotary table, for applying various process liquids to the wafer; 液体回收装置,环绕地设置在所述旋转台的周围,并且可沿着垂直方向相对所述旋转台移动,其中所述液体回收装置包含多个沿着所述垂直方向堆叠设置的回收环,且每一所述回收环用于收集对应的其中一种工艺液体及其夹带的气液混合物;以及a liquid recovery device, circumferentially disposed around the rotary table and movable relative to the rotary table in a vertical direction, wherein the liquid recovery device includes a plurality of recovery rings stacked along the vertical direction, and Each of the recovery loops is used to collect a corresponding one of the process liquids and an entrained gas-liquid mixture thereof; and 多个气体回收装置,分别与所述液体回收装置的所述多个回收环对应连接,其中每一所述气体回收装置包含:A plurality of gas recovery devices, respectively connected to the plurality of recovery loops of the liquid recovery device, wherein each of the gas recovery devices includes: 风箱,包含第一连接口和第二连接口,其中所述第一连接口与对应的回收环连接,使得所述回收环内的所述气液混合物通过所述第一连接口进入所述风箱的内部;以及A bellows, comprising a first connection port and a second connection port, wherein the first connection port is connected with a corresponding recovery ring, so that the gas-liquid mixture in the recovery ring enters the bellows through the first connection port internal; and 排气管,与所述风箱的所述第二连接口连接,用于将收集的所述气液混合物排出。The exhaust pipe is connected to the second connection port of the bellows, and is used for discharging the collected gas-liquid mixture. 2.如权利要求1所述的单晶圆湿处理设备,其特征在于,每一所述气体回收装置的所述风箱还包含:上表面、下表面、侧表面、空腔,所述上表面与所述下表面相对设置,且所述侧表面位在所述上表面与所述下表面之间,以及所述空腔是由所述上表面、所述下表面、和所述侧表面互相连接而组成,其中所述第一连接口设置在所述侧表面,以及所述第二连接口设置在所述上表面。2 . The single-wafer wet processing apparatus according to claim 1 , wherein the bellows of each gas recovery device further comprises: an upper surface, a lower surface, a side surface, and a cavity, and the upper surface Opposed to the lower surface, the side surface is located between the upper surface and the lower surface, and the cavity is formed by the upper surface, the lower surface, and the side surface The first connection port is provided on the side surface, and the second connection port is provided on the upper surface. 3.如权利要求2所述的单晶圆湿处理设备,其特征在于,每一所述气体回收装置的所述风箱还包含:排液口,设置在所述下表面,使得所述气液混合物通过所述风箱而产生的凝结液体通过所述排液口排出。3 . The single-wafer wet processing apparatus according to claim 2 , wherein the bellows of each of the gas recovery devices further comprises: a liquid drain, arranged on the lower surface, so that the gas-liquid The condensed liquid produced by the mixture passing through the bellows is discharged through the liquid discharge port. 4.如权利要求1所述的单晶圆湿处理设备,其特征在于,所述液体回收装置的每一所述回收环包含:4. The single-wafer wet processing apparatus of claim 1, wherein each of the recovery loops of the liquid recovery device comprises: 液体接收口,与所述旋转台对准;a liquid receiving port, aligned with the rotary table; 分隔板,设置在所述回收环的内部以分隔出内环空间和外环空间,其中所述内环空间用于承接从所述液体接收口进入的所述工艺液体及其夹带的所述气液混合物,并且所述分隔板阻挡所述工艺液体从所述内环空间流至所述外环空间,以及所述分隔板上形成有多个通孔,用于让所述内环空间内的所述气液混合物通过所述多个通孔进入所述外环空间;以及A dividing plate is arranged inside the recovery ring to separate an inner annular space and an outer annular space, wherein the inner annular space is used to receive the process liquid entering from the liquid receiving port and the entrained gas-liquid mixture, and the separation plate blocks the flow of the process liquid from the inner annular space to the outer annular space, and a plurality of through holes are formed on the separation plate for allowing the inner annular space The gas-liquid mixture in the space enters the outer annular space through the plurality of through holes; and 液体收集口,与所述内环空间连通,用于让所述工艺液体从所述液体收集口排出;以及a liquid collection port, in communication with the inner annular space, for allowing the process liquid to be discharged from the liquid collection port; and 多个气体回收装置,分别与所述液体回收装置的所述多个回收环对应连接,用于将收集的所述气液混合物排出。A plurality of gas recovery devices are respectively connected to the plurality of recovery rings of the liquid recovery device, and are used for discharging the collected gas-liquid mixture. 5.如权利要求4所述的单晶圆湿处理设备,其特征在于,每一所述回收环还包含:5. The single-wafer wet processing equipment of claim 4, wherein each of the recycling loops further comprises: 环形上盖;Ring cover; 环形底板,与所述环形上盖对应设置;an annular bottom plate corresponding to the annular upper cover; 外环壁,与所述环形上盖的外周缘和所述环形底板的外周缘连接;an outer ring wall, connected with the outer peripheral edge of the annular upper cover and the outer peripheral edge of the annular bottom plate; 气体通道口,设置在所述外环壁上,且与对应的其中之一所述气体回收装置连接,其中所述分隔板设置在所述环形上盖和所述环形底板之间,以及所述液体接收口位在所述环形上盖的内周缘和所述环形底板的内周缘之间。A gas passage port is arranged on the outer ring wall and is connected with the corresponding one of the gas recovery devices, wherein the partition plate is arranged between the annular upper cover and the annular bottom plate, and the The liquid receiving port is located between the inner peripheral edge of the annular upper cover and the inner peripheral edge of the annular bottom plate. 6.如权利要求1所述的单晶圆湿处理设备,其特征在于,每一所述气体回收装置的所述风箱还包含观视窗,且通过所述观视窗可看到所述风箱的内部;以及6 . The single-wafer wet processing apparatus of claim 1 , wherein the bellows of each of the gas recovery devices further comprises a viewing window, and the interior of the bellows can be seen through the viewing window. 7 . ;as well as 其中所述单晶圆湿处理设备还包含多个水管路,且每一所述气体回收装置的所述风箱与一个所述水管路连接,以及通过所述水管路将洁净水传输至所述风箱以清洗所述风箱的内部。The single-wafer wet processing equipment further includes a plurality of water pipelines, and the bellows of each gas recovery device is connected to one of the water pipelines, and clean water is transmitted to the bellows through the water pipelines to clean the inside of the bellows. 7.一种单晶圆湿处理设备,其特征在于,包含:7. A single-wafer wet processing equipment, characterized in that, comprising: 旋转台,用于放置晶圆;Rotary stage for placing wafers; 液体供应装置,设置在所述旋转台上方,用于对所述晶圆施加多种工艺液体;a liquid supply device, arranged above the rotary table, for applying various process liquids to the wafer; 液体回收装置,环绕地设置在所述旋转台的周围,并且可沿着垂直方向相对所述旋转台移动,其中所述液体回收装置包含多个沿着所述垂直方向堆叠设置的回收环,其中每一所述回收环包含:A liquid recovery device is circumferentially arranged around the rotary table and is movable relative to the rotary table in a vertical direction, wherein the liquid recovery device includes a plurality of recovery rings stacked and arranged in the vertical direction, wherein Each of said recycling loops includes: 液体接收口,与所述旋转台对准,用于接收对应的其中一种工艺液体及其夹带的气液混合物;a liquid receiving port, aligned with the rotary table, for receiving one of the corresponding process liquids and the entrained gas-liquid mixture; 分隔板,设置在所述回收环的内部以分隔出内环空间和外环空间,其中所述内环空间用于承接从所述液体接收口进入的所述工艺液体及其夹带的所述气液混合物,并且所述分隔板阻挡所述工艺液体从所述内环空间流至所述外环空间,以及所述分隔板上形成有多个通孔,用于让所述内环空间内的所述气液混合物通过所述多个通孔进入所述外环空间;以及A dividing plate is arranged inside the recovery ring to separate an inner annular space and an outer annular space, wherein the inner annular space is used to receive the process liquid entering from the liquid receiving port and the entrained gas-liquid mixture, and the separation plate blocks the flow of the process liquid from the inner annular space to the outer annular space, and a plurality of through holes are formed on the separation plate for allowing the inner annular space The gas-liquid mixture in the space enters the outer annular space through the plurality of through holes; and 液体收集口,与所述内环空间连通,用于让所述工艺液体从所述液体收集口排出;以及a liquid collection port, in communication with the inner annular space, for allowing the process liquid to be discharged from the liquid collection port; and 多个气体回收装置,分别与所述液体回收装置的所述多个回收环对应连接,用于将收集的所述气液混合物排出。A plurality of gas recovery devices are respectively connected to the plurality of recovery rings of the liquid recovery device, and are used for discharging the collected gas-liquid mixture. 8.如权利要求7所述的单晶圆湿处理设备,其特征在于,每一所述回收环还包含:8. The single-wafer wet processing equipment of claim 7, wherein each of the recycling loops further comprises: 环形上盖;Ring cover; 环形底板,与所述环形上盖对应设置;an annular bottom plate corresponding to the annular upper cover; 外环壁,与所述环形上盖的外周缘和所述环形底板的外周缘连接;an outer ring wall, connected with the outer peripheral edge of the annular upper cover and the outer peripheral edge of the annular bottom plate; 气体通道口,设置在所述外环壁上,且与对应的其中之一所述气体回收装置连接,其中所述分隔板设置在所述环形上盖和所述环形底板之间,以及所述液体接收口位在所述环形上盖的内周缘和所述环形底板的内周缘之间。A gas passage port is arranged on the outer ring wall and is connected with the corresponding one of the gas recovery devices, wherein the partition plate is arranged between the annular upper cover and the annular bottom plate, and the The liquid receiving port is located between the inner peripheral edge of the annular upper cover and the inner peripheral edge of the annular bottom plate. 9.如权利要求7所述的单晶圆湿处理设备,其特征在于,每一所述气体回收装置包含:9. The single-wafer wet processing apparatus of claim 7, wherein each of the gas recovery devices comprises: 风箱,包含第一连接口和第二连接口,其中所述第一连接口与对应的回收环连接,使得所述回收环内的所述气液混合物通过所述第一连接口进入所述风箱的内部;以及A bellows, comprising a first connection port and a second connection port, wherein the first connection port is connected with a corresponding recovery ring, so that the gas-liquid mixture in the recovery ring enters the bellows through the first connection port internal; and 排气管,与所述风箱的所述第二连接口连接,用于将收集的所述气液混合物排出。The exhaust pipe is connected to the second connection port of the bellows, and is used for discharging the collected gas-liquid mixture. 10.如权利要求9所述的单晶圆湿处理设备,其特征在于,每一所述气体回收装置的所述风箱还包含:上表面、下表面、侧表面、空腔,所述上表面与所述下表面相对设置,且所述侧表面位在所述上表面与所述下表面之间,以及所述空腔是由所述上表面、所述下表面、和所述侧表面互相连接而组成,其中所述第一连接口设置在所述侧表面,以及所述第二连接口设置在所述上表面。10. The single-wafer wet processing apparatus of claim 9, wherein the bellows of each gas recovery device further comprises: an upper surface, a lower surface, a side surface, and a cavity, and the upper surface Opposed to the lower surface, the side surface is located between the upper surface and the lower surface, and the cavity is formed by the upper surface, the lower surface, and the side surface The first connection port is provided on the side surface, and the second connection port is provided on the upper surface. 11.如权利要求9所述的单晶圆湿处理设备,其特征在于,每一所述气体回收装置的所述风箱还包含:排液口,设置在所述下表面,使得所述气液混合物通过所述风箱而产生的凝结液体通过所述排液口排出。11 . The single-wafer wet processing apparatus according to claim 9 , wherein the bellows of each of the gas recovery devices further comprises: a liquid discharge port, disposed on the lower surface, so that the gas-liquid The condensed liquid produced by the mixture passing through the bellows is discharged through the liquid discharge port. 12.如权利要求9所述的单晶圆湿处理设备,其特征在于,每一所述气体回收装置的所述风箱还包含观视窗,且通过所述观视窗可看到所述风箱的内部;以及12 . The single-wafer wet processing apparatus according to claim 9 , wherein the bellows of each of the gas recovery devices further comprises a viewing window, and the interior of the bellows can be seen through the viewing window. 13 . ;as well as 其中所述单晶圆湿处理设备还包含多个水管路,且每一所述气体回收装置的所述风箱与一个所述水管路连接,以及通过所述水管路将洁净水传输至所述风箱以清洗所述风箱的内部。The single-wafer wet processing equipment further includes a plurality of water pipelines, and the bellows of each gas recovery device is connected to one of the water pipelines, and clean water is transmitted to the bellows through the water pipelines to clean the inside of the bellows.
CN201910372200.2A 2019-05-06 2019-05-06 Single Wafer Wet Processing Equipment Pending CN111900102A (en)

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