CN111637983B - Detection system and method of resistance type temperature sensor - Google Patents
Detection system and method of resistance type temperature sensor Download PDFInfo
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- CN111637983B CN111637983B CN202010476550.6A CN202010476550A CN111637983B CN 111637983 B CN111637983 B CN 111637983B CN 202010476550 A CN202010476550 A CN 202010476550A CN 111637983 B CN111637983 B CN 111637983B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/22—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K15/00—Testing or calibrating of thermometers
- G01K15/007—Testing
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
- G05B19/042—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
- G05B19/0423—Input/output
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Abstract
The embodiment of the invention discloses a detection system and a detection method of a resistance type temperature sensor, wherein the detection system comprises the following steps: the temperature control device comprises a divider resistor, a sensor resistor, a temperature box, a temperature acquisition device and a microprocessor; two ends of the divider resistor are respectively connected with the power supply and one end of the sensor resistor; the input end of the microprocessor is connected with one end of the sensor resistor and the temperature acquisition device; the sensor resistor and the temperature acquisition device are arranged in a temperature box; the divider resistor and the sensor resistor divide the power supply voltage to generate a divided voltage signal and send the divided voltage signal to the microprocessor; the temperature acquisition device is used for acquiring the temperature in the temperature box and sending the temperature to the microprocessor; the microprocessor is used for calculating the measuring resistance value of the sensor resistor according to the voltage division signal, calculating the theoretical resistance value of the sensor resistor according to the temperature, then calculating the error between the measuring resistance value and the theoretical resistance value, and judging whether the sensor resistor is qualified or not according to the error. The technical scheme of the invention can quickly detect the performance of the temperature sensor.
Description
Technical Field
The embodiment of the invention relates to the technical field of sensor detection, in particular to a detection system and a detection method of a resistance type temperature sensor.
Background
With the rapid development of mechanical automation, the resistance type temperature sensor is widely used. The qualified resistance type temperature sensor can accurately monitor the temperature of the environment, so that accurate automatic processing can be realized according to the change of the temperature. Therefore, it is important to detect the performance of the resistance type temperature sensor.
The prior art is only used for solving the problems that the temperature sensitivity of the sensor is low and the precision is difficult to improve, can not detect the performance of the sensor and can not quickly judge whether the sensor fails or not.
Disclosure of Invention
The embodiment of the invention provides a detection system and a detection method of a resistance type temperature sensor, which can realize accurate detection of the performance of the resistance type temperature sensor.
In a first aspect, an embodiment of the present invention provides a detection system for a resistance type temperature sensor, including: the temperature control device comprises a divider resistor, a sensor resistor, a temperature box, a temperature acquisition device and a microprocessor;
one end of the divider resistor is connected with a power supply, and the other end of the divider resistor is connected with one end of the sensor resistor; the other end of the sensor resistor is grounded; the input end of the microprocessor is respectively connected with one end of the sensor resistor and the temperature acquisition device; the sensor resistor and the temperature acquisition device are placed in the temperature box;
the voltage dividing resistor and the sensor resistor divide the power voltage to generate a voltage dividing signal and send the voltage dividing signal to the microprocessor; the temperature box is used for adjusting the temperature around the sensor resistor; the temperature acquisition device is used for acquiring the temperature in the temperature box and sending the temperature to the microprocessor;
the microprocessor is used for calculating the measuring resistance value of the sensor resistor according to the voltage division signal and calculating the theoretical resistance value of the sensor resistor according to the temperature; and calculating the error between the measured resistance value and the theoretical resistance value, and judging whether the sensor resistance is qualified or not according to the error.
Further, the detection system of the resistance type temperature sensor further comprises a signal processing circuit; the input end of the signal processing circuit is connected with one end of the sensor resistor, and the output end of the signal processing circuit is connected with the input end of the microprocessor;
the signal processing circuit is used for processing the voltage division signal and sending the processed voltage division signal to the microprocessor.
Further, the signal processing circuit includes: a current limiting resistor; one end of the current limiting resistor is connected with one end of the sensor resistor, and the other end of the current limiting resistor is connected with the input end of the microprocessor.
Further, the signal processing circuit further includes: a filter capacitor; one end of the filter capacitor is connected with the power supply, and the other end of the filter capacitor is connected with the input end of the microprocessor.
Further, the signal processing circuit further includes: an overvoltage protection diode; and the negative electrode of the overvoltage protection diode is connected with a power supply, and the positive electrode of the overvoltage protection diode is connected with the input end of the microprocessor.
In a second aspect, an embodiment of the present invention further provides a detection method for a resistance type temperature sensor, which is applied to the system in the first aspect, and includes:
acquiring voltage division signals of a sensor resistor at different temperatures;
for each temperature, calculating a measurement resistance value of the sensor resistor at the current temperature according to the voltage division signal;
calculating a theoretical resistance value of the sensor resistor at the current temperature;
and calculating the error between the measured resistance value and the theoretical resistance value, and judging whether the sensor resistance is qualified or not according to the error.
According to the embodiment of the invention, the voltage dividing resistor and the sensor resistor are adopted to divide the power supply voltage to generate the voltage dividing signal, the voltage dividing signal is sent to the microprocessor, meanwhile, the temperature around the sensor resistor is adjusted by the temperature box, the temperature in the temperature box acquired by the temperature acquisition device is sent to the microprocessor, so that the microprocessor calculates the measurement resistance value of the sensor resistor according to the voltage dividing signal, calculates the theoretical resistance value of the sensor resistor according to the temperature, finally calculates the error between the measurement resistance value and the theoretical resistance value, and judges whether the sensor resistor is qualified or not according to the error, thereby realizing the effects of quickly detecting the performance of the temperature sensor and accurately judging whether the sensor is failed or not.
Drawings
Fig. 1 is a schematic structural diagram of a resistive sensor detection system according to an embodiment of the present invention;
fig. 2a is a schematic diagram of a signal processing circuit according to a second embodiment of the present invention;
fig. 2b is a schematic structural diagram of a resistance type temperature sensor according to a second embodiment of the present invention;
fig. 2c is a schematic diagram illustrating a relationship curve between a resistance value of a sensor and a temperature according to a second embodiment of the present invention;
fig. 3 is a flowchart of a resistive sensor detection method according to a third embodiment of the present invention.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting of the invention. It should be further noted that, for the convenience of description, only some of the structures related to the present invention are shown in the drawings, not all of the structures.
Example one
Fig. 1 is a schematic structural diagram of a resistive sensor detection system according to an embodiment of the present invention, which is applicable to a situation of detecting a resistive temperature sensor.
As shown in fig. 1, the detection system of the resistance type temperature sensor includes: a divider resistor 111, a sensor resistor 121, a temperature box 120, a temperature acquisition device 122 and a microprocessor 140;
one end of the voltage dividing resistor 111 is connected to the power supply 130, and the other end is connected to one end of the sensor resistor 121; the other end of the sensor resistor 121 is grounded; the input end of the microprocessor 140 is respectively connected with one end of the sensor resistor 121 and the temperature acquisition device 122; the sensor resistor 121 and the temperature acquisition device 122 are placed in the temperature box 120.
In this embodiment, the voltage dividing resistor 111 is connected to the sensor resistor 121 to form a sampling circuit, the voltage dividing resistor 111 is a fixed value, the resistance value of the sensor resistor 121 changes with temperature, and the other end of the sensor resistor 121 is grounded.
The voltage dividing resistor 111 and the sensor resistor 121 divide the voltage of the power supply 130 to generate a divided voltage signal, and the divided voltage signal is sent to the microprocessor 140; the temperature box 120 is used to regulate the temperature around the sensor resistor 121; the temperature acquisition device 122 is used to acquire the temperature in the temperature box 120 and send the temperature to the microprocessor 140.
In this embodiment, the voltage dividing signals are voltage signals corresponding to different temperatures, the temperature box 120 reads the temperature value through the temperature acquisition device 122 and outputs the temperature value to the microprocessor 140, and typically, the temperature acquisition device may select a thermocouple for calibrating the temperature of the temperature box and sending the temperature signal to the microprocessor 140.
The microprocessor 140 is used for calculating a measured resistance value of the sensor resistor 121 according to the voltage division signal and calculating a theoretical resistance value of the sensor resistor 121 according to the temperature; and calculating the error between the measured resistance value and the theoretical resistance value, and judging whether the sensor resistor 121 is qualified or not according to the error.
In the present embodiment, the sensor resistor 121 may be made of a Negative Temperature Coefficient (NTC) thermistor semiconductor material or a Positive Temperature Coefficient (PTC) thermistor semiconductor material. Illustratively, for a sensor resistor 121 made of a Positive Temperature Coefficient (PTC) thermistor semiconductor material, the theoretical resistance value is calculated by the formula:
Rs＝RM+R0(1+αT+βT2),
in the formula, RsIs the theoretical resistance value, R, of the sensor resistor 121MIs the resistance value, R, of the terminal and cable inside the sensor resistor 1210α and β are constants for the resistance value of the sensor resistor 121 at 0 ℃.
Illustratively, for a sensor resistor 121 made of a negative temperature coefficient (PTC) thermistor semiconductor material, the theoretical resistance value is calculated by the formula:
in the formula, RTR is a theoretical resistance value of the sensor resistor 121 at a predetermined temperature TNFor the sensor resistor 121 at the rated temperature TNThe resistance value of time, B, is a constant.
The calculation formula of the measured resistance value of the sensor resistance 121 is:
in the formula, R2Is a measured resistance value, V, of the sensor resistance 121sIs the voltage value of the divided signal, VccIs the voltage value, R, of the power supply 1301The resistance value of the voltage-dividing resistor 111.
In this embodiment, by adjusting the temperature in the temperature box 120, the resistance value of the sensor resistor 121 changes with the temperature, the voltage division signal generates corresponding voltage values at different temperatures, and the microprocessor 140 receives the voltage division signal and the temperature signal sent by the temperature acquisition device 122, so as to calculate the theoretical resistance value and the measured resistance value of the sensor resistor 121 at different temperatures by using a formula, calculate the difference between the theoretical resistance value and the measured resistance value, and determine whether the error is within an allowable range. If the error is within the set threshold range, the sensor resistor 121 is qualified, otherwise, the sensor resistor is not qualified.
In the embodiment, in order to accurately detect the performance of the sensor resistor at different temperatures, the temperature adjusting range is-40 ℃ to 900 ℃.
According to the embodiment of the invention, the voltage dividing resistor and the sensor resistor are adopted to divide the power supply voltage to generate the voltage dividing signal, the voltage dividing signal is sent to the microprocessor, meanwhile, the temperature around the sensor resistor is adjusted by the temperature box, the temperature in the temperature box acquired by the temperature acquisition device is sent to the microprocessor, so that the microprocessor calculates the measurement resistance value of the sensor resistor according to the voltage dividing signal, calculates the theoretical resistance value of the sensor resistor according to the temperature, finally calculates the error between the measurement resistance value and the theoretical resistance value, and judges whether the sensor resistor is qualified or not according to the error, thereby realizing the effects of quickly detecting the performance of the temperature sensor and accurately judging whether the sensor is failed or not.
Example two
Fig. 2a is a schematic structural diagram of a detection system of a resistance type temperature sensor according to a second embodiment of the present invention, and as shown in fig. 2a, the system further includes a signal processing circuit 110, the present embodiment further provides an operation principle of the signal processing circuit 110 based on the above embodiment, and the following describes a signal processing circuit 110 according to the second embodiment with reference to fig. 2 a.
The input end of the signal processing circuit 110 is connected with one end of the sensor resistor 121, and the output end is connected with the input end of the microprocessor 140;
the signal processing circuit 110 is configured to process the voltage-divided signal and send the processed voltage-divided signal to the microprocessor 140. The signal processing circuit 110 is configured to protect the voltage division signals, which are voltage signals respectively corresponding to different temperatures.
As shown in fig. 2a, the signal processing circuit 110 includes at least one of: a voltage dividing resistor 111, a current limiting resistor 112, a filter capacitor 113 and an overvoltage protection diode 114.
The signal processing circuit 110 includes: a current limiting resistor 112; the current limiting resistor 112 has one end connected to one end of the sensor resistor 121 and the other end connected to an input of the microprocessor 140. Used for limiting the current of the voltage division signal.
In this embodiment, the current limiting resistor 112 and the sensor resistor 121 form a voltage dividing circuit for generating a voltage dividing signal to be sent to the microprocessor 140.
The signal processing circuit 110 further includes: a filter capacitor 113; one terminal of the filter capacitor 113 is connected to the power supply 130, and the other terminal is connected to an input terminal of the microprocessor 140. For filtering the divided voltage signal.
The signal processing circuit further includes: an overvoltage protection diode 114; the overvoltage protection diode 114 has a cathode connected to the power supply 130 and an anode connected to an input of the microprocessor 140.
Fig. 2b is a schematic structural diagram of a sensor resistor according to a second embodiment of the present invention, and as shown in fig. 2b, the sensor resistor 121 includes a core chip 210, a cable 220, and a connector 230.
In the present embodiment, the core chip 210 has a temperature sensitive element therein. Temperature sensitive elements are classified into two types: (1) a Negative Temperature Coefficient (NTC) temperature sensitive element, which is made of a Negative Temperature Coefficient (NTC) thermosensitive semiconductor material and shows that the lower the temperature, the higher the resistance, and the higher the temperature, the lower the resistance; (2) the Positive Temperature Coefficient (PTC) temperature sensitive element is made of a heat sensitive semiconductor material with a Positive Temperature Coefficient (PTC), and shows that the higher the temperature is, the higher the resistance is, and the lower the temperature is, the lower the resistance is.
During the test, the temperature in the temperature chamber 120 is constant, and the temperature collecting device 122 collects the temperature in the temperature chamber 120 and sends the collected temperature to the microprocessor 140. Optionally, the temperature acquisition device 122 in the embodiment of the present invention employs a thermocouple, and an additional sensor is not required, thereby reducing the cost.
Fig. 2c is a relationship curve of the sensor resistance and the temperature according to the second embodiment of the present invention. Typically, the core chip inside the sensor resistor 121 in the embodiment of the present invention uses a Positive Temperature Coefficient (PTC) temperature sensitive element, that is, the resistance value of the sensor resistor 121 increases with the increase of temperature. Under the condition of ensuring constant temperature, measuring and sending a temperature signal to the microprocessor 140 through the temperature acquisition device 122, and calculating a theoretical resistance value at the temperature by the microprocessor 140; through the voltage dividing circuit formed by the current limiting resistor 112 and the sensor resistor 121, the microprocessor 140 reads the voltage dividing signal and calculates the measurement resistance value; by adjusting the temperature of the temperature box 120, a relation curve of the measured resistance value of the sensor resistor 121 and the temperature is drawn, and compared with a relation curve of the theoretical resistance value and the temperature, whether the error is within an allowable range is judged.
Illustratively, table 1 is a table of temperature-resistance characteristics of a temperature sensor in the embodiment of the present invention.
TABLE 1
In the embodiment of the invention, the temperature of each test point is kept constant by using the temperature box 120 in the process of detecting the temperature sensor, so that the influence of temperature fluctuation on the test precision is avoided, and the reliability and the precision of detection are ensured. The temperature box 120 and the temperature acquisition device 122 are adopted in the detection system, so that the temperature of the sensor is accurately controlled, and the detection precision is improved. The present invention does not require an additional sensor and has only one temperature acquisition device 122, thereby reducing costs. In the detection process, only the voltage sampling value of the temperature sensor and the value of the temperature box 120 need to be read, and the detection device is simple. In software design, upper computer control is not involved, and the method is simple and easy to implement. Therefore, the invention is very beneficial to engineering realization and application popularization. The detection system of the resistance type temperature sensor provided by the embodiment of the invention further comprises the signal processing circuit, and the signal processing circuit protects the voltage division signal, so that the safety of the detection system can be improved.
EXAMPLE III
Fig. 3 is a flowchart of a detection method of a resistive temperature sensor according to a third embodiment of the present invention, where the method is applicable to detecting a resistive temperature sensor, and can be executed by the detection system of a resistive temperature sensor provided in any one of the embodiments.
The method specifically comprises the following steps:
and step S310, acquiring a voltage division signal of the sensor resistor at different temperatures.
The voltage division signal is obtained by dividing the power supply voltage by the voltage division resistor and the sensor voltage. In this embodiment, the manner of obtaining the voltage division signals of the sensor resistor at different temperatures may be to first control the temperature box to generate different constant temperatures, and then collect the voltage division signals of the sensor resistor at each constant temperature.
And step S320, calculating the measurement resistance value of the sensor resistor at the current temperature according to the voltage division signal for each temperature.
The calculation formula of the measured resistance value of the sensor resistor at the current temperature is as follows:
in the formula, R2Is a measured resistance value, V, of the sensor resistance 121sIs the voltage value of the divided signal, VccIs the voltage value, R, of the power supply 1301The resistance value of the voltage-dividing resistor 111.
Step S330, calculating a theoretical resistance value of the sensor resistor at the current temperature;
for a sensor resistor made of a Positive Temperature Coefficient (PTC) thermistor semiconductor material, the theoretical resistance value of the sensor resistor is calculated by the formula:
Rs＝RM+R0(1+αT+βT2),
in the formula, RsIs the theoretical resistance value, R, of the sensor resistor 121MIs the resistance value, R, of the terminal and cable inside the sensor resistor 1210α and β are constants for the resistance value of the sensor resistor 121 at 0 ℃.
For a sensor resistor made of a negative temperature coefficient (PTC) thermistor semiconductor material, the theoretical resistance value is calculated by the formula:
in the formula, RTR is a theoretical resistance value of the sensor resistor 121 at a predetermined temperature TNFor the sensor resistor 121 at the rated temperature TNThe resistance value of time, B, is a constant.
And step S340, calculating errors of the measured resistance value and the theoretical resistance value, and judging whether the sensor resistance is qualified or not according to the errors.
Specifically, the difference between the measured resistance value and the theoretical resistance value is made to obtain the error between the measured resistance value and the theoretical resistance value.
If the error exceeds a set threshold range, the resistance of the sensor is unqualified; otherwise, the sensor is qualified.
The technical scheme of the embodiment is as follows: acquiring voltage division signals of a sensor resistor at different temperatures; for each temperature, calculating a measured resistance value of the sensor resistor at the current temperature according to the voltage division signal; calculating the theoretical resistance value of the sensor resistor at the current temperature; and calculating the error between the measured resistance value and the theoretical resistance value, and judging whether the resistance of the sensor is qualified or not according to the error. The embodiment realizes the effects of rapidly detecting the performance of the temperature sensor and accurately judging whether the sensor fails or not.
It is to be noted that the foregoing is only illustrative of the preferred embodiments of the present invention and the technical principles employed. It will be understood by those skilled in the art that the present invention is not limited to the particular embodiments described herein, but is capable of various obvious changes, rearrangements and substitutions as will now become apparent to those skilled in the art without departing from the scope of the invention. Therefore, although the present invention has been described in greater detail by the above embodiments, the present invention is not limited to the above embodiments, and may include other equivalent embodiments without departing from the spirit of the present invention, and the scope of the present invention is determined by the scope of the appended claims.
Claims (8)
1. A sensing system for a resistive temperature sensor, comprising: the temperature control circuit comprises a divider resistor, a sensor resistor, a temperature box, a temperature acquisition device, a signal processing circuit and a microprocessor;
one end of the divider resistor is connected with a power supply, and the other end of the divider resistor is connected with one end of the sensor resistor; the other end of the sensor resistor is grounded; the input end of the microprocessor is respectively connected with one end of the sensor resistor and the temperature acquisition device; the sensor resistor and the temperature acquisition device are placed in the temperature box;
the voltage dividing resistor and the sensor resistor divide the power voltage to generate a voltage dividing signal and send the voltage dividing signal to the microprocessor; the temperature box is used for adjusting the temperature around the sensor resistor; the temperature acquisition device is used for acquiring the temperature in the temperature box and sending the temperature to the microprocessor;
the temperature acquisition device selects a thermocouple;
the microprocessor is used for calculating the measuring resistance value of the sensor resistor according to the voltage division signal and calculating the theoretical resistance value of the sensor resistor according to the temperature; calculating the error between the measured resistance value and the theoretical resistance value, and judging whether the sensor resistance is qualified or not according to the error;
the input end of the signal processing circuit is connected with one end of the sensor resistor, and the output end of the signal processing circuit is connected with the input end of the microprocessor;
the signal processing circuit is used for processing the partial pressure signal and sending the processed partial pressure signal to the microprocessor;
the signal processing circuit includes: an overvoltage protection diode; and the negative electrode of the overvoltage protection diode is connected with a power supply, and the positive electrode of the overvoltage protection diode is connected with the input end of the microprocessor.
2. The system of claim 1, wherein the signal processing circuit comprises: a current limiting resistor; one end of the current limiting resistor is connected with one end of the sensor resistor, and the other end of the current limiting resistor is connected with the input end of the microprocessor.
3. The system of claim 2, wherein the signal processing circuit further comprises: a filter capacitor; one end of the filter capacitor is connected with the power supply, and the other end of the filter capacitor is connected with the input end of the microprocessor.
4. A method of sensing by a resistive temperature sensor, the method being performed by the system of any of claims 1-3, comprising:
acquiring voltage division signals of a sensor resistor at different temperatures;
for each temperature, calculating a measurement resistance value of the sensor resistor at the current temperature according to the voltage division signal;
calculating a theoretical resistance value of the sensor resistor at the current temperature;
and calculating the error between the measured resistance value and the theoretical resistance value, and judging whether the sensor resistance is qualified or not according to the error.
5. The method of claim 4, wherein obtaining the divided signals of the sensor resistance at different temperatures comprises:
controlling the temperature box to generate different constant temperatures;
and acquiring voltage division signals of the sensor resistor at each constant temperature.
6. The method of claim 4, wherein calculating the measured resistance value of the sensor resistor at the current temperature based on the divided voltage signal is calculated according to the following equation:
wherein R is2For measuring resistance value, VsIs a divided voltage signal, VccIs the supply voltage, R1Is a value of a voltage dividing resistance.
7. The method of claim 4, wherein calculating a theoretical resistance value of the sensor resistance at a current temperature comprises:
and calculating the theoretical resistance value of the sensor resistor at the current temperature according to the theoretical relational expression of the temperature sensor and the resistance value.
8. The method of claim 4, wherein determining whether the sensor resistance is acceptable based on the error comprises:
if the error exceeds a set threshold range, the sensor resistor is unqualified; otherwise, the sensor is qualified.
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