CN111855003A - Temperature determination method and device - Google Patents
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- CN111855003A CN111855003A CN202010760977.9A CN202010760977A CN111855003A CN 111855003 A CN111855003 A CN 111855003A CN 202010760977 A CN202010760977 A CN 202010760977A CN 111855003 A CN111855003 A CN 111855003A
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- 238000009529 body temperature measurement Methods 0.000 claims description 15
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- G—PHYSICS
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- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/22—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor
- G01K7/24—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor in a specially-adapted circuit, e.g. bridge circuit
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/22—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor
- G01K7/24—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor in a specially-adapted circuit, e.g. bridge circuit
- G01K7/25—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor in a specially-adapted circuit, e.g. bridge circuit for modifying the output characteristic, e.g. linearising
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Abstract
The application discloses a temperature determination method and device, relates to the field of temperature detection, and solves the problems that in the prior art, the calculation amount is large and the calculation speed is slow when the temperature is reversely deduced according to the resistance value of a metal resistor. The method comprises the following steps: the processor acquires a first numerical value, wherein the first numerical value is the numerical value of the digital signal output by the analog-to-digital conversion circuit at a first moment; the processor determines the temperature corresponding to the first value according to a target linear relation and the first value, wherein the target linear relation is a linear relation between the digital signal and the temperature detected by the temperature detection circuit. According to the temperature determining method, the temperature is determined according to the linear relation, so that the calculation amount is small when the temperature is determined, the memory occupation is small, and the temperature calculating speed is increased.
Description
Technical Field
The present invention relates to the field of temperature detection, and in particular, to a method and an apparatus for determining a temperature.
Background
At present, household appliances such as steam ovens and microwave ovens generally determine the internal temperature by using the resistance value of a metal resistor. In particular, it can be according to the formula RX＝R0(1+AT+BT2+CT3) And the resistance value of the metal resistor reversely deduces the internal temperature. In this formula, T represents temperature, R0Representing the resistance of the metal resistor at 0 ℃, A, B and C are both coefficients, and A has a value of 10-3Stage, B has a value of 10-7Stage, C has a value of 10-12And (4) stages.
From the above formula, it can be seen that: the temperature and the resistance value of the metal resistor are in a nonlinear relation, the value of the coefficient C is 0 when the temperature is less than 0 ℃, but the value of the coefficient C is not 0 when the temperature is greater than 0 ℃, the detection range of the internal temperature of the steaming oven is 0-380 ℃ generally, and the influence of the coefficient C on the operation cannot be ignored in order to ensure the accuracy of the operation when the temperature is reversely deduced according to the resistance value of the metal resistor. Therefore, the calculation amount is large when the temperature is reversely deduced according to the resistance value of the metal resistor, the occupation of the memory is large, and the calculation speed is seriously influenced.
Disclosure of Invention
The invention provides a temperature determination method and device, which are used for solving the problems of large calculation amount and low calculation speed when the temperature is reversely estimated according to the resistance value of a metal resistor in the prior art.
In order to achieve the purpose, the invention adopts the following technical scheme:
in a first aspect, the present invention provides a method for determining a temperature, which is applied to a temperature measurement circuit, where the temperature measurement circuit includes a resistor, a temperature detection circuit electrically connected to the resistor, an analog-to-digital conversion circuit electrically connected to the temperature detection circuit, and a processor electrically connected to the analog-to-digital conversion circuit; the output voltage of the temperature detection circuit changes along with the change of the resistance value, and the analog-to-digital conversion circuit is used for performing analog-to-digital conversion on an output voltage signal of the temperature detection circuit and outputting a digital signal; the method for determining the temperature comprises the following steps: the processor acquires a first numerical value, wherein the first numerical value is the numerical value of the digital signal output by the analog-to-digital conversion circuit at a first moment; the processor determines a temperature corresponding to the first value according to a target linear relationship and the first value, wherein the target linear relationship is a linear relationship between the digital signal and the temperature detected by the temperature detection circuit.
According to the temperature determining method, the temperature is determined through a target linear relation generated in advance. Compared with the prior art that the temperature is reversely deduced according to the nonlinear relation, the temperature is determined according to the linear relation, so that the calculation amount is small when the temperature is determined, the memory occupation is small, and the temperature calculation speed is improved.
In a second aspect, the present invention provides a temperature determination apparatus, which is applied to a temperature measurement circuit, where the temperature measurement circuit includes a resistor, a temperature detection circuit electrically connected to the resistor, an analog-to-digital conversion circuit electrically connected to the temperature detection circuit, and a processor electrically connected to the analog-to-digital conversion circuit; the output voltage of the temperature detection circuit changes along with the change of the resistance value, and the analog-to-digital conversion circuit is used for performing analog-to-digital conversion on an output voltage signal of the temperature detection circuit and outputting a digital signal; the temperature determination device described above includes: the acquisition module is used for acquiring a first numerical value, wherein the first numerical value is the numerical value of the digital signal output by the analog-to-digital conversion circuit at a first moment; and the determining module is used for determining the temperature corresponding to the first value acquired by the acquiring module according to a target linear relation and the first value, wherein the target linear relation is a linear relation between the digital signal and the temperature detected by the temperature detecting circuit.
In a third aspect, the present application provides a temperature determination device comprising a memory and a processor. The memory is coupled to the processor. The memory is for storing computer program code comprising computer instructions. The temperature determining device, when the processor executes the computer instructions, performs the method of determining a temperature as described in the first aspect and any of its possible designs.
In a fourth aspect, the present application provides a computer-readable storage medium having stored therein instructions, which, when run on a device for determining a temperature, cause the device to perform a method for determining a temperature as set forth in the first aspect and any of its possible designs.
In a fifth aspect, the present application provides a computer program product comprising computer instructions which, when run on a temperature determining means, cause the temperature determining means to perform the method of determining a temperature as set forth in the first aspect and any one of its possible design forms.
For a detailed description of the second to fifth aspects and their various implementations in this application, reference may be made to the detailed description of the first aspect and its various implementations; moreover, the beneficial effects of the second aspect to the fifth aspect and the various implementation manners thereof may refer to the beneficial effect analysis of the first aspect and the various implementation manners thereof, and are not described herein again.
These and other aspects of the present application will be more readily apparent from the following description.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
FIG. 1 is a diagram illustrating a relationship between temperature and resistance of a metal resistor in the prior art;
FIG. 2 is a first schematic structural diagram of a temperature measurement circuit provided in the present application;
FIG. 3 is a second schematic structural diagram of a temperature measurement circuit provided in the present application;
FIG. 4 is a schematic flow chart of a target linear relationship determination method provided in the present application;
FIG. 5 is a schematic diagram of a current first non-linear relationship provided herein;
FIG. 6 is a first schematic diagram of determining a target linear relationship provided herein;
FIG. 7 is a second schematic diagram of determining a target linear relationship provided herein;
FIG. 8 is a third schematic diagram of determining a target linear relationship provided herein;
FIG. 9 is a fourth schematic diagram of determining a target linear relationship provided herein;
FIG. 10 is a schematic flow chart of a method for determining temperature provided herein;
fig. 11 is a schematic hardware structure diagram of a temperature determination device according to an embodiment of the present application;
fig. 12 is a schematic structural diagram of a temperature determination apparatus according to an embodiment of the present application.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless otherwise specified.
In the prior art, when the temperature in the steaming oven is determined, the formula R is satisfied according to the resistance value of the temperature and the metal resistorX＝R0(1+AT+BT2+CT3) And calculating the temperature in the steaming oven by the resistance value of the metal resistor.
As shown in FIG. 1, a rectangular coordinate system is established with the temperature T (in "degrees Celsius") as the ordinate and the resistance R (in ohm. omega.) of the metal resistor as the abscissa. Fig. 1 shows the relationship between the temperature and the resistance value of the metal resistor in the above formula. Referring to fig. 1, it can be seen that the temperature T is nonlinear with the resistance R of the metal resistor. And when the temperature is less than 0 ℃, the value of the coefficient C is 0, but when the temperature is more than 0 ℃, the value of the coefficient C is not 0, the detection range of the internal temperature of the steaming oven is usually 0-380 ℃, and in order to ensure the accuracy of the operation when the temperature is reversely deduced according to the resistance value of the metal resistor, the influence of the coefficient C on the operation cannot be ignored. Therefore, in the prior art, the calculation amount is large when the temperature is reversely deduced according to the resistance value of the metal resistor, the memory occupation is large, and the calculation speed is seriously influenced.
In order to solve the above problem, the present application provides a temperature determination method, which is applied to a temperature measurement circuit, and determines a temperature through a target linear relationship generated in advance. Compared with the method for reversely deducing the temperature according to the nonlinear relation in the prior art, the temperature is determined according to the linear target relation, so that the calculation amount is small when the temperature is determined, the memory occupation is small, and the temperature calculation speed is improved.
As shown in fig. 2, the temperature measuring circuit in the embodiment of the present application includes a resistor 01, a temperature detecting circuit 02, an analog-to-digital converting circuit 03, and a processor 04. The resistor 01 is electrically connected with the temperature detection circuit 02, the temperature detection circuit 02 is electrically connected with the analog-to-digital conversion circuit 03, and the analog-to-digital conversion circuit 03 is electrically connected with the processor 04.
The temperature detection circuit 02 detects a change in resistance of the resistor 01, and an output voltage of the temperature detection circuit 02 changes with the change in resistance of the resistor 01.
The analog-to-digital conversion circuit 03 is configured to perform analog-to-digital conversion on the output voltage signal of the temperature detection circuit 02 and output a digital signal.
The processor 04 is configured to determine a temperature corresponding to the digital signal according to the digital signal output by the analog-to-digital conversion circuit 03.
For example, the temperature detection circuit 02 and the analog-to-digital conversion circuit 03 may be electrically connected directly or indirectly through an intermediate circuit. The intermediate medium circuit includes at least one of an amplifying circuit and a sample-and-hold circuit.
Illustratively, as shown in fig. 3, the temperature detection circuit 02 and the analog-to-digital conversion circuit 03 are electrically connected indirectly through the amplification circuit 05 and the sample-and-hold circuit 06. The amplifying circuit 05 is used for amplifying the voltage signal output by the temperature detecting circuit 02, that is, converting the smaller detection signal into a voltage value required by the analog-to-digital converting circuit 03. The sample hold circuit 06 is used for ensuring that the analog quantity amplified by the amplifying circuit 05 is unchanged in the input value of the analog-to-digital conversion circuit 03 in the analog-to-digital conversion process.
For example, the analog-to-digital conversion circuit 03 and the sample-and-hold circuit 06 may be provided separately or integrally. For example, the analog-to-digital conversion circuit 03 and the sample-and-hold circuit 06 may both be integrated on the processor 04.
As can be seen from the above description, the temperature is determined according to a target linear relationship generated in advance in the present application. For ease of understanding, the generation process of the target linear relationship will be described first.
The target linear relationship is a linear relationship between the digital signal output from the analog-to-digital conversion circuit 03 and the temperature detected by the temperature detection circuit 02.
As shown in FIG. 4, the generation process of the target linear relationship includes S101-S105.
S101, the processor 04 determines a current first nonlinear relation.
The current first nonlinear relationship is a nonlinear relationship between the digital signal output by the analog-to-digital conversion circuit 03 and the temperature detected by the temperature detection circuit 02.
For example, the current first non-linearity may be an initial first non-linear relationship, or may be a first non-linear relationship determined again in S105 described below.
Optionally, the current first nonlinear relationship may be an initial first nonlinear relationship, and the determination method of the initial first nonlinear relationship is as follows: the processor 04 analyzes a corresponding relationship between the resistance value of the resistor and the digital signal in the historical time period to determine an initial first nonlinear relationship in which a maximum value of the digital signal corresponds to a maximum temperature value measured by the temperature measuring circuit.
Illustratively, the resistance value of the metal temperature measuring resistor changes along with the change of temperature, the metal temperature measuring resistor is replaced by an adjustable resistor or a sectional fixed resistor, digital signals under different resistance values are obtained by setting the resistance value of the adjustable resistor or the sectional fixed resistor, and an initial first nonlinear relation is determined according to the digital signals under the different resistance values and the temperature values corresponding to the different resistance values.
Illustratively, after determining the initial first non-linear relationship, the processor 04 determines that the maximum value of the digital signal output by the analog-to-digital conversion circuit 03 is equal to or greater than the first threshold value.
For example, the first threshold may be determined according to actual requirements, or the first threshold may be determined by measuring accuracy of the temperature. For example, the specific value of the maximum value of the digital signal is determined by the number of bits of the analog-to-digital conversion circuit, and the 10-bit analog-to-digital conversion circuit corresponds to the maximum value 2 of the digital signal101023, if the temperature ranges from 0 to 100 ℃, the detection accuracy is 0.1 ℃, the first threshold value may be 1000, and the maximum value of the digital signal is 1023 greater than the first threshold value, the maximum value of the digital signal meets the actual requirements.
The initial value of the maximum value of the digital signal in the current first nonlinear relationship corresponds to the maximum temperature value measured by the temperature measuring circuit, and the initial value of the minimum value of the digital signal in the current first nonlinear relationship corresponds to the minimum temperature value measured by the temperature measuring circuit.
For example, as shown in fig. 5, a rectangular coordinate system is established with the temperature T as the ordinate and the value of the digital signal output by the analog-to-digital conversion circuit 03 as the abscissa. The current first non-linear relationship is shown in the graph of fig. 5. The coordinates of two endpoints in the first nonlinear relation are respectively (x)0，y0) And (x)max，ymax) Wherein x ismaxThe maximum temperature value y measured by the temperature measuring circuitmaxCorresponds to, x0Minimum temperature value y measured by temperature measuring circuit0Correspondingly, that is, the value of the digital signal in the first non-linear relationship covers the temperature range measured by the thermometry circuit. Illustratively, the temperature measuring circuit measures a minimum temperature value y0It may be the minimum measurement accuracy measured by the thermometry circuit.
S102, the processor 04 determines a first linear relation.
The two endpoints of the first linear relationship respectively correspond to the minimum value and the maximum value of the digital signal in the current first non-linear relationship.
Illustratively, in conjunction with fig. 5, as shown in fig. 6, the first linear relationship is a connecting line between two endpoints of the current first non-linear relationship in fig. 6, which is indicated by a dashed line in fig. 6, and the coordinates of the two endpoints of the first linear relationship are (x) respectively0，y0) And (x)max，ymax) I.e. the two end points of the first linear relation correspond to the minimum value and the maximum value of the digital signal in the current first non-linear relation, respectively.
S103, the processor 04 determines a difference value between the temperature value in the first nonlinear relation and the temperature value in the first linear relation, and determines a first temperature difference value according to the determined difference value.
For each value in the digital signal in the current first non-linear relationship and the first linear relationship, calculating the difference between the temperature value of each value in the first non-linear relationship and the corresponding temperature value of the value in the first linear relationship one by one, and determining the largest difference as the first temperature difference.
For example, the present application describes an example in which when the value of the digital signal is half of the maximum value of the digital signal, the difference between the temperature value in the first nonlinear relationship and the corresponding temperature value in the first linear relationship is the maximum. For example, in conjunction with FIG. 6, as shown in FIG. 7, where the digital signal has a value of xmidWhen is xmid＝xmax/2, x in the first non-linear relationshipmidCorresponding temperature value ymidWith x in the first linear relationshipmidCorresponding temperature value y1The difference between the two is maximum, ymidSubtracting y1The obtained value is the first temperature difference.
And S104, if the first temperature difference is smaller than or equal to a preset threshold value, determining the first linear relation as a sub-linear relation.
For example, the preset threshold may be determined according to actual requirements, or the preset threshold may be determined according to the measurement accuracy of the temperature.
When the first temperature difference is smaller than or equal to a preset threshold value, namely when the deviation between the current first nonlinear relation and the first linear relation can meet the accuracy requirement of measurement, the first linear relation is determined to be a sub-linear relation, and the sub-linear relation can be a target linear relation or a subset of the target linear relation, so that when the temperature is actually determined, and when the processor determines that the digital signal output by the analog-to-digital conversion circuit is within the range of the digital signal corresponding to the first linear relation, the temperature corresponding to the digital signal can be determined according to the first linear relation and the digital signal.
And S105, if the first temperature difference is larger than the preset threshold, re-determining the first nonlinear relation.
And the maximum value or the minimum value of the digital signal in the redetermined first nonlinear relation is the value of the digital signal corresponding to the first temperature difference value.
Illustratively, in conjunction with fig. 6, as shown in fig. 7, when the maximum value of the digital signal in the first non-linear relationship is the value of the digital signal corresponding to the first temperature difference, the first non-linear relationship is determined from the point O (x)0，y0) To point A (x)mid，ymid) A curve segment OA, when the minimum value of the digital signal in the first non-linear relationship is the value of the digital signal corresponding to the first temperature difference, the first non-linear relationship is determined from the point A (x)mid，ymid) To point B (x)max，ymax) Curve segment AB of (a). That is, when the first temperature difference is greater than the preset threshold, the redetermined first nonlinear relationship is two nonlinear relationships obtained by dividing the current first nonlinear relationship into two segments.
Since the first re-determined non-linear relationships are two (i.e., the curve segment OA and the curve segment AB), S102-S105 are performed for each of the first re-determined non-linear relationships until the temperature values in all of the first re-determined non-linear relationships and the corresponding first temperature difference in the first re-determined linear relationship are less than or equal to the predetermined threshold.
Illustratively, in conjunction with FIG. 7, as shown in FIG. 8, the first non-linear relationship that is re-determined is curve segment AB, based on the two endpoints of curve segment AB (i.e., (x)0，y0) And (x)mid，ymid) Re-determining the first linear relationship 1, the re-determined first linear relationship 1 being a point (x)0，y0) And point (x)mid，ymid) Is indicated by a dashed line in fig. 8.
At x0To xmidThe difference between the temperature value of the redetermined first linear relationship 1 and the temperature value in the curve segment OA is compared value by value, and the maximum value of the difference is determined as the first temperature difference corresponding to the redetermined first linear relationship 1.
And if the first temperature difference value corresponding to the redetermined first linear relation 1 is smaller than or equal to the preset threshold, determining the first linear relation 1 as the sub-linear relation in the target linear relation.
If the first temperature difference value corresponding to the first linear relation 1 is larger than the preset threshold, the first nonlinear relation is determined again according to the first temperature difference value corresponding to the first linear relation 1. For example, in conjunction with FIG. 8, as shown in FIG. 9, in xmid/2Temperature value in a first non-linear relationship with xmid/2The maximum difference between corresponding temperature values in the first linear relation 3 is an example, x can be continued0To xmidCorresponding curve segment OA from xmid/2Is divided into two curve segments. And continuing to execute S102-S105 for the two curve segments until the temperature values in all the re-determined first non-linear relations and the corresponding first temperature differences in the re-determined first linear relations are less than or equal to a preset threshold value, and all the determined sub-linear relations form a target linear relation.
The embodiment of the present application will be described by taking only the redefined first non-linear relationship as the curve segment OA as an example, and the steps performed when the redefined first non-linear relationship is the curve segment AB are the same as those performed when the redefined first non-linear relationship is the curve segment OA.
As can be seen from the above generation process of the target linear relationship, the target linear relationship generated by the present application at least includes at least one sub-linear relationship.
The following describes a method for determining the temperature provided in the embodiments of the present application.
As shown in fig. 10, the determination method includes:
s201, the processor 04 acquires a first numerical value.
The first value is the value of the digital signal output by the analog-to-digital conversion circuit at a first moment.
Illustratively, the first time is any time when the temperature is determined.
S202, the processor 04 determines the temperature corresponding to the first numerical value according to the target linear relation and the first numerical value which are generated in advance.
The target linear relationship is a linear relationship between the digital signal and the temperature detected by the temperature detection circuit. For an exemplary generation process of the target linear relationship, reference may be specifically made to the above S101 to S105, which is not described herein again.
It should be noted that, since the target linear relationship generated in the present application includes at least one sub-linear relationship, after the processor 04 obtains the first numerical value, the processor determines which sub-linear relationship the first numerical value belongs to within the abscissa range, thereby determining the sub-linear relationship corresponding to the first numerical value, and further calculating the temperature according to the determined sub-linear relationship and the first numerical value.
According to the temperature determining method, the temperature is determined through a target linear relation generated in advance. Compared with the method for reversely deducing the temperature according to the nonlinear relation in the prior art, the temperature is determined according to the linear target relation, so that the calculation amount is small when the temperature is determined, the memory occupation is small, and the temperature calculation speed is improved.
The scheme provided by the embodiment of the application is mainly introduced from the perspective of a method. To implement the above functions, it includes hardware structures and/or software modules for performing the respective functions. Those of skill in the art would readily appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as hardware or combinations of hardware and computer software. Whether a function is performed as hardware or computer software drives hardware depends upon the particular application and design constraints imposed on the solution. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present application.
As shown in fig. 11, the present embodiment provides a temperature determination apparatus 300. The temperature determining device may comprise at least one processor 301, a communication line 302, a memory 303, a communication interface 304.
In particular, the processor 301 is configured to execute computer-executable instructions stored in the memory 303, thereby implementing steps or actions of the terminal.
The processor 301 may be a chip. For example, the Field Programmable Gate Array (FPGA) may be an Application Specific Integrated Circuit (ASIC), a system on chip (SoC), a Central Processing Unit (CPU), a Network Processor (NP), a digital signal processing circuit (DSP), a Microcontroller (MCU), a programmable logic controller (PLD) or other integrated chips.
A communication line 302 for transmitting information between the processor 301 and the memory 303.
A memory 303 for storing computer executable instructions and controlled by the processor 301.
The memory 303 may be separate and coupled to the processor via the communication line 302. The memory 303 may be either volatile memory or nonvolatile memory, or may include both volatile and nonvolatile memory. The non-volatile memory may be a read-only memory (ROM), a programmable read-only memory (PROM), an erasable programmable read-only memory (EPROM), an electrically erasable programmable read-only memory (EEPROM), or a flash memory. Volatile memory can be Random Access Memory (RAM), which acts as external cache memory. By way of example, and not limitation, many forms of RAM are available, such as Static Random Access Memory (SRAM), Dynamic Random Access Memory (DRAM), Synchronous Dynamic Random Access Memory (SDRAM), double data rate SDRAM, Enhanced SDRAM (ESDRAM). It should be noted that the memory of the systems and devices described herein is intended to comprise, without being limited to, these and any other suitable types of memory.
A communication interface 304 for communicating with other devices or a communication network. The communication network may be an ethernet, a Radio Access Network (RAN), or a Wireless Local Area Network (WLAN).
It is noted that the configuration shown in fig. 11 does not constitute a limitation of the temperature determination device, and the temperature determination device may include more or less components than those shown in fig. 11, or some components in combination, or a different arrangement of components, in addition to the components shown in fig. 11.
As shown in fig. 12, the present embodiment provides a temperature determination apparatus 10. The temperature determination device may include an acquisition module 11 and a determination module 12.
The obtaining module 11 is configured to obtain a first numerical value. For example, in conjunction with fig. 10, the obtaining module 11 may be configured to execute S201.
And the determining module 12 is configured to determine, according to a target linear relationship generated in advance and the first numerical value, a temperature corresponding to the first numerical value acquired by the acquiring module. For example, in conjunction with fig. 10, the determination module 12 may be configured to perform S202.
It should be understood that, in the various embodiments of the present application, the sequence numbers of the above-mentioned processes do not mean the execution sequence, and the execution sequence of each process should be determined by its function and inherent logic, and should not constitute any limitation to the implementation process of the embodiments of the present application.
In actual implementation, the obtaining module 11, the determining module 12, and the processor 301 shown in fig. 11 may call the program code in the memory 303 to implement the above. The specific implementation process may refer to the description of the temperature determination method portion shown in fig. 10, and will not be described herein again.
Another embodiment of the present application further provides a computer-readable storage medium, which stores therein computer instructions that, when executed on a temperature determination apparatus, cause the temperature determination apparatus to perform the steps performed by the temperature determination apparatus in the method flow shown in the above method embodiment.
In another embodiment of the present application, there is also provided a computer program product comprising instructions that, when executed on a temperature determining apparatus, cause the temperature determining apparatus to perform the steps performed by the temperature determining apparatus in the method flow shown in the above method embodiment.
Those of ordinary skill in the art will appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware or combinations of computer software and electronic hardware. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the implementation. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present application.
It can be clearly understood by those skilled in the art that, for convenience and brevity of description, the specific working processes of the above-described systems, devices and units may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again.
In the several embodiments provided in the present application, it should be understood that the disclosed system, apparatus, and method may be implemented in other ways. For example, the above-described embodiments of the apparatus are merely illustrative, and for example, a division of a unit is merely a logical division, and an actual implementation may have another division, for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices or units, and may be in an electrical, mechanical or other form.
Units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present application may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit.
The above description is only for the specific embodiments of the present application, but the scope of the present application is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present application should be covered within the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (10)
1. The temperature determination method is characterized by being applied to a temperature measurement circuit, wherein the temperature measurement circuit comprises a resistor, a temperature detection circuit electrically connected with the resistor, an analog-to-digital conversion circuit electrically connected with the temperature detection circuit, and a processor electrically connected with the analog-to-digital conversion circuit; the output voltage of the temperature detection circuit changes along with the change of the resistance value, and the analog-to-digital conversion circuit is used for performing analog-to-digital conversion on an output voltage signal of the temperature detection circuit and outputting a digital signal; the determination method comprises the following steps:
the processor acquires a first numerical value, wherein the first numerical value is the numerical value of the digital signal output by the analog-to-digital conversion circuit at a first moment;
and the processor determines the temperature corresponding to the first numerical value according to a pre-generated target linear relation and the first numerical value, wherein the target linear relation is the linear relation between the digital signal and the temperature detected by the temperature detection circuit.
2. The determination method according to claim 1, wherein the generation process of the target linear relationship comprises:
the processor determines a current first nonlinear relationship, wherein the current first nonlinear relationship is a nonlinear relationship between the digital signal and the temperature detected by the temperature detection circuit, an initial value of a maximum value of the digital signal in the current first nonlinear relationship corresponds to a maximum temperature value measured by the temperature measurement circuit, and an initial value of a minimum value of the digital signal in the current first nonlinear relationship corresponds to a minimum temperature value measured by the temperature measurement circuit;
step A: determining a first linear relation, wherein two endpoints of the first linear relation respectively correspond to the minimum value and the maximum value of the digital signal in the current first nonlinear relation;
and B: for each value in the digital signals in the current first non-linear relationship and the first linear relationship, determining a difference between the temperature value in the first non-linear relationship and the temperature value in the first linear relationship, and determining a first temperature difference according to the determined difference, wherein the first temperature difference is the difference with the largest value in the determined differences;
if the first temperature difference is smaller than or equal to a preset threshold value, determining the first linear relation as a sub-linear relation;
if the first temperature difference is larger than the preset threshold, re-determining a first nonlinear relation, wherein the maximum value or the minimum value of the digital signal in the re-determined first nonlinear relation is the numerical value of the digital signal corresponding to the first temperature difference; according to the re-determined first non-linear relationship, executing the step A and the step B until the first temperature difference is smaller than or equal to the preset threshold value;
determining the target linear relationship includes determining all sub-linear relationships.
3. The method according to claim 2, wherein the current first non-linear relationship is an initial first non-linear relationship, and the initial first non-linear relationship is determined by:
and the processor analyzes the corresponding relation between the resistance value of the resistor and the digital signal in the historical time period to determine the initial first nonlinear relation, wherein the maximum value of the digital signal in the initial first nonlinear relation corresponds to the maximum temperature value measured by the temperature measuring circuit.
4. The method of claim 3, wherein after determining the initial first non-linear relationship, the method further comprises:
determining that a maximum value of the digital signal is equal to or greater than a first threshold value.
5. The temperature determination device is applied to a temperature measurement circuit, wherein the temperature measurement circuit comprises a resistor, a temperature detection circuit electrically connected with the resistor, an analog-to-digital conversion circuit electrically connected with the temperature detection circuit, and a processor electrically connected with the analog-to-digital conversion circuit; the output voltage of the temperature detection circuit changes along with the change of the resistance value, and the analog-to-digital conversion circuit is used for performing analog-to-digital conversion on an output voltage signal of the temperature detection circuit and outputting a digital signal; the determination device comprises:
the acquisition module is used for acquiring a first numerical value, wherein the first numerical value is the numerical value of the digital signal output by the analog-to-digital conversion circuit at a first moment;
and the determining module is used for determining the temperature corresponding to the first value acquired by the acquiring module according to a pre-generated target linear relationship and the first value, wherein the target linear relationship is a linear relationship between the digital signal and the temperature detected by the temperature detecting circuit.
6. The determination apparatus according to claim 5, wherein the determination module is specifically configured to:
determining a current first nonlinear relationship, where the current first nonlinear relationship is a nonlinear relationship between the digital signal and the temperature detected by the temperature detection circuit, an initial value of a maximum value of the digital signal in the current first nonlinear relationship corresponds to a maximum temperature value measured by the temperature measurement circuit, and an initial value of a minimum value of the digital signal in the current first nonlinear relationship corresponds to a minimum temperature value measured by the temperature measurement circuit;
step A: determining a first linear relation, wherein two endpoints of the first linear relation respectively correspond to the minimum value and the maximum value of the digital signal in the current first nonlinear relation;
and B: for each value in the digital signals in the current first non-linear relationship and the first linear relationship, determining a difference between the temperature value in the first non-linear relationship and the temperature value in the first linear relationship, and determining a first temperature difference according to the determined difference, wherein the first temperature difference is the difference with the largest value in the determined differences;
if the first temperature difference is smaller than or equal to a preset threshold value, determining the first linear relation as a sub-linear relation;
if the first temperature difference is larger than the preset threshold, re-determining a first nonlinear relation, wherein the maximum value or the minimum value of the digital signal in the re-determined first nonlinear relation is the numerical value of the digital signal corresponding to the first temperature difference; according to the re-determined first non-linear relationship, executing the step A and the step B until the first temperature difference is smaller than or equal to the preset threshold value;
determining the target linear relationship includes determining all sub-linear relationships.
7. The apparatus of claim 6, wherein the determination module is further configured to:
and analyzing the corresponding relation between the resistance value of the resistor and the digital signal in the historical time period to determine the initial first nonlinear relation, wherein the maximum value of the digital signal in the initial first nonlinear relation corresponds to the maximum temperature value measured by the temperature measuring circuit.
8. The apparatus of claim 7, wherein the determination module is further configured to:
after determining the initial first non-linear relationship, determining that the maximum value of the digital signal is greater than or equal to a first threshold value.
9. A temperature determining apparatus, characterized in that the temperature determining apparatus comprises a memory and a processor; the memory and the processor are coupled; the memory for storing computer program code, the computer program code comprising computer instructions; the temperature determination device, when executing the computer instructions, performs the temperature determination method according to any of claims 1-4.
10. A computer-readable storage medium having stored therein instructions which, when run on a temperature determination device, cause the device to perform the temperature determination method of any one of claims 1-4.
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112697307A (en) * | 2020-12-10 | 2021-04-23 | 西安中车永电捷通电气有限公司 | Temperature determination method, temperature determination device, vehicle, storage medium, and program product |
| CN112818287A (en) * | 2021-01-29 | 2021-05-18 | 三一海洋重工有限公司 | Weighing method and system of material grabbing machine, storage medium and electronic equipment |
| CN113804322A (en) * | 2021-08-27 | 2021-12-17 | 惠州Tcl移动通信有限公司 | Circuit system, method, storage medium and equipment for detecting temperature |
| CN113899462A (en) * | 2021-09-08 | 2022-01-07 | 海信家电集团股份有限公司 | Temperature measurement method, temperature measurement circuit and temperature measurement device |
| CN114812866A (en) * | 2021-01-18 | 2022-07-29 | 上海辰竹仪表有限公司 | Method, apparatus, device and medium for calculating division number of thermocouple or thermal resistor |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103185645A (en) * | 2011-12-29 | 2013-07-03 | 中国科学院沈阳自动化研究所 | High-precision temperature detecting device and detecting method applied to draught fan control system |
| CN107576410A (en) * | 2017-09-12 | 2018-01-12 | 北京天诚同创电气有限公司 | Temperature checking method and device |
| CN109115257A (en) * | 2017-06-22 | 2019-01-01 | 深圳怡化电脑股份有限公司 | Modification method, device, equipment and the storage medium of sensor characteristic |
-
2020
- 2020-07-31 CN CN202010760977.9A patent/CN111855003B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103185645A (en) * | 2011-12-29 | 2013-07-03 | 中国科学院沈阳自动化研究所 | High-precision temperature detecting device and detecting method applied to draught fan control system |
| CN109115257A (en) * | 2017-06-22 | 2019-01-01 | 深圳怡化电脑股份有限公司 | Modification method, device, equipment and the storage medium of sensor characteristic |
| CN107576410A (en) * | 2017-09-12 | 2018-01-12 | 北京天诚同创电气有限公司 | Temperature checking method and device |
Non-Patent Citations (2)
| Title |
|---|
| 吴松涛等: ""非线性数据标准化处理过程中的线性近似法"", 《信息工程大学学报》 * |
| 张天亮等: ""基于分段线性插值法的高精度测温研究"", 《信息技术与信息化》 * |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112697307A (en) * | 2020-12-10 | 2021-04-23 | 西安中车永电捷通电气有限公司 | Temperature determination method, temperature determination device, vehicle, storage medium, and program product |
| CN112697307B (en) * | 2020-12-10 | 2023-08-29 | 西安中车永电捷通电气有限公司 | Temperature determination method, device, vehicle, storage medium, and program product |
| CN114812866A (en) * | 2021-01-18 | 2022-07-29 | 上海辰竹仪表有限公司 | Method, apparatus, device and medium for calculating division number of thermocouple or thermal resistor |
| CN112818287A (en) * | 2021-01-29 | 2021-05-18 | 三一海洋重工有限公司 | Weighing method and system of material grabbing machine, storage medium and electronic equipment |
| CN112818287B (en) * | 2021-01-29 | 2024-04-09 | 三一海洋重工有限公司 | Weighing method and system of grabbing machine, storage medium and electronic equipment |
| CN113804322A (en) * | 2021-08-27 | 2021-12-17 | 惠州Tcl移动通信有限公司 | Circuit system, method, storage medium and equipment for detecting temperature |
| CN113899462A (en) * | 2021-09-08 | 2022-01-07 | 海信家电集团股份有限公司 | Temperature measurement method, temperature measurement circuit and temperature measurement device |
| CN113899462B (en) * | 2021-09-08 | 2024-04-09 | 海信家电集团股份有限公司 | A temperature measurement method, a temperature measurement circuit and a temperature measurement device |
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