[go: up one dir, main page]

CN111782438B - An Improved Radiation Hardened Matrix Code Decoding Circuit - Google Patents

An Improved Radiation Hardened Matrix Code Decoding Circuit Download PDF

Info

Publication number
CN111782438B
CN111782438B CN201910271188.6A CN201910271188A CN111782438B CN 111782438 B CN111782438 B CN 111782438B CN 201910271188 A CN201910271188 A CN 201910271188A CN 111782438 B CN111782438 B CN 111782438B
Authority
CN
China
Prior art keywords
bits
bit
check
information
information bits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201910271188.6A
Other languages
Chinese (zh)
Other versions
CN111782438A (en
Inventor
施宇根
李少甫
周明长
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Southwest University of Science and Technology
Original Assignee
Southwest University of Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Southwest University of Science and Technology filed Critical Southwest University of Science and Technology
Priority to CN201910271188.6A priority Critical patent/CN111782438B/en
Publication of CN111782438A publication Critical patent/CN111782438A/en
Application granted granted Critical
Publication of CN111782438B publication Critical patent/CN111782438B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1048Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using arrangements adapted for a specific error detection or correction feature
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/38Response verification devices
    • G11C29/42Response verification devices using error correcting codes [ECC] or parity check

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Detection And Correction Of Errors (AREA)
  • Error Detection And Correction (AREA)

Abstract

An improved decoding circuit of radiation-resistant reinforced matrix code is designed to correct the error of the reversed bit of 6-bit data width of memory. The decoding circuit completes decoding error correction of the data bits through two iterations. The core of the decoding circuit is to obtain new check bits and syndromes for the received information bits and redundant bits, and to correct errors in the data by comparing the updated syndromes with the initial syndromes.

Description

一种改进的抗辐射加固矩阵码译码电路An Improved Radiation Hardened Matrix Code Decoding Circuit

技术领域technical field

本发明涉及一种对于存储器抗辐射加固改进的矩阵码译码电路。The present invention relates to an improved matrix code decoding circuit for memory radiation hardening.

背景技术Background technique

空间辐照环境下,高能粒子会使得存储器发生多位翻转。存储器发生2-5位数据宽度的软错误概率较大,也有极小的概率发生更多宽度的数据比特翻转。一般而言,存储器也可以通过BCH码、RS码以及LDPC纠错能力强的码字进行纠错。但这类码字的高性能使得电路实现复杂,不但本身需要存储校验矩阵,辐射环境下校验矩阵容易出错导致译码失效,而且译码过程时延严重,硬件开销也难以承受。In the environment of space irradiation, high-energy particles can cause multiple bit flips in the memory. The memory has a high probability of soft errors with a data width of 2-5 bits, and a very small probability of data bit flips with a larger width. Generally speaking, the memory can also perform error correction through BCH code, RS code and LDPC codeword with strong error correction capability. However, the high performance of such codewords complicates the circuit implementation. Not only does it need to store the parity check matrix, but the parity check matrix is prone to errors in a radiation environment, resulting in decoding failure. Moreover, the decoding process has a serious delay and the hardware overhead is unbearable.

针对辐射环境下的出错特性构造二维矩阵码,二维矩阵码将一个字在逻辑上划分为矩阵形式,可对指定数据宽度的存储器翻转进行纠错,除了添加冗余电路外,不需要更改存储器电路结构。矩阵码电路实现简单,可较好的对存储器进行抗辐射加固,但随着电路工艺尺寸的降低,存储器需要纠错能力更强的纠错码。A two-dimensional matrix code is constructed according to the error characteristics in the radiation environment. The two-dimensional matrix code logically divides a word into a matrix form, which can correct the memory flip of the specified data width. Except for adding redundant circuits, no changes are required. Memory circuit structure. The matrix code circuit is simple to implement, and can better harden the memory against radiation. However, with the reduction of the circuit process size, the memory needs an error correction code with stronger error correction capability.

经检索DOI号为10.16708/j.cnki.1000-758X.2018.0070提出了一种矩阵码构造方法,本发明设计了一种改进的译码电路,对6位数据宽度的翻转进行多次分割后纠错,其可以对单个码字的6位数据宽度翻转进行纠错。After searching the DOI number is 10.16708/j.cnki.1000-758X.2018.0070, a matrix code construction method is proposed. The present invention designs an improved decoding circuit, which performs multiple divisions for the inversion of the 6-bit data width and then corrects error, it can correct the 6-bit data width inversion of a single codeword.

矩阵码对存储器的字在逻辑上划分为多个4阶矩阵,矩阵码校验位生成公式如下,其中公式3和公式4对所校验信息位进行联合校验,例如信息位

Figure 526138DEST_PATH_IMAGE001
翻转时,公式3的状态应当表示为‘1110’。The matrix code logically divides the words of the memory into multiple 4th-order matrices. The matrix code check bit generation formula is as follows, where Equation 3 and Equation 4 perform joint checking on the checked information bits, such as information bits
Figure 526138DEST_PATH_IMAGE001
When flipped, the state of Equation 3 should be represented as '1110'.

Figure 309155DEST_PATH_IMAGE002
(1)
Figure 309155DEST_PATH_IMAGE002
(1)

Figure 363699DEST_PATH_IMAGE003
(2)
Figure 363699DEST_PATH_IMAGE003
(2)

Figure 59122DEST_PATH_IMAGE004
(3)
Figure 59122DEST_PATH_IMAGE004
(3)

Figure 831906DEST_PATH_IMAGE005
(4)
Figure 831906DEST_PATH_IMAGE005
(4)

发明内容SUMMARY OF THE INVENTION

本发明要解决的问题在于提供一种改进的译码电路增加矩阵码的纠错性能。The problem to be solved by the present invention is to provide an improved decoding circuit to increase the error correction performance of the matrix code.

为达到上述目的,本发明提供如下实现方案:In order to achieve the above object, the present invention provides following realization scheme:

步骤1:数据接收信息位根据产生14个新的校验位

Figure 107030DEST_PATH_IMAGE006
,以此得到校正子
Figure 32392DEST_PATH_IMAGE007
:Step 1: Generate 14 new parity bits according to data reception information bits
Figure 107030DEST_PATH_IMAGE006
, so as to get the corrector
Figure 32392DEST_PATH_IMAGE007
:

Figure 164296DEST_PATH_IMAGE008
(5)
Figure 164296DEST_PATH_IMAGE008
(5)

步骤2:对信息矩阵中的部分信息位进行纠错,纠错公式如下:Step 2: Correct some information bits in the information matrix. The error correction formula is as follows:

Figure 362059DEST_PATH_IMAGE009
(6)
Figure 362059DEST_PATH_IMAGE009
(6)

Figure 237611DEST_PATH_IMAGE010
(7)
Figure 237611DEST_PATH_IMAGE010
(7)

步骤3: 对纠正后信息位进行更新得到新的校验位

Figure 266747DEST_PATH_IMAGE011
与校正子
Figure 821750DEST_PATH_IMAGE012
,根据新的校正子对剩余的信息位中的部分信息位进行纠错:Step 3: Update the corrected information bit to get a new check bit
Figure 266747DEST_PATH_IMAGE011
with syndrome
Figure 821750DEST_PATH_IMAGE012
, and correct some of the remaining information bits according to the new syndrome:

Figure 506809DEST_PATH_IMAGE013
(8)
Figure 506809DEST_PATH_IMAGE013
(8)

Figure 920473DEST_PATH_IMAGE014
(9)
Figure 920473DEST_PATH_IMAGE014
(9)

Figure 69694DEST_PATH_IMAGE015
(10)
Figure 69694DEST_PATH_IMAGE015
(10)

步骤4:对步骤3中信息位的纠正结果进行更新,更新后产生新的校验位

Figure 746663DEST_PATH_IMAGE016
,并以此得到新的校正子
Figure 715756DEST_PATH_IMAGE017
。Step 4: Update the correction result of the information bit in Step 3, and generate a new check bit after the update
Figure 746663DEST_PATH_IMAGE016
, and use this to get a new correction
Figure 715756DEST_PATH_IMAGE017
.

Figure 949423DEST_PATH_IMAGE018
(11)
Figure 949423DEST_PATH_IMAGE018
(11)

步骤5:剩余信息位的校验状态

Figure 687571DEST_PATH_IMAGE019
可根据更新后的校正子
Figure 535442DEST_PATH_IMAGE020
得到,通过校验状态即可对3区信息位进行纠错:Step 5: Check Status of Remaining Information Bits
Figure 687571DEST_PATH_IMAGE019
According to the updated syndrome
Figure 535442DEST_PATH_IMAGE020
It can be obtained that the error correction of the 3-zone information bits can be performed by checking the status:

Figure 991831DEST_PATH_IMAGE021
(12)
Figure 991831DEST_PATH_IMAGE021
(12)

其中

Figure 12877DEST_PATH_IMAGE022
表示信息位
Figure 120379DEST_PATH_IMAGE023
在指定数据宽度内根据公式3和公式4可能得到校验状态的所有情况的或运算。剩余信息位纠错完成,纠错算法完成译码。in
Figure 12877DEST_PATH_IMAGE022
Indicates information bits
Figure 120379DEST_PATH_IMAGE023
According to Equation 3 and Equation 4, it is possible to obtain the OR operation of all cases of the check state within the specified data width. The error correction of the remaining information bits is completed, and the error correction algorithm completes the decoding.

本发明的优异效果在于:本发明提出了一种改进的矩阵码译码电路,电路对信息位发生的连续错误通过多次迭代将翻转位进行分割;每次的迭代更新将减少校验位出错位数;从而在不提高太多功耗、时延开销的同时增加纠错码译码性能。The excellent effects of the present invention are as follows: the present invention proposes an improved matrix code decoding circuit, the circuit divides the flipped bits through multiple iterations for continuous errors occurring in the information bits; each iteration update will reduce check bit errors The number of bits; thereby increasing the decoding performance of the error correction code without increasing too much power consumption and delay overhead.

附图说明Description of drawings

为了更好的阐述本发明的目的、细节及优点,提供如下附图进行说明:In order to better illustrate the purpose, details and advantages of the present invention, the following accompanying drawings are provided for description:

图1是译码流程图;Fig. 1 is a decoding flow chart;

图2是位宽为16bit位的字在逻辑上的矩阵排列Figure 2 is the logical matrix arrangement of a word with a bit width of 16 bits

图3是对逻辑上的矩阵在码字编码时将矩阵分割为3个部分;Fig. 3 divides the matrix into 3 parts when the codeword is encoded to the logical matrix;

图4~19是16bit位宽的字的各个信息位纠错电路。Figures 4 to 19 are error correction circuits for each information bit of a 16-bit wide word.

具体实施方式Detailed ways

参照图2中的码字逻辑排列结构,本发明以16bit位宽的字作为较佳实施例,具体步骤如下:With reference to the codeword logical arrangement structure in Fig. 2, the present invention takes the word of 16bit bit width as a preferred embodiment, and the concrete steps are as follows:

步骤1:数据接收信息位根据产生14个新的校验位

Figure 873571DEST_PATH_IMAGE006
,以此得到校正子
Figure 817256DEST_PATH_IMAGE007
:Step 1: Generate 14 new parity bits according to data reception information bits
Figure 873571DEST_PATH_IMAGE006
, so as to get the corrector
Figure 817256DEST_PATH_IMAGE007
:

Figure 641993DEST_PATH_IMAGE024
(13)
Figure 641993DEST_PATH_IMAGE024
(13)

步骤2:参照图3中的各分区位置,首先对信息矩阵中的1区和2区的部分信息位进行纠错,纠错公式如下:Step 2: Referring to the position of each partition in Fig. 3, firstly correct some information bits in the 1st area and 2nd area in the information matrix, and the error correction formula is as follows:

Figure 354734DEST_PATH_IMAGE025
(6)
Figure 354734DEST_PATH_IMAGE025
(6)

Figure 544407DEST_PATH_IMAGE026
(7)
Figure 544407DEST_PATH_IMAGE026
(7)

步骤3: 对纠正后的和进行更新得到新的校验位

Figure 726121DEST_PATH_IMAGE011
与校正子
Figure 823390DEST_PATH_IMAGE012
,根据新的校正子对图3中1区和2区剩余的信息位进行纠错:Step 3: Update the corrected sum to get the new check digit
Figure 726121DEST_PATH_IMAGE011
with syndrome
Figure 823390DEST_PATH_IMAGE012
, and correct the remaining information bits in areas 1 and 2 in Figure 3 according to the new syndrome:

Figure 656216DEST_PATH_IMAGE027
(8)
Figure 656216DEST_PATH_IMAGE027
(8)

Figure 813528DEST_PATH_IMAGE028
(9)
Figure 813528DEST_PATH_IMAGE028
(9)

Figure 669489DEST_PATH_IMAGE029
(10)
Figure 669489DEST_PATH_IMAGE029
(10)

步骤4:对步骤3中信息位的纠正结果对3区校验位进行更新,更新后产生新的校验位

Figure 810927DEST_PATH_IMAGE016
,并以此得到新的校正子
Figure 763840DEST_PATH_IMAGE017
。Step 4: Update the 3-area check digit for the correction result of the information bit in step 3, and generate a new check digit after the update
Figure 810927DEST_PATH_IMAGE016
, and use this to get a new correction
Figure 763840DEST_PATH_IMAGE017
.

Figure 92053DEST_PATH_IMAGE030
(11)
Figure 92053DEST_PATH_IMAGE030
(11)

步骤5:剩余信息位的校验状态

Figure 435309DEST_PATH_IMAGE019
可根据更新后的校正子
Figure 139960DEST_PATH_IMAGE020
得到,通过校验状态即可对3区信息位进行纠错:Step 5: Check Status of Remaining Information Bits
Figure 435309DEST_PATH_IMAGE019
According to the updated syndrome
Figure 139960DEST_PATH_IMAGE020
It can be obtained that the error correction of the 3-zone information bits can be performed by checking the status:

Figure 432532DEST_PATH_IMAGE031
(12)
Figure 432532DEST_PATH_IMAGE031
(12)

其中

Figure 134909DEST_PATH_IMAGE022
表示信息位
Figure 762200DEST_PATH_IMAGE023
在6位数据宽度内根据公式3和公式4可能得到校验状态的所有情况的或运算。剩余信息位纠错完成,纠错算法完成译码。in
Figure 134909DEST_PATH_IMAGE022
Indicates information bits
Figure 762200DEST_PATH_IMAGE023
According to formula 3 and formula 4, it is possible to obtain the OR operation of all cases of the check state within the data width of 6 bits. The error correction of the remaining information bits is completed, and the error correction algorithm completes the decoding.

各信息位的对应电路如图4~19所示。The corresponding circuit of each information bit is shown in Figure 4~19.

以上详细描述的实施例仅用于说明本发明的具体实施方式,需要说明,上述描述的内容仅具有说明性而非限制,但是本领域技术人员应当理解,可以在形式和细节上对其作不同的改变,而不偏离发明权利要求书所限定的范围。The above-detailed embodiments are only used to illustrate the specific implementation of the present invention. It should be noted that the above-described content is only illustrative and not restrictive, but those skilled in the art should understand that different forms and details can be made. changes without departing from the scope defined by the claims of the invention.

Claims (2)

1. An improved radiation-resistant reinforced matrix code decoding circuit is designed to correct the error of the reversed bit of the data width of 6 bits in a memory, and the decoding circuit completes the decoding and error correction of the data bits through two iterations; the core of the decoding circuit is that new check bits and syndromes are obtained from received information bits and redundant bits, and data are corrected through comparison between the updated syndromes and the initial syndromes;
the coding mode of the designed decoding circuit is that a code word is logically divided into n 4-order matrixes, 16 information bits in the matrixes are sequentially arranged, and 14 check bits are obtained from the 16 information bits; the sign bit is defined as:
Figure 234759DEST_PATH_IMAGE001
is an initial information bit;
Figure 776599DEST_PATH_IMAGE002
is an initial check bit;
Figure 478976DEST_PATH_IMAGE003
a check bit generated for receiving the information bit;
Figure 106266DEST_PATH_IMAGE004
calculating a syndrome for the received information bits and the initial check bits;
Figure 863876DEST_PATH_IMAGE005
the check bits are obtained after the first iteration of part of the information bits;
Figure 525801DEST_PATH_IMAGE006
obtaining a new syndrome for the check bit and the initial information bit after the first iteration;
Figure 399079DEST_PATH_IMAGE007
the check bits are obtained after the second iteration of the partial information bits;
Figure 248087DEST_PATH_IMAGE006
obtaining a syndrome for the check bit after the second iteration and the initial information bit;
Figure 294540DEST_PATH_IMAGE008
is the modified information bit;
step 1: data receiving information bits are based on generating 14 new parity bits
Figure 827284DEST_PATH_IMAGE003
Thereby obtaining a syndrome
Figure 871463DEST_PATH_IMAGE004
:
Figure 207766DEST_PATH_IMAGE009
(13)
Step 2: and correcting errors of partial information in the information matrix, wherein the error correction formula is as follows:
Figure 792331DEST_PATH_IMAGE010
(6)
Figure 163270DEST_PATH_IMAGE011
(7)
step 3, updating the corrected information bits to obtain new check bits
Figure 439004DEST_PATH_IMAGE005
And syndrome
Figure 528183DEST_PATH_IMAGE012
And correcting error of part of the remaining information bits according to the new syndrome:
Figure 916439DEST_PATH_IMAGE013
(8)
Figure 407463DEST_PATH_IMAGE014
(9)
Figure 793445DEST_PATH_IMAGE015
(10)
and 4, step 4: updating the correction result of the information bit in the step 3, and generating a new check bit after updating
Figure 855073DEST_PATH_IMAGE016
And thus obtain a new syndrome
Figure 47020DEST_PATH_IMAGE017
Figure 392551DEST_PATH_IMAGE018
(11)
And 5: check state of remaining information bits
Figure 949434DEST_PATH_IMAGE019
Can be based on the updated syndrome
Figure 747626DEST_PATH_IMAGE020
And obtaining, the residual information bits can be corrected through the check state:
Figure 992531DEST_PATH_IMAGE021
(12)
wherein
Figure 192568DEST_PATH_IMAGE022
Representing information bits
Figure 920353DEST_PATH_IMAGE023
An or operation of all cases of the check state may be obtained according to equations 3 and 4 within the 6-bit data width; and completing error correction of the residual information bits, and completing decoding by an error correction algorithm.
2. The improved radioresistant reinforced matrix code decoding circuit of claim 1 wherein: the circuit divides the reversed bit through multiple iterations for continuous errors of the information bit, and the error bit of the check bit is reduced through each iteration updating.
CN201910271188.6A 2019-04-04 2019-04-04 An Improved Radiation Hardened Matrix Code Decoding Circuit Expired - Fee Related CN111782438B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201910271188.6A CN111782438B (en) 2019-04-04 2019-04-04 An Improved Radiation Hardened Matrix Code Decoding Circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201910271188.6A CN111782438B (en) 2019-04-04 2019-04-04 An Improved Radiation Hardened Matrix Code Decoding Circuit

Publications (2)

Publication Number Publication Date
CN111782438A CN111782438A (en) 2020-10-16
CN111782438B true CN111782438B (en) 2022-08-05

Family

ID=72755177

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201910271188.6A Expired - Fee Related CN111782438B (en) 2019-04-04 2019-04-04 An Improved Radiation Hardened Matrix Code Decoding Circuit

Country Status (1)

Country Link
CN (1) CN111782438B (en)

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20120059806A (en) * 2010-12-01 2012-06-11 한국전자통신연구원 Method for producing and decoding of error correcting code, and apparatus thereof
US9286154B2 (en) * 2013-06-07 2016-03-15 Alcatel Lucent Error correction for entangled quantum states
US9342404B2 (en) * 2013-12-12 2016-05-17 Phison Electronics Corp. Decoding method, memory storage device, and memory controlling circuit unit
US9543981B2 (en) * 2014-03-25 2017-01-10 Texas Instruments Incorporated CRC-based forward error correction circuitry and method
TWI543178B (en) * 2014-06-10 2016-07-21 群聯電子股份有限公司 Decoding method, memory storage device and memory controlling circuit unit
CN106328209B (en) * 2015-06-30 2020-01-21 中国科学院电子学研究所 Memory single-particle multi-bit upset fault-tolerant method and circuit

Also Published As

Publication number Publication date
CN111782438A (en) 2020-10-16

Similar Documents

Publication Publication Date Title
US11740960B2 (en) Detection and correction of data bit errors using error correction codes
US8543891B2 (en) Power-optimized decoding of linear codes
US11115051B2 (en) Systems and methods for decoding error correcting codes
CN109586731B (en) System and method for decoding error correction codes
US9391641B2 (en) Syndrome tables for decoding turbo-product codes
US20130031447A1 (en) Fast detection of convergence or divergence in iterative decoding
KR20190008335A (en) Method and apparatus for encoding and decoding structured LDPC
WO2017194013A1 (en) Error correction coding method and device
CN107425856A (en) Low density parity check decoder and method for saving power thereof
KR20090041224A (en) Synchronous Decoder and Synchronous Decoding Method
CN103023518B (en) Error correction method of cyclic Hamming code based on parallel coding and decoding
WO2020052672A1 (en) Decoding method and apparatus for turbo product code, decoder, and computer storage medium
KR101775969B1 (en) Method and circuit for qc-ldpc codes in nand flash memory
JP2012050008A (en) Error detection/correction method and semiconductor memory device
CN111782438B (en) An Improved Radiation Hardened Matrix Code Decoding Circuit
CN1756090B (en) Channel encoding apparatus and method
US12119841B2 (en) G-LDPC decoder and G-LDPC decoding method
WO2011144161A1 (en) Method, device and system for forward error correction
EP1643653A1 (en) Iterative decoding of low-density parity-check (LDPC) codes
KR101154923B1 (en) BCH decoder, memory system having the same and BCHBCH decoding method
CN103309766A (en) Error correction method of cyclic hamming code based on parallel coding and decoding
CN113489995A (en) Decoding method for decoding received information and related decoding device
CN114880161A (en) Bi-adjacent error correction code based on (23, 12) Golay code for data storage correction
KR101226439B1 (en) Rs decoder, memory system having the same and decoding method
CN108880564B (en) A low-density parity-check code decoding method with cache fault tolerance

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20220805

CF01 Termination of patent right due to non-payment of annual fee