[go: up one dir, main page]

CN111610404A - Testing device - Google Patents

Testing device Download PDF

Info

Publication number
CN111610404A
CN111610404A CN202010554079.8A CN202010554079A CN111610404A CN 111610404 A CN111610404 A CN 111610404A CN 202010554079 A CN202010554079 A CN 202010554079A CN 111610404 A CN111610404 A CN 111610404A
Authority
CN
China
Prior art keywords
bearing
detection
feeding
tested
workpiece
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202010554079.8A
Other languages
Chinese (zh)
Inventor
潘翔
马朱惠
杨筱瑜
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kunshan Myzy Fixture Technology Co Ltd
Original Assignee
Kunshan Myzy Fixture Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kunshan Myzy Fixture Technology Co Ltd filed Critical Kunshan Myzy Fixture Technology Co Ltd
Priority to CN202010554079.8A priority Critical patent/CN111610404A/en
Publication of CN111610404A publication Critical patent/CN111610404A/en
Pending legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

The invention relates to the technical field of electronic product detection, and particularly discloses a testing device. The test device comprises a feeding mechanism, a bearing mechanism, a detection mechanism and a transfer mechanism, wherein a plurality of superposed bearing trays are arranged on the feeding mechanism, a plurality of bearing grids are arranged on each bearing tray, each bearing grid can contain a workpiece to be tested, the bearing mechanism is used for bearing the bearing trays, the detection mechanism is positioned above the bearing mechanism and can sequentially detect the workpieces to be tested on the bearing trays, and the transfer mechanism is configured to transfer the bearing trays on the feeding mechanism to the bearing mechanism. According to the testing device provided by the invention, the feeding, transferring and detecting processes of the workpiece to be tested are realized through the mutual matching among the feeding mechanism, the bearing mechanism, the detecting mechanism and the transferring mechanism, the automation degree is higher, the labor intensity of operators is reduced, and the labor cost is lower.

Description

Testing device
Technical Field
The invention relates to the technical field of electronic product detection, in particular to a testing device.
Background
With the progress of scientific technology, electronic systems become more complex, and the requirements on the reliability and maintainability of the electronic systems become higher and higher. The quality of the circuit board, which is an important component in the development and production of electronic systems, directly affects the quality of the entire device, and therefore, the performance of the circuit board needs to be tested before assembly.
The testing device in the prior art generally comprises a bearing mechanism and a detection assembly, wherein the bearing mechanism is located below the detection assembly, the bearing mechanism is used for bearing a workpiece to be tested, the detection assembly is used for detecting the workpiece to be tested placed on the bearing mechanism, and the existing testing process generally comprises the following steps: firstly, an operator places a workpiece to be tested on a bearing mechanism, a detection assembly starts to detect the workpiece to be tested, after the detection assembly detects the workpiece, the operator takes the workpiece down, and then another component to be tested is placed on the bearing mechanism. By adopting the test method, the detection assembly can only test one workpiece after the operator loads the workpiece once, so that the test assembly has longer standby time, lower test efficiency, higher labor intensity of the operator and higher labor cost.
Disclosure of Invention
The invention aims to provide a testing device, which reduces the standby time of a testing assembly, has higher testing efficiency, reduces the labor intensity of operators and has lower labor cost.
As the conception, the technical scheme adopted by the invention is as follows:
a test apparatus, comprising:
the loading mechanism is provided with a plurality of superposed bearing plates, each bearing plate is provided with a plurality of bearing grids, and each bearing grid can contain one workpiece to be tested;
the bearing mechanism is used for bearing the bearing disc;
the detection mechanism is positioned above the bearing mechanism and can be used for sequentially detecting the workpieces to be tested on the bearing plate;
a transfer mechanism configured to transfer the carrier tray on the loading mechanism onto the carrier mechanism.
As a preferable aspect of the test apparatus, the carrying mechanism includes:
a Y-direction driving member;
the Y-direction displacement platform is connected with the output end of the Y-direction driving piece, and the Y-direction driving piece can drive the Y-direction displacement platform to move along the Y direction;
the X-direction driving piece is arranged on the Y-direction displacement platform;
the bearing plate is connected with the output end of the X-direction driving piece, the X-direction driving piece can drive the bearing plate to move along the X direction, and the bearing plate is used for placing the bearing disc;
wherein the X direction and the Y direction are perpendicular to each other.
As a preferable aspect of the test apparatus, the detection mechanism includes:
the probe assembly can abut against the surface of the workpiece to be tested and detect the workpiece to be tested;
and the detection lifting driving piece is used for driving the probe assembly to lift.
As a preferable aspect of the test apparatus, the probe assembly includes:
the detection bracket is connected with the output end of the detection lifting driving piece;
the detection probes are arranged on the detection support and can be abutted to the surface of the workpiece to be tested.
As a preferable aspect of the test apparatus, the detection mechanism further includes a distance sensor configured to detect a descending distance of the detection probe.
As a preferred embodiment of the testing apparatus, the detecting mechanism further includes an alignment camera, the alignment camera is disposed above the carrying mechanism, and the alignment camera is configured to control the X-directional driving element and/or the Y-directional driving element to operate according to the position of the workpiece to be tested, so that the workpiece to be tested and the detecting probe are disposed opposite to each other.
As a preferred scheme of the testing device, a plurality of the bearing grids are arranged on the bearing tray in an array.
As a preferable aspect of the test apparatus, the feed mechanism includes:
the feeding support plate is used for bearing a plurality of superposed bearing discs;
and the output end of the feeding lifting driving component is connected with the feeding supporting plate and used for driving the feeding supporting plate to lift.
As a preferable aspect of the testing apparatus, the feeding lifting drive assembly includes:
a feeding driving motor;
the feeding screw rod is connected with the output end of the feeding driving motor and extends in the vertical direction;
and the feeding nut is sleeved on the feeding screw rod, and the feeding support plate is arranged on the feeding nut.
As a preferred scheme of the testing device, the testing device further comprises a blanking mechanism, the transfer mechanism can also transfer the bearing disc on the bearing mechanism to the blanking mechanism, and the bearing disc is used for placing a workpiece which is detected.
The invention has the beneficial effects that:
the invention provides a testing device which comprises a feeding mechanism, a bearing mechanism, a detecting mechanism and a transferring mechanism, wherein when a workpiece to be tested is detected, an operator can place a plurality of superposed bearing trays on the feeding mechanism at one time, each bearing tray is provided with a plurality of bearing grids for containing the workpiece to be tested, the transferring mechanism can transfer the bearing trays on the feeding mechanism to the bearing mechanism, and the detecting mechanism is used for detecting the workpiece to be tested on the bearing mechanism. Bear the dish through setting up, bear the dish and include a plurality of check that bear, every bears the check and all can hold a examination work piece that awaits measuring, just can realize the detection of a plurality of examination work pieces that await measuring promptly through a material loading, has saved detection mechanism's waiting material time, has improved detection efficiency. Through the mutual cooperation among the feeding mechanism, the bearing mechanism, the detection mechanism and the transfer mechanism, the feeding, transfer and detection processes of workpieces to be tested are realized, the automation degree is higher, the labor intensity of operators is reduced, and the labor cost is lower.
Drawings
FIG. 1 is a schematic structural diagram of a testing apparatus according to an embodiment of the present invention;
FIG. 2 is a schematic structural diagram of a carrier tray of a testing apparatus according to an embodiment of the present invention;
FIG. 3 is a schematic structural diagram of a detection mechanism of a testing apparatus according to an embodiment of the present invention;
FIG. 4 is a schematic structural diagram of a probe assembly of a testing apparatus according to an embodiment of the present invention.
In the figure:
1-a feeding mechanism; 11-a feeding support plate; 12-a feeding lifting driving assembly; 10-a carrier tray; 101-a carrier grid;
2-a carrying mechanism; 21-a carrier plate; a 22-X directional drive member; a 23-Y directional driving member;
3-a detection mechanism; 31-a probe assembly; 311-a detection scaffold; 312-a detection probe; 32-detecting the lifting driving member; 33-a distance sensor; 34-an alignment camera;
4-a transfer mechanism; 5-a frame; 6-a controller.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting of the invention. It should be further noted that, for the convenience of description, only some of the structures related to the present invention are shown in the drawings, not all of the structures.
In the description of the present invention, unless expressly stated or limited otherwise, the terms "connected," "connected," and "fixed" are to be construed broadly, e.g., as meaning permanently connected, removably connected, or integral to one another; can be mechanically or electrically connected; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
In the present invention, unless otherwise expressly stated or limited, "above" or "below" a first feature means that the first and second features are in direct contact, or that the first and second features are not in direct contact but are in contact with each other via another feature therebetween. Also, the first feature being "on," "above" and "over" the second feature includes the first feature being directly on and obliquely above the second feature, or merely indicating that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature includes the first feature being directly under and obliquely below the second feature, or simply meaning that the first feature is at a lesser elevation than the second feature.
In the description of the present embodiment, the terms "upper", "lower", "left", "right", and the like are used based on the orientations and positional relationships shown in the drawings only for convenience of description and simplification of operation, and do not indicate or imply that the referred device or element must have a specific orientation, be configured and operated in a specific orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first" and "second" are used only for descriptive purposes and are not intended to have a special meaning.
As shown in fig. 1-2, the present embodiment provides a testing apparatus, which includes a feeding mechanism 1, a carrying mechanism 2, a detecting mechanism 3, a transferring mechanism 4, and a rack 5, where the feeding mechanism 1, the carrying mechanism 2, the detecting mechanism 3, and the transferring mechanism 4 are all disposed on the rack 5, and the rack 5 plays a role of integral support. Specifically, a plurality of superposed bearing trays 10 are arranged on the feeding mechanism 1, a plurality of bearing grids 101 are arranged on each bearing tray 10, each bearing grid 101 can contain one workpiece to be tested, the bearing mechanism 2 is used for bearing the bearing tray 10, the detection mechanism 3 is arranged above the bearing mechanism 2 and can sequentially detect the workpieces to be tested on the bearing tray 10, and the transfer mechanism 4 is configured to transfer the bearing tray 10 on the feeding mechanism 1 to the bearing mechanism 2. The transfer mechanism 4 is specifically a six-axis manipulator, which is a prior art and will not be described in detail in this application.
For convenience of description, as shown in fig. 1, the length direction of the rack 5 is defined as an X direction, the width direction of the rack 5 is defined as a Y direction, and the height direction of the rack 5 is defined as a Z direction, where the X direction, the Y direction, and the Z direction are perpendicular to each other two by two, and the X direction, the Y direction, and the Z direction only represent a spatial direction and have no substantial meaning.
The detection device that this embodiment provided, when examining the test work piece, operating personnel can once only place a plurality of superimposed bearing tray 10 on feed mechanism 1, is provided with a plurality of bearing grids 101 that hold the work piece that awaits measuring on every bearing tray 10, and transfer mechanism 4 can shift bearing tray 10 on the feed mechanism 1 to bearing mechanism 2 on, and detection mechanism 3 is used for examining the test work piece that awaits measuring on the bearing mechanism 2 and detects. Bear dish 10 through setting up, bear dish 10 including a plurality of check 101 that bear, every bears the check 101 in all can holding a examination work piece that awaits measuring, just can realize the detection of a plurality of examination work pieces that await measuring promptly through a material loading, saved detection mechanism 3's waiting material time, improved detection efficiency. Through the mutual cooperation between the feeding mechanism 1, the bearing mechanism 2, the detection mechanism 3 and the transfer mechanism 4, the feeding, transfer and detection processes of workpieces to be tested are realized, the automation degree is higher, the labor intensity of operators is reduced, and the labor cost is lower.
As shown in fig. 2, a plurality of carrier cells 101 are arranged on the carrier tray 10 in an array. In this embodiment, 295 carrier cells 101 are disposed on each carrier tray 10, and 295 carrier cells 101 are arranged in an array of 15 × 29. Of course, in other embodiments, the distribution pattern of the carrier grid 101 may also be adjusted according to the size of the workpiece to be tested and the actual production condition, which is not limited herein.
Further, as shown in fig. 1, the bearing mechanism 2 includes a bearing plate 21, an X-direction driving member 22, a Y-direction displacement platform and a Y-direction driving member 23, the Y-direction driving member 23 is disposed on the rack 5, the Y-direction displacement platform is connected to an output end of the Y-direction driving member 23, the Y-direction driving member 23 can drive the Y-direction displacement platform to move along the Y-direction, the X-direction driving member 22 is disposed on the Y-direction displacement platform, the bearing plate 21 is connected to an output end of the X-direction driving member 22, the X-direction driving member 22 can drive the bearing plate 21 to move along the X-direction, and the bearing plate 21 is used. The X-direction driving element 22 may be an X-direction driving cylinder or an X-direction linear motor, and the Y-direction driving element 23 may be a Y-direction driving cylinder or a Y-direction linear motor. By arranging the X-direction driving part 22 and the Y-direction driving part 23, the bearing plate 21 can drive the bearing tray 10 to move along the X direction and/or the Y direction, so that the detection mechanism 3 can sequentially detect the workpieces to be detected on the bearing tray 10.
Preferably, the testing device further comprises a controller 6, the detection mechanism 3, the X-directional driving element 22 and the Y-directional driving element 23 are electrically connected to the controller 6, and the controller 6 controls the detection mechanism 3, the X-directional driving element 22 and the Y-directional driving element 23 to realize a full-automatic testing process of the testing device on the workpiece to be tested.
Further, as shown in fig. 3-4, the detecting mechanism 3 includes a probe assembly 31 and a detecting lifting driving member 32, the probe assembly 31 can abut against and detect the surface of the workpiece to be tested, and the detecting lifting driving member 32 is used for driving the probe assembly 31 to lift. The detection lifting driving member 32 is specifically a detection lifting driving cylinder. When the X-direction driving element 22 or the Y-direction driving element 23 drives the carrier plate 21 to move along the X direction or the Y direction, the detection lifting driving element 32 drives the probe assembly 31 to move upwards, so as to prevent the workpiece to be tested from interfering with the probe assembly 31 and damaging the workpiece to be tested.
Specifically, as shown in fig. 4, the probe assembly 31 includes a detecting bracket 311 and a plurality of detecting probes 312, the detecting bracket 311 is connected to the output end of the detecting lifting driving element 32, the plurality of detecting probes 312 are disposed on the detecting bracket 311, and the detecting probes 312 can abut against the surface of the workpiece to be tested. After the transfer mechanism 4 places the carrier tray 10 containing the workpiece to be tested on the carrier plate 21, the detection lifting driving member 32 drives the probe assembly 31 to descend, so that the plurality of detection probes 312 contact with the surface of one of the workpieces to be tested, thereby realizing the detection of the workpiece to be tested.
In this embodiment, the number of the detection probes 312 is 592, and the 592 detection probes 312 are arranged on the detection support 311 in an array, and are used for detecting each point on the surface of the workpiece to be tested, so as to ensure the accuracy of the detection result. Of course, in other embodiments, the number of the detection probes 312 may also be adjusted according to actual production conditions, and is not limited herein.
Further, as shown in fig. 3, the detection mechanism 3 further includes a distance sensor 33, and the distance sensor 33 is configured to detect a descending distance of the detection probe 312. Specifically, the distance sensor 33 is electrically connected to the controller 6, and in the process of detecting that the lifting driving member 32 drives the plurality of detection probes 312 to descend, the distance sensor 33 can transmit the descending distance of the detection probes 312 to the controller 6 in real time, so as to control the operation and stop of the lifting driving member 32, thereby preventing the detection probes 312 from crushing the workpiece to be tested.
Further, the inspection mechanism 3 further includes an alignment camera 34, the alignment camera 34 is disposed above the carrying mechanism 2, and the alignment camera 34 is configured to control the operation of the X-direction driving element 22 and/or the Y-direction driving element 23 according to the position of the workpiece to be tested, so that the workpiece to be tested is disposed opposite to the inspection probe 312. Specifically, the alignment camera 34 is electrically connected to the controller 6, the alignment camera 34 collects an image of the carrier tray 10 on the carrier plate 21 and transmits the signal to the controller 6, and the controller 6 controls the X-direction driving element 22 and/or the Y-direction driving element 23 to operate, so that the next workpiece to be tested is aligned with the probe assembly 31, thereby ensuring the orderly testing process.
Further, as shown in fig. 1, the feeding mechanism 1 includes a feeding support plate 11 and a feeding lifting driving assembly 12, the feeding support plate 11 is used for bearing a plurality of superposed bearing trays 10, and an output end of the feeding lifting driving assembly 12 is connected to the feeding support plate 11 for driving the feeding support plate 11 to lift. After the transfer mechanism 4 grabs one carrier tray 10 and transfers it onto the carrier plate 21, the loading lifting driving assembly 12 drives the loading supporting plate 11 to move upward by the thickness of one carrier tray 10, so that the transfer mechanism 4 can grab the carrier tray 10 at the same height each time, and the operation process is simplified.
Particularly, material loading lift drive assembly 12 includes material loading driving motor, material loading lead screw and material loading nut, and the material loading lead screw links to each other with material loading driving motor's output to extend along vertical direction (Z direction), the material loading nut cover is located on the material loading lead screw, material loading backup pad 11 sets up on material loading nut. When the feeding driving motor works, the feeding screw rod can be driven to rotate, so that the feeding nut drives the feeding supporting plate 11 to move along the Z direction.
Further, the testing device further comprises a blanking mechanism 5, the transfer mechanism 4 can also transfer the bearing disc 10 on the bearing mechanism 2 to the blanking mechanism 5, and the bearing disc 10 is provided with a workpiece which is detected. It can be understood that the blanking mechanism 5 has the same specific structure as the feeding mechanism 1, and only differs from the feeding mechanism 1 in the arrangement position, the carrier tray 10 carried by the feeding mechanism 1 contains the undetected workpieces, and the carrier tray 10 carried by the blanking mechanism 5 contains the detected workpieces.
The working flow of the testing device is briefly described below with reference to fig. 1-4:
(1) an operator places workpieces to be tested in the bearing grids 101 of the bearing plate 10 and places the superposed bearing plate 10 on the feeding support plate 11;
(2) the transfer mechanism 4 grabs the bearing disc 10 positioned at the uppermost layer and places the bearing disc on the bearing plate 21, and the feeding lifting driving assembly 12 drives the feeding supporting plate 11 to move upwards by the thickness of one bearing disc 10;
(3) the alignment camera 34 collects image information of the bearing disc 10 on the bearing plate 21 and transmits the information into the controller 6, and the controller 6 controls the operation of the X-direction driving part 22 and/or the Y-direction driving part 23 to drive the bearing plate 21 to move along the X direction and/or the Y direction, so that the first workpiece to be tested is opposite to the probe assembly 31;
(4) the detection lifting driving member 32 drives the probe assembly 31 to move downwards, so that the plurality of detection probes 312 abut against the surface of the first workpiece to be tested, so as to detect the workpiece to be tested, and transmit the detection result to the controller 6;
(5) detecting that the lifting driving part 32 drives the probe assembly 31 to move upwards, and controlling the X-direction driving part 22 and/or the Y-direction driving part 23 to work by the controller 6 so as to drive the bearing plate 21 to move along the X direction and/or the Y direction, so that the next workpiece to be tested is opposite to the probe assembly 31;
(6) repeating the steps (4) and (5) until the workpieces to be tested on the bearing plate 10 are completely detected;
(7) the transfer mechanism 4 grasps the carrier tray 10 containing the detected workpiece and transfers it to the blanking mechanism 5, and the blanking mechanism 5 transfers the detected workpiece to the next process.
The foregoing embodiments are merely illustrative of the principles and features of this invention, which is not limited to the above-described embodiments, but rather is susceptible to various changes and modifications without departing from the spirit and scope of the invention, which changes and modifications are within the scope of the invention as claimed. The scope of the invention is defined by the appended claims and equivalents thereof.

Claims (10)

1. A test apparatus, comprising:
the loading mechanism (1) is provided with a plurality of superposed bearing discs (10), each bearing disc (10) is provided with a plurality of bearing grids (101), and each bearing grid (101) can contain one workpiece to be tested;
the bearing mechanism (2) is used for bearing the bearing disc (10);
the detection mechanism (3) is positioned above the bearing mechanism (2) and can sequentially detect the workpieces to be tested on the bearing plate (10);
a transfer mechanism (4), wherein the transfer mechanism (4) is configured to transfer the carrier tray (10) on the feeding mechanism (1) to the carrier mechanism (2).
2. The testing device according to claim 1, characterized in that the carrying mechanism (2) comprises:
a Y-direction driving member (23);
the Y-direction displacement platform is connected with the output end of the Y-direction driving piece (23), and the Y-direction driving piece (23) can drive the Y-direction displacement platform to move along the Y direction;
an X-direction driving member (22) arranged on the Y-direction displacement platform;
the bearing plate (21) is connected with the output end of the X-direction driving piece (22), the X-direction driving piece (22) can drive the bearing plate (21) to move along the X direction, and the bearing plate (21) is used for placing the bearing disc (10);
wherein the X direction and the Y direction are perpendicular to each other.
3. The testing device according to claim 2, characterized in that the detection mechanism (3) comprises:
a probe assembly (31) capable of abutting against and detecting the surface of the workpiece to be tested;
and a detection lifting driving piece (32) for driving the probe assembly (31) to lift.
4. The testing device according to claim 3, characterized in that the probe assembly (31) comprises:
the detection bracket (311) is connected with the output end of the detection lifting driving piece (32);
the detection device comprises a plurality of detection probes (312), wherein the detection probes (312) are arranged on the detection bracket (311), and the detection probes (312) can abut against the surface of the workpiece to be tested.
5. The testing device according to claim 4, characterized in that the detection mechanism (3) further comprises a distance sensor (33), the distance sensor (33) being configured to detect a distance of descent of the detection probe (312).
6. The testing device according to claim 4, wherein the inspection mechanism (3) further comprises a registration camera (34), the registration camera (34) is disposed above the carrying mechanism (2), and the registration camera (34) is configured to control the operation of the X-directional driving member (22) and/or the Y-directional driving member (23) according to the position of the workpiece to be tested, so that the workpiece to be tested is disposed opposite to the inspection probe (312).
7. The testing device according to claim 1, wherein a plurality of the carrier compartments (101) are arranged in an array on the carrier tray (10).
8. The testing device according to claim 1, characterized in that the feeding mechanism (1) comprises:
a loading support plate (11) for carrying a plurality of superimposed carrier trays (10);
and the output end of the feeding lifting driving component (12) is connected with the feeding supporting plate (11) and is used for driving the feeding supporting plate (11) to lift.
9. The testing device according to claim 8, characterized in that the loading lifting drive assembly (12) comprises:
a feeding driving motor;
the feeding screw rod is connected with the output end of the feeding driving motor and extends in the vertical direction;
and the feeding nut is sleeved on the feeding screw rod, and the feeding support plate (11) is arranged on the feeding nut.
10. The testing device according to any one of claims 1 to 9, characterized in that the testing device further comprises a blanking mechanism (5), the transfer mechanism (4) is further capable of transferring the carrier tray (10) on the carrier mechanism (2) to the blanking mechanism (5), and the carrier tray (10) is used for placing the workpiece after detection.
CN202010554079.8A 2020-06-17 2020-06-17 Testing device Pending CN111610404A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202010554079.8A CN111610404A (en) 2020-06-17 2020-06-17 Testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202010554079.8A CN111610404A (en) 2020-06-17 2020-06-17 Testing device

Publications (1)

Publication Number Publication Date
CN111610404A true CN111610404A (en) 2020-09-01

Family

ID=72203930

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202010554079.8A Pending CN111610404A (en) 2020-06-17 2020-06-17 Testing device

Country Status (1)

Country Link
CN (1) CN111610404A (en)

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112858860A (en) * 2020-12-30 2021-05-28 前海晶云(深圳)存储技术有限公司 Testing device
CN112857233A (en) * 2020-12-31 2021-05-28 荣旗工业科技(苏州)股份有限公司 Size detection system
CN113267735A (en) * 2021-03-15 2021-08-17 长春工业大学 Intelligent device for detecting on-off state between wiring terminals in electric cabinet
CN113532282A (en) * 2021-06-17 2021-10-22 深圳市骏创科技有限公司 Automatic change detection, packing integrated form production facility
CN113654585A (en) * 2021-08-11 2021-11-16 南京英锐创电子科技有限公司 Automated equipment for calibration of pressure and acceleration sensors
CN113671344A (en) * 2021-08-16 2021-11-19 苏州特斯捷电子科技有限公司 Industrial control mainboard test fixture
CN114113709A (en) * 2021-11-29 2022-03-01 苏州爱谱睿电子科技有限公司 Motion device for test piece burning machine
CN114101078A (en) * 2021-11-23 2022-03-01 博众精工科技股份有限公司 Detection device
CN114347014A (en) * 2021-11-25 2022-04-15 国营芜湖机械厂 Automatic test system and test method for jamming projectile emitter
CN114405850A (en) * 2022-01-24 2022-04-29 苏州华兴源创科技股份有限公司 Manipulator coordinate point compensation method and device, chip detection method and device
CN114558801A (en) * 2022-02-28 2022-05-31 宁波卓鸿工业科技有限公司 Electrode high voltage automatic test equipment
CN116500424A (en) * 2023-06-27 2023-07-28 深圳市克洛诺斯科技有限公司 PCB detection device

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108983010A (en) * 2018-09-19 2018-12-11 昆山迈致治具科技有限公司 A kind of testing touch screen machine
WO2020051828A1 (en) * 2018-09-13 2020-03-19 太仓德纳森机电工程有限公司 Circuit board testing device
CN110911311A (en) * 2019-11-18 2020-03-24 深圳格兰达智能装备股份有限公司 Visual inspection machine to wafer after cutting
CN110989220A (en) * 2019-12-18 2020-04-10 苏州精濑光电有限公司 Detection device
CN212321758U (en) * 2020-06-17 2021-01-08 昆山迈致治具科技有限公司 Testing device

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020051828A1 (en) * 2018-09-13 2020-03-19 太仓德纳森机电工程有限公司 Circuit board testing device
CN108983010A (en) * 2018-09-19 2018-12-11 昆山迈致治具科技有限公司 A kind of testing touch screen machine
CN110911311A (en) * 2019-11-18 2020-03-24 深圳格兰达智能装备股份有限公司 Visual inspection machine to wafer after cutting
CN110989220A (en) * 2019-12-18 2020-04-10 苏州精濑光电有限公司 Detection device
CN212321758U (en) * 2020-06-17 2021-01-08 昆山迈致治具科技有限公司 Testing device

Cited By (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112858860A (en) * 2020-12-30 2021-05-28 前海晶云(深圳)存储技术有限公司 Testing device
CN112857233B (en) * 2020-12-31 2023-02-28 荣旗工业科技(苏州)股份有限公司 Size detection system
CN112857233A (en) * 2020-12-31 2021-05-28 荣旗工业科技(苏州)股份有限公司 Size detection system
CN113267735A (en) * 2021-03-15 2021-08-17 长春工业大学 Intelligent device for detecting on-off state between wiring terminals in electric cabinet
CN113532282A (en) * 2021-06-17 2021-10-22 深圳市骏创科技有限公司 Automatic change detection, packing integrated form production facility
CN113532282B (en) * 2021-06-17 2023-08-11 深圳市骏创科技有限公司 Automatic change detection, packing integrated production facility
CN113654585A (en) * 2021-08-11 2021-11-16 南京英锐创电子科技有限公司 Automated equipment for calibration of pressure and acceleration sensors
CN113671344A (en) * 2021-08-16 2021-11-19 苏州特斯捷电子科技有限公司 Industrial control mainboard test fixture
CN113671344B (en) * 2021-08-16 2024-05-28 苏州特斯捷电子科技有限公司 Industrial control mainboard test fixture
CN114101078B (en) * 2021-11-23 2024-05-31 苏州博众智能机器人有限公司 Detection device
CN114101078A (en) * 2021-11-23 2022-03-01 博众精工科技股份有限公司 Detection device
CN114347014A (en) * 2021-11-25 2022-04-15 国营芜湖机械厂 Automatic test system and test method for jamming projectile emitter
CN114113709B (en) * 2021-11-29 2023-12-15 苏州爱谱睿电子科技有限公司 Movement device for test piece burning machine
CN114113709A (en) * 2021-11-29 2022-03-01 苏州爱谱睿电子科技有限公司 Motion device for test piece burning machine
CN114405850A (en) * 2022-01-24 2022-04-29 苏州华兴源创科技股份有限公司 Manipulator coordinate point compensation method and device, chip detection method and device
CN114558801A (en) * 2022-02-28 2022-05-31 宁波卓鸿工业科技有限公司 Electrode high voltage automatic test equipment
CN116500424A (en) * 2023-06-27 2023-07-28 深圳市克洛诺斯科技有限公司 PCB detection device
CN116500424B (en) * 2023-06-27 2024-03-29 深圳市克洛诺斯科技有限公司 PCB detection device

Similar Documents

Publication Publication Date Title
CN111610404A (en) Testing device
CN110794320B (en) A fully automatic voltage internal resistance test system
CA1044379A (en) Wafer transfer device
JP6031292B2 (en) Board contact method to probe card
CN112517417A (en) Double-turntable full-automatic detection machine and detection method thereof
KR20190056286A (en) Wafer positioning and loading system
CN107931902A (en) Weld upset feed mechanism and its lithium battery welding equipment
CN101396692B (en) A device that can automate the appearance inspection of electronic components
CN112683792A (en) System for graphite flake appearance defects
CN113358078B (en) Bearing size detection system
CN212321758U (en) Testing device
CN112758677B (en) Automatic jig cover plate elasticity test equipment and test method
CN214407428U (en) Flatness detection equipment and system
TW201407171A (en) Electronic component testing and classification equipment
CN207806936U (en) Weld upset feed mechanism and its lithium battery welding equipment
CN108225245B (en) Automatic thickness measuring device for flexible porous thin sheet
JP3344545B2 (en) Structure of rotary arm device chuck part of handler
WO1991011093A1 (en) System for mounting components on circuit boards
KR20180091510A (en) Display cell test equipment
CN118169530A (en) Testing device and production line
CN214732580U (en) Automatic tool apron elasticity test equipment
CN107900572A (en) Lithium battery welding equipment
CN107914072A (en) Lithium battery transmits gauge and its lithium battery welding equipment
JP2769372B2 (en) LCD probe device
CN114260589A (en) Laser marking detection process and device for IC chip strip

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination